CN116223524A - Automatic optical detection device for transistor - Google Patents

Abstract

The invention relates to an automatic optical detection device for a transistor, which comprises a feeding part, a transferring part and a detection part, wherein the feeding part is used for feeding the transistor; the feeding part is provided with a feeding station for clamping the material pipe by the transferring part, and the detecting part detects three surfaces to be detected of the transistor in the material pipe from the transparent first surface, the transparent second surface and the transparent third surface of the material pipe respectively; the transferring part comprises a translation mechanism, a rotation mechanism and a clamping mechanism; the clamping mechanism clamps a material pipe positioned at the feeding station, the translation mechanism drives the clamping mechanism to translate between the feeding part and the detection part, and the rotation mechanism drives the clamping mechanism to switch between a horizontal plane and a vertical plane; the translation mechanism is matched with the rotation mechanism to enable the first surface, the second surface and the third surface of the material pipe to be sequentially sent to the detection part. The translation mechanism is matched with the rotating mechanism, so that the first surface, the second surface and the third surface of the material pipe clamped by the clamping mechanism are sequentially and continuously sent to the detection part, the preparation time for detection is saved, and the working efficiency is improved.

Description

Automatic optical detection device for transistor

Technical Field

The invention relates to transistor defect detection equipment, in particular to an automatic optical detection device for a transistor.

Background

Automatic optical inspection (English is called Automated Optical Inspection, english is called AOI for short), and is a technology for detecting common defects of the appearance of a product based on an optical principle. The AOI equipment automatically scans the product through the camera, acquires images, compares the region to be detected on the product with qualified parameters in the database, inspects the defects of the product through image processing, and displays or marks the defects through a display or an automatic mark for repair by maintenance personnel.

When the transistor is detected by AOI technology, the end face and the front surface and the back surface of one end of the transistor with pins are required to detect defects. In the prior art, a transistor is clamped by a rotary clamping assembly and sequentially rotated twice, three surfaces to be detected are respectively sent to the same detection station, and the defect detection of the transistor is completed. Therefore, although automatic optical detection can be realized, the detected transistors are required to be sent to the blanking station each time, new transistors can be continuously grabbed, and the problem of low working efficiency exists.

Disclosure of Invention

Aiming at the problem of low working efficiency of the existing AOI equipment, the invention provides the transistor automatic optical detection device with high working efficiency.

The technical scheme of the invention is as follows: an automatic optical detection device for a transistor is used for detecting three surfaces to be detected of the transistor, and comprises a feeding part, a transferring part and a detecting part; wherein:

the feeding part is configured to store a plurality of stacked material pipes, transistors to be detected are arranged in the material pipes side by side, and the first surface, the second surface and the third surface of the material pipes are transparent and respectively opposite to three surfaces to be detected of the transistors in the material pipes;

the feeding part is provided with a feeding station for clamping the material pipe by the transferring part, and the detecting part is configured to detect three surfaces to be detected of transistors in the material pipe from the transparent first surface, the transparent second surface and the transparent third surface of the material pipe respectively;

the transferring part comprises a translation mechanism, a rotating mechanism and a clamping mechanism, wherein the clamping mechanism is arranged at the movable end of the rotating mechanism, and the rotating mechanism is arranged at the movable end of the translation mechanism; the clamping mechanism is configured to clamp a material pipe positioned at the feeding station, the translation mechanism is configured to drive the clamping mechanism to translate between the feeding part and the detection part, and the rotation mechanism is configured to drive the clamping mechanism to switch between a horizontal plane and a vertical plane;

the translation mechanism is matched with the rotation mechanism to enable the first surface, the second surface and the third surface of the material pipe to be sequentially sent to the detection part.

Through the configuration including translation mechanism, rotary mechanism and fixture's transfer portion, translation mechanism cooperatees with rotary mechanism, makes the first surface, second surface and the third surface continuity of the material pipe of fixture centre gripping be sent to detection portion in proper order to save the preparation time of detection, improved work efficiency.

Optionally, the detecting portion includes a first detecting component and a second detecting component, the first detecting component is used for detecting the first surface and the third surface of the material pipe respectively, and the second detecting component is used for detecting the second surface of the material pipe.

The detection part comprises two detection components, the first surface and the third surface of the material pipe at the same height position can be detected by the first detection component, the second surface of the material pipe at the other height position can be detected by the second detection component, the positions of the two detection components can be respectively adjusted and fixed before detection, and the detection time can be saved without readjustment during detection.

Optionally, the first surface of the material pipe is opposite to the third surface, the clamping mechanism comprises a first clamping component and a second clamping component which are installed at the movable end of the rotating mechanism in a back-to-back way, and the first clamping component and the second clamping component are respectively used for independently clamping one material pipe;

When the material pipe clamped by the first clamping component is detected on the third surface, the second clamping component clamps another material pipe from the feeding station;

when the third surface of the material pipe clamped by the second clamping component is detected, the first clamping component clamps another material pipe from the feeding station.

The clamping mechanism comprises two clamping assemblies, when the material pipe clamped by one clamping assembly is located at the detection station, the other clamping assembly clamps the other material pipe from the feeding station, so that synchronous feeding of the two material pipes is realized, and the working efficiency is improved.

Optionally, the automatic optical detection device for the transistor further comprises a marking part positioned at the back of the detection part, the marking part is configured to mark the surface of the material pipe corresponding to the unqualified transistor, and the marking part is provided with a transferring station for receiving the detected material pipe;

when the material pipe clamped by the first clamping component is detected on the first surface, the material pipe clamped by the second clamping component is positioned at a transferring station;

when the material pipe clamped by the second clamping component is detected on the first surface, the material pipe clamped by the first clamping component is positioned at a transferring station.

Through configuration marking part, can mark on the material pipe surface that unqualified transistor corresponds, be convenient for the follow-up processing of unqualified transistor.

Optionally, the first detection component and the second detection component are arranged above the translation path of the translation mechanism at intervals;

when the material pipe clamped by the first clamping component is translated below the first detecting component, the first detecting component detects the first surface or the third surface of the material pipe;

the rotary mechanism is used for driving the first clamping component to turn over 90 degrees, so that the second surface of the material pipe rotates to the lower side of the second detection component, and the second detection component is used for detecting the second surface of the material pipe.

