CN118401827A - 表面检查方法以及表面检查装置 - Google Patents

表面检查方法以及表面检查装置 Download PDF

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Publication number
CN118401827A
CN118401827A CN202280079127.XA CN202280079127A CN118401827A CN 118401827 A CN118401827 A CN 118401827A CN 202280079127 A CN202280079127 A CN 202280079127A CN 118401827 A CN118401827 A CN 118401827A
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CN
China
Prior art keywords
light
spherical surface
screen
sphere
optical axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202280079127.XA
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English (en)
Chinese (zh)
Inventor
孟凡辉
丰内哲也
丸山重信
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Construction Machinery Co Ltd
Original Assignee
Hitachi Construction Machinery Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Construction Machinery Co Ltd filed Critical Hitachi Construction Machinery Co Ltd
Publication of CN118401827A publication Critical patent/CN118401827A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN202280079127.XA 2021-12-14 2022-12-08 表面检查方法以及表面检查装置 Pending CN118401827A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021-202537 2021-12-14
JP2021202537 2021-12-14
PCT/JP2022/045211 WO2023112809A1 (ja) 2021-12-14 2022-12-08 表面検査方法および表面検査装置

Publications (1)

Publication Number Publication Date
CN118401827A true CN118401827A (zh) 2024-07-26

Family

ID=86774653

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280079127.XA Pending CN118401827A (zh) 2021-12-14 2022-12-08 表面检查方法以及表面检查装置

Country Status (3)

Country Link
JP (1) JP7696012B2 (enrdf_load_stackoverflow)
CN (1) CN118401827A (enrdf_load_stackoverflow)
WO (1) WO2023112809A1 (enrdf_load_stackoverflow)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4963459A (enrdf_load_stackoverflow) * 1972-10-16 1974-06-19
US4398825A (en) * 1981-02-17 1983-08-16 General Motors Corporation Optical scanner for ball inspection
JPS58219441A (ja) * 1982-06-15 1983-12-20 Hajime Sangyo Kk 凸面体の表面欠陥検査装置
JPH0470555A (ja) * 1990-07-11 1992-03-05 Sumitomo Metal Ind Ltd 球体表面検査装置
CN112284984B (zh) * 2020-10-19 2024-03-08 陕西科技大学 一种基于光反射的固体表面能测定装置及方法
KR102274955B1 (ko) * 2021-02-02 2021-07-08 주식회사 아이엘비 비전 촬영에 의한 야구공 둘레 자동 측정시스템

Also Published As

Publication number Publication date
WO2023112809A1 (ja) 2023-06-22
JP7696012B2 (ja) 2025-06-19
JPWO2023112809A1 (enrdf_load_stackoverflow) 2023-06-22

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