CN117147916A - Clamp device and signal eye diagram measuring device - Google Patents
Clamp device and signal eye diagram measuring device Download PDFInfo
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- CN117147916A CN117147916A CN202210929165.1A CN202210929165A CN117147916A CN 117147916 A CN117147916 A CN 117147916A CN 202210929165 A CN202210929165 A CN 202210929165A CN 117147916 A CN117147916 A CN 117147916A
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- 238000010586 diagram Methods 0.000 title claims abstract description 58
- 238000012360 testing method Methods 0.000 claims abstract description 165
- 239000003990 capacitor Substances 0.000 claims abstract description 119
- 239000004020 conductor Substances 0.000 claims abstract description 107
- 239000000758 substrate Substances 0.000 claims abstract description 61
- 239000000523 sample Substances 0.000 claims abstract description 41
- 230000000149 penetrating effect Effects 0.000 claims abstract description 12
- 238000010168 coupling process Methods 0.000 claims abstract description 6
- 230000008878 coupling Effects 0.000 claims abstract description 5
- 238000005859 coupling reaction Methods 0.000 claims abstract description 5
- 238000005259 measurement Methods 0.000 claims description 9
- 230000013011 mating Effects 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 18
- 230000005540 biological transmission Effects 0.000 description 19
- 230000008054 signal transmission Effects 0.000 description 3
- 230000005484 gravity Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000000881 depressing effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 239000012779 reinforcing material Substances 0.000 description 1
- 230000011664 signaling Effects 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/30—Monitoring; Testing of propagation channels
- H04B17/309—Measuring or estimating channel quality parameters
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- Electromagnetism (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The application provides a clamp device and a signal eye diagram measuring device, wherein the clamp device is applied to a central control board, a first test capacitor and a second test capacitor are arranged on the central control board, and the first test capacitor and the second test capacitor can perform signal coupling processing on differential signals. The fixture device comprises a substrate, a first conductor and a second conductor, wherein the substrate is arranged opposite to the central control board, a first through hole and a second through hole are formed in the substrate, the first through hole can correspond to the first test capacitor, and the second through hole can correspond to the second test capacitor; the first conductor is arranged in the first through hole in a penetrating way and can be electrically connected with the first test capacitor; the second conductor is arranged in the second through hole in a penetrating way and can be electrically connected with the second test capacitor. The fixture device can assist in signal eye diagram test, not only can improve the contact accuracy of the test probe and the test capacitor, but also can simplify the operation process of measuring the eye diagram.
Description
Technical Field
The application relates to the technical field of display, in particular to a clamp device and a signal eye diagram measuring device.
Background
Currently, differential signals are transmitted between a central control board and a display panel of a display device BY adopting an LVDS interface, a V-BY-ONE interface or a P2P interface. In order to test the quality of differential signals transmitted by the center control board or to test the transmission performance of the FFC (Flexible Flat Cable, tin plated flat copper wire) connected between the center control board and the display panel, it is often necessary to measure the signal eye pattern of the test capacitance on the center control board.
In the testing process, a test probe is generally required to be contacted with a test capacitor, so as to obtain a signal eye pattern. However, the test capacitor is smaller, and the test probe cannot accurately contact with the test capacitor, so that the test probe needs to be continuously adjusted; however, in the process of continuously adjusting the test probe, the probe rubs against the test capacitor, which causes the test capacitor to be easily damaged, and even directly damages the central control board, so that the test process cannot be continuously performed.
Disclosure of Invention
The embodiment of the application provides a clamp device and a signal eye diagram measuring device, wherein the clamp device can assist in signal eye diagram test, not only can improve the contact accuracy of a test probe and a test capacitor, but also can simplify the operation process of measuring an eye diagram.
The embodiment of the application provides a fixture device, which is applied to a central control board, wherein a first test capacitor and a second test capacitor are arranged on the central control board, and the first test capacitor and the second test capacitor can perform signal coupling processing on differential signals, and the fixture device comprises:
the substrate is arranged opposite to the central control board, a first through hole and a second through hole are formed in the substrate, the first through hole can correspond to the first test capacitor, and the second through hole can correspond to the second test capacitor;
the first conductor is arranged in the first through hole in a penetrating mode and can be electrically connected with the first test capacitor;
the second conductor is arranged in the second through hole in a penetrating mode, and the second conductor can be electrically connected with the second test capacitor.
In some embodiments, the first conductive body includes a first main body portion and a first sharp portion, one end of the first main body portion is connected to the first sharp portion, the other end is disposed through the first through hole, and the first sharp portion can be electrically connected to the first test capacitor.
In some embodiments, the first electrical conductor further includes a clamping portion connected to an end of the first body portion remote from the first sharp portion, a minimum width of the clamping portion perpendicular to a length direction of the first body portion being greater than a diameter of the first through hole; when the first conductor penetrates through the first through hole, the clamping part is located at one side of the substrate away from the central control board, the first main body part penetrates through the through hole, and the first sharp part is located at one side of the substrate close to the central control board.
In some embodiments, the hole wall of the first through hole is provided with an internal thread, and an end of the first main body part far away from the first sharp part is provided with an external thread, and the internal thread is matched with the external thread, so that the first electric conductor is fixed on the substrate.
In some embodiments, the second electrical conductor includes a second main body portion and a second sharp portion, one end of the second main body portion is connected to the second sharp portion, and the other end is disposed through the second through hole.
In some embodiments, the fixture apparatus further comprises a support coupled to the substrate, the support being capable of supporting the substrate on the central control board.
In some embodiments, the fixture apparatus further comprises a fastener coupled to the base plate, the fastener further being capable of being coupled to the central control plate such that the base plate is relatively fixed to the central control plate.
The embodiment of the application also provides a signal eye diagram measuring device, which comprises:
the test equipment comprises an oscilloscope and a probe connected with the oscilloscope;
in the fixture device, the probe can be electrically connected with the first conductor and the second conductor.
In some embodiments, the signal eye diagram measuring device further comprises a servo driver and a servo motor electrically connected with the servo driver, wherein the servo motor is connected with the probe, and the servo driver can drive the servo motor to drive the probe to move.
In some embodiments, the signal eye measurement device further comprises a controller electrically connected to the servo driver.
The clamp device provided by the embodiment of the application is applied to the central control board, the first test capacitor and the second test capacitor are arranged on the central control board, and the signal transmission quality can be detected by testing the signal eye patterns of the first test capacitor and the second test capacitor. The fixture device comprises a substrate, a first conductor and a second conductor, wherein the substrate and the central control board are oppositely arranged, a first through hole and a second through hole are formed in the substrate, and the first through hole corresponds to the first test capacitor, the second through hole corresponds to the second test capacitor, so that the first conductor can be electrically connected with the first test capacitor only by penetrating through the first through hole, and the second conductor can be electrically connected with the second test capacitor only by penetrating through the second through hole. When testing the central control board, only need the probe electricity to connect the one end that first electric conductor kept away from first test capacitor and the one end that second electric conductor kept away from second test capacitor just can carry out the signal eye pattern test, just so need not constantly carry out artificial debugging, not only can improve the accuracy that test probe contacted with test capacitor, can also simplify the operation process of measuring the eye pattern.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are required to be used in the description of the embodiments will be briefly described below. It is evident that the drawings in the following description are only some embodiments of the application and that other drawings may be obtained from these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic diagram of a first structure of a fixture device according to an embodiment of the present application.
Fig. 2 is a schematic diagram of a second structure of a fixture device according to an embodiment of the present application.
Fig. 3 is a schematic view of a third structure of the clamp device according to the embodiment of the present application.
Fig. 4 is a schematic diagram of a first structure of a first electrical conductor according to an embodiment of the present application.
Fig. 5 is a schematic diagram of a fourth structure of a fixture device according to an embodiment of the present application.
Fig. 6 is a schematic diagram of a second structure of the first conductor according to the embodiment of the present application.
Fig. 7 is a schematic diagram of a first structure of a second conductor according to an embodiment of the present application.
Fig. 8 is a schematic diagram of a second structure of a second electrical conductor according to an embodiment of the present application.
