CN116504162A - Screen test jig and screen test equipment - Google Patents
Screen test jig and screen test equipment Download PDFInfo
- Publication number
- CN116504162A CN116504162A CN202310769820.6A CN202310769820A CN116504162A CN 116504162 A CN116504162 A CN 116504162A CN 202310769820 A CN202310769820 A CN 202310769820A CN 116504162 A CN116504162 A CN 116504162A
- Authority
- CN
- China
- Prior art keywords
- screen
- test
- pressure head
- detection module
- impedance detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 172
- 238000001514 detection method Methods 0.000 claims abstract description 63
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims abstract description 38
- 229910052709 silver Inorganic materials 0.000 claims abstract description 38
- 239000004332 silver Substances 0.000 claims abstract description 38
- 239000000523 sample Substances 0.000 claims abstract description 37
- 239000000084 colloidal system Substances 0.000 claims abstract description 35
- 238000003825 pressing Methods 0.000 claims abstract description 31
- 239000000758 substrate Substances 0.000 claims abstract description 22
- 229910052751 metal Inorganic materials 0.000 claims description 9
- 239000002184 metal Substances 0.000 claims description 9
- 238000000034 method Methods 0.000 abstract description 4
- 230000000694 effects Effects 0.000 abstract description 3
- 238000010586 diagram Methods 0.000 description 7
- 239000000853 adhesive Substances 0.000 description 5
- 230000001070 adhesive effect Effects 0.000 description 5
- 150000003071 polychlorinated biphenyls Chemical class 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 208000010727 head pressing Diseases 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000008707 rearrangement Effects 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The embodiment of the invention discloses a screen test jig and screen test equipment, wherein the screen test jig comprises at least one test unit and a jig substrate; each test unit comprises a pressure head, an internal impedance detection module, a silver colloid impedance detection module and a lighting test module. According to the method, the plurality of probes are arranged on the internal impedance detection module, the silver colloid impedance detection module and the lighting test module, the arrangement sequence of the probes is consistent with the arrangement sequence of the corresponding test terminals on the screen to be tested, and the press head is used for pressing down the screen to be tested, so that the internal impedance detection module, the silver colloid impedance detection module and the plurality of probes on the lighting test module are in press connection with the corresponding test terminals on the screen to be tested to complete corresponding tests. The screen test fixture solves the technical problems that the screen test fixture in the prior art can only detect single parameters of the screen and cannot be compatible with a plurality of test functions, and achieves the technical effect that one test fixture can detect a plurality of parameters simultaneously.
Description
Technical Field
The embodiment of the invention relates to the technical field of screen detection, in particular to a screen test jig and screen test equipment.
Background
At present, screens in the market have various sizes, such as a mobile phone screen, a notebook screen, a television screen and the like, but the current jig for testing the screens can only detect a single parameter of a screen with a certain size, and cannot be compatible with a plurality of test functions.
Disclosure of Invention
The embodiment of the invention provides a screen test jig and screen test equipment, which solve the technical problems that the screen test jig in the prior art can only detect single parameters of a screen and cannot be compatible with a plurality of test functions.
The embodiment of the invention provides a screen test fixture, which comprises at least one test unit and a fixture substrate; at least one test unit is arranged on the jig substrate, and one test unit is used for testing one screen to be tested;
each test unit comprises a pressure head, an internal impedance detection module, a silver colloid impedance detection module and a lighting test module;
the internal impedance detection module, the silver colloid impedance detection module and the lighting test module are arranged on the lower surface of the pressure head;
the internal impedance detection module, the silver colloid impedance detection module and the lighting test module are all provided with a plurality of probes, and the arrangement sequence of the probes is consistent with the arrangement sequence of corresponding test terminals on the screen to be tested;
the pressure head is used for pressing down the screen to be tested, so that the internal impedance detection module, the silver colloid impedance detection module and the probes on the lighting test module are in pressure connection with corresponding test terminals on the screen to be tested, and internal impedance test, silver colloid impedance test and lighting test of the screen to be tested are completed.
Further, the internal impedance detection module, the silver colloid impedance detection module and the probes on the lighting test module are all double-ended probes.
Further, each test unit further comprises two screen moving tracks and two pressure head moving tracks;
the two screen moving rails are respectively arranged below the two sides of the pressure head and are respectively arranged in parallel to the two sides of the pressure head, and the screen to be tested moves to the lower part of the pressure head by utilizing the screen moving rails;
the two pressure head moving rails are respectively arranged at two side edges of the pressure head, and the pressure head moves up and down along the direction vertical to the jig substrate through the pressure head moving rails.
