CN117553703A - Universal profile detection method for spliced sub-mirrors of primary mirrors of different telescopes - Google Patents

Universal profile detection method for spliced sub-mirrors of primary mirrors of different telescopes Download PDF

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Publication number
CN117553703A
CN117553703A CN202311528635.4A CN202311528635A CN117553703A CN 117553703 A CN117553703 A CN 117553703A CN 202311528635 A CN202311528635 A CN 202311528635A CN 117553703 A CN117553703 A CN 117553703A
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mirror
mirrors
sub
telescope
light path
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黄亚
王丰璞
李新南
徐晨
李博
陈哲
田杰
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Nanjing Institute Of Astronomical Optics Chinese Academy Of Sciences
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Nanjing Institute Of Astronomical Optics Chinese Academy Of Sciences
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2441Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Telescopes (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)

Abstract

The invention discloses a general type surface shape detection method for splicing sub-mirrors of primary mirrors of different telescopes, which adopts a shrinkage Jiao Shan lens with selected parameters to shorten the detection light path length of the sub-mirrors of different telescopes, and each sub-mirror detects residual wave aberration of a light path inspection point and is undertaken by calculation holographic compensation. When different telescope spliced sub-mirrors are detected, corresponding calibration light paths are designed, a special standard spherical mirror is selected, and a transmission wavefront error introduced by the processing of the telescopic lens is calibrated; and obtaining the transmission wave front of the corresponding areas of the lens to be detected and the focusing lens by adopting a ray tracing mode. The invention is a universal detection method, has the characteristics of simple structure and strong universality, can be suitable for the surface shape detection of the spliced sub-mirrors of the primary mirror of a plurality of large astronomical telescopes, effectively avoids the complicated customization of the surface shape detection equipment of the sub-mirrors of different telescopes, reduces the processing and manufacturing cost of the sub-mirrors with different parameters, and provides theoretical and technical guarantees for the diversified design of the large astronomical telescope.

Description

Universal profile detection method for spliced sub-mirrors of primary mirrors of different telescopes
Technical Field
The invention belongs to the field of advanced optical manufacturing and detection, and particularly relates to a general detection method for high-precision surface shapes of spliced sub-mirrors of primary mirrors of different large astronomical optical telescopes.
Background
With the continuous deep exploration of universe, the demands of China and international on large astronomical telescopes are increasing, and the construction schemes of the large astronomical telescopes with different calibers are sequentially proposed. The telescope to be built is currently proposed in China and comprises twelve meters of optical infrared telescope (Large Optical Telescope, LOT), a growing type general optical telescope (Expanding Aperture Segmented Telescope, EAST) and a Shanghai traffic university spectrum telescope (Jiaotong University Spectroscopic Telescope, JUST), wherein the calibers of primary mirrors are respectively 12 meters, 8 meters and 4.4 meters, and the curvature radiuses of the primary mirrors are respectively 38.4 meters, 21.5 meters and 12.8 meters. In the international aspect, the telescope currently being constructed comprises a thirty-meter telescope (Thirty Meter Telescope, TMT) and a European extremely-large telescope (Extremely Large Telescope, ELT), wherein the caliber of a primary mirror is respectively 30 meters and 39.2 meters, and the curvature radius of the primary mirror is respectively 60 meters and 69 meters. The telescope primary mirrors with different calibers are formed by splicing hexagonal sub mirrors with the diagonal diameters of 1.1 meters or 1.44 meters.
The aspherical primary mirror of the spliced mirror telescope is formed by splicing hundreds of sub mirrors, and the basic optical parameters of the spliced primary mirror, including the aperture, the vertex curvature radius, the aspherical coefficient, the surface shape error and the like, are uniquely determined according to the specific requirements of the specific telescope. The sub-mirrors forming the spliced mirror surface have different parameters, so that the co-phase splicing of the telescope primary mirror is realized, and the shape, caliber, splicing position, off-axis quantity, surface shape and surface shape errors are required to meet the technical requirements.