Fig. 9 is a schematic view of a fifth structure of a fixture device according to an embodiment of the present application.
Fig. 10 is a schematic diagram of a first structure of a signal eye diagram measurement device according to an embodiment of the application.
Fig. 11 is a schematic diagram of a second structure of a signal eye diagram measurement device according to an embodiment of the application.
Fig. 12 is a schematic diagram of a third structure of a signal eye diagram measurement device according to an embodiment of the application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. It will be apparent that the described embodiments are only some, but not all, embodiments of the application. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to fall within the scope of the application.
Currently, differential signals are transmitted between a central control board and a display panel of a display device BY adopting an LVDS interface, a V-BY-ONE interface or a P2P interface. In order to test the quality of differential signals transmitted by the center control board or to test the transmission performance of the FFC connected between the center control board and the display panel, it is often necessary to measure the signal eye pattern of the test capacitor on the center control board.
In the transmission process of differential signals, the test capacitor is often required to filter noise in the differential signals, so that the quality of the output differential signals is effectively ensured. When the differential signals output by the central control board are required to be tested, the quality of the differential signals output by the central control board can be obtained only by testing the differential signals passing through the test capacitor to obtain a signal eye diagram.
During testing, the test probe needs to be in contact with the test capacitor to acquire a signal eye pattern. However, in the process of acquiring the signal eye pattern, the following problems often occur, resulting in low test efficiency and even damage to the central control board. First, because the test capacitor is smaller, or the layout of the test capacitor of the central control board is unreasonable, the test capacitor is not easily contacted well when the test probe is used, and the situation that the test probe and the test capacitor are not contacted well often exists, so that the test is required to be repeated continuously. And the second point is that the probe can rub with the test capacitor in the process of continuously adjusting the probe, so that the test capacitor is easy to damage, and even the center control board can be directly damaged, so that the test process cannot be continuously performed.
Therefore, in order to solve the above-mentioned problems, the present application provides a fixture device and a signal eye diagram measuring device, wherein the fixture device can assist the signal eye diagram test, not only can improve the accuracy of the contact between the test probe and the test capacitor, but also can simplify the operation process of measuring the eye diagram. The following description is made in detail with reference to the accompanying drawings.
Referring to fig. 1, fig. 1 is a schematic diagram of a first structure of a clamp device according to an embodiment of the application.
Embodiments of the present application provide a clamp apparatus 10. The fixture device 10 is applied to a central control board 20, and a first test capacitor 21 and a second test capacitor 22 are arranged on the central control board 20, and the first test capacitor 21 and the second test capacitor 22 can perform signal coupling processing on differential signals.
The central control board 20 is also called a logic board, a screen driving board or a TCON board, and the central control board 20 is connected to a display screen to control the image display of the display screen. For example, the central control board 20 processes an input signal (the input signal includes three signals of RGB data signal, clock signal and control signal) and then converts the processed input signal into a differential signal, i.e., a LVDS (Low-Voltage Differential Signaling, low voltage differential signal) signal capable of driving the display screen, and then directly sends the differential signal to the LVDS receiving chip of the display screen.
Wherein the formation of the differential signal relies on a differential transmission technique. The differential transmission technique is to transmit a first signal on a first transmission line and a second signal on a second transmission line, wherein the first signal and the second signal have the same amplitude and opposite phases, and the first signal and the second signal are commonly referred to as differential signals. On the central control board 20, the first and second transmission lines are generally of equal length, equal width, in close proximity and at the same level. Therefore, the differential signal is formed by the common transmission of the first transmission line and the second transmission line, so that the first test capacitor 21 is provided on the first transmission line, and the second test capacitor 22 is provided on the second transmission line, so that the signal coupling process is performed on the differential signal.
Referring to fig. 2, fig. 2 is a schematic diagram of a second structure of a clamp device according to an embodiment of the application.