Through setting up first detection subassembly and second detection subassembly in the interval, make the position of two detection subassemblies correspond with the centre gripping position of every centre gripping subassembly around the rotation respectively, the detection portion of being convenient for detects two adjacent surfaces of material pipe, namely first surface and second surface or second surface and third surface.

Optionally, the feeding part comprises a regulating component, a buffer component and a transferring component, wherein,

the buffer component is used for storing a plurality of stacked feed pipes;

the transfer component is used for taking out the material pipe from the buffer component and putting the material pipe into the normalization component;

the sizing component is used for receiving the material pipe and enabling the material pipe to be in a feeding station.

The buffer storage component temporarily stores the material pipe, so that the waiting time of the transfer component can be reduced, and the transfer efficiency of the transfer component can be improved; through the regular material pipe of regular subassembly, make the material pipe can be located the material loading position accurately, can avoid carrying the transportation error of subassembly, reduce the fault rate.

Optionally, the regulating assembly is provided with two bearing seats positioned at two sides of the feeding station, the two bearing seats are provided with positioning steps along a first side of the translation direction of the translation mechanism, and the two bearing seats are provided with ejector blocks capable of moving relative to the positioning steps along a second side of the translation direction of the translation mechanism;

the regular assembly further comprises a reference plate, a regular plate and a regular plate driving piece, wherein the reference plate and the regular plate are respectively positioned on the outer sides of the two bearing seats along the translation direction perpendicular to the translation mechanism, the regular plate is arranged on the regular plate driving piece, and the regular plate driving piece drives the regular plate to move relative to the reference plate.

Through location step and benchmark board as the benchmark, come regular material pipe through the removal of kicking block and regular board, make the material pipe fix a position on the horizontal plane, conveniently transport the department and snatch accurately.

Optionally, the marking part comprises a marking device group, a marking device translation module, a material pipe conveying line, a material supporting component and a lifting component;

the lifting component is arranged outside the material pipe conveying line, and the material supporting component is arranged above the material pipe conveying line; the material pipe conveying line is configured to receive and convey the material pipe conveyed from the transferring part, the transferring station is arranged at the feeding end of the material pipe conveying line, the lifting assembly is configured to lift the material pipe from the material pipe conveying line to the material supporting assembly, and the material supporting assembly is configured to support and position the material pipe;

The marker translation module is arranged above the material supporting component; the marker set is arranged at the movable end of the marker translation module, and the marker translation module is configured to drive the marker set to move above the material supporting component; the marking device group comprises a plurality of marking devices and marking device lifting pieces, the marking devices are arranged at the movable ends of the marking device lifting pieces, and the marking device lifting pieces drive the respective marking devices to lift and mark on the material pipe.

Lifting the material pipe from the material pipe conveying line to the material supporting assembly through the lifting assembly, moving the marker set to the position above the material supporting assembly through the marker translation module, and driving the marker to lift by the marker lifting piece so as to realize marking on the material pipe; when in marking, the material pipe can not deviate, and the normal marking of the marking device can be realized.

Optionally, the automatic optical detection device for transistors further comprises a material receiving part, wherein the material receiving part is arranged at a later station of the marking part and is configured to sort the collection material pipes according to the detection result of the detection part.

The material pipe after marking is classified and collected through the material receiving part, so that timely classification of the detected material pipe can be realized, and the working efficiency is improved.

Optionally, the material receiving part comprises an adsorption component, an adsorption component lifting piece, an adsorption component translation piece, a good material receiving box and an NG material receiving box;

The adsorption component is arranged at the movable end of the adsorption component lifting piece, and the adsorption component lifting piece is arranged at the movable end of the adsorption component translation piece; the adsorption component translation piece is configured to drive the adsorption component lifting piece to translate to the upper part of the good product receiving box or the NG product receiving box, and the adsorption component lifting piece is configured to drive the adsorption component to lift;

the adsorption component comprises a plurality of sucking disc groups and sucking disc group lifting members, and each sucking disc group is driven by the corresponding sucking disc group lifting member to lift.

Through the absorption material pipe of absorption subassembly, drive absorption subassembly through absorption subassembly elevating piece and absorption subassembly translation piece and remove to yields and receive workbin or NG article and receive the workbin top, then with the categorised collection of material pipe after the detection in corresponding receipts workbin, realize the categorised collection of material pipe.

Optionally, two ends of the length direction of the material pipe are respectively provided with a bolt for sealing the material pipe, two adjacent transistors in the material pipe are mutually abutted, and a first surface and a third surface of the material pipe are respectively and inwards formed with limiting protrusions, and the two limiting protrusions clamp the main body parts of the transistors.

The transistor can be reliably fixed in the material pipe through the limit bulge.

Optionally, the first detection assembly includes a plurality of first cameras spaced along the length of the tube, each first camera being configured to detect at least one transistor in the tube;

The second detection assembly comprises a plurality of second cameras which are arranged at intervals along the length direction of the material pipe, and each second camera is used for detecting at least one transistor in the material pipe.

Each detection component comprises a plurality of cameras, so that a plurality of transistors can be detected simultaneously, and the detection efficiency is improved.

Drawings

Fig. 1 is a schematic perspective view of a tube for carrying a transistor to be inspected in accordance with the present invention.

Fig. 2 is a schematic perspective view of an alternative embodiment of the present invention.

Fig. 3 is a schematic perspective view of the alignment assembly in the embodiment shown in fig. 2.

Fig. 4 is a schematic perspective view of a feeding portion in the embodiment shown in fig. 2.

Fig. 5 is a schematic perspective view of the loading portion shown in fig. 4, in which the transfer assembly is removed.

Fig. 6 is a schematic perspective view of a frame replacement assembly in the loading section shown in fig. 4.

Fig. 7 is a schematic perspective view of the assembled base and slide plate of fig. 6.

Fig. 8 is an enlarged view at a in fig. 7.

Fig. 9 is a schematic perspective view of the transfer portion in the embodiment shown in fig. 2.

Fig. 10 is a schematic perspective view of the relative positions of the alignment assembly, the transfer portion, the detection portion and the pipe transporting line 4 in the embodiment shown in fig. 2.

Fig. 11 is a front view of fig. 12.

Fig. 12 is a schematic perspective view of the marking portion in the embodiment shown in fig. 2.

FIG. 13 is a schematic perspective view of the marking portion shown in FIG. 12, wherein the marker set and the marker translation module are removed.

Fig. 14 is a schematic perspective view of a material receiving portion in the embodiment shown in fig. 2.

Fig. 1 to 14 include:

a transistor automated optical inspection device 1;

the feeding section 10, the feeding station 11, the regulating assembly 12, the carrier 121, the positioning step 122, the top block 123, the reference plate 124, the regulating plate 125, the regulating plate driver 126, the carrier cylinder 127, the top block cylinder 128, the top block slide rail 129, the buffer assembly 13, the buffer frame 131, the fixed plate 132, the fixed plate translation section 133, the partition 134, the fixed plate lifting section 135, the guide assembly 136, the transfer assembly 14, the transfer translation section 141, the adsorption lifting section 142, the adsorption section 143, the adsorption mounting plate 144, the adsorption member 145, the frame replacement assembly 15, the base 151, the slide plate 152, the slide rail 153, the positioning wheel 154, the positioning assembly 155, the insert block 156, the socket 157, the steel ball 158, the spring 159, the lifting assembly 16, the lifting plate 161, and the lifting plate lifting section 162;

transfer section 20, translation mechanism 21, rotation mechanism 22, transfer plate 221, spindle 222, bearing block 223, spindle drive 224, fixed frame 225, clamping mechanism 23, first clamping assembly 231, second clamping assembly 232, first clamping jaw 233, first clamping jaw drive 234, second clamping jaw 235, second clamping jaw drive 236, transfer station 24;

A detection unit 30, a first detection unit 31, a first camera 311, a second detection unit 32, and a second camera 321;

the marking section 40, the marking unit 41, the marking unit 411, the marking unit lifter 412, the marking unit translation module 42, the material pipe transporting line 43, the conveyor belt 431, the reference block 432, the guide plate 433, the air blowing unit 434, the material supporting unit 44, the bracket 441, the bracket translation unit 442, the alignment plate 443, the pushing block driver 444, the pushing block 445, the lifting unit 45, the lifting plate 451, the lifting plate lifter 452, and the stopper 453;

the feeding part 50, the adsorption component 51, the suction cup group 511, the suction cup group lifting piece 512, the adsorption component lifting piece 52, the adsorption component translation piece 53, the good product feeding box 54, the NG product feeding box 55, the good product guiding frame 56 and the NG product guiding frame 57;

the material pipe 100, a first surface 101, a second surface 102, a third surface 103, a bolt 104 and a limiting protrusion 105;

the material frame 200, the positioning groove 201, the cushion block 202 and the partition plate 203.

Detailed Description

In order that the above-recited objects, features and advantages of the present invention will become more readily apparent, a more particular description of the invention will be rendered by reference to the appended drawings and appended detailed description.

As shown in fig. 1, a tube 100 is provided, the tube 100 being used to carry a transistor for which the present invention is intended. Transistors to be detected are arranged in the material pipe 100 side by side, and the first surface 101, the second surface 102 and the third surface 103 of the material pipe 100 are transparent and respectively opposite to three surfaces to be detected of the transistors in the material pipe 100. Optionally, the first surface 101 of the tube 100 is opposite the third surface 103.

Optionally, two ends of the length direction of the material pipe 100 are respectively provided with a bolt 104 for sealing the material pipe 100; adjacent two transistors in the material pipe 100 are mutually abutted, and a first surface 101 and a third surface 103 of the material pipe 100 are respectively formed with limiting protrusions 105 inwards; two limit projections 105 extend along the length of the tube 100, the two limit projections 105 catching the body portion of the transistor.

The transistor is reliably fixed in the feed tube 100 by the stopper protrusion 105.

Fig. 2 shows an automated optical inspection device 1 for transistors for inspecting three surfaces to be inspected of a transistor loaded in a tube 100 as shown in fig. 1. The transistor automatic optical detection device 1 mainly comprises a feeding part 10, a transferring part 20 and a detection part 30.

Wherein: the feeding part 10 is configured to store a plurality of stacked tubes 100;

the feeding part 10 is provided with a feeding station 11 for clamping the material pipe 100 by the transferring part 20, and the detecting part 30 is configured to detect three surfaces to be detected of transistors inside the material pipe 100 from a first surface 101, a second surface 102 and a third surface 103 which are transparent to the material pipe 100 respectively;

the transfer part 20 comprises a translation mechanism 21, a rotation mechanism 22 and a clamping mechanism 23, wherein the clamping mechanism 23 is arranged at the movable end of the rotation mechanism 22, and the rotation mechanism 22 is arranged at the movable end of the translation mechanism 21; the clamping mechanism 23 is configured to clamp the material pipe 100 positioned at the feeding station 11, the translation mechanism 21 is configured to drive the clamping mechanism 23 to translate between the feeding part 10 and the detecting part 30, and the rotation mechanism 22 is configured to drive the clamping mechanism 23 to switch between a horizontal plane and a vertical plane;

The translation mechanism 21 cooperates with the rotation mechanism 22 to sequentially feed the first surface 101, the second surface 102, and the third surface 103 of the tube 100 to the detection portion 30 for detection.

By configuring the transfer part 20 including the translation mechanism 21, the rotation mechanism 22 and the clamping mechanism 23, the translation mechanism 21 is matched with the rotation mechanism 22, so that the first surface 101, the second surface 102 and the third surface 103 of the pipe 100 clamped by the clamping mechanism 23 are sequentially and continuously sent to the detection part 30, thereby saving the preparation time for detection and improving the working efficiency.

The individual components of the invention are described in further detail below.

As shown in fig. 2, the feeding portion 10 serves to feed the material pipe 100 to the transfer portion 20. As an alternative embodiment, the loading section 10 includes a sizing assembly 12, a buffering assembly 13, and a transfer assembly 14.

Wherein, the buffer component 13 is used for storing a plurality of material pipes 100 which are stacked;

the transfer component 14 is used for taking out the material pipe 100 from the buffer component 13 and putting the material pipe into the normalization component 12;

the organizer assembly 12 is configured to receive the material tube 100 and to present the material tube 100 to the loading station 11.

The buffer storage component 13 temporarily stores the material pipe 100, so that the waiting time of the transfer component 14 can be reduced, and the transfer efficiency of the transfer component 14 can be improved; by sizing the tube 100 with the sizing assembly 12, the tube 100 can be precisely positioned at the loading location, thereby avoiding the transfer error of the transfer assembly 14 and reducing the failure rate.

In this embodiment, as shown in fig. 3, optionally, the trimming assembly 12 is provided with two carrying seats 121 located at two sides of the feeding station 11, a positioning step 122 is provided on a first side (i.e., a side close to the transferring portion 20) of the two carrying seats 121 along the translation direction of the translation mechanism 21, and a top block 123 movable relative to the positioning step 122 is provided on a second side (i.e., a side far from the transferring portion 20) of the two carrying seats 121 along the translation direction of the translation mechanism 21.

The leveling assembly 12 further includes a datum plate 124, a leveling plate 125, and a leveling plate driving member 126, where the datum plate 124 and the leveling plate 125 are respectively located on the outer sides of the two bearing seats 121 along the translation direction perpendicular to the translation mechanism 21, and the leveling plate 125 is mounted on a movable end of the leveling plate driving member 126, and the leveling plate driving member 126 drives the leveling plate 125 to move relative to the datum plate 124. Alternatively, the normalization plate driver 126 employs an air cylinder.

By positioning the step 122 and the reference plate 124 as references, the pipe 100 is normalized by the movement of the top block 123 and the normalization plate 125, so that the pipe 100 is in a constant position before being grasped, and the transfer part 20 can grasp accurately.

In one embodiment, two carrier blocks 121 are respectively mounted on the carrier block cylinders 127, and the carrier block cylinders 127 can drive the corresponding carrier blocks 121 to lift.

In another embodiment, two top blocks 123 are respectively mounted on the movable ends of the top block cylinders 128, the top block cylinders are mounted on the bearing seats 121, and a top block sliding rail 129 is further mounted between each top block 123 and the corresponding bearing seat 121. The top block cylinder 128 drives the corresponding top block 123 to slide along the top block slide rail 129, so that the corresponding positioning step 122 can be close to or far away from.

As shown in fig. 4 and 5, the buffer assembly 13 optionally includes a buffer frame 131, a fixed plate 132, and a fixed plate translation portion 133.

Two fixed flitch 132 are arranged in the opposite both sides of buffering frame 131, and every fixed flitch 132 is installed at the expansion end of a fixed flitch translation portion 133, and two fixed flitch 132 are configured to insert or remove buffering frame 131 under the drive of fixed flitch translation portion 133. Alternatively, the fixed plate translating portion 133 employs an air cylinder.

The fixed material plate translation part 133 drives the fixed material plate 132 to be inserted into the buffer frame 131, so that the material pipe 100 lifted into the buffer frame 131 by the jacking component 16 can be lifted in the buffer frame 131, and the jacking component 16 can withdraw the material frame 200, thereby facilitating replacement of the material frame 200 in the material frame replacement component 15.

Optionally, a plurality of partitions 134 are vertically installed in the buffer frame 131, and the buffer frame 131 is divided into a plurality of parallel buffer spaces by the plurality of partitions 134.

The buffer frame 131 is provided with a plurality of buffer spaces, so that the plurality of material pipes 100 can be stored at the same time, the waiting time of the transfer assembly 14 can be reduced, and the transfer efficiency can be improved.

In one embodiment, optionally, the buffer assembly 13 further includes a fixed material plate lifting portion 135, the fixed material plate translation portion 133 is mounted on a movable end of the fixed material plate lifting portion 135, and the fixed material plate lifting portion 135 is configured to drive the fixed material plate translation portion 133 to lift, so that the uppermost material pipe 100 in the buffer frame 131 is in a constant position. Optionally, the fixed material plate lifting part 135 adopts a screw motor, which is used for lifting the fixed material plate 132 and the fixed material plate translation part 133 step by step, so that the height of one material pipe 100 is lifted each time, the uppermost material pipe 100 in the buffer assembly 13 is always positioned at the same position, and the transfer assembly 14 is convenient to grasp.

The fixed material plate lifting part 135 drives the fixed material plate 132 to lift to a preset position in the buffer assembly 13, so that the uppermost material pipe 100 in the buffer frame 131 is always at a constant position, and the transfer assembly 14 is convenient for transferring the material pipe 100.

In one embodiment, the fixed plate lifting portion 135 further comprises a guide assembly 136, the guide assembly 136 being configured to guide the fixed plate lifting portion 135 when the fixed plate lifting portion 135 is lifted. Optionally, the guide assembly 136 employs a guide rod. The buffer frame 131 is prevented from shaking by guiding the fixed-material-plate lifting part 135 by the guide assembly 136.

As shown in fig. 4 and 5, alternatively, the transfer unit 14 includes a transfer translation portion 141, an adsorption lifting portion 142, and an adsorption portion 143, the adsorption portion 143 is mounted on the adsorption lifting portion 142, and the adsorption lifting portion 142 is mounted on the transfer translation portion 141; the adsorption part 143 is used for adsorbing the material pipe 100 in the buffer assembly 13, the adsorption lifting part 142 is used for driving the adsorption part 143 to lift, and the transfer translation part 141 is used for driving the adsorption lifting part 142 to translate. Alternatively, the transfer translation portion 141 and the suction lifting portion 142 are respectively linear modules.

The material pipe 100 in the buffer assembly 13 is absorbed by the absorption part 143, and the absorption part 143 is driven by the absorption lifting part 142 and the transfer translation part 141 to move to a feeding position, so that smooth feeding of the material pipe 100 is realized.

In this embodiment, the suction portion 143 may optionally include a suction mounting plate 144 and a plurality of suction members 145, the plurality of suction members 145 being mounted below the suction mounting plate 144. Alternatively, suction member 145 employs a suction cup.

The suction portion 143 is provided with a plurality of suction members 145, and the suction members 145 reliably suck the material pipe 100, thereby preventing the material pipe 100 from dropping and damaging the transistor.

As shown in fig. 4 and 5, the feeding portion 10 may optionally further include a frame replacement assembly 15. As an alternative embodiment, the frame replacing assembly 15 includes a base 151, a sliding plate 152 and a sliding rail 153, the sliding plate 152 is movably mounted on the base 151 through the sliding rail 153, and the sliding plate 152 is used for carrying the frame 200.

The material frame replacing assembly 15 adopts the sliding plate 152 and the sliding rail 153, and is smooth in drawing and pulling, so that the material frame 200 can be replaced conveniently.

As shown in fig. 6, optionally, a positioning wheel 154 is mounted on the sliding plate 152, and a positioning groove 201 for the positioning wheel 154 to fit and clamp is provided at the bottom of the material frame 200.

The positioning wheel 154 and the positioning groove 201 are matched, so that the material frame 200 can be positioned on the sliding plate 152, and the material frame 200 is prevented from shaking.

As shown in fig. 7 and 8, the frame replacing assembly 15 optionally further includes a positioning assembly 155, the positioning assembly 155 is mounted between the base 151 and the slide plate 152, and the positioning assembly 155 is used for positioning the slide plate 152 on the base 151.

By positioning the slide plate 152 on the base 151 by the positioning assembly 155, the material frame 200 is ensured to be at a predetermined position, so that the lifting assembly 16 can lift the material pipe 100 conveniently.

Specifically, the positioning assembly 155 includes an insert 156 and a socket 157, the insert 156 is mounted on the slide plate 152, the socket 157 is mounted on the base 151, a slot into which the insert 156 is inserted is provided on the socket 157, steel balls 158 are mounted on both sides of the slot, and the steel balls 158 are abutted against the insert 156 by springs 159.

As shown in fig. 4 and 5, alternatively, the lifting assembly 16 includes a lifting plate 161 and a lifting plate lifting portion 162, the lifting plate 161 is mounted on a movable component of the lifting plate lifting portion 162, the lifting plate lifting portion 162 drives the lifting plate 161 to lift in a vertical direction, and a cavity for inserting the lifting plate 161 under the material pipe 100 is formed at the bottom of the material frame 200. Alternatively, the lift plate lifting part 162 employs a linear module.

The bottom of the material frame 200 is provided with a cavity, so that the jacking plate 161 of the jacking assembly 16 is conveniently inserted into the material frame 200, and interference is avoided.

Specifically, the material frame 200 is divided into a plurality of storage spaces by a plurality of partitions 203, a pad 202 is installed at the lower portion of each storage space, the material pipe 100 is placed on the pad 202, and a cavity for inserting the jacking plate 161 is formed under the material pipe 100.

As shown in fig. 2, the transfer portion 20 functions to detect a transistor in the tube 100. The transfer section 20 includes a translation mechanism 21, a rotation mechanism 22, and a clamping mechanism 23.

As shown in fig. 9, the translation mechanism 21 may alternatively employ a linear module.

As shown in fig. 9, as an alternative embodiment, the rotation mechanism 22 includes a transfer plate 221, a rotation shaft 222, bearing blocks 223, and a rotation shaft driving member 224, the rotation shaft 222 is rotatably mounted on the transfer plate 221 through two bearing blocks 223, and the transfer plate 221 is mounted on the movable end of the translation mechanism 21. The movable end of the rotating shaft driving piece 224 is connected to the rotating shaft 222; the rotation shaft driving part 224 drives the rotation shaft 222 to rotate. Alternatively, the spindle drive 224 employs a pulley drive.

As shown in fig. 9, as an alternative embodiment, the clamping mechanism 23 includes a first clamping assembly 231 and a second clamping assembly 232 mounted opposite the movable end of the rotating mechanism 22, the first clamping assembly 231 and the second clamping assembly 232 being respectively configured to individually clamp a single tube 100.

The first clamping assembly 231 clamps the other tube 100 from the loading station 11 while the third surface 103 is inspected by the second clamping assembly 232;

the second clamping assembly 232 clamps the tube 100 from the loading station 11 while the third surface 103 is inspected and the first clamping assembly 231 clamps another tube 100.

The clamping mechanism 23 comprises two clamping assemblies, when the material pipe 100 clamped by one clamping assembly is located at the detection station, the other clamping assembly clamps the other material pipe 100 from the feeding station 11, so that synchronous feeding of the two material pipes 100 is realized, and the working efficiency is improved.

Optionally, the first clamping assembly 231 includes two pairs of first clamping jaws 233 and two first clamping jaw driving members 234, each pair of first clamping jaws 233 being mounted on one first clamping jaw driving member 234; two first jaw driving members 234 are fixedly mounted at one end of the rotating shaft 222, respectively, and the first jaw driving members 234 drive the first jaws 233 to open and close. Alternatively, the first jaw driver 234 employs a double-ended air cylinder.

The second clamping assembly 232 and the first clamping assembly 231 are symmetrically mounted on the rotating shaft 222. The second clamping assembly 232 includes two pairs of second clamping jaws 235 and two second jaw drives 236, the second clamping jaws 235 being mounted on the second jaw drives 236; the second jaw driver 236 drives the second jaw 235 open and close. Alternatively, the second jaw driver 236 employs a double-headed cylinder.

Optionally, two fixing frames 225 are mounted on the rotating shaft 222, and a first clamping jaw 233 and a second clamping jaw 235 are symmetrically mounted on each fixing frame 225.

As shown in fig. 2, the detecting portion 30 functions to detect a transistor in the feed pipe 100.

As an alternative embodiment, the detecting part 30 includes a first detecting component 31 and a second detecting component 32, the first detecting component 31 is used for detecting the first surface 101 and the third surface 103 of the material pipe 100, respectively, and the second detecting component 32 is used for detecting the second surface 102 of the material pipe 100.

The detecting part 30 comprises two detecting components, the first surface 101 and the third surface 103 of the pipe 100 at the same height position can be detected by the first detecting component 31, the second surface 102 of the pipe 100 at another height position can be detected by the second detecting component 32, the positions of the two detecting components can be respectively adjusted and fixed before detection, and the detecting time can be saved without readjusting during detection.

Optionally, the first detecting assembly 31 includes a plurality of first cameras 311 spaced along the length of the tube 100, each first camera 311 being configured to detect at least one transistor in the tube 100;

the second detecting assembly 32 includes a plurality of second cameras 321 spaced apart along the length of the tube 100, each second camera 321 being configured to detect at least one transistor within the tube 100.

Each detection assembly comprises a plurality of cameras, and can detect all transistors in one material pipe 100 at the same time, so that the detection efficiency is improved.

As shown in fig. 10 and 11, alternatively, the first detection assembly 31 and the second detection assembly 32 are disposed above the translation path of the translation mechanism 21 at intervals;

when the material pipe 100 clamped by the first clamping assembly 231 is translated below the first detecting assembly 31, the first detecting assembly 31 detects the first surface 101 or the third surface 103 of the material pipe 100;

the rotating mechanism 22 is used for driving the first clamping assembly 231 to turn 90 ° so that the second surface 102 of the material pipe 100 rotates below the second detecting assembly 32, and the second detecting assembly 32 is used for detecting the second surface 102 of the material pipe 100.

By providing the first detecting element 31 and the second detecting element 32 at intervals, the positions of the two detecting elements respectively correspond to the clamping positions of each clamping element before and after rotation, so that the detecting portion 30 can detect two adjacent surfaces of the material pipe 100, namely, the first surface 101 and the second surface 102 or the second surface 102 and the third surface 103.

As shown in fig. 2, the present invention may further include a marking portion 40 located at a subsequent stage of the detecting portion 30, where the marking portion 40 is configured to mark a surface of the tube 100 corresponding to the defective transistor, and the marking portion 40 is provided with a transfer station 24 for receiving the detected tube 100.

The first clamping assembly 231 clamps the material tube 100 while the first surface 101 is inspected, and the second clamping assembly 232 clamps the material tube 100 at the transfer station 24;

the tube 100 held by the second clamping assembly 232 is in the transfer station 24 while the tube 100 held by the first clamping assembly 231 is being inspected at the first surface 101.

By configuring the marking part 40, marks can be marked on the surface of the material pipe 100 corresponding to the failed transistor, so that the subsequent treatment of the failed transistor is facilitated.

As shown in fig. 12 and 13, as an alternative embodiment, the marking portion 40 includes a marking device set 41, a marking device translation module 42, a material pipe conveying line 43, a material supporting assembly 44, and a lifting assembly 45.

The lifting assembly 45 is arranged outside the material pipe conveying line 43, and the material supporting assembly 44 is arranged above the material pipe conveying line 43; the tube transport line 43 is configured to receive and transport the tube 100 transferred from the transfer section 20, the transfer station 24 is disposed at a feed end of the tube transport line 43, the lifting assembly 45 is configured to lift the tube 100 from the tube transport line 43 to the holding assembly 44, and the holding assembly 44 is configured to hold and position the tube 100.

The marker translation module 42 is mounted above the stock assembly 44; the marker set 41 is mounted at the movable end of the marker translation module 42, and the marker translation module 42 is configured to drive the marker set 41 to move above the material supporting assembly 44; the labeler group 41 comprises a plurality of labelers 411 and labeler lifting pieces 412, the labelers 411 are arranged at the movable ends of the labeler lifting pieces 412, and the labeler lifting pieces 412 drive the labelers 411 to lift and label on the material pipe 100.

Lifting the material pipe 100 from the material pipe conveying line 43 to the material supporting assembly 44 through the lifting assembly 45, moving the marker set 41 to the position above the material supporting assembly 44 through the marker translation module 42, and driving the marker 411 to lift by the marker lifting member 412 so as to realize marking on the material pipe 100; when the marking is performed, the material pipe 100 is not deviated, and normal marking of the marking device 411 can be realized.

In one embodiment, the pipe transporting line 43 optionally includes two parallel and spaced-apart conveyor belts 431, wherein a reference block 432 for blocking the pipe 100 is mounted at a discharge end of the conveyor belts 431, and/or a guide plate 433 for guiding the pipe 100 is mounted at a feed end of the conveyor belts 431.

The position of the material pipe 100 on the material pipe conveying line 43 is constant by arranging the reference block 432 at the discharge end of the conveying belt 431, so that the lifting assembly 45 is convenient to accurately lift; by providing the guide plate 433 to guide the material pipe 100, the material pipe 100 can smoothly enter the material pipe transporting line 43.

In another embodiment, alternatively, two guide plates 433 are symmetrically installed at the outer sides of the feeding ends of the two conveyor belts 431, and the interval between the feeding ends of the two guide plates 433 is gradually decreased along the feeding direction.

By arranging the guide plate 433 in an arc shape, the pipe 100 can be stably and smoothly regulated to a position centered on the pipe transporting line 43.

In one embodiment, optionally, the feed end of the tube transport line 43 is further fitted with a blowing member 434 for blowing the tube 100 to be received toward the conveyor belt 431.

The blowing member 434 allows the material pipe 100 to be quickly dropped onto the material pipe transporting line 43, thereby improving productivity.

As shown in fig. 13, in one embodiment, the material supporting assembly 44 optionally includes two brackets 441 and a bracket translation member 442, where the two brackets 441 are symmetrically installed at the outer side of the conveying direction of the material pipe conveying line 43, and the bracket translation member 442 drives the two brackets 441 to approach or separate from each other. Alternatively, the carriage translator 442 employs an air cylinder.

The two carriages 441 are moved away by the carriage translation 442 so that there is room for the lifting assembly 45 to lift the tube 100 beyond the upper surface of the carriages 441; the two carriages 441 are brought closer together by the carriage translation 442, and the tube 100 can rest on the carriages 441 when the lifting assembly 45 is lowered.

Optionally, the material supporting assembly 44 further includes a trimming plate 443, the two trimming plates 443 are symmetrically mounted on the two brackets 441, respectively, the two trimming plates 443 are used for trimming the material pipes 100 carried on the two brackets 441, and the two trimming plates 443 are abutted against or away from two ends of the material pipes 100 in the length direction under the driving of the brackets 441.

The uniformity of the monolith tube 100 can be regulated in the length direction by the regulating plate 443.

Alternatively, each of the alignment plates 443 is integrally formed with its corresponding bracket 441, in an L-shape. The trimming plate 443 is integrally formed with the bracket 441 for easy manufacture.

In one embodiment, optionally, the reference block 432 is higher than the brackets 441, the material supporting assembly 44 further includes a pushing block driving member 444 mounted on each bracket 441, the pushing block driving member 444 is located at an end of the bracket 441 near the feeding end of the conveying belt 431, a pushing block 445 is mounted on a movable part of the pushing block driving member 444, and the pushing block driving member 444 is configured to drive the pushing block 445 to abut against the material pipes 100, so that the plurality of material pipes 100 are gathered along the conveying direction of the material pipe conveying line 43. Alternatively, the pusher drive 444 employs an air cylinder.

The reference block 432 is higher than the bracket 441 and can be used as a reference surface of the material pipe 100 during marking; the pushing block driving piece 444 drives the pushing block 445 to abut against the material pipes 100, so that the plurality of material pipes 100 can be gathered along the conveying direction of the material pipe conveying line 43.

In one embodiment, the lift assembly 45 optionally includes a lift plate 451 and a lift plate lift member 452, the lift plate 451 being mounted to a movable member of the lift plate lift member 452, the lift plate lift member 452 being configured to raise and lower the lift plate 451. Alternatively, the lifting plate elevating member 452 employs an air cylinder.

The lifting plate 451 is lifted and lowered by the lifting plate lifting member 452 to transfer the material tube 100 to the material supporting assembly 44.

In another embodiment, optionally, the lifting assembly 45 further comprises a stop 453, the stop 453 being mounted to an end of the lifting plate 451 near the feed end of the pipe transport line 43; the stopper 453 is configured to block the pipe 100 located at the rear path, which is conveyed on the pipe conveying line 43, when the lifting plate 451 is lifted.

The pipe 100, which is subsequently fed into the pipe transporting line 43, is blocked outside the lifting assembly 45 by the stopper 453, so that interference between the pipe 100 and the lifting plate 451 can be prevented.

As shown in fig. 2, the present invention may further include a receiving portion 50, the receiving portion 50 being installed at a subsequent station of the marking portion 40, the receiving portion 50 being configured to sort the collecting pipes 100 according to the result detected by the detecting portion 30.

The material receiving part 50 is used for classifying and collecting the marked material pipes 100, so that the timely classification of the detected material pipes 100 can be realized, and the working efficiency is improved.

As shown in fig. 14, as an alternative embodiment, the receiving portion 50 includes an adsorption unit 51, an adsorption unit lifting member 52, an adsorption unit translation member 53, a good receiving bin 54, and an NG receiving bin 55.

The adsorption component 51 is arranged at the movable end of the adsorption component lifting piece 52, and the adsorption component lifting piece 52 is arranged at the movable end of the adsorption component translation piece 53; the suction component lifting member 53 is configured to drive the suction component lifting member 52 to move horizontally to a position above the good product receiving bin 54 or the NG product receiving bin 55, and the suction component lifting member 52 is configured to drive the suction component 51 to lift. Alternatively, the suction assembly lifter 52 employs an air cylinder, and the suction assembly translator 53 employs a linear die set.

Optionally, the suction assembly 51 includes a plurality of suction cup groups 511 and suction cup group lifting members 512, and each suction cup group 511 is lifted by the respective suction cup group lifting member 512. Alternatively, the suction cup set lifting member 512 employs an air cylinder,

the adsorption component 51 is used for adsorbing the marked material pipes 100 on the material supporting component 44 of the marking part 40 at one time, the adsorption component 51 is driven by the adsorption component lifting component 52 and the adsorption component translation component 53 to move to the position above the good product receiving box 54 or the NG product receiving box 55, and then the detected material pipes 100 are classified and collected in the corresponding receiving boxes, so that the classified collection of the material pipes 100 is realized.

In one embodiment, a good product guiding frame 56 is installed above the good product receiving box 54, and an NG product guiding frame 57 is installed above the NG product receiving box 55, where the good product guiding frame 56 and the NG product guiding frame 57 respectively play a guiding role.

As shown in fig. 2, the working process of the present invention is as follows:

the buffer assembly 13 of the feeding part 10 takes out a material pipe 100 from the buffer frame 131 and sends the material pipe 100 to the regulating assembly 12;

the transfer part 20 slides to the position of the regulating assembly 12 to clamp the material taking pipe 100, and then the material taking pipe 100 returns to the detection part 30 for optical detection, and the detected material taking pipe 100 is sent to the marking part 40 by the transfer part 20;

After the defective transistor is marked by the marking part 40, the suction component 51 of the receiving part 50 grabs the material pipe 100 and sends it into the corresponding receiving box.

The invention has been described above in sufficient detail with a certain degree of particularity. It will be appreciated by those of ordinary skill in the art that the descriptions of the embodiments are merely exemplary and that all changes that come within the true spirit and scope of the invention are desired to be protected. The scope of the invention is indicated by the appended claims rather than by the foregoing description of the embodiments.

Claims (12)

1. The automatic optical detection device for the transistor is characterized by being used for detecting three surfaces to be detected of the transistor, and comprises a feeding part, a transferring part and a detecting part; wherein:

the feeding part is configured to store a plurality of stacked material pipes, transistors to be detected are arranged in the material pipes side by side, and the first surface, the second surface and the third surface of the material pipes are transparent and respectively opposite to three surfaces to be detected of the transistors in the material pipes;

the feeding part is provided with a feeding station for the transferring part to clamp the material pipe, and the detecting part is configured to detect three surfaces to be detected of the transistor inside the material pipe from the transparent first surface, the transparent second surface and the transparent third surface of the material pipe respectively;

The transferring part comprises a translation mechanism, a rotating mechanism and a clamping mechanism, wherein the clamping mechanism is arranged at the movable end of the rotating mechanism, and the rotating mechanism is arranged at the movable end of the translation mechanism; the clamping mechanism is configured to clamp the material pipe at the feeding station, the translation mechanism is configured to drive the clamping mechanism to translate between the feeding part and the detection part, and the rotation mechanism is configured to drive the clamping mechanism to switch between a horizontal plane and a vertical plane;

the translation mechanism is matched with the rotating mechanism to enable the first surface, the second surface and the third surface of the material pipe to be sequentially sent to the detection part.

2. The automated optical inspection device of claim 1, wherein the inspection section comprises a first inspection assembly for inspecting a first surface and a third surface of the tube, respectively, and a second inspection assembly for inspecting a second surface of the tube.

3. The automated optical inspection device of claim 2, wherein the first surface of the tube is opposite the third surface, the clamping mechanism comprises a first clamping assembly and a second clamping assembly mounted opposite the movable end of the rotating mechanism, the first clamping assembly and the second clamping assembly each being configured to clamp a single tube;

When the third surface of the material pipe clamped by the first clamping component is detected, the second clamping component clamps another material pipe from the feeding station;

when the third surface of the material pipe clamped by the second clamping component is detected, the first clamping component clamps another material pipe from the feeding station.

4. The automated optical inspection apparatus of claim 3, further comprising a marking section located downstream of the inspection section, the marking section configured to mark a surface of a tube corresponding to an unacceptable transistor, the marking section being provided with a transfer station for receiving the inspected tube;

when the material pipe clamped by the first clamping component is detected on the first surface, the material pipe clamped by the second clamping component is positioned at the transferring station;

when the first surface of the material pipe clamped by the second clamping component is detected, the material pipe clamped by the first clamping component is positioned at the transferring station.

5. The automated optical inspection device of claim 3, wherein the first and second inspection assemblies are spaced above a translation path of the translation mechanism;

When the material pipe clamped by the first clamping component is translated below the first detecting component, the first detecting component detects the first surface or the third surface of the material pipe;

the rotating mechanism is used for driving the first clamping assembly to turn over 90 degrees, so that the second surface of the material pipe rotates to the lower side of the second detection assembly, and the second detection assembly is used for detecting the second surface of the material pipe.

6. The automated optical inspection apparatus of claim 1, wherein the loading section comprises a normalization assembly, a buffer assembly, and a transfer assembly, wherein,

the buffer assembly is used for storing a plurality of stacked feed pipes;

the transfer component is used for taking out the material pipe from the cache component and placing the material pipe into the regulating component;

the regulating assembly is used for receiving the material pipe and enabling the material pipe to be located at a feeding station.

7. The automated optical inspection device of claim 6, wherein the alignment assembly is provided with two bearing seats positioned at two sides of the feeding station, wherein the two bearing seats are provided with positioning steps along a first side of the translation direction of the translation mechanism, and the two bearing seats are provided with top blocks capable of moving relative to the positioning steps along a second side of the translation direction of the translation mechanism;

The regulating assembly further comprises a reference plate, a regulating plate and a regulating plate driving piece, wherein the reference plate and the regulating plate are respectively positioned on the two outer sides of the bearing seats along the translation direction perpendicular to the translation mechanism, the regulating plate is installed on the regulating plate driving piece, and the regulating plate driving piece drives the regulating plate to move relative to the reference plate.

8. The automated optical inspection device of claim 4, wherein the marking section comprises a marking assembly, a marking assembly translation module, a tube transport line, a material supporting assembly, and a lifting assembly;

the lifting assembly is arranged outside the material pipe conveying line, and the material supporting assembly is arranged above the material pipe conveying line; the material pipe conveying line is configured to receive and convey the material pipe conveyed from the transferring part, the transferring station is arranged at a feeding end of the material pipe conveying line, the lifting assembly is configured to lift the material pipe from the material pipe conveying line to the material supporting assembly, and the material supporting assembly is configured to support and position the material pipe;

the marker translation module is arranged above the material supporting component; the marker set is arranged at the movable end of the marker translation module, and the marker translation module is configured to drive the marker set to move above the material supporting assembly; the marking device group comprises a plurality of marking devices and marking device lifting pieces, the marking devices are arranged at the movable ends of the marking device lifting pieces, and the marking device lifting pieces drive the marking devices to lift and mark the material pipes.

9. The automated optical inspection device of claim 4, further comprising a receiving portion mounted at a post-processing station of the marking portion, the receiving portion configured to sort and collect the tubes according to a result of the inspection by the inspection portion.

10. The automated optical inspection device of claim 9, wherein the receiving portion comprises an adsorption assembly, an adsorption assembly lifting member, an adsorption assembly translation member, a good receiving bin, and a NG receiving bin;

the adsorption component is arranged at the movable end of the adsorption component lifting piece, and the adsorption component lifting piece is arranged at the movable end of the adsorption component translation piece; the adsorption component lifting piece is configured to drive the adsorption component lifting piece to move to the upper part of the good product receiving box or the NG product receiving box, and the adsorption component lifting piece is configured to drive the adsorption component to lift;

the adsorption component comprises a plurality of sucking disc groups and sucking disc group lifting members, and each sucking disc group is driven by the corresponding sucking disc group lifting member to lift.

11. The automated optical inspection device of claim 1, wherein two ends of the tube in the length direction are respectively provided with a latch for closing the tube, two adjacent transistors in the tube are abutted against each other, and a first surface and a third surface of the tube are respectively formed with a limiting protrusion inwards, and the two limiting protrusions clamp the main body of the transistor.

12. The automated optical inspection device of claim 2, wherein the first inspection assembly comprises a plurality of first cameras spaced apart along the length of the tube, each first camera configured to inspect at least one of the transistors within the tube;

the second detection assembly comprises a plurality of second cameras which are arranged at intervals along the length direction of the material pipe, and each second camera is used for detecting at least one transistor in the material pipe.

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