CN1183564A - Method and apparatus for testing CPU register bit reverse caused by single particle effect - Google Patents
Method and apparatus for testing CPU register bit reverse caused by single particle effect Download PDFInfo
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Abstract
A method for testing the bit reversal in CPU register caused by single-particle effect includes setting up an initial constant in the register to be tested, continuously reading the value, comparing it with the real value stored in main control computer, recording the register name, data and time if difference is found, replacing the new value for the constant, and repeating said steps until computer is dead halted. Its apparatus is composed of front-end single-board computer with the CPU to be tested, far from other chips and shielded, and main control computer. Its advantages are high test speed and reliability, and correct records of register name,time,event number, etc.
Description
The present invention relates to a kind of method of testing and device of CPU register bit reverse caused by single particle effect.
Along with science and technology development such as China's space flight, nuclear weapon, nuclear submarines, the research of the radiation effect of large-scale computer cpu chip is also increasingly important, because these chips are the control core of certain part often, in case out of control will bringing about great losses, so how to simulate the radiation environment of this chip, and the various phenomenons that its radiation produces are carried out some tests and analysis, will have crucial meaning.Usually, semiconductor electronic part under radiation environment, different along with kinds of radiation and radiation dose, it may produce displacement effect, ionisation effect, surface effect, these effects all can be directed at permanent, the semipermanent or instantaneous damage of semiconductor.For bipolar transistor, generally use common emitter current gain h
FECharacterize its Δ (l/h
FE) be directly proportional i.e. Δ (l/h with radiation flux Ф
FE)=k Ф, wherein K is a Damage coefficient, so the permanent damage K that causes for neutron, proton and electron institute will be a well damage sign amount.Transient-radiation effect mainly shows as and the induced photocurrent effect occurs.But it is an electronic system as the large scale integrated circuit cpu chip, the radiation effect that on ten hundreds of transistors, produces, also to consider the radiation effect of circuit, and the instantaneous photocurrent that the parasitism between each unit components and parts is tied and parasitic transistor causes, also have passive device, they also can produce radiation effect; Therefore the radiation effect of cpu chip will be a very complicated process.Present trend is to set up the radiation effect model, analyzes with mathematical model.In experiment, the macroscopic appearance of its radiation effect of trend test, as: single particle effect SEE (Slngle Event Efect) wherein again based on the research of single-particle bit flipping SEU (Slngle Event Upest) and single event latchup SEL (Slngle Event Latchup).The common in the world popular following five kinds of methods of inspection of the SEU test of microprocessor: (1) unicomputer self check method (Self-test Single Computer method): with the configuration of single computing machine, check microprocessor, as use single board computer (Single Board Computer), its processor possesses " self check (Self-Tests) " function, and self-detection result can be shown by CRT or the simple LED demonstration.(2) the unicomputer method of additional controller: peripheral control unit is by constantly relatively inquiring about the work of microprocessor with an external memory storage that has " true value ".(3) the auxiliary Golden Chlp method of controller: the microprocessor that peripheral control unit comparison is checked and the output of one " standard " (Golden Chlp) microprocessor, they all move identical program.More than in three kinds of methods, tested microprocessor all is when their need, extracts the instruction that is stored in the storer (RAM or ROM) automatically.(4) single computor method (the Controller Domlnated of controller domination, Slngle Computer Method): controller " is taken over " function of the storer of (take over) single computing machine, when tested microprocessor need extract instruction, introduce instruction by controller, " force-fed " is passive to call in so instruct, in fact tested microprocessor is single step successively (Slngle-steps) operation in given program, inquires about the output in each step with a controller.(5) Golden Chlp method (the Controller Domlnted of controller domination, Golden Chip method): this is another kind of single-step process, the inquiry of upset comprises the output of more tested microprocessor and the output of " standard " microprocessor (Golden Chlp), and this standard C PU is operated under the identical program.By controller memory error data, in said method, except (1) plants, restriction when all controlled device of remaining operating rate " is shaken hands " (handshake) communication, controller is a miniature or small-size computer normally, it needs several delicate (Tens of mlcroseconds) to collect and store data, therefore the clock frequency of a DUT (Devlce Under Test) must be interrupted, when controller was collected roll data, the notion of " average clock frequency " was induced one to be in order to refer in particular to average clock frequency (average clock rate) in round of visits.
