CN115877210A - Pressure-maintaining adjustable capacitive load insulation detection method, device and equipment - Google Patents
Pressure-maintaining adjustable capacitive load insulation detection method, device and equipment Download PDFInfo
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Abstract
The invention provides a method, a device and equipment for detecting insulation of a pressure-maintaining adjustable capacitive load, belonging to the technical field of capacitive load micro-short circuit detection, wherein if the maximum voltage drop value of the capacitive load at a voltage rising stage is greater than a first preset threshold value, micro-breakdown occurs to the capacitive load at the voltage rising stage; if the maximum voltage drop value of the capacitive load at the pressure maintaining stage is greater than a second preset threshold value, micro-breakdown occurs to the capacitive load at the pressure maintaining stage; if the maximum terminal voltage drop value of the free drop stage is larger than a third preset threshold, micro breakdown occurs to the capacitive load in the free drop stage, defective products that the insulation resistance value of the capacitive load is small but micro breakdown or micro short circuit does not occur in the voltage rising stage and the pressure maintaining stage can be effectively checked by increasing the capacitive load terminal voltage detection in the free drop stage, and the detection precision and detection rate of defects such as micro breakdown and insulation resistance value small in the free drop stage are improved by increasing the third preset threshold to be larger than the first preset threshold and the second preset threshold.
Description
Technical Field
The invention relates to the technical field of capacitive load micro-short circuit detection, in particular to a pressure-maintaining adjustable capacitive load insulation detection method, device and equipment.
Background
The short circuit of the battery can cause abnormal discharge of the battery and even safety accidents. The detection and identification of the short circuit problem of the battery cell (cell for short) before the electrolyte is injected in the production process of the battery are very important, the abnormal discharge and safety accidents caused by the short circuit of the battery can be avoided in the finished battery stage, the short circuit cell can be identified in advance, and the production and processing cost of the short circuit cell is reduced.
In the actual production process, besides the serious short circuit problems caused by material dust puncture, diaphragm breakdown, tab folding and the like, a large proportion of micro-short circuit cells exist, the micro-short circuit points are caused by material dust particles, diaphragm defects, the structural characteristics of the cells and the like, the micro-short circuit points can generate instantaneous discharge after the positive electrode and the negative electrode are excited by high voltage, the micro-short circuit points can be restored to be similar to a normal cell state after being fused in the high-voltage discharge process, but the cells still have the micro-short circuit discharge burning defect or further cause the risk of short circuit, and are the types of cells which are difficult to identify in short circuit cells.
Chinese patent CN114035081A discloses a test method for accurately identifying the problem of micro short circuit of a battery cell before liquid injection, wherein constant current output is controlled to charge the cell to a stable test voltage, and meanwhile, in the first step, a charging voltage climbing and voltage constant pressure maintaining stage, a voltage sampling channel is controlled to sample the voltage at two ends of the tested cell in real time and draw a dynamic voltage change curve in the charging process; step two, calculating sampling points in the voltage climbing process, wherein a maximum voltage drop value Vd1 appears in the voltage climbing process; step three, calculating a sampling point in the voltage pressure maintaining process, and calculating a maximum voltage drop value Vd2 which appears after the voltage climbs to the set voltage and the test time is finished; and step four, comparing the Vd1 and the Vd2 which are captured with Vd1 and Vd2 thresholds of a good product battery cell test, and identifying instant micro short circuit discharge which occurs in the test. However, since it only detects the voltage dynamic variation curve during the charging voltage climbing and voltage constant pressure maintaining stages, it is unable to accurately find out the problem of use failure of capacitive load products caused by the small insulation resistance value of the capacitive load.
Disclosure of Invention
The invention provides a method, a device and equipment for insulation detection of a pressure-maintaining adjustable capacitive load, which are used for accurately detecting the defects of short circuit, micro breakdown, low insulation impedance and the like of the capacitive load, different product defects display different fault types, and customers can pertinently improve the production flow according to the product reject ratio corresponding to the detected type of the capacitive load defect.
The specific technical scheme provided by the invention is as follows:
on one hand, the pressure-maintaining adjustable capacitive load insulation detection method provided by the invention comprises the following steps:
respectively obtaining the maximum drop values of the capacitive load terminal voltage in a voltage rising stage, a pressure maintaining stage and a free drop stage;
if the maximum voltage drop value of the capacitive load at the voltage rising stage is larger than a first preset threshold value, micro breakdown occurs on the capacitive load at the voltage rising stage;
if the maximum voltage drop value of the capacitive load terminal in the pressure maintaining stage is greater than a second preset threshold value, the capacitive load is subjected to micro-breakdown in the pressure maintaining stage;
if the maximum voltage drop value of the capacitive load at the free drop stage is larger than a third preset threshold value, micro breakdown occurs to the capacitive load at the free drop stage; wherein the third preset threshold is greater than the first preset threshold and the second preset threshold.
Optionally, the magnitude of the third preset threshold is in a positive correlation with the maximum voltage in the voltage rising phase and the duration of the free fall phase.
Optionally, the third preset threshold is equal to a product value obtained by multiplying a ratio of the maximum voltage in the voltage rising stage to the equivalent insulation resistance of the capacitive load by the duration of the free falling stage and a weight coefficient.
