JPWO2023112497A1 - - Google Patents
Info
- Publication number
- JPWO2023112497A1 JPWO2023112497A1 JP2023567583A JP2023567583A JPWO2023112497A1 JP WO2023112497 A1 JPWO2023112497 A1 JP WO2023112497A1 JP 2023567583 A JP2023567583 A JP 2023567583A JP 2023567583 A JP2023567583 A JP 2023567583A JP WO2023112497 A1 JPWO2023112497 A1 JP WO2023112497A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/18—Investigating the presence of flaws defects or foreign matter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/20—Image preprocessing
- G06V10/25—Determination of region of interest [ROI] or a volume of interest [VOI]
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/20—Image preprocessing
- G06V10/255—Detecting or recognising potential candidate objects based on visual cues, e.g. shapes
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/40—Extraction of image or video features
- G06V10/44—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
- G06V10/764—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10116—X-ray image
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30136—Metal
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30168—Image quality inspection
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V2201/00—Indexing scheme relating to image or video recognition or understanding
- G06V2201/06—Recognition of objects for industrial automation
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V2201/00—Indexing scheme relating to image or video recognition or understanding
- G06V2201/07—Target detection
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Multimedia (AREA)
- Computer Vision & Pattern Recognition (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Artificial Intelligence (AREA)
- Quality & Reliability (AREA)
- Software Systems (AREA)
- Medical Informatics (AREA)
- Computing Systems (AREA)
- Evolutionary Computation (AREA)
- Databases & Information Systems (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021201740 | 2021-12-13 | ||
| PCT/JP2022/039845 WO2023112497A1 (ja) | 2021-12-13 | 2022-10-26 | 情報処理装置、情報処理方法、プログラム及び記録媒体 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2023112497A1 true JPWO2023112497A1 (https=) | 2023-06-22 |
| JPWO2023112497A5 JPWO2023112497A5 (https=) | 2024-08-26 |
Family
ID=86774461
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023567583A Pending JPWO2023112497A1 (https=) | 2021-12-13 | 2022-10-26 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20240331339A1 (https=) |
| EP (1) | EP4450959A4 (https=) |
| JP (1) | JPWO2023112497A1 (https=) |
| CN (1) | CN118382799A (https=) |
| WO (1) | WO2023112497A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2025115178A1 (ja) * | 2023-11-30 | 2025-06-05 | 富士通株式会社 | 機械学習プログラム、機械学習方法、および情報処理装置 |
| EP4586187A1 (en) * | 2024-01-12 | 2025-07-16 | Valeo Systemes Thermiques | Method and system for automated characterisation of material defects through an image of the material |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8284247B2 (en) * | 2008-02-15 | 2012-10-09 | Enerize Corporation | Method and apparatus for detecting and inspecting through-penetrating defects in foils and films |
| JP6197659B2 (ja) * | 2014-01-20 | 2017-09-20 | 富士ゼロックス株式会社 | 検出制御装置、プログラム及び検出システム |
| JP6588332B2 (ja) * | 2015-12-25 | 2019-10-09 | 株式会社イシダ | 物品検査システム |
| CN108158597B (zh) * | 2016-12-07 | 2021-08-06 | 北京东软医疗设备有限公司 | 确定原始x射线能量数据的方法、装置及ct设备 |
| JP2018173374A (ja) * | 2017-03-31 | 2018-11-08 | 松定プレシジョン株式会社 | Ｘ線検査装置 |
| CN112204385A (zh) * | 2018-06-29 | 2021-01-08 | 富士胶片株式会社 | 缺陷显示装置及方法 |
| JP7239507B2 (ja) * | 2020-01-30 | 2023-03-14 | 株式会社日立製作所 | アラート出力タイミング制御装置、アラート出力タイミング制御方法、アラート出力タイミング制御プログラム |
| JP7496702B2 (ja) | 2020-03-27 | 2024-06-07 | 日鉄ステンレス株式会社 | 疵検査装置及び疵検査方法 |
| DE102021107640A1 (de) * | 2020-03-30 | 2021-09-30 | Sintokogio, Ltd. | Inspektionsergebnisanzeigevorrichtung und Speichermedium |
| CN111596179A (zh) * | 2020-05-25 | 2020-08-28 | 国网湖南省电力有限公司 | 基于数字成像技术的电缆缓冲层缺陷带电检测方法、系统、介质及设备 |
-
2022
- 2022-10-26 EP EP22907031.3A patent/EP4450959A4/en active Pending
- 2022-10-26 CN CN202280081559.4A patent/CN118382799A/zh active Pending
- 2022-10-26 JP JP2023567583A patent/JPWO2023112497A1/ja active Pending
- 2022-10-26 WO PCT/JP2022/039845 patent/WO2023112497A1/ja not_active Ceased
-
2024
- 2024-06-10 US US18/738,416 patent/US20240331339A1/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP4450959A4 (en) | 2025-03-26 |
| WO2023112497A1 (ja) | 2023-06-22 |
| EP4450959A1 (en) | 2024-10-23 |
| US20240331339A1 (en) | 2024-10-03 |
| CN118382799A (zh) | 2024-07-23 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20240621 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20250710 |