The objective of the invention is for provide a kind of can analogue simulation and test single-particle bit flipping effect, and can obtain in real time, the method for testing of the CPU register bit reverse caused by single particle effect of comparative analysis data.
Another object of the present invention also is to provide a kind of to be had only tested CPU to receive irradiation and guarantees that bit flipping produces the unicity in source, and each content of registers and can sending at any time of constantly testing oneself, and data processing section can obtain in real time, the continuous proving installation of the CPU register bit reverse caused by single particle effect of comparative analysis and real time record flip-flop transition, register type and data.
Purpose of the present invention can realize by following measure:
A kind of single-particle should cause the method for testing of CPU register-bit upset, contains following step:
---store a bitmap that is easy to the observation bit upset in advance for each register of the CPU of tested front end sheet of veneer, and desire is carried out the program that reads each register-bit roll data deposit in the ROM storer of tested CPU single card microcomputer;
---desire is carried out the program that data obtain and handle deposit in the program storage of main control computing machine;
---tested CPU is placed radiation environment;
---start the tested CPU of main control computer and front end single card microcomputer, under the control of tested CPU, enable the program among the ROM, read the content of each register of tested CPU successively, and transfer to main control system;
---principal computer receives the data that transmit from tested front end single card microcomputer by the Data Acquisition And Processing Program in its program storage, and itself and " true value " that deposited in the host memory are compared; The identical then record not in back relatively; Represent that as difference bit flipping has taken place register, then time, register name and the data of bit flipping itself take place in record, and with it as the former initial value of data next time;
---repeat above-mentioned steps until latch-up phenomenon or deadlock; Then use the hard clear switch of far-end of tested CPU, restart until end of test (EOT).
A kind of proving installation of CPU register bit reverse caused by single particle effect contains main control computer and PC interface board; This device also comprises tested front end single card microcomputer; Tested CPU and register thereof, clock chip, code translator, timing chip and parallel common interface chip are housed on the front end single card microcomputer; The ROM storer that each register-bit roll-over procedure of tested CPU is read in storage also is housed; The conductively-closed of front end single card microcomputer has only tested CPU to place radiation environment.
Purpose of the present invention also can realize by following measure:
The bitmap of storing in the method for testing of CPU register bit reverse caused by single particle effect each register of tested CPU in advance can be FFFF, OAOA, class heuristicimal code such as 0505.
Its proving installation also is provided with one on main control computer can the tested CPU locking of long-range hard removing or the hard clear switch of deadlock.
The present invention has following advantage compared to existing technology:
1, method of testing of the present invention is compared the restriction that is not subjected to " shaking hands " with additive method, can test the bit flipping effect that single particle effect causes quickly and easily.
2, device of the present invention can be accurately, the bitmap after the time that bit flipping took place, register name, incident number and the upset that are produced of record particle effect in time; Be convenient to off-line analysis and deal with data.
3, the situation of device of the present invention qualitative observation can be on computer screen directly perceived, monitoring bit flipping.
4, single particle effect can be observed and test to device of the present invention under the irradiation of accelerator line.
5, device of the present invention is owing to parallel and " shaking hands " mode are adopted in communication between principal computer and the front end single card microcomputer; Thereby its test speed is fast, and data are reliable, the bit error rate is extremely low.
Concrete structure of the present invention is provided by the following drawings:
Fig. 1 is a proving installation structural representation of the present invention
The tested CPU 3-of 1-front end single card microcomputer 2-clock chip 4-code translator 5-timing chip
The 6-common interface chip 7-PC machine interface board 8-main control system 9-ROM storer that walks abreast
The 10-register
Fig. 2 is the process flow diagram that reads each register-bit roll-over procedure in the ROM storer of the present invention
Fig. 3 is the process flow diagram of the Data Acquisition And Processing Program of main control system of the present invention
The present invention also incites somebody to action in conjunction with the accompanying drawings, and embodiment is described in further detail:
Embodiment:
A kind of single-particle should cause that the method for testing of CPU register-bit upset contains following step:
---give the CPU of tested front end single card microcomputer 1
2Each register 10 store bitmap FFFF, an OAOA who is easy to observation bit upset, class heuristicimal code such as 0505 in advance; And desire is carried out the program read each register 10 bit flipping data deposit in the ROM storer 9 of tested CPU single card microcomputer;
---desire is carried out the program that data obtain and handle deposit in the program storage of main control computing machine 8;
---tested CPU is placed radiation environment;
---start the tested CPU of main control computer 8 and front end single card microcomputer 1
2, at tested CPU
2Control under, enable ROM
9In program, read tested CPU successively
2The content of each register 10, and transfer to main control system 8;
---principal computer 8 receives the data that transmit from tested front end single card microcomputer 1 by the Data Acquisition And Processing Program in its program storage, and itself and " true value " that deposited in main frame 8 internal memories are compared; The identical then record not in back relatively; Represent that as difference bit flipping has taken place register 10, then 10 in time, register and the data itself of bit flipping take place in record, and with it as the former initial value of data next time;
---repeat above-mentioned steps until latch-up phenomenon or deadlock; Then use the hard clear switch of far-end of tested CPU, restart until end of test (EOT).
With reference to Fig. 1, the proving installation of CPU register bit reverse caused by single particle effect contains main control computer 8 and PC interface board 7; This device also comprises tested front end single card microcomputer 1; Tested CPU is housed on front end single card microcomputer 1
2And register 10, clock chip 3, code translator 4, timing chip 5 and parallel common interface chip 6; Storage also is housed reads tested CPU
2The ROM of each register 10 bit flipping program
9Storer; Other elements on the front end single card microcomputer 1 are away from tested CPU
2And conductively-closed has only tested CPU
10Place radiation environment; Also being provided with one on main control computer 8 can the tested CPU of long-range hard removing
2The hard clear switch of locking or deadlock; The PC interface board 7 of main control computer 8 connects with the concentric cable of parallel common interface chip 6 by 10m50 Ω.
With reference to Fig. 2, being described as follows of ROM process flow diagram: start-up control main frame 8 and tested CPU
2, the program start of main control system 8 provides the parallel common interface chip 8255 of a control word CTL and inputs to tested CPU
2, as control word CTL=F
1, then the ROM procedure Selection is tested CPU
80C
86The bit flipping of register, initialization 8255 then, the tested CPU of initialization
80C
86Each register 10; The identification code F (R1) that chooses the 1st register 10 then is sent to main frame 8 by 8255 A mouth, judge whether main frame receives identification code, "No" then resends, and "Yes" then reads the content C (R1) of the 1st register 10 and is sent to main frame 8 by 8255 A mouth; Judge whether to be sent to main frame 8, "No" then resends again, and "Yes" then begins the test of 1+1 register, be back to choose 1+1 register 10 identification code until end of test (EOT).
With reference to Fig. 3, being described as follows of the Data Acquisition And Processing Program process flow diagram of main frame 8: main frame 8 and tested CPU
2After the startup, the program of main frame 8 begins startup and enters initialization, and $A is as being F in input
1, then main frame 8 procedure Selection are obtained, and handle tested CPU
2Register 10 data that send; At first check the tested CPU content of registers R1 of host memory storage, the F that reception is read by the ROM program (R1) is from the buffer status identification code F1 of 8255 inputs, judge whether F1 equals the 1st register of main frame, "No" is then returned again and is received, and "Yes" then procedure Selection enters 1 processing subroutine; Receive the content R1 of the 1st register that the ROM program reads then, judge whether R1 equals R1
-1When receiving (promptly for the first time is the initial value of main frame), "No" then with R1 as the initial value that compares next time, and time, register name and data and the demonstration of bit flipping take place in the deposit record; "Yes" then shows; Then return after the demonstration and receive the next register identification code F that sends
1+1, so repeatedly until end of test (EOT).
Above-mentioned two process flow diagrams carry out circulation time, locking or deadlock occur as CPU, then remove with hard clear switch, restart.Because radiation effect is not only to occur over just in each register that CPU can measure, and may appear in other link, thereby the present invention also can test the bit flipping effect of timing chip 8254 yet.
The ROM program adopts assembly language to write, and its critical subroutine mainly contains:
1, sends the program of bitmap
ORG?
0A
60H
TST
1：MOV?AL，
82H
OUT?
0D
7H，AL ； [01]AX
2299
INT：?MOV?BL，
11H ；03 [02]BX
8811
MOV?BH，
88H ；04 [03]CXaaaa
MOV?CL，
0AAH ；05 [04]DX
005f
MOV?CH，
0AAH ；06 [05]BP
00FF
MOV?DL，
05FH ；07 [06]DI
2299
MOV?DH，
00H ；08 [07]SP
00ff
MOV?BP，
00FFH ；
0B-
0C [08]SIff
00
MOV?DI，
2299H ；
09-0A [09]CS
9922
MOV?SP，
00FFH ；
0D-
0E [10]DS
2299
MOV?SI，
0FF
00H ；
0F
-10 [11]SS
00FF
MOV?DS，DI ；11-12 [12]ESaaaa
MOV?SS，BP ；15-16 [13]FL4
6，47
MOV?ES，CX ；17-18
LAHF ；19
JMP?J
2
2, read the subroutine of B, C register data
J
1：IN AL，
0D
3H
CMP?AL，
01H
JZ INI
；；；；；；；；；B?B?B?B?；；；L?L?L?L?L?；；；；；；；；；；；；；；；；J
2：MOV?AL，
030H
OUT?
0D
5H，AL
MOVAL，BL
OUT?
0D
1H，AL
DEC DL
JN2?J
2
MOV?DL，
5FH；；；；；；；；；B?B?B?B?B?；；；H?H?H?H?H?；；；；；；；；；；；；；；；；；J
3：MOV?AL，
040H
OUT?
0D
5H，AL
MOV?AL，BH
OUT?
0D
1H，AL
DEC?DL
JNZ?J
3
MOV?DL，
5FH；；；；；；；；；C?C?C?C?C?；；；L?L?L?L?L；；；；；；；；；；；；；；；；；J
4：MOV?AL，
050H
OUT?
0D
5H，AL
MOV?AL，CL
OUT?OD
1H，AL
DEC?DL
JNZ?J
4
MOV?DL，
5FH；；；；；；；；；C?C?C?C?C；；；H?H?H?H?H；；；；；；；；；?；?；?；；；；；；J
5：MOV?AL，
06
0H
OUT?
0D
5H，AL
MOV?AL，CH
OUT?
0D
1H，AL
DEC?DL
JNZ?J
5
MOV?DL，
5FH
Host data obtains with handling procedure and adopts Turbo C language to weave into, and its function of mainly creating has:
Vold lntlallze (Vold) initialization
Vold user-lnterrupt-test (Vold) user is interrupted check
Vold textbox (Vold) creates user interface
Vold putvsca (Vold) creates the function that constantly refreshes picture
Int getkey () hot key is handled function
Vold lookroad () program branches control letter system
Locat (lnt x, int y) mapping function
Vold?changetextstyle(lnt?font，
Int dlrectlon, lnt charslze) change text output format function
Int?gprlnt(lat?*xloc，
Int Yloc, char * fmt) the graph text printf
Claims (4)
1, a kind of method of testing of CPU register bit reverse caused by single particle effect is characterized in that this method contains following step:
---store a bitmap that is easy to the observation bit upset in advance for each register (10) of the CPU (2) of tested front end single card microcomputer (1), and desire is carried out the program that reads each register (10) bit flipping data deposit in the ROM storer (9) of tested CPU;
---desire is carried out the program that data obtain and handle deposit in the program storage of main control computing machine (8);
---tested CPU is placed radiation environment;
---start the tested CPU (2) of main control computer (8) and front end single card microcomputer (1), under the control of tested CPU (2), enable the program among the ROM (9), read the content of each register (10) of tested CPU (2) successively, and transfer to main control system (8);
---principal computer (8) receives the data that transmit from tested front end single card microcomputer (1) by the Data Acquisition And Processing Program in its program storage, and with its with exist " true value " in main frame (8) internal memory to compare; The identical then record not in back relatively; Represent that as difference bit flipping has taken place register (10), then time, register (10) name and the data itself of bit flipping take place in record, and with it as the former initial value of data next time;
---repeat above-mentioned steps until latch-up phenomenon or deadlock; Then use the hard clear switch of far-end of tested CPU (2), restart until end of test (EOT).
2, the method for testing of CPU register bit reverse caused by single particle effect as claimed in claim 1 is characterized in that can be FFFF, OAOA, 0505 class heuristicimal code to the bitmap that each register (10) of tested CPU (2) is stored in advance.
3, a kind of proving installation of CPU register bit reverse caused by single particle effect contains main control computer (8) and PC interface board (7); It is characterized in that this device also comprises tested front end single card microcomputer (1); Tested CPU (2) and register (10) thereof, clock chip (3), code translator (4), timing chip (5) and parallel common interface chip (6) are housed on front end single card microcomputer (1); ROM (9) storer that each register of tested CPU (2) (10) bit flipping program is read in storage also is housed; Front end single card microcomputer (1) conductively-closed has only tested CPU (10) to place radiation environment.
4, the proving installation of CPU register bit reverse caused by single particle effect as claimed in claim 1, it is characterized in that also being provided with on main control computer (8) one can long-range hard removing tested CPU (2) locking or the hard clear switch of deadlock.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 96111451 CN1183564A (en) | 1996-11-22 | 1996-11-22 | Method and apparatus for testing CPU register bit reverse caused by single particle effect |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 96111451 CN1183564A (en) | 1996-11-22 | 1996-11-22 | Method and apparatus for testing CPU register bit reverse caused by single particle effect |
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|---|---|
| CN1183564A true CN1183564A (en) | 1998-06-03 |
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| CN 96111451 Pending CN1183564A (en) | 1996-11-22 | 1996-11-22 | Method and apparatus for testing CPU register bit reverse caused by single particle effect |
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Cited By (17)
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|---|---|---|---|---|
| CN1101023C (en) * | 1999-12-29 | 2003-02-05 | 中国科学院上海冶金研究所 | Tester and test method for single-particle inversion fault-tolerant capability of software for satellite carried computer |
| CN1760676B (en) * | 2004-10-14 | 2010-04-28 | 中国科学院空间科学与应用研究中心 | Detector and method for detecting capability of microprocessor for anti event of single particle |
| CN101833064A (en) * | 2010-05-05 | 2010-09-15 | 中国人民解放军国防科学技术大学 | Experimental system for simulating single event effect (SEE) of pulse laser based on optical fiber probe |
| CN101551763B (en) * | 2009-05-15 | 2010-10-20 | 中国人民解放军国防科学技术大学 | Method and device for repairing single event upset in field programmable logic gate array |
| CN102096627A (en) * | 2009-12-11 | 2011-06-15 | 上海卫星工程研究所 | Device for testing single event upset fault resistance of on-board software |
| CN102175248A (en) * | 2011-01-25 | 2011-09-07 | 哈尔滨工业大学 | Pulsar signal detector based on single event effect |
| CN102402475A (en) * | 2010-09-15 | 2012-04-04 | 北京圣涛平试验工程技术研究院有限责任公司 | CPU (Central Processing Unit) single event effect testing method for space navigation |
| CN102521467A (en) * | 2011-12-29 | 2012-06-27 | 北京航空航天大学 | Bit-by-bit upset fault injection method specifically for SRAM (static random access memory) type FPGA (field programmable gate array) |
| CN102540062A (en) * | 2011-12-29 | 2012-07-04 | 北京航空航天大学 | Random flip fault injection method aiming at SRAM (Static Random Access Memory) type FPGA (Field Programmable Gate Array) |
| CN103033524A (en) * | 2012-12-31 | 2013-04-10 | 中国科学院微电子研究所 | Detection method for single-particle radiation effect |
| CN103675546A (en) * | 2013-12-11 | 2014-03-26 | 北京时代民芯科技有限公司 | Single event effect detecting device of image sensor |
| CN105589780A (en) * | 2014-10-22 | 2016-05-18 | 北京圣涛平试验工程技术研究院有限责任公司 | Neutron single event effect testing method of CPU |
| CN105590651A (en) * | 2014-10-22 | 2016-05-18 | 北京圣涛平试验工程技术研究院有限责任公司 | DRAM (dynamic random access memory) neutron single event effect test method |
| CN105590653A (en) * | 2014-10-22 | 2016-05-18 | 北京圣涛平试验工程技术研究院有限责任公司 | Neutron single event effect testing method of a SRAM type FPGA |
| CN107741559A (en) * | 2017-10-12 | 2018-02-27 | 电子科技大学 | Single-particle inversion test system and method under a kind of space-oriented radiation environment |
| CN110691979A (en) * | 2017-06-05 | 2020-01-14 | 富士通株式会社 | Soft error checking method, soft error checking device and soft error checking system |
| CN113125943A (en) * | 2020-11-05 | 2021-07-16 | 中国科学院上海微系统与信息技术研究所 | FPGA radiation test module, ASIC chip radiation resistance evaluation system and method |
-
1996
- 1996-11-22 CN CN 96111451 patent/CN1183564A/en active Pending
Cited By (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1101023C (en) * | 1999-12-29 | 2003-02-05 | 中国科学院上海冶金研究所 | Tester and test method for single-particle inversion fault-tolerant capability of software for satellite carried computer |
| CN1760676B (en) * | 2004-10-14 | 2010-04-28 | 中国科学院空间科学与应用研究中心 | Detector and method for detecting capability of microprocessor for anti event of single particle |
| CN101551763B (en) * | 2009-05-15 | 2010-10-20 | 中国人民解放军国防科学技术大学 | Method and device for repairing single event upset in field programmable logic gate array |
| CN102096627A (en) * | 2009-12-11 | 2011-06-15 | 上海卫星工程研究所 | Device for testing single event upset fault resistance of on-board software |
| CN101833064A (en) * | 2010-05-05 | 2010-09-15 | 中国人民解放军国防科学技术大学 | Experimental system for simulating single event effect (SEE) of pulse laser based on optical fiber probe |
| CN101833064B (en) * | 2010-05-05 | 2012-09-05 | 中国人民解放军国防科学技术大学 | Experimental system for simulating single event effect (SEE) of pulse laser based on optical fiber probe |
| CN102402475B (en) * | 2010-09-15 | 2014-12-03 | 北京圣涛平试验工程技术研究院有限责任公司 | CPU (Central Processing Unit) single event effect testing method for space navigation |
| CN102402475A (en) * | 2010-09-15 | 2012-04-04 | 北京圣涛平试验工程技术研究院有限责任公司 | CPU (Central Processing Unit) single event effect testing method for space navigation |
| CN102175248A (en) * | 2011-01-25 | 2011-09-07 | 哈尔滨工业大学 | Pulsar signal detector based on single event effect |
| CN102521467A (en) * | 2011-12-29 | 2012-06-27 | 北京航空航天大学 | Bit-by-bit upset fault injection method specifically for SRAM (static random access memory) type FPGA (field programmable gate array) |
| CN102540062A (en) * | 2011-12-29 | 2012-07-04 | 北京航空航天大学 | Random flip fault injection method aiming at SRAM (Static Random Access Memory) type FPGA (Field Programmable Gate Array) |
| CN102521467B (en) * | 2011-12-29 | 2013-04-24 | 北京航空航天大学 | Bit-by-bit upset fault injection method specifically for SRAM (static random access memory) type FPGA (field programmable gate array) |
| CN103033524A (en) * | 2012-12-31 | 2013-04-10 | 中国科学院微电子研究所 | Detection method for single-particle radiation effect |
| CN103675546A (en) * | 2013-12-11 | 2014-03-26 | 北京时代民芯科技有限公司 | Single event effect detecting device of image sensor |
| CN103675546B (en) * | 2013-12-11 | 2016-07-06 | 北京时代民芯科技有限公司 | The single particle effect detecting device of imageing sensor |
| CN105589780A (en) * | 2014-10-22 | 2016-05-18 | 北京圣涛平试验工程技术研究院有限责任公司 | Neutron single event effect testing method of CPU |
| CN105590651A (en) * | 2014-10-22 | 2016-05-18 | 北京圣涛平试验工程技术研究院有限责任公司 | DRAM (dynamic random access memory) neutron single event effect test method |
| CN105590653A (en) * | 2014-10-22 | 2016-05-18 | 北京圣涛平试验工程技术研究院有限责任公司 | Neutron single event effect testing method of a SRAM type FPGA |
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