CN116699346A - Power frequency withstand voltage test loop and power frequency withstand voltage test method - Google Patents
Power frequency withstand voltage test loop and power frequency withstand voltage test method Download PDFInfo
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- CN116699346A CN116699346A CN202310989636.2A CN202310989636A CN116699346A CN 116699346 A CN116699346 A CN 116699346A CN 202310989636 A CN202310989636 A CN 202310989636A CN 116699346 A CN116699346 A CN 116699346A
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- 238000012360 testing method Methods 0.000 title claims abstract description 272
- 238000010998 test method Methods 0.000 title claims abstract description 12
- 239000012212 insulator Substances 0.000 claims description 20
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- 238000003825 pressing Methods 0.000 claims description 9
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- 238000009413 insulation Methods 0.000 description 7
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- 238000009533 lab test Methods 0.000 description 3
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/14—Circuits therefor, e.g. for generating test voltages, sensing circuits
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- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
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Abstract
The application provides a power frequency withstand voltage test loop and a power frequency withstand voltage test method, comprising the following steps: the system comprises a first power frequency voltage source, first measuring equipment, a second power frequency voltage source, second measuring equipment, a high-altitude sample and an insulating platform; the first power frequency voltage source is connected with the first measuring equipment in parallel, and a public end connected in parallel is connected with the high-voltage end of the high-altitude sample; the second power frequency voltage source is connected with the second measuring equipment in parallel, and a common end connected in parallel is connected with the shell of the high-altitude sample; the base of the high-altitude test sample is arranged on the top surface of the insulating platform, wherein the base of the high-altitude test sample and the top surface of the insulating platform are equipotential. The first voltage and the second voltage with the phase difference of 180 degrees are respectively applied to the high-altitude sample to carry out the power frequency withstand voltage test, so that the requirements of test equipment and test space are reduced, and the test cost is controlled; the problem that high-level voltage is difficult to apply due to solidification of test equipment is solved, the test equipment is effectively protected, and safety is improved.
Description
Technical Field
The application relates to the technical field of power frequency withstand voltage tests, in particular to a power frequency withstand voltage test loop and a power frequency withstand voltage test method.
Background
The industrial frequency withstand voltage test is a test for checking the insulation withstand voltage capability of electrical equipment. The industrial frequency withstand voltage performance is mainly determined by an industrial frequency alternating current withstand voltage test. As known from the national relevant standard requirements, if the final installation site of the test sample is a position with the altitude higher than 1000m, the altitude correction of the test voltage is needed when the power frequency withstand voltage test is carried out in a laboratory with the altitude position not higher than 1000 m.
Because the conventional test voltage of the conventional power frequency withstand voltage test loop is far lower than the power frequency test voltage after the altitude correction, if the conventional power frequency withstand voltage test loop is continuously used, the laboratory space size and laboratory test equipment are required to be extremely severely, the laboratory cost is increased by modifying the laboratory and the laboratory test equipment, the power frequency test voltage after the altitude correction is too high, the safety risk is increased, and the problem of damage to test products and test equipment is easy to occur.
Therefore, designing a power frequency withstand voltage test loop meeting the high altitude correction condition is a problem to be solved urgently.
Disclosure of Invention
Therefore, the embodiment of the application provides a power frequency withstand voltage test loop and a power frequency withstand voltage test method, which are used for solving the problem that test equipment is easy to damage due to overhigh voltage.
In order to achieve the above object, the embodiment of the present application provides the following technical solutions:
an embodiment of the application discloses a power frequency withstand voltage test loop in a first aspect, wherein the test loop comprises: the system comprises a first power frequency voltage source, first measuring equipment, a second power frequency voltage source, second measuring equipment, a high-altitude sample and an insulating platform;
the first power frequency voltage source is connected with the first measuring equipment in parallel, one common end of the parallel connection is connected with the high-voltage end of the high-altitude sample, and the other common end of the parallel connection is grounded;
the second power frequency voltage source is connected with the second measuring equipment in parallel, one common end of the parallel connection is connected with the shell of the high-altitude sample, and the other common end of the parallel connection is grounded;
the phase difference between the voltage generated by the first power frequency voltage source and the voltage generated by the second power frequency voltage source is 180 degrees;
the base of the high-altitude test sample is arranged on the top surface of the insulating platform, wherein the base of the high-altitude test sample and the top surface of the insulating platform are equipotential;
the grounding end of the insulating platform is grounded.
Preferably, the first power frequency voltage source includes: a first power frequency test transformer and a first resistor;
the grounding end of the first power frequency test transformer is grounded, and the high-voltage end of the first power frequency test transformer is connected with one end of the first resistor;
the other end of the first resistor is connected with the high-voltage end of the first measuring device and the high-voltage end of the high-altitude sample.