The fixture device 10 at least comprises a substrate 11, a first conductor 12 and a second conductor 13, wherein the substrate 11 is disposed opposite to the central control board 20, a first through hole 111 and a second through hole 112 are disposed on the substrate 11, the first through hole 111 can correspond to the first test capacitor 21, and the second through hole 112 can correspond to the second test capacitor 22. The first conductor 12 is disposed in the first through hole 111, the first conductor 12 can be electrically connected to the first test capacitor 21, the second conductor 13 is disposed in the second through hole 112, and the second conductor 13 can be electrically connected to the second test capacitor 22. The substrate 11 may be an insulating plate made of a polymer synthetic resin and a reinforcing material.
With continued reference to fig. 2 and fig. 3, fig. 3 is a schematic diagram of a third structure of the clamp device according to the embodiment of the application.
The first through hole 111 and the second through hole 112 on the substrate 11 may be one or more. When the first through hole 111 and the second through hole 112 on the substrate 11 are respectively one, the jig device 10 can be applied to the center control board 20 transmitting a differential signal. That is, the first transmission line and the second transmission line on the central control board 20 are one, and the number of the first test capacitors 21 and the number of the second test capacitors 22 are 1. Accordingly, the number of the first conductors 12 and the second conductors 13 is 1. When the number of the first through holes 111 and the second through holes 112 on the substrate 11 is two or more, respectively, the jig device 10 may be applied to the center control board 20 that transmits at least one differential signal. That is, the first transmission line and the second transmission line of the central control board 20 are at least one, each first transmission line is connected to a first test capacitor 21, and each second transmission line is connected to a second test capacitor 22. For example, when the number of the first through holes 111 and the second through holes 112 on the substrate 11 is three, the fixture device 10 may be applied to the central control board 20 that transmits three differential signals.
When the fixture device 10 is disposed on the central control board 20, the substrate 11 is disposed opposite to the central control board 20, the first through holes 111 are in one-to-one correspondence with the first test capacitors 21, the second through holes 112 are in one-to-one correspondence with the second test capacitors 22, the first conductive body 12 is passed through the first through holes 111 and electrically connected with the first test capacitors 21, the second conductive body 13 is passed through the second through holes 112 and electrically connected with the second test capacitors 13 and 22, and finally, only the first conductive body 12 and the second conductive body 13 need to be connected to detect differential signals transmitted by the first test capacitors 21 and the second test capacitors 22.
When a plurality of differential signals are transmitted on the central control board 20, each differential signal corresponds to one first test capacitor 21 and one second test capacitor 22. Similarly, the substrate 11 is provided with a plurality of first through holes 111 and a plurality of second through holes 112. When the fixture device 10 is disposed on the central control board 20, the substrate 11 and the central control board 20 are disposed opposite to each other, and each first through hole 111 corresponds to one first test capacitor 21, each second through hole 112 corresponds to one second test capacitor 22, then each first conductor 12 is passed through one first through hole 111 and electrically connected to the first test capacitor 21 corresponding to the first through hole 111, and each second conductor 13 is passed through one second through hole 112 and electrically connected to the second test capacitor 22 corresponding to the second through hole 112.
The fixture device 10 provided by the embodiment of the application is applied to the central control board 20, the central control board 20 is provided with the first test capacitor 21 and the second test capacitor 22, and the signal transmission quality can be detected by testing the signal eye diagrams of the first test capacitor 21 and the second test capacitor 22. The fixture device 10 includes a substrate 11, a first conductor 12 and a second conductor 13, the substrate 11 is disposed opposite to the central control board 20, a first through hole 111 and a second through hole 112 are disposed on the substrate 11, and since the first through hole 111 corresponds to the first test capacitor 21 and the second through hole 112 corresponds to the second test capacitor 22, the first conductor 12 can be electrically connected to the first test capacitor 21 only by penetrating through the first through hole 111, and similarly, the second conductor 13 can be electrically connected to the second test capacitor 22 only by penetrating through the second through hole 112. When the central control board 20 is tested, only the end, far away from the first test capacitor 21, of the first conductor 12 and the end, far away from the second test capacitor 22, of the second conductor 13 are electrically connected by the probe to perform signal eye diagram test, so that manual debugging is not required continuously, the contact accuracy of the test probe and the test capacitor can be improved, and the operation process of measuring an eye diagram can be simplified.
In some embodiments, referring to fig. 4, fig. 4 is a schematic diagram of a first structure of a first electrical conductor according to an embodiment of the present application. The first conductor 12 includes a first main body 121 and a first sharp portion 122, and one end of the first main body 121 is connected to the first sharp portion 122, and the other end is disposed through the first through hole 111. Wherein the first sharp portion 122 is electrically connectable to the first test capacitor 21. It can be appreciated that, when the first sharp portion 122 is electrically connected to the first test capacitor 21, the contact area between the first sharp portion 122 and the first test capacitor 21 is small, so that the first test capacitor 21 is contacted more accurately, and other electronic components are not easily touched by mistake. The first electrical conductor 12 may be a hollow structure to save material.
In some embodiments, referring to fig. 5 and fig. 6, fig. 5 is a fourth structural schematic diagram of a fixture device according to an embodiment of the present application, and fig. 6 is a second structural schematic diagram of a first electrical conductor according to an embodiment of the present application. The first electrical conductor 12 further includes a clamping portion (denoted as a first clamping portion 123), the first clamping portion 123 is connected to an end of the first body portion 121 away from the first sharp portion 122, and a minimum width of the first clamping portion 123 perpendicular to the length direction of the first body portion 121 is greater than a diameter of the first through hole 111. When the first electrical conductor 12 is inserted into the first through hole 111, the first clamping portion 123 is located at a side of the substrate 11 away from the central control board 20, the first main body portion 121 is inserted into the first through hole 111, and the first sharp portion 122 is located at a side of the substrate 11 close to the central control board 20. It can be understood that, since the electrical conductor further includes the first clamping portion 123, when the first electrical conductor 12 is inserted into the first through hole 111, the first clamping portion 123 cannot pass through the first through hole 111 due to the gravity of the first electrical conductor 12, and is clamped to the side of the substrate 11 away from the central control board 20. In the first aspect, by providing the first clamping portion 123, the first electrical conductor 12 passes through the first through hole 111 during the process of placing the fixture device 10 on the central control board 20 or removing the fixture device from the central control board 20, so that the first electrical conductor 12 is damaged due to accidental dropping. In the second aspect, when the user connects the first electric conductor 12 using the probe to detect the differential signal, the differential signal can be detected only by connecting with the first clamping portion 123 on the side of the substrate 11 away from the center control board 20; since the projected area of the first clamping portion 123 on the substrate 11 is larger than the area of the cross section of the first through hole 111, the false touch rate of the user connecting the first conductor 12 by using the probe can be reduced.
In some embodiments, the hole wall of the first through hole 111 has an internal thread (denoted as a first internal thread), and the end of the first main body 121 remote from the first sharp portion 122 has an external thread (denoted as a first external thread), and the first internal thread and the first external thread cooperate to form a threaded connection, so that the first electrical conductor 12 is fixed on the substrate 11. It will be appreciated that the first electrical conductor 12 is secured to the base plate 11 by the engagement of the first internal threads and the first external threads, thereby avoiding the first electrical conductor 12 from passing through the first through hole 111 during the placement of the fixture apparatus 10 on the central control board 20 or the removal of the fixture apparatus from the central control board 20, resulting in the first electrical conductor 12 being damaged by an accidental drop.
In some embodiments, referring to fig. 7, fig. 7 is a schematic diagram of a first structure of a second conductive body according to an embodiment of the present application. The second conductor 13 includes a second main body 131 and a second sharp portion 132, wherein one end of the second main body 131 is connected to the second sharp portion 132, and the other end is disposed through the second through hole 112. Wherein the second sharp 132 is capable of electrically connecting with the second test capacitor 22. It can be appreciated that, when the second sharp portion 132 is electrically connected to the second test capacitor 22, the contact area between the second sharp portion 132 and the second test capacitor 22 is small, so that the second test capacitor 22 is more accurately contacted, and other electronic components are not easily touched by mistake. The second electrical conductor 13 may be a hollow structure, so as to save materials.
In some embodiments, referring to fig. 8, fig. 8 is a schematic diagram of a second structure of a second electrical conductor according to an embodiment of the application. The second electrical conductor 13 further includes a clamping portion (denoted as a second clamping portion 133), the second clamping portion 133 is connected to an end of the second main body portion 131 away from the second sharp portion 132, and a minimum width of the second clamping portion 133 perpendicular to the length direction of the second main body portion 131 is greater than a diameter of the second through hole 112. When the second electrical conductor 13 is inserted into the second through hole 112, the second clamping portion 133 is located at a side of the substrate 11 away from the central control board 20, the second main portion 131 is inserted into the second through hole 112, and the second sharp portion 132 is located at a side of the substrate 11 close to the central control board 20. It can be understood that, since the electrical conductor further includes the second clamping portion 133, when the second electrical conductor 13 is inserted into the second through hole 112, the second clamping portion 133 cannot pass through the second through hole 112 due to the gravity of the second electrical conductor 13, and is clamped to the side of the substrate 11 away from the central control board 20. In the second aspect, by providing the second clamping portion 133, the second electrical conductor 13 is prevented from passing through the second through hole 112 during the process of placing the fixture device 10 on the central control board 20 or removing the fixture device from the central control board 20, so that the second electrical conductor 13 is damaged due to accidental dropping. In the second aspect, when the user connects the second electric conductor 13 using the probe to detect the differential signal, the differential signal can be detected only by connecting with the second clamping portion 133 on the side of the substrate 11 away from the center control board 20; since the projected area of the second clamping portion 133 on the substrate 11 is larger than the area of the cross section of the second through hole 112, the false touch rate of the user connecting the second conductive body 13 with the probe can be reduced.
In some embodiments, the hole wall of the second through hole 112 has an internal thread (denoted as a second internal thread), and an end of the second main body 131 remote from the second sharp portion 132 has an external thread (denoted as a second external thread), and the second internal thread and the second external thread cooperate to form a threaded connection, so that the second electrical conductor 13 is fixed on the substrate 11. It will be appreciated that the second electrical conductor 13 is secured to the base plate 11 by the engagement of the second internal threads and the second external threads, thereby avoiding the second electrical conductor 13 from passing through the second through hole 112 during the placement of the fixture device 10 on the central control board 20 or removal from the central control board 20, resulting in damage to the second electrical conductor 13 due to accidental dropping.
In some embodiments, referring to fig. 9, fig. 9 is a schematic diagram of a fifth structure of a clamp device according to an embodiment of the application. The fixture apparatus 10 further includes a support member 14, the support member 14 being connected to the substrate 11, the support member 14 being located between the central control board 20 and the substrate 11, the support member 14 being capable of supporting the substrate 11 on the central control board 20 such that the substrate 11 is disposed opposite the central control board 20. The number of the supporting pieces 14 may be plural, and the plural supporting pieces may be disposed at corners of the substrate 11 so that the substrate 11 can be stably placed on the center control board 20. Meanwhile, since the first test capacitor 21 or the second test capacitor 22 located on the central control board 20 is smaller, it is difficult to accurately align the first through hole 111 or the second through hole 112 with the first test capacitor 21 or the second test capacitor 22, and since the supporting member 14 is connected with the substrate 11, the first through hole 111 or the second through hole 112 can be accurately aligned with the first test capacitor 21 or the second test capacitor 22 by determining the relative position of the supporting member 14 and the central control board 20.
In some embodiments, the fixture apparatus 10 further includes a fastener coupled to the base plate 11, the fastener being capable of coupling to the base plate 11 to fix the relative position of the base plate 11 and the central control plate 20. The relative positions of the substrate 11 and the central control board 20 are fixed, so that the relative dislocation phenomenon of the substrate 11 and the central control board 20 in the subsequent differential signal detection process can be avoided, and testing errors and faults are avoided. Wherein the fastener may be a buckle or a screw. For example, the center control plate 20 is provided with a first screw hole 23, and the base plate 11 is provided with a second screw hole 15 at a position corresponding to the first screw hole 23. When the center control board 20 is operating normally, the center control board 20 is fixed to the main board by the first screw. When the differential signal needs to be detected, the first screw can be removed, the substrate 11 and the central control board 20 are arranged opposite to each other, the second screw is used to pass through the first screw hole 23 and the second screw hole 15 so as to fix the central control board 20 and the substrate 11 on the main board, the first conductor 12 is abutted against the first test capacitor 21, the second conductor 13 is abutted against the second test capacitor 22, and finally the probe is connected with the first conductor 12 and the second conductor 13 so as to detect the differential signal.
