CN116234661A - 用于cmp处理的基板搬运系统及方法 - Google Patents
用于cmp处理的基板搬运系统及方法 Download PDFInfo
- Publication number
- CN116234661A CN116234661A CN202180061781.3A CN202180061781A CN116234661A CN 116234661 A CN116234661 A CN 116234661A CN 202180061781 A CN202180061781 A CN 202180061781A CN 116234661 A CN116234661 A CN 116234661A
- Authority
- CN
- China
- Prior art keywords
- substrate
- end effector
- polishing
- axis
- transferring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B57/00—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
- B24B57/02—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B27/00—Other grinding machines or devices
- B24B27/0076—Other grinding machines or devices grinding machines comprising two or more grinding tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/10—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/10—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
- B24B37/102—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being able to rotate freely due to a frictional contact with the lapping tool
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/10—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
- B24B37/105—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/34—Accessories
- B24B37/345—Feeding, loading or unloading work specially adapted to lapping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J11/00—Manipulators not otherwise provided for
- B25J11/0095—Manipulators transporting wafers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J15/00—Gripping heads and other end effectors
- B25J15/06—Gripping heads and other end effectors with vacuum or magnetic holding means
- B25J15/0616—Gripping heads and other end effectors with vacuum or magnetic holding means with vacuum
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
- H10P90/12—Preparing bulk and homogeneous wafers
- H10P90/123—Preparing bulk and homogeneous wafers by grinding or lapping
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
- H10P90/12—Preparing bulk and homogeneous wafers
- H10P90/124—Preparing bulk and homogeneous wafers by processing the backside of the wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
- H10P90/12—Preparing bulk and homogeneous wafers
- H10P90/126—Preparing bulk and homogeneous wafers by chemical etching
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/005—Feeding or manipulating devices specially adapted to grinding machines
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B51/00—Arrangements for automatic control of a series of individual steps in grinding a workpiece
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
- H10P90/12—Preparing bulk and homogeneous wafers
- H10P90/129—Preparing bulk and homogeneous wafers by polishing
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Robotics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US202063075607P | 2020-09-08 | 2020-09-08 | |
| US63/075,607 | 2020-09-08 | ||
| PCT/US2021/046605 WO2022072079A2 (en) | 2020-09-08 | 2021-08-19 | Substrate handling systems and methods for cmp processing |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN116234661A true CN116234661A (zh) | 2023-06-06 |
Family
ID=80469432
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202180061781.3A Pending CN116234661A (zh) | 2020-09-08 | 2021-08-19 | 用于cmp处理的基板搬运系统及方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US12454036B2 (https=) |
| EP (1) | EP4210903A4 (https=) |
| JP (1) | JP7763244B2 (https=) |
| KR (1) | KR102759345B1 (https=) |
| CN (1) | CN116234661A (https=) |
| TW (2) | TWI875625B (https=) |
| WO (1) | WO2022072079A2 (https=) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114649245B (zh) * | 2022-05-19 | 2022-09-09 | 西安奕斯伟材料科技有限公司 | 一种用于承载和清洁硅片的装置 |
| US12539577B2 (en) * | 2022-10-03 | 2026-02-03 | Applied Materials, Inc. | System and method for detecting a membrane failure in a chemical mechanical polishing system |
| WO2024091617A1 (en) * | 2022-10-27 | 2024-05-02 | Berkshire Grey Operating Company, Inc. | Systems and methods for automated packaging and processing with object placement pose control |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1531747A (zh) * | 2001-03-14 | 2004-09-22 | ���̡�Ӧ�ò��Ϲɷ�����˾ | 以电化学机械研磨法进行基材平坦化 |
| TW200733221A (en) * | 2006-01-09 | 2007-09-01 | Applied Materials Inc | A method for adjusting substrate processing times in a substrate polishing system |
| TW200919572A (en) * | 2007-08-29 | 2009-05-01 | Applied Materials Inc | Method of soft pad preparation to reduce removal rate ramp-up effect and to stabilize defect rate |
| CN105051882A (zh) * | 2013-03-15 | 2015-11-11 | 应用材料公司 | 基板位置对准器 |
| US20160218030A1 (en) * | 2015-01-27 | 2016-07-28 | Lam Research Corporation | End effector for wafer transfer system and method of transferring wafers |
| CN211332378U (zh) * | 2020-06-16 | 2020-08-25 | 苏州市意可机电有限公司 | 具有机械手臂的自动上下料设备 |
Family Cites Families (52)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0319215A (ja) * | 1989-06-16 | 1991-01-28 | Shioya Seisakusho:Kk | 貼付装置 |
| US5738574A (en) | 1995-10-27 | 1998-04-14 | Applied Materials, Inc. | Continuous processing system for chemical mechanical polishing |
| US7097544B1 (en) * | 1995-10-27 | 2006-08-29 | Applied Materials Inc. | Chemical mechanical polishing system having multiple polishing stations and providing relative linear polishing motion |
| JP3894514B2 (ja) | 1997-04-04 | 2007-03-22 | 株式会社ディスコ | 研磨装置 |
| JP3271658B2 (ja) * | 1998-03-23 | 2002-04-02 | 信越半導体株式会社 | 半導体シリコン単結晶ウェーハのラップ又は研磨方法 |
| US6406359B1 (en) | 1999-06-01 | 2002-06-18 | Applied Materials, Inc. | Apparatus for transferring semiconductor substrates using an input module |
| US6361422B1 (en) | 1999-06-15 | 2002-03-26 | Applied Materials, Inc. | Method and apparatus for transferring semiconductor substrates using an input module |
| US6481951B1 (en) * | 1999-09-16 | 2002-11-19 | Applied Materials, Inc. | Multiple sided robot blade for semiconductor processing equipment |
| US6679755B1 (en) | 1999-12-09 | 2004-01-20 | Applied Materials Inc. | Chemical mechanical planarization system |
| WO2001064391A2 (en) | 2000-02-29 | 2001-09-07 | Applied Materials, Inc. | Planarization system with a wafer transfer corridor and multiple polishing modules |
| US6572730B1 (en) | 2000-03-31 | 2003-06-03 | Applied Materials, Inc. | System and method for chemical mechanical planarization |
| US6413145B1 (en) | 2000-04-05 | 2002-07-02 | Applied Materials, Inc. | System for polishing and cleaning substrates |
| US6413356B1 (en) | 2000-05-02 | 2002-07-02 | Applied Materials, Inc. | Substrate loader for a semiconductor processing system |
| US6435941B1 (en) | 2000-05-12 | 2002-08-20 | Appllied Materials, Inc. | Apparatus and method for chemical mechanical planarization |
| US7048607B1 (en) | 2000-05-31 | 2006-05-23 | Applied Materials | System and method for chemical mechanical planarization |
| US6645550B1 (en) | 2000-06-22 | 2003-11-11 | Applied Materials, Inc. | Method of treating a substrate |
| US7097534B1 (en) | 2000-07-10 | 2006-08-29 | Applied Materials, Inc. | Closed-loop control of a chemical mechanical polisher |
| US6561884B1 (en) | 2000-08-29 | 2003-05-13 | Applied Materials, Inc. | Web lift system for chemical mechanical planarization |
| US6613200B2 (en) | 2001-01-26 | 2003-09-02 | Applied Materials, Inc. | Electro-chemical plating with reduced thickness and integration with chemical mechanical polisher into a single platform |
| US6817923B2 (en) | 2001-05-24 | 2004-11-16 | Applied Materials, Inc. | Chemical mechanical processing system with mobile load cup |
| US6677239B2 (en) | 2001-08-24 | 2004-01-13 | Applied Materials Inc. | Methods and compositions for chemical mechanical polishing |
| US6811466B1 (en) | 2001-12-28 | 2004-11-02 | Applied Materials, Inc. | System and method for in-line metal profile measurement |
| US6939198B1 (en) | 2001-12-28 | 2005-09-06 | Applied Materials, Inc. | Polishing system with in-line and in-situ metrology |
| US20030224678A1 (en) | 2002-05-31 | 2003-12-04 | Applied Materials, Inc. | Web pad design for chemical mechanical polishing |
| US7265382B2 (en) | 2002-11-12 | 2007-09-04 | Applied Materials, Inc. | Method and apparatus employing integrated metrology for improved dielectric etch efficiency |
| US20050092620A1 (en) | 2003-10-01 | 2005-05-05 | Applied Materials, Inc. | Methods and apparatus for polishing a substrate |
| US7390744B2 (en) | 2004-01-29 | 2008-06-24 | Applied Materials, Inc. | Method and composition for polishing a substrate |
| US7433759B2 (en) | 2004-07-22 | 2008-10-07 | Applied Materials, Inc. | Apparatus and methods for positioning wafers |
| US7314808B2 (en) * | 2004-12-23 | 2008-01-01 | Applied Materials, Inc. | Method for sequencing substrates |
| CN101147233A (zh) | 2005-05-12 | 2008-03-19 | 应用材料股份有限公司 | 用于在清洁模块中垂直转移半导体基材的方法及设备 |
| US7198548B1 (en) | 2005-09-30 | 2007-04-03 | Applied Materials, Inc. | Polishing apparatus and method with direct load platen |
| JP2007158170A (ja) * | 2005-12-07 | 2007-06-21 | Ishikawajima Harima Heavy Ind Co Ltd | 搬送ロボット |
| US20070151866A1 (en) | 2006-01-05 | 2007-07-05 | Applied Materials, Inc. | Substrate polishing with surface pretreatment |
| US20080157455A1 (en) * | 2006-12-29 | 2008-07-03 | Applied Materials, Inc. | Compliant substrate holding assembly |
| US7840375B2 (en) | 2007-04-02 | 2010-11-23 | Applied Materials, Inc. | Methods and apparatus for generating a library of spectra |
| KR101413762B1 (ko) * | 2007-08-22 | 2014-07-01 | 위순임 | 기판 처리 시스템 |
| US20090061739A1 (en) * | 2007-09-05 | 2009-03-05 | Jeong In-Kwon | Polishing apparatus and method for polishing semiconductor wafers using load-unload stations |
| JP5307381B2 (ja) * | 2007-11-12 | 2013-10-02 | Hoya株式会社 | 半導体素子ならびに半導体素子製造法 |
| JP4732423B2 (ja) * | 2007-11-13 | 2011-07-27 | 株式会社デンソー | 炭化珪素半導体装置の製造方法 |
| US8322963B2 (en) | 2008-04-18 | 2012-12-04 | Applied Materials, Inc. | End effector for a cluster tool |
| WO2009131945A2 (en) | 2008-04-25 | 2009-10-29 | Applied Materials, Inc. | High throughput chemical mechanical polishing system |
| US20100041316A1 (en) | 2008-08-14 | 2010-02-18 | Yulin Wang | Method for an improved chemical mechanical polishing system |
| WO2011133386A2 (en) | 2010-04-20 | 2011-10-27 | Applied Materials, Inc. | Closed-loop control for improved polishing pad profiles |
| US8851816B2 (en) | 2011-04-07 | 2014-10-07 | Microtronic, Inc. | Apparatus, system, and methods for weighing and positioning wafers |
| US20120322345A1 (en) | 2011-06-17 | 2012-12-20 | Applied Materials, Inc. | Apparatus for chemical mechanical polishing |
| US20130115862A1 (en) | 2011-11-09 | 2013-05-09 | Applied Materials, Inc. | Chemical mechanical polishing platform architecture |
| DE102012013022A1 (de) * | 2012-06-29 | 2014-04-24 | Liebherr-Verzahntechnik Gmbh | Vorrichtung zur automatisierten Handhabung von Werkstücken |
| US9711381B2 (en) | 2013-01-31 | 2017-07-18 | Applied Materials, Inc. | Methods and apparatus for post-chemical mechanical planarization substrate cleaning |
| US10755960B2 (en) * | 2014-11-04 | 2020-08-25 | Brooks Automation, Inc. | Wafer aligner |
| JP6276317B2 (ja) * | 2016-03-31 | 2018-02-07 | 平田機工株式会社 | ハンドユニットおよび移載方法 |
| TW201812893A (zh) | 2016-08-26 | 2018-04-01 | 美商應用材料股份有限公司 | 具有以機器人存取卡匣的化學機械研磨工具 |
| US10651067B2 (en) * | 2017-01-26 | 2020-05-12 | Brooks Automation, Inc. | Method and apparatus for substrate transport apparatus position compensation |
-
2021
- 2021-08-19 JP JP2023512062A patent/JP7763244B2/ja active Active
- 2021-08-19 CN CN202180061781.3A patent/CN116234661A/zh active Pending
- 2021-08-19 KR KR1020237011710A patent/KR102759345B1/ko active Active
- 2021-08-19 EP EP21876184.9A patent/EP4210903A4/en active Pending
- 2021-08-19 US US17/407,062 patent/US12454036B2/en active Active
- 2021-08-19 WO PCT/US2021/046605 patent/WO2022072079A2/en not_active Ceased
- 2021-08-26 TW TW113124645A patent/TWI875625B/zh active
- 2021-08-26 TW TW110131615A patent/TWI849331B/zh active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1531747A (zh) * | 2001-03-14 | 2004-09-22 | ���̡�Ӧ�ò��Ϲɷ�����˾ | 以电化学机械研磨法进行基材平坦化 |
| TW200733221A (en) * | 2006-01-09 | 2007-09-01 | Applied Materials Inc | A method for adjusting substrate processing times in a substrate polishing system |
| TW200919572A (en) * | 2007-08-29 | 2009-05-01 | Applied Materials Inc | Method of soft pad preparation to reduce removal rate ramp-up effect and to stabilize defect rate |
| CN105051882A (zh) * | 2013-03-15 | 2015-11-11 | 应用材料公司 | 基板位置对准器 |
| US20160218030A1 (en) * | 2015-01-27 | 2016-07-28 | Lam Research Corporation | End effector for wafer transfer system and method of transferring wafers |
| CN211332378U (zh) * | 2020-06-16 | 2020-08-25 | 苏州市意可机电有限公司 | 具有机械手臂的自动上下料设备 |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI875625B (zh) | 2025-03-01 |
| US12454036B2 (en) | 2025-10-28 |
| JP7763244B2 (ja) | 2025-10-31 |
| JP2023540884A (ja) | 2023-09-27 |
| EP4210903A2 (en) | 2023-07-19 |
| TWI849331B (zh) | 2024-07-21 |
| TW202224849A (zh) | 2022-07-01 |
| KR102759345B1 (ko) | 2025-01-22 |
| WO2022072079A2 (en) | 2022-04-07 |
| TW202442373A (zh) | 2024-11-01 |
| US20220072682A1 (en) | 2022-03-10 |
| KR20230061535A (ko) | 2023-05-08 |
| EP4210903A4 (en) | 2024-10-16 |
| WO2022072079A3 (en) | 2022-07-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI678750B (zh) | 基板處理裝置及處理方法 | |
| TWI790319B (zh) | 基板處理系統及基板處理方法 | |
| JP6093328B2 (ja) | 基板処理システム、基板処理方法、プログラム及びコンピュータ記憶媒体 | |
| JP4838614B2 (ja) | 半導体基板の平坦化装置および平坦化方法 | |
| US12400892B2 (en) | High throughput polishing modules and modular polishing systems | |
| CN116234661A (zh) | 用于cmp处理的基板搬运系统及方法 | |
| TW201413857A (zh) | 工件搬送裝置 | |
| TW201442092A (zh) | 研磨裝置及研磨方法 | |
| KR101658250B1 (ko) | 기판 이면 연마 장치, 기판 이면 연마 시스템 및 기판 이면 연마 방법 및 기판 이면 연마 프로그램을 기록한 기록 매체 | |
| JP3775176B2 (ja) | 半導体ウェーハの製造方法及び製造装置 | |
| JP6013824B2 (ja) | ワーク搬送装置 | |
| WO2007026556A1 (ja) | 半導体ウエーハの鏡面研磨方法及び鏡面研磨システム | |
| JP2008036744A (ja) | 研磨装置 | |
| KR20070077979A (ko) | 화학적 기계적 연마 장치 및 이를 이용한 웨이퍼의 연마방법 | |
| CN100537134C (zh) | 研磨半导体晶圆的设备及方法 | |
| JP7690056B2 (ja) | 基板処理方法及び基板処理システム | |
| JP7788324B2 (ja) | 搬送装置 | |
| KR20070095702A (ko) | 기판 이송 장치 및 이를 구비하는 화학적 기계적 연마장치 | |
| US12046500B2 (en) | Transport apparatus and substrate processing apparatus | |
| US12622217B2 (en) | High throughput polishing modules and modular polishing systems | |
| JP2020104240A (ja) | 移載機及びベベル研磨装置 | |
| US20200101576A1 (en) | Platen assembly and method of assembling a platen assembly | |
| JP2025120540A (ja) | 研磨装置、及びSiCウェーハの研磨方法 | |
| CN118404505A (zh) | 研磨具的调整方法、基板处理方法及基板处理装置 | |
| WO2023009116A1 (en) | High throughput polishing modules and modular polishing systems |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |