CN117871425A - Device and method for measuring short-wave infrared full polarization characteristics of targets based on thermal radiation effect - Google Patents

Abstract

The device and method for measuring the short-wave infrared full polarization characteristics of a target under the thermal radiation effect belong to the field of polarization detection technology, and solve the problem that the prior art lacks the technology for detecting and identifying targets using the short-wave infrared full polarization characteristics in different environmental thermal radiation ratios. The control device, the light source emitting device, the image acquisition device and the high-temperature heating table are all placed in a constant temperature box; the guide rail at the transmitting end and the guide rail at the receiving end are both arc-shaped and arranged oppositely, the guide rail at the transmitting end is used to fix the light source emitting device, the light source emitting device is connected to the first drive motor, the guide rail at the receiving end is used to fix the image acquisition device, and the image acquisition device is connected to the second drive motor; the tunable laser light source is coaxially arranged with the attenuation plate; the short-wave infrared fully automatic polarizer, the cage filter wheel and the short-wave infrared camera are coaxially arranged in sequence; the first drive motor and the second drive motor are both connected to the computer, and the short-wave infrared camera communicates with the computer in both directions.

Description

Device and method for measuring short-wave infrared full polarization characteristics of targets based on thermal radiation effect

Technical Field

The invention relates to the technical field of polarization detection, and in particular to a device and method for measuring short-wave infrared full polarization characteristics of a target due to thermal radiation effect.

Background technique

Traditional short-wave infrared polarization imaging devices can only distinguish between natural and man-made objects by analyzing the polarization characteristics of the target under specific background radiation. However, their target recognition capabilities are still insufficient in complex environments with variable thermal radiation.

At present, the short-wave infrared focal plane detector is equipped with a corresponding polarization optical system, which can realize the polarization imaging mode of time division, aperture division and amplitude division. However, there is a lack of research on the influence of the environment and the thermal radiation effect of the target polarization characteristics. At the same time, although the focal plane polarization imaging system that directly integrates micro-nano polarization elements into the focal plane array has been vigorously developed, most of the research still focuses on the visible light range. At the same time, the structure is relatively complex. Due to the processing error of the polarization element and the great light loss, the extinction ratio and transmittance of this imaging mode also need to be improved. In particular, the polarization extinction ratio, as a key indicator of the polarization imaging system, directly determines the system's polarization analysis ability, anti-interference ability and utilization efficiency of polarization information. Therefore, considering the complexity of the system structure, the working temperature requirements and the extinction ratio requirements, it is urgent to design a time-sharing full-polarization fully automatic imaging device based on the thermal radiation effect, with a simple structure design and a high extinction ratio.

The ambient thermal radiation ratio is the ratio of the ambient thermal radiation intensity to the target's self-heating radiation intensity, which can be expressed macroscopically as the ratio of the ambient temperature to the target temperature. As the ambient thermal radiation affects the infrared polarization characteristics of the target, with the diversification and complexity of the polarization detection environment, some key equipment is often affected by the ambient thermal radiation, which can easily cause interference in infrared polarization detection. Therefore, in different ambient thermal radiations, it is important to use the thermal radiation effect to analyze the full polarization characteristics of the target in different environments.

In summary, the existing technology lacks the technology to detect and identify targets using the full polarization characteristics of short-wave infrared in different environmental thermal radiation ratios.

Summary of the invention

The present invention solves the problem that the prior art lacks a technology for detecting and identifying targets using the short-wave infrared full polarization characteristics in different environmental thermal radiation ratios.

The device for measuring the short-wave infrared full polarization characteristics of a target due to thermal radiation effect of the present invention comprises a constant temperature box, a control device, a light source emitting device, an image acquisition device, a high-temperature heating platform and a computer;

The control device includes a transmitting end guide rail, a receiving end guide rail, a first driving motor and a second driving motor;

The light source emitting device comprises a tunable laser light source and an attenuation plate;

The image acquisition device includes a short-wave infrared fully automatic polarizer, a cage filter wheel and a short-wave infrared camera;

The control device, light source emitting device, image acquisition device and high temperature heating platform are all placed in a constant temperature box;

The transmitting end guide rail and the receiving end guide rail are both arc-shaped and arranged opposite to each other. The transmitting end guide rail is used to fix the light source emitting device, which is connected to the first driving motor. The receiving end guide rail is used to fix the image acquisition device, which is connected to the second driving motor.

