CN113643746B - Flash memory data analysis method and device, terminal equipment and storage medium - Google Patents
Flash memory data analysis method and device, terminal equipment and storage medium Download PDFInfo
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/38—Response verification devices
- G11C29/42—Response verification devices using error correcting codes [ECC] or parity check
Abstract
The application is suitable for the technical field of flash memories, and particularly relates to a flash memory data analysis method, a flash memory data analysis device, terminal equipment and a storage medium. The method comprises the steps of executing writing data on each flash memory block in the flash memory, recording the writing temperature when writing the data, reading the data in each flash memory block and recording the reading temperature when reading the data under a test temperature range, obtaining the identification information of the flash memory block with error reading, the bit number of the reading error corresponding to the flash memory block, the reading temperature and the writing temperature, generating an analysis table from the information of the flash memory block with error reading, realizing the test of the reading and writing performance of the flash memory, and obtaining the test result of each flash memory block more accurately according to the bit number of the reading error of the flash memory block under a temperature condition and combining the temperature condition so as to be used for judging the reliability of the flash memory.
Description
Technical Field
The present application belongs to the technical field of flash memories, and in particular, relates to a flash memory data analysis method, a flash memory data analysis device, a terminal device, and a storage medium.
Background
Flash memory, i.e., flash memory, has the advantages of fast access speed, high performance, low power consumption, etc., and is widely used in memory solutions. Along with the increase of the storage capacity of the flash memory, the number of bits of the storage unit in the flash memory is increased, so that the built-in error correction function of the flash memory cannot meet the requirement of guaranteeing the reliability of the flash memory, and therefore, in order to guarantee the reliability of the flash memory, the test of the read-write performance of the flash memory is particularly important.
Disclosure of Invention
In view of the above, the embodiments of the present application provide a method, an apparatus, a terminal device, and a storage medium for analyzing flash memory data, so as to solve the problem of testing the read-write performance of the flash memory.
In a first aspect, an embodiment of the present application provides a method for analyzing flash memory data, where a flash memory includes at least one flash memory block, the method includes:
writing data into each flash memory block, and recording the writing temperature when writing the data;
reading data in each flash memory block in a test temperature range, and recording the reading temperature when the data are read;
if the flash memory block with the reading error exists, acquiring identification information of the flash memory block with the reading error, and the bit number, the reading temperature and the writing temperature of the reading error corresponding to the flash memory block;
and generating an analysis table aiming at the flash memory block with the reading error according to the identification information of the flash memory block with the reading error and the bit number, the reading temperature and the writing temperature of the reading error corresponding to the flash memory block.
In a second aspect, an embodiment of the present application provides an analysis device for flash memory data, where a flash memory includes at least one flash memory block, the analysis device including:
the writing module is used for writing data into each flash memory block and recording the writing temperature when the data are written;
the reading module is used for reading the data in each flash memory block in a test temperature range and recording the reading temperature when the data are read;
the acquisition module is used for acquiring the identification information of the flash memory block with the reading error and the bit number, the reading temperature and the writing temperature of the reading error corresponding to the flash memory block if the flash memory block with the reading error exists;
and the generation module is used for generating an analysis table aiming at the flash memory block with the reading error according to the identification information of the flash memory block with the reading error, and the bit number, the reading temperature and the writing temperature of the reading error corresponding to the flash memory block.
In a third aspect, an embodiment of the present application provides a terminal device, the terminal device comprising a processor, a memory and a computer program stored in the memory and executable on the processor, the processor implementing the analysis method according to the first aspect when executing the computer program.
In a fourth aspect, embodiments of the present application provide a computer readable storage medium storing a computer program which, when executed by a processor, implements the analysis method according to the first aspect.
In a fifth aspect, an embodiment of the present application provides a computer program product for causing a terminal device to execute the analysis method as described in the first aspect above when the computer program product is run on the terminal device.
Compared with the prior art, the embodiment of the application has the beneficial effects that: the application executes writing data and records writing temperature when writing data for each flash memory block in the flash memory, reads the data in each flash memory block and records reading temperature when reading the data under the test temperature range, acquires the identification information of the flash memory block with error reading, the bit number of the reading error corresponding to the flash memory block, the reading temperature and the writing temperature, generates an analysis table for the information of the flash memory block with error reading, realizes the test of the reading and writing performance of the flash memory, and can more accurately obtain the test result of each flash memory block according to the bit number of the reading error of the flash memory block under the temperature condition and the temperature condition, thereby being used for judging the reliability of the flash memory.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the embodiments or the description of the prior art will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a flow chart of a method for analyzing flash memory data according to an embodiment of the application;
fig. 2 is a flow chart of a method for analyzing flash memory data according to a second embodiment of the present application;
fig. 3 is a schematic structural diagram of an analysis device for flash memory data according to a third embodiment of the present application;
fig. 4 is a schematic structural diagram of a terminal device according to a fourth embodiment of the present application.
Detailed Description
In the following description, for purposes of explanation and not limitation, specific details are set forth such as the particular system architecture, techniques, etc., in order to provide a thorough understanding of the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.
It should be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It should also be understood that the term "and/or" as used in the present specification and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes such combinations.
As used in the present description and the appended claims, the term "if" may be interpreted as "when..once" or "in response to a determination" or "in response to detection" depending on the context. Similarly, the phrase "if a determination" or "if a [ described condition or event ] is detected" may be interpreted in the context of meaning "upon determination" or "in response to determination" or "upon detection of a [ described condition or event ]" or "in response to detection of a [ described condition or event ]".
Furthermore, the terms "first," "second," "third," and the like in the description of the present specification and in the appended claims, are used for distinguishing between descriptions and not necessarily for indicating or implying a relative importance.
Reference in the specification to "one embodiment" or "some embodiments" or the like means that a particular feature, structure, or characteristic described in connection with the embodiment is included in one or more embodiments of the application. Thus, appearances of the phrases "in one embodiment," "in some embodiments," "in other embodiments," and the like in the specification are not necessarily all referring to the same embodiment, but mean "one or more but not all embodiments" unless expressly specified otherwise. The terms "comprising," "including," "having," and variations thereof mean "including but not limited to," unless expressly specified otherwise.
The terminal device in the embodiment of the present application may be a palm computer, a desktop computer, a notebook computer, an ultra-mobile personal computer (ultra-mobile personal computer, UMPC), a netbook, a cloud server, a personal digital assistant (personal digital assistant, PDA), or the like, and the embodiment of the present application does not limit the specific type of the terminal device.
It should be understood that the sequence number of each step in the foregoing embodiment does not mean that the execution sequence of each process should be determined by the function and the internal logic, and should not limit the implementation process of the embodiment of the present application.
In order to illustrate the technical scheme of the application, the following description is made by specific examples.
Referring to fig. 1, a flow chart of an analysis method of flash memory data according to an embodiment of the present application is provided, the analysis method is applied to a terminal device, the terminal device is connected to a flash memory, the flash memory includes at least one flash memory block, as shown in fig. 1, the analysis method may include the following steps:
step S101, writing data in each flash block, and recording the writing temperature when writing data.
The flash memory block may refer to a storage area in the flash memory, where addresses of the storage area range from a block head address to a block tail address, and is used for storing binary data. The flash memory block may include at least one sector, and data is written into each sector of the flash memory block in turn until all sectors of the flash memory block are written with data, and the temperature when the data is written is recorded, namely the writing temperature. The temperature may be sensed by a temperature sensor provided in the flash memory and may be recorded in degrees fahrenheit or celsius.
After the writing of the data in the current flash memory block is completed, detecting whether the next flash memory block is written with the data, if the next flash memory block is detected to be not written with the data, writing the data in the flash memory block, and recording the writing temperature.
When the flash memory is used for writing data, a corresponding hardware circuit is used for providing a gate voltage which is large enough, and electrons are driven into the floating gate through the tunneling effect of the oxide layer to finish the process of writing 0.
In order to calculate the number of error bits in the flash memory block, the application can adopt a hardware error detection and correction (Error Checking and Correction, ECC) algorithm, and a check redundancy code is added when writing data, so that the number of error bits can be detected according to the check redundancy code when reading data.
The application can also adopt a BCH algorithm or a low density parity check code (Low Density Parity Check Code, LDPC) algorithm to correct and record the bit number of the read error, and compared with a hardware ECC algorithm, the two algorithms have better error correction capability.
Optionally, the write temperatures of the different flash blocks are different.
After the current flash memory block finishes writing data under the first temperature condition, if the next flash memory block is detected to be not written with data, writing the data in the flash memory block under the second temperature condition, wherein the first temperature is not equal to the second temperature.
The first temperature condition and the second temperature condition may be created by a temperature control device external to the flash memory and detected by a temperature sensor in the flash memory. For example, when the temperature sensor detects a temperature corresponding to the first temperature condition, data is written in the current flash memory block, and the temperature is recorded.
In the application, if the flash memory is divided into N flash memory blocks, N temperature conditions are required to be set, the temperatures in the N temperature conditions are different, and the N flash memory blocks write data under the different temperature conditions respectively until all the flash memory blocks are written or all the temperature conditions are used. Therefore, the writing of data to the flash memory blocks under different temperature conditions can be ensured, the analysis result can be more accurate, and the method is suitable for more temperature environments.
Optionally, before writing the data in each flash block, the analysis method further includes:
the data of each flash block is erased.
In order to test and analyze the whole storage area of all the flash blocks in the flash memory, the data needs to be written into the whole flash memory, so that the data of each flash block in the flash memory is erased before the data is written. When the flash memory is erased, reverse voltage can be applied through the corresponding hardware circuit, electrons can come out of the oxide layer by utilizing tunneling effect, and the erasing function can be completed by removing 0.
Step S102, reading data in each flash memory block under the test temperature range, and recording the reading temperature when reading the data.
When reading data, the electrons are arranged in the floating gate, so that a reverse electric field is generated, the starting voltage is increased, the flash memory can be read by means of the characteristic, the voltage value of the gate electrode larger than the starting voltage is increased, the channel is conducted, the conducting current is generated, and whether the channel is 0 can be analyzed through the conducting current. And (3) checking the read data based on a hardware ECC algorithm, namely detecting according to a check redundancy code, so as to determine the bit number of the read error.
The test temperature range may be a set temperature range, wherein the temperature range may be a range of a low temperature and a high temperature, and the temperature range may also refer to a temperature value. Similarly, temperature conditions are created through temperature control equipment outside the flash memory, the temperature is detected through a temperature sensor in the flash memory, when the temperature sensor detects that the temperature is in a test temperature range, data of a flash memory block are read, and the temperature at the moment is recorded to be the read temperature.
After the current flash memory block is read, detecting whether the next flash memory block is read, if the next flash memory block is not read, reading the data of the flash memory block in a test temperature range, and recording the reading temperature. At this time, the read temperature of the current flash memory block may be the same as or different from the read temperature of the next flash memory block, but both read temperatures need to be within the test temperature range.
In the application, the terminal equipment can write data into all the flash memory blocks in the flash memory in sequence, and read all the flash memory blocks after writing the data, or the terminal equipment writes data into one flash memory block in the flash memory and reads the flash memory block after writing the data.
Step S103, if the flash memory block with the error reading exists, the identification information of the flash memory block with the error reading and the bit number, the reading temperature and the writing temperature of the corresponding reading error of the flash memory block are obtained.
The identification information of the flash memory block, the bit number of the read error, the read temperature and the write temperature are obtained aiming at the flash memory block with the read error, so that the method can be used for analyzing the specific situation of the error of the flash memory block. If a plurality of flash memory blocks with read errors exist in the flash memory, information corresponding to all the flash memory blocks with read errors needs to be acquired.
The writing temperature is the temperature recorded when the data is written, and the reading temperature is the temperature recorded when the data is read, so that the temperature data can be directly obtained from the recording.
The identification information of the flash block may refer to an identification capable of uniquely determining the flash block, and the identification information may be stored as intrinsic data of the flash block in a block header of the flash block. For example, the identification information may be a block number of a flash memory block, and the block number may be a reference number made when the flash memory is partitioned.
The number of bits of the read error is detected and counted based on a hardware ECC algorithm in the process of reading, and the number of bits of the read error can be recorded after reading.
Step S104, according to the identification information of the flash memory block with the error reading, and the bit number, the reading temperature and the writing temperature of the reading error corresponding to the flash memory block, an analysis table aiming at the flash memory block with the error reading is generated.
The identification information, the corresponding bit number, the reading temperature and the writing temperature are respectively filled into different cells of one row or one column in the analysis table, namely, one flash memory block with reading error corresponds to one row or one column in the analysis table, and if a plurality of flash memory blocks with reading error exist, the analysis table has a plurality of rows or a plurality of columns.
The analysis table can be an EXCL table and can be opened in the terminal equipment or displayed on the display equipment, so that information of a flash memory block with a read error can be intuitively and visually observed, and a test result of the read-write performance of the flash memory is obtained.
Optionally, after generating the analysis table for the flash block with the read error, the analysis method further includes:
according to the analysis table, a visual view is generated for showing identification information of the flash memory block of the read error, the bit number of the read error, the read temperature and the write temperature.
The visual view may be a histogram, a line graph, a pie chart, etc., the analysis table includes identification information, a bit number, a read temperature, and a write temperature, one parameter is taken as an independent variable, the other parameters are taken as dependent variables, and a trend graph of the other parameters changing along with the parameter changes may be obtained, and the trend graph may be a histogram or a line graph.
For example, with the writing temperature as an argument, the number of bits of the reading error as an argument, a trend graph of the number of bits of the reading error as a function of the writing temperature can be generated by fitting to two sets of data; for another example, the data points in the trend graph may be marked according to the identification information, which may be used to intuitively display the identification of the flash memory block with the read error corresponding to the data point, and similarly, the data points in the trend graph may also be marked according to the read temperature.
The embodiment of the application executes the writing data for each flash memory block in the flash memory and records the writing temperature when the writing data is recorded, reads the data in each flash memory block and records the reading temperature when the data is read under the test temperature range, acquires the identification information of the flash memory block with error reading, the bit number of the reading error corresponding to the flash memory block, the reading temperature and the writing temperature, generates an analysis table for the information of the flash memory block with error reading, realizes the reading and writing performance test of the flash memory, and can more accurately obtain the test result of each flash memory block according to the bit number of the reading error of the flash memory block under the temperature condition in combination with the temperature condition so as to be used for judging the reliability of the flash memory.
Referring to fig. 2, a flow chart of a method for analyzing flash data according to a second embodiment of the present application is shown in fig. 2, where the method for analyzing flash data may include the following steps:
in step S201, data is written in each flash block, and the writing temperature at the time of writing the data is recorded.
Step S202, reading data in each flash memory block under the test temperature range, and recording the reading temperature when reading the data.
In step S203, if there is a flash memory block with a read error, the identification information of the flash memory block with a read error, and the number of bits, the read temperature and the write temperature of the read error corresponding to the flash memory block are obtained.
The content types of steps S201 to S203 are the same as those of steps S101 to S103, and reference may be made to the descriptions of steps S101 to S103, which are not repeated here.
Step S204, the identification information of the flash memory block with error reading, the bit number of the reading error, the reading temperature and the writing temperature corresponding to the flash memory block are saved as a character separation value CSV format file through serial port printing.
For flash memories such as serial flash memories, which need information to be output in a serial print format, the output information needs to be saved as a Character Separation Value (CSV) format file through serial printing. The CSV format file stores form data in plain text form, and is composed of any number of records separated by a certain line feed, each record is composed of fields, and the separators among the fields are other characters or character strings, most commonly commas or tab symbols.
The identification information of the flash memory block with the read error, the bit number of the read error, the read temperature and the write temperature are all recorded in the form of fields in the CSV format file.
Step S205, according to the CSV format file, an analysis table for the flash memory block with error reading is generated.
Since the CSV format file is a character sequence of a plurality of rows, the information of the flash memory block with the read error cannot be clearly indicated, and therefore, the information needs to be converted into an analysis table, and the analysis table can correspond the identification information to the corresponding bit number of the read error, the read temperature and the write temperature, that is, the identification information of one flash memory block and the corresponding bit number of the read error, the read temperature and the write temperature are taken as one row or one column.
For example, converting the CSV format file into the EXCL table file, where if the CSV format file includes the identification information of multiple flash blocks and the corresponding bit number of the read error, the read temperature and the write temperature, then multiple columns exist in the EXCL table file, each column corresponds to one flash block, and four rows of cells exist in one column, which are respectively the identification information, the bit number, the read temperature and the write temperature.
Optionally, generating the analysis table for the flash block with the read error according to the CSV format file includes:
and reading the CSV format file through the lua script command, and converting the data in the CSV format file into an analysis table aiming at the flash memory block with the reading error.
The lua script command is a pre-developed script file, the script file can identify separators in the CSV format file, and fields divided by the separators in one row are respectively filled in continuous cells in one row of the table.
According to the embodiment of the application, the data to be output in the serial port printing form is processed to obtain the analysis table, so that the automatic generation of the chart is realized, the manual intervention, the manual statistics and the calculation can be reduced to the maximum extent, the data destruction is avoided, and the efficiency and the accuracy of the data analysis are effectively improved.
Fig. 3 shows a block diagram of a device for analyzing flash data according to a third embodiment of the present application, where the device is applied to a terminal device, and the terminal device is connected to a flash memory, and the flash memory includes at least one flash memory block, and only a portion related to the embodiment of the present application is shown for convenience of explanation.
Referring to fig. 3, the analysis apparatus includes:
a writing module 31 for writing data in each flash block and recording a writing temperature when writing data;
a reading module 32, configured to read data in each flash memory block in a test temperature range, and record a reading temperature when the data is read;
the obtaining module 33 is configured to obtain, if a flash memory block with a read error exists, identification information of the flash memory block with the read error, and a bit number, a read temperature, and a write temperature of the read error corresponding to the flash memory block;
the analysis table generation module 34 is configured to generate an analysis table for the flash memory block with the read error according to the identification information of the flash memory block with the read error and the bit number, the read temperature and the write temperature of the read error corresponding to the flash memory block.
Optionally, the write temperatures of the different flash blocks are different.
Optionally, the analysis table generation module 34 includes:
the serial port printing unit is used for printing and storing the identification information of the flash memory block with the error reading, the bit number of the reading error, the reading temperature and the writing temperature corresponding to the flash memory block into a character separation value CSV format file through a serial port;
and the analysis table generation unit is used for generating an analysis table aiming at the flash memory block with the reading error according to the CSV format file.
Optionally, the generating unit is specifically configured to:
and reading the CSV format file through the lua script command, and converting the data in the CSV format file into an analysis table aiming at the flash memory block with the reading error.
Optionally, the analysis device further includes:
and the erasing module is used for erasing the data of each flash memory block before the data is written in each flash memory block.
Optionally, the analysis device further includes:
and the visual view generation module is used for generating a visual view according to the analysis table after generating the analysis table for the flash memory block with the read error, and the visual view is used for showing the identification information of the flash memory block with the read error, the bit number of the read error, the read temperature and the write temperature.
It should be noted that, because the content of information interaction and execution process between the modules and the embodiment of the method of the present application are based on the same concept, specific functions and technical effects thereof may be referred to in the method embodiment section, and details thereof are not repeated herein.
Fig. 4 is a schematic structural diagram of a terminal device according to a fourth embodiment of the present application. As shown in fig. 4, the terminal device 4 of this embodiment includes: at least one processor 40 (only one is shown in fig. 4), a memory 41, and a computer program 42 stored in the memory 41 and executable on the at least one processor 40, the steps in any of the respective method embodiments of analyzing flash data described above being implemented when the computer program 42 is executed by the processor 40.
The terminal device 4 may include, but is not limited to, a processor 40, a memory 41. It will be appreciated by those skilled in the art that fig. 4 is merely an example of the terminal device 4 and is not meant to be limiting as to the terminal device 4, and may include more or fewer components than shown, or may combine certain components, or different components, such as may also include input-output devices, network access devices, etc.
The processor 40 may be a CPU, the processor 40 may also be other general purpose processors, digital signal processors (Digital Signal Processor, DSP), application specific integrated circuits (Application Specific Integrated Circuit, ASIC), off-the-shelf programmable gate arrays (Field-Programmable Gate Array, FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or the like. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
The memory 41 may in some embodiments be an internal storage unit of the terminal device 4, such as a hard disk or a memory of the terminal device 4. The memory 41 may in other embodiments also be an external storage device of the terminal device 4, such as a plug-in hard disk provided on the terminal device 4, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash Card (Flash Card) or the like. Further, the memory 41 may also include both an internal storage unit of the terminal device 4 and an external storage device. The memory 41 is used to store an operating system, application programs, boot loader (BootLoader), data, and other programs and the like, such as program codes of computer programs and the like. The memory 41 may also be used to temporarily store data that has been output or is to be output.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-described division of the functional units and modules is illustrated, and in practical application, the above-described functional distribution may be performed by different functional units and modules according to needs, i.e. the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-described functions. The functional units and modules in the embodiment may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit, where the integrated units may be implemented in a form of hardware or a form of a software functional unit. In addition, the specific names of the functional units and modules are only for distinguishing from each other, and are not used for limiting the protection scope of the present application. The specific working process of the units and modules in the above device may refer to the corresponding process in the foregoing method embodiment, which is not described herein again. The integrated units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer readable storage medium. Based on such understanding, the present application may implement all or part of the flow of the method of the above-described embodiment, and may be implemented by a computer program to instruct related hardware, and the computer program may be stored in a computer readable storage medium, where the computer program, when executed by a processor, may implement the steps of the method embodiment described above. Wherein the computer program comprises computer program code, which may be in the form of source code, object code, executable files or in some intermediate form, etc. The computer readable medium may include at least: any entity or device capable of carrying computer program code, a recording medium, a computer Memory, a Read-Only Memory (ROM), a random access Memory (Random Access Memory, RAM), an electrical carrier signal, a telecommunications signal, and a software distribution medium. Such as a U-disk, removable hard disk, magnetic or optical disk, etc. In some jurisdictions, computer readable media may not be electrical carrier signals and telecommunications signals in accordance with legislation and patent practice.
The present application may also be implemented by a computer program product for implementing all or part of the steps of the method embodiments described above, when the computer program product is run on a terminal device, causing the terminal device to execute the steps of the method embodiments described above.
In the foregoing embodiments, the descriptions of the embodiments are emphasized, and in part, not described or illustrated in any particular embodiment, reference is made to the related descriptions of other embodiments.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus/terminal device and method may be implemented in other manners. For example, the apparatus/terminal device embodiments described above are merely illustrative, e.g., the division of modules or units is merely a logical function division, and there may be additional divisions when actually implemented, e.g., multiple units or components may be combined or integrated into another system, or some features may be omitted or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection via interfaces, devices or units, which may be in electrical, mechanical or other forms.
The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed over a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
The above embodiments are only for illustrating the technical solution of the present application, and are not limiting; although the application has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present application, and are intended to be included in the scope of the present application.
Claims (8)
1. A method of analyzing flash data, wherein the flash memory includes at least one flash block, the method comprising:
writing data into each flash memory block, and recording the writing temperature when the data is written, wherein the writing temperatures of different flash memory blocks are different;
reading data in each flash memory block in a test temperature range, and recording the reading temperature when the data are read;
if the flash memory block with the reading error exists, acquiring identification information of the flash memory block with the reading error, and the bit number, the reading temperature and the writing temperature of the reading error corresponding to the flash memory block;
and generating an analysis table aiming at the flash memory block with the reading error according to the identification information of the flash memory block with the reading error and the bit number, the reading temperature and the writing temperature of the reading error corresponding to the flash memory block.
2. The analysis method according to claim 1, wherein the generating the analysis table for the flash memory block with the read error according to the identification information of the flash memory block with the read error and the bit number, the read temperature, and the write temperature of the read error corresponding to the flash memory block includes:
the identification information of the flash memory block with the error reading and the bit number, the reading temperature and the writing temperature of the reading error corresponding to the flash memory block are printed and stored as a character separation value CSV format file through a serial port;
and generating an analysis table aiming at the flash memory block with the reading error according to the CSV format file.
3. The method of claim 2, wherein generating an analysis table for the read erroneous flash block from the CSV format file comprises:
and reading the CSV format file through a lua script command, and converting the data in the CSV format file into an analysis table aiming at the flash memory block with the reading error.
4. The method of analysis of claim 1, wherein prior to writing data in each flash block, the method of analysis further comprises:
and erasing the data of each flash memory block.
5. The analysis method according to any one of claims 1 to 4, characterized in that after generating an analysis table for the read-erroneous flash block, the analysis method further comprises:
and generating a visual view according to the analysis table, wherein the visual view is used for showing the identification information of the flash memory block with the read-out error, the bit number of the read-out error, the read temperature and the write-in temperature.
6. An analysis device for flash data, wherein a flash memory includes at least one flash block, the analysis device comprising:
the writing module is used for writing data into each flash memory block, recording the writing temperature when the data is written, and the writing temperatures of different flash memory blocks are different;
the reading module is used for reading the data in each flash memory block in a test temperature range and recording the reading temperature when the data are read;
the acquisition module is used for acquiring the identification information of the flash memory block with the reading error and the bit number, the reading temperature and the writing temperature of the reading error corresponding to the flash memory block if the flash memory block with the reading error exists;
and the generation module is used for generating an analysis table aiming at the flash memory block with the reading error according to the identification information of the flash memory block with the reading error, and the bit number, the reading temperature and the writing temperature of the reading error corresponding to the flash memory block.
7. A terminal device, characterized in that it comprises a processor, a memory and a computer program stored in the memory and executable on the processor, which processor, when executing the computer program, implements the analysis method according to any of claims 1 to 5.
8. A computer readable storage medium storing a computer program, characterized in that the computer program, when executed by a processor, implements the analysis method according to any one of claims 1 to 5.
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| CN114267402B (en) * | 2021-11-22 | 2022-11-18 | 上海芯存天下电子科技有限公司 | Bad storage unit testing method, device, equipment and storage medium of flash memory |
| CN114822677B (en) * | 2022-05-20 | 2023-05-09 | 深圳市金胜电子科技有限公司 | Information recording method and device of NAND flash memory chip, electronic equipment and medium |
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