The high-precision surface shape inspection of the telescope primary mirror and the spliced sub-mirrors adopts a method that an anti-spherical aberration single lens is adopted to shorten the length of a detection light path, and the residual wave aberration of the detection light path is compensated by calculation holography (Computer Generated Hologram, CGH). However, when the primary mirror and the secondary mirror of the astronomical telescope are spliced in batch, the curvature radius of the primary mirror is different, each primary mirror and the secondary mirror of the telescope are designed and a detection light path is built, which is time-consuming and labor-consuming, and how to finish the rapid inspection of the secondary mirrors of the astronomical telescope quickly becomes a technical problem to be solved in the astronomical telescope processing field.
Disclosure of Invention
Aiming at the problems in the prior art, the invention provides a general profile detection method for splicing sub-mirrors of main mirrors of different telescopes.
In order to achieve the above purpose, the present invention provides the following technical solutions:
the universal profile detection method for the spliced sub-mirrors of the primary mirrors of different telescopes comprises the following steps:
step 1: building a first calibration light path of a first telescope primary mirror spliced sub-mirror, wherein the first calibration light path comprises an interferometer, a first calculation hologram, a focusing lens and a first standard mirror corresponding to the first telescope (the first standard mirror is a standard spherical mirror, the curvature radiuses of the standard spherical mirrors corresponding to different telescopes are different, the curvature radiuses are the same as those of a specific telescope primary mirror), outgoing light of the interferometer is transmitted through the first calculation hologram diffraction and the focusing lens and vertically enters the first standard mirror, then light is reflected along an original light path and returns to the interferometer, a wave surface of the return light interferes with an internal reference wave surface of the interferometer to form interference fringes, and the transmitted wavefront error W of the focusing lens of the first calibration light path is obtained through interferometer software processing 1-0 Transforming the transmission wavefront of the first calibration optical path by adopting a ray tracing method to obtain a transmission wavefront W of a corresponding region of the first calibration optical path corresponding to the first telescope ion mirror 1
Step 2: building a first detection light path of a first telescope primary mirror spliced sub-mirror, replacing a first standard mirror in a first calibration light path by the first detection light path by a first telescope off-axis sub-mirror, replacing a first calculation hologram by a second calculation hologram, transmitting emergent light of an interferometer by a second calculation hologram diffraction and focusing lens, vertically incident to the first telescope off-axis sub-mirror, reflecting the light along an original light path, returning to the interferometer, and measuring to obtainObtaining a first detection light path wavefront W of the first telescope off-axis sub-mirror 2 (interferometer software processing calculation, measurement method and W described above) 1 The same measurement method);
step 3: calculating the surface shape of the first telescope off-axis ion mirror, i.e. W 3 =W 2 -W 1
Step 4: building a second calibration light path of a second telescope primary mirror spliced sub-mirror, replacing a first telescope off-axis sub-mirror with a second standard mirror corresponding to the second telescope at a first standard mirror position, replacing a second calculation hologram with a third calculation hologram, enabling emergent light of an interferometer to be vertically incident to the second standard mirror through diffraction of the third calculation hologram and transmission of a contraction mirror, enabling light to be reflected along an original light path and return to the interferometer, enabling a wave surface of the return light to interfere with an internal reference wave surface of the interferometer to form interference fringes, and processing to obtain a transmission wavefront error W of the contraction lens of the second calibration light path 4-0 Transforming the transmission wavefront of the second calibration optical path by adopting a ray tracing method to obtain a transmission wavefront W of a corresponding region of the second calibration optical path corresponding to the second telescope ion mirror 4
Step 5: building a second detection light path of a second telescope primary mirror spliced sub-mirror, replacing a second standard mirror in a second calibration light path by a second telescope off-axis sub-mirror by the second detection light path, replacing a third calculation hologram by a fourth calculation hologram, enabling emergent light of an interferometer to be transmitted through a fourth calculation hologram diffraction and focusing lens, enabling the emergent light to vertically enter the second telescope off-axis sub-mirror, enabling the emergent light to be reflected along an original light path and then return to the interferometer, and measuring to obtain a wavefront W of the second detection light path of the second telescope off-axis sub-mirror 5 (interferometer software processing calculation, measurement method and W described above) 1 The same measurement method);
step 6: calculating the shape of the second telescope off-axis ion mirror, i.e. W 6 =W 5 -W 4
Step 7: and (4) replacing the telescope primary mirror spliced sub-mirrors, and repeating the steps 4 to 6 to obtain the surface shape information of the spliced sub-mirrors of the different telescope primary mirrors.
