JP2024000324A - 情報処理装置、情報処理方法及びプログラム - Google Patents
情報処理装置、情報処理方法及びプログラム Download PDFInfo
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- JP2024000324A JP2024000324A JP2022099048A JP2022099048A JP2024000324A JP 2024000324 A JP2024000324 A JP 2024000324A JP 2022099048 A JP2022099048 A JP 2022099048A JP 2022099048 A JP2022099048 A JP 2022099048A JP 2024000324 A JP2024000324 A JP 2024000324A
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0008—Industrial image inspection checking presence/absence
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N20/00—Machine learning
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T11/00—Two-dimensional [2D] image generation
- G06T11/60—Creating or editing images; Combining images with text
- G06T11/65—Creating or editing images; Combining images with text on geographic maps
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/40—Extraction of image or video features
- G06V10/44—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
- G06V10/764—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/222—Studio circuitry; Studio devices; Studio equipment
- H04N5/262—Studio circuits, e.g. for mixing, switching-over, change of character of image, other special effects ; Cameras specially adapted for the electronic generation of special effects
- H04N5/265—Mixing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10016—Video; Image sequence
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30132—Masonry; Concrete
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- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- Quality & Reliability (AREA)
- Software Systems (AREA)
- Signal Processing (AREA)
- Artificial Intelligence (AREA)
- Health & Medical Sciences (AREA)
- Medical Informatics (AREA)
- Evolutionary Computation (AREA)
- General Health & Medical Sciences (AREA)
- Computing Systems (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Databases & Information Systems (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Data Mining & Analysis (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Analysis (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022099048A JP2024000324A (ja) | 2022-06-20 | 2022-06-20 | 情報処理装置、情報処理方法及びプログラム |
| EP23163699.4A EP4296956A1 (en) | 2022-06-20 | 2023-03-23 | Defect detection in partial images capturing an entire inspected infrastructure |
| US18/193,671 US20230410284A1 (en) | 2022-06-20 | 2023-03-31 | Information processing apparatus and information processing method |
| CN202310697230.7A CN117274152A (zh) | 2022-06-20 | 2023-06-13 | 信息处理设备、信息处理方法和存储介质 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022099048A JP2024000324A (ja) | 2022-06-20 | 2022-06-20 | 情報処理装置、情報処理方法及びプログラム |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2024000324A true JP2024000324A (ja) | 2024-01-05 |
| JP2024000324A5 JP2024000324A5 (https=) | 2025-06-17 |
Family
ID=85726403
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022099048A Pending JP2024000324A (ja) | 2022-06-20 | 2022-06-20 | 情報処理装置、情報処理方法及びプログラム |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20230410284A1 (https=) |
| EP (1) | EP4296956A1 (https=) |
| JP (1) | JP2024000324A (https=) |
| CN (1) | CN117274152A (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7564671B2 (ja) | 2020-09-29 | 2024-10-09 | キヤノン株式会社 | 情報処理装置、制御方法、及び、プログラム |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2017216943A1 (ja) * | 2016-06-17 | 2017-12-21 | 三菱電機株式会社 | 変状進展判定装置及び変状進展判定方法 |
| WO2019021719A1 (ja) * | 2017-07-27 | 2019-01-31 | 富士フイルム株式会社 | 損傷データ編集装置、損傷データ編集方法、およびプログラム |
| WO2019150872A1 (ja) * | 2018-02-02 | 2019-08-08 | 富士フイルム株式会社 | 画像処理装置及び画像処理方法 |
| WO2021014774A1 (ja) * | 2019-07-25 | 2021-01-28 | 富士フイルム株式会社 | 補修図生成装置、補修図生成方法及びプログラム |
| JP2021018676A (ja) * | 2019-07-22 | 2021-02-15 | キヤノン株式会社 | 情報処理装置及び情報処理方法及びプログラム |
| JP2021081912A (ja) * | 2019-11-18 | 2021-05-27 | 株式会社ベイシスコンサルティング | 構造物画像管理システム |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005310044A (ja) | 2004-04-26 | 2005-11-04 | Constec Engi Co | データ処理装置、データ処理方法、及びデータ処理プログラム |
| JP5645730B2 (ja) | 2011-03-25 | 2014-12-24 | 公益財団法人鉄道総合技術研究所 | コンクリート表面の閉合ひび割れ検出方法 |
| JP6099479B2 (ja) | 2013-05-21 | 2017-03-22 | 大成建設株式会社 | ひび割れ検出方法 |
| JP7427381B2 (ja) * | 2019-07-22 | 2024-02-05 | キヤノン株式会社 | 情報処理装置、システム、情報処理方法及びプログラム |
-
2022
- 2022-06-20 JP JP2022099048A patent/JP2024000324A/ja active Pending
-
2023
- 2023-03-23 EP EP23163699.4A patent/EP4296956A1/en active Pending
- 2023-03-31 US US18/193,671 patent/US20230410284A1/en active Pending
- 2023-06-13 CN CN202310697230.7A patent/CN117274152A/zh active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2017216943A1 (ja) * | 2016-06-17 | 2017-12-21 | 三菱電機株式会社 | 変状進展判定装置及び変状進展判定方法 |
| WO2019021719A1 (ja) * | 2017-07-27 | 2019-01-31 | 富士フイルム株式会社 | 損傷データ編集装置、損傷データ編集方法、およびプログラム |
| WO2019150872A1 (ja) * | 2018-02-02 | 2019-08-08 | 富士フイルム株式会社 | 画像処理装置及び画像処理方法 |
| US20200349695A1 (en) * | 2018-02-02 | 2020-11-05 | Fujifilm Corporation | Image processing apparatus and image processing method |
| JP2021018676A (ja) * | 2019-07-22 | 2021-02-15 | キヤノン株式会社 | 情報処理装置及び情報処理方法及びプログラム |
| WO2021014774A1 (ja) * | 2019-07-25 | 2021-01-28 | 富士フイルム株式会社 | 補修図生成装置、補修図生成方法及びプログラム |
| JP2021081912A (ja) * | 2019-11-18 | 2021-05-27 | 株式会社ベイシスコンサルティング | 構造物画像管理システム |
Non-Patent Citations (2)
| Title |
|---|
| "画像処理によるコンクリート構造物のひび割れ幅計測 クラックスケールを用いた定量的測定", 画像ラボ 第18巻 第11号, JPN6026009750, 1 November 2007 (2007-11-01), ISSN: 0005816110 * |
| PRASHANT KUMAR; APURVA SHARMA; SOLOMON RAJU KOTA: "Automatic Multiclass Instance Segmentation of Concrete Damage Using Deep Learning Model", IEEE ACCESS, vol. 9, JPN6026009751, 21 June 2021 (2021-06-21), US, pages 90330 - 90345, ISSN: 0005816111 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN117274152A (zh) | 2023-12-22 |
| EP4296956A1 (en) | 2023-12-27 |
| US20230410284A1 (en) | 2023-12-21 |
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