Further, each test unit further comprises a plurality of first magnetic attraction structures, and the plurality of first magnetic attraction structures are respectively arranged at the two pressure head moving tracks;
the first magnetic structure is used for adsorbing and fixing the pressure head after the pressure head moves upwards.
Further, each test unit further comprises a plurality of second magnetic structures, and the second magnetic structures are arranged on the lower surface of the pressure head;
the second magnetic structure is used for adsorbing and fixing the pressure head after the pressure head moves downwards.
Further, the ram includes a gripping structure; the holding structure is arranged on the upper surface of the pressure head.
Further, the test unit further comprises a pressure head limiting block; the pressure head limiting block is arranged at the joint of the pressure head moving track and the jig substrate.
Further, the test unit further comprises a dowel hole; the positioning pin hole is arranged on the lower surface of the pressure head; the locating pin holes are arranged corresponding to the locating columns on the jig substrate.
Further, the silver colloid impedance detection module comprises conductive colloid and a metal sheet, wherein the metal sheet is connected to the conductive colloid by utilizing a self-locking screw.
The embodiment of the invention also provides screen test equipment, which comprises the screen test jig according to any embodiment, and a signal generator; and the signal generator sends a test signal to a screen to be tested through the screen test jig.
The embodiment of the invention discloses a screen test jig and screen test equipment, wherein the screen test jig comprises at least one test unit and a jig substrate; each test unit comprises a pressure head, an internal impedance detection module, a silver colloid impedance detection module and a lighting test module. According to the method, the plurality of probes are arranged on the internal impedance detection module, the silver colloid impedance detection module and the lighting test module, the arrangement sequence of the probes is consistent with the arrangement sequence of the corresponding test terminals on the screen to be tested, and the press head is used for pressing down the screen to be tested, so that the internal impedance detection module, the silver colloid impedance detection module and the plurality of probes on the lighting test module are in press connection with the corresponding test terminals on the screen to be tested to complete corresponding tests. The screen test fixture solves the technical problems that the screen test fixture in the prior art can only detect single parameters of the screen and cannot be compatible with a plurality of test functions, and achieves the technical effect that one test fixture can detect a plurality of parameters simultaneously.
Drawings
Fig. 1 is a top view of a screen test fixture according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of the lower surface of a test unit provided by an embodiment of the present invention;
fig. 3 is a front view of a screen test fixture according to an embodiment of the present invention;
FIG. 4 is a block diagram of a ram down condition provided by an embodiment of the present invention;
fig. 5 is a block diagram of a ram up state according to an embodiment of the present invention.
Detailed Description
The invention is described in further detail below with reference to the drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting thereof. It should be further noted that, for convenience of description, only some, but not all of the structures related to the present invention are shown in the drawings.
It should be noted that the terms "first," "second," and the like in the description and the claims of the present invention and in the drawings are used for distinguishing between different objects and not for limiting a particular order. The following embodiments of the present invention may be implemented individually or in combination with each other, and the embodiments of the present invention are not limited thereto.
Fig. 1 is a top view of a screen test fixture according to an embodiment of the present invention. Fig. 2 is a schematic diagram of a lower surface of a test unit according to an embodiment of the present invention.
As shown in fig. 1, the screen test fixture includes at least one test unit 10 and a fixture substrate 20; a block diagram of a screen test fixture provided with two test units 10 is exemplarily shown in fig. 1. Referring to fig. 1, at least one test unit 10 is disposed on a fixture substrate 20, and one test unit 10 is used for testing a screen 30 to be tested; each test unit 10 comprises a pressure head 11, an internal impedance detection module 12, a silver paste impedance detection module 13 and a lighting test module 14; the internal impedance detection module 12, the silver paste impedance detection module 13 and the lighting test module 14 are arranged on the lower surface of the pressure head 11, as shown in fig. 2; the internal impedance detection module 12, the silver colloid impedance detection module 13 and the lighting test module 14 are respectively provided with a plurality of probes 15, and the arrangement sequence of the probes 15 is consistent with the arrangement sequence of corresponding test terminals on the screen 30 to be tested.
The pressing head 11 is used for pressing down the screen 30 to be tested, so that the internal impedance detection module 12, the silver colloid impedance detection module 13 and the probes 15 on the lighting test module 14 are pressed against corresponding test terminals on the screen 30 to be tested, and internal impedance test, silver colloid impedance test and lighting test of the screen 30 to be tested are completed.
