CN117274152A - 信息处理设备、信息处理方法和存储介质 - Google Patents

信息处理设备、信息处理方法和存储介质 Download PDF

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Publication number
CN117274152A
CN117274152A CN202310697230.7A CN202310697230A CN117274152A CN 117274152 A CN117274152 A CN 117274152A CN 202310697230 A CN202310697230 A CN 202310697230A CN 117274152 A CN117274152 A CN 117274152A
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CN
China
Prior art keywords
information
defect
image
processing apparatus
defect information
Prior art date
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Pending
Application number
CN202310697230.7A
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English (en)
Chinese (zh)
Inventor
杉山贤治
野上敦史
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Publication of CN117274152A publication Critical patent/CN117274152A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/00—Two-dimensional [2D] image generation
    • G06T11/60—Creating or editing images; Combining images with text
    • G06T11/65—Creating or editing images; Combining images with text on geographic maps
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/40—Extraction of image or video features
    • G06V10/44—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/764—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/222—Studio circuitry; Studio devices; Studio equipment
    • H04N5/262—Studio circuits, e.g. for mixing, switching-over, change of character of image, other special effects ; Cameras specially adapted for the electronic generation of special effects
    • H04N5/265—Mixing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30132—Masonry; Concrete

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Software Systems (AREA)
  • Signal Processing (AREA)
  • Artificial Intelligence (AREA)
  • Health & Medical Sciences (AREA)
  • Medical Informatics (AREA)
  • Evolutionary Computation (AREA)
  • General Health & Medical Sciences (AREA)
  • Computing Systems (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Databases & Information Systems (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Data Mining & Analysis (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
CN202310697230.7A 2022-06-20 2023-06-13 信息处理设备、信息处理方法和存储介质 Pending CN117274152A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022-099048 2022-06-20
JP2022099048A JP2024000324A (ja) 2022-06-20 2022-06-20 情報処理装置、情報処理方法及びプログラム

Publications (1)

Publication Number Publication Date
CN117274152A true CN117274152A (zh) 2023-12-22

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN202310697230.7A Pending CN117274152A (zh) 2022-06-20 2023-06-13 信息处理设备、信息处理方法和存储介质

Country Status (4)

Country Link
US (1) US20230410284A1 (https=)
EP (1) EP4296956A1 (https=)
JP (1) JP2024000324A (https=)
CN (1) CN117274152A (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7564671B2 (ja) 2020-09-29 2024-10-09 キヤノン株式会社 情報処理装置、制御方法、及び、プログラム

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005310044A (ja) 2004-04-26 2005-11-04 Constec Engi Co データ処理装置、データ処理方法、及びデータ処理プログラム
JP5645730B2 (ja) 2011-03-25 2014-12-24 公益財団法人鉄道総合技術研究所 コンクリート表面の閉合ひび割れ検出方法
JP6099479B2 (ja) 2013-05-21 2017-03-22 大成建設株式会社 ひび割れ検出方法
WO2017216943A1 (ja) * 2016-06-17 2017-12-21 三菱電機株式会社 変状進展判定装置及び変状進展判定方法
JP6805351B2 (ja) * 2017-07-27 2020-12-23 富士フイルム株式会社 損傷データ編集装置、損傷データ編集方法、およびプログラム
WO2019150872A1 (ja) * 2018-02-02 2019-08-08 富士フイルム株式会社 画像処理装置及び画像処理方法
JP7344692B2 (ja) * 2019-07-22 2023-09-14 キヤノン株式会社 情報処理装置及び情報処理方法及びプログラム
JP7427381B2 (ja) * 2019-07-22 2024-02-05 キヤノン株式会社 情報処理装置、システム、情報処理方法及びプログラム
EP4006792B1 (en) * 2019-07-25 2025-06-25 FUJIFILM Corporation Repair diagram creating device, repair diagram creating method, and program
JP7433623B2 (ja) * 2019-11-18 2024-02-20 株式会社ベイシスコンサルティング 構造物画像管理システム

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JP2024000324A (ja) 2024-01-05
EP4296956A1 (en) 2023-12-27
US20230410284A1 (en) 2023-12-21

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