CN118382799A - 信息处理装置、信息处理方法、程序及记录介质 - Google Patents

信息处理装置、信息处理方法、程序及记录介质 Download PDF

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Publication number
CN118382799A
CN118382799A CN202280081559.4A CN202280081559A CN118382799A CN 118382799 A CN118382799 A CN 118382799A CN 202280081559 A CN202280081559 A CN 202280081559A CN 118382799 A CN118382799 A CN 118382799A
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China
Prior art keywords
information processing
detection target
priority
processing device
transmission image
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Pending
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CN202280081559.4A
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English (en)
Chinese (zh)
Inventor
池田辽
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Corp
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Fujifilm Corp
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Filing date
Publication date
Application filed by Fujifilm Corp filed Critical Fujifilm Corp
Publication of CN118382799A publication Critical patent/CN118382799A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/25—Determination of region of interest [ROI] or a volume of interest [VOI]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/255—Detecting or recognising potential candidate objects based on visual cues, e.g. shapes
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/40—Extraction of image or video features
    • G06V10/44—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/764—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10116—X-ray image
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30136—Metal
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30168—Image quality inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V2201/00—Indexing scheme relating to image or video recognition or understanding
    • G06V2201/06—Recognition of objects for industrial automation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V2201/00—Indexing scheme relating to image or video recognition or understanding
    • G06V2201/07—Target detection

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Artificial Intelligence (AREA)
  • Quality & Reliability (AREA)
  • Software Systems (AREA)
  • Medical Informatics (AREA)
  • Computing Systems (AREA)
  • Evolutionary Computation (AREA)
  • Databases & Information Systems (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN202280081559.4A 2021-12-13 2022-10-26 信息处理装置、信息处理方法、程序及记录介质 Pending CN118382799A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021201740 2021-12-13
JP2021-201740 2021-12-13
PCT/JP2022/039845 WO2023112497A1 (ja) 2021-12-13 2022-10-26 情報処理装置、情報処理方法、プログラム及び記録媒体

Publications (1)

Publication Number Publication Date
CN118382799A true CN118382799A (zh) 2024-07-23

Family

ID=86774461

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280081559.4A Pending CN118382799A (zh) 2021-12-13 2022-10-26 信息处理装置、信息处理方法、程序及记录介质

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Country Link
US (1) US20240331339A1 (https=)
EP (1) EP4450959A4 (https=)
JP (1) JPWO2023112497A1 (https=)
CN (1) CN118382799A (https=)
WO (1) WO2023112497A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025115178A1 (ja) * 2023-11-30 2025-06-05 富士通株式会社 機械学習プログラム、機械学習方法、および情報処理装置
EP4586187A1 (en) * 2024-01-12 2025-07-16 Valeo Systemes Thermiques Method and system for automated characterisation of material defects through an image of the material

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8284247B2 (en) * 2008-02-15 2012-10-09 Enerize Corporation Method and apparatus for detecting and inspecting through-penetrating defects in foils and films
JP6197659B2 (ja) * 2014-01-20 2017-09-20 富士ゼロックス株式会社 検出制御装置、プログラム及び検出システム
JP6588332B2 (ja) * 2015-12-25 2019-10-09 株式会社イシダ 物品検査システム
CN108158597B (zh) * 2016-12-07 2021-08-06 北京东软医疗设备有限公司 确定原始x射线能量数据的方法、装置及ct设备
JP2018173374A (ja) * 2017-03-31 2018-11-08 松定プレシジョン株式会社 Ｘ線検査装置
CN112204385A (zh) * 2018-06-29 2021-01-08 富士胶片株式会社 缺陷显示装置及方法
JP7239507B2 (ja) * 2020-01-30 2023-03-14 株式会社日立製作所 アラート出力タイミング制御装置、アラート出力タイミング制御方法、アラート出力タイミング制御プログラム
JP7496702B2 (ja) 2020-03-27 2024-06-07 日鉄ステンレス株式会社 疵検査装置及び疵検査方法
DE102021107640A1 (de) * 2020-03-30 2021-09-30 Sintokogio, Ltd. Inspektionsergebnisanzeigevorrichtung und Speichermedium
CN111596179A (zh) * 2020-05-25 2020-08-28 国网湖南省电力有限公司 基于数字成像技术的电缆缓冲层缺陷带电检测方法、系统、介质及设备

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Publication number Publication date
EP4450959A4 (en) 2025-03-26
JPWO2023112497A1 (https=) 2023-06-22
WO2023112497A1 (ja) 2023-06-22
EP4450959A1 (en) 2024-10-23
US20240331339A1 (en) 2024-10-03

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