Furthermore, the detection method shortens the detection light path length of the primary mirror and the ion mirror of different telescopes through the same focusing lens, and removes the influence of the transmitted wavefront error of the focusing lens on the measurement surface shape of the to-be-measured mirror through the corresponding calibration light path of each telescope. Furthermore, the object-oriented lens is a primary lens spliced sub-lens of different telescopes, wherein the primary lens of the different telescopes has different curvature radius and quadratic term coefficient, the spliced sub-lens has different off-axis amounts, and the aperture of the sub-lens is smaller than or equal to that of the zoom lens.
Furthermore, the curvature radius, the aspheric coefficients and the off-axis quantity of the peak of the spliced sub-mirror of different telescopes are different, but a lens with a selected parameter is used for carrying out conjugate calculation on detection light paths of different detection objects to determine the position of a detection point, and the residual wave aberration of the detection light paths is born by calculation holographic compensation.
Furthermore, for a specific spliced telescope, a special standard spherical mirror is selected, the conjugate optical path error of the lens is calibrated, and the conjugate point position residual error is corrected by a special calculation hologram, wherein the curvature radius of the standard spherical mirror is the same as the curvature radius of a primary mirror of the specific telescope.
Further, different off-axis sub-mirrors of a specific telescope are used for detection, and a compensation calculation hologram is manufactured according to residual wave aberration of a sub-mirror detection light path to replace a special hologram of the calibration light path, wherein the geometric dimension of the hologram is the same as the carrier frequency.
Compared with the prior art, the invention has the beneficial effects that:
the invention is based on the original refraction diffraction combined compensation method, carries out zero calibration on a detection light path by arranging a special correction reflecting mirror for a special telescope and a special zero hologram element for the special telescope, is applicable to sub-mirrors of telescopes with different parameters after zero calibration like a standard lens is replaced by a common interferometer, and is a universal detection method. The detection method has the characteristics of simple structure and strong universality, can be suitable for the surface shape detection of the spliced sub-mirrors of the primary mirrors of various large astronomical telescopes, effectively avoids the tedious customization of the surface shape detection equipment of the sub-mirrors of different telescopes, reduces the processing and manufacturing cost of the sub-mirrors with different parameters, and provides theoretical and technical guarantees for the diversified design of the large astronomical telescope.
Drawings
FIG. 1 is a schematic view of a primary mirror splice sub-mirror of a telescope with different aperture;
FIG. 2 is a schematic diagram of a calibration light path of a universal profile detection device for a primary mirror and a spliced sub-mirror of different telescopes;
FIG. 3 is a plot of calibration light path points, the geometric radius of the plot being approximately 0 μm;
FIG. 4 is a plot of nominal optical path wave aberration with a root mean square value of approximately 0 wavelengths;
FIG. 5 is an illustration of stray diffracted light from a nominal optical path, with the nearest stray diffraction order light from the working diffraction order light being 0.9mm;
FIG. 6 is a side view of the nominal optical path operational diffracted light, stray diffracted light;
fig. 7 is a schematic diagram of the detection light path of the particular model telescope ion mirror.
The marks in the figure: the telescope primary mirror and secondary mirror detection light path corresponding CGH is characterized in that 1 is an interferometer, 2 is a special CGH for calibrating a light path, 3 is a focusing lens, 4 is a special type telescope secondary mirror detection device calibration light path calibration standard mirror, 5 is another telescope secondary mirror detection device calibration standard mirror, 6 is another telescope calibration light path CGH,7 is a telescope primary mirror and secondary mirror, and 8 is a telescope primary mirror and secondary mirror detection light path corresponding CGH.
Detailed Description
The invention is described in further detail below with reference to the accompanying drawings.
The off-axis sub-mirrors of the primary mirror of different telescopes are all regular hexagon mirrors of 1.44 meters, only the vertex curvature radius, the quadratic term coefficient and the off-axis quantity are different, a lens with a selected parameter is used for carrying out conjugate calculation on detection light paths of different detection objects to determine the position of a detection point, and the residual wave aberration of the detection light paths is borne by calculation holographic compensation. In order to reduce the influence of the transmitted wavefront error of the focusing lens on the detection light path, as shown in fig. 1, when different telescope spliced sub-mirrors are used for detection, a corresponding calibration light path of the telescope ion mirror detection light path is designed, the point-to-point difference is carried out on the light ray trace point, and the transmitted wavefront error introduced by the focusing lens processing is corrected.
According to the thought, the invention provides a general profile detection method for the spliced sub-mirrors of the primary mirrors of different telescopes based on the refraction and diffraction combination compensation detection principle.
According to the method, the detection light path length of the primary mirror and the ion mirror of different telescopes is shortened through the same focusing lens, and the influence of the transmitted wavefront error of the focusing lens on the measurement surface shape of the to-be-measured mirror is removed through the corresponding calibration light path of each telescope. A focusing lens is adopted to shorten the length of a detection light path, a special correction reflector (the correction reflector is a spherical reflector) of a specific telescope and a special zero hologram element are arranged to carry out zero calibration on the detection light path, and the light path after zero calibration can be used for sub-mirror shape inspection of telescopes with different parameters as a standard lens is replaced by a common interferometer, so that the method is a universal detection method.
The optical parameters of the telescopic lens are calculated aiming at the detection light path of the sub-mirror surface shape of a certain telescope, and when the telescopic lens is used for detecting the spliced sub-mirror surface shape of other telescope primary mirrors, extra defocus and spherical aberration are introduced, and part of aberration is borne by CGH compensation. However, the transmission wavefront error introduced by the processing surface shape during the development of the focusing lens cannot be ignored, so that a special calibration light path is required to be designed to calibrate and remove the partial error.
A special spliced telescope is selected, a special standard spherical mirror is selected, the error of a lens conjugate light path is calibrated, and the position residual error of a conjugate point is corrected by a special calculation hologram; the correcting reflector is a spherical reflector, and the curvature radius of the spherical reflector is the same as that of the primary mirror of the specific telescope; and detecting different off-axis sub-mirrors of the specific telescope, and manufacturing a compensation calculation hologram according to the residual wave aberration of the sub-mirror detection light path to replace the special hologram of the calibration light path, wherein the geometric dimension of the hologram is the same as the carrier frequency.
The detection system of this patent contains: phase-shifting interferometer, calculation holographic plate, focusing Shan Toujing, different telescope calibration standard mirror and off-axis aspheric sub-mirror.
