CN116457321B - 接合体、陶瓷铜电路基板及半导体装置 - Google Patents

接合体、陶瓷铜电路基板及半导体装置 Download PDF

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Publication number
CN116457321B
CN116457321B CN202180072058.5A CN202180072058A CN116457321B CN 116457321 B CN116457321 B CN 116457321B CN 202180072058 A CN202180072058 A CN 202180072058A CN 116457321 B CN116457321 B CN 116457321B
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copper plate
concentration
bonding layer
copper
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CN116457321A (zh
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米津麻纪
末永诚一
藤泽幸子
佐野孝
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Special Ceramic Materials Co ltd
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Toshiba Corp
Toshiba Materials Co Ltd
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W40/00Arrangements for thermal protection or thermal control
    • H10W40/20Arrangements for cooling
    • H10W40/25Arrangements for cooling characterised by their materials
    • H10W40/255Arrangements for cooling characterised by their materials having a laminate or multilayered structure, e.g. direct bond copper [DBC] ceramic substrates
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    • C04B37/00Joining burned ceramic articles with other burned ceramic articles or other articles by heating
    • C04B37/02Joining burned ceramic articles with other burned ceramic articles or other articles by heating with metallic articles
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    • C04B37/00Joining burned ceramic articles with other burned ceramic articles or other articles by heating
    • C04B37/02Joining burned ceramic articles with other burned ceramic articles or other articles by heating with metallic articles
    • C04B37/023Joining burned ceramic articles with other burned ceramic articles or other articles by heating with metallic articles characterised by the interlayer used
    • C04B37/026Joining burned ceramic articles with other burned ceramic articles or other articles by heating with metallic articles characterised by the interlayer used consisting of metals or metal salts
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0306Inorganic insulating substrates, e.g. ceramic, glass
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/09Use of materials for the conductive, e.g. metallic pattern
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/67Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
    • H10W70/69Insulating materials thereof
    • H10W70/692Ceramics or glasses
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    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/02Composition of constituents of the starting material or of secondary phases of the final product
    • C04B2235/50Constituents or additives of the starting mixture chosen for their shape or used because of their shape or their physical appearance
    • C04B2235/54Particle size related information
    • C04B2235/5418Particle size related information expressed by the size of the particles or aggregates thereof
    • C04B2235/5436Particle size related information expressed by the size of the particles or aggregates thereof micrometer sized, i.e. from 1 to 100 micron
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    • C04B2235/656Aspects relating to heat treatments of ceramic bodies such as green ceramics or pre-sintered ceramics, e.g. burning, sintering or melting processes characterised by specific heating conditions during heat treatment
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    • C04B2235/658Atmosphere during thermal treatment
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    • C04B2235/78Grain sizes and shapes, product microstructures, e.g. acicular grains, equiaxed grains, platelet-structures
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    • C04B2237/12Metallic interlayers
    • C04B2237/126Metallic interlayers wherein the active component for bonding is not the largest fraction of the interlayer
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    • C04B2237/30Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/388Improvement of the adhesion between the insulating substrate and the metal by the use of a metallic or inorganic thin film adhesion layer

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Ceramic Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Materials Engineering (AREA)
  • Structural Engineering (AREA)
  • Organic Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Ceramic Products (AREA)
CN202180072058.5A 2020-10-22 2021-10-20 接合体、陶瓷铜电路基板及半导体装置 Active CN116457321B (zh)

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JP2020177286 2020-10-22
JP2020-177286 2020-10-22
PCT/JP2021/038712 WO2022085711A1 (ja) 2020-10-22 2021-10-20 接合体、セラミックス銅回路基板、および半導体装置

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CN116457321B true CN116457321B (zh) 2024-08-06

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US (1) US20230260868A1 (https=)
EP (1) EP4234518A4 (https=)
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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102655126A (zh) * 2011-03-01 2012-09-05 三菱综合材料株式会社 功率模块用基板及制法、自带散热器的该基板及功率模块
CN105189109A (zh) * 2013-03-14 2015-12-23 三菱综合材料株式会社 接合体、功率模块用基板及自带散热器的功率模块用基板

Family Cites Families (10)

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Publication number Priority date Publication date Assignee Title
EP0480038B1 (en) * 1990-04-16 1997-07-09 Denki Kagaku Kogyo Kabushiki Kaisha Ceramic circuit board
JPH0923060A (ja) * 1995-07-07 1997-01-21 Asahi Chem Ind Co Ltd 新規メタライズ基板
JP3714557B2 (ja) * 2003-04-21 2005-11-09 日立金属株式会社 セラミックス基板用ろう材及びこれを用いたセラミックス回路基板、パワー半導体モジュール
JP6430382B2 (ja) * 2013-08-08 2018-11-28 株式会社東芝 回路基板および半導体装置
EP3053899B1 (en) * 2013-09-30 2019-11-06 Mitsubishi Materials Corporation Cu/ceramic bonded body, method for manufacturing cu/ceramic bonded body, and power module substrate
JP6742073B2 (ja) * 2015-03-11 2020-08-19 デンカ株式会社 セラミックス回路基板
EP3398205B1 (en) * 2015-12-28 2019-10-30 NGK Insulators, Ltd. Bonded substrate and method for manufacturing bonded substrate
KR102129339B1 (ko) * 2016-06-10 2020-07-03 다나카 기킨조쿠 고교 가부시키가이샤 세라믹스 회로 기판, 및 세라믹스 회로 기판의 제조 방법
JP6642865B2 (ja) * 2016-06-16 2020-02-12 富士電機株式会社 はんだ接合部
JP6970738B2 (ja) * 2017-03-30 2021-11-24 株式会社東芝 セラミックス銅回路基板およびそれを用いた半導体装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102655126A (zh) * 2011-03-01 2012-09-05 三菱综合材料株式会社 功率模块用基板及制法、自带散热器的该基板及功率模块
CN105189109A (zh) * 2013-03-14 2015-12-23 三菱综合材料株式会社 接合体、功率模块用基板及自带散热器的功率模块用基板

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CN116457321A (zh) 2023-07-18
JP7524340B2 (ja) 2024-07-29
EP4234518A1 (en) 2023-08-30
WO2022085711A1 (ja) 2022-04-28
EP4234518A4 (en) 2024-10-09
JPWO2022085711A1 (https=) 2022-04-28
US20230260868A1 (en) 2023-08-17

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