Specifically, for different screens 30 to be tested, the arrangement order of the test terminals on different PCBs is different, that is, the arrangement positions of the golden fingers on the different PCBs are different, so the arrangement order of the probes 15 on the lighting test module 14 is correspondingly set according to the different screens 30 to be tested. Further, the lighting test module 14 may be configured to be pluggable or replaceable to accommodate lighting tests of different types of screens 30 under test. In the embodiment of the invention, the screen test jig can be compatible with the test of a 5-16.2 inch screen, and the three-in-one combined test and the compatibility of multiple sizes are realized, so that the test on the screen and the maintenance on the jig are more convenient and quick, the investment of labor cost is reduced, and the jig can be maximally used in production.
Fig. 3 is a front view of a screen test fixture according to an embodiment of the present invention. As shown in fig. 3, the indenter 11 in the test unit 10 on the left side is in a raised state, and the indenter 11 in the test unit 10 on the right side is in a depressed state. After the screen 30 to be tested enters the lower part of the pressure head 11, the pressure head 11 is pressed down, so that the internal impedance detection module 12, the silver colloid impedance detection module 13 and the probes 15 on the lighting test module 14 are pressed on corresponding detection terminals of the screen 30 to be tested, and the internal impedance test, the silver colloid impedance test and the lighting test of the screen 30 to be tested are completed.
Specifically, after the probe 15 on the internal impedance detection module 12 is crimped on the internal impedance detection terminal on the screen 30 to be detected, a loop is formed between the probe 15 and the detection terminal, the internal impedance detection module 12 can return the detected impedance value of the screen 30 to be detected to the receiver of the screen test fixture, the receiver transmits the data to an upper computer, or directly transmits the detected impedance value to the upper computer connected with the screen test fixture, an internal impedance threshold value specified by a product is stored in the upper computer in advance, the internal impedance threshold value is compared with a pre-stored internal impedance threshold value after the detected impedance value is received, and if the internal impedance threshold value is not met, an alarm prompt is sent. Similarly, the same principle is adopted for testing the silver colloid impedance by using the silver colloid impedance detection terminal of the probe 15 on the silver colloid impedance detection module 13 to be pressed on the screen 30 to be tested, and the description is omitted here.
After the probe 15 on the lighting test module 14 is pressed onto the lighting detection terminal on the screen 30 to be tested, the signal generator sends a test signal to the screen 30 to be tested through the probe 15, so that the screen 30 to be tested is lighted, and lighting test of the screen 30 to be tested is completed.
According to the method, the plurality of probes are arranged on the internal impedance detection module, the silver colloid impedance detection module and the lighting test module, the arrangement sequence of the probes is consistent with the arrangement sequence of the corresponding test terminals on the screen to be tested, and the press head is used for pressing down the screen to be tested, so that the internal impedance detection module, the silver colloid impedance detection module and the plurality of probes on the lighting test module are in press connection with the corresponding test terminals on the screen to be tested to complete corresponding tests. The screen test fixture solves the technical problems that the screen test fixture in the prior art can only detect single parameters of the screen and cannot be compatible with a plurality of test functions, and achieves the technical effect that one test fixture can detect a plurality of parameters simultaneously.
Optionally, the internal impedance detection module 12, the silver paste impedance detection module 13, and the probes 15 on the lighting test module 14 are all double-ended probes.
Specifically, most of traditional testing uses are BGA (Ball Grid Array) single-point probes, because silver colloid impedance detection terminals are small, the length and width of general terminals are only 0.65mm, when the BGA probes are pressed down to the silver colloid impedance detection terminals of the screen 30 to be tested, product lines pressed to the screen 30 to be tested sometimes can be scratched or crushed due to the problem of precision limitation, so that the application adopts thinner double-end probes, and the total length of the body of each double-end probe, the type of a needle head, the diameter of an outer tube, the working stroke, the resistance and the like need to be selected according to the impedance requirements of the point positions of the detection terminals.
Fig. 4 is a block diagram of a pressing head pressing state according to an embodiment of the present invention. Fig. 5 is a block diagram of a ram up state according to an embodiment of the present invention.
Optionally, as shown in fig. 4 and 5, each test unit 10 further includes two screen movement rails 16 and two indenter movement rails 17; the two screen moving rails 16 are respectively arranged below the two side edges of the pressing head 11 and are respectively arranged in parallel to the two side edges of the pressing head 11, and the screen 30 to be tested is moved to the lower part of the pressing head 11 by utilizing the screen moving rails 16; the two ram moving rails 17 are respectively disposed at two sides of the ram 11, and the ram 11 moves up and down along a direction perpendicular to the jig substrate 20 through the ram moving rails 17.