The invention discloses a general profile detection method for splicing sub-mirrors of primary mirrors of different telescopes, which comprises the following steps:
step 1: setting up a telescope 1 primary mirror and splicing sub-mirrors to calibrate a light path, and dryingObtaining a transmission wavefront error W of a focusing lens corresponding to an ion mirror through image acquisition processing of a interferometer 1
Step 2: the detection light path is changed to the primary mirror of the telescope 1, the ion mirror is used for calculating the hologram, and the interferometer acquires and processes the image to obtain the wave front W of the detection light path of the ion mirror 2
Step 3: telescope 1 off-axis sub-mirror shape, W 3 =W 2 -W 1
Step 4: for the surface shape detection of the telescope 2 sub-mirror, the corresponding calibration standard mirror of the telescope 2 is replaced at the position of the calibration standard mirror, a telescope 2 primary mirror spliced sub-mirror calibration light path is built, and the transmitted wavefront error W of the telescope 2 off-axis sub-mirror corresponding to the focusing lens is measured and obtained 4
Step 5: changing calculation hologram, measuring to obtain the detection light path wave front W of telescope 2 primary mirror ion axis mirror 5
Step 6: telescope 2 off-axis sub-mirror shape, W 6 =W 5 -W 4
And (5) repeating the steps 4 to 6, and measuring and obtaining the surface shape information of the spliced sub-mirrors of the primary mirrors of the different telescopes.
The invention is described below in connection with the high-precision surface shape detection of two large astronomical telescope primary mirror spliced sub-mirrors.
Thirty meters telescope in the United states, twelve meters optical infrared telescope built by planning in China, optical parameters such as
Table 1 shows:
two large astronomical telescope primary mirrors are formed by splicing hexagonal sub-mirrors with the diagonal diameter of 1.44m, and the curvature radius of a main mirror is 60 meters and 38.4 meters respectively. The parent sagittal expression is:
wherein r is 2 =x 2 +y 2 C is the curvature of the mother mirror, and K is the quadratic term coefficient of the mother mirror.
The surface shape detection light path and the error calibration light path of the TMT telescope ion mirror are shown in fig. 7 and 2, and as can be seen from fig. 3-4, the point diagram and the wave aberration of the detection light path are close to zero, and the separation condition of stray diffraction light is shown in fig. 5-6. The off-axis sub-mirror surface shape detection light path adjustment steps are as follows:
1. according to the illustration of FIG. 2, a TMT main mirror spliced sub-mirror calibration light path is constructed, the emergent light of an interferometer 1 is diffracted by a CGH 2, transmitted by a zoom lens 3, perpendicularly incident to a standard spherical reflector 4, reflected along the original light path, returns to the interferometer, and the test wave surface interferes with the reference wave surface inside the interferometer to form interference fringes, and the interference fringes are processed by a CCD acquisition fringe computer to obtain the transmitted wavefront error W of the zoom lens of the calibration light path 1-0 Transforming the transmission wavefront of the calibration light path by adopting a light ray trace mode to obtain the transmission wavefront W of the region corresponding to the ion mirror detection light path 1
2. According to the illustration shown in fig. 7, a TMT main mirror spliced sub-mirror detection light path is built, the emergent light of an interferometer 1 is diffracted by a CGH 8, transmitted by a zoom lens 3, vertically incident to a TMT main mirror off-axis sub-mirror 7, reflected along the original light path, returned to the interferometer, and measured to obtain the wavefront W of the off-axis sub-mirror detection light path 2
3. Calculating TMT main mirror spliced sub-mirror surface shape W 3 ,W 3 =W 2 -W 1
For the surface shape detection of the LOT telescope off-axis ion mirror, the detection light path adjustment steps are as follows:
1. as shown in fig. 2, in the position of the standard spherical reflector 4 (the position of the TMT ion mirror 7) for calibrating the optical path of the TMT calibration optical path, the special calibration reflector 5 for replacing the detection optical path of the LOT sub-mirror is constructed, the calibration optical path of the LOT main mirror and the spliced sub-mirror is constructed, the emergent light of the interferometer 1 is transmitted through the CGH 6 diffraction and the zoom mirror 3, the vertical incidence standard spherical reflector 5 reflects the light along the original optical path and returns to the interferometer, the test wave surface interferes with the internal reference wave surface of the interferometer to form interference fringes, and the interference fringes are processed by the CCD acquisition fringe computer to obtain the transmitted wavefront error W of the zoom lens of the calibration optical path 4-0 By lightThe transmission wavefront of the calibration light path is transformed in a line tracking mode to obtain the transmission wavefront W of the corresponding area of the ion mirror detection light path 4
2. According to the illustration shown in FIG. 7, a LOT main mirror spliced sub-mirror detection light path is built, the emergent light of an interferometer 1 is transmitted by a CGH diffraction and focusing mirror 3, and is vertically incident to an LOT main mirror ion mirror, the light is reflected along the original light path and returns to the interferometer, and the wavefront W of the ion mirror detection light path is obtained by measurement 5
3. Calculating TMT main mirror spliced sub-mirror surface shape W 6 ,W 6 =W 5 -W 4
As described above, for the off-axis sub-mirror surface shape detection of different telescopes, only the transmitted wavefront of the corresponding area of the calibration detection optical path focusing lens is required, and the transmitted wavefront error is removed as the system error of the off-axis sub-mirror detection optical path, so that the actual surface shape of the off-axis sub-mirror can be obtained.
The invention provides a universal profile detection method for spliced sub-mirrors of primary mirrors of different telescopes. According to the method, a shrinkage Jiao Shan lens with selected parameters is adopted to shorten the detection light path length of the ion mirrors of different telescopes, each sub-mirror detects residual wave aberration of a light path inspection point, and the residual wave aberration is assumed by calculation holographic compensation; when different telescope spliced sub-mirrors are detected, corresponding calibration light paths are designed, a special standard spherical mirror is selected, and a transmission wavefront error introduced by the processing of the telescopic lens is calibrated; obtaining the transmission wave front of the corresponding areas of the lens to be detected and the focusing lens by adopting a ray tracing mode; and (4) performing point-to-point difference, and calculating the surface shape information of the telescope ion mirror. The invention has the characteristics of high precision and strong universality, and can realize batch and rapid detection of the ion mirrors of the primary mirrors of different telescopes.
The above description is only of the preferred embodiments of the present invention, and is not intended to limit the present invention. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (6)

1. The universal profile detection method for the spliced sub-mirrors of the primary mirrors of different telescopes is characterized by comprising the following steps of: the method comprises the following steps:
step 1: building a first calibration light path of a first telescope primary mirror spliced sub-mirror, wherein the first calibration light path comprises an interferometer, a first calculation hologram, a zoom lens and a first standard mirror corresponding to the first telescope, emergent light of the interferometer is transmitted by the first calculation hologram diffraction and zoom lens and vertically enters the first standard mirror, light is reflected along an original light path and returns to the interferometer, a wave surface of return light interferes with a reference wave surface in the interferometer to form interference fringes, and a transmission wavefront error W of the zoom lens of the first calibration light path is obtained through interferometer software processing 1-0 Transforming the transmission wavefront of the first calibration optical path by adopting a ray tracing method to obtain a transmission wavefront W of a corresponding region of the first calibration optical path corresponding to the first telescope ion mirror 1
Step 2: building a first detection light path of a first telescope primary mirror spliced sub-mirror, replacing a first standard mirror in a first calibration light path by the first telescope off-axis sub-mirror by the first detection light path, replacing a first calculation hologram by a second calculation hologram, transmitting emergent light of an interferometer by a second calculation hologram diffraction and focusing lens, vertically incident to the first telescope off-axis sub-mirror, reflecting the light along an original light path, returning to the interferometer, and measuring to obtain a wavefront W of the first detection light path of the first telescope off-axis sub-mirror 2
Step 3: calculating the surface shape of the first telescope off-axis ion mirror, i.e. W 3 =W 2 -W 1
Step 4: building a second calibration light path of a second telescope primary mirror spliced sub-mirror, replacing a first telescope off-axis sub-mirror with a second standard mirror corresponding to the second telescope at a first standard mirror position, replacing a second calculation hologram with a third calculation hologram, enabling emergent light of an interferometer to be vertically incident to the second standard mirror through diffraction of the third calculation hologram and transmission of a contraction mirror, enabling light to be reflected along an original light path and return to the interferometer, enabling a wave surface of the return light to interfere with an internal reference wave surface of the interferometer to form interference fringes, and processing to obtain a transmission wavefront error W of the contraction lens of the second calibration light path 4-0 Transforming the transmission wavefront of the second calibration optical path by adopting a ray tracing method to obtainTransmitting wavefront W to corresponding region of second calibration light path corresponding to second telescope off-axis sub-mirror 4
