CN117038384A - Vacuum interrupter - Google Patents
Vacuum interrupter Download PDFInfo
- Publication number
- CN117038384A CN117038384A CN202310503500.6A CN202310503500A CN117038384A CN 117038384 A CN117038384 A CN 117038384A CN 202310503500 A CN202310503500 A CN 202310503500A CN 117038384 A CN117038384 A CN 117038384A
- Authority
- CN
- China
- Prior art keywords
- contact
- carrier
- contact portion
- cucr
- wcag
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000463 material Substances 0.000 claims abstract description 177
- 229910052799 carbon Inorganic materials 0.000 claims description 117
- 229910052802 copper Inorganic materials 0.000 claims description 77
- 229910015269 MoCu Inorganic materials 0.000 claims description 45
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical group [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 33
- 229910052709 silver Inorganic materials 0.000 claims description 23
- 229910052718 tin Inorganic materials 0.000 claims description 12
- 230000001419 dependent effect Effects 0.000 claims description 5
- 239000010949 copper Substances 0.000 description 88
- 229910002804 graphite Inorganic materials 0.000 description 16
- 239000010439 graphite Substances 0.000 description 16
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 10
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 8
- 239000004332 silver Substances 0.000 description 8
- 238000003466 welding Methods 0.000 description 8
- XMWRBQBLMFGWIX-UHFFFAOYSA-N C60 fullerene Chemical compound C12=C3C(C4=C56)=C7C8=C5C5=C9C%10=C6C6=C4C1=C1C4=C6C6=C%10C%10=C9C9=C%11C5=C8C5=C8C7=C3C3=C7C2=C1C1=C2C4=C6C4=C%10C6=C9C9=C%11C5=C5C8=C3C3=C7C1=C1C2=C4C6=C2C9=C5C3=C12 XMWRBQBLMFGWIX-UHFFFAOYSA-N 0.000 description 5
- 229910003460 diamond Inorganic materials 0.000 description 5
- 239000010432 diamond Substances 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 229910003472 fullerene Inorganic materials 0.000 description 5
- 229910021389 graphene Inorganic materials 0.000 description 5
- 238000005219 brazing Methods 0.000 description 4
- 239000000919 ceramic Substances 0.000 description 3
- 238000011161 development Methods 0.000 description 3
- 230000018109 developmental process Effects 0.000 description 3
- 239000012212 insulator Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000005476 soldering Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 229910000599 Cr alloy Inorganic materials 0.000 description 2
- GXDVEXJTVGRLNW-UHFFFAOYSA-N [Cr].[Cu] Chemical compound [Cr].[Cu] GXDVEXJTVGRLNW-UHFFFAOYSA-N 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- 239000011651 chromium Substances 0.000 description 2
- 239000000788 chromium alloy Substances 0.000 description 2
- WUUZKBJEUBFVMV-UHFFFAOYSA-N copper molybdenum Chemical compound [Cu].[Mo] WUUZKBJEUBFVMV-UHFFFAOYSA-N 0.000 description 2
- SBYXRAKIOMOBFF-UHFFFAOYSA-N copper tungsten Chemical compound [Cu].[W] SBYXRAKIOMOBFF-UHFFFAOYSA-N 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000013011 mating Effects 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- UONOETXJSWQNOL-UHFFFAOYSA-N tungsten carbide Chemical compound [W+]#[C-] UONOETXJSWQNOL-UHFFFAOYSA-N 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- ITZSSQVGDYUHQM-UHFFFAOYSA-N [Ag].[W] Chemical compound [Ag].[W] ITZSSQVGDYUHQM-UHFFFAOYSA-N 0.000 description 1
- UIFRCFMIMRGTFB-UHFFFAOYSA-N [Cu].[W].[Cu] Chemical compound [Cu].[W].[Cu] UIFRCFMIMRGTFB-UHFFFAOYSA-N 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000001595 contractor effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000010891 electric arc Methods 0.000 description 1
- 238000001125 extrusion Methods 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 150000001247 metal acetylides Chemical class 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 238000013021 overheating Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H33/00—High-tension or heavy-current switches with arc-extinguishing or arc-preventing means
- H01H33/60—Switches wherein the means for extinguishing or preventing the arc do not include separate means for obtaining or increasing flow of arc-extinguishing fluid
- H01H33/66—Vacuum switches
- H01H33/664—Contacts; Arc-extinguishing means, e.g. arcing rings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H33/00—High-tension or heavy-current switches with arc-extinguishing or arc-preventing means
- H01H33/60—Switches wherein the means for extinguishing or preventing the arc do not include separate means for obtaining or increasing flow of arc-extinguishing fluid
- H01H33/66—Vacuum switches
- H01H33/664—Contacts; Arc-extinguishing means, e.g. arcing rings
- H01H33/6643—Contacts; Arc-extinguishing means, e.g. arcing rings having disc-shaped contacts subdivided in petal-like segments, e.g. by helical grooves
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/02—Contacts characterised by the material thereof
- H01H1/0203—Contacts characterised by the material thereof specially adapted for vacuum switches
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/02—Contacts characterised by the material thereof
- H01H1/0203—Contacts characterised by the material thereof specially adapted for vacuum switches
- H01H1/0206—Contacts characterised by the material thereof specially adapted for vacuum switches containing as major components Cu and Cr
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/02—Contacts characterised by the material thereof
- H01H1/021—Composite material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/02—Contacts characterised by the material thereof
- H01H1/021—Composite material
- H01H1/023—Composite material having a noble metal as the basic material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/02—Contacts characterised by the material thereof
- H01H1/021—Composite material
- H01H1/023—Composite material having a noble metal as the basic material
- H01H1/0233—Composite material having a noble metal as the basic material and containing carbides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/02—Contacts characterised by the material thereof
- H01H1/021—Composite material
- H01H1/025—Composite material having copper as the basic material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/02—Contacts characterised by the material thereof
- H01H1/021—Composite material
- H01H1/027—Composite material containing carbon particles or fibres
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/02—Contacts characterised by the material thereof
- H01H1/04—Co-operating contacts of different material
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Composite Materials (AREA)
- Materials Engineering (AREA)
- High-Tension Arc-Extinguishing Switches Without Spraying Means (AREA)
- Contacts (AREA)
Abstract
The present invention relates to a vacuum interrupter comprising: a first carrier; a second carrier; wherein the first carrier comprises a stem and a contact; wherein the second carrier comprises a stem and a contact; wherein the contact of the first carrier comprises a first contact portion and a second contact portion surrounding the first contact portion; wherein the contact of the second carrier comprises a first contact portion and a second contact portion surrounding the first contact portion; and wherein at least a portion of the first contact portion of the first carrier is of a different material than the second contact portion of the first carrier; and/or wherein at least a portion of the first contact portion of the second carrier is of a different material than the second contact portion of the second carrier.
Description
Technical Field
The invention relates to a vacuum interrupter and a contact for a vacuum interrupter.
Background
Vacuum interrupters need to have contacts that can operate with high short-circuit switching performance and resist welding together.
The material for the contacts of the Vacuum Interrupter (VI) must meet several requirements, such as low resistance in the closed position, the ability to interrupt a specific current, avoidance of welding and low chopping currents.
Current chopping may occur when a mechanical switch (e.g., a vacuum interrupter) breaks a circuit with current. At the instant of mechanical disconnection, an arc is formed between contacts and current continues to flow. Ideally, current will flow until its next current zero; the circuit is then opened.
However, it may happen that at a level of a few amperes, the current is slightly cut off or "chopped". In VI, some energy is required to keep the arc active; the energy comes from the current. In the case of low currents, an arc may thus occur, and the current is thus chopped.
The actual value of the chopping current may vary with each interruption; is a statistical distribution. Higher values occur with reduced probability.
If the cable and the motor are considered as loads to be cut off by the vacuum interrupter, the result of the chopping current is that the actual current in the motor is used as activation energy, and the oscillation starts between the inductance of the motor and the stray capacitance of the cable. Due to the so-called low stray capacitance, the generated overvoltage will be high and may damage the insulation of the motor windings.
In order to avoid such damage, surge arresters can be used to suppress overvoltages, which have the disadvantage of having separate components (space, costs).
The average level of the current chopping depends on the contact material of the VI, so the contact material can be properly selected. WCAg has a lower level of chopping current than CuCr.
CUCR is widely used for circuit breakers due to its low resistance, its Gao Duankai capability, and its moderate chopping current. However, the typical chopping current level of CuCr is still relatively high for some applications, such as small inductive loads, and additional methods of surge arresters as described above must be provided to eliminate the risk of damaging the load due to chopper current induced overvoltage. In addition, cuCr has a certain tendency to weld, but this can be managed by a suitable contact pressure and a strong drive.
WCAg is widely used in contactors due to its low resistance, its sufficient breaking capability, its low tendency to weld and especially its extremely low chopping current. The disadvantage is that this material is not well suited for the expansion of the short-circuit breaking capability required by the market and that Ag in contact is expensive.
Moreover, as the contactor moves further toward higher short circuit breaking capability, it may occur that the limiting factor is not the short circuit break itself but an increase in contact resistance. Under arc discharge, the WCAg contacts evaporated some of their silver content. The fact that silver is relatively easy to evaporate results in a target low chopping current. The corresponding loss of silver in the contact is not critical when switching the load current. However, when the short circuit current is switched, the loss of silver in the WCAg contacts can be significant and ultimately lead to a failed version of the test, since the increase in resistance of VI during the test is limited by related criteria (e.g., IEC62271-106,6.102.9).
There is a need to address these issues.
Disclosure of Invention
It would therefore be advantageous to have an improved vacuum interrupter technique.
The object of the invention is solved by the subject matter of the independent claims, with further embodiments being incorporated into the dependent claims.
In a first aspect, there is provided a vacuum interrupter comprising:
-a first carrier; and
-a second carrier.
The first carrier includes a stem and a contact. The second carrier includes a stem and a contact. The contact of the first carrier includes a first contact portion and a second contact portion surrounding the first contact portion. The contact of the second carrier includes a first contact portion and a second contact portion surrounding the first contact portion. At least a portion of the first contact portion of the first carrier is of a different material than the second contact portion of the first carrier and/or at least a portion of the first contact portion of the second carrier is of a different material than the second contact portion of the second carrier.
In an example, in a deactivated state, the vacuum interrupter is configured to keep the contact of the first carrier spaced apart from the contact of the second carrier, and in an activated state, the vacuum interrupter is configured to bring the contact of the first carrier and the contact of the second carrier into contact with each other.
In an example, in a deactivated state, the vacuum interrupter is configured to hold the contact of the first carrier in contact with the contact of the second carrier, and in an activated state, the vacuum interrupter is configured to separate the contact of the first carrier from the contact of the second carrier.
In an example, the first carrier is a fixed contact carrier, the second carrier is a movable contact carrier, and in the activated state the vacuum interrupter is configured to move the second carrier.
In an example, the first carrier is a movable contact carrier, the second carrier is a fixed contact carrier, and in the activated state, the vacuum interrupter is configured to move the first carrier.
In an example, the material of all first contact portions of the first carrier is different from the material of the second contact portions of the first carrier and/or the material of all first contact portions of the first carrier is different from the material of the second contact portions of the first carrier.
In an example, the junction between the first contact portion and the second contact portion of the contact of the first carrier defines a plane. The first contact portion includes a portion having a surface below the plane, and at least a portion of the first contact portion is a remaining portion of the first contact portion other than the portion having the surface below the plane.
In an example, the junction between the first contact portion and the second contact portion of the contact of the second carrier defines a plane. The first contact portion includes a portion having a surface below the plane, and at least a portion of the first contact portion is a remaining portion of the first contact portion other than the portion having the surface below the plane.
In an example, the junction between the first contact portion and the second contact portion of the contact of the first carrier defines a plane. At least a portion of the first contact portion includes a portion having a surface that is above the plane.
In an example, the junction between the first contact portion and the second contact portion of the contact of the second carrier defines a plane. At least a portion of the first contact portion includes a portion having a surface that is above the plane.
In an example, the material of the second contact portion of the first carrier is WCAg or WCAg/C or CuCr/C or WCu/C or Cu/C or MoCu/C or Cu or WCu or WCCu/C or MoCCu/C or Ag/C or Cu.
In an example, the material of the second contact portion of the second carrier is WCAg or WCAg/C or CuCr/C or WCu/C or Cu/C or MoCu/C or Cu or WCu or WCCu/C or MoCCu/C or Ag/C or Cu.
In an example, the material of at least a part of the first contact portion of the first carrier is Ag/C or Cu/C or CuCr/C or WCu/C or MoCu/C or Sn/C or C.
In an example, the material of at least a part of the first contact portion of the second carrier is Ag/C or Cu/C or CuCr/C or WCu/C or MoCu/C or Sn/C or C.
In an example, the junction between the first contact portion and the second contact portion of the contact of the first carrier defines a plane. At least a portion of the first contact portion is a tapered pin protruding outwardly from the plane.
In an example, the junction between the first contact portion and the second contact portion of the contact of the second carrier defines a plane. At least a portion of the first contact portion is a tapered pin protruding outwardly from the plane.
In an example, the material of at least a portion of the first contact portion of the first carrier is carbon.
In an example, the material of at least a portion of the first contact portion of the first carrier is carbon.
In an example, the second contact portion of the first carrier includes one or more slits.
In an example, the second contact portion of the second carrier includes one or more slits.
In an example, the first contact portion of the first carrier includes one or more slits.
In an example, the first contact portion of the second carrier includes one or more slits.
In an example, the one or more slits in the first contact portion of the first carrier are a continuation of the one or more slits in the second contact portion of the first carrier.
In an example, the one or more slits in the first contact portion of the second carrier are a continuation of the one or more slits in the second contact portion of the first carrier.
In an example, the material of at least a portion of the first contact portion of the first carrier is the same as the material of at least a portion of the first contact portion of the second carrier.
In an example, the material of the second contact portion of the first carrier is the same as the material of the second contact portion of the second carrier.
In an example, the shape of at least a portion of the first contact portion of the first carrier is the same as the shape of at least a portion of the first contact portion of the second carrier.
In an example, the shape of the second contact portion of the first carrier is the same as the shape of the second contact portion of the second carrier.
In a second aspect, there is provided a vacuum interrupter comprising:
-a first carrier; and
-a second carrier.
The first carrier includes a stem and a contact. The second carrier includes a stem and a contact. The contact of the first carrier is made of a first material. The contacts of the second carrier are made of a second material. The following applies:
The first material is Ag/C and the second material is WCAg or WCAg/C; or (b)
The first material is WCAg/C and the second material is WCAg or WCAg/C; or (b)
The first material is Cu/C and the second material is CuCr or CuCr/C or WCu/C or Cu; or (b)
The first material is WCu/C, and the second material is CuCr or Cu; or (b)
The first material is WCCu/C and the second material is CuCr or CuCr/C or WCu/C or WCCu/C or Cu; or (b)
The first material is MoCu/C and the second material is WCMo/C or CuCr/C or WCu/C or Cu; or (b)
The first material is MoCCu/C and the second material is CuCr/C or Cu.
In a third aspect, a contact for a vacuum interrupter is provided. The contact member includes:
-a first contact portion; and
-a second contact portion.
The second contact portion surrounds the first contact portion. At least a portion of the first contact portion is of a different material than the second contact portion.
In a fourth aspect, a contact for a vacuum interrupter is provided. The material of the contact piece is Ag/C or WCAg/C or Cu/C or CuCr/C or WCu/C or Cu or WCCu/C or CuCr/C or WCu/C or WCCu/C or MoCu/C or WCMo/C or MoCCu/C.
The above aspects and examples will become apparent from and elucidated with reference to the embodiments described hereinafter.
Drawings
Exemplary embodiments will be described hereinafter with reference to the following drawings:
fig. 1 shows an example of a contact and its stem, also called carrier;
FIG. 2 shows an example of a vacuum interrupter in an open position;
FIG. 3 shows an example of a contact and a lever;
FIG. 4 shows an example of a contact and a lever;
FIG. 5 shows an example of a contact and a lever;
FIG. 6 shows an example of a vacuum interrupter in an open position; and
fig. 7 shows an example of a contact and a lever.
Detailed Description
Fig. 1 to 7 relate to a vacuum interrupter and a contact.
In an example, the vacuum interrupter includes a first carrier 101 and a second carrier 102. The first carrier comprises a stem 10 and a contact (1). The second carrier comprises a rod 10 and a contact 1. The carrier may be referred to as a contact with its stem. The contact of the first carrier comprises a first contact portion 30 and a second contact portion 20 surrounding the first contact portion. The contact of the second carrier comprises a first contact portion 30 and a second contact portion 20 surrounding the first contact portion. The contact with the portion 30 surrounded by the portion 20 is clearly shown in fig. 1 to 7. It can be seen here that the parts of the contacts facing each other have a central portion 30 and a portion 20 outside the central portion and surrounding it. The portion 20 may be below the portion 30 or just around the outside, with the central portion 30 passing all the way through the contact to the rod 10. This is the meaning of "surrounding". At least a portion of the first contact portion of the first carrier is of a different material than the second contact portion of the first carrier. Additionally or alternatively, the material of at least a portion of the first contact portion of the second carrier is different from the material of the second contact portion of the second carrier.
In an example, the material of the first contact portion 30 of the second carrier is the same as the material of the second contact portion 20 of the second carrier.
In an example, the material of the first contact portion 30 of the second carrier is WCAg and the material of the second contact portion 20 of the second carrier is WCAg.
In an example, the material of the first contact portion 30 of the second carrier is WCAg/C and the material of the second contact portion 20 of the second carrier is WCAg/C.
In an example, the material of the first contact portion 30 of the second carrier is Cu/C and the material of the second contact portion 20 of the second carrier is Cu/C.
In an example, the material of the first contact portion 30 of the second carrier is CuCr/C and the material of the second contact portion 20 of the second carrier is CuCr/C.
In an example, the material of the first contact portion 30 of the second carrier is WCu/C and the material of the second contact portion 20 of the second carrier is WCu/C.
According to an example, in a deactivated state, the vacuum interrupter is configured to keep the contact of the first carrier spaced apart from the contact of the second carrier, and in an activated state, the vacuum interrupter is configured to bring the contact of the first carrier and the contact of the second carrier into contact with each other.
According to an example, in a deactivated state, the vacuum interrupter is configured to hold the contact of the first carrier in contact with the contact of the second carrier, and in an activated state, the vacuum interrupter is configured to separate the contact of the first carrier from the contact of the second carrier.
According to an example, the first carrier is a fixed contact carrier, the second carrier is a movable contact carrier, and in the activated state the vacuum interrupter is configured to move the second carrier.
According to an example, the first carrier is a movable contact carrier, the second carrier is a fixed contact carrier, and in the activated state the vacuum interrupter is configured to move the first carrier.
According to an example, the material of all first contact portions of the first carrier is different from the material of the second contact portions of the first carrier, additionally or alternatively the material of all first contact portions of the first carrier is different from the material of the second contact portions of the first carrier.
According to an example, the junction between the first contact portion 30 and the second contact portion 20 of the contact of the first carrier defines a plane. This can be seen in fig. 1 to 7. For example, referring to fig. 1, the first portion 30 is an insert into the second portion 20. The upper edge of the hole in the portion 20 is rounded, which forms a junction with the portion 30 (the upper edge of the portion 20 does not need to contact the portion 30, and it is the upper edge of the portion 20 that forms a hole or recess in which the portion 30 is located, which forms a plane). Thus, this junction in the circle (upper edge of the portion 20) forms a plane. In the example of fig. 1, the upper edge of the hole/recess of the portion 20 is also rounded and forms a plane, and the upper surface of the portion 30 is flat and in this plane, whereas for example in fig. 3 the upper edge of the hole/recess of the portion 20 is also rounded and forms a plane, but now the upper surface of the portion 30 is below this plane, whereas in fig. 4 the upper part of the portion 30 is above this plane. Continuing with the example described herein, the first contact portion includes portions 35, 50 having surfaces below the plane, and at least a portion of the first contact portion is the remainder of the first contact portion except for the portion having the surfaces below the plane. Additionally or alternatively, the junction between the first and second contact portions of the contacts of the second carrier defines a plane, and the first contact portion includes a portion 35 having a surface below the plane, and at least a portion of the first contact portion is a remainder of the first contact portion other than the portion having the surface below the plane. Additionally or alternatively, the junction between the first and second contact portions of the contacts of the first carrier defines a plane, and at least a portion of the first contact portion includes a portion 36 having a surface located above the plane. Additionally or alternatively, the junction between the first and second contact portions of the contacts of the second carrier defines a plane, and at least a portion of the first contact portion includes a portion 36 having a surface located above the plane.
According to an example, the material of the second contact portion of the first carrier is WCAg or WCAg/C or CuCr/C or WCu/C or Cu/C or MoCu/C or Cu or WCu or WCCu/C or MoCCu/C or Ag/C or Cu. Additionally or alternatively, the material of the second contact portion of the second carrier is WCAg or WCAg/C or CuCr/C or WCu/C or Cu/C or MoCu/C or Cu or WCu or WCCu/C or MoCCu/C or Ag/C or Cu.
According to an example, the material of at least a part of the first contact portion of the first carrier is Ag/C or Cu/C or CuCr/C or WCu/C or MoCu/C or Sn/C or C. Additionally or alternatively, the material of at least a part of the first contact portion of the second carrier is Ag/C or Cu/C or CuCr/C or WCu/C or MoCu/C or Sn/C or C.
According to an example, the junction between the first contact portion and the second contact portion of the contact of the first carrier defines a plane, and at least a portion of the first contact portion is a tapered pin 31 protruding outwardly from the plane. Additionally or alternatively, the junction between the first and second contact portions of the contacts of the second carrier defines a plane, and at least a portion of the first contact portion is a tapered pin 31 protruding outwardly from the plane.
According to an example, the material of at least a portion of the first contact portion of the first carrier is carbon. Additionally or alternatively, the material of at least a portion of the first contact portion of the first carrier is carbon.
According to an example, the second contact portion of the first carrier comprises one or more slits 40. Additionally or alternatively, the second contact portion of the second carrier comprises one or more slits 40.
According to an example, the first contact portion of the first carrier comprises one or more slits. Additionally or alternatively, the first contact portion of the second carrier comprises one or more slits.
According to an example, the one or more slits in the first contact portion of the first carrier are a continuation of the one or more slits in the second contact portion of the first carrier. Additionally or alternatively, the one or more slits in the first contact portion of the second carrier are a continuation of the one or more slits in the second contact portion of the first carrier.
According to an example, the material of at least a portion of the first contact portion of the first carrier is the same as the material of at least a portion of the first contact portion of the second carrier. Additionally or alternatively, the material of the second contact portion of the first carrier is the same as the material of the second contact portion of the second carrier.
According to an example, the shape of at least a portion of the first contact portion of the first carrier is the same as the shape of at least a portion of the first contact portion of the second carrier. Additionally or alternatively, the shape of the second contact portion of the first carrier is the same as the shape of the second contact portion of the second carrier.
In an example, the vacuum interrupter includes a first carrier 101 and a second carrier 102. The first carrier comprises a stem 10 and a contact 1. The second carrier comprises a rod 10 and a contact 1. The contact of the first carrier is made of a first material. The contacts of the second carrier are made of a second material. The following applies:
the first material is Ag/C and the second material is WCAg or WCAg/C; or alternatively
The first material is WCAg/C and the second material is WCAg or WCAg/C; or alternatively
The first material is Cu/C and the second material is CuCr or CuCr/C or WCu/C or Cu; or alternatively
The first material is WCu/C, and the second material is CuCr or Cu; or alternatively
The first material is WCCu/C and the second material is CuCr or CuCr/C or WCu/C or WCCu/C or Cu; or alternatively
The first material is MoCu/C and the second material is WCMo/C or CuCr/C or WCu/C or Cu; or alternatively
The first material is MoCCu/C and the second material is CuCr/C or Cu.
As is apparent from the above, the exemplary new contact for a vacuum interrupter includes a first contact portion 30 and a second contact portion 20. The second contact portion surrounds the first contact portion. At least a portion of the first contact portion is of a different material than the second contact portion.
In an example, the material of all the first contact portions is different from the material of the second contact portions.
In an example, the junction between the first contact portion and the second contact portion defines a plane. The first contact portion comprises portions 35, 50 of the surface below the plane. At least a part of the first contact portion is a remaining portion of the first contact portion except for a portion of the surface below the plane.
In an example, the junction between the first contact portion and the second contact portion defines a plane. At least a portion of the first contact portion includes a portion 36 having an above-plane surface.
In an example, the material of the second contact portion is WCAg or WCAg/C or CuCr/C or WCu/C or Cu/C or MoCu/C or Cu or WCu or WCCu/C or MoCCu/C or Ag/C or Cu.
In an example, the material of at least a part of the first contact portion of the first carrier is Ag/C or Cu/C or CuCr/C or WCu/C or MoCu/C or Sn/C or C.
In an example, the junction between the first contact portion and the second contact portion defines a plane. At least a part of the first contact portion is a tapered pin 31 protruding outwardly from the plane.
In an example, the material of at least a portion of the first contact portion of the first carrier is carbon.
In an example, the second contact portion includes one or more slits 40.
In an example, the first contact portion includes one or more slits.
In an example, the one or more slits in the first contact portion are a continuation of the one or more slits in the second contact portion.
As is clear from the above, an exemplary new contact for a vacuum interrupter is defined as follows: the material of the contact piece is Ag/C or WCAg/C or Cu/C or CuCr/C or WCu/C or Cu or WCCu/C or CuCr/C or WCu/C or WCCu/C or MoCu/C or WCMo/C or MoCCu/C.
The vacuum interrupter with the new contact and the contact itself will now be described in further detail with reference to specific embodiments, wherein reference is again made to fig. 1-7.
The new development described herein relates to a center insert that enters a Vacuum Interrupter (VI) contact. The insert is composed of a second contact material. Different contact materials may then be used 1) to carry current in the closed position of the contactor and 2) to open current in the open position of the contactor.
The new development also relates to the use of carbides or graphites (graphene/fullerene or diamond) as contact materials for Medium Voltage (MV) vacuum interrupters due to their low chopping current behaviour. The design shown overcomes the known limitations of normal contact materials for the general requirements of MV VI contacts.
Fig. 1 shows a contact 1 on its stem, which may also be referred to as a carrier 101, 102. The rod 10 is a prior art rod, typically made of copper. The main part 20 of the contact is made of WCAg, for example, which is the prior art of contacts. The insert 30 in the contact is made of a different material than the main part 20, such as CuCr or WCCu. The insert 30 of the contact 1 is also referred to as the first contact portion 30. The main portion 20 of the contact 1 is also referred to as the second contact portion 20.
Fig. 2 shows VI100 in an open position with fixed and movable bars with contacts 101, 102, the contacts 101, 102 with inserts. In addition, the main components of VI according to the prior art are shown: upper and lower caps 110, 130, a ceramic insulator 120, and a bellows 140.
When VI is closed, the contact will primarily contact its insert 30. When VI is open and current is flowing, an arc 201 will form between the inserts 30.
The materials of 20 and 30 are selected in this way: the arc voltage of the material of the insert 30 is typically higher than the arc voltage of the material of the main portion 20. The result will be that the arc 201 will commutate to the area between the main parts 20 of the contacts, similar to the arc 202, as shown in the right hand side view of fig. 2. The arc will damage the main portion 20 so that its resistance increases. In the case of WCAg, ag will locally evaporate at the base point of the arc so that the component with low resistance will be depleted in the contact; WC will continue to act as a support structure. In the case of prior art contacts made entirely of WCAg, this increase in resistance may be why it is not possible to pass the test according to the standard. With the insert 30 being shielded from the arc due to the higher arc voltage, and in the area where the contacts are in contact, this effect of increased resistance can be avoided.
For contactor applications, low chopping currents are important. The chopping current is determined by the material in contact with the arc. Thus, in case WCAg is the material of the main part 20, a low chopping current can be maintained. In addition, it is important that the material of insert 30 meet other requirements of the contact material for applications according to VI. The CUCR generally has a higher arc voltage than WCAg, but for contactor applications, the trend of moderate welding may be too strong for relatively weak actuation of the contactor. Suitable materials for the insert 30 have been found to be WCCu or WCCuAg, as these materials have a higher arc voltage than WCAg, but they do not have the same welding propensity as CuCr.
Fig. 3 shows two features of the contact 1. To introduce a transverse magnetic field, a slit 40 is introduced into the contact with the insert to move the arc around the radial end of the contact so that localized overheating of the surface of the contact is limited. The slit may also be in the region of the insert 30, as shown in fig. 3, or the slit may be in the main portion 20 only (not shown). Another feature shown in fig. 3 is a hole or recess 50 in the center of the contact, i.e., the first contact portion, to support the commutation of the arc from the center of the contact toward the main portion 20.
Fig. 4 shows the elevation 31 of the insert 30 compared to the main portion 20 to ensure that contact is always with the insert 30 rather than with the main portion 20. Since the commutation of the arc is mainly dependent on the material and not strongly dependent on the length of the arc, the commutation of the arc 201 to the arc 202 will not be affected by the elevation 31.
Fig. 5 shows the contacts on their stem. The rod 10 is a prior art rod, typically made of copper. Several advantageous materials for the main portion 20 (also referred to as the second contact portion 20) and the portion 30 (also referred to as the insert or the first contact portion 30) of the contact are discussed below.
The new developments discussed herein achieve low chopping currents due to the use of carbon in some way. Carbon may be present in the main portion 20 and/or the insert 30 as carbide or graphite (graphene, fullerene or diamond).
The lowering 35 of the insert is the choice to ensure that normal load current is conducted by the material of the main portion 20 of the outer zone. Thus, in these cases, the choice of material for the insert or pin 30 is not limited by its ohmic resistance.
Alternatively, as shown in fig. 7, the pin or insert 30 may have an extension 36 above the surface of 20. In these cases, the material of the pin or insert 30 must meet the low resistance and low tendency of micro-welding in the closed state.
As shown in the right-most diagram of fig. 5, slits 40 may be added to all contacts to increase the ability to handle high current arcs.
Fig. 6 shows VI100 in an open position with fixed and movable bars with contacts 101, 102, the contacts 101, 102 with inserts. In addition, the main components of VI according to the prior art are shown: upper and lower caps 110, 130, a ceramic insulator 120, and a bellows 140.
When VI is closed, the contact will only contact its main portion 20. When VI is open and current is flowing, an arc 201 will form between the main sections 20. The behavior of the arc now varies according to the magnitude of the current:
For low currents, the arc 201 will travel toward the center of the contact as shown by arc 202 in fig. 6, since the arc voltage of the material of the pin or insert 30 of the inner region is lower than the arc voltage of the material of the main portion 20 of the outer region. Thus, as the current approaches zero crossing, a low chopping current of the material of the pin or insert 30 will be applied.
For high currents, such as short-circuit currents, the arc will be driven away from the center by the lorentz force of its current and supported by the pinch effect. Thus, a high short circuit interrupting capability of the material of the main portion 20 will be applied.
Fig. 7 shows several geometrical arrangements of the main portion 20 (also called second contact portion) and the insert 30 (also called pin or first contact portion):
310: two contact arrangements with protruding pins. The two contacts may be made of the same combination of materials or different combinations of materials.
320: an arrangement of one contact with protruding pins and one contact without pins.
330: arrangement of two contacts without pins. The two contacts may be made of the same material or different materials.
340: two contact arrangements with tapered pins that do not drop and protrude. The two contacts may be made of the same combination of materials or different combinations of materials. In the example shown, the diameter of the pin 30 is relatively small compared to the total mating surface of the contact. Alternatively, a larger pin 30 may be used that covers a substantial portion of the mating face of the contact to mitigate the transition of the low current arc from the main portion 20 of the contact to the pin 30. The same applies to the arrangement 350.
350: an arrangement of contacts with tapered pins and contacts without pins.
A number of exemplary applications and embodiments are described below:
vacuum interrupter for contactor applications:
the main part 20 of the contact is made of WCAg, for example, which is the prior art of contacts. The pin 30 is made of a different material than the main portion 20. The material of the pin 30 may be selected primarily for its low chopping current. Suitable materials for the pin 30 are carbide or graphite (graphene/fullerene or diamond).
Vacuum interrupter for circuit breaker applications:
the main part 20 of the contact is made of CuCr, for example, which is the prior art of circuit breakers. The pin 30 is made of a different material than the main portion 20. The material of the pin 30 may be selected primarily for its low chopping current. The use of carbon in some way allows a significant reduction in the chopping current. Suitable materials for the pin 30 are carbide or graphite (graphene, fullerene or diamond).
The following relates to a specific embodiment of the arrangement shown in fig. 7.
Arranging 310-two contacts with protruding pins; the two contacts may be identical or different:
a first contact: the pin 30 is made of Ag/C and the main part 20 is made of WCAg or WCAg/C or CuCr/C or WCu/C or Cu/C or MoCu/C or Cu.
And a second contact: the pin 30 is made of Ag/C and the main part 20 is made of WCAg or WCAg/C or CuCr/C or WCu/C or Cu/C or MoCu/C or Cu.
A first contact: the pin 30 is made of Cu/C and the main part 20 is made of WCAg or WCAg/C or CuCr/C or WCu/C or MoCu/Cu.
And a second contact: the pin 30 is made of Cu/C and the main part 20 is made of WCAg or WCAg/C or CuCr/C or WCu/C or MoCu/C or Cu.
A first contact: the pin 30 is made of MoCu/C and the main part 20 is made of WCAg or WCAg/C or CuCr/C or WCu/C or MoCu/C or Cu.
And a second contact: the pin 30 is made of MoCu/C and the main part 20 is made of WCAg or WCAg/C or CuCr/C or WCu/C or MoCu/C or Cu.
In the following combinations, the materials of the pin 30 and the main portion 20 are the same in the second contact, so in these cases there will be no combination of the portion 20 and the portion 30, but only a common portion main portion 20 and pin 30 having a combined shape:
a first contact: the pin 30 is made of Ag/C and the main portion 20 is made of WCAg or WCAg/C.
And a second contact: both the pin 30 and the main portion 20 are made of WCAg or WCAg/C.
A first contact: the pin 30 is made of Cu/C or CuCr/C or WCu/C, and the main portion 20 is made of WCAg or WCAg/C or CuCr/C or WCu/C or MoCu/C or Cu.
And a second contact: both the pin 30 and the main portion 20 are made of Cu/C.
A first contact with protruding pins and a flat second contact without pins are arranged 320.
The combination of Ag in one contact and Cu in the second contact in contact with each other in the closed position is not described here, as the combined Ag and Cu have a strong tendency to weld.
A first contact: the pin 30 is made of Ag/C and the main portion 20 is made of WCAg or WCAg/C.
The second contact is made of WCAg or WCAg/C
A first contact: the pin 30 is made of Ag/C and the main portion 20 is made of CuCr/C or WCu/C
The second contact is made of WCAg or WCAg/C.
A first contact: the pin 30 is made of Cu/C and the main portion 20 is made of WCAg or WCAg/C.
The second contact is made of CuCr/C or WCu/C.
A first contact: the pin 30 is made of Cu/C and the main portion 20 is made of CuCr/C or WCu/C.
The second contact is made of CuCr/C or WCu/C.
In the case of Sn/C, it must be considered that Sn/C will become liquid during brazing of VI, and therefore the combination with pins made of Sn/C is limited to the following arrangement: the pin is in lower contact (during brazing) and the pin does not show a bulge 36, i.e. the pin must show a lowering 35, or it may be flat in the main part 20:
A first contact: the pin 30 is made of Sn/C and the main part 20 is made of WCAg or WCAg/C or CuCr/C or WCu/C.
The second contact is made of WCAg or WCAg/C or CuCr/C or WCu/C or Cu/C.
Arrangement 330-the two contacts are flat without pins and made of the same or different materials:
one contact is made of Ag/C.
The second contact is made of WCAg or WCAg/C.
One contact is made of WCAg/C.
The second contact is made of WCAg or WCAg/C.
One contact is made of Cu/C.
The second contact is made of CuCr or CuCr/C or WCu/C or Cu.
One contact is made of WCu/C.
The second contact is made of CuCr or Cu.
One contact is made of WCCu/C.
The second contact is made of CuCr or CuCr/C or WCu/C or WCCu/C or Cu.
One contact is made of MoCu/C.
The second contact is made of WCMo/C or CuCr/C or WCu/C or Cu.
A contact made of MoCCu/C.
The second contact is made of CuCr/C or Cu.
Arrangement 340-both contacts made of the same material with flat or lowered taper pins:
the pin 30 is made of C and the main portion 20 is made of Cu or WCu or WCCu/C or CuCr/C or MoCu/C or MoCCu/C.
The pin 30 is made of C and the main part 20 is made of Ag/C or WCAg/C.
Arrangement 340-two contacts made of different materials with flat or lowered taper pins:
first contact: the pin 30 is made of C and the main portion 20 is made of Cu.
Second contact: the pin 30 is made of C and the main portion 20 is made of WCu or WCCu/C or CuCr/C or MoCu/C or MoCCu/C.
First contact: the pin 30 is made of C and the main portion 20 is made of WCu.
Second contact: the pin 30 is made of C and the main portion 20 is made of WCCu or WCCu/C or CuCr/C or MoCu/C or MoCCu/C.
First contact: the pin 30 is made of C and the main portion 20 is made of WCCu.
Second contact: the pin 30 is made of C and the main portion 20 is made of WCCu/C or CuCr/C or MoCu/C or MoCCu/C.
First contact: the pin 30 is made of C and the main portion 20 is made of WCCu/C.
Second contact: the pin 30 is made of C and the main portion 20 is made of CuCr or CuCr/C or MoCu/C or MoCCu/C.
First contact: the pin 30 is made of C and the main portion 20 is made of CuCr.
Second contact: the pin 30 is made of C and the main portion 20 is made of CuCr/C or MoCu/C or MoCCu/C.
Arrangement 350-first contact has a flat or lowered tapered pin, second contact is flat with no pin:
First contact: the pin 30 is made of C and the main portion 20 is made of Cu.
The second contact is made of Cu/C or WCu or WCCu/C or CuCr/C or MoCu/C or MoCCu/C.
First contact: the pin 30 is made of C and the main portion 20 is made of Cu/C.
The second contact is made of Cu/C or WCu or WCCu/C or CuCr/C or MoCu/C or MoCCu/C.
First contact: the pin 30 is made of C and the main portion 20 is made of CuCr.
The second contact is made of CuCr, WCu or MoCu/C or MoCCu/C.
First contact: the pin 30 is made of C and the main part 20 is made of WCAg.
The second contact is made of WCAg or WCAg/C or MoCu/C or MoCCu/C.
First contact: the pin 30 is made of C and the main portion 20 is made of WCAg/C.
The second contact is made of WCAg or WCAg/C or MoCu/C or MoCCu/C.
First contact: the pin 30 is made of C and the main portion 20 is made of Ag/C.
The second contact is made of Ag/C or WCAg/C or MoCu/C or MoCCu/C.
The materials mentioned are as follows:
Ag/C has a minority percentage (0.1%..10%) of silver of graphite; in particular with 2% and with 4% graphite.
WCAg tungsten silver carbide, particularly with 10% …% Ag, is well known for MV VI contactor applications.
WCAg/C has a few percent (0.1%..10%) of tungsten carbide silver of graphite, especially with 10% …% Ag and with 1% graphite.
C carbon, graphite, graphene, fullerene or diamond
Cu copper
Cu/C has a small percentage (0.1%. 10%) of copper of graphite; in particular with 2% and with 4% graphite.
CuCr copper chromium with 18% …% chromium alloy, in particular with 25% and with 35% Cr
CuCr/C copper chromium with a small percentage (0.1%..10%) of graphite and 18% …% chromium alloy, in particular with 25% and with 35% Cr
WCu has 5%. 40% copper tungsten copper
WCu/C has a few percent (0.1%. 10%) graphite and tungsten copper with 5%. 40% copper
WCCu has 10%. 50% copper tungsten carbide copper
WCCu/C has a few percent (0.1%..10%) graphite and tungsten carbide copper with 10%..50% copper
MoCu/C has a few percent (0.1%. 10%) of graphite and molybdenum copper with 10%. 50% copper
MoCCu/C has a minority percentage (0.1%. 10%) of graphite and molybdenum copper carbide with 10%. 50% copper
Sn/C tin with a few percent (0.1%..10%) of graphite
All percentages are by weight.
The following relates to the advantages of the material combination:
arc of nominal current:
for all arrangements with at least one protruding pin (arrangements 310 and 320):
An arc is formed at the location of the pin 30, as current flows there at the instant of contact separation. The relatively low level of load current compared to the short circuit current does not overstress the material of pin 30 (Ag/C, cu/C, sn/C).
At current zero, low chopping currents of Ag/C or Cu/C or Sn/C are applied. Furthermore, the pin combination made of CuCr/C or WCu/C will show a low chopping current due to the content of C.
The combination with pins made of WCAg, cuCr or WCu will also have a low chopping current due to the C content of the opposing contacts.
For all arrangements (330) with flat contacts without pins:
the low chopping currents of Ag/C or WCAg/C or Cu/C or WCCu/C or MoCu/C or MoCCu/C are applied independent of the position of the arc.
For all arrangements (340, 350) with one or more pins made of C:
since the arc voltage of the material C in the inner region of the pin 30 is lower than the arc voltage of the material in the outer region of the main portion 20, a low current arc will travel towards the inner region of the pin 30 and a low chopping current of C will be applied.
Short circuit current arc:
for all arrangements (310, 320) with at least one protruding pin:
although the arc starts at the location of the pin 30, it will be driven away from the center of the contact by the lorentz force and the shrink effect in a short time, so it will burn in the area of the main part 20 of the contact where the material WCAg or WCAg/C or CuCr/C or WCu/C resists the arc. In the case of a short circuit current, the chopping current will be low anyway due to the high temperature of the main part 20. In addition, the pin 30 is not degraded by high short-circuit currents.
For all arrangements with flat contacts without pins:
in the case of Ag or Ag/C or Cu/C or Sn/C, the possible short-circuit current may be lower than known from e.g. WCAg, but still sufficient for certain applications where other advantages are more important, e.g. for load current switching of small motors.
For all arrangements (340, 350) with one or more pins made of C:
independent of its starting point, the arc will be driven away from the center of the contact by lorentz forces and the contraction effect in a short time, so it will burn in the region of the main part 20 of the contact, in which region the material WCAg or WCAg/C or CuCr/C or WCu/C or WCCu/C or MoCCu/C resists the arc. In case of a short circuit current, the chopping current will be low anyway due to the high temperature of 20. In addition, the pin 30 is not degraded by high short-circuit currents.
Even Cu, cu/C and Ag/C provide a certain arc resistance, which is sufficient depending on the application.
Ohmic resistance:
for all arrangements (310, 320) with at least one protruding pin:
here, the pin 30 is the part carrying the normal load current of the contact. A typical effect of previous arcs on Ag/C, cu/C, sn/C, cuCr/C or WCu/C is that C is depleted in the surface of the pin 30, such that pure metal remains at the surface of the pin 30 and thus ohmic resistance is low.
Materials such as WCAg, cuCr or WCu are suitable herein.
For all arrangements of flat contacts without pins (330):
typical effects of previous arcing on Ag/C or WCAg/C or Cu/C or WCCu/C or MoCu/C or MoCCu/C or Sn/C are C depletion in the surface of the pin 30 such that pure metal remains at the surface of 30 and therefore ohmic resistance is low
WCAg is a prior art contactor and thus it can also be used here.
For all arrangements (340, 350) with one or more pins made of C:
here, the main portion 20 of the contact carries the normal load current of the contact, which is prior art. In the case of a material of 20 containing C, C will also be depleted at the surface due to the arc, so that the ohmic resistance remains low.
Welding:
for all arrangements (310, 320) with at least one protruding pin:
Ag/C is well known for negligible micro-soldering. This behavior is also valid for Cu/C, cuCr/C, WCu/C, mo/C, WCCu/C, moCCu/C and Sn/C due to the C content.
For all arrangements of flat contacts without pins (330):
since at least one of the two contacts is made of a material containing a few percent of C, the tendency for micro-soldering is also very low in these cases.
For all arrangements (340, 350) with one or more pins made of C:
here, the main portion 20 is a characteristic of the welding behavior. Even Cu, cu/C and Ag/C provide a certain arc resistance, which may be sufficient depending on the application.
Manufacturing:
for all arrangements (310, 320) with at least one protruding pin:
the usual manufacturing process of VI may utilize joining of VI components by brazing. Ag/C is more difficult here because C in the surface has a tendency to repel solder. This can be overcome by a prior heat treatment of the surface of the Ag/C such that the surface consists of pure silver, or by an extrusion process in which the Ag/C is surrounded by a tube made of pure silver, or by embedding the Ag/C powder centre into the powder of the main part of the contact, e.g. WCAg, before sintering the contact.
In case the material of the main part of the contact is e.g. CuCr, a deep drawn foil of Ni may be inserted between CuCr and Ag/C to avoid that too much braze solder is precipitated from the mixture of Cu and Ag at a soldering temperature above 780 ℃.
For all arrangements (340, 350) with one or more pins made of C: pure carbon is virtually non-solderable. For connection with the main part of the contact material 20, a taper 31 is thus given so that it is of a suitable form in the main part of the contact and the stem. Braze welding may be used to fill the gap between main portion 20 and taper 31 and between taper 31 and the rod. Furthermore, a brazing filler metal is suitable for connecting the main portion 20 and the rod.
The following reference numerals are:
1 contact with lever
10 poles
The main part of the 20 contact, also called the second contact part
30 in the contact, also known as the insert or pin or first contact portion
31 in the contact member-a form of the first contact portion 30
35 decrease of 30 compared to 20-one form of the first contact portion 30
36-a form of the protruding-first contact portion 30 of 30 compared to 20
40 contact slit
50 in the contact-one form of the first contact portion 30
100 vacuum interrupter
101 fixed contact with rod
102 moving contact with lever
110 upper cover
120 ceramic insulator
130 lower cover
140 corrugated pipe
201 arc
202 arc
310 arrangement of two contacts with protruding pins
320 an arrangement of a contact with protruding pins and a contact without pins
330 arrangement of two contacts without pins
340 arrangement of two contacts with tapered pins that do not drop and bulge
350 arrangement of a contact with a conical pin and a contact without a pin
While the invention has been illustrated and described in detail in the drawings and foregoing description, such illustration and description are to be considered illustrative or exemplary and not restrictive. The invention is not limited to the disclosed embodiments. Other variations to the disclosed embodiments can be understood and effected by those skilled in the art in practicing the claimed invention, from a study of the drawings, the disclosure, and the dependent claims.
Claims (18)
1. A vacuum interrupter, comprising:
-a first carrier (101); and
-a second carrier (102);
wherein the first carrier comprises a lever (10) and a contact (1);
wherein the second carrier comprises a lever (10) and a contact (1);
wherein the contact of the first carrier comprises a first contact portion (30) and a second contact portion (20) surrounding the first contact portion;
wherein the contact of the second carrier comprises a first contact portion (30) and a second contact portion (20) surrounding the first contact portion; and
wherein at least a portion of the first contact portion of the first carrier is of a different material than the second contact portion of the first carrier; and/or wherein at least a portion of the first contact portion of the second carrier is of a different material than the second contact portion of the second carrier.
2. The vacuum interrupter of claim 1, wherein in a deactivated state the vacuum interrupter is configured to keep the contact of the first carrier spaced apart from the contact of the second carrier, and in an activated state the vacuum interrupter is configured to bring the contact of the first carrier and the contact of the second carrier into contact with each other; or wherein in a deactivated state the vacuum interrupter is configured to hold the contact of the first carrier in contact with the contact of the second carrier, and in an activated state the vacuum interrupter is configured to separate the contact of the first carrier from the contact of the second carrier.
3. The vacuum interrupter of any one of claims 1-2, wherein the first carrier is a fixed contact carrier and the second carrier is a movable contact carrier, and wherein in the activated state the vacuum interrupter is configured to move the second carrier; or wherein the first carrier is a movable contact carrier and the second carrier is a fixed contact carrier, and wherein in the activated state the vacuum interrupter is configured to move the first carrier.
4. The vacuum interrupter of any one of claims 1-3, wherein a material of all of the first contact portions of the first carrier is different from a material of the second contact portions of the first carrier; and/or wherein the material of all of the first contact portions of the first carrier is different from the material of the second contact portions of the first carrier.
5. The vacuum interrupter of any one of claims 1-4, wherein a junction between the first and second contact portions of the contact of the first carrier defines a plane, and wherein the first contact portion includes a portion (35, 50) having a surface located below the plane, and wherein the at least a portion of the first contact portion is a remainder of the first contact portion other than the portion having the surface located below the plane; and/or wherein a junction between the first contact portion and the second contact portion of the contact of the second carrier defines a plane, and wherein the first contact portion comprises a portion (35) having a surface located below the plane, and wherein the at least a portion of the first contact portion is a remainder of the first contact portion other than the portion having the surface located below the plane.
6. The vacuum interrupter of any one of claims 1-4, wherein a junction between the first contact portion and the second contact portion of the contact of the first carrier defines a plane, and wherein the at least a portion of the first contact portion comprises a portion (36) having a surface above the plane; and/or wherein a junction between the first contact portion and the second contact portion of the contact of the second carrier defines a plane, and wherein the at least a portion of the first contact portion includes a portion (36) having a surface above the plane.
7. The vacuum interrupter of any one of claims 1-6, the material of the second contact portion of the first carrier being WCAg or WCAg/C or CuCr/C or WCu/C or Cu/C or MoCu/C or Cu or WCu or WCCu/C or MoCCu/C or Ag/C or Cu; and/or wherein the material of the second contact portion of the second carrier is WCAg or WCAg/C or CuCr/C or WCu/C or Cu/C or MoCu/C or Cu or WCu or WCCu/C or MoCCu/C or Ag/C or Cu.
8. The vacuum interrupter of any one of claims 1-7, wherein a material of the at least a portion of the first contact portion of the first carrier is Ag/C or Cu/C or CuCr/C or WCu/C or MoCu/C or Sn/C or C; and/or wherein the material of said at least a portion of said first contact portion of said second carrier is Ag/C or Cu/C or CuCr/C or WCu/C or MoCu/C or Sn/C or C.
9. The vacuum interrupter of any one of claims 1-4, wherein a junction between the first and second contact portions of the contact of the first carrier defines a plane, and wherein the at least a portion of the first contact portion is a tapered pin (31) protruding outwardly from the plane; and/or wherein the junction between the first and second contact portions of the contacts of the second carrier defines a plane, and wherein the at least a portion of the first contact portion is a tapered pin (31) protruding outwardly from the plane.
10. The vacuum interrupter of claim 9, wherein a material of the at least a portion of the first contact portion of the first carrier is carbon; and/or wherein the material of the at least a portion of the first contact portion of the first carrier is carbon.
11. The vacuum interrupter of any one of claims 1-10, wherein the second contact portion of the first carrier comprises one or more slits (40); and/or wherein the second contact portion of the second carrier comprises one or more slits (40).
12. The vacuum interrupter of any one of claims 1-11, wherein the first contact portion of the first carrier comprises one or more slits; and/or wherein the first contact portion of the second carrier comprises one or more slits.
13. The vacuum interrupter of claim 12 when dependent on claim 11 wherein the one or more slits in the first contact portion of the first carrier are a continuation of the one or more slits in the second contact portion of the first carrier; and/or wherein the one or more slits in the first contact portion of the second carrier are a continuation of the one or more slits in the second contact portion of the first carrier.
14. The vacuum interrupter of any one of claims 1-13, wherein a material of the at least a portion of the first contact portion of the first carrier is the same as a material of the at least a portion of the first contact portion of the second carrier; and/or wherein the material of the second contact portion of the first carrier is the same as the material of the second contact portion of the second carrier.
15. The vacuum interrupter of any one of claims 1-14, wherein a shape of the at least a portion of the first contact portion of the first carrier is the same as a shape of the at least a portion of the first contact portion of the second carrier; and/or wherein the shape of the second contact portion of the first carrier is the same as the shape of the second contact portion of the second carrier.
16. A vacuum interrupter, comprising:
-a first carrier (101); and
-a second carrier (102);
wherein the first carrier comprises a lever (10) and a contact (1);
wherein the second carrier comprises a lever (10) and a contact (1);
wherein the contact of the first carrier is made of a first material;
wherein the contact of the second carrier is made of a second material;
wherein the first material is Ag/C and the second material is WCAg or WCAg/C; or alternatively
Wherein the first material is WCAg/C and the second material is WCAg or WCAg/C; or alternatively
Wherein the first material is Cu/C and the second material is CuCr or CuCr/C or WCu/C or Cu; or alternatively
Wherein the first material is WCu/C and the second material is CuCr or Cu; or alternatively
Wherein the first material is WCCu/C and the second material is CuCr or CuCr/C or WCu/C or WCCu/C or Cu; or alternatively
Wherein the first material is MoCu/C and the second material is WCMo/C or CuCr/C or WCu/C or Cu; or alternatively
Wherein the first material is MoCCu/C and the second material is CuCr/C or Cu.
17. A contact for a vacuum interrupter, comprising:
-a first contact portion (30); and
-a second contact portion (20);
wherein the second contact portion surrounds the first contact portion; and is also provided with
Wherein at least a portion of the first contact portion is of a different material than the second contact portion.
18. A contact for a vacuum interrupter:
wherein the material of the contact is Ag/C or WCAg/C or Cu/C or CuCr/C or WCu/C or Cu or WCCu/C or CuCr/C or WCu/C or WCCu/C or MoCu/C or WCMo/C or MoCCu/C.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP22172209.3 | 2022-05-08 | ||
EP22172209.3A EP4276864A1 (en) | 2022-05-08 | 2022-05-08 | Vacuum interrupter |
Publications (1)
Publication Number | Publication Date |
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CN117038384A true CN117038384A (en) | 2023-11-10 |
Family
ID=81595596
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202310503500.6A Pending CN117038384A (en) | 2022-05-08 | 2023-05-06 | Vacuum interrupter |
Country Status (2)
Country | Link |
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EP (1) | EP4276864A1 (en) |
CN (1) | CN117038384A (en) |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3182156A (en) * | 1961-09-19 | 1965-05-04 | Gen Electric | Vacuum-type circuit interrupter |
GB1388283A (en) * | 1972-05-18 | 1975-03-26 | English Electric Co Ltd | Vacuum type electric circuit interrupting devices |
JPH01100837A (en) * | 1987-10-12 | 1989-04-19 | Mitsubishi Electric Corp | Vacuum switch tube |
JP2653486B2 (en) * | 1988-08-19 | 1997-09-17 | 株式会社東芝 | Contact material for vacuum valve |
JP3101329B2 (en) * | 1991-01-10 | 2000-10-23 | 株式会社東芝 | Vacuum valve |
JP2009289652A (en) * | 2008-05-30 | 2009-12-10 | Toshiba Corp | Agwc-ag composite contact, and manufacturing method thereof |
DE102013014915A1 (en) * | 2013-09-11 | 2015-03-12 | Airbus Defence and Space GmbH | Contact materials for high-voltage DC systems |
US10468205B2 (en) * | 2016-12-13 | 2019-11-05 | Eaton Intelligent Power Limited | Electrical contact alloy for vacuum contactors |
CN112620640B (en) * | 2020-12-09 | 2023-01-31 | 温州宏丰电工合金股份有限公司 | Preparation method of AgNi electrical contact material based on recycling of AgC scrap |
-
2022
- 2022-05-08 EP EP22172209.3A patent/EP4276864A1/en active Pending
-
2023
- 2023-05-06 CN CN202310503500.6A patent/CN117038384A/en active Pending
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EP4276864A1 (en) | 2023-11-15 |
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