CN1175270C - Machine for electric test of printed circuits with adjustable position of sound needles - Google Patents
Machine for electric test of printed circuits with adjustable position of sound needles Download PDFInfo
- Publication number
- CN1175270C CN1175270C CNB961992778A CN96199277A CN1175270C CN 1175270 C CN1175270 C CN 1175270C CN B961992778 A CNB961992778 A CN B961992778A CN 96199277 A CN96199277 A CN 96199277A CN 1175270 C CN1175270 C CN 1175270C
- Authority
- CN
- China
- Prior art keywords
- test
- test board
- machine
- pin
- respect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
- Perforating, Stamping-Out Or Severing By Means Other Than Cutting (AREA)
- Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
- Supply And Installment Of Electrical Components (AREA)
Abstract
Machine for the electric test of printed ciruits, of the type comprising a board which bears (1) a plurality of conductive needles (10) which are connectable on their reverse side with means for the analysis of the electric parameters between one and the other needle, characterized in that: at least two coplanar needle boards and one adjacent to the other (1SS-1SD/1IS-1ID) are used, and one board (1SS/1IS) is made movable with respect to the other (1SD/1ID), and the respective board to be checked (2) is made movable with respect to said boards (1) or vice-versa.
Description
Technical field
The present invention relates to P.e.c. is carried out the machine of electric test.
Background technology
In the prior art, the more known machine that is used to check P.e.c..
Usually, these machines have one be equipped with many conductive pins plate or the bed.On this plate or bed, be placed with Printed Circuit Card, by suitably making different needle guide electricity, and measure accordingly, can check whether defectiveness of this P.e.c..
Obviously, this inspection requirements pin must in position contact with P.e.c..
Because P.e.c. is diversified, therefore, must add an adaptation board on this needle stand plate, this adaptation board comprises that move, the identical by different way pin of P.e.c. according to examine.
The shortcoming of this method is that machine is restricted, and it only may check the P.e.c. with corresponding adapter or adaptation board.
Need with the adaptation board of the different Printed Circuit Card as much of examine.
In addition, well-known, therefore the surface of circuit, is not that total energy guarantees the effectively required suitable electric conductivity of contact not always on same plane.
The another kind of method that provides is to regulate corresponding pin one pin can independently be moved with respect to other pin, but this method is very complicated and expend high.
Because movably pin can not be provided in a large number, therefore, in fact must check each circuit, a kind of method also needs the supervision time of length after the institute.
In the U.S., A can find similar feature in 5436567 (WEXLER etc.) 25 days July nineteen ninety-five (claim 1 and Fig. 1).This patent disclosure a pair of side test probe mechanism, this mechanism comprises:
-top side, be installed in one on door row by spring-loaded electric probe, it be used for a test in first side of equipment (DUT) be electrically connected;
An one row nail bed test probe of-bottom side, it be used for second side relative that is positioned at described DUT with described first side on many test points electrically contact;
-compression set, this compression set and top side, be installed in one on door row by spring-loaded contact mechanical articulation, and be fixed on row's nail bed test probe of bottom side, this compression set is used to clamp described DUT;
-one lever, this lever and compression set mechanical connection, and it is hinged by spring-loaded electric probe with a row, this bar has a device, this device is used to bear perpendicular to the push rod power on the first direction on a plane, described plane comprises that this row is by spring-loaded electric probe, and this device shifts described push rod power, be hinged on the row of one in this compression set by spring-loaded electric probe so that drive is described on the second direction relative with described first direction, and realize electrically contacting with the many test points on described first side that is positioned at described DUT are vertical; With
-vacuum actuated device, this vacuum actuated device is arranged in compression set and is connected so that at the described DUT of test process locking with a row nail bed test probe of bottom side, and produces described push rod power so that electric contact of described many test points on the row's nail test probe that orders about the bottom side and described second side that is positioned at described DUT;
The corresponding card of-examine, this card can with respect to the two boards that comprises top board and base plate respectively move and
-described two boards also can move with respect to described card.
The explanation of invention
The objective of the invention is to avoid above-mentioned defective, specifically, provide a kind of machine that utilizes the conductivity detection needle system that can be applicable to any type of circuit to check various P.e.c..