Step 5: building a second detection light path of a second telescope primary mirror spliced sub-mirror, replacing a second standard mirror in a second calibration light path by a second telescope off-axis sub-mirror by the second detection light path, replacing a third calculation hologram by a fourth calculation hologram, enabling emergent light of an interferometer to be transmitted through a fourth calculation hologram diffraction and focusing lens, enabling the emergent light to vertically enter the second telescope off-axis sub-mirror, enabling the emergent light to be reflected along an original light path and then return to the interferometer, and measuring to obtain a wavefront W of the second detection light path of the second telescope off-axis sub-mirror 5
Step 6: calculating the shape of the second telescope off-axis ion mirror, i.e. W 6 =W 5 -W 4
Step 7: and (4) replacing the telescope primary mirror spliced sub-mirrors, and repeating the steps 4 to 6 to obtain the surface shape information of the spliced sub-mirrors of the different telescope primary mirrors.
2. The method for detecting the general profile of the spliced sub-mirrors of the primary mirrors of the different telescopes according to claim 1, wherein the method shortens the detection optical path length of the off-axis sub-mirrors of the primary mirrors of the different telescopes through the same focusing lens, and removes the influence of the transmitted wavefront error of the focusing lens on the measurement profile of the mirror to be detected through the corresponding calibration optical path of each telescope.
3. The method for detecting the general profile of the spliced sub-mirrors of the primary mirrors of the different telescopes according to claim 1, wherein the object-oriented direction of the method is the spliced sub-mirrors of the primary mirrors of the different telescopes, wherein the curvature radius and the quadratic term coefficient of the primary mirrors of the different telescopes are different, the off-axis amounts of the spliced sub-mirrors are different, and the caliber of the sub-mirrors is smaller than or equal to that of the telescopic lenses.
4. The method for detecting the general profile of the spliced sub-mirrors of the primary mirrors of different telescopes according to claim 1, wherein the radius of curvature, the aspheric coefficients and the off-axis amounts of the vertex of the spliced sub-mirrors of different telescopes are different, but a lens with a selected parameter is used for carrying out conjugate calculation on detection light paths of different detection objects to determine the position of a detection point, and residual wave aberration of the detection light paths is borne by calculation holographic compensation.
5. The method for detecting the general profile of the spliced sub-mirrors of the primary mirrors of different telescopes according to claim 1, wherein for a specific spliced telescope, a special standard spherical mirror is selected to calibrate the conjugate optical path error of the lens, and the conjugate point position residual error is corrected by a special calculation hologram, wherein the curvature radius of the standard spherical mirror is the same as the curvature radius of the primary mirror of the specific telescope.
6. The method for detecting the general profile of the split sub-mirrors of the primary mirrors of different telescopes according to claim 1, wherein the different off-axis sub-mirrors of the specific telescope are detected, and a compensation calculation hologram is manufactured according to the residual wave aberration of the sub-mirror detection light path, and the geometry of the hologram is the same as the carrier frequency instead of the special hologram of the calibration light path.
CN202311528635.4A 2023-11-16 2023-11-16 Universal profile detection method for spliced sub-mirrors of primary mirrors of different telescopes Pending CN117553703A (en)

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