CN112185453A - Read interference test method and device, computer readable storage medium and electronic equipment - Google Patents
Read interference test method and device, computer readable storage medium and electronic equipment Download PDFInfo
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- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
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- G11C29/42—Response verification devices using error correcting codes [ECC] or parity check
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C2029/4402—Internal storage of test result, quality data, chip identification, repair information
Abstract
The invention discloses a read interference test method, a device, a computer readable storage medium and an electronic device, determining a block to be tested of the flash memory to be tested and a corresponding area to be read according to the input test data, continuously reading the area to be read until the actual ECC value of the block to be tested is larger than the preset ECC value, outputting the test result, by an automatic test mode, the stability of blocks corresponding to different read times under the continuous read operation of the flash memory to be tested is effectively detected, thereby obtaining a threshold value of the reading times which can clearly require data moving or refreshing in the aspect of data security processing of the flash memory, the test comparison action is realized in an automatic mode, the automatic test of the reading interference is realized, the test efficiency is improved, and moreover, visual test results can be output, and characteristic analysis and later algorithm debugging of the flash memory are facilitated.
Description
Technical Field
The present invention relates to the field of testing, and in particular, to a method and an apparatus for testing read disturb, a computer-readable storage medium, and an electronic device.
Background
For NAND (computer flash memory) there is Read Disturb (Read Disturb), i.e. when a page is Read, it will Disturb other pages in the same block. As the NAND update iterates, the number of pages in a block is greater, and the more information a memory cell stores, the greater the read disturb read occurs.
The NAND has the characteristic of read interference, so that the read times of the current block need to be recorded, and when the read times exceed a threshold value, the data in the block is moved, so that the data loss is avoided, or the data on the block is refreshed. It is important to acquire a threshold value for which a relocation or refresh operation is required.
However, the conventional method for obtaining the threshold value is generally manual operation, which consumes manpower and is not efficient.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: the reading interference testing method and device, the computer readable storage medium and the electronic equipment are provided, so that the automatic testing of the reading interference is realized, and the testing efficiency is improved.
In order to solve the technical problems, the invention adopts a technical scheme that:
a read disturb test method, comprising the steps of:
receiving test parameters, wherein the test parameters comprise block information, page information and a preset ECC value;
acquiring equipment information of a flash memory to be tested, and determining a block to be tested of the flash memory to be tested and a corresponding region to be read according to the block information, the page information and the equipment information;
erasing and writing the block to be tested;
and continuously reading the area to be read until the actual ECC value of the block to be tested is larger than the preset ECC value, and outputting a test result.
In order to solve the technical problem, the invention adopts another technical scheme as follows:
a read disturb test device, comprising the steps of:
the device comprises a receiving module, a processing module and a processing module, wherein the receiving module is used for receiving test parameters, and the test parameters comprise block information, page information and a preset ECC value;
the acquisition module is used for acquiring the equipment information of the flash memory to be tested and determining the block to be tested of the flash memory to be tested and the corresponding area to be read according to the block information, the page information and the equipment information;
the erasing module is used for erasing and writing the block to be tested;
and the reading module is used for continuously reading the area to be read until the actual ECC value of the block to be tested is larger than the preset ECC value, and outputting a test result.
In order to solve the technical problem, the invention adopts another technical scheme as follows:
a computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of a read disturb test method as described above.
In order to solve the technical problem, the invention adopts another technical scheme as follows:
an electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the steps of a read disturb test method as described above when executing the computer program.
The invention has the beneficial effects that: the method comprises the steps of determining a block to be tested of the flash memory to be tested and a corresponding area to be read according to input test data, continuously reading the area to be read until the actual ECC value of the block to be tested is larger than a preset ECC value, outputting a test result, and effectively detecting the stability of the block corresponding to different reading times under continuous reading operation of the flash memory to be tested in an automatic test mode, so that a threshold value of the reading times which can definitely need data moving or refreshing is obtained in data safety processing of the flash memory, test comparison action is realized in the automatic mode, automatic test of reading interference is realized, test efficiency is improved, visual test results can be output, and characteristic analysis and later algorithm debugging of the flash memory are facilitated.
Drawings
FIG. 1 is a flowchart illustrating steps of a read disturb test method according to an embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a read disturb test apparatus according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of an electronic device according to an embodiment of the present invention;
fig. 4 is a flowchart illustrating detailed steps of a read disturb test method according to an embodiment of the present invention.
Detailed Description
In order to explain technical contents, achieved objects, and effects of the present invention in detail, the following description is made with reference to the accompanying drawings in combination with the embodiments.
Referring to fig. 1, an embodiment of the present invention provides a read disturb testing method, including:
receiving test parameters, wherein the test parameters comprise block information, page information and a preset ECC value;
acquiring equipment information of a flash memory to be tested, and determining a block to be tested of the flash memory to be tested and a corresponding region to be read according to the block information, the page information and the equipment information;
erasing and writing the block to be tested;
and continuously reading the area to be read until the actual ECC value of the block to be tested is larger than the preset ECC value, and outputting a test result.
From the above description, the beneficial effects of the present invention are: the method comprises the steps of determining a block to be tested of the flash memory to be tested and a corresponding area to be read according to input test data, continuously reading the area to be read until the actual ECC value of the block to be tested is larger than a preset ECC value, outputting a test result, and effectively detecting the stability of the block corresponding to different reading times under continuous reading operation of the flash memory to be tested in an automatic test mode, so that a threshold value of the reading times which can definitely need data moving or refreshing is obtained in data safety processing of the flash memory, test comparison action is realized in the automatic mode, automatic test of reading interference is realized, test efficiency is improved, visual test results can be output, and characteristic analysis and later algorithm debugging of the flash memory are facilitated.
Further, the block information includes a block number, and the page information includes a page number;
the determining the block to be tested of the flash memory to be tested and the corresponding area to be read according to the block information, the page information and the equipment information comprises:
determining physical block information of the flash memory to be tested according to the equipment information, retrieving in the physical block information according to the block number, and determining a block to be tested of the flash memory to be tested;
and searching in the determined block to be tested according to the page number, and determining a region to be read of the block to be tested.
As can be seen from the above description, the block number and the page number in the received test parameters are retrieved from the acquired device information, and when the block number and the page number are retrieved, the block number is retrieved first, and then the page number is retrieved, which not only can avoid the error operation on the non-existent block, improve the effectiveness and reliability of the operation, but also improve the hit rate of the retrieval.
Further, the block information includes a starting block number, a starting page number, and a page number;
the determining the block to be tested of the flash memory to be tested and the corresponding area to be read according to the block information, the page information and the equipment information comprises:
determining physical block information of the flash memory to be tested according to the equipment information, retrieving in the physical block information according to the initial block number, and determining an initial block to be tested of the flash memory to be tested;
determining a block to be tested according to the initial block to be tested and the number of blocks;
searching in each determined block to be tested according to the starting page number, and determining a starting page to be read of each block to be tested;
and determining a region to be read corresponding to each block to be tested according to the initial page to be read of each block to be tested and the page number, wherein each region to be read comprises a plurality of pages.
As can be seen from the above description, by setting the starting block number, the starting page number, and the page number in the block information, data reading can be performed on a plurality of data blocks in one reading operation, so that a test on a plurality of data blocks at one time is realized, and the test efficiency is further improved.
Further, the test parameters further include a read length;
the performing continuous reading operation on the area to be read comprises:
and continuously accessing the same address from the initial address of the area to be read according to the read length and executing the read operation.
As can be seen from the above description, repeated read operations of the data block are realized by sequentially accessing and reading the same address, and the read operations are performed for the same address, so that the speed of continuous read can be increased, and the test efficiency is improved.
Further, the performing continuous reading operation on the area to be read includes:
performing continuous reading operation on the area to be read of each block to be tested;
when each reading operation is executed, selecting one block from the blocks to be tested according to a random sequence, and randomly selecting one page from the area to be read of the selected block for reading until all the blocks to be tested are traversed.
According to the description, when a plurality of data blocks are read in one reading operation, the data blocks can be selected and read in a random sequence in one reading operation, and the area to be read of each data block comprises a plurality of data pages.
Further, the test parameters further comprise a checking frequency;
the continuously reading the area to be read until the actual ECC value of the block to be tested is larger than the preset ECC value, and outputting the test result comprises:
in the process of continuously reading the area to be read, acquiring an actual ECC value of a block to be tested according to the inspection frequency, and comparing the actual ECC value with the preset ECC value;
and judging whether the actual ECC value is larger than the preset ECC value, if so, outputting a test result, and if not, returning to execute the step of continuously reading the area to be read.
As can be seen from the above description, by setting the check frequency, and obtaining and comparing the actual ECC value according to the check frequency, the test efficiency can be improved, and a comparison performed after one read operation is performed is avoided.
Further, the method also comprises the step of storing the test result;
the test result comprises ECC values corresponding to the blocks to be tested under different read operation times.
From the above description, it can be known that, by storing and outputting the ECC value for the block to be tested under different read operation times, correspondence between the read times of the specific block and the block instability can be performed, so as to know how many times the current flash memory is read to become unstable, and obtain an exact continuous time limit.
Referring to fig. 2, another embodiment of the present invention provides a read disturb test apparatus, including:
the device comprises a receiving module, a processing module and a processing module, wherein the receiving module is used for receiving test parameters, and the test parameters comprise block information, page information and a preset ECC value;
the acquisition module is used for acquiring the equipment information of the flash memory to be tested and determining the block to be tested of the flash memory to be tested and the corresponding area to be read according to the block information, the page information and the equipment information;
the erasing module is used for erasing and writing the block to be tested;
and the reading module is used for continuously reading the area to be read until the actual ECC value of the block to be tested is larger than the preset ECC value, and outputting a test result.
Another embodiment of the present invention provides a computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, implements the steps of a read disturb test method as described above.
Referring to fig. 3, another embodiment of the present invention provides an electronic device, which includes a memory, a processor, and a computer program stored in the memory and running on the processor, wherein the processor implements the steps of the read disturb test method when executing the computer program.
The read interference test method, device, computer-readable storage medium and electronic device of the present invention can be applied to any NAND flash memory that needs to be subjected to read interference test, such as SLC (Single-level Cell), MLC (Multi-level Cell), eMLC (enhanced Multi-level Cell), TLC (Triple-level Cell, three-layer Cell), and the following are described by specific embodiments:
example one
In this embodiment, an automated test of read disturb on a specific NAND flash memory can be implemented by developing a test software, which can be developed based on an MFC framework and mainly includes the following processes: 1. writing test data by a user; 2. writing test parameters by a user; 3. testing the NAND flash memory to be tested; 4. the obtaining of the test result data, as shown in fig. 4, specifically includes the steps of:
s1, a user firstly opens the software, and then writes test data in a test data input box, namely writes a NAND flash memory mark to be tested and the like, so that the test software can clearly test which specific NAND flash memory block;
s2, receiving test parameters input by a user, wherein the test parameters can be freely set in an operation page of test software, and the test parameters comprise block information, page information and a preset ECC value;
wherein, the ECC (error Correction code) value indicates the stability of the corresponding block, which is the error check and Correction of data, and the ECC value will increase every time data is erroneous and corrected;
the predetermined ECC value is determined by the NAND verification capability and is generally set to eighty percent of the verification limit;
in this implementation, the block information includes a block number, and the page information includes a page number;
determining physical block information of the flash memory to be tested according to the equipment information, retrieving in the physical block information according to the block number, and determining a block to be tested of the flash memory to be tested;
searching in the determined block to be tested according to the page number, and determining a region to be read of the block to be tested;
specifically, device information of the NAND flash memory to be tested is obtained through a GetDeviceInfo () function, including required physical blocks, page information, capacity size, and the like;
s3, erasing and writing the block to be tested;
s31, erasing a Block to be tested through pWnd- > PhyEraseBlock (Block, Count), wherein Block represents the Block number to be operated, Count represents the number of the Block operated this time, in this embodiment, the number of the Block to be operated is 1, and Count value is 1, because of the NAND characteristic, before the Block is written, the Block is erased for the following writing operation;
s32, writing a Block to be tested through pWnd- > PhyWrite (Block, Count), wherein the Block represents the Block number to be operated, the Count represents the number of the Block operated at this time, information is written into the selected Block, and the filled information content is some default data, generally the address information of the Block, so that the subsequent information reading action is facilitated;
s4, continuously reading the area to be read until the actual ECC value of the block to be tested is larger than the preset ECC value, and outputting a test result;
wherein the test parameters further include a read length;
continuously accessing the same address from the initial address of the area to be read according to the read length and executing read operation;
specifically, by pWnd- > OnlyRLba (LbaStartAddr, LbaLen), LbaStartAddr represents the start address of reading, LbaLen: and the reading length is expressed (the reading length is below 32k and is greater than 32k, the same address cannot be continuously accessed), repeated reading operation is carried out on the selected area, when the actual ECC value of the block to be tested is detected to be greater than the preset ECC value, the reading operation is stopped, the current actual ECC value and the execution times of the reading operation corresponding to the actual ECC value are recorded, the test result is output, and the threshold value of the reading times needing data moving or refreshing can be intuitively determined through the test result.
Example two
The difference between the first embodiment and the second embodiment is that the first embodiment can test a plurality of data blocks at a time, that is, when reading data each time, a plurality of data blocks are read, so that the test efficiency can be further improved, and meanwhile, when reading data of each block, a plurality of data pages are randomly selected and closer to an actual data reading scene, specifically:
the block information comprises a starting block number, a starting page number and a page number;
the determining the block to be tested of the flash memory to be tested and the corresponding area to be read according to the block information, the page information and the equipment information comprises:
determining physical block information of the flash memory to be tested according to the equipment information, retrieving in the physical block information according to the initial block number, and determining an initial block to be tested of the flash memory to be tested;
determining the blocks to be tested according to the initial blocks to be tested and the number of the blocks, wherein the data blocks with the number of the continuous blocks after the initial blocks are all the blocks to be tested;
searching in each determined block to be tested according to the starting page number, and determining a starting page to be read of each block to be tested;
determining a to-be-read area corresponding to each block to be tested according to the to-be-read starting page and the page number of each block to be tested, wherein each to-be-read area comprises a plurality of pages;
the performing continuous reading operation on the area to be read comprises:
performing continuous reading operation on the area to be read of each block to be tested;
when each reading operation is executed, selecting one block from the blocks to be tested according to a random sequence, and randomly selecting one page from the area to be read of the selected block for reading until all the blocks to be tested are traversed;
for example, the number of the data block to be tested at this time is block2-block8, and the corresponding areas to be read are all pages 23-page35, each block of block2-block8 is selected in a random order when reading operation is performed each time, and for each block, one page of page23-page35 is selected as an initial address at random, and data reading is performed according to a preset reading length; after one reading operation is finished, the next reading operation is carried out again, and the operation is repeatedly executed;
when the test result is output and stored, the test result includes the identifier of each data block, the corresponding read times and the corresponding ECC value, i.e. the corresponding ECC value under different read times of different data blocks is displayed;
and when the actual ECC value reaches or exceeds the preset ECC value, stopping the reading operation of the data block corresponding to the actual ECC value, outputting the test result of the data block, and for other data blocks of which the actual ECC value does not reach or exceed the preset ECC value, continuously executing continuous reading operation until the actual ECC values of all the data blocks reach or exceed the preset ECC value, and stopping the running of the test software.
EXAMPLE III
The implementation is different from the first embodiment or the second embodiment in that the test parameters are further defined to further include a checking frequency;
the continuously reading the area to be read until the actual ECC value of the block to be tested is larger than the preset ECC value, and outputting the test result comprises:
in the process of continuously reading the area to be read, acquiring an actual ECC value of a block to be tested according to the inspection frequency, and comparing the actual ECC value with the preset ECC value;
judging whether the actual ECC value is larger than the preset ECC value or not, if so, outputting a test result, and if not, returning to execute the step of continuously reading the area to be read;
as shown in fig. 4, after data reading is performed on the selected area, it is determined whether a time for checking is reached, if yes, an actual ECC value is obtained and compared with a preset ECC value, and if not, a read operation is returned to;
for example, if the checking frequency is set to 1 ten thousand times, after ten thousand read operations are performed, the actual ECC value corresponding to the data block currently read once is obtained, and then the actual ECC value is compared with the preset ECC value;
in an optional embodiment, the check frequency may be dynamically set, and in an actual running process of the software, the check frequency may be adaptively changed according to a comparison result of the actual ECC value, for example, when a difference between the actual ECC value and the preset ECC value of a data block is smaller than a preset value, the check frequency corresponding to the data block is adjusted, and the check frequency is reduced to a preset check frequency value by a preset adjustment amplitude, for example, 1 ten thousand per time may be adjusted to 8 thousand per time, so that a threshold of the number of reads that need to perform data migration or refresh may be more accurately determined.
Example four
Referring to fig. 2, a read disturb test apparatus includes:
the device comprises a receiving module, a processing module and a processing module, wherein the receiving module is used for receiving test parameters, and the test parameters comprise block information, page information and a preset ECC value;
the acquisition module is used for acquiring the equipment information of the flash memory to be tested and determining the block to be tested of the flash memory to be tested and the corresponding area to be read according to the block information, the page information and the equipment information;
the erasing module is used for erasing and writing the block to be tested;
and the reading module is used for continuously reading the area to be read until the actual ECC value of the block to be tested is larger than the preset ECC value, stopping the reading operation and outputting a test result.
EXAMPLE five
A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, implements the steps of a read disturb test method as described in any one of the first to third embodiments.
EXAMPLE six
Referring to fig. 3, an electronic device includes a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor executes the computer program to implement the steps of a read disturb test method according to any one of the first to third embodiments.
In summary, the read disturb testing method, apparatus, computer readable storage medium and electronic device provided by the present invention determine a block to be tested of a flash memory to be tested and a corresponding region to be read of the block according to input testing data, perform continuous read operations on the region to be read, obtain an actual ECC value corresponding to the block to be tested according to a check frequency, compare the actual ECC value with a preset ECC value until the actual ECC value of the block to be tested is greater than the preset ECC value, output a testing result, and test a plurality of data blocks at one time, efficiently detect the stability of blocks corresponding to different read times under continuous read operations of the flash memory to be tested by an automatic testing method, achieve correspondence between the read times of the block to be tested and the block instability, thereby know how many times the block of the current NAND will become unstable through reading, and obtain an exact continuous read time limit, the method can acquire a threshold value of the number of reading times for clearly determining the data moving or refreshing, can prevent the data in the flash memory from being lost when the limit is reached quickly in the aspect of data safety processing of the flash memory, realizes test comparison actions in an automatic mode, realizes automatic test of reading interference, improves test efficiency, can output visual test results, and is convenient for characteristic analysis and later algorithm debugging of the flash memory.
In the above embodiments provided in the present application, it should be understood that the disclosed method, apparatus, computer-readable storage medium, and electronic device may be implemented in other ways. For example, the above-described apparatus embodiments are merely illustrative, and for example, the division of the modules is only one logical division, and other divisions may be realized in practice, for example, a plurality of components or modules may be combined or integrated into another apparatus, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or components or modules, and may be in an electrical, mechanical or other form.
The components described as separate parts may or may not be physically separate, and parts displayed as components may or may not be physical modules, may be located in one place, or may be distributed on a plurality of network modules. Some or all of the components can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional modules in the embodiments of the present invention may be integrated into one processing module, or each component may exist alone physically, or two or more modules are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode.
The integrated module, if implemented in the form of a software functional module and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
It should be noted that, for the sake of simplicity, the above-mentioned method embodiments are described as a series of acts or combinations, but those skilled in the art should understand that the present invention is not limited by the described order of acts, as some steps may be performed in other orders or simultaneously according to the present invention. Further, those skilled in the art will appreciate that the embodiments described in the specification are presently preferred and that no acts or modules are necessarily required of the invention.
In the above embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all equivalent changes made by using the contents of the present specification and the drawings, or applied directly or indirectly to the related technical fields, are included in the scope of the present invention.
The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all equivalent changes made by using the contents of the present specification and the drawings, or applied directly or indirectly to the related technical fields, are included in the scope of the present invention.
Claims (10)
1. A read disturb test method, comprising the steps of:
receiving test parameters, wherein the test parameters comprise block information, page information and a preset ECC value;
acquiring equipment information of a flash memory to be tested, and determining a block to be tested of the flash memory to be tested and a corresponding region to be read according to the block information, the page information and the equipment information;
erasing and writing the block to be tested;
and continuously reading the area to be read until the actual ECC value of the block to be tested is larger than the preset ECC value, and outputting a test result.
2. The read disturb test method of claim 1, wherein the block information comprises a block number, and the page information comprises a page number;
the determining the block to be tested of the flash memory to be tested and the corresponding area to be read according to the block information, the page information and the equipment information comprises:
determining physical block information of the flash memory to be tested according to the equipment information, retrieving in the physical block information according to the block number, and determining a block to be tested of the flash memory to be tested;
and searching in the determined block to be tested according to the page number, and determining a region to be read of the block to be tested.
3. The read disturb test method of claim 1, wherein the block information includes a starting block number, a starting page number, and a page number;
the determining the block to be tested of the flash memory to be tested and the corresponding area to be read according to the block information, the page information and the equipment information comprises:
determining physical block information of the flash memory to be tested according to the equipment information, retrieving in the physical block information according to the initial block number, and determining an initial block to be tested of the flash memory to be tested;
determining a block to be tested according to the initial block to be tested and the number of blocks;
searching in each determined block to be tested according to the starting page number, and determining a starting page to be read of each block to be tested;
and determining a region to be read corresponding to each block to be tested according to the initial page to be read of each block to be tested and the page number, wherein each region to be read comprises a plurality of pages.
4. The read disturb test method of claim 2, wherein the test parameters further comprise a read length;
the performing continuous reading operation on the area to be read comprises:
and continuously accessing the same address from the initial address of the area to be read according to the read length and executing the read operation.
5. The read disturb test method of claim 3, wherein the performing consecutive read operations on the area to be read comprises:
performing continuous reading operation on the area to be read of each block to be tested;
when each reading operation is executed, selecting one block from the blocks to be tested according to a random sequence, and randomly selecting one page from the area to be read of the selected block for reading until all the blocks to be tested are traversed.
6. The read disturb test method of any of claims 1 to 5, wherein said test parameters further comprise a verify frequency;
the continuously reading the area to be read until the actual ECC value of the block to be tested is larger than the preset ECC value, and outputting the test result comprises:
in the process of continuously reading the area to be read, acquiring an actual ECC value of a block to be tested according to the inspection frequency, and comparing the actual ECC value with the preset ECC value;
and judging whether the actual ECC value is larger than the preset ECC value, if so, outputting a test result, and if not, returning to execute the step of continuously reading the area to be read.
7. The read disturb test method of any of claims 1 to 5, further comprising saving the test result;
the test result comprises ECC values corresponding to the blocks to be tested under different read operation times.
8. A read disturb test device, comprising the steps of:
the device comprises a receiving module, a processing module and a processing module, wherein the receiving module is used for receiving test parameters, and the test parameters comprise block information, page information and a preset ECC value;
the acquisition module is used for acquiring the equipment information of the flash memory to be tested and determining the block to be tested of the flash memory to be tested and the corresponding area to be read according to the block information, the page information and the equipment information;
the erasing module is used for erasing and writing the block to be tested;
and the reading module is used for continuously reading the area to be read until the actual ECC value of the block to be tested is larger than the preset ECC value, and outputting a test result.
9. A computer-readable storage medium having stored thereon a computer program, characterized in that: the computer program, when executed by a processor, performs the steps of a method for read disturb testing as claimed in any one of claims 1 to 7.
10. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements the steps of a read disturb test method as claimed in any one of claims 1 to 7 when executing the computer program.
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