Described this and other purpose can realize by the machine that is used for P.e.c. in the card that will check is carried out electric test, this kind machine comprises a packaged plate that many conductive pins are arranged, the opposite end of pin is connected with electric parameters analysis device between two pins, it is characterized in that:
-used at least two on same plane and test boards with another piece next-door neighbour;
-block of plate can independently move with respect to other piece plate;
The corresponding card of-examine can independently move with respect to described plate, and vice versa.
Like this, can obtain advantage of the present invention immediately, that is: not need adapter, just can make this machine general on different P.e.c., thereby make total system become simple.
Therefore, in fact, the pin on any locational test board of circuit front-end is moved, and the relative pin on the relative test board is moved.Because described relative test board can move, therefore, no matter its position, place and shape how, can arrive any one the circuit end points determined that will test.
Like this, can guarantee the versatility of test macro to any card.
In fact:
-in the relative point of the P.e.c. of examine one be positioned under first plate and another is positioned at and arranges under second plate, and when not coinciding, as long as move first and second plates (perhaps also moving card) and the corresponding layout of relative point with examine is just enough accurately with it with probe;
-when the relative point of two P.e.c. of examine very near so that it is when only being covered by a plate, only need the card of mobile examine, and make described circuit accurately be arranged between the described two boards the middle part (perhaps in contrast, move described two boards), so that a bit being positioned under first plate of circuit and another point is positioned under second plate, then by move the two just be enough to make described 2 with described two boards in a respective needle of each piece accurately overlap.
Useful is that the upper and lower that test board is arranged in the card of examine is positioned between the test board so that make.
Use that can be more general like this.
Useful is that this machine also has the pin of detection can axially movable characteristics.
Like this, the part pin is interacted just, and desirable position in the easier aligning P.e.c..
Also have an advantage to be, because pin can move axially, therefore, even, also might better contact with the corresponding desirable point of P.e.c. when blocking or all points of circuit surface are not fully on same plane the time.
Useful is that pin can move axially by calutron.
Like this can be simply and the desirable pin of manipulation of safety.
These and some other advantages of the present invention can be clear by the DETAILED DESCRIPTION OF THE PREFERRED of carrying out below in conjunction with accompanying drawing, and this explanation is not restrictive, only is an example.
Fig. 1 is the perspective diagram of check-out console (bed);
Fig. 2 is the cross sectional representation of axially movable detection pin;
Fig. 3 is a viewgraph of cross-section of preferred embodiment, and it has two pairs of relative check-out consoles, also has the card of the examine between these two pairs of check-out consoles, and two pairs of check-out consoles can independently relatively move each other.
Check-out console is represented with 1, and pin is represented with 10.
Particularly in the drawings, a pair of test check-out console that is positioned at a left side and the right side on two tops represents with 1SS and 1SD that respectively the left side that is positioned at of bottom is represented with 1IS and 1ID respectively with right a pair of test check-out console.
Every block of plate has many being ordered about by electromagnet 11 and makes axially movable pin 10.
Every pin all is electrically connected with the electric parameter check system 12 of a known technology.
In order to operate the location, above-mentioned all plates can independently relatively move each other.
The card that is placed between the plate also can be moved on described plane by 2 expressions and it.
The inspection that this system provides a kind of net list " net-list " of the relative position that utilizes the band single point to carry out.
Connecting test is that pointwise is carried out, and in order to test the connection of a network of being made up of " n " individual point, need carry out " n-1 " inferior test between the paired point of selecting in order to comprise all connected modes.
By from each to selecting a point the network, carry out the short-circuit test in the heterogeneous networks.
The required full test number of times of n network test (check) that can utilize following formula to calculate to carry out in this way, that is: the full test number of times is n* (n-1)/2.
By only selecting next-door neighbour's network, promptly network close to each other can reduce this testing time in predetermined scope.
Need the part that the position is subdivided into again and the pin number on movable test board (bed) adapts of test, the feasible point that will test can reach the position of regulation and contact with one of them testing needle.
By after two boards reaches the point that will test at least, must check to connect or the insulation situation.
To move the used time in order shortening, can to optimize the path of axle by changing the frequency of each test.
This machine is made of a frame, is fixed with two pairs of relative test boards on the frame, and they can independently move with respect to two Z-axises.
Be fixed with test probe (pin) on test board, this probe (pin) is directly handled by electromagnet, and moves along its axis.
At first, P.e.c. is placed on the scaffold, this scaffold can be carried P.e.c. between two test boards.
Printed Circuit Card remains fixed in this position, perhaps then moves again.
Test board is blocked near this, begin test.
Each piece test board is independent check and manipulation, and therefore, required range is by the distance decision between the probe.
When correct position, electromagnet is handled and is positioned at the lip-deep probe that will contact, and like this, utilizes a pair of probe of action simultaneously, can check function, its corresponding continuity and the contingent short-circuit conditions of two circuit between the desirable point.
This process can repeat pointwise in the desired manner and carry out.
As described, except each independently moved with respect to another piece plate plate in the plate, preferably Printed Circuit Card also independently moved with respect to a plate in a pair of plate or another piece plate.
Like this, can obtain purposes widely.
Claims (6)
1. one kind is used for P.e.c. in the card that will check is carried out the machine of electric test, and it comprises test board (1), and this plate is equipped with many conductive pins (10), and the opposite end of pin is connected with electric parameters analysis device between per two pins, it is characterized in that:
-it comprises the test board of at least two coplanes that are closely adjacent to each other;
-test board can independently move with respect to other test board;
The corresponding card (2) of-examine can independently move with respect to described test board (1), and perhaps described test board (1) can independently move with respect to the corresponding card (2) of examine.
2. the machine that is used for P.e.c. is carried out electric test as claimed in claim 1 is characterized in that it comprises the test board (1) of two coplanes that are closely adjacent to each other, and this can relatively move each other to test board.
3. the machine that is used for P.e.c. is carried out electric test as claimed in claim 1 is characterized in that it comprises two pairs of test boards, and every pair is made of two described test boards, and a test board is relative with another piece test board.
4. the machine that is used for P.e.c. is carried out electric test as claimed in claim 1 is characterized in that described pin (10) can move axially.
5. the described machine of arbitrary as described above claim is characterized in that calutron (11) orders about described pin and produces mobile.
6. as the described machine of arbitrary claim in the claim 1 to 4, it is characterized in that testing is that to circuit 2 carry out, make a plate done with respect to the card of examine with respect to another piece plate and/or two boards that corresponding aligning moves or opposite moving after, pin on the plate of point and a side contacts, and another point contacts with a pin of another test board of another same side or opposite flank.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT95UD000251A IT1282829B1 (en) | 1995-12-22 | 1995-12-22 | ELECTRIC TESTING MACHINE FOR PRINTED CIRCUITS WITH ADJUSTABLE POSITION OF THE PROBE NEEDLES |
| ITUD95A000251 | 1995-12-22 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1205774A CN1205774A (en) | 1999-01-20 |
| CN1175270C true CN1175270C (en) | 2004-11-10 |
Family
ID=11421986
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB961992778A Expired - Fee Related CN1175270C (en) | 1995-12-22 | 1996-08-09 | Machine for electric test of printed circuits with adjustable position of sound needles |
Country Status (27)
| Country | Link |
|---|---|
| US (1) | US6124722A (en) |
| EP (1) | EP0876619B1 (en) |
| JP (1) | JP2000502791A (en) |
| KR (1) | KR100526744B1 (en) |
| CN (1) | CN1175270C (en) |
| AT (1) | ATE202850T1 (en) |
| AU (1) | AU718507B2 (en) |
| BR (1) | BR9612251A (en) |
| CA (1) | CA2241326C (en) |
| CZ (1) | CZ298035B6 (en) |
| DE (1) | DE69613717T2 (en) |
| DK (1) | DK0876619T3 (en) |
| ES (1) | ES2160830T3 (en) |
| GR (1) | GR3036790T3 (en) |
| HU (1) | HUP9901931A3 (en) |
| IT (1) | IT1282829B1 (en) |
| MX (1) | MX9805100A (en) |
| NO (1) | NO315877B1 (en) |
| NZ (1) | NZ315085A (en) |
| PL (1) | PL327496A1 (en) |
| PT (1) | PT876619E (en) |
| RO (1) | RO119659B1 (en) |
| RU (1) | RU2212775C2 (en) |
| SI (1) | SI9620133B (en) |
| TR (1) | TR199801178T2 (en) |
| UA (1) | UA28121C2 (en) |
| WO (1) | WO1997023784A1 (en) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| IT1282827B1 (en) | 1995-09-22 | 1998-03-31 | New System Srl | MACHINE FOR THE CONTRAST CHECK OF THE PRINTED CIRCUITS |
| JP2004505251A (en) | 2000-07-19 | 2004-02-19 | オルボテック リミテッド | Apparatus and method for electrical testing of electrical circuits |
| WO2005093441A1 (en) * | 2004-03-26 | 2005-10-06 | Quanta Display Inc. | Line defect testing-repairing device and method |
| CN100357752C (en) * | 2004-03-26 | 2007-12-26 | 广辉电子股份有限公司 | Line defect detection maintenance equipment and method |
| CN100388001C (en) * | 2004-05-24 | 2008-05-14 | 名威科技实业有限公司 | Detecting chip with multiple detecting units |
| DE102009004555A1 (en) | 2009-01-14 | 2010-09-30 | Atg Luther & Maelzer Gmbh | Method for testing printed circuit boards |
| CN108761233B (en) * | 2018-05-23 | 2024-07-26 | 沈小晴 | Module switchable dial device for flexibility test of IED device and test method |
| EP3891516B1 (en) * | 2018-09-11 | 2024-05-29 | Magicmotorsport Srl | Tool and assembly for carrying out tests on electrical and/or electronic circuits |
| JP7217293B2 (en) | 2019-12-18 | 2023-02-02 | 株式会社アドバンテスト | Automatic test equipment for testing one or more devices under test, and method for operating the automatic test equipment |
| CN113474663A (en) * | 2019-12-18 | 2021-10-01 | 爱德万测试公司 | Automatic test equipment for testing one or more devices under test and method of operating automatic test equipment |
| TWI797552B (en) * | 2020-02-06 | 2023-04-01 | 日商愛德萬測試股份有限公司 | Automated test equipment for testing one or more devices-under-test and method for operating an automated test equipment |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU563614A1 (en) * | 1974-04-17 | 1977-06-30 | Московский Ордена Ленина Энергетический Институт | Eddy current converter |
| DE2628428C3 (en) * | 1976-06-24 | 1979-02-15 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Adapter for connecting connection and / or test points of an assembly with a measuring circuit |
| US4841241A (en) * | 1986-08-07 | 1989-06-20 | Siemens Aktiengesellschaft | Testing device for both-sided contacting of component-equipped printed circuit boards |
| EP0256368B1 (en) * | 1986-08-07 | 1992-09-30 | Siemens Aktiengesellschaft | Testing device for the double-sided stepwise contacting of equipped printed circuit boards |
| US4975637A (en) * | 1989-12-29 | 1990-12-04 | International Business Machines Corporation | Method and apparatus for integrated circuit device testing |
| US5436567A (en) * | 1993-02-08 | 1995-07-25 | Automated Test Engineering, Inc. | Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts |
-
1995
- 1995-12-22 NZ NZ315085A patent/NZ315085A/en unknown
- 1995-12-22 IT IT95UD000251A patent/IT1282829B1/en active IP Right Grant
-
1996
- 1996-08-09 ES ES96926571T patent/ES2160830T3/en not_active Expired - Lifetime
- 1996-08-09 TR TR1998/01178T patent/TR199801178T2/en unknown