Referring to fig. 10, fig. 10 is a schematic diagram of a first structure of a signal eye diagram measurement device according to an embodiment of the application. The embodiment of the application also provides a signal eye diagram measuring device 100, the signal eye diagram measuring device 100 comprises a test device and a fixture device 10, the test device comprises an oscilloscope and a probe connected with the oscilloscope, and when detecting differential signals, the probe can be electrically connected with the first conductor 12 and the second conductor 13, so that the signal eye diagram is displayed on the oscilloscope.
In some embodiments, referring to fig. 11, fig. 11 is a schematic diagram illustrating a second structure of a signal eye diagram measurement device according to an embodiment of the application. The signal eye diagram measuring device 100 further comprises a servo driver 50 and a servo motor 70 electrically connected with the servo driver 50, wherein the servo motor 70 is connected with the probe, and the servo driver 50 can drive the servo motor 70 to drive the probe to move. It will be appreciated that the servo driver 50 can drive the servo motor 70 by simply inputting a command to the servo driver 50, and the servo motor 70 moves the probe. If the central control board 20 transmits a plurality of differential signals, one first conductor 12 and one second conductor 13 are corresponding to each differential signal. If the first conductor 12 and the second conductor 13 corresponding to each differential signal are denoted as a set of the first conductor 12 and the second conductor 13, the servo motor 70 can be controlled to drive the probe to test each set of the first conductor 12 and the second conductor 13 sequentially or in a self-defined manner, so as to improve the testing efficiency. Optionally, the signal eye diagram measuring device 100 further includes a code controller, one end of which is connected to the servo driver 50, and the other end of which is connected to the servo motor 70. The positions of the first through hole 111 and the second through hole 112 on the substrate 11 are input into the servo driver 50, and then encoded by the encoding controller, the servo electrode 70 is controlled to drive the probe to test each group of the first conductor 12 and the second conductor 13 sequentially or in a self-defined manner, so as to improve the testing efficiency.
In some embodiments, referring to fig. 12, fig. 12 is a schematic diagram illustrating a third structure of a signal eye diagram measurement apparatus according to an embodiment of the application. The signal eye diagram measuring apparatus 100 further comprises a controller 90, wherein the controller 90 is electrically connected with the servo driver 50. It will be appreciated that by depressing the controller 90, instructions can be input to the servo driver 50, and the servo driver 50 can drive the servo motor 70, and the servo motor 70 moves the probe. Thus, when the first set of first conductors 12 and the second conductors 13 are tested, the hand-held controller 90 is pressed down, and the servo motor 70 controls the probe to automatically continue testing the next set of first conductors 12 and the second conductors 13 until the test is completed.
The fixture device 10 provided by the embodiment of the application is applied to the central control board 20, the central control board 20 is provided with the first test capacitor 21 and the second test capacitor 22, and the signal transmission quality can be detected by testing the signal eye diagrams of the first test capacitor 21 and the second test capacitor 22. The fixture device 10 includes a substrate 11, a first conductor 12 and a second conductor 13, the substrate 11 is disposed opposite to the central control board 20, a first through hole 111 and a second through hole 112 are disposed on the substrate 11, and since the first through hole 111 corresponds to the first test capacitor 21 and the second through hole 112 corresponds to the second test capacitor 22, the first conductor 12 can be electrically connected to the first test capacitor 21 only by penetrating through the first through hole 111, and similarly, the second conductor 13 can be electrically connected to the second test capacitor 22 only by penetrating through the second through hole 112. When the central control board 20 is tested, only the end, far away from the first test capacitor 21, of the first conductor 12 and the end, far away from the second test capacitor 22, of the second conductor 13 are electrically connected by the probe to perform signal eye diagram test, so that manual debugging is not required continuously, the contact accuracy of the test probe and the test capacitor can be improved, and the operation process of measuring an eye diagram can be simplified.
In the foregoing embodiments, the descriptions of the embodiments are emphasized, and for parts of one embodiment that are not described in detail, reference may be made to related descriptions of other embodiments.
In the description of the present application, the terms "first," "second," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more features.
The fixture device and the signal eye diagram measuring device provided by the embodiment of the application are described in detail. Specific examples are set forth herein to illustrate the principles and embodiments of the present application and are provided to aid in the understanding of the present application. Meanwhile, as those skilled in the art will have variations in the specific embodiments and application scope in light of the ideas of the present application, the present description should not be construed as limiting the present application.
Claims (10)
1. The utility model provides a fixture device, its characterized in that is applied to central control panel, be provided with first test capacitor and second test capacitor on the central control panel, first test capacitor with the second test capacitor can carry out signal coupling processing to differential signal, fixture device includes:
the substrate is arranged opposite to the central control board, a first through hole and a second through hole are formed in the substrate, the first through hole can correspond to the first test capacitor, and the second through hole can correspond to the second test capacitor;
the first conductor is arranged in the first through hole in a penetrating mode and can be electrically connected with the first test capacitor;
the second conductor is arranged in the second through hole in a penetrating mode, and the second conductor can be electrically connected with the second test capacitor.
2. The fixture apparatus of claim 1, wherein the first electrical conductor comprises a first body portion and a first sharp portion, one end of the first body portion is connected to the first sharp portion, the other end is disposed through the first through hole, and the first sharp portion is electrically connectable to the first test capacitor.
3. The jig device of claim 2, wherein the first conductor further comprises a clamping portion connected to an end of the first body portion remote from the first sharp portion, a minimum width of the clamping portion perpendicular to a length direction of the first body portion being larger than a diameter of the first through hole; when the first conductor penetrates through the first through hole, the clamping part is located at one side of the substrate away from the central control board, the first main body part penetrates through the through hole, and the first sharp part is located at one side of the substrate close to the central control board.
4. The fixture apparatus of claim 2, wherein the wall of the first through hole has an internal thread, and the end of the first body portion remote from the first sharp portion has an external thread, the internal thread mating with the external thread to secure the first electrical conductor to the substrate.
5. The fixture apparatus of claim 1, wherein the second electrical conductor comprises a second main body portion and a second sharp portion, one end of the second main body portion being connected to the second sharp portion, the other end being disposed through the second through hole.
6. The fixture apparatus of any one of claims 1 to 5, further comprising a support member coupled to the substrate, the support member capable of supporting the substrate on the central control board.
7. The fixture apparatus of claim 6, further comprising a fastener coupled to the base plate, the fastener being further capable of being coupled to the central control plate to relatively secure the base plate to the central control plate.
8. A signal eye diagram measuring device, comprising:
the test equipment comprises an oscilloscope and a probe connected with the oscilloscope;
the clamp device of any one of claims 1 to 7, the probe being electrically connectable to the first electrical conductor and the second electrical conductor.
9. The signal eye diagram measurement apparatus of claim 8, further comprising a servo driver and a servo motor electrically connected to the servo driver, wherein the servo motor is connected to the probe, and the servo driver is capable of driving the servo motor to drive the probe to move.
10. The signal eye measurement device of claim 9, further comprising a controller electrically connected to the servo driver.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210929165.1A CN117147916A (en) | 2022-08-03 | 2022-08-03 | Clamp device and signal eye diagram measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210929165.1A CN117147916A (en) | 2022-08-03 | 2022-08-03 | Clamp device and signal eye diagram measuring device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN117147916A true CN117147916A (en) | 2023-12-01 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210929165.1A Pending CN117147916A (en) | 2022-08-03 | 2022-08-03 | Clamp device and signal eye diagram measuring device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN117147916A (en) |
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2022
- 2022-08-03 CN CN202210929165.1A patent/CN117147916A/en active Pending
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