Specifically, as shown in fig. 1 and 4, after the screen 30 to be tested is placed at a preset position on the jig substrate 20, the screen 30 to be tested is moved from the preset position to the position right under the indenter 11 through the screen moving rail 16, and after the screen 30 to be tested is moved in place, the indenter 11 is pressed down along the indenter moving rail 17, so that the internal impedance detecting module 12, the silver paste impedance detecting module 13, and the probes 15 on the lighting test module 14 provided on the lower surface of the indenter 11 can be press-bonded with the screen 30 to be tested.
Optionally, as shown in fig. 4 and 5, each test unit 10 further includes a plurality of first magnetic attraction structures 18, where the plurality of first magnetic attraction structures 18 are respectively disposed at the two ram moving tracks 17; the first magnetic attraction structure 18 is used for carrying out adsorption fixation on the pressure head 11 after the pressure head 11 moves upwards.
Specifically, a plurality of first magnetic attraction structures 18 are further disposed at the ram moving rail 17, and the first magnetic attraction structures 18 have an attraction function, typically magnets. After the screen 30 to be tested is tested, the pressing head 11 moves upwards along the pressing head moving rail 17, and when the screen is moved in place, the first magnetic attraction structure 18 can adsorb the pressing head 11, so that the screen is not easy to fall down, and the screen 30 to be tested is protected from being scratched by the probe 15 below the pressing head 11 when the screen is slid out of the lower part of the pressing head 11 along the screen moving rail 16.
Optionally, as shown in fig. 2 and 5, each test unit 10 further includes a plurality of second magnetic attraction structures 19, where the plurality of second magnetic attraction structures 19 are disposed on the lower surface of the pressure head 11; the second magnetic attraction structure 19 is used for carrying out attraction fixation on the pressing head 11 after the pressing head 11 moves downwards.
Specifically, a plurality of second magnetic attraction structures 19 are further disposed on the lower surface of the pressing head 11, and the second magnetic attraction structures 19 have an attraction function, typically magnets. When the screen 30 to be tested slides into the lower part of the press head 11, the press head 11 moves downwards along the press head moving track 17, after the press connection with the screen 30 to be tested is completed, the press head 11 and the jig substrate 20 are adsorbed by the second magnetic attraction structure 19, so that the press head 11 and the screen 30 to be tested are fully pressed, the test result cannot be influenced by upward loosening in the test process, and correspondingly, the position on the jig substrate 20 corresponding to the second magnetic attraction structure 19 is provided with a magnetic attraction structure which can attract the second magnetic attraction structure 19, and the details are omitted.
Alternatively, as shown in fig. 3, 4 and 5, the ram 11 includes a gripping structure 110; the holding structure 110 is disposed on the upper surface of the pressing head 11.
Specifically, the tester can move the indenter 11 up and down by holding the structure 110.
Optionally, as shown in fig. 5, the test unit 10 further includes a ram stopper 40; the ram limiting block 40 is disposed at the connection between the ram moving rail 17 and the jig substrate 20.
Specifically, in order to enable the screen 30 to be tested to move in place when moving below the pressing head 11, the connection part of the pressing head moving rail 17 and the jig substrate 20 is further provided with a pressing head limiting block 40, and the pressing head limiting block 40 is an L-shaped positioning stop block, so that whether the screen 30 to be tested slides in place can be conveniently and directly known when sliding into the lower part of the pressing head 11.
Optionally, as shown in fig. 2, the test unit 10 further comprises dowel holes 50; the positioning pin hole 50 is arranged on the lower surface of the pressure head 11; the positioning pin holes 50 are arranged corresponding to the positioning posts on the jig substrate 20.
Specifically, in order to enable the pressing head 11 to move in place accurately when pressing down the screen 30 to be tested without shifting the pressing head moving rail 17, a positioning pin hole 50 is further provided on the lower surface of the pressing head 11, and when the pressing head 11 moves down, whether the pressing head 11 is pressed down in place can be judged by inserting between the positioning pin hole 50 and a positioning column on the jig substrate 20.
Optionally, the silver colloid impedance detection module 13 includes a conductive colloid and a metal sheet, and the metal sheet is connected to the conductive colloid by using a self-locking screw.
Specifically, the conducting surface of the conductive adhesive can be increased by connecting the metal sheet with the conductive adhesive, the problem that the conducting surface of the silver adhesive point is smaller when the pressure head 11 is pressed down is solved, and the self-locking screw is used for connecting the metal sheet on the conductive adhesive, so that the conductive adhesive can be prevented from falling off. In general, the metal sheet may be a copper sheet with better conductivity.
The embodiment of the invention also provides screen test equipment, which comprises the screen test jig in any embodiment, and a signal generator; the signal generator sends a test signal to the screen to be tested through the screen test jig.
The screen test device provided by the embodiment of the present invention includes the screen test fixture in the above embodiment, so the screen test device provided by the embodiment of the present invention also has the beneficial effects described in the above embodiment, and will not be described herein again.
In the description of embodiments of the present invention, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art.
Finally, it should be noted that the foregoing description is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, while the invention has been described in connection with the above embodiments, the invention is not limited to the embodiments, but may be embodied in many other equivalent forms without departing from the spirit or scope of the invention, which is set forth in the following claims.
Claims (10)
1. The screen test fixture is characterized by comprising at least one test unit (10) and a fixture substrate (20); at least one test unit (10) is arranged on the jig substrate (20), and one test unit (10) is used for testing one screen (30) to be tested correspondingly;
each test unit (10) comprises a pressure head (11), an internal impedance detection module (12), a silver colloid impedance detection module (13) and a lighting test module (14);
the internal impedance detection module (12), the silver colloid impedance detection module (13) and the lighting test module (14) are arranged on the lower surface of the pressure head (11);
the internal impedance detection module (12), the silver colloid impedance detection module (13) and the lighting test module (14) are respectively provided with a plurality of probes (15), and the arrangement sequence of the probes (15) is consistent with the arrangement sequence of corresponding test terminals on the screen (30) to be tested;
the pressure head (11) is used for pressing down the screen (30) to be tested, so that the internal impedance detection module (12), the silver colloid impedance detection module (13) and the probes (15) on the lighting test module (14) are in pressure connection with corresponding test terminals on the screen (30) to be tested, and internal impedance test, silver colloid impedance test and lighting test of the screen (30) to be tested are completed.
2. The screen test jig of claim 1 wherein the probes (15) on the internal impedance detection module (12), the silver paste impedance detection module (13) and the lighting test module (14) are all double-ended probes.
3. The screen test jig according to claim 1, wherein each of the test units (10) further comprises two screen movement rails (16) and two indenter movement rails (17);
the two screen moving rails (16) are respectively arranged below two side edges of the pressure head (11) and are respectively arranged in parallel on two side edges of the pressure head (11), and the screen (30) to be tested moves to the lower part of the pressure head (11) by utilizing the screen moving rails (16);
the two pressure head moving rails (17) are respectively arranged at two side edges of the pressure head (11), and the pressure head (11) moves up and down along the direction perpendicular to the jig substrate (20) through the pressure head moving rails (17).
4. A screen test fixture according to claim 3, wherein each test unit (10) further comprises a plurality of first magnetic attraction structures (18), and the plurality of first magnetic attraction structures (18) are respectively arranged at two pressure head moving tracks (17);
the first magnetic structure (18) is used for adsorbing and fixing the pressure head (11) after the pressure head (11) moves upwards.
5. A screen test jig according to claim 3, wherein each of the test units (10) further comprises a plurality of second magnetic structures (19), the plurality of second magnetic structures (19) being provided on the lower surface of the indenter (11);
the second magnetic structure (19) is used for adsorbing and fixing the pressure head (11) after the pressure head (11) moves downwards.
6. A screen test jig according to claim 3, wherein the ram (11) comprises a gripping structure (110); the holding structure (110) is arranged on the upper surface of the pressure head (11).
7. A screen test fixture according to claim 3, characterized in that the test unit (10) further comprises a ram stopper (40); the pressure head limiting block (40) is arranged at the joint of the pressure head moving track (17) and the jig substrate (20).
8. A screen test fixture according to claim 3, characterized in that the test unit (10) further comprises dowel holes (50); the positioning pin hole (50) is arranged on the lower surface of the pressure head (11); the positioning pin holes (50) are arranged corresponding to positioning columns on the jig substrate (20).
9. The screen test jig according to claim 1, wherein the silver paste impedance detection module (13) comprises a conductive paste and a metal sheet, and the metal sheet is connected to the conductive paste by a self-locking screw.
10. A screen testing apparatus, characterized in that the screen testing apparatus comprises the screen testing jig of any one of the preceding claims 1 to 9, the screen testing apparatus further comprising a signal generator; and the signal generator sends a test signal to a screen to be tested through the screen test jig.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310769820.6A CN116504162B (en) | 2023-06-28 | 2023-06-28 | Screen test jig and screen test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310769820.6A CN116504162B (en) | 2023-06-28 | 2023-06-28 | Screen test jig and screen test equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN116504162A true CN116504162A (en) | 2023-07-28 |
| CN116504162B CN116504162B (en) | 2023-09-15 |
Family
ID=87328787
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310769820.6A Active CN116504162B (en) | 2023-06-28 | 2023-06-28 | Screen test jig and screen test equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116504162B (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2972176B1 (en) * | 1998-02-26 | 1999-11-08 | ブレン・チャイルド株式会社 | Board inspection equipment |
| CN204463780U (en) * | 2015-02-06 | 2015-07-08 | 昆山龙腾光电有限公司 | Short bar tool |
| CN109830198A (en) * | 2019-04-09 | 2019-05-31 | 苏州精濑光电有限公司 | A kind of impedance detection device |
| CN110174534A (en) * | 2019-06-14 | 2019-08-27 | 苏州精濑光电有限公司 | A kind of testing pressure head |
| CN214845399U (en) * | 2021-06-03 | 2021-11-23 | 合肥美铭电子科技有限公司 | Vertical downward-pressing type screen test fixture |
| CN214953789U (en) * | 2021-06-24 | 2021-11-30 | 东莞市德普特电子有限公司 | Soft contact silver glue impedance test fixture |
-
2023
- 2023-06-28 CN CN202310769820.6A patent/CN116504162B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2972176B1 (en) * | 1998-02-26 | 1999-11-08 | ブレン・チャイルド株式会社 | Board inspection equipment |
| CN204463780U (en) * | 2015-02-06 | 2015-07-08 | 昆山龙腾光电有限公司 | Short bar tool |
| CN109830198A (en) * | 2019-04-09 | 2019-05-31 | 苏州精濑光电有限公司 | A kind of impedance detection device |
| CN110174534A (en) * | 2019-06-14 | 2019-08-27 | 苏州精濑光电有限公司 | A kind of testing pressure head |
| CN214845399U (en) * | 2021-06-03 | 2021-11-23 | 合肥美铭电子科技有限公司 | Vertical downward-pressing type screen test fixture |
| CN214953789U (en) * | 2021-06-24 | 2021-11-30 | 东莞市德普特电子有限公司 | Soft contact silver glue impedance test fixture |
Also Published As
| Publication number | Publication date |
|---|---|
| CN116504162B (en) | 2023-09-15 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4463310A (en) | Apparatus for detecting the presence of components on a printed circuit board | |
| US6414502B1 (en) | Loaded-board, guided-probe test fixture | |
| KR101338332B1 (en) | Bbt jig for fpcb inspection | |
| CN104614610A (en) | Modular needle bed fixture for testing PCBA | |
| CN106405274B (en) | Electronic element aging testing device | |
| CN105353219A (en) | Step resistor detection system for battery module | |
| US6191601B1 (en) | Test fixture for matched impedance testing | |
| CN206270464U (en) | A kind of FPC touch screen base plate Open Short test devices | |
| CN2795865Y (en) | Composite printed circuit board test device | |
| CN116504162B (en) | Screen test jig and screen test equipment | |
| CN202710618U (en) | Electric performance test fixture for one-driving-two circuit board | |
| CN207473048U (en) | A kind of Combined circuit board test device | |
| CN107782928A (en) | A kind of B2B connector testing devices | |
| CN108469583B (en) | ICT tester | |
| CN216526160U (en) | Simple PCB detection jig with wide detection range | |
| US20060139045A1 (en) | Device and method for testing unpackaged semiconductor die | |
| CN107505561A (en) | A kind of detection instrument of stamp hole pcb board | |
| CN212965292U (en) | Portable plug testing device | |
| CN106771831B (en) | Automatic detection mechanism for connectors with multiple pin heights | |
| CN108169659B (en) | Circuit board module detection tool | |
| CN201867430U (en) | Positioning structure of test bench | |
| CN219302559U (en) | PCB insulation resistance test rack | |
| CN101430354B (en) | Test method and apparatus for pin element | |
| CN220251995U (en) | False piezoelectric measuring clamp for touch screen | |
| JPH10197559A (en) | Test head with switch probe |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |