CN115966237A - Screening method and device for bad blocks of hard disk, storage medium and electronic device - Google Patents
Screening method and device for bad blocks of hard disk, storage medium and electronic device Download PDFInfo
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Abstract
The embodiment of the invention provides a method and a device for screening bad blocks of a hard disk, a storage medium and an electronic device, wherein the method comprises the following steps: the method comprises the steps of obtaining a target hard disk to be tested, conducting read-write test on the target hard disk under a target temperature environment to obtain a group of bit overturning numbers, determining a bit overturning number threshold value according to the group of bit overturning numbers, and determining a block corresponding to the bit overturning number meeting a preset condition with the bit overturning number threshold value as a bad block in the target hard disk. By the method and the device, the problem of screen leakage or screen error of the bad blocks caused by incomplete particle characteristic analysis in the related art is solved.
Description
Technical Field
The embodiment of the invention relates to the field of computers, in particular to a method and a device for screening bad blocks of a hard disk, a storage medium and an electronic device.
Background
At present, the solid state disk is widely applied to various occasions, and due to the difference of field environments, the examination on the data safety of the solid state disk is more and more severe, and particularly, the solid state disk is used under different environmental temperatures, so that the temperature resistance and the stability of particles can be more examined. Therefore, some particles with stronger temperature resistance and stability under wide-temperature environment need to be screened out.
Currently, in the related art, a bad block screening threshold is determined by counting the number of erroneous bits by writing data and reading data at a given temperature, and a bad block is screened by the threshold. However, the number of erroneous bit reversals is counted only by making a temperature difference between the written data and the read data, which may cause that the blocks which perform relatively badly under low-temperature or high-temperature environment are not screened out completely, and the risk of screening out the bad blocks exists.
Aiming at the problem of screen leakage or screen error of bad blocks caused by incomplete particle characteristic analysis in the related technology, an effective solution is not provided at present.
Disclosure of Invention
The embodiment of the invention provides a method and a device for screening bad blocks of a hard disk, a storage medium and an electronic device, which are used for at least solving the problem of screen missing or screen error of the bad blocks caused by incomplete particle characteristic analysis in the related technology.
According to an embodiment of the present invention, a method for screening bad blocks of a hard disk is provided, including: acquiring a target hard disk to be tested, wherein the target hard disk consists of a plurality of blocks to be screened;
performing a read-write test on the target hard disk in a target temperature environment to obtain a group of bit flipping numbers, wherein the target temperature environment is a temperature environment in which the temperature difference between the target temperature environment and a preset temperature always exceeds a preset value, one bit flipping number in the group of bit flipping numbers corresponds to one block in the target hard disk, and the one bit flipping number indicates an accumulated value of the number of bits 1 flipped to bit 0 and the number of bits 0 flipped to bit 1 in the read-write test process;
determining a bit flip number threshold according to the group of bit flip numbers, wherein the bit flip number threshold is determined by a bit flip number average value and a bit flip number maximum value of the group of bit flip numbers;
and determining the block corresponding to the bit flipping number meeting the preset condition with the bit flipping number threshold value as a bad block in the target hard disk.
According to another embodiment of the present invention, there is provided a hard disk bad block screening apparatus, including: the system comprises an acquisition module, a selection module and a selection module, wherein the acquisition module is used for acquiring a target hard disk to be tested, and the target hard disk consists of a plurality of blocks to be screened;
the processing module is used for performing read-write test on the target hard disk under a target temperature environment to obtain a group of bit flipping numbers, wherein the target temperature environment is a temperature environment in which the temperature difference between the target temperature environment and a preset temperature always exceeds a preset value, one bit flipping number in the group of bit flipping numbers corresponds to one block in the target hard disk, and the one bit flipping number represents an accumulated value of the number of bit 0 flipping to bit 1 and the number of bit 1 flipping to bit 0 in the read-write test process;
a first determining module, configured to determine a threshold of bit flipping numbers according to the group of bit flipping numbers, where the threshold of bit flipping numbers is determined by a mean value of the bit flipping numbers of the group of bit flipping numbers and a maximum value of the bit flipping numbers;
and the second determining module is used for determining the block corresponding to the bit turnover number meeting the preset condition with the bit turnover number threshold value as a bad block in the target hard disk.
According to a further embodiment of the present invention, there is also provided a computer-readable storage medium having a computer program stored thereon, wherein the computer program is arranged to perform the steps of any of the above method embodiments when executed.
According to yet another embodiment of the present invention, there is also provided an electronic device, comprising a memory in which a computer program is stored and a processor configured to run the computer program to perform the steps of any of the method embodiments described above.
By the method and the device, the problem of missing or wrong screening of the bad blocks caused by incomplete particle characteristic analysis in the related technology is solved, the screening accuracy rate of the bad blocks of the hard disk is improved, and the risk of missing or wrong screening of the bad blocks is greatly reduced.
Drawings
Fig. 1 is a block diagram of a hardware structure of a mobile terminal of a method for screening a bad block of a hard disk according to an embodiment of the present invention;
FIG. 2 is a flowchart of a method for screening bad blocks of a hard disk according to an embodiment of the present invention;
FIG. 3 is a flowchart of model generation of a method for screening bad blocks of a hard disk according to an embodiment of the present invention;
fig. 4 is a block diagram of a screening apparatus for hard disk bad blocks according to an embodiment of the present invention.
Detailed Description
Embodiments of the present invention will be described in detail below with reference to the accompanying drawings in conjunction with embodiments.
It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order.
The method embodiments provided in the embodiments of the present application may be executed in a mobile terminal, a computer terminal, or a similar computing device. Taking the example of running on a mobile terminal, fig. 1 is a hardware structure block diagram of the mobile terminal of the method for screening a bad block of a hard disk according to the embodiment of the present invention. As shown in fig. 1, the mobile terminal may include one or more (only one shown in fig. 1) processors 102 (the processor 102 may include, but is not limited to, a processing device such as a microprocessor MCU or a programmable logic device FPGA), and a memory 104 for storing data, wherein the mobile terminal may further include a transmission device 106 for communication functions and an input-output device 108. It will be understood by those skilled in the art that the structure shown in fig. 1 is only an illustration, and does not limit the structure of the mobile terminal. For example, the mobile terminal may also include more or fewer components than shown in FIG. 1, or have a different configuration than shown in FIG. 1.
The memory 104 may be used to store a computer program, for example, a software program and a module of an application software, such as a computer program corresponding to the method for screening a bad block of a hard disk in the embodiment of the present invention, and the processor 102 executes various functional applications and data processing by running the computer program stored in the memory 104, so as to implement the method described above. The memory 104 may include high speed random access memory, and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some examples, the memory 104 may further include memory located remotely from the processor 102, which may be connected to the mobile terminal over a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
The transmission device 106 is used for receiving or transmitting data via a network. Specific examples of the network described above may include a wireless network provided by a communication provider of the mobile terminal. In one example, the transmission device 106 includes a Network adapter (NIC), which can be connected to other Network devices through a base station so as to communicate with the internet. In one example, the transmission device 106 may be a Radio Frequency (RF) module, which is used for communicating with the internet in a wireless manner.
In this embodiment, a method for screening a bad block of a hard disk is provided, and fig. 2 is a flowchart of a method for screening a bad block of a hard disk according to an embodiment of the present invention, as shown in fig. 2, the flowchart includes the following steps:
s202, acquiring a target hard disk to be tested, wherein the target hard disk consists of a plurality of blocks to be screened;
optionally, in this embodiment, the target hard disk to be tested may include, but is not limited to, a plurality of hard disks that have not yet been tested but are to be tested, where the types of the target hard disks may include, but are not limited to, solid state disks, mechanical hard disks, hybrid hard disks, and the like.
Optionally, in this embodiment, the target hard disk may include, but is not limited to, a plurality of land blocks to be screened, where the land blocks to be screened include good blocks and bad blocks, and the difference between the good blocks and the bad blocks may include, but is not limited to, whether the requirement under the corresponding condition is met, and the bad blocks will be screened out in the screening process.
S204, performing read-write test on the target hard disk under a target temperature environment to obtain a group of bit flipping numbers, wherein the target temperature environment is a temperature environment in which the temperature difference with a preset temperature always exceeds a preset value, one bit flipping number in the group of bit flipping numbers corresponds to one block in the target hard disk, and one bit flipping number represents an accumulated value of the number of bit 0 flipping to bit 1 and the number of bit 1 flipping to bit 0 in the read-write test process;
optionally, in this embodiment, the target temperature environment may include, but is not limited to, a temperature environment preset by a screener, and may be a high-temperature environment, a low-temperature ring, or a temperature cycle environment. The environment may be a high-temperature writing and low-temperature reading environment, or a high-temperature writing and high-temperature reading environment, or a low-temperature writing and low-temperature reading environment, a low-temperature writing and high-temperature reading environment, and the specific setting of the target temperature environment is not limited herein.
Optionally, in this embodiment, the preset temperature and the preset value in the "target temperature environment is a temperature environment in which the temperature difference from the preset temperature always exceeds the preset value" may include, but are not limited to, being set in advance by a technician and being adjustable at any time according to actual needs, and the preset value of the preset temperature may also be adjusted according to actual needs after multiple test operations are completed. And when the difference value between the test temperature environment and the preset temperature always exceeds the preset value, the temperature environment is the target temperature environment.
Optionally, in this embodiment, the read-write test may be to perform a relevant test on whether data written into and read from the target hard disk are consistent, and the bit flipping number may include, but is not limited to, the number of bits written into and read from the target hard disk that are inconsistent.
It should be noted that, the block is divided into 2304 pages (configuration), each page can store 16k of data, 16x1024 bytes, 1 byte is equal to 8 bits, and the prior art uses the page to determine the bad block.
A bit is a unit of information amount. A bit (bit) is an abbreviation for a binary unit or digit (binary digit) that represents the amount of information provided by a selected unary (0 or 1) from a binary array (if the probability of occurrence of the binary is equal). In practice, each binary digit is often referred to as a bit, regardless of whether the probabilities of the two symbols occurring are equal. The information contained in one bit of a binary number or the required amount of information for specifying 1 of 2 options is called one bit, and is the minimum unit representing information, and there are only two states: 0 and 1. These two values may also be interpreted as logical values (true/false, yes/no), algebraic sign (+/-), active state (on/off), or any other two-value attribute. A byte (byte) is 8 bits, one english letter usually occupies one byte, and one chinese character usually occupies two bytes. The smallest unit of information that a typical computer system can read and locate is a byte, that is, information that a typical computer system cannot actually read and locate accurately to the bit (bit) level.
For example, when the binary number is read with 10001 and written with 01101, it is not difficult to find that the values of the first bit, the second bit and the third bit in the data are correspondingly flipped, and then the bit flipping number is 3.
S206, determining a bit flipping number threshold according to the group of bit flipping numbers, wherein the bit flipping number threshold is determined by a bit flipping number average value and a bit flipping number multiple value of the group of bit flipping numbers;
optionally, in this embodiment, the bit flip number threshold is determined by a bit flip number average value of a group of bit flip numbers and a bit flip number maximum value, where the bit flip number average value is determined by dividing the number of data after the group of bit flip numbers is added, and the bit flip number maximum value is a second maximum bit flip number in the group of bit flip numbers.
For example, if the number of bit flips of a group of numbers is 5, 6, 7, 8, 9, respectively, then the average value of the group of bit flips is 7, and the number of bit flips is 8, then the threshold value of the number of bit flips is determined as 7 and 8.
The above is merely an example, and the present application is not limited in any particular way.
And S208, determining the block corresponding to the bit turnover number meeting the preset condition with the bit turnover number threshold value as a bad block in the target hard disk.
Optionally, in this embodiment, the threshold of the number of bit flips may include, but is not limited to, a judgment value for screening good and bad blocks of a target hard disk to be screened, where when the threshold meets a preset condition, a block corresponding to the number of bit flips is a bad block, and otherwise, the block is a good block.
It should be noted that the method of screening for a bad block may use RDT (Reliability verification Test), which may screen out some blocks exceeding a set ECC (Error correction Code) threshold during the Test, and these blocks may be marked as bad blocks.
Exemplarily, fig. 3 is a schematic specific flowchart of a method for screening a hard disk bad block according to an embodiment of the present invention, and as shown in fig. 3, the method for screening a hard disk bad block includes, but is not limited to, the following steps:
s302, starting screening;
s304, performing particle analysis, namely analyzing the particle characteristics of the flash memory particles under high-temperature, low-temperature and warm-cycle environments, and analyzing whether the particle characteristics are caused by environmental temperature changes or the process characteristics of the particles (whether the particle characteristics are caused only by temperature changes or not);
s306, performing high-low temperature RDT test;
s308, determining a high-low temperature RDT screening threshold;
s310, screening high-temperature and low-temperature RDT;
s312, judging whether the RDT screening is passed or not, if the judgment result is yes, executing S314, and if the judgment result is no, executing S320;
s314, the bad blocks are inherited, and the bad blocks screened out by the RDT each time are inherited in a bad block inheritance mode, so that the bad blocks screened out by the RDT in a low-temperature environment and a high-temperature environment are not included in the product testing process, and the product testing yield is ensured;
s316, carrying out product testing;
s318, judging whether the product test is passed or not, if so, executing S322, and if not, executing S320;
s320, eliminating;
and S322, finishing screening.
The above is merely an example, and the present application is not limited in any particular way.
According to the method and the device, the target hard disk to be tested is obtained, the target hard disk is subjected to read-write test in the target temperature environment, a group of bit overturning numbers are obtained, the bit overturning number threshold value is determined according to the group of bit overturning numbers, and the block corresponding to the bit overturning number meeting the preset condition with the bit overturning number threshold value is determined to be the bad block in the target hard disk. Except that statistics writes the wrong bit number under the environment that high temperature was write to the low temperature or the low temperature is read to high temperature, still statistics is at low temperature or the constant temperature environment of high temperature wrong bit number for bad piece under the constant temperature environment also can be filtered out, what reduce bad piece and leak sieve the risk, solved the problem that the bad piece that exists among the correlation technique leaks sieve or mistake sieve because of the incomplete bad piece that leads to of granule characteristic analysis, reach and improve the bad piece screening accuracy of hard disk, the technical effect of greatly reduced bad piece and leak sieve or mistake sieve the risk.
In an exemplary embodiment, the read-write test is performed on the target hard disk under the target temperature environment to obtain a set of bit flipping numbers, which includes at least one of: under the condition that the stability of a target hard disk under a low-temperature environment needs to be tested, performing a write test on the target hard disk under a first low-temperature environment, and performing a read test on the target hard disk under the first low-temperature environment to obtain a first group of bit flipping numbers, wherein the first low-temperature environment is a temperature environment with the temperature always lower than a preset temperature and the temperature difference always greater than the preset value, and the group of bit flipping numbers comprises the first group of bit flipping numbers; under the condition that the stability of a target hard disk under a temperature cycle environment needs to be tested, performing a write test on the target hard disk under a first low-temperature environment, and performing a read test on the target hard disk under a first high-temperature environment to obtain a second group of bit flipping numbers, wherein the first high-temperature environment is a temperature environment with the temperature always higher than a preset temperature and the temperature difference always larger than the preset value, and the group of bit flipping numbers comprises the second group of bit flipping numbers; under the condition that the stability of the target hard disk under the temperature cycle environment needs to be tested, performing write test on the target hard disk under a first high-temperature environment, and performing read test on the target hard disk under a first low-temperature environment to obtain a third group of bit flipping numbers, wherein the group of bit flipping numbers comprises the third group of bit flipping numbers; and under the condition that the stability of the target hard disk under the high-temperature environment needs to be tested, performing write test on the target hard disk under the first high-temperature environment, and performing read test on the target hard disk under the first high-temperature environment to obtain a fourth group of bit flipping numbers, wherein the group of bit flipping numbers comprises the fourth group of bit flipping numbers.
Optionally, in this embodiment, the stability of the target hard disk in the low temperature environment may be the stability of the target hard disk in the low temperature writing and low temperature reading environments, that is, comparing the value of the bit flipping number of the test target hard disk in the low temperature writing and low temperature reading with a preset value, and if the test target hard disk meets the relevant condition, it may be said that the target hard disk is stable in the low temperature environment, otherwise, the target hard disk is not stable enough if the test target hard disk does not meet the relevant condition.
Optionally, in this embodiment, the first low temperature environment may include, but is not limited to, a temperature environment in which the temperature is always lower than a preset temperature and the temperature difference between the temperature and the preset temperature is always greater than the preset value, and the first group of bit flipping numbers may be the number of flipped read/write data obtained after performing a write test on the target hard disk in the first low temperature environment and performing a read test on the target hard disk in the first low temperature environment.
For example, if the data written in the first low temperature environment is 10001 and the data read in the first low temperature environment is 11101, the first set of bit flipping numbers is 2.
Optionally, in this embodiment, the temperature cycle environment may be a temperature environment in which the temperatures of the written data and the read data have a large difference, and may include a high-temperature writing low-temperature reading environment and a low-temperature writing high-temperature environment. The first high temperature environment is a temperature environment in which the temperature is always higher than a preset temperature and the difference between the temperature and the preset temperature is always greater than the preset value, and the second group of bit flipping numbers may be the number of flipped read/write data obtained after the write test is performed on the target hard disk in the first low temperature environment and the read test is performed on the target hard disk in the first high temperature environment.
Optionally, in this embodiment, the third set of bit flipping numbers may be the number of flipped read-write data obtained after performing a write test on the target hard disk in the first high-temperature environment and performing a read test on the target hard disk in the first low-temperature environment.
Optionally, in this embodiment, the stability in the high-temperature environment may be stability of the target hard disk in the high-temperature writing and high-temperature reading environments, that is, comparing the value of the bit flipping number of the target hard disk during high-temperature writing and high-temperature reading with a preset value, and when a relevant condition is met, it may be said that the target hard disk is stable in the high-temperature environment, otherwise, when the relevant condition is not met, it is not stable enough
It should be noted that the group of bit flipping numbers includes a first group of bit flipping numbers for low-temperature writing and reading, a second group of bit flipping numbers for low-temperature writing and reading, a third group of bit flipping numbers for high-temperature writing and reading, and a fourth group of bit flipping numbers for high-temperature writing and reading.
According to the embodiment of the application, a method that under the condition that the stability of a target hard disk to be tested is in a low-temperature environment, a write test is performed on the target hard disk under a first low-temperature environment, and a read test is performed on the target hard disk under the first low-temperature environment to obtain a first group of bit flipping numbers is adopted, or under the condition that the stability of the target hard disk to be tested is in a warm circulation environment, a write test is performed on the target hard disk under the first low-temperature environment, and a read test is performed on the target hard disk under the first high-temperature environment to obtain a second group of bit flipping numbers is performed, or under the condition that the stability of the target hard disk to be tested is in the warm circulation environment, a write test is performed on the target hard disk under the first high-temperature environment, and a read test is performed on the target hard disk under the first high-temperature environment to obtain a fourth group of bit flipping numbers is adopted. The target hard disk can be read and written according to different temperature environments, the problem that bad blocks are leaked to be screened or are screened mistakenly due to incomplete particle characteristic analysis in the related technology is solved, the screening accuracy rate of the bad blocks of the hard disk is improved, and the technical effects that the bad blocks are leaked to be screened or are screened mistakenly are greatly reduced.
In an exemplary embodiment, the method further includes: performing particle analysis on the read-write process of a target hard disk in different temperature environments, and determining the target particle characteristics of the target hard disk, wherein the target particle characteristics comprise the particle characteristics caused by the change of the environmental temperature or the particle characteristics caused by the self process of the particles; in the case where the target particle characteristics indicate particle characteristics due to changes in ambient temperature, the stability of the target hard disk in a low-temperature environment, a high-temperature environment, and a warm-cycle environment was tested, respectively.
Alternatively, in this embodiment, the above grain analysis may include, but is not limited to, counting the number of read-write error bit flips of the target hard disk in the cases of low-temperature write low-temperature read, low-temperature write high-temperature read, high-temperature write high-temperature read, and high-temperature write low-temperature read, and determining whether such a relationship is caused only by a temperature change through a relationship between the number of bit flips. The particle characteristics of the target hard disk may include, but are not limited to, a relationship between the number of bits of the read-write error in the case of low-temperature write and low-temperature read, low-temperature write and high-temperature read, high-temperature write and low-temperature write of the target hard disk, wherein the target particle characteristics include particle characteristics due to environmental temperature changes or particle characteristics due to processes of the particles themselves.
For example, 10011 is written in a high-temperature environment, 10011 is read at a low-temperature environment, 11011 is read in the high-temperature environment, then the bit flipping number of the high-temperature writing and low-temperature reading is 0, and the bit flipping number of the high-temperature writing and high-temperature reading is 1, then it can be determined that the difference of the bit flipping numbers is caused by the environment temperature change, and then the stability of the target hard disk in the low-temperature environment, the high-temperature environment and the temperature cycle environment can be tested respectively. If 10011 and 11000 are written in a high temperature environment respectively, and then the read numbers are 10011 and 11111 respectively, it is known that the read tests of two groups of data are performed under the same environmental temperature, but the obtained bit flip numbers are different, and the grain characteristics may not be caused by the environmental temperature change, but by the self-process.
In an exemplary embodiment, determining the bit flip number threshold from a set of bit flip numbers includes: determining a bit flipping number average value, a bit flipping number times maximum value and a bit flipping number minimum value of a target hard disk in a target temperature environment according to a group of bit flipping numbers; determining a first bit flip number interval and a second bit flip number interval according to the bit flip number average value, the bit flip number maximum value and the bit flip number minimum value, wherein the lower limit of the first bit flip number interval is the bit flip number minimum value, the upper limit of the first bit flip number interval is the bit flip number average value, the lower limit of the second bit flip number interval is the bit flip number average value, and the upper limit of the second bit flip number interval is the bit flip number maximum value; the bit flip number threshold is determined based on a first number of a group of bit flip numbers in a first bit flip number interval and a second number of a group of bit flip numbers in a second bit flip number interval.
Alternatively, in this embodiment, the average value of the bit flipping numbers may be an average value of a group of bit flipping numbers, the largest value of the bit flipping numbers may be a second largest bit flipping number of the group of bit flipping numbers, and the smallest value of the bit flipping numbers may be a smallest bit flipping number of the group of bit flipping numbers.
Alternatively, in this embodiment, the first bit flip number interval and the second bit flip number interval may be determined by a bit flip number average value, a bit flip number maximum value, and a bit flip number minimum value. The first number may be a number of one set of bit flips in a first bit flip interval, and the second number may be a number of one set of bit flips in a second bit flip interval.
Alternatively, in this embodiment, the bit flipping number threshold may be determined by the first number and the second number.
For example, if a group of bit flip numbers are 1, 5, 6, 7, 8, and 9 respectively, then the average value of the group of bit flip numbers is 6, the maximum value of the bit flip numbers is 8, the minimum value of the bit flip numbers is 1, at this time, the first bit flip interval is [1,6 ], the second bit flip interval is [6,8], the number of blocks of the group of bit flip numbers in the first bit flip interval (corresponding to the first number) is counted as 2, the ratio of the number of blocks of the group of bit flip numbers in the first bit flip interval to the total number of blocks is 1/3, the number of blocks of the group of bit flip intervals (corresponding to the second number) is counted as 4, and the ratio of the number of blocks of the group of bit flip numbers in the second bit flip interval to the total number of blocks is 2/3.
In an exemplary embodiment, determining the bit flip number threshold according to a first number of the set of bit flip numbers in a first bit flip number interval and a second number of the set of bit flip numbers in a second bit flip number interval comprises: determining a pre-screening yield corresponding to the bit flip number average value according to the first number and the second number, wherein the pre-screening yield indicates that the number of hard disks with bad blocks not exceeding a preset number of bad blocks accounts for the ratio of the number of the hard disks of the plurality of hard disks under the condition that the target hard disk is a plurality of hard disks; and determining a bit flip number threshold according to the pre-screening yield.
Optionally, in this embodiment, the pre-screening yield indicates a ratio of the number of hard disks, of which the number of bad blocks does not exceed a preset number of bad blocks, to the number of hard disks of the plurality of hard disks when the target hard disk is a plurality of hard disks, and the determining of the pre-screening yield corresponding to the bit flipping number average value according to the first number and the second number may refer to using the bit flipping number average value as a pre-screening threshold value, where a block is called a bad block if the pre-screening yield is greater than the pre-screening threshold value, where a ratio of the number of bad disks to the total number of hard disks is a bad disk rate if the bad blocks in the hard disks exceed the preset value, and the pre-screening yield is 1 minus the bad disk rate.
For example, a group of bit flipping numbers are 1, 5, 6, 7, 8, and 9, the first number is 2, the second number is 4, the pre-screening threshold corresponding to the mean 6 of the bit flipping numbers is 6, and the pre-screening yield is 40%.
According to the embodiment of the application, a mode of determining the pre-screening yield corresponding to the bit flip number average value according to the first quantity and the second quantity and then determining the bit flip number threshold according to the pre-screening yield is adopted. The method and the device can determine the proper bad block screening threshold value by a more comprehensive analysis method and a more strict screening scheme and complete the bad block screening, solve the problem of bad block screening omission or wrong screening caused by incomplete particle characteristic analysis in the related technology, improve the hard disk bad block screening accuracy rate and greatly reduce the risk of bad block screening omission or wrong screening.
In an exemplary embodiment, determining the bit flip number threshold based on the pre-screening yield comprises: determining a bit flip number threshold value according to the bit flip number average value, the bit flip number large value and the first number under the condition that the pre-screening yield is less than or equal to the preset screening yield; and under the condition that the pre-screening yield is greater than the preset screening yield, determining a bit flip number threshold according to the bit flip number average value, the bit flip number large value and the second number.
Optionally, in this embodiment, the preset screening yield may be a value set in advance by a relevant technician according to technical experience, or may be an industry-specified value, which may be 50%, 0.8, or the like, and the setting manner and the representing manner of the preset screening yield are not specifically limited herein.
For example, in the above example, the bit flip number average is used as the pre-screening threshold, and if the RDT screening yield is 40% smaller than the preset screening yield 50% when the recording threshold is the bit flip number average, then the bit flip number threshold is determined according to the following formula one:
ThrECC die ＝ AgvECC block + (MaxECC block - AgvECC block ) K (formula one)
The coefficient screening coefficient K = MAX (X1, X2), the maximum value of X1 (the proportion of the block number of a group of bit flipping numbers in a first bit flipping interval in the total block number) and X2 (the proportion of the block number of a group of bit flipping numbers in a second bit flipping interval in the total block number) is taken, thrECCdie is a bad block screening threshold, agvECCblock is the average value of the bit flipping numbers in the RDT test, and MaxECCblock is the large value of the bit flipping numbers in the RDT test.
If the RDT screening yield pre-screening yield is 60% greater than the preset screening yield 50% under the condition that the recording threshold is the bit flip number average value, determining the bit flip number threshold by the following formula two:
ThrECC die ＝AgvECC block +(MaxECC block -AgvECC block ) K (formula)Two)
The coefficient screening coefficient K = MAX (X1, X2), taking the minimum value of X1 (the percentage of the block number of a group of bit flipping numbers in a first bit flipping interval in the total block number) and X2 (the percentage of the block number of a group of bit flipping numbers in a second bit flipping interval in the total block number), thrECCdie being a bad block screening threshold, agvECCblock being the average value of the bit flipping numbers in the RDT test, and MaxECCblock being the large value of the bit flipping numbers in the RDT test.
According to the embodiment of the application, the bit overturning number threshold is determined according to the bit overturning number average value, the bit overturning number large value and the first number under the condition that the pre-screening yield is smaller than or equal to the preset screening yield, and then the bit overturning number threshold is determined according to the bit overturning number average value, the bit overturning number large value and the second number under the condition that the pre-screening yield is larger than the preset screening yield. The problem of exist among the correlation technique because of the incomplete bad piece that leads to of granule characteristic analysis hourglass sieve or mistake sieve is solved, reach the technological effect that improves hard disk bad piece screening accuracy, greatly reduced bad piece leaks sieve or mistake sieve risk.
In an exemplary embodiment, after determining a block corresponding to a bit flipping number that satisfies a preset condition with respect to a threshold bit flipping number as a bad block in the target hard disk, the method further includes: marking bad blocks in the target hard disk in the process of testing the target hard disk at the current time; and in the process of testing the target hard disk at different environmental temperatures next time, the marked bad block is not tested.
Optionally, in this embodiment, the process of marking the bad block in the target hard disk is inherited as the bad block, so that the marked bad block can be directly skipped in the test process, where the bad blocks in the low-temperature environment, the high-temperature environment and the warm-cycle environment are all marked, and the marked bad block in one environment will not be tested in the next other environment.
According to the embodiment of the application, the bad blocks in the target hard disk are marked in the process of testing the target hard disk at the current time, and the marked bad blocks are not tested in the process of testing the target hard disk at different environmental temperatures at the next time. Through the bad block inheritance mode, the bad blocks screened by the RDT at each time are inherited, so that the bad blocks screened by the RDT in the low-temperature environment and the high-temperature environment are not contained in the product testing process, the product testing yield is ensured, the problem that the bad blocks are leaked or mistakenly screened due to incomplete particle characteristic analysis in the related technology is solved, the screening accuracy rate of the hard disk bad blocks is improved, and the technical effects of greatly reducing the risk of leaking or mistakenly screening the bad blocks are achieved.
It is to be understood that the above-described embodiments are only a few, but not all, embodiments of the present invention.
The present application will be described in detail with reference to the following specific examples:
the application provides a particle screening method of a solid state disk in order to solve the problem that a bad block leaks to be screened under the constant temperature environment of low temperature or high temperature, and the particle screening method specifically comprises the following four parts:
1. and (4) analyzing the particles. And counting the number of the bit flipping times of the flash memory particles under the conditions of low-temperature writing and reading, high-temperature writing and reading and high-temperature writing and reading. By analyzing the particle characteristics (in any one of 4 scenes, the relation between the numbers of the read-write error bit flip of different pages) of the flash memory particles under the wide-temperature environment, whether the particle characteristics are caused by the environmental temperature change or the particle self-process characteristics (whether the particle characteristics are caused only by the temperature change) is analyzed. If the data is caused by the change of the environmental temperature, a further analysis needs to be performed on the weaker blocks expressed by the environment, and whether the number of the read-write error bit flips under the high-temperature, low-temperature and temperature cycling environment (low-temperature write high-temperature read or high-temperature write low-temperature read) meets the subsequent product requirements is mainly analyzed. If not, the blocks are screened out as much as possible during the later flash memory particle screening. On the contrary, if the read error bit flipping number meets the subsequent product requirements, further wear testing is needed, for example, after the blocks PE are used for a certain number of times, the read error bit flipping numbers of the blocks under the low-temperature, high-temperature and warm-cycle environment are statistically analyzed again to determine whether the subsequent product requirements are met. If the wide-temperature product requirement is not met, the blocks are screened out as much as possible in the post-screening process, and otherwise, if the wide-temperature product requirement is met, the blocks do not need to be paid excessive attention in the RDT screening process.
2. Low and high temperature RDT screening ECC thresholds are determined. By analyzing the RDT ECC data in the low-temperature and high-temperature environments, ECC threshold values (read-write error bit flip numbers) of the low-temperature and high-temperature RDT screening are determined. The threshold determination method is as follows:
A. firstly, respectively counting the average value AgvECC (the average value agvEcc of low temperature and high temperature), the second maximum value MaxECC (the second largest value at high temperature and the second largest value at low temperature) and the minimum value MinECC of ECC data in the low temperature and high temperature RDT tests of the particles. And dividing the interval into two intervals [ MinECC, agvECC) and [ AgvECC, maxEcc ], respectively counting the proportion of the block number in the interval [ MinECC, agvECC) and [ AgvECC, maxECC ] to the total block number as X1 and X2, and calculating the distribution. And taking the average value AgvECC (the blocks smaller than the AgvECC are regarded as bad blocks) as a pre-screening threshold, and recording the RDT screening yield (3 disks, 5 blocks in each disk, bad disk rate, and bad disk number in each disk not exceeding a preset value) under the condition that the threshold is AgvECC. In the pre-screening, if the pre-screening yield is less than 50%, the pre-screening yield is too low, and a final screening threshold value is determined through a formula I; otherwise, determining the final screening threshold value through a second formula.
B. The calculation formula of the low-temperature or high-temperature RDT screening threshold value is as follows:
a) The formula I is as follows:
ThrECCdie = AgvECCblock + (MaxECCblock-AgvECCblock) K, wherein the coefficient screening coefficient K = MAX (X1, X2), the maximum value of X1 and X2 is taken, thrECCdie is a bad Block screening threshold value, agvECCblock is the average value of all Page ECC values in one Block in the RDT test, and MaxECCblock is the second maximum value of all Page ECC values in one Block in the RDT test.
b) The formula II is as follows:
threccdi = agvccblock + (MaxECCblock-agvccblock) × K, where the coefficient screening coefficient K = MIN (X1, X2), taking the minimum value of X1 and X2, threccdi is the ECC threshold for RDT bad Block screening, agvccblock is the mean of all Page ECC values within one Block in the RDT test, and MaxECCblock is the second maximum of all Page ECC values within one Block in the RDT test.
3. The bad block inherits. After the screening threshold values of the RDTs at the low temperature and the high temperature are determined, the bad blocks screened by the RDT test under the low temperature and the high temperature environment need to be inherited in the subsequent RDT screening or product test verification. Through the bad block inheritance mode, the bad blocks screened out by the RDT each time are inherited, so that the bad blocks screened out by the RDT in a low-temperature environment and a high-temperature environment are not contained in the product testing process, and the product testing yield is ensured.
4. And (5) testing the product. And after the bad blocks screened out by the low-temperature RDT and the high-temperature RDT are inherited, the product test is completed at different environmental temperatures according to the product requirements.
Through the description of the foregoing embodiments, it is clear to those skilled in the art that the method according to the foregoing embodiments may be implemented by software plus a necessary general hardware platform, and certainly may also be implemented by hardware, but the former is a better implementation mode in many cases. Based on such understanding, the technical solutions of the present invention may be embodied in the form of a software product, which is stored in a storage medium (such as ROM/RAM, magnetic disk, optical disk) and includes instructions for enabling a terminal device (such as a mobile phone, a computer, a server, or a network device) to execute the method according to the embodiments of the present invention.
In this embodiment, a screening apparatus for bad hard disk blocks is further provided, and the apparatus is used to implement the foregoing embodiments and preferred embodiments, which have already been described and will not be described again. As used below, the term "module" may be a combination of software and/or hardware that implements a predetermined function. Although the means described in the embodiments below are preferably implemented in software, an implementation in hardware, or a combination of software and hardware is also possible and contemplated.
Fig. 4 is a block diagram of a screening apparatus for bad blocks of a hard disk according to an embodiment of the present invention, and as shown in fig. 4, the apparatus includes:
an obtaining module 402, configured to obtain a target hard disk to be tested, where the target hard disk is composed of multiple blocks to be screened;
a processing module 404, configured to perform a read-write test on a target hard disk in a target temperature environment to obtain a set of bit flipping numbers, where the target temperature environment is a temperature environment in which a temperature difference between the target temperature environment and a preset temperature always exceeds a preset value, one bit flipping number in the set of bit flipping numbers corresponds to one block in the target hard disk, and one bit flipping number indicates an accumulated value of the number of bits 0 flipped to bit 1 and the number of bits 1 flipped to bit 0 in the read-write test process;
a first determining module 406, configured to determine a bit flipping number threshold according to a group of bit flipping numbers, where the bit flipping number threshold is determined by a bit flipping number average of the group of bit flipping numbers and a bit flipping number maximum;
the second determining module 408 is configured to determine a block corresponding to the bit flip number that meets the preset condition with the bit flip number threshold as a bad block in the target hard disk.
In an exemplary embodiment, the apparatus further includes:
the first processing unit is used for performing write test on the target hard disk in a first low-temperature environment under the condition that the stability of the target hard disk in the low-temperature environment needs to be tested, and performing read test on the target hard disk in the first low-temperature environment to obtain a first group of bit flipping numbers, wherein the first low-temperature environment is a temperature environment with the temperature always lower than a preset temperature and the temperature difference always greater than the preset value, and the group of bit flipping numbers comprises the first group of bit flipping numbers;
the second processing unit is used for performing write test on the target hard disk in a first low-temperature environment and performing read test on the target hard disk in a first high-temperature environment under the condition that the stability of the target hard disk under a temperature cycle environment needs to be tested to obtain a second group of bit flipping numbers, wherein the first high-temperature environment is a temperature environment with the temperature always higher than a preset temperature and the temperature difference always larger than the preset value, and the group of bit flipping numbers comprises the second group of bit flipping numbers;
the third processing unit is used for performing write test on the target hard disk under the first high-temperature environment and performing read test on the target hard disk under the first low-temperature environment under the condition that the stability of the target hard disk under the temperature cycle environment needs to be tested to obtain a third group of bit flipping numbers, wherein the group of bit flipping numbers comprises the third group of bit flipping numbers;
and the fourth processing unit is used for performing write test on the target hard disk in the first high-temperature environment under the condition that the stability of the target hard disk in the high-temperature environment needs to be tested, and performing read test on the target hard disk in the first high-temperature environment to obtain a fourth group of bit flipping numbers, wherein the group of bit flipping numbers comprises the fourth group of bit flipping numbers.
In an exemplary embodiment, the apparatus further includes:
the fifth processing unit is used for performing particle analysis on the read-write process of the target hard disk in different temperature environments and determining target particle characteristics of the target hard disk, wherein the target particle characteristics comprise particle characteristics caused by environmental temperature change or particle characteristics caused by particle self-process;
and the test unit is used for respectively testing the stability of the target hard disk in a low-temperature environment, a high-temperature environment and a temperature cycle environment under the condition that the target particle characteristics represent the particle characteristics caused by the change of the environmental temperature.
In an exemplary embodiment, the apparatus further includes:
the first determining unit is used for determining the bit flip number average value, the bit flip number maximum value and the bit flip number minimum value of the target hard disk in the target temperature environment according to the group of bit flip numbers;
a second determining unit, configured to determine a first bit flip number interval and a second bit flip number interval according to the bit flip number average value, the bit flip number maximum value, and the bit flip number minimum value, where a lower limit of the first bit flip number interval is the bit flip number minimum value, an upper limit of the first bit flip number interval is the bit flip number average value, a lower limit of the second bit flip number interval is the bit flip number average value, and an upper limit of the second bit flip number interval is the bit flip number maximum value;
a third determining unit, configured to determine a bit flip threshold according to a first number of the group of bit flip numbers in the first bit flip number interval and a second number of the group of bit flip numbers in the second bit flip number interval.
In an exemplary embodiment, the apparatus further includes:
a fourth determining unit, configured to determine a pre-screening yield corresponding to the bit flipping number average according to the first number and the second number, where the pre-screening yield indicates a ratio of a number of hard disks, in which the number of bad blocks does not exceed a preset number of bad blocks, to a number of hard disks of the plurality of hard disks when the target hard disk is a plurality of hard disks;
and the fifth determining unit is used for determining the bit flip number threshold according to the pre-screening yield.
In an exemplary embodiment, the apparatus further includes:
a sixth determining unit, configured to determine a bit flip number threshold according to the bit flip number average value, the bit flip number maximum value, and the first number when the pre-screening yield is less than or equal to the preset screening yield;
and the seventh determining unit is used for determining the bit flip number threshold according to the bit flip number average value, the bit flip number maximum value and the second number under the condition that the pre-screening yield is greater than the preset screening yield.
In an exemplary embodiment, the apparatus further includes:
the marking unit is used for marking bad blocks in the target hard disk in the process of testing the target hard disk at the current time;
and the canceling unit is used for canceling the test of the marked bad blocks in the process of testing the target hard disk at different environmental temperatures next time.
It should be noted that, the above modules may be implemented by software or hardware, and for the latter, the following may be implemented, but not limited to: the modules are all positioned in the same processor; alternatively, the modules are respectively located in different processors in any combination.
An embodiment of the present invention further provides a computer-readable storage medium, in which a computer program is stored, wherein the computer program is configured to perform the steps in any of the above method embodiments when executed.
In an exemplary embodiment, the computer-readable storage medium may include, but is not limited to: various media capable of storing computer programs, such as a usb disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic disk, or an optical disk.
Embodiments of the present invention also provide an electronic device comprising a memory having a computer program stored therein and a processor arranged to run the computer program to perform the steps of any of the above method embodiments.
In an exemplary embodiment, the electronic apparatus may further include a transmission device and an input/output device, wherein the transmission device is connected to the processor, and the input/output device is connected to the processor.
For specific examples in this embodiment, reference may be made to the examples described in the above embodiments and exemplary embodiments, and details of this embodiment are not repeated herein.
It will be apparent to those skilled in the art that the modules or steps of the present invention described above may be implemented in a general purpose computing device, they may be centralized in a single computing device or distributed across a network of multiple computing devices, and they may be implemented in program code that is executable by a computing device, such that they may be stored in a memory device and executed by a computing device, and in some cases, the steps shown or described may be executed in an order different from that shown or described herein, or they may be separately fabricated into individual integrated circuit modules, or multiple modules or steps therein may be fabricated into a single integrated circuit module. Thus, the present invention is not limited to any specific combination of hardware and software.
The above is only a preferred embodiment of the present invention, and is not intended to limit the present invention, and various modifications and changes will occur to those skilled in the art. Any modification, equivalent replacement, or improvement made within the principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. A method for screening bad blocks of a hard disk is characterized by comprising the following steps:
acquiring a target hard disk to be tested, wherein the target hard disk consists of a plurality of blocks to be screened;
performing a read-write test on the target hard disk in a target temperature environment to obtain a group of bit flipping numbers, wherein the target temperature environment is a temperature environment in which the temperature difference between the target temperature environment and a preset temperature always exceeds a preset value, one bit flipping number in the group of bit flipping numbers corresponds to one block in the target hard disk, and the one bit flipping number indicates an accumulated value of the number of bits 1 flipped to bit 0 and the number of bits 0 flipped to bit 1 in the read-write test process;
determining a bit flipping number threshold according to the group of bit flipping numbers, wherein the bit flipping number threshold is determined by a bit flipping number average value and a bit flipping number times large value of the group of bit flipping numbers;
and determining the block corresponding to the bit flipping number meeting the preset condition with the bit flipping number threshold value as a bad block in the target hard disk.
2. The method of claim 1, wherein performing a read-write test on the target hard disk in the target temperature environment to obtain a set of bit flipping numbers comprises at least one of:
under the condition that the stability of the target hard disk under a low-temperature environment needs to be tested, performing a write test on the target hard disk under a first low-temperature environment, and performing a read test on the target hard disk under the first low-temperature environment to obtain a first group of bit flipping numbers, wherein the first low-temperature environment is a temperature environment with the temperature always lower than the preset temperature and the temperature difference always greater than the preset value, and the group of bit flipping numbers comprises the first group of bit flipping numbers;
under the condition that the stability of the target hard disk under a temperature cycle environment needs to be tested, performing a write test on the target hard disk under the first low-temperature environment, and performing a read test on the target hard disk under the first high-temperature environment to obtain a second group of bit flipping numbers, wherein the first high-temperature environment is a temperature environment with the temperature always higher than the preset temperature and the temperature difference always greater than the preset value, and the group of bit flipping numbers comprises the second group of bit flipping numbers;
under the condition that the stability of the target hard disk under the temperature cycle environment needs to be tested, performing a write test on the target hard disk under the first high-temperature environment, and performing a read test on the target hard disk under the first low-temperature environment to obtain a third group of bit flipping numbers, wherein the group of bit flipping numbers comprises the third group of bit flipping numbers;
and under the condition that the stability of the target hard disk under the high-temperature environment needs to be tested, performing a write test on the target hard disk under the first high-temperature environment, and performing a read test on the target hard disk under the first high-temperature environment to obtain a fourth group of bit flipping numbers, wherein the group of bit flipping numbers includes the fourth group of bit flipping numbers.
3. The method of claim 2, further comprising:
performing particle analysis on the read-write process of the target hard disk in different temperature environments, and determining target particle characteristics of the target hard disk, wherein the target particle characteristics comprise particle characteristics caused by environmental temperature change or particle characteristics caused by the self process of particles;
and under the condition that the target particle characteristics represent particle characteristics caused by environmental temperature changes, respectively testing the stability of the target hard disk in the low-temperature environment, the high-temperature environment and the temperature cycle environment.
4. The method of claim 1, wherein determining the threshold number of bit flips based on the set of number of bit flips comprises:
determining the bit flipping number average value, the bit flipping number times maximum value and the bit flipping number minimum value of the target hard disk in the target temperature environment according to the group of bit flipping numbers;
determining a first bit flipping number interval and a second bit flipping number interval according to the bit flipping number average value, the bit flipping number large value and the bit flipping number minimum value, wherein the lower limit of the first bit flipping number interval is the bit flipping number minimum value, the upper limit of the first bit flipping number interval is the bit flipping number average value, the lower limit of the second bit flipping number interval is the bit flipping number average value, and the upper limit of the second bit flipping number interval is the bit flipping number large value;
determining the bit flip number threshold according to a first number of the group of bit flip numbers in the first bit flip number interval and a second number of the group of bit flip numbers in the second bit flip number interval.
5. The method of claim 4, wherein determining the bit flip threshold based on a first number of the set of bit flip numbers in the first bit flip number interval and a second number of the set of bit flip numbers in the second bit flip number interval comprises:
determining a pre-screening yield corresponding to the bit flipping number average value according to the first number and the second number, wherein the pre-screening yield represents a proportion of the number of hard disks of which the number of bad blocks does not exceed a preset number of bad blocks in the number of hard disks of the plurality of hard disks under the condition that the target hard disk is a plurality of hard disks;
and determining the bit flip number threshold according to the pre-screening yield.
6. The method of claim 5, wherein determining the bit flip number threshold according to the pre-screening yield comprises:
determining the bit flip number threshold according to the bit flip number average value, the bit flip number multiple maximum value and the first number under the condition that the pre-screening yield is less than or equal to a preset screening yield;
and under the condition that the pre-screening yield is greater than the preset screening yield, determining the bit flip number threshold according to the bit flip number average value, the bit flip number multiple maximum value and the second number.
7. The method according to claim 1, wherein after determining the block corresponding to the bit flipping number satisfying the preset condition with respect to the threshold bit flipping number as the bad block in the target hard disk, the method further comprises:
marking bad blocks in the target hard disk in the process of testing the target hard disk at the current time;
and in the process of testing the target hard disk at different environmental temperatures next time, the marked bad block is not tested.
8. The utility model provides a sieving mechanism of bad piece of hard disk which characterized in that includes:
the system comprises an acquisition module, a selection module and a selection module, wherein the acquisition module is used for acquiring a target hard disk to be tested, and the target hard disk consists of a plurality of blocks to be screened;
the processing module is used for performing read-write test on the target hard disk under a target temperature environment to obtain a group of bit flipping numbers, wherein the target temperature environment is a temperature environment in which the temperature difference between the target temperature environment and a preset temperature always exceeds a preset value, one bit flipping number in the group of bit flipping numbers corresponds to one block in the target hard disk, and the one bit flipping number represents an accumulated value of the number of bit 0 flipping to bit 1 and the number of bit 1 flipping to bit 0 in the read-write test process;
a first determining module, configured to determine a bit flipping number threshold according to the group of bit flipping numbers, where the bit flipping number threshold is determined by a bit flipping number average value and a bit flipping number maximum value of the group of bit flipping numbers;
and the second determining module is used for determining the block corresponding to the bit flipping number meeting the preset condition with the bit flipping number threshold as the bad block in the target hard disk.
9. A computer-readable storage medium, in which a computer program is stored, which computer program, when being executed by a processor, carries out the steps of the method according to any one of claims 1 to 7.
10. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the steps of the method as claimed in any of claims 1 to 7 are implemented when the computer program is executed by the processor.
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| CN116340076B (en) * | 2023-05-30 | 2023-10-17 | 深圳市晶存科技有限公司 | Hard disk performance test method, device and medium |
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