Optionally, if the maximum voltage drop value of the capacitive load at the voltage rising stage is greater than a first preset threshold, the performing of micro-breakdown on the capacitive load at the voltage rising stage includes:
if the maximum drop value of the capacitive load terminal voltage in the voltage rising stage is larger than a first preset threshold value, acquiring the capacitive load terminal voltage value at the ending moment of the voltage rising stage;
if the voltage value of the capacitive load end at the ending moment of the voltage rising stage is smaller than a preset voltage value, the capacitive load is short-circuited in the voltage rising stage;
and if the voltage value of the capacitive load end at the ending moment of the voltage rising stage is equal to a preset voltage value, generating micro short circuit on the capacitive load in the voltage rising stage, wherein the preset voltage value is the same as the maximum voltage value of the capacitive load end in the pressure maintaining stage.
Optionally, if the maximum voltage drop value of the capacitive load at the free drop stage is greater than a third preset threshold, the step of performing micro-breakdown on the capacitive load at the free drop stage specifically includes:
if the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than a third preset threshold value, judging whether the capacitive load terminal voltage change curve in the free drop stage drops linearly or not;
if the voltage variation curve of the capacitive load terminal in the free falling stage is linear falling, the capacitive load does not have micro breakdown in the free falling stage;
and if the voltage change curve of the capacitive load terminal in the free falling stage is nonlinear falling, the capacitive load is subjected to micro breakdown in the free falling stage.
Optionally, if the maximum voltage drop value of the capacitive load at the free drop stage is greater than a third preset threshold, the step of performing micro-breakdown on the capacitive load at the free drop stage specifically includes:
if the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than a third preset threshold value, acquiring the maximum slope of the capacitive load terminal voltage change curve in the free drop stage;
if the maximum slope is not greater than the preset slope threshold, the micro-breakdown of the capacitive load does not occur in the free drop stage;
and if the maximum slope is larger than the preset slope threshold, micro breakdown occurs to the capacitive load in the free drop stage.
Optionally, the duration of the voltage rising phase is less than the duration of the pressure holding phase and less than the duration of the free fall phase, and the duration of the free fall phase is greater than the duration of the pressure holding phase.
Optionally, the duration of the voltage rising phase is always less than 100ms, and the magnitude of the third preset threshold is in a positive correlation with the maximum voltage of the voltage rising phase.
On the other hand, the invention also provides a pressure-maintaining adjustable capacitive load insulation detection device, which comprises:
the acquisition module is used for respectively acquiring the maximum dropping values of the capacitive load terminal voltage in a voltage rising stage, a pressure maintaining stage and a free dropping stage;
the first judgment module is used for judging whether the maximum voltage drop value of the capacitive load at the voltage rising stage is larger than a first preset threshold value or not, and if so, performing micro-breakdown on the capacitive load at the voltage rising stage;
the second judgment module is used for judging whether the maximum voltage drop value of the capacitive load terminal in the pressure maintaining stage is greater than a second preset threshold value or not, and if so, performing micro-breakdown on the capacitive load terminal in the pressure maintaining stage;
the third judging module is used for judging whether the capacitive load has micro breakdown in the free falling stage if the maximum voltage falling value of the capacitive load at the free falling stage is larger than a third preset threshold value; wherein the third preset threshold is greater than the first preset threshold and the second preset threshold.
On the other hand, this application provides an insulating check out test set of pressurize adjustable capacitive load, includes: a processor, and a memory communicatively coupled to the processor;
the memory stores computer-executable instructions;
the processor executes the computer execution instructions stored in the memory to realize the pressure maintaining adjustable capacitive load insulation detection method.
In another aspect, the present application provides a computer-readable storage medium having stored thereon computer-executable instructions for implementing the above-mentioned pressure-holding adjustable capacitive load insulation detection method when the computer-executable instructions are executed by a processor.
The invention has the following beneficial effects:
according to the method for detecting the voltage-maintaining adjustable capacitive load insulation, the maximum voltage drop values of the capacitive load at a voltage rising stage, a voltage maintaining stage and a free drop stage are respectively obtained; if the maximum voltage drop value of the capacitive load at the voltage rising stage is larger than a first preset threshold value, micro breakdown occurs to the capacitive load at the voltage rising stage; if the maximum voltage drop value of the capacitive load at the pressure maintaining stage is greater than a second preset threshold value, micro-breakdown occurs to the capacitive load at the pressure maintaining stage; if the maximum drop value of the capacitive load end voltage in the free drop stage is larger than a third preset threshold value, micro breakdown occurs in the capacitive load in the free drop stage, defective products which have small capacitive load insulation resistance values but do not have micro breakdown or micro short circuit in the voltage rising stage and the pressure maintaining stage can be effectively checked by increasing the capacitive load end voltage detection in the free drop stage, and the detection accuracy and detection rate of defects such as micro breakdown and small insulation resistance values in the free drop stage can be improved by increasing the third preset threshold value to be larger than the first preset threshold value and the second preset threshold value.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the description below are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a flow chart of a method for detecting insulation of a pressure maintaining adjustable capacitive load according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a complete test waveform for capacitive load terminal voltage as exemplary illustrated herein;
FIG. 3 is a schematic diagram illustrating a micro-short circuit waveform at a capacitive load terminal voltage according to an exemplary embodiment of the present disclosure;
FIG. 4 is a schematic diagram illustrating a short-circuit waveform of a capacitive load terminal voltage according to an embodiment of the present invention;
fig. 5 is a block diagram of a pressure-maintaining adjustable capacitive load insulation detection apparatus according to an embodiment of the present invention;
fig. 6 is a diagram illustrating a polarization current process during an insulation test of a capacitive load according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer, the present invention will be described in further detail with reference to the accompanying drawings, and it is apparent that the described embodiments are only a part of the embodiments of the present invention, not all of the embodiments. All other embodiments, which can be obtained by a person skilled in the art without making any creative effort based on the embodiments in the present invention, belong to the protection scope of the present invention.
The terms "comprises," "comprising," and "having," and any variations thereof, in the description and claims of this invention, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
A method and an apparatus for detecting insulation of a pressure maintaining adjustable capacitive load according to an embodiment of the present invention will be described in detail with reference to fig. 1 to 6.
Referring to fig. 6, capacitive loads generally include a lithium battery cell before liquid injection, a chip capacitor, and the like, and the method and the device for detecting insulation of a pressure-maintaining adjustable capacitive load according to the embodiment of the present invention may be widely applied to detection of insulation performance of capacitive loads including a lithium battery cell before liquid injection, a chip capacitor, and the like.
As is well known, an insulation resistance tester or a dc withstand voltage tester is widely used for testing insulation of capacitive loads (such as a lithium battery cell before injection, a chip capacitor, etc.). However, none of these approaches has been developed specifically for capacitive loads and does not take into account the specificity of the capacitive load insulation test. Some insulating objects such as plastics, ceramics and the like can reach stable values instantly when conducting current under the action of direct current high voltage, but for capacitive loads such as lithium battery cores, chip capacitors and the like before liquid injection, the insulation of the insulating objects is formed by composite media, and various polarization phenomena can be generated under the action of the direct current high voltage.
Referring to fig. 6, before injection, three polarized currents exist in the insulation test process of capacitive loads such as a lithium battery cell, a chip capacitor and the like, wherein a capacitive current i1 is generated due to a capacitance effect of a medium, and when the capacitive load to be tested is pressurized, rapid polarization occurs inside the medium, which is equivalent to a current generated by charging the capacitor. The capacitance current i1 exists instantaneously, and the decay speed is high. The sink current i2 is a current generated due to slow polarization occurring inside the medium, which slowly decays with time. The conduction current i3 is caused by the insulation equivalent resistance of the medium, and the current value is constant.
The current is large at the beginning of the polarization and decreases with increasing time. During the polarization, the fastest decaying is the capacitive current i1, the slowly time varying sinking current i2, and the non-time varying current is the conduction current i3 (leakage current). Therefore, when the insulation resistance tester measures the insulation value of the capacitive load, the insulation resistance tester shows the phenomenon that the insulation resistance is very small at the beginning and only has a few megaohms, and the insulation resistance can be rapidly increased and then gradually changed along with the gradual reduction of the polarization current. Generally, the test stability of the insulation resistance of the capacitive load needs more than several seconds, the insulation test value of the high-capacity lithium battery core needs more than 10 seconds, and the requirement of an automatic production line for the rapid test of the capacitive load cannot be met.
Meanwhile, if the diaphragm has fine-hair-shaped protrusions in capacitive load such as a lithium battery cell before liquid injection, the diaphragm can be instantaneously broken down and short-circuited after direct-current high voltage is applied, and the diaphragm becomes an insulation state after being burned. And the insulation resistance tester can filter the bypass capacitance of the hardware sampling circuit and the software average value algorithm, so that the micro short circuit defect of the capacitive load caused by instantaneous discharge cannot be detected. Chinese patent CN114035081A discloses a testing method for accurately identifying the problem of micro short circuit of a battery core before liquid injection, which can detect the micro short circuit occurring in a voltage rising stage and a pressure maintaining stage, but cannot detect the product defect caused by the small insulation resistance of a capacitive load.
In order to solve the above technical problem, an embodiment of the present invention provides an insulation detection method for a capacitive load with adjustable pressure holding, which adopts a mode of adjustable high-voltage holding time, and sets different pressure holding times according to different capacitive loads, so as to solve the problem of the particularity of polarized current existing in the capacitive load. And stopping the output of the high-voltage device after the pressure maintaining mode is finished, enabling the capacitive load to be detected to enter a free discharge mode (free falling stage), performing charge consumption by the equivalent insulation resistance of the capacitive load according to the characteristic that the capacitive load has the capacity of storing electric quantity, actively and quickly discharging the stored electric quantity of the capacitive load by the high-voltage device after the set time is reached, enabling the voltage of the end of the capacitive load to be zero, then enabling the capacitive load to flow to the next testing procedure, judging the insulation quality by comparing whether the voltage falling value of the capacitive load exceeds a set alarm threshold value at each stage, and simultaneously detecting the defects of the capacitive load such as micro short circuit, small insulation resistance value and the like.
Referring to fig. 1 to 4, a method for detecting insulation of a pressure-maintaining adjustable capacitive load according to an embodiment of the present invention includes:
step 110: and respectively obtaining the maximum dropping values of the capacitive load terminal voltage in the voltage rising stage, the pressure maintaining stage and the free dropping stage.
Referring to fig. 1 and fig. 2, in the embodiment of the present invention, the whole process of capacitive load insulation detection is divided into a voltage rising stage, a pressure maintaining stage, a free drop stage and a fast discharge stage, wherein the insulation resistance tester, the dc voltage withstanding tester or the chinese patent CN114035081A in the prior art always charges the capacitive load to be detected in the whole test process, and the corresponding test process only includes the voltage rising stage and the pressure maintaining stage.
According to the embodiment of the invention, a high-voltage device is adopted to apply high voltage to the tested capacitive load (such as a lithium battery cell, a chip capacitor and the like before liquid injection) in the voltage rising stage, and the voltage value applied to the tested capacitive load can be adjusted and set as required. The capacitive load to be tested needs a certain charging time, the voltage reaches a preset voltage value, and the preset voltage value is also the maximum terminal voltage value of the capacitive load in the subsequent pressure maintaining stage. The voltage rising phase of the capacitive load to be measured corresponds to the initial rapid polarization process of the capacitive load to be measured. The duration of the initial rapid polarization process depends on the internal resistance of the high-voltage device and the magnitude of the equivalent capacitance value of the capacitive load to be measured. Preferably, in the embodiment of the invention, the rise time of the voltage at the control end of the internal resistance of the high-voltage device is regulated to be less than 100ms, namely, the duration time of the voltage rise stage is controlled within 100ms by regulating the internal resistance of the high-voltage device, so that the initial rapid polarization of the capacitive load to be detected is realized, and the micro short circuit and short circuit detection precision of the capacitive load at the voltage rise stage are improved.
When the terminal voltage of the capacitive load end reaches a preset voltage value, the high-voltage device is kept to continuously output so that the capacitive load enters a pressure maintaining stage, wherein the duration time length of the pressure maintaining stage is larger than the time length of a voltage rising stage, if the duration time length of the pressure maintaining stage is insufficient or the pressure maintaining stage is not carried out, the capacitive load enters a free discharge stage, in the actual test process, the terminal voltage of the capacitive load can be observed to obviously drop and then approach linear dropping, further, the short circuit or micro short circuit error detection of the free discharge stage can be caused, and the micro short circuit detection precision of the free drop stage can be reduced.
The creative research shows that the interlayer polarization phenomenon can occur in the insulation test process of the capacitive load to be tested, the interlayer polarization phenomenon lasts for a long time, but the absorption current is small. If the voltage rise stage is ended without pressure holding or the duration of the pressure holding stage is not enough, the voltage drop stage (namely, the free discharge stage) is started, namely, the output of the high-voltage device is stopped when the pressure holding stage with enough time is ended, the voltage of the capacitive load to be measured is steeply dropped due to absorption current consumed by interlayer polarization of the capacitive load, and when the interlayer polarization is ended, the linear drop caused by free discharge of the equivalent insulation resistance of the capacitive load to be measured is only achieved. This causes the discreteness of the terminal voltage drop at the free discharge stage to be large, and the third preset threshold value cannot be accurately set to accurately judge the micro short circuit and micro breakdown phenomena occurring at the free drop stage, so that the misjudgment or missing detection at the free drop stage affects the insulation detection precision of the detected capacitive load.
The embodiment of the present invention does not specifically limit how long the duration of the pressure holding stage is set. However, through the inventive analysis, the duration length of the pressure maintaining stage needs to be set to be longer than that of the voltage rising stage, wherein, initially, a pressure maintaining time longer than that of the voltage rising stage can be set according to the polarization condition of the tested capacitive load after reaching the preset voltage value, so that the high-voltage device continues to output the voltage to provide the absorption current of the capacitive load.
After the pressure maintaining stage is finished, the high-voltage device stops outputting the voltage, the tested capacitive load enters a free discharge mode, and the continuous process of the free discharge mode is the free drop stage of the embodiment of the invention. In the free discharge mode, the output of the high-voltage device is stopped, namely, the pressure maintaining is stopped, the capacitive load performs charge consumption by the equivalent insulation resistance of the capacitive load, and the voltage at the capacitive load end is reduced in a nearly linear manner. In the free drop stage, if the equivalent insulation resistance of the capacitive load meets the requirement and no micro-breakdown or micro-short circuit occurs, at this time, since the equivalent insulation resistance of the good capacitive load is basically in a stable range and the capacitance value of the good capacitive load is also stable, the terminal voltage drop value of the measured capacitive load is also stable within the duration time of the free drop stage and basically presents a linear drop.
After the free discharge stage is finished, the short circuit insulation test of the capacitive load to be tested is also finished, and at the moment, the active discharge circuit in the high-voltage device discharges the stored charge of the capacitive load to be tested, so that the voltage of the end of the active discharge circuit is reduced to zero and then the active discharge circuit flows to the next station, and the electric shock accident is prevented.
In an example, in the embodiment of the present invention, a digital voltmeter is used to detect the voltage values of the capacitive load to be measured at the voltage rising stage, the pressure holding stage, the free falling stage and the fast discharging stage, and after processing, the voltage variation curves of the capacitive load to be measured at the voltage rising stage, the pressure holding stage, the free falling stage and the fast discharging stage can be visually displayed in a curve form, where the voltage variation curves of the good capacitive load at the voltage rising stage, the pressure holding stage, the free falling stage and the fast discharging stage are shown in fig. 2.
Step 120: and if the maximum voltage drop value of the capacitive load at the voltage rising stage is larger than a first preset threshold value, the capacitive load generates micro breakdown at the voltage rising stage.
And detecting the terminal voltage of the capacitive load to be detected in the voltage rising stage, and if the maximum drop value of the terminal voltage of the capacitive load in the voltage rising stage is greater than a first preset threshold value, performing micro-breakdown on the capacitive load in the voltage rising stage. In the case of a pre-injection lithium battery cell, if the diaphragm has a thin-hair-like protrusion, a direct-current high voltage is applied to the diaphragm at the voltage rising stage, and then the diaphragm is instantaneously broken down to form a short circuit, and the diaphragm is burned to be in an insulating state. The thin-whisker-shaped protrusion is melted off, and then the short-circuit channel disappears to recover to a non-short-circuit state, but the isolating membrane can be burnt and damaged to a certain extent due to the fusing of the thin-whisker-shaped protrusion and the generation of electric arc, and the situation is the micro-breakdown to be detected by the embodiment of the invention.
For example, before liquid injection, the negative electrode of the lithium battery core is dropped and is lapped to the positive electrode through the edge of the battery core, the negative electrode is dropped and is lapped to the positive electrode to form a positive-negative short circuit loop, the short circuit loop can be quickly melted down due to weak overcurrent capacity and accompanied with electric arc generation when high-voltage excitation is applied between the positive electrode and the negative electrode, a short circuit channel disappears after a part of a material wire is melted down and is recovered to a non-short circuit state, but an isolating membrane can be burnt and damaged to a certain extent due to fusing of the material wire and generation of the electric arc, and the capacitive load micro-breakdown defect to be detected by the embodiment of the invention also belongs to the capacitive load micro-breakdown defect to be detected by the embodiment of the invention.
Referring to fig. 3, the voltage rise stage detects the voltages at two ends of the capacitive load in real time, and if the capacitive load is subjected to voltage breakdown due to poor insulation to form internal discharge, the voltage at the end of the capacitive load drops, that is, if the capacitive load is subjected to micro breakdown in the charging stage, the voltage at the end of the capacitive load drops and fluctuates due to the internal discharge. Referring to fig. 3, assuming that the initial voltage of the droop is A1 and the end voltage of the droop is A2, the maximum voltage droop in the voltage rising phase is: VT1= A1-A2. Whether the dropping voltage VT1 exceeds a first preset threshold value V1 set by a client or not is compared, and if the maximum voltage dropping VT1 is larger than the first preset threshold value V1, the micro-breakdown of the tested capacitive load at the voltage rising stage can be judged.
Further, if the maximum voltage drop value of the capacitive load terminal at the voltage rising stage is greater than a first preset threshold value, acquiring a voltage value of the capacitive load terminal at the end moment of the voltage rising stage; if the voltage value of the capacitive load end at the end moment of the voltage rising stage is smaller than the preset voltage value, the voltage drop fluctuation of the capacitive load at the voltage rising stage belongs to the short circuit generated inside the capacitive load; and if the voltage value of the capacitive load end at the ending moment of the voltage rising stage is equal to a preset voltage value, generating micro short circuit on the capacitive load in the voltage rising stage, wherein the preset voltage value is the same as the maximum voltage value of the capacitive load end in the pressure maintaining stage.
Referring to fig. 4, in the embodiment of the present invention, when it is detected that the voltage drop across the capacitive load to be measured is greater than the first preset threshold value in the voltage rising stage, whether the voltage value across the capacitive load at the end of the voltage rising stage reaches the preset voltage value is analyzed by superposition, and the micro-breakdown phenomenon occurring in the voltage rising stage is further accurately identified as whether a short circuit or a micro-short defect occurs inside the capacitive load to be measured, so that a production line can be subjected to targeted production process and production process improvement according to different micro-breakdown type analyses, and the production yield of the capacitive load to be measured is improved. That is, in the embodiment of the present invention, by determining whether the maximum terminal voltage drop in the voltage rising stage is greater than the first preset threshold and whether the capacitive load terminal voltage value at the end time of the voltage rising stage reaches the preset voltage value, it is determined whether the terminal voltage fluctuation of the capacitive load to be detected in the voltage rising stage is caused by a short circuit or a micro breakdown, so as to solve the problems in production according to the bad type.
Meanwhile, the embodiment of the invention can also calculate the time TP for the capacitive load terminal voltage to rise to the preset voltage value in the voltage rising stage, and the voltage rising time of the capacitive load terminal is in direct proportion to the capacitance value. And (4) comparing the rising time with the rising time TP by setting an upper limit TH and a lower limit TL of the rising time to judge whether the capacitance value of the capacitive load is too large or too small or whether the probe is in poor contact to cause idle measurement.
Step 130: and if the maximum voltage drop value of the capacitive load terminal in the pressure maintaining stage is greater than a second preset threshold value, the capacitive load is subjected to micro breakdown in the pressure maintaining stage.
Referring to fig. 2 and 3, assuming that the dropping start voltage of the voltage at the capacitive load terminal in the pressure holding stage is B1 and the dropping end voltage is B2, the maximum dropping value VT2 at the capacitive load terminal in the pressure holding stage = B1-B2, and if the maximum dropping value VT2 at the capacitive load terminal in the pressure holding stage is greater than the second preset threshold value V2, the capacitive load undergoes micro-breakdown in the pressure holding stage.
Similarly, if the maximum drop value of the voltage of the capacitive load terminal in the pressure maintaining stage is greater than a first preset threshold value, acquiring the voltage value of the capacitive load terminal at the finishing moment of the pressure maintaining stage; if the voltage value of the capacitive load end at the finishing moment of the pressure maintaining stage is smaller than the preset voltage value, the voltage drop fluctuation of the capacitive load in the pressure maintaining stage belongs to the internal short circuit; and if the voltage value of the capacitive load terminal at the finishing moment of the pressure maintaining stage is equal to the preset voltage value, generating micro short circuit on the capacitive load in the pressure maintaining stage.
Referring to fig. 4, in the embodiment of the present invention, when it is detected that the voltage drop across the capacitive load to be measured is greater than the first preset threshold value in the pressure maintaining stage, whether the voltage value across the capacitive load at the end of the pressure maintaining stage reaches the preset voltage value is analyzed by superposition, so as to further accurately identify the micro-breakdown phenomenon occurring in the pressure maintaining stage as whether a short circuit or a micro-short circuit defect occurs inside the capacitive load to be measured, and further, the production flow and production process improvement on the production line can be performed according to different types of micro-breakdown analysis, so as to improve the production yield of the capacitive load to be measured. That is, in the embodiment of the present invention, by determining whether the maximum terminal voltage drop in the pressure holding stage is greater than the first preset threshold and whether the capacitive load terminal voltage value at the pressure holding stage end time reaches the preset voltage value, it is determined whether the terminal voltage fluctuation of the capacitive load to be measured in the pressure holding stage is caused by a short circuit or a micro breakdown, so as to solve the problems in production according to a poor type.
Step 140: if the maximum voltage drop value of the capacitive load at the free drop stage is larger than a third preset threshold value, micro breakdown occurs to the capacitive load at the free drop stage; wherein the third preset threshold is greater than the first preset threshold and the second preset threshold.
According to the insulation detection method for the pressure-maintaining adjustable capacitive load, provided by the embodiment of the invention, the third preset threshold is larger than the first preset threshold and the second preset threshold, and the terminal voltage drop value of the capacitive load in the free drop stage comprises terminal voltage fluctuation caused by micro breakdown and linear drop caused by free discharge of the equivalent insulation resistance of the capacitive load to be detected, so that the detection precision of the micro breakdown of the capacitive load in the free drop stage can be improved by making the third preset threshold larger than the first preset threshold and the second preset threshold, and the linear drop caused by free discharge of the equivalent insulation resistance of the capacitive load to be detected is prevented from being identified as micro breakdown.
Further, in order to improve the precision of capacitive load micro-breakdown detection in the free fall stage, the embodiment of the invention positively correlates the magnitude of the third preset threshold with the maximum voltage in the voltage rise stage and the duration of the free fall stage. Preferably, the third preset threshold is equal to a product value obtained by multiplying a ratio of the maximum voltage of the voltage rising stage to the equivalent insulation resistance of the capacitive load by the duration length of the free falling stage and the weight coefficient, and when the maximum voltage of the voltage rising stage is larger, the third preset threshold is larger, the duration length of the free falling stage is longer, the third preset threshold is larger, so that the linear falling caused by the free discharge of the equivalent insulation resistance of the capacitive load to be detected can be prevented from being identified as the micro-breakdown, and the capacitive load micro-breakdown detection accuracy of the free falling stage is improved.
Referring to fig. 2 and 3, assuming that the voltage at the start time of the free discharge is C1 and the voltage at the stop time is C2, the maximum voltage drop value during the free discharge phase is VT3= C1-C2. If the free discharge stage drop voltage VT3 exceeds a third preset threshold value V3 set by a customer, the micro-breakdown inside the tested capacitive load can be judged.
If micro-breakdown occurs in the tested capacitive load in the free drop stage or the insulation resistance value of the tested capacitive load is smaller, the maximum drop value of the capacitive load end voltage in the free drop stage is larger than a third preset threshold value, and whether micro-breakdown occurs in the tested capacitive load in the free drop stage or not is accurately identified. According to the method for detecting the insulation of the pressure-maintaining adjustable capacitive load, provided by the embodiment of the invention, when the maximum drop value of the voltage of the capacitive load terminal in the free drop stage is greater than a third preset threshold value, whether the voltage change curve of the capacitive load terminal in the free drop stage falls linearly or not is judged in a superposition manner.
Specifically, if the maximum drop value of the capacitive load terminal voltage in the free drop stage is greater than a third preset threshold, judging whether the capacitive load terminal voltage variation curve in the free drop stage falls linearly or not; if the voltage variation curve of the capacitive load terminal in the free falling stage is linear falling, the capacitive load does not have micro breakdown in the free falling stage; and if the voltage change curve of the capacitive load terminal in the free falling stage is nonlinear falling, the capacitive load is subjected to micro breakdown in the free falling stage. When the maximum voltage drop value of the capacitive load terminal in the free drop stage is greater than a third preset threshold value and the voltage change curve of the capacitive load terminal in the free drop stage is linear drop, the measured capacitive load does not have micro breakdown in the free drop stage, and the large voltage drop of the measured capacitive load is caused by the small insulation resistance value.
If micro-breakdown occurs in the capacitive load to be detected in the free falling stage or the insulation resistance value of the capacitive load to be detected is smaller, the maximum drop value of the capacitive load end voltage in the free falling stage is larger than a third preset threshold value, and then whether micro-breakdown occurs in the capacitive load in the free falling stage or not is accurately identified. The fourth preset threshold is greater than the third preset threshold.
Specifically, if the maximum capacitive load end voltage drop value in the free drop stage is greater than a third preset threshold, judging whether the maximum capacitive load end voltage drop value in the free drop stage is less than a fourth preset threshold; if the maximum voltage drop value of the capacitive load at the free drop stage is smaller than a fourth preset threshold value, the capacitive load does not have micro breakdown at the free drop stage; the maximum voltage drop value of the capacitive load terminal in the free drop stage is larger than the third preset threshold and smaller than the fourth preset threshold due to the fact that the insulation resistance value of the capacitive load terminal is smaller, namely the voltage drop of the capacitive load to be tested is caused by the defect that the insulation resistance value of the capacitive load to be tested is smaller. If the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than a fourth preset threshold value, the capacitive load is subjected to micro-breakdown in the free drop stage, so that the reason that the capacitive load terminal voltage in the free drop stage fluctuates greatly can be accurately identified, and whether the current product defect type belongs to the micro-breakdown inside the capacitive load to be measured in the free drop stage or the insulation resistance value of the capacitive load to be measured is smaller is accurately identified.
If micro-breakdown occurs in the capacitive load to be detected in the free falling stage or the insulation resistance value of the capacitive load to be detected is smaller, the maximum drop value of the capacitive load end voltage in the free falling stage is larger than a third preset threshold value, and then whether micro-breakdown occurs in the capacitive load in the free falling stage or not can be accurately identified.
Specifically, if the maximum drop value of the capacitive load terminal voltage at the free-fall stage is greater than a third preset threshold, acquiring the maximum slope of a capacitive load terminal voltage change curve at the free-fall stage; if the maximum slope is not greater than the preset slope threshold, the capacitive load does not have micro-breakdown in the free drop stage, and the large voltage drop of the tested capacitive load is caused by the defect that the insulation resistance value in the capacitive load is small; and if the maximum slope is larger than the preset slope threshold, micro breakdown occurs to the capacitive load in the free drop stage.
By the method, defective products with small insulation resistance values of the capacitive load but no breakdown short circuit or micro short circuit in the voltage rising stage and the pressure maintaining stage can be effectively checked in the free discharge stage, the small insulation resistance of the capacitive load can be synchronously detected in the capacitive load micro breakdown detection process, defective products with poor insulation can be prevented from flowing into the market, and the detection precision and the detection efficiency can be improved.
According to the method for detecting the insulation of the capacitive load with the adjustable pressure maintaining function, the maximum voltage drop value of the capacitive load at the voltage rising stage, the pressure maintaining stage and the free drop stage is obtained respectively; if the maximum voltage drop value of the capacitive load at the voltage rising stage is larger than a first preset threshold value, micro breakdown occurs to the capacitive load at the voltage rising stage; if the maximum voltage drop value of the capacitive load at the pressure maintaining stage is greater than a second preset threshold value, micro-breakdown occurs to the capacitive load at the pressure maintaining stage; if the maximum drop value of the capacitive load end voltage in the free drop stage is larger than a third preset threshold value, micro breakdown occurs in the capacitive load in the free drop stage, defective products which have small capacitive load insulation resistance values but do not have micro breakdown or micro short circuit in the voltage rising stage and the pressure maintaining stage can be effectively checked by increasing the capacitive load end voltage detection in the free drop stage, and the detection accuracy and detection rate of defects such as micro breakdown and small insulation resistance values in the free drop stage can be improved by increasing the third preset threshold value to be larger than the first preset threshold value and the second preset threshold value.
Based on the same inventive concept, referring to fig. 5, an embodiment of the present invention further provides a pressure-maintaining adjustable capacitive load insulation detection apparatus, and the pressure-maintaining adjustable capacitive load insulation detection apparatus provided in the embodiment of the present invention may execute a processing procedure provided in an embodiment of a pressure-maintaining adjustable capacitive load insulation detection method. As shown in fig. 5, a pressure holding adjustable capacitive load insulation detecting device 20 includes:
an obtaining module 201, configured to obtain maximum dropping values of capacitive load terminal voltages at a voltage rising stage, a pressure maintaining stage, and a free dropping stage, respectively;
the first judging module 202 is configured to, if a maximum drop value of a capacitive load terminal voltage at a voltage rising stage is greater than a first preset threshold, cause a micro-breakdown of the capacitive load at the voltage rising stage;
the second judging module 203 is configured to, if the maximum drop value of the voltage of the capacitive load at the pressure maintaining stage is greater than a second preset threshold, cause micro-breakdown of the capacitive load at the pressure maintaining stage;
the third judging module 204 is configured to, if the maximum drop value of the capacitive load terminal voltage at the free drop stage is greater than a third preset threshold, cause micro-breakdown of the capacitive load at the free drop stage; wherein the third preset threshold is greater than the first preset threshold and the second preset threshold.
The apparatus provided in the embodiment of the present application may be specifically configured to execute the scheme provided in the embodiment of the method corresponding to fig. 1, and specific functions and technical effects that can be achieved are not described herein again.
Based on the same inventive concept, an embodiment of the present invention further provides a pressure-maintaining adjustable capacitive load insulation detection apparatus, including: a processor, and a memory communicatively coupled to the processor, the memory storing computer-executable instructions.
The processor executes the computer execution instructions stored in the memory to implement the scheme provided by any of the above method embodiments, and the specific functions and the technical effects that can be achieved are not described herein again. The electronic device may be the above-mentioned server.
The embodiment of the present application further provides a computer-readable storage medium, where computer-executable instructions are stored in the computer-readable storage medium, and when the computer-executable instructions are executed by a processor, the computer-executable instructions are used to implement the solutions provided in any of the above method embodiments, and specific functions and technical effects that can be achieved are not described herein again.
An embodiment of the present application further provides a computer program product, where the program product includes: the computer program is stored in a readable storage medium, at least one processor of the electronic device can read the computer program from the readable storage medium, and the at least one processor executes the computer program to enable the electronic device to execute the scheme provided by any one of the above method embodiments, and specific functions and achievable technical effects are not described herein again.
Other embodiments of the present application will be apparent to those skilled in the art from consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of the invention following, in general, the principles of the application and including such departures from the present disclosure as come within known or customary practice within the art to which the invention pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the application being indicated by the following claims.
It should be noted that although several units or sub-units of the apparatus are mentioned in the above detailed description, such division is merely exemplary and not mandatory. Indeed, the features and functions of two or more units described above may be embodied in one unit, according to embodiments of the application. Conversely, the features and functions of one unit described above may be further divided into embodiments by a plurality of units.
While the preferred embodiments of the present application have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all alterations and modifications as fall within the scope of the application.
It will be apparent to those skilled in the art that various modifications and variations can be made in the embodiments of the present invention without departing from the spirit or scope of the embodiments of the invention. Thus, if such modifications and variations of the embodiments of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to encompass these modifications and variations.
Claims (10)
1. The method for detecting the insulation of the pressure-maintaining adjustable capacitive load is characterized by comprising the following steps of:
respectively obtaining the maximum drop values of the capacitive load terminal voltage in a voltage rising stage, a pressure maintaining stage and a free drop stage;
if the maximum voltage drop value of the capacitive load at the voltage rising stage is larger than a first preset threshold value, micro breakdown occurs to the capacitive load at the voltage rising stage;
if the maximum voltage drop value of the capacitive load at the pressure maintaining stage is greater than a second preset threshold value, micro-breakdown occurs to the capacitive load at the pressure maintaining stage;
if the maximum voltage drop value of the capacitive load at the free drop stage is larger than a third preset threshold value, micro breakdown occurs to the capacitive load at the free drop stage;
wherein the third preset threshold is greater than the first preset threshold and the second preset threshold.
2. The pressure holding adjustable capacitive load insulation detection method according to claim 1, wherein the magnitude of the third preset threshold is in positive correlation with the maximum voltage of the voltage rising stage and the duration of the free falling stage.
3. The dwell-adjustable capacitive load insulation detection method according to claim 2, wherein the third preset threshold is equal to a product value of a ratio of a maximum voltage of the voltage rising stage to an equivalent insulation resistance of the capacitive load itself multiplied by a duration length of the free fall stage and a weight coefficient.
4. The method for detecting insulation of a pressure maintaining adjustable capacitive load according to claim 1, wherein if the maximum voltage drop value of the capacitive load at the voltage rising stage is greater than a first preset threshold value, the micro-breakdown of the capacitive load at the voltage rising stage comprises:
if the maximum drop value of the capacitive load terminal voltage in the voltage rising stage is larger than a first preset threshold value, acquiring the capacitive load terminal voltage value at the ending moment of the voltage rising stage;
if the voltage value of the capacitive load end at the ending moment of the voltage rising stage is smaller than a preset voltage value, the capacitive load is short-circuited in the voltage rising stage;
and if the voltage value of the capacitive load end at the ending moment of the voltage rising stage is equal to a preset voltage value, generating micro short circuit on the capacitive load in the voltage rising stage, wherein the preset voltage value is the same as the maximum voltage value of the capacitive load end in the pressure maintaining stage.
5. The method for detecting insulation of the pressure maintaining adjustable capacitive load according to claim 2, wherein if the maximum drop value of the voltage of the capacitive load at the free drop stage is greater than a third preset threshold, the micro-breakdown of the capacitive load at the free drop stage specifically comprises:
if the maximum capacitive load terminal voltage drop value in the free drop stage is larger than a third preset threshold value, judging whether a capacitive load terminal voltage change curve in the free drop stage drops linearly or not;
if the voltage variation curve of the capacitive load terminal in the free falling stage is linear falling, the capacitive load does not have micro breakdown in the free falling stage;
and if the voltage change curve of the capacitive load terminal in the free falling stage is nonlinear falling, the capacitive load is subjected to micro breakdown in the free falling stage.
6. The method for detecting insulation of the pressure maintaining adjustable capacitive load according to claim 2, wherein if the maximum drop value of the voltage of the capacitive load at the free drop stage is greater than a third preset threshold, the micro-breakdown of the capacitive load at the free drop stage specifically comprises:
if the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than a third preset threshold value, acquiring the maximum slope of the capacitive load terminal voltage change curve in the free drop stage;
if the maximum slope is not greater than the preset slope threshold, the micro-breakdown of the capacitive load does not occur in the free drop stage;
and if the maximum slope is larger than the preset slope threshold, micro breakdown occurs to the capacitive load in the free drop stage.
7. The dwell adjustable capacitive load insulation detection method according to claim 1, characterized in that the duration of the voltage rise phase is shorter than the duration of the dwell phase and shorter than the duration of the free fall phase, the duration of the free fall phase being longer than the duration of the dwell phase.
8. The pressure-holding adjustable capacitive load insulation detection method according to claim 2, wherein the duration of the voltage rising stage is always less than 100ms, and the magnitude of the third preset threshold is in positive correlation with the maximum voltage of the voltage rising stage.
9. The utility model provides an insulating detection device of capacitive load that pressurize is adjustable which characterized in that, the insulating detection device of capacitive load that pressurize is adjustable includes:
the acquisition module is used for respectively acquiring the maximum dropping values of the capacitive load terminal voltage in a voltage rising stage, a pressure maintaining stage and a free dropping stage;
the first judgment module is used for judging whether the maximum voltage drop value of the capacitive load at the voltage rising stage is larger than a first preset threshold value or not, and if so, performing micro-breakdown on the capacitive load at the voltage rising stage;
the second judgment module is used for judging whether the capacitive load has micro-breakdown in the pressure holding stage if the maximum voltage drop value of the capacitive load terminal in the pressure holding stage is greater than a second preset threshold value;
the third judging module is used for judging whether the capacitive load has micro breakdown in the free falling stage if the maximum voltage falling value of the capacitive load at the free falling stage is larger than a third preset threshold value; wherein the third preset threshold is greater than the first preset threshold and the second preset threshold.
10. The utility model provides an insulating check out test set of capacitive load that pressurize is adjustable which characterized in that includes: a processor, and a memory communicatively coupled to the processor;
the memory stores computer-executable instructions;
the processor executes computer-executable instructions stored by the memory to implement the method of any of claims 1-8.
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