Preferably, the first measuring device includes: a first capacitive voltage divider and a first voltmeter;
the high-voltage end of the first capacitive voltage divider is connected with the high-voltage end of the first power frequency voltage source and the high-voltage end of the high-altitude sample, the grounding of the first capacitive voltage divider is grounded, and the low-voltage end of the first capacitive voltage divider is connected with one end of the first voltmeter;
the other end of the first voltmeter is grounded.
Preferably, the second power frequency voltage source includes: the second power frequency test transformer and the second resistor;
the grounding end of the second power frequency test transformer is grounded, and the high-voltage end of the second power frequency test transformer is connected with one end of the second resistor;
the other end of the second resistor is connected with the high-voltage end of the second measuring device and the shell of the high-altitude sample.
Preferably, the second measuring device includes: a second capacitive voltage divider and a second voltmeter;
the high-voltage end of the second capacitive voltage divider is connected with the high-voltage end of the second power frequency voltage source and the shell of the high-altitude sample, the grounding end of the second capacitive voltage divider is grounded, and the low-voltage end of the second capacitive voltage divider is connected with one end of the second voltmeter;
the other end of the second voltmeter is grounded.
Preferably, the insulation platform includes: the insulator support comprises a base support, a top platform, insulator struts and a voltage equalizing cover;
the bottom end of the insulator support is fixedly connected with one side outer surface of the base support, the top end of the insulator support is fixedly connected with one side outer surface of the top platform, the base support is the bottom of the insulating platform, the top platform is the top of the insulating platform, the insulator support is used for supporting the top platform, and the other side outer surface of the top platform is used for placing the high-altitude test sample;
the voltage equalizing cover surrounds the top of the insulator support column and the fixed connection part of the top platform, and the peripheral edge of the top platform, and is used for enabling electric fields around the top platform to be uniformly distributed.
The second aspect of the embodiment of the application discloses a power frequency withstand voltage test method, which comprises the following steps:
when a test instruction is received, a voltage application task and a voltage detection task are executed in parallel, wherein the test instruction at least comprises test voltage and test duration, the voltage application task indicates that voltages are respectively applied to two sides of a test sample so that voltage values of the two sides of the test sample respectively reach first voltage and second voltage, the first voltage and the second voltage are kept unchanged until the duration is equal to the test duration, the pressing is stopped, the sum of the first voltage and the second voltage is equal to the test voltage, and the voltage detection task indicates that the voltage values of the two sides of the test sample are detected;
and if the voltage value detected by the voltage detection task in real time is not zero during the execution of the voltage application task, determining that the test sample meets the requirement of the power frequency withstand voltage test.
Preferably, when receiving the test instruction, the task of applying the voltage and the task of detecting the voltage are executed in parallel, including:
when a test instruction is received, a first power frequency voltage source is controlled to apply voltage to one side of a test sample, so that the voltage value applied to one side of the test sample reaches the first voltage, and the voltage values of two sides of the test sample are detected in real time until the first power frequency voltage source stops applying voltage;
controlling a second power frequency voltage source to apply voltage to the other side of the test sample so that the voltage value applied to the other side of the test sample reaches a second voltage, wherein the first voltage and the second voltage are both smaller than the rated power frequency tolerance voltage to the ground;
and when the duration of applying the second voltage to the other side of the test sample by the second power frequency voltage source is equal to the test duration, controlling the first power frequency voltage source and the second power frequency voltage source to stop pressing.
Preferably, when receiving a test instruction, the first power frequency voltage source is controlled to apply voltage to one side of the test article, so that the voltage value applied to one side of the test article reaches the first voltage, and the voltage values of two sides of the test article are detected in real time until the first power frequency voltage source stops applying voltage, including:
when a test instruction is received, a first power frequency voltage source is controlled to apply voltage to one side of a test sample and continuously boost the voltage, and voltage values of two sides of the test sample are detected in real time until the first power frequency voltage source stops applying the voltage;
and when the voltage value applied to the side of the test sample by the first power frequency voltage source reaches the preset duty ratio of the first voltage, boosting according to the preset speed until the voltage value applied to the side of the test sample by the first power frequency voltage source is equal to the first voltage.
Preferably, the controlling the second power frequency voltage source to apply a voltage to the other side of the test sample so that the voltage value applied to the other side of the test sample reaches the second voltage includes:
controlling a second power frequency voltage source to apply voltage to the other side of the test sample and continuously boosting the voltage;
and when the voltage value applied to the other side of the test sample by the second power frequency voltage source reaches the preset duty ratio of the second voltage, boosting according to the preset speed until the voltage value applied to the other side of the test sample by the second power frequency voltage source is equal to the second voltage.
Based on the power frequency withstand voltage test loop and the power frequency withstand voltage test method provided by the embodiment of the application, the test loop comprises: the system comprises a first power frequency voltage source, first measuring equipment, a second power frequency voltage source, second measuring equipment, a high-altitude sample and an insulating platform; the first power frequency voltage source is connected with the first measuring equipment in parallel, and a public end connected in parallel is connected with the high-voltage end of the high-altitude sample; the second power frequency voltage source is connected with the second measuring equipment in parallel, and a common end connected in parallel is connected with the shell of the high-altitude sample; the base of the high-altitude test sample is arranged on the top surface of the insulating platform, wherein the base of the high-altitude test sample and the top surface of the insulating platform are equipotential. The first power frequency voltage source and the second power frequency voltage source respectively apply the first voltage and the second voltage with the phase difference of 180 degrees to the high-altitude sample so as to carry out a power frequency withstand voltage test, thereby reducing the requirements of test equipment and test space and controlling the test cost; the problem that high-level voltage is difficult to apply due to solidification of test equipment is solved, the test equipment is effectively protected, and safety is improved.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings that are required to be used in the embodiments or the description of the prior art will be briefly described below, and it is obvious that the drawings in the following description are only embodiments of the present application, and that other drawings can be obtained according to the provided drawings without inventive effort for a person skilled in the art.
FIG. 1 is a first circuit diagram of a power frequency withstand voltage test loop provided by an embodiment of the application;
FIG. 2 is a second circuit diagram of a power frequency withstand voltage test loop according to an embodiment of the present application;
FIG. 3 is a third circuit diagram of a power frequency withstand voltage test loop according to an embodiment of the present application;
FIG. 4 is a fourth circuit diagram of a power frequency withstand voltage test loop according to an embodiment of the present application;
FIG. 5 is a fifth circuit diagram of a power frequency withstand voltage test loop according to an embodiment of the present application;
FIG. 6 is a schematic diagram of an insulation platform of a power frequency withstand voltage test loop according to an embodiment of the present application;
FIG. 7 is a flow chart of a method for testing power frequency withstand voltage according to an embodiment of the present application;
fig. 8 is a schematic diagram of a relationship between a first voltage and a second voltage according to an embodiment of the present application.
Detailed Description
The following description of the embodiments of the present application will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present application, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
In the present disclosure, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
As known from the background art, if the final installation site of the test product of the power frequency withstand voltage test is a position with an altitude higher than 1000m, the test voltage needs to be subjected to altitude correction when the power frequency withstand voltage test is performed in a laboratory with an altitude position not higher than 1000m, but the power frequency test voltage after the altitude correction is too high, the safety risk is increased, the problem that the test product and the test equipment are damaged easily occurs, and the conventional power frequency withstand voltage test loop cannot be continuously used.
In an embodiment of the present application, the high altitude test sample may be a high altitude cannula. Bushings are devices that provide insulation and support for one or more conductors passing through a partition such as a wall or a box; the high-altitude casing is a casing product in a high-altitude area under a long-term working condition.
Specifically, when the altitude of the installation site of the sleeve is higher than 1000m, the altitude correction is carried out on the test voltage when the laboratory with the altitude not higher than 1000m tests according to the national standard, and the correction coefficient is thatThe calculation mode is shown in the formula (1):
（1）
wherein H is altitude.
It is known that the power frequency test voltage of the high-altitude casing after the altitude correction is far higher than the conventional test voltage, and if the conventional power frequency withstand voltage test loop is continuously used, the laboratory space size and laboratory test equipment are extremely severely required, and the safety risk exists.
Therefore, an embodiment of the present application provides a power frequency withstand voltage test circuit and a power frequency withstand voltage test method, the test circuit including: the system comprises a first power frequency voltage source, first measuring equipment, a second power frequency voltage source, second measuring equipment, a high-altitude sample and an insulating platform; the first power frequency voltage source is connected with the first measuring equipment in parallel, and a public end connected in parallel is connected with the high-voltage end of the high-altitude sample; the second power frequency voltage source is connected with the second measuring equipment in parallel, and a common end connected in parallel is connected with the shell of the high-altitude sample; the base of the high-altitude test sample is arranged on the top surface of the insulating platform, wherein the base of the high-altitude test sample and the top surface of the insulating platform are equipotential. The first power frequency voltage source and the second power frequency voltage source respectively apply the first voltage and the second voltage with the phase difference of 180 degrees to the high-altitude sample so as to carry out a power frequency withstand voltage test, thereby reducing the requirements of test equipment and test space and controlling the test cost; the problem that high-level voltage is difficult to apply due to solidification of test equipment is solved, the test equipment is effectively protected, and safety is improved.
Referring to fig. 1, a first circuit diagram of a power frequency withstand voltage test loop provided by an embodiment of the application is shown, where the power frequency withstand voltage test loop includes: the device comprises a first power frequency voltage source 01, a first measuring device 02, a second power frequency voltage source 03, a second measuring device 04, a high-altitude sample 05 and an insulating platform 06.
The first power frequency voltage source 01 and the first measuring device 02 are connected in parallel, one common end of the parallel connection is connected with the high-voltage end of the high-altitude sample 05, and the other common end of the parallel connection is grounded. The second power frequency voltage source 03 is connected in parallel with the second measuring equipment 04, one common end of the parallel connection is connected with the shell of the high altitude sample 05, and the other common end of the parallel connection is grounded. The phase difference between the voltage generated by the first power frequency voltage source 01 and the voltage generated by the second power frequency voltage source 03 is 180 °. The base of the high altitude test substance 05 is mounted on the top surface of the insulating platform 06, wherein an equipotential is provided between the base of the high altitude test substance 05 and the top surface of the insulating platform 06. The ground of the insulating platform 06 is grounded.
The first power frequency voltage source 01 and the second power frequency voltage source 03 are used as power supply equipment of the power frequency withstand voltage test loop provided by the embodiment of the application. The first power frequency voltage source 01 and the second power frequency voltage source 03 are used for respectively applying voltages with the phase difference of 180 degrees to the high-altitude sample 05. The sum of the two voltages applied by the first power frequency voltage source 01 and the second power frequency voltage source 03 is the test voltage of a power frequency withstand voltage test.
It can be appreciated that the first measuring device 02 serves as a measuring device for the first power frequency voltage source 01; the second measuring device 04 is used as a measuring device of a second power frequency voltage source 03; the first measuring device 02 and the second measuring device 04 are used for detecting the voltage value born by the high-voltage end and the casing of the high-altitude sample 05 respectively.
The insulating platform 06 is used for placing the high-altitude test sample 05, and specifically, the high-altitude test sample is integrally arranged on the insulating platform; the first power frequency voltage source 01 is connected with the high-voltage end of the high-altitude sample; the second power frequency voltage source 03 is connected with the shell of the high altitude sample. The high altitude sample 05 may be a high altitude cannula.
In the embodiment of the application, the power frequency withstand voltage test loop under the high altitude correction condition is constructed by reasonably designing the first power frequency voltage source 01, the first measuring equipment 02, the second power frequency voltage source 03, the second measuring equipment 04, the high altitude test article 05 and the insulating platform 06 and adopting a mode of pressurizing two ends of the high altitude test article by the double-frequency voltage source, thereby reducing the requirements of test equipment and test space and controlling the test cost; the problem that high-level voltage is difficult to apply due to solidification of test equipment is solved, the test equipment is effectively protected, safety is improved, and effective assessment of high-altitude samples is guaranteed.
In a specific embodiment, referring to fig. 2 in conjunction with fig. 1, a second circuit diagram of a power frequency withstand voltage test loop provided by an embodiment of the present application is shown, where a first power frequency voltage source 01 includes: a first power frequency test transformer and a first resistor R1.
The grounding end of the first power frequency test transformer is grounded, and the high-voltage end of the first power frequency test transformer is connected with one end of the first resistor R1; the other end of the first resistor R1 is connected to the high voltage end of the first measuring device 02 and the high voltage end of the high altitude sample 05.
It is understood that the first resistor R1 is a body protection resistor of the first power frequency test transformer. The first power frequency transformer is connected in series with the first resistor R1.
That is, the first resistor R1 is installed between the high voltage end of the first power frequency transformer and the high voltage end of the first capacitive voltage divider (the first capacitive voltage divider is shown in fig. 3), and there is no base.
In the embodiment of the application, a first power frequency voltage source 01 is constructed based on a first power frequency test transformer and a first resistor R1 to apply a voltage to a high altitude sample 05.
In a specific embodiment, referring to fig. 3 in conjunction with fig. 1, a third circuit diagram of a power frequency withstand voltage test loop provided by an embodiment of the present application is shown, where the first measurement device 02 includes: a first capacitive voltage divider and a first voltmeter.
The high-voltage end of the first capacitive voltage divider is connected with the high-voltage end of the first power frequency voltage source 01 and the high-voltage end of the high-altitude sample 05, the grounding end of the first capacitive voltage divider is grounded, and the low-voltage end of the first capacitive voltage divider is connected with one end of the first voltmeter; the other end of the first voltmeter is grounded.
It should be noted that the first capacitive voltage divider is a voltage dividing device using a capacitor as a voltage dividing element; the high-voltage power supply consists of a high-voltage end and a low-voltage end, wherein the low-voltage end transmits obtained voltage signals through a cable and displays the voltage signals on a first voltmeter.
It will be appreciated that the first voltmeter is specifically configured to detect the voltage value to which the high voltage end of the high altitude test object 05 is subjected.
In the embodiment of the application, a first measuring device 02 is constructed based on a first capacitive voltage divider and a first voltmeter and is used for dividing and detecting the voltage value of the high-voltage end of the high-altitude sample 05.
In a specific embodiment, referring to fig. 4 in conjunction with fig. 1, a fourth circuit diagram of a power frequency withstand voltage test loop provided by an embodiment of the present application is shown, where the second power frequency voltage source 03 includes: a second power frequency test transformer and a second resistor R2.
The grounding end of the second power frequency test transformer is connected with one end of the second resistor R2; the other end of the second resistor R2 is connected to the high voltage end of the second measuring device 04 and to the housing of the high altitude sample 05.
It is understood that the second resistor R2 is a body protection resistor of the second power frequency test transformer. The second power frequency transformer is connected in series with a second resistor R2.
That is, the second resistor R2 is installed between the high voltage end of the second power frequency transformer and the high voltage end of the second capacitive voltage divider (see fig. 5 for the second capacitive voltage divider), without a base.
In the embodiment of the present application, the second power frequency voltage source 03 is constructed based on the second power frequency test transformer and the second resistor R2 to apply a voltage to the high altitude specimen 05.
In a specific embodiment, referring to fig. 5 in conjunction with fig. 1, a fifth circuit diagram of a power frequency withstand voltage test loop provided by an embodiment of the present application is shown, where the second measurement device 04 includes: a second capacitive voltage divider and a second voltmeter.
The high-voltage end of the second capacitive voltage divider is connected with the high-voltage end of the second power frequency voltage source 03 and the shell of the high-altitude sample 05, the grounding end of the second capacitive voltage divider is grounded, and the low-voltage end of the second capacitive voltage divider is connected with one end of the second voltmeter; the other end of the second voltmeter is grounded.
It can be understood that the second capacitive voltage divider is a voltage dividing device using a capacitor as a voltage dividing element; the voltage signal is transmitted by the low-voltage end through a cable and is displayed on a second voltmeter.
The second voltmeter is specifically configured to detect a voltage value born by the housing of the high altitude test object 05.
In the embodiment of the application, the second measuring device 04 is constructed based on the second capacitive voltage divider and the second voltmeter and is used for dividing and detecting the voltage value of the high altitude sample 05 casing.
In a specific embodiment, referring to fig. 6 in conjunction with fig. 1, an insulation platform schematic diagram of a power frequency withstand voltage test loop provided by an embodiment of the present application is shown, where an insulation platform 06 includes: base support, top platform, insulator pillar and pressure equalizing cover.
Wherein, the bottom of insulator pillar and one side surface fixed connection of base support, the top of insulator pillar and one side surface fixed connection of top platform, wherein, the base support is insulating platform 06's bottom, and the top platform is insulating platform 06's top, and the insulator pillar is used for supporting top platform, and top platform's opposite side surface is used for placing high altitude test sample 05.
Specifically, a plurality of insulator posts may be spliced to form an insulator post to increase the distance between the base support and the top platform. The specific splicing conditions are adjusted according to actual test requirements, and are not limited herein.
The voltage equalizing cover surrounds the fixed connection part between the top of the insulator support and the top platform and the peripheral edge of the top platform, and is used for enabling electric fields around the top platform to be distributed uniformly.
It will be appreciated that the insulating platform is a load-bearing platform supported by the insulator posts as insulation. The base support and the top platform are of a cuboid structure.
In the embodiment of the application, an insulating platform 06 is constructed for placing a high altitude sample 05.
Referring to fig. 7 in combination with what is shown in fig. 1 to 6, a flowchart of a power frequency withstand voltage test method provided by an embodiment of the present application is shown.
In the embodiment of the present application, the industrial frequency withstand voltage test is specifically a test in which an ac voltage is applied to a test sample according to a standard prescribed program.
The power frequency withstand voltage test method comprises the following steps:
step S701: and when receiving the test instruction, executing the voltage application task and the voltage detection task in parallel.
In the process of concretely implementing step S701, when a test instruction carrying a test voltage and a test duration is received, a task of applying the voltage and a task of detecting the voltage are executed in parallel. The voltage application task indicates that voltages are respectively applied to two sides of the test sample so that voltage values of the two sides of the test sample respectively reach a first voltage and a second voltage, and the first voltage and the second voltage are kept unchanged until the keeping time is equal to the test time, and then pressing is stopped; the voltage detection task indicates to detect the voltage values at both sides of the test specimen.
In some specific embodiments, when a test instruction carrying test voltage and test duration is received, controlling a first power frequency voltage source to apply voltage to one side of a test sample so that the voltage value applied to one side of the test sample reaches the first voltage, and detecting the voltage values of two sides of the test sample in real time until the first power frequency voltage source stops applying voltage; and controlling the second power frequency voltage source to apply voltage to the other side of the test sample so as to enable the voltage value applied to the other side of the test sample to reach the second voltage. The first voltage and the second voltage are both smaller than the rated power frequency tolerance voltage of the grounding electrode; and when the duration of applying the second voltage to the other side of the test sample by the second power frequency voltage source is equal to the test duration, controlling the first power frequency voltage source and the second power frequency voltage source to stop pressing.
The phase difference between the first voltage and the second voltage is 180 ° (for example, as shown in fig. 8); the sum of the first voltage and the second voltage is equal to the test voltage.
It can be understood that, in the voltage application task, the first power frequency voltage source is controlled to apply a voltage to one side of the test sample, so that the voltage value applied to one side of the test sample reaches the first voltage as follows:
controlling a first power frequency voltage source to apply voltage to one side of the test sample and continuously boosting the voltage; when the voltage value applied to the side of the test sample by the first power frequency voltage source reaches the preset duty ratio of the first voltage, boosting according to the preset speed until the voltage value applied to the side of the test sample by the first power frequency voltage source is equal to the first voltage.
For example: and controlling the first power frequency voltage source to apply voltage to one side of the test sample and slowly boost the voltage, and controlling the first power frequency voltage source to slowly boost the voltage according to the 2%U/s rate of the first voltage when the first voltmeter detects that the voltage value applied to one side of the test sample by the first power frequency voltage source reaches 75% of the first voltage, until the first voltmeter detects that the voltage value applied to one side of the test sample by the first power frequency voltage source is equal to the first voltage.
When the voltage value applied by the first power frequency voltage source to one side of the test sample is equal to the first voltage, controlling the second power frequency voltage source to apply voltage to the other side of the test sample so that the voltage value applied to the other side of the test sample reaches the second voltage, wherein the specific process is as follows:
controlling a second power frequency voltage source to apply voltage to the other side of the test sample and continuously boosting the voltage; and when the voltage value applied by the second power frequency voltage source to the other side of the test sample reaches the preset duty ratio of the second voltage, boosting according to the preset speed until the voltage value applied by the second power frequency voltage source to the other side of the test sample is equal to the second voltage.
For example: and controlling the second power frequency voltage source to apply voltage to the other side of the test sample and slowly boost the voltage, and controlling the second power frequency voltage source to slowly boost the voltage according to the speed of 2%U/s of the second voltage when the second voltmeter detects that the voltage value applied by the second power frequency voltage source to the other side of the test sample reaches 75% of the second voltage, until the second voltmeter detects that the voltage value applied by the other side of the second power frequency voltage source to the test sample is equal to the second voltage.
It can be appreciated that the first power frequency voltage source and the second power frequency voltage source are controlled to slowly boost so as to ensure that the test sample is not destroyed.
When the duration of applying the second voltage to the other side of the test sample by the second power frequency voltage source reaches the test duration, the first power frequency voltage source and the second power frequency voltage source are controlled to stop applying pressure.
That is, when the voltage applied to the test sample by the second power frequency voltage source reaches the second voltage, the second voltage is kept unchanged until the duration of applying the second voltage reaches the test duration (for example, 60 seconds), the first power frequency voltage source and the second power frequency voltage source are controlled to stop pressing.
Specifically, the first power frequency voltage source and the second power frequency voltage source are controlled to rapidly reduce the voltage so as to observe whether destructive discharge occurs in the test sample within the test duration.
Step S702: if the voltage value detected by the voltage detection task in real time is not zero during the execution of the voltage application task, determining that the test sample meets the requirement of the power frequency withstand voltage test.
In the specific implementation step S702, starting from the first power frequency voltage source to apply pressure to the test sample until the first power frequency voltage source and the second power frequency voltage source stop applying pressure to the test sample, if the voltage values detected by the voltmeter corresponding to the first power frequency voltage source are all not zero, and the voltage values detected by the voltmeter corresponding to the second power frequency voltage source are all not zero, that is, the test sample does not have destructive discharge, then determining that the test sample meets the power frequency withstand voltage test requirement.
In the specific implementation process, if destructive discharge of the test sample does not occur during the execution of the voltage application task (namely, the voltage value detected by the voltmeter corresponding to the first power frequency voltage source is not zero, and the voltage value detected by the voltmeter corresponding to the second power frequency voltage source is not zero), determining that the test sample meets the power frequency withstand voltage test requirement. That is, if destructive discharge of the test sample occurs at any time during execution of the voltage application task (i.e., the voltage value detected by the voltmeter corresponding to the first power frequency voltage source is zero and/or the voltage value detected by the voltmeter corresponding to the second power frequency voltage source is zero), it is determined that the test sample does not meet the power frequency withstand voltage test requirement.
In the embodiment of the application, the first power frequency voltage source and the second power frequency voltage source respectively apply the first voltage and the second voltage with the phase difference of 180 degrees to the high-altitude sample to carry out the power frequency withstand voltage test, so that the safety problems of generating heat of the transformer coil and the protection resistor, generating corona and the like due to overhigh voltage are solved, the test equipment and the test environment are effectively protected, and the safety is improved.
In summary, the embodiment of the application provides a power frequency withstand voltage test loop and a power frequency withstand voltage test method, wherein the test loop comprises: the system comprises a first power frequency voltage source, first measuring equipment, a second power frequency voltage source, second measuring equipment, a high-altitude sample and an insulating platform; the first power frequency voltage source is connected with the first measuring equipment in parallel, and a public end connected in parallel is connected with the high-voltage end of the high-altitude sample; the second power frequency voltage source is connected with the second measuring equipment in parallel, and a common end connected in parallel is connected with the shell of the high-altitude sample; the base of the high-altitude test sample is arranged on the top surface of the insulating platform, wherein the base of the high-altitude test sample and the top surface of the insulating platform are equipotential. The first power frequency voltage source and the second power frequency voltage source respectively apply the first voltage and the second voltage with the phase difference of 180 degrees to the high-altitude sample so as to carry out a power frequency withstand voltage test, thereby reducing the requirements of test equipment and test space and controlling the test cost; the problem that high-level voltage is difficult to apply due to solidification of test equipment is solved, the test equipment is effectively protected, and safety is improved.
In this specification, each embodiment is described in a progressive manner, and identical and similar parts of each embodiment are all referred to each other, and each embodiment mainly describes differences from other embodiments. In particular, for a system or system embodiment, since it is substantially similar to a method embodiment, the description is relatively simple, with reference to the description of the method embodiment being made in part.
The systems and system embodiments described above are merely illustrative, wherein the elements illustrated as separate elements may or may not be physically separate, and the elements shown as elements may or may not be physical elements, may be located in one place, or may be distributed over a plurality of network elements. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment. Those of ordinary skill in the art will understand and implement the present application without undue burden.
Those of skill would further appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that the various illustrative elements and steps are described above generally in terms of functionality in order to clearly illustrate the interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. A power frequency withstand voltage test loop, characterized in that the test loop comprises: the system comprises a first power frequency voltage source, first measuring equipment, a second power frequency voltage source, second measuring equipment, a high-altitude sample and an insulating platform;
the first power frequency voltage source is connected with the first measuring equipment in parallel, one common end of the parallel connection is connected with the high-voltage end of the high-altitude sample, and the other common end of the parallel connection is grounded;
the second power frequency voltage source is connected with the second measuring equipment in parallel, one common end of the parallel connection is connected with the shell of the high-altitude sample, and the other common end of the parallel connection is grounded;
the phase difference between the voltage generated by the first power frequency voltage source and the voltage generated by the second power frequency voltage source is 180 degrees;
the base of the high-altitude test sample is arranged on the top surface of the insulating platform, wherein the base of the high-altitude test sample and the top surface of the insulating platform are equipotential;
the grounding end of the insulating platform is grounded.
2. The test circuit of claim 1, wherein the first power frequency voltage source comprises: a first power frequency test transformer and a first resistor;
the grounding end of the first power frequency test transformer is grounded, and the high-voltage end of the first power frequency test transformer is connected with one end of the first resistor;
the other end of the first resistor is connected with the high-voltage end of the first measuring device and the high-voltage end of the high-altitude sample.
3. The test circuit of claim 1, wherein the first measurement device comprises: a first capacitive voltage divider and a first voltmeter;
the high-voltage end of the first capacitive voltage divider is connected with the high-voltage end of the first power frequency voltage source and the high-voltage end of the high-altitude sample, the grounding of the first capacitive voltage divider is grounded, and the low-voltage end of the first capacitive voltage divider is connected with one end of the first voltmeter;
the other end of the first voltmeter is grounded.
4. The test circuit of claim 1, wherein the second power frequency voltage source comprises: the second power frequency test transformer and the second resistor;
the grounding end of the second power frequency test transformer is grounded, and the high-voltage end of the second power frequency test transformer is connected with one end of the second resistor;
the other end of the second resistor is connected with the high-voltage end of the second measuring device and the shell of the high-altitude sample.
5. The test circuit of claim 1, wherein the second measurement device comprises: a second capacitive voltage divider and a second voltmeter;
the high-voltage end of the second capacitive voltage divider is connected with the high-voltage end of the second power frequency voltage source and the shell of the high-altitude sample, the grounding end of the second capacitive voltage divider is grounded, and the low-voltage end of the second capacitive voltage divider is connected with one end of the second voltmeter;
the other end of the second voltmeter is grounded.
6. The test circuit of claim 1, wherein the insulating platform comprises: the insulator support comprises a base support, a top platform, insulator struts and a voltage equalizing cover;
the bottom end of the insulator support is fixedly connected with one side outer surface of the base support, the top end of the insulator support is fixedly connected with one side outer surface of the top platform, the base support is the bottom of the insulating platform, the top platform is the top of the insulating platform, the insulator support is used for supporting the top platform, and the other side outer surface of the top platform is used for placing the high-altitude test sample;
the voltage equalizing cover surrounds the top of the insulator support column and the fixed connection part of the top platform, and the peripheral edge of the top platform, and is used for enabling electric fields around the top platform to be uniformly distributed.
7. The power frequency withstand voltage test method is characterized by comprising the following steps of:
when a test instruction is received, a voltage application task and a voltage detection task are executed in parallel, wherein the test instruction at least comprises test voltage and test duration, the voltage application task indicates that voltages are respectively applied to two sides of a test sample so that voltage values of the two sides of the test sample respectively reach first voltage and second voltage, the first voltage and the second voltage are kept unchanged until the duration is equal to the test duration, the pressing is stopped, the sum of the first voltage and the second voltage is equal to the test voltage, and the voltage detection task indicates that the voltage values of the two sides of the test sample are detected;
and if the voltage value detected by the voltage detection task in real time is not zero during the execution of the voltage application task, determining that the test sample meets the requirement of the power frequency withstand voltage test.
8. The method of claim 7, wherein the concurrently executing the apply voltage task and the voltage detect task when the test instruction is received comprises:
when a test instruction is received, a first power frequency voltage source is controlled to apply voltage to one side of a test sample, so that the voltage value applied to one side of the test sample reaches the first voltage, and the voltage values of two sides of the test sample are detected in real time until the first power frequency voltage source stops applying voltage;
controlling a second power frequency voltage source to apply voltage to the other side of the test sample so that the voltage value applied to the other side of the test sample reaches a second voltage, wherein the first voltage and the second voltage are both smaller than the rated power frequency tolerance voltage to the ground;
and when the duration of applying the second voltage to the other side of the test sample by the second power frequency voltage source is equal to the test duration, controlling the first power frequency voltage source and the second power frequency voltage source to stop pressing.
9. The method according to claim 8, wherein when receiving the test command, controlling the first power frequency voltage source to apply a voltage to the test sample side so that the voltage value applied to the test sample side reaches the first voltage, and detecting the voltage values of both sides of the test sample in real time until the first power frequency voltage source stops applying the voltage, comprises:
when a test instruction is received, a first power frequency voltage source is controlled to apply voltage to one side of a test sample and continuously boost the voltage, and voltage values of two sides of the test sample are detected in real time until the first power frequency voltage source stops applying the voltage;
and when the voltage value applied to the side of the test sample by the first power frequency voltage source reaches the preset duty ratio of the first voltage, boosting according to the preset speed until the voltage value applied to the side of the test sample by the first power frequency voltage source is equal to the first voltage.
10. The method of claim 8, wherein controlling the second power frequency voltage source to apply a voltage to the other side of the test specimen such that the voltage value applied to the other side of the test specimen reaches the second voltage, comprises:
controlling a second power frequency voltage source to apply voltage to the other side of the test sample and continuously boosting the voltage;
and when the voltage value applied to the other side of the test sample by the second power frequency voltage source reaches the preset duty ratio of the second voltage, boosting according to the preset speed until the voltage value applied to the other side of the test sample by the second power frequency voltage source is equal to the second voltage.
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