JP7696012B2 - 表面検査方法および表面検査装置 - Google Patents

表面検査方法および表面検査装置 Download PDF

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Publication number
JP7696012B2
JP7696012B2 JP2023567733A JP2023567733A JP7696012B2 JP 7696012 B2 JP7696012 B2 JP 7696012B2 JP 2023567733 A JP2023567733 A JP 2023567733A JP 2023567733 A JP2023567733 A JP 2023567733A JP 7696012 B2 JP7696012 B2 JP 7696012B2
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light
spherical surface
screen
sphere
optical axis
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Japanese (ja)
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JPWO2023112809A1 (enrdf_load_stackoverflow
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凡輝 孟
哲也 豊内
重信 丸山
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Hitachi Construction Machinery Co Ltd
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Hitachi Construction Machinery Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2023567733A 2021-12-14 2022-12-08 表面検査方法および表面検査装置 Active JP7696012B2 (ja)

Applications Claiming Priority (3)

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JP2021202537 2021-12-14
JP2021202537 2021-12-14
PCT/JP2022/045211 WO2023112809A1 (ja) 2021-12-14 2022-12-08 表面検査方法および表面検査装置

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JPWO2023112809A1 JPWO2023112809A1 (enrdf_load_stackoverflow) 2023-06-22
JP7696012B2 true JP7696012B2 (ja) 2025-06-19

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JP2023567733A Active JP7696012B2 (ja) 2021-12-14 2022-12-08 表面検査方法および表面検査装置

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JP (1) JP7696012B2 (enrdf_load_stackoverflow)
CN (1) CN118401827A (enrdf_load_stackoverflow)
WO (1) WO2023112809A1 (enrdf_load_stackoverflow)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112284984A (zh) 2020-10-19 2021-01-29 陕西科技大学 一种基于光反射的固体表面能测定装置及方法
KR102274955B1 (ko) 2021-02-02 2021-07-08 주식회사 아이엘비 비전 촬영에 의한 야구공 둘레 자동 측정시스템

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4963459A (enrdf_load_stackoverflow) * 1972-10-16 1974-06-19
US4398825A (en) * 1981-02-17 1983-08-16 General Motors Corporation Optical scanner for ball inspection
JPS58219441A (ja) * 1982-06-15 1983-12-20 Hajime Sangyo Kk 凸面体の表面欠陥検査装置
JPH0470555A (ja) * 1990-07-11 1992-03-05 Sumitomo Metal Ind Ltd 球体表面検査装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112284984A (zh) 2020-10-19 2021-01-29 陕西科技大学 一种基于光反射的固体表面能测定装置及方法
KR102274955B1 (ko) 2021-02-02 2021-07-08 주식회사 아이엘비 비전 촬영에 의한 야구공 둘레 자동 측정시스템

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CN118401827A (zh) 2024-07-26
WO2023112809A1 (ja) 2023-06-22
JPWO2023112809A1 (enrdf_load_stackoverflow) 2023-06-22

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