CN1760676B - Detector and method for detecting capability of microprocessor for anti event of single particle - Google Patents
Detector and method for detecting capability of microprocessor for anti event of single particle Download PDFInfo
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- CN1760676B CN1760676B CN 200410083647 CN200410083647A CN1760676B CN 1760676 B CN1760676 B CN 1760676B CN 200410083647 CN200410083647 CN 200410083647 CN 200410083647 A CN200410083647 A CN 200410083647A CN 1760676 B CN1760676 B CN 1760676B
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Abstract
The detector includes monitor system board, test board, and power board. The method includes monitoring part and part of microprocessor to be tested. The monitoring part includes (1) controlling reset operation of microprocessor to be tested as a sensor; (2) receiving data sent from microprocessor as a sensor regularly; (3) receiving data of event of single particle obtained through self-testing by microprocessor; (4) collecting working current of system to be tested through current limiter; (5) sending data of recording event of single particle to a remote measuring system. The microprocessor part includes (1) monitoring flip event of single particle in internal registers and data memory; (2) capturing program of gone astray caused by flip event of single particle; (3) sending data of recording event of single particle to the monitoring system; sending prearranged data to the monitoring system timely to indicate that system is running normally.
Description
Technical field
The present invention relates to the space exploration technical field, particularly a kind of detector and method that detects capability of microprocessor for anti event of single particle.
Background technology
Single event is the single high energy particle in space, comprise heavy ion, high energy proton, high energy electron or neutron bombardment microelectronic component, cause the incident of upset of microelectronic component logic function or device failure, mainly contain single event upset and single event latchup.Single-particle inversion be high energy charged particles in semi-conductor chip ionizing event and the upset of the data bit that causes.Locking single particle is the electronic devices and components deadlock that high energy charged particles causes.Along with microelectronic component obtains more and more widely application in aerospace engineering, and the integrated level of microelectronic component is more and more higher, and single event is also increasing to the threat of aerospace engineering, and the consequence of being brought is serious.
Computer system is often being undertaken extremely important task in aerospace engineering, CPU is again the heart of computing machine, single event upset takes place as it, will cause program to move towards chaotic, making the computing machine can't operate as normal, be exactly how to prevent computer circuits chip generation single event so press for the realistic problem of solution now.Should select the stronger CPU of anti event of single particle ability for use from the angle of aerospace engineering, and take necessary countermeasure and safeguard procedures, reduce the occurrence probability of single event, avoid taking place locking phenomena, improve the reliability of spacecraft, prolong operational lifetime of spacecraft, the final purpose that realizes improving the spacecraft benefit just becomes the task of top priority.At present, domestic first microprocessor of 16 bit 1750A has developed and has finished, owing to be new product, awaits by verifying its anti-irradiation ability.For this reason, designed the detector of this detection 1750A anti event of single particle ability, can satisfy the requirement of aerospace engineering, can provide it to space flight department as the reference of CPU being carried out type selecting to the anti-irradiation ability of device as its test findings.
At present, the detection instrument of the anti-irradiation ability of checking CPU often just test single event by the method for using hardware circuit monitoring cpu address line, and this method also only is confined to test single event upset.The present invention combines the software and hardware verification method, has added the software protecting measure in software design.Utilize this kind method both to simplify hardware circuit design, reduced effectively again and only used the single event of tested CPU usually, both monitor single event thereby reached, again the purpose of verifying software safeguard procedures validity himself register testing test leakage.And in the present invention, by using restrictor to monitor the method for tested cpu system working current, the more effective single event latchup of having tested.The present invention can and be loaded in the anti event of single particle ability of carrying out verifying in the method that the rail test combines CPU on the satellite by ground simulation test, and test is abundant, and data are detailed, and its test figure can be used as space flight department carries out type selecting to CPU important references.And design versatility of the present invention is higher, only needs to change a little, promptly can be used for detecting the anti event of single particle ability of other classification CPU.
Summary of the invention
The object of the present invention is to provide a kind of detector and method that detects capability of microprocessor for anti event of single particle.Particularly a kind of detector that detects microprocessor 1750A anti event of single particle ability in conjunction with the software protecting measure, by being loaded in this detector on the satellite or carrying out ground simulation test, obtain the measurement result of the single event upset probability and the computer system generation locking single particle of this device, test figure can be used as space flight department carries out type selecting to CPU reference.
The key of the present invention's design has two aspects: the one, and the method for testing of CPU single event; The 2nd, software protecting measure and validity test thereof.
The present invention designs according to the requirement of making the space flight instrument, and institute's employing components and parts are except that test device, and all the other all select the military products device for use.In order effectively to reduce single CPU self-test owing to move the detection error that self testing procedure brings, the test of this instrument CPU single-particle inversion adopts tested CPU self-testing system to combine with the computer monitor control system of an outside, is aided with the integrated test facility of software protecting measure.Promptly this detector is made up of 2 cover cpu subsystems, and they are respectively Monitoring and Controlling CPU (adopt at present CPU be 80C31) subsystems, reach tested cpu subsystem, promptly homemade 1750A system.
Detector is by being loaded on the satellite or carrying out ground simulation test and detect homemade microprocessor of 16 bit 1750A anti event of single particle ability.
Whole detector is by cabinet, base plate, a barricade, three functional modules, and promptly supervisory system plate, breadboard, power panel are formed.
The supervisory system plate is by 80C31 microprocessor, program storage, data-carrier store, address latch, address decoder, logic control, A/D converter, compositions such as I/O interface and watchdog circuit, be used for system under test (SUT) (sensor) is carried out monitoring record, data management and control, connect by bus.
Breadboard is by tested microprocessor 1750A, program storage, data-carrier store, address latch, address decoder, logic control, watchdog circuit, form with the interface circuit of monitoring 80C31 subsystem etc.
Power panel is made up of power module, power filter, relay, restrictor etc.
Detect the detector of capability of microprocessor for anti event of single particle, the supervisory system plate also comprises: telemetry interface and switch control interface are connected in the external data receiving system by telemetry interface, and are connected in power panel by the switch control interface.
The switch control interface is connected in the relay of power panel.
Power panel is connected to supervisory system plate and breadboard.
The restrictor of power panel is connected in the current monitoring circuit of breadboard and supervisory system plate.
Description of drawings
In order to further specify technology contents of the present invention, below in conjunction with accompanying drawing describe in detail as after, wherein:
Fig. 1 is a detector principle of work block diagram of the present invention;
Fig. 2 is a detector monitors subprogram process flow diagram of the present invention;
Fig. 3 is the tested microprocessor system program flow diagram of detector of the present invention;
Fig. 4 is a detector power-supply system electrical schematic diagram of the present invention.
Embodiment
As shown in Figure 1, the tested microprocessor 1750A of a slice in the native system and is equipped with the program storage (PROM) that adds the safeguard measure program, and data-carrier store (RAM) and other peripheral circuit constitute a system, as the sensor of monitoring single-particle inversion; A slice 80C31 microprocessor, program storage (PROM), data-carrier store (RAM), A/D converter and other peripheral circuits constitute monitor portion; after this part is installed in barricade; barricade is the aluminium sheet of thickness 3mm, and this barricade plays the effect of isolating the anti-radiation protection supervisory system.
80C31 system works step as monitor portion is as follows: referring to Fig. 2.
Step S2-1, control resets as the tested microprocessor of sensor;
Step S2-2, regularly receive the data of sending here as the tested microprocessor of sensor, and the result of relatively its output identical with expection whether, if in limiting time, do not receive or receive wrong data, think that then system under test (SUT) is subjected to single event and influences the program run confusion, just note the time of this moment, and calculate the stored count (begin certainly accumulative total) that causes system mistake by single event, and to tested microprocessor enforcement reset operation, judge then that as continuous 30 no responses chip under test thoroughly lost efficacy, to thoroughly close system under test (SUT) this moment, no longer carry out reset operation;
Step S2-3, the single event data that reception is obtained by tested microprocessor self-test, include deadlock, automatically reset and internal register, data-carrier store ram cell generation single-particle inversion, and the program of utilizing necessary software protecting measure the to correct single event walking to fly, as monitor out above-mentioned situation, system will note the time of this moment, and calculate the stored count of system under test (SUT) generation single event, distinguish event type, and the packet of this recording events is kept among the data-carrier store RAM, wait for and sending by telemetry interface;
Step S2-4, pass through restrictor, collection is as the working current of the system under test (SUT) of sensor, excessive undesired as electric current, promptly single event latchup might take place, system will gather the primary current value every 1 second this moment, adopt continuously three times, and calculate the stored count that causes system mistake by single event, and three current values are formed a packet together with the time of stored count, identification code, generation incident, the classification indication code of this incident, be kept among the data-carrier store RAM, wait for and sending by telemetry interface; By relay tested microprocessor system is closed simultaneously and restart operation, as restart operation 30 times, electric current is still undesired, then has device failure, and will thoroughly close system under test (SUT) this moment, no longer carry out reboot operation;
Step S2-5 send the single event record data to give telemetry system by telemetry interface, and this telemetry system is the ground test receiving equipment when ground experiment, is satellite remote terminal data control system during the dress star.This process is finished by supervisory system CPU interrupt response, promptly sending data strobe signal by telemetry system makes supervisory system 80C31CPU produce an external interrupt, supervisory system CPU just suspends monitoring, and beginning sends data to telemetry system, continues monitoring after finishing.
Tested microprocessor system job step is as follows: referring to Fig. 3.
Step S3-1, the single event upset of tested microprocessor internal register of self-test and data-carrier store RAM;
Step S3-2, catch because the program that single-particle inversion causes is walked to fly, and it is normal to correct its program recovery by the software protecting measure, the software protecting measure has effectively reduced only uses the single event of tested CPU to himself register testing test leakage usually, this self-protection ability, the moment soft fault that software systems are caused for single-particle can be discerned and handle; For program walk to fly, deadlock, system can recover, and backrush is carried out;
Step S3-3 send the single event record data to give supervisory system;
Step S3-4 regularly send tentation data to give supervisory system, shows that system's operation is normal;
The detector power system design adopts the secondary power supply power supply mode as shown in Figure 4, also is placed on after the barricade.Major technique comprises:
A. secondary power supply adopts the DC/DC power module, is input as+28V, is output as+5V, and it has the over-current over-voltage protection measure to primary power source, and the overcurrent protection current design is 1A.
B. adopt the current-limiting resistance protection between secondary power supply and the primary power source, in case filter-capacitor circuit lost efficacy, current-limiting resistance will burn till high value resistor, can effectively realize fault isolation.
C. secondary power supply is divided into duplex feeding, and two-way all has power module and power filter alone, one road supplying monitoring system wherein, and tested system is supplied with on another road.So design when in a single day single event takes place in tested system, causes electric current increase or device failure etc., can effectively isolate its influence to supervisory system, even tested thrashing, supervisory system still can work on.
D. using restrictor and relay with system under test (SUT) power interface place.
E. restrictor can effectively detect the system under test (SUT) electric current, and current signal is changed the CPU that is transferred to supervisory system by A/D, realizes the current monitoring to system under test (SUT), in order to the monitoring single event latchup.
F. relay is the power switch of system under test (SUT); send the switch order signal by supervisory system CPU and come pilot relay; realization is to the switch control of tested system; can effectively when locking takes place tested microprocessor 1750A, carry out switching manipulation to it; play the protection entire circuit, make it avoid causing electric current to increase and the influence of burning circuit by single event latchup.
This detector can be loaded on the satellite, and tested microprocessor system (sensor) is installed in by satellite covering place, by in the rail flight test, verifies the anti-irradiation ability of this test device.Because it is big to carry out the cost of primary space flight test, chance is few, so also can carry out simulation test on ground to this detector, by test, obtains single event upset rate, the upset cross section of this test device, by calculating its anti-irradiation ability of checking.
The inventive point of this detector is:
A. the present invention adopts tested CPU self-testing system to combine with the computer monitor control system of an outside, the integrated test facility that is aided with the software protecting measure, effectively reduced and only used the single event of tested CPU usually, and simplified hardware design himself register testing test leakage.
B. power-supply system is divided into duplex feeding, and two-way all has power module and power filter alone, one road supplying monitoring system wherein, and tested system is supplied with on another road.Effectively isolate system under test (SUT) and supervisory system, even tested thrashing, supervisory system still can work on.
C. use restrictor to detect the system under test (SUT) electric current, in order to the monitoring single event latchup.
D. supervisory system can realize the power switch of tested system is controlled by relay; can effectively when locking takes place tested microprocessor, carry out switching manipulation to it; play the protection entire circuit, make it avoid causing electric current to increase and the influence of burning circuit by single event latchup.
E. with single event record according to classify different of form of taking place with the position, in addition different classification sign indicating numbers makes the staff can make judgement apace, convenient research.
Claims (5)
1. a detector that detects capability of microprocessor for anti event of single particle is made up of supervisory system plate, breadboard, power panel, it is characterized in that,
The supervisory system plate is used for system under test (SUT) is carried out monitoring record, data management and control, comprises by the first bus microprocessor linked, first program storage, first data-carrier store, address latch, address decoder, logic control, A/D converter, I/O interface, watchdog circuit and switch control interface;
Breadboard comprises the tested microprocessor, second program storage, second data-carrier store and the interface circuit that connect by second bus, and wherein interface circuit is used for being connected with the supervisory system plate;
Power panel, be used to the power supply of supervisory system plate and breadboard, wherein the part for the power supply of supervisory system plate comprises a RC filtering, first power filter and the first power module D/C that connects successively, comprises the 2nd RC filtering, second source filtering, second source module D/C, relay and the restrictor of connection successively for the part of breadboard power supply;
The supervisory system plate is connected with breadboard by data bus, and is connected in power panel by the switch control interface.
2. according to the detector of the detection capability of microprocessor for anti event of single particle of claim 1, it is characterized in that the supervisory system plate also comprises telemetry interface, and be connected in the external data receiving system by this telemetry interface.
3. according to the detector of the detection capability of microprocessor for anti event of single particle of claim 1, it is characterized in that the switch control interface of described supervisory system plate is connected in the relay of power panel.
4. according to the detector of the detection capability of microprocessor for anti event of single particle of claim 1, it is characterized in that the restrictor of power panel is connected in the tested cpu system current monitoring circuit in the supervisory system plate.
5. according to the detector of the detection capability of microprocessor for anti event of single particle of claim 1, it is characterized in that the microprocessor of supervisory system plate is 80C31.
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| CN 200410083647 CN1760676B (en) | 2004-10-14 | 2004-10-14 | Detector and method for detecting capability of microprocessor for anti event of single particle |
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| CN 200410083647 CN1760676B (en) | 2004-10-14 | 2004-10-14 | Detector and method for detecting capability of microprocessor for anti event of single particle |
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| CN1760676A CN1760676A (en) | 2006-04-19 |
| CN1760676B true CN1760676B (en) | 2010-04-28 |
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Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101694506B (en) * | 2009-10-19 | 2011-07-13 | 中国空间技术研究院 | Device and method for controlling heating temperature of movable type single-particle testing device |
| CN101968652A (en) * | 2010-07-21 | 2011-02-09 | 中国航天科技集团公司第九研究院第七七一研究所 | Detection device and method for microcontroller system device |
| CN103018659B (en) * | 2012-11-26 | 2013-12-25 | 西北核技术研究所 | System and method for testing frequency response of single event effect of processor |
| CN103984401B (en) * | 2014-05-15 | 2016-08-24 | 中国航天科技集团公司第九研究院第七七一研究所 | A kind of embedded space computer single event latch-up is monitored the most in real time and releases device |
| CN104062978B (en) * | 2014-06-26 | 2016-08-17 | 北京控制工程研究所 | A kind of space single-particle that eliminates overturns the method that CPU register pair attitude affects |
| CN104661020A (en) * | 2015-02-11 | 2015-05-27 | 中国科学院长春光学精密机械与物理研究所 | Common ageing test system for visible/infrared detector |
| CN108535626B (en) * | 2017-12-29 | 2021-06-08 | 北京时代民芯科技有限公司 | Full-automatic test device and method for SOC single particle test |
| CN108052420B (en) * | 2018-01-08 | 2021-11-02 | 哈尔滨工业大学 | Zynq-7000-based dual-core ARM processor single event upset resistance protection method |
| CN109003645B (en) * | 2018-06-27 | 2022-01-21 | 山东航天电子技术研究所 | Electronic system on-orbit single event effect verification system |
| CN110667896A (en) * | 2019-10-14 | 2020-01-10 | 深圳航天东方红海特卫星有限公司 | Micro-nano satellite integrated electronic system |
| CN112710913A (en) * | 2020-12-12 | 2021-04-27 | 北京空间飞行器总体设计部 | Two-class multi-type COTS device single event soft error testing hardware system |
| CN113032222B (en) * | 2021-04-13 | 2022-10-28 | 浙江威固信息技术有限责任公司 | Solid state disk resistant to single event functional interruption |
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| CN1183564A (en) * | 1996-11-22 | 1998-06-03 | 中国科学院近代物理研究所 | Method and apparatus for testing CPU register bit reverse caused by single particle effect |
| CN1258043A (en) * | 1999-12-29 | 2000-06-28 | 中国科学院上海冶金研究所 | Tester and test method for single-particle inversion fault-tolerant capability of software for satellite carried computer |
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1183564A (en) * | 1996-11-22 | 1998-06-03 | 中国科学院近代物理研究所 | Method and apparatus for testing CPU register bit reverse caused by single particle effect |
| CN1258043A (en) * | 1999-12-29 | 2000-06-28 | 中国科学院上海冶金研究所 | Tester and test method for single-particle inversion fault-tolerant capability of software for satellite carried computer |
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