JP2024000324A - 情報処理装置、情報処理方法及びプログラム - Google Patents

情報処理装置、情報処理方法及びプログラム Download PDF

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Publication number
JP2024000324A
JP2024000324A JP2022099048A JP2022099048A JP2024000324A JP 2024000324 A JP2024000324 A JP 2024000324A JP 2022099048 A JP2022099048 A JP 2022099048A JP 2022099048 A JP2022099048 A JP 2022099048A JP 2024000324 A JP2024000324 A JP 2024000324A
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deformation
image
processing apparatus
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JP2022099048A
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Japanese (ja)
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JP2024000324A5 (https=
Inventor
賢治 杉山
Kenji Sugiyama
敦史 野上
Atsushi Nogami
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Canon Inc
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Canon Inc
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Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2022099048A priority Critical patent/JP2024000324A/ja
Priority to EP23163699.4A priority patent/EP4296956A1/en
Priority to US18/193,671 priority patent/US20230410284A1/en
Priority to CN202310697230.7A priority patent/CN117274152A/zh
Publication of JP2024000324A publication Critical patent/JP2024000324A/ja
Publication of JP2024000324A5 publication Critical patent/JP2024000324A5/ja
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    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/0008Industrial image inspection checking presence/absence
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00Machine learning
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/00Two-dimensional [2D] image generation
    • G06T11/60Creating or editing images; Combining images with text
    • G06T11/65Creating or editing images; Combining images with text on geographic maps
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/50Depth or shape recovery
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/70Determining position or orientation of objects or cameras
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/40Extraction of image or video features
    • G06V10/44Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/70Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/764Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00Details of television systems
    • H04N5/222Studio circuitry; Studio devices; Studio equipment
    • H04N5/262Studio circuits, e.g. for mixing, switching-over, change of character of image, other special effects ; Cameras specially adapted for the electronic generation of special effects
    • H04N5/265Mixing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10016Video; Image sequence
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30132Masonry; Concrete

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Software Systems (AREA)
  • Signal Processing (AREA)
  • Artificial Intelligence (AREA)
  • Health & Medical Sciences (AREA)
  • Medical Informatics (AREA)
  • Evolutionary Computation (AREA)
  • General Health & Medical Sciences (AREA)
  • Computing Systems (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Databases & Information Systems (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Data Mining & Analysis (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
JP2022099048A 2022-06-20 2022-06-20 情報処理装置、情報処理方法及びプログラム Pending JP2024000324A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2022099048A JP2024000324A (ja) 2022-06-20 2022-06-20 情報処理装置、情報処理方法及びプログラム
EP23163699.4A EP4296956A1 (en) 2022-06-20 2023-03-23 Defect detection in partial images capturing an entire inspected infrastructure
US18/193,671 US20230410284A1 (en) 2022-06-20 2023-03-31 Information processing apparatus and information processing method
CN202310697230.7A CN117274152A (zh) 2022-06-20 2023-06-13 信息处理设备、信息处理方法和存储介质

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Application Number Priority Date Filing Date Title
JP2022099048A JP2024000324A (ja) 2022-06-20 2022-06-20 情報処理装置、情報処理方法及びプログラム

Publications (2)

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JP2024000324A true JP2024000324A (ja) 2024-01-05
JP2024000324A5 JP2024000324A5 (https=) 2025-06-17

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US (1) US20230410284A1 (https=)
EP (1) EP4296956A1 (https=)
JP (1) JP2024000324A (https=)
CN (1) CN117274152A (https=)

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Publication number Priority date Publication date Assignee Title
JP7564671B2 (ja) 2020-09-29 2024-10-09 キヤノン株式会社 情報処理装置、制御方法、及び、プログラム

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017216943A1 (ja) * 2016-06-17 2017-12-21 三菱電機株式会社 変状進展判定装置及び変状進展判定方法
WO2019021719A1 (ja) * 2017-07-27 2019-01-31 富士フイルム株式会社 損傷データ編集装置、損傷データ編集方法、およびプログラム
WO2019150872A1 (ja) * 2018-02-02 2019-08-08 富士フイルム株式会社 画像処理装置及び画像処理方法
WO2021014774A1 (ja) * 2019-07-25 2021-01-28 富士フイルム株式会社 補修図生成装置、補修図生成方法及びプログラム
JP2021018676A (ja) * 2019-07-22 2021-02-15 キヤノン株式会社 情報処理装置及び情報処理方法及びプログラム
JP2021081912A (ja) * 2019-11-18 2021-05-27 株式会社ベイシスコンサルティング 構造物画像管理システム

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JP2005310044A (ja) 2004-04-26 2005-11-04 Constec Engi Co データ処理装置、データ処理方法、及びデータ処理プログラム
JP5645730B2 (ja) 2011-03-25 2014-12-24 公益財団法人鉄道総合技術研究所 コンクリート表面の閉合ひび割れ検出方法
JP6099479B2 (ja) 2013-05-21 2017-03-22 大成建設株式会社 ひび割れ検出方法
JP7427381B2 (ja) * 2019-07-22 2024-02-05 キヤノン株式会社 情報処理装置、システム、情報処理方法及びプログラム

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WO2017216943A1 (ja) * 2016-06-17 2017-12-21 三菱電機株式会社 変状進展判定装置及び変状進展判定方法
WO2019021719A1 (ja) * 2017-07-27 2019-01-31 富士フイルム株式会社 損傷データ編集装置、損傷データ編集方法、およびプログラム
WO2019150872A1 (ja) * 2018-02-02 2019-08-08 富士フイルム株式会社 画像処理装置及び画像処理方法
US20200349695A1 (en) * 2018-02-02 2020-11-05 Fujifilm Corporation Image processing apparatus and image processing method
JP2021018676A (ja) * 2019-07-22 2021-02-15 キヤノン株式会社 情報処理装置及び情報処理方法及びプログラム
WO2021014774A1 (ja) * 2019-07-25 2021-01-28 富士フイルム株式会社 補修図生成装置、補修図生成方法及びプログラム
JP2021081912A (ja) * 2019-11-18 2021-05-27 株式会社ベイシスコンサルティング 構造物画像管理システム

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PRASHANT KUMAR; APURVA SHARMA; SOLOMON RAJU KOTA: "Automatic Multiclass Instance Segmentation of Concrete Damage Using Deep Learning Model", IEEE ACCESS, vol. 9, JPN6026009751, 21 June 2021 (2021-06-21), US, pages 90330 - 90345, ISSN: 0005816111 *

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CN117274152A (zh) 2023-12-22
EP4296956A1 (en) 2023-12-27
US20230410284A1 (en) 2023-12-21

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