The tunable laser light source is coaxially arranged with the attenuation plate;

The short-wave infrared fully automatic polarizer, cage filter wheel and short-wave infrared camera are coaxially arranged in sequence;

The first drive motor and the second drive motor are both connected to a computer, and the short-wave infrared camera communicates with the computer in a two-way manner;

The attenuation sheet has a diameter of 7 mm to 9 mm, a thickness of 1 mm to 1.2 mm, and a light transmittance of 35%;

The short-wave infrared fully automatic polarizer has a diameter of 24 mm to 26 mm, a light aperture of 18 mm to 20 mm, a light transmittance greater than 75%, and a wavelength passing through the short-wave infrared fully automatic polarizer of 0.8 μm to 1.7 μm.

Furthermore, in one embodiment of the present invention, the tunable laser light source has a pulse width of 5 ns, a repetition frequency of 100 Hz, and outputs light with a wavelength of 410 nm to 2300 nm and a line width of 6 cm ^-1 .

Furthermore, in one embodiment of the present invention, the cage filter wheel is equipped with 6 filters, and the central wavelengths of the 6 filters are 808nm, 1064nm, 1200nm, 1300nm, 1400nm and 1500nm respectively.

Furthermore, in one embodiment of the present invention, the spectrum range of the short-wave infrared camera is 0.4 μm to 1.7 μm.

Furthermore, in one embodiment of the present invention, the temperature range of the high temperature heating stage is room temperature to 700°C.

The method for measuring the short-wave infrared full polarization characteristics of a target due to thermal radiation effect of the present invention is implemented by using the device for measuring the short-wave infrared full polarization characteristics of a target due to thermal radiation effect described in the above method, and comprises the following steps:

Step S1, the light emitted by the tunable laser light source is incident on a target located on a high-temperature heating platform after the light intensity is attenuated by an attenuation plate;

Step S2, stabilizing the constant temperature box at -70°C to 150°C, adjusting the light source emitting device to 10° to 70° through the first driving motor, and adjusting the image acquisition device to 10° to 90° through the second driving motor;

Step S3, the light reflected by the target on the high-temperature heating table is polarized in polarization directions of 0°, 60° and 120° through a short-wave infrared fully automatic polarizer;

Step S4, the light polarized by the short-wave infrared fully automatic polarizer is passed through the filter of the cage filter wheel to obtain light of a desired wavelength, so that the light of the wavelength enters the short-wave infrared camera for imaging;

Step S5, changing the filter of the cage filter wheel, and repeating the operations of steps S1 to S4 until the target completes imaging of 6 filters;

Step S6, respectively changing the temperature of the constant temperature box, and the angles of the light source emitting device and the image acquisition device, and repeating the operations of steps S2 to S5;

Step S7, using a computer to extract the grayscale value of the shortwave infrared intensity image obtained by the shortwave infrared camera at different angles, different temperatures, and the same target at polarization directions of 0°, 60° and 120°, and calculate the polarization degree according to the grayscale value.

The present invention solves the problem that the prior art lacks a technology for detecting and identifying targets using the full polarization characteristics of short-wave infrared in different environmental thermal radiation ratios. Specific beneficial effects include:

1. The device for measuring the short-wave infrared full polarization characteristics of a target under the thermal radiation effect of the present invention realizes the acquisition of the short-wave infrared intensity images of the target under different observation angles and different radiation ratios and obtains the polarization information through the mutual coordination among the constant temperature box, the control device, the light source emitting device, the image acquisition device, the high-temperature heating stage and the computer, thereby solving the problem that the prior art lacks a device for detecting and identifying the target under different environmental thermal radiation ratios by using the short-wave infrared full polarization characteristics;

2. The method for measuring the full polarization characteristics of short-wave infrared targets under the thermal radiation effect described in the present invention can quickly collect short-wave infrared intensity images of targets with different radiation ratios at different observation angles and obtain polarization information, thereby saving measurement time and compensating for the influence of solar movement and weather changes when short-wave infrared tests are measured outdoors.

BRIEF DESCRIPTION OF THE DRAWINGS

The above and/or additional aspects and advantages of the present invention will become apparent and easily understood from the following description of the embodiments in conjunction with the accompanying drawings, in which:

1 is a block diagram of the overall structure of a device for measuring short-wave infrared full polarization characteristics of a target due to thermal radiation effect according to Embodiment 1;

FIG2 is a diagram showing the internal structure of the thermostat described in Embodiment 1;

In the figure, 1 is a constant temperature box, 21 is a transmitting end guide rail, 22 is a receiving end guide rail, 23 is a first driving motor, 24 is a second driving motor, 3 is a light source emitting device, 31 is a tunable laser light source, 32 is an attenuation plate, 4 is an image acquisition device, 41 is a short-wave infrared fully automatic polarizer, 42 is a cage filter wheel, 43 is a short-wave infrared camera, 5 is a high-temperature heating table, and 6 is a computer.

Detailed ways

The following will clearly and completely describe various embodiments of the present invention in conjunction with the accompanying drawings. The embodiments described with reference to the accompanying drawings are exemplary and intended to be used to explain the present invention, but should not be understood as limiting the present invention.

Embodiment 1: The device for measuring the short-wave infrared full polarization characteristics of a target under the thermal radiation effect described in this embodiment comprises a constant temperature box 1, a control device, a light source emitting device 3, an image acquisition device 4, a high-temperature heating platform 5 and a computer 6;

The control device includes a transmitting end guide rail 21, a receiving end guide rail 22, a first drive motor 23 and a second drive motor 24;

The light source emitting device 3 comprises a tunable laser light source 31 and an attenuation plate 32;

The image acquisition device 4 includes a short-wave infrared fully automatic polarizer 41, a cage filter wheel 42 and a short-wave infrared camera 43;

The control device, light source emitting device 3, image acquisition device 4 and high temperature heating platform 5 are all placed in the constant temperature box 1;

The transmitting end guide rail 21 and the receiving end guide rail 22 are both arc-shaped and arranged opposite to each other. The transmitting end guide rail 21 is used to fix the light source emitting device 3, and the light source emitting device 3 is connected to the first driving motor 23. The receiving end guide rail 22 is used to fix the image acquisition device 4, and the image acquisition device 4 is connected to the second driving motor 24.

The tunable laser light source 31 is coaxially arranged with the attenuation plate 32;

The short-wave infrared fully automatic polarizer 41, cage filter wheel 42 and short-wave infrared camera 43 are coaxially arranged in sequence;

The first drive motor 23 and the second drive motor 24 are both connected to the computer 6, and the short-wave infrared camera 43 communicates with the computer 6 in a two-way manner;

The attenuation sheet 32 has a diameter of 7 mm to 9 mm, a thickness of 1 mm to 1.2 mm, and a light transmittance of 35%;

The short-wave infrared fully automatic polarizer 41 has a diameter of 24 mm to 26 mm, a light aperture of 18 mm to 20 mm, a light transmittance greater than 75%, and a wavelength passing through the short-wave infrared fully automatic polarizer 41 of 0.8 μm to 1.7 μm.

In the prior art, most of the split-focal plane polarization imaging systems that directly integrate micro-nano polarization elements into the focal plane array still focus on the visible light range, and the structure is relatively complex. Due to the processing errors of the polarization elements and the huge light loss, the extinction ratio and transmittance of this imaging mode also need to be improved. Moreover, the equipment is often affected by the environmental thermal radiation, which can easily cause interference in the infrared polarization detection work. Therefore, it is urgent to design a time-sharing full-polarization fully automatic imaging device based on the thermal radiation effect, with a simple structural design and a high extinction ratio.

In order to solve the above technical problems, as shown in FIG1 and FIG2, the present embodiment designs a device for measuring the short-wave infrared full polarization characteristics of a target under the thermal radiation effect, and the device comprises a constant temperature box 1, a control device, a light source emitting device 3, an image acquisition device 4, a high temperature heating platform 5 and a computer 6;

The control device, light source emitting device 3, image acquisition device 4 and high temperature heating platform 5 are all placed in the constant temperature box 1;

The size of the thermostat 1 is large enough to accommodate researchers to conduct experiments or operations that need to be performed at a stable temperature and humidity. The thermostat 1 is used to maintain the ambient radiation temperature.

The control device includes a transmitting end guide rail 21, a receiving end guide rail 22, a first drive motor 23 and a second drive motor 24. The transmitting end guide rail 21 is used to fix the light source emitting device 3. The transmitting end guide rail 21 is mechanically connected to the light source emitting device 3. The light source emitting device 3 is adjusted in real time by the first drive motor 23 at its angular position. The receiving end guide rail 22 is used to fix the image acquisition device 4. The receiving end guide rail 22 is mechanically connected to the image acquisition device 4. The image acquisition device 4 is adjusted in real time by the second drive motor 24 at its angular position.

The light source emitting device 3 comprises a tunable laser light source 31 and an attenuation plate 32. The optical axes of the tunable laser light source 31 and the attenuation plate 32 are on the same straight line, and the attenuation plate 32 is located on the outgoing light path of the tunable laser light source 31. The tunable laser light source 31 is used to emit light, and the light intensity is attenuated by the attenuation plate 32, and then incident on the center of the target;

The image acquisition device 4 includes a short-wave infrared fully automatic polarizer 41, a cage filter wheel 42 and a short-wave infrared camera 43. The short-wave infrared fully automatic polarizer 41, the cage filter wheel 42 and the short-wave infrared camera 43 are fixed on the receiving end guide rail 22 from bottom to top in sequence, and the optical axes of the three are on the same straight line. The short-wave infrared fully automatic polarizer 41 is used to obtain light reflected by the target at polarization directions of 0°, 60° and 120°, the cage filter wheel 42 is used to obtain light of different wavelengths for subsequent imaging, and the short-wave infrared camera 43 performs intensity imaging of the target at corresponding angles, wavelengths and polarization directions;

The high temperature heating stage 5 is used to control the target temperature and the spontaneous radiation intensity;

The computer 6 is used to control the first drive motor 23 and the second drive motor 24, and process the image of the image acquisition device 4 for analysis, and the image acquisition device 4 is connected to the computer 6 for two-way communication. The image acquisition device 4 acquires short-wave infrared intensity images of the target at polarization angles of 0°, 60° and 120°, and inputs the short-wave infrared intensity images of the target into the computer 6;

The device can achieve the purpose of collecting target short-wave infrared intensity images with different radiation ratios at different observation angles and obtaining polarization information.

In this embodiment, the attenuation sheet 32 has a diameter of 8 mm, a thickness of 1.1 mm, and a light transmittance of 35%.

In this embodiment, the short-wave infrared fully automatic polarizer 41 is a fully automatic polarizer with a diameter of 25 mm, a light aperture of 19 mm, a transmittance greater than 75%, a transmission wavelength that can be limited to 0.8 μm to 1.7 μm, and an operating temperature range of -40°C to 93°C.

Embodiment 2. This embodiment further limits the target short-wave infrared full polarization characteristic measurement device of the thermal radiation effect described in Embodiment 1. The tunable laser light source 31 has a pulse width of 5ns, a repetition frequency of 100Hz, and outputs light of 410nm to 2300nm with a line width of 6cm ^-1 .

In this embodiment, the tunable laser light source 31 is a high-energy tunable nanosecond laser with a pulse width of 5 ns and a repetition frequency of up to 100 Hz. It uses OPO (optical parametric oscillation) to output light with a wavelength of 410 nm to 2300 nm and a line width of about 6 cm ^-1 .

Implementation method three: This implementation method is a further limitation of the target short-wave infrared full polarization characteristic measurement device for the thermal radiation effect described in implementation method one. The cage filter wheel 42 is equipped with 6 filters, and the central wavelengths of the 6 filters are 808nm, 1064nm, 1200nm, 1300nm, 1400nm and 1500nm respectively.

In this embodiment, the cage filter wheel 42 has 6 positions for fixing 1-inch filters. 6 filters are placed in the cage filter wheel 42, and the central wavelengths of the 6 filters are 808nm, 1064nm, 1200nm, 1300nm, 1400nm and 1500nm respectively.

Embodiment 4: This embodiment further limits the device for measuring the short-wave infrared full polarization characteristics of a target due to thermal radiation effect described in Embodiment 1. The spectrum of the short-wave infrared camera 43 is 0.4 μm to 1.7 μm.

In this embodiment, the short-wave infrared camera 43 is a wide-band short-wave infrared array camera with a resolution of up to 1280*1024, a spectrum of 0.4 μm to 1.7 μm, and an adjustable exposure time.

Embodiment 5: This embodiment further limits the device for measuring the short-wave infrared full polarization characteristics of a target under the thermal radiation effect described in Embodiment 1. The temperature range of the high-temperature heating stage 5 is from room temperature to 700°C.

In this embodiment, the high temperature heating stage 5 is a precision constant temperature heating stage with a temperature control range of room temperature (generally defined as 25°C) to 700°C, a temperature resolution of 0.1°C, a temperature control accuracy of ±1%°C, a power supply voltage of AC220V (50Hz), and a power of 600W.

Embodiment 6: The method for measuring the short-wave infrared full polarization characteristics of a target under the thermal radiation effect described in this embodiment is implemented by using the device for measuring the short-wave infrared full polarization characteristics of a target under the thermal radiation effect described in any one of embodiments 1 to 5, and includes the following steps:

Step S1, the light emitted by the tunable laser light source 31 is incident on a target located on a high-temperature heating platform 5 after the light intensity is attenuated by the attenuation plate 32;

Step S2, stabilizing the constant temperature box at -70°C to 150°C, adjusting the light source emitting device to 10° to 70° through the first driving motor, and adjusting the image acquisition device to 10° to 90° through the second driving motor;

Step S3, the light reflected by the target on the high-temperature heating platform 5 is polarized in polarization directions of 0°, 60° and 120° by a short-wave infrared fully automatic polarizer 41;

Step S4, the light polarized by the short-wave infrared fully automatic polarizer 41 is passed through the filter of the cage filter wheel 42 to obtain light of a desired wavelength, so that the light of the wavelength enters the short-wave infrared camera 43 for imaging;

Step S5, changing the filter of the cage filter wheel 42, and repeating the operations of steps S1 to S4 until the target completes imaging of 6 filters;

Step S6, respectively changing the temperature of the constant temperature box 1, and the angles of the light source emitting device 3 and the image acquisition device 4, and repeating the operations of steps S3 to S5;

Step S7, the computer 6 extracts the grayscale value of the shortwave infrared intensity image obtained by the shortwave infrared camera 43 at different angles, different temperatures, and the target at the same polarization directions of 0°, 60° and 120°, and calculates the polarization degree according to the grayscale value.

This embodiment designs a method for measuring the short-wave infrared full polarization characteristics of a target under the thermal radiation effect, and the method comprises the following steps:

Step S1, adjusting the relative positions of the transmitting end guide rail 21, the target and the receiving end guide rail 22, and making the tunable laser light source 31 and the attenuation plate 32 in the same optical path, and the short-wave infrared fully automatic polarizer 41, the cage filter wheel 42 and the short-wave infrared camera 43 in the same optical path;

Step S2, placing the target in the center of the high temperature heating stage 5, starting the tunable laser light source 31, and ensuring that the light emitted by the tunable laser light source 31 irradiates the center of the target;

Step S3, adjusting the power of the thermostat 1 so that the interior of the thermostat 1 is stabilized at a desired temperature;

Step S4, turning on the short-wave infrared camera 43, driving the light source emitting device 3 to a desired angle through the first driving motor 23, and driving the image acquisition device 4 to a desired angle through the second driving motor 24;

Step S5, the light emitted by the tunable laser light source 31 is irradiated on the center of the target. After the light is reflected from the center of the target, the short-wave infrared fully automatic polarizer 41 is adjusted by a built-in motor in the short-wave infrared fully automatic polarizer 41 to achieve polarization of the target reflected light in polarization directions of 0°, 60° and 120°;

Step S6, using the cage filter wheel 42 to place the filter of the required wavelength on the light path of the reflected light, so that the light of the wavelength enters the short-wave infrared camera 43 for imaging;

Step S7, changing the filter of the cage filter wheel 42, and repeating the operations from step S2 to step S6 until the image acquisition of the target 6 wavelengths is completed;

Step S8, respectively changing the temperature of the constant temperature box 1 in step S3, and the angles of the light source emitting device 3 and the image acquisition device 4 in step S4, and repeating the operations of steps S3 to S7;

Step S9, the grayscale value calculation software in the computer 6 is used to extract the grayscale value of the shortwave infrared intensity image of the target at different angles and different temperatures acquired by the shortwave infrared camera 43. The specific grayscale value extraction process is: frame a certain polarization angle intensity image of the target, obtain the average grayscale value of each pixel point of the framed part, obtain the image grayscale values of the three polarization angles of 0°, 60° and 120° at the same time, and the three polarization angle images constitute a polarization degree image, and then the polarization degree is calculated.

In this embodiment, the ambient radiation intensity and the target spontaneous radiation intensity are controlled by using a constant temperature box 1 and a high temperature workbench 5 to explore the influence of ambient thermal radiation on the target infrared full polarization characteristics;

In step S9, the specific calculation formula of DoLP _measured (polarization degree) is:

The grayscale values of the short-wave infrared intensity images at three polarization angles of 0°, 60°, and 120° are obtained by grayscale value calculation software, which are a, b, and c respectively;

.

This method can quickly collect target shortwave infrared intensity images at different high angles and different radiation ratios and obtain polarization information, saving measurement time and compensating for the influence of solar movement and weather changes when shortwave infrared experiments are measured outdoors.

In this embodiment, the thermostat 1 is a walk-in constant temperature and humidity chamber with a temperature range of -70°C to 150°C, a control accuracy of ±2.0°C, and a temperature setting accuracy, indication accuracy, and analysis accuracy of ±0.1°C.

In this embodiment, the transmitting end guide rail 21 adjusts the angle range of the light source emitting device 3 from 10° to 70°, and the receiving end guide rail 22 adjusts the angle range of the image acquisition device 4 from 10° to 90°.

The specific working principle of the image acquisition device 4 is:

The second driving motor 24 is controlled by the computer 6 to drive the image acquisition device 4 to slide on the receiving end guide rail 22, and the sliding angle range is 10° to 90° with an accuracy of 0.5°. Then, the short-wave infrared intensity images of different observation altitude angles and different wavelengths are obtained through the polarization of the short-wave infrared fully automatic polarizer 41 and the cage filter wheel 42.

In order to better illustrate the method for measuring the short-wave infrared full polarization characteristics of the target thermal radiation effect described in the present application, the following examples are described in detail:

Taking the magnesium alloy plate as the research object, the magnesium alloy plate is placed in the center of the high-temperature heating table 5. The incident height angle of the light source emitting device 3 starts at 10° and ends at 70°, and is driven at intervals of 2°, with a total of 31 incident height angles. The image acquisition device 4 starts at 10° and ends at 90°, and is driven at intervals of 2°, with a total of 41 observation height angles. The polarization directions are three angles of 0°, 60° and 120°. The cage filter wheel has filters of 6 wavelengths. Therefore, 31*41*3*6=22878 images of the same target under the same thermal radiation effect are obtained. The three angles of 0°, 60° and 120° at the same time constitute a polarization image, with a total of 7626 polarization degree values.

In order to facilitate the analysis of polarization characteristics, for rough surfaces, it is assumed that the angle between the microfacet and the normal diameter of the target macroscopic surface is small, and only the incident and reflected light on the same plane are considered. The linear polarization degree DoLP of the target is calculated as follows:

;

In the formula, Depends on the size of the ambient radiation ratio, which is regulated by changing the temperature of the constant temperature box and the temperature of the high temperature heating stage. The reflectivity of the vertical and parallel components of the _RS and _RP Fresnel, /> To measure the roughness of the target by laser confocal microscopy, _i is the vertex angle of the light source emitting device;

in, ,/> The solution formula is as follows:

In the formula, is the refraction angle, /> is the refractive index of air, /> is the refractive index of the target medium.

In order to better illustrate the method for measuring the short-wave infrared full polarization characteristics of the target thermal radiation effect described in the present application, the following examples are described in detail:

The model simulation is performed by MATLAB (Matrix Factory) software and the DoLP _measurement results obtained by the method for measuring the short-wave infrared full polarization characteristics of the target using the thermal radiation effect described in this embodiment are compared to analyze the influence of different environmental radiation ratios on the full polarization characteristics of the target;

In order to more intuitively reflect the accuracy of the two, RMSE (root mean square error) is used to measure the deviation between the simulation value and the measured value. The smaller the value, the higher the model accuracy. The expression is as follows:

In the formula, is the number of experiments, i=1, 2, 3, ... n, in a finite number of measurements, where n is the number of measurements and i is the deviation between a simulation value and the measured value.

Table 1

The calculation results are shown in Table 1. In the table, RMSE1 is the traditional model simulation, RMSE2 is the target short-wave infrared full polarization characteristic measurement method using the thermal radiation effect described in this embodiment, and the percentage is the decrease ratio of the RMSE2 value of this embodiment relative to the RMSE1 value. The larger the percentage, the greater the accuracy improvement, and the more accurate it is. From the data in the table, the root mean square error value of the model established in this embodiment is smaller, and the error of the model is reduced by at least 47.57%. The percentage of the accuracy of the surface model data of 99 alumina ceramic plate material has decreased by 71.19%, which is the largest reduction. This shows that the model accuracy of the target short-wave infrared full polarization characteristic measurement method using the thermal radiation effect described in this embodiment is higher and the fitting effect is better.

The above is a detailed introduction to the target short-wave infrared full polarization characteristic measurement device and method for the thermal radiation effect proposed in the present invention. Specific examples are used in this article to illustrate the principle and implementation mode of the present invention. The description of the above embodiments is only used to help understand the method and core idea of the present invention. At the same time, for general technicians in this field, according to the idea of the present invention, there will be changes in the specific implementation mode and application scope. In summary, the content of this specification should not be understood as a limitation on the present invention.

Claims (6)

1. A device for measuring the short-wave infrared full polarization characteristics of a target under thermal radiation effect, characterized in that the device comprises a constant temperature box (1), a control device, a light source emitting device (3), an image acquisition device (4), a high-temperature heating table (5) and a computer (6); The control device comprises a transmitting end guide rail (21), a receiving end guide rail (22), a first driving motor (23) and a second driving motor (24); The light source emitting device (3) comprises a tunable laser light source (31) and an attenuation plate (32); The image acquisition device (4) comprises a short-wave infrared fully automatic polarizer (41), a cage filter wheel (42) and a short-wave infrared camera (43); The control device, light source emitting device (3), image acquisition device (4) and high temperature heating platform (5) are all placed in a constant temperature box (1); The transmitting end guide rail (21) and the receiving end guide rail (22) are both arc-shaped and arranged opposite to each other. The transmitting end guide rail (21) is used to fix the light source emitting device (3), and the light source emitting device (3) is connected to the first drive motor (23). The receiving end guide rail (22) is used to fix the image acquisition device (4), and the image acquisition device (4) is connected to the second drive motor (24). The tunable laser light source (31) and the attenuation plate (32) are coaxially arranged; The short-wave infrared fully automatic polarizer (41), cage filter wheel (42) and short-wave infrared camera (43) are coaxially arranged in sequence; The first drive motor (23) and the second drive motor (24) are both connected to the computer (6), and the short-wave infrared camera (43) communicates bidirectionally with the computer (6); The attenuation sheet (32) has a diameter of 7 mm to 9 mm, a thickness of 1 mm to 1.2 mm, and a light transmittance of 35%; The short-wave infrared fully automatic polarizer (41) has a diameter of 24 mm to 26 mm, a light aperture of 18 mm to 20 mm, a light transmittance greater than 75%, and a wavelength of 0.8 μm to 1.7 μm passing through the short-wave infrared fully automatic polarizer (41). 2. The device for measuring the short-wave infrared full polarization characteristics of a target under the thermal radiation effect according to claim 1, characterized in that the pulse width of the tunable laser light source (31) is 5 ns, the repetition frequency is 100 Hz, and the output light is 410 nm to 2300 nm with a line width of 6 cm ^-1 . 3. The target short-wave infrared full polarization characteristic measurement device of thermal radiation effect according to claim 1 is characterized in that the cage filter wheel (42) is equipped with 6 filters, and the central wavelengths of the 6 filters are 808nm, 1064nm, 1200nm, 1300nm, 1400nm and 1500nm respectively. 4. The device for measuring the short-wave infrared full polarization characteristics of a target based on thermal radiation effect according to claim 1, characterized in that the spectrum of the short-wave infrared camera (43) is 0.4 μm to 1.7 μm. 5. The device for measuring the short-wave infrared full polarization characteristics of a target based on the thermal radiation effect according to claim 1, characterized in that the temperature range of the high-temperature heating stage (5) is from room temperature to 700°C. 6. A method for measuring the full polarization characteristics of short-wave infrared targets under thermal radiation effects, wherein the method is implemented by using the device for measuring the full polarization characteristics of short-wave infrared targets under thermal radiation effects as claimed in any one of claims 1 to 5, and is characterized in that the method comprises the following steps: Step S1, light emitted by a tunable laser light source (31) is incident on a target located on a high-temperature heating platform (5) after the light intensity is attenuated by an attenuation plate (32); Step S2, stabilizing the constant temperature box at -70°C to 150°C, adjusting the light source emitting device to 10° to 70° through the first driving motor, and adjusting the image acquisition device to 10° to 90° through the second driving motor; Step S3, the light reflected by the target on the high-temperature heating platform (5) is polarized at polarization directions of 0°, 60° and 120° by a short-wave infrared fully automatic polarizer (41); Step S4, the light polarized by the short-wave infrared fully automatic polarizer (41) is passed through the filter of the cage filter wheel (42) to obtain light of a desired wavelength, so that the light of the desired wavelength enters the short-wave infrared camera (43) for imaging; Step S5, changing the filter of the cage filter wheel (42), and repeating the operations of steps S1 to S4 until the target completes imaging of 6 filters; Step S6, respectively changing the temperature of the constant temperature box (1), and the angles of the light source emitting device (3) and the image acquisition device (4), and repeating the operations of steps S2 to S5; Step S7, using a computer (6) to extract grayscale values from the shortwave infrared intensity images of the target at different angles, different temperatures, and the same polarization directions of 0°, 60°, and 120° acquired by the shortwave infrared camera (43), and calculate the degree of polarization based on the grayscale values.