- 1996-08-09 WO PCT/IT1996/000160 patent/WO1997023784A1/en active IP Right Grant
- 1996-08-09 PT PT96926571T patent/PT876619E/en unknown
- 1996-08-09 KR KR10-1998-0704775A patent/KR100526744B1/en not_active IP Right Cessation
- 1996-08-09 EP EP96926571A patent/EP0876619B1/en not_active Expired - Lifetime
- 1996-08-09 PL PL96327496A patent/PL327496A1/en unknown
- 1996-08-09 RO RO98-01087A patent/RO119659B1/en unknown
- 1996-08-09 AU AU66684/96A patent/AU718507B2/en not_active Ceased
- 1996-08-09 UA UA98063229A patent/UA28121C2/en unknown
- 1996-08-09 HU HU9901931A patent/HUP9901931A3/en unknown
- 1996-08-09 CZ CZ0187498A patent/CZ298035B6/en not_active IP Right Cessation
- 1996-08-09 CA CA002241326A patent/CA2241326C/en not_active Expired - Fee Related
- 1996-08-09 DE DE69613717T patent/DE69613717T2/en not_active Expired - Fee Related
- 1996-08-09 BR BR9612251A patent/BR9612251A/en not_active IP Right Cessation
- 1996-08-09 SI SI9620133A patent/SI9620133B/en not_active IP Right Cessation
- 1996-08-09 RU RU98113859/09A patent/RU2212775C2/en not_active IP Right Cessation
- 1996-08-09 CN CNB961992778A patent/CN1175270C/en not_active Expired - Fee Related
- 1996-08-09 US US09/091,677 patent/US6124722A/en not_active Expired - Fee Related
- 1996-08-09 AT AT96926571T patent/ATE202850T1/en not_active IP Right Cessation
- 1996-08-09 DK DK96926571T patent/DK0876619T3/en active
- 1996-08-09 JP JP9523485A patent/JP2000502791A/en not_active Ceased
-
1998
- 1998-06-12 NO NO19982707A patent/NO315877B1/en unknown
- 1998-06-22 MX MX9805100A patent/MX9805100A/en not_active IP Right Cessation
-
2001
- 2001-10-03 GR GR20010401652T patent/GR3036790T3/en not_active IP Right Cessation
Also Published As
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN1175270C (en) | Machine for electric test of printed circuits with adjustable position of sound needles | |
| CN1072362C (en) | Manufacturing defect analyzer with improved fault coverage | |
| CN1174257C (en) | Method and apparatus for testing circuit board | |
| DE112016001987T5 (en) | Inspection device and inspection method | |
| ITTO991077A1 (en) | TEST APPARATUS FOR TESTING BACKPLANE OR POPULAR CIRCUIT BOARDS. | |
| CN1452231A (en) | Testing board for testing semiconductor | |
| CN1790042A (en) | Multiplex test method for semiconductor wafer and multiplex test probe station therefor | |
| DE112015001192T5 (en) | Inspection system for device under test and method for operating an inspection system for device under test | |
| CN109225929B (en) | Inductor performance automatic tester | |
| WO2016182289A1 (en) | Test socket adapter | |
| DE19581448C2 (en) | Devices and methods for automatic testing of components | |
| CN1196794A (en) | Machine for opposite control of printed circuits | |
| CN100340864C (en) | Apparatus and method for testing circuit board | |
| EP0989409A1 (en) | Scan test machine for densely spaced test sites | |
| DE10260238A1 (en) | Adapter for testing printed circuit boards | |
| JP3924724B2 (en) | Module for inspection equipment for inspecting printed circuit boards | |
| CN116990618A (en) | Automatic aging test device for batch chargers and application method thereof | |
| CN113740637B (en) | Cable test fixture | |
| CN215813193U (en) | Testing device for PCB | |
| DE69927126T2 (en) | Sampling tester for testing the continuity of bare printed circuits | |
| RU98107136A (en) | DEVICE FOR REGULATING PRINTED BOARDS LOCATED ON THE OPPOSITE PARTIES | |
| DE19707485A1 (en) | Converter device with a force-applying blind pins | |
| CN206863175U (en) | One kind automation FCT detection means | |
| CN206505105U (en) | A kind of common type bimodulus electrical testing electrode tip holder | |
| CN218995590U (en) | PCB board detection device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C19 | Lapse of patent right due to non-payment of the annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |