CN115508620A - Supercapacitor capacity testing device - Google Patents

Supercapacitor capacity testing device Download PDF

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Publication number
CN115508620A
CN115508620A CN202211170621.5A CN202211170621A CN115508620A CN 115508620 A CN115508620 A CN 115508620A CN 202211170621 A CN202211170621 A CN 202211170621A CN 115508620 A CN115508620 A CN 115508620A
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CN
China
Prior art keywords
super capacitor
switch
capacity
capacitance
tested
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202211170621.5A
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Chinese (zh)
Inventor
邹连喜
丁彦召
吴春生
张小溪
丁田田
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Shenzhen Anmu Technology Co ltd
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Shenzhen Anmu Technology Co ltd
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Publication date
Application filed by Shenzhen Anmu Technology Co ltd filed Critical Shenzhen Anmu Technology Co ltd
Priority to CN202211170621.5A priority Critical patent/CN115508620A/en
Publication of CN115508620A publication Critical patent/CN115508620A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605Measuring capacitance
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/13Energy storage using capacitors

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)

Abstract

The invention relates to a super capacitor capacity testing device which comprises a main loop electrically connected with a direct current power supply, wherein the main loop is sequentially connected with a first switch, a second switch, a current-limiting resistor and a capacitance element with known capacity in series, the positive pole of the direct current power supply is connected with the first switch, the negative pole of the direct current power supply is connected with the capacitance element, and a testing loop used for connecting a super capacitance element to be tested is arranged between the first switch and the second switch. The testing device can realize the capacity test of the super capacitor and has the advantages of simple structure, low cost and simple and quick test.

Description

Supercapacitor capacity testing device
Technical Field
The invention relates to a device for testing the capacity of a super capacitor.
Background
The super capacitor is used as an energy storage device, the stored electric energy of the super capacitor is high and generally reaches the farad level, and the traditional common capacitor is in the microfarad level, so that the traditional digital bridge for measuring the capacity of the common capacitor cannot quickly and accurately measure the super capacitor, and how to efficiently and accurately measure the capacitance of the super capacitor is a technical problem in the current research, production and application of the super capacitor.
To solve the technical problem, the Chinese patent No.: zl201310349381.X, entitled a capacitance test system machine test method of a super capacitor, discloses a capacitance test system of a super capacitor, and adopts a method of parallel-series discharge, automatic switching, differential input and synchronous scanning in the scheme, so that the capacitance of the super capacitor can be detected, but the test system has a complex structure and higher cost. Therefore, how to design a supercapacitor capacity testing device can realize the capacity detection of the supercapacitor, has a simple structure, and is still a difficult problem to be put in front of research and development technicians.
Disclosure of Invention
The technical problem to be solved by the invention is to provide a super capacitor capacity testing device, which can quickly and accurately detect the capacity of a super capacitor and has the advantages of simple structure and low manufacturing cost.
In order to solve the technical problems, the technical scheme adopted by the invention is as follows: the testing device comprises a main loop electrically connected with a direct-current power supply, wherein the main loop is sequentially connected with a first switch, a second switch, a current-limiting resistor and a capacitance element with known capacity in series, the positive electrode of the direct-current power supply is connected with the first switch, the negative electrode of the direct-current power supply is connected with the capacitance element, a testing loop used for connecting a super capacitance element to be tested is arranged between the first switch and the second switch, one end of the testing loop is electrically connected with the main loop between the first switch and the second switch, and the other end of the testing loop is connected with the negative electrode of the direct-current power supply.
According to the design concept of the invention, in the technical scheme of the invention, the capacity testing device firstly enables a direct current power supply to charge the super capacitor element to be tested in the testing loop, and after the super capacitor element to be tested is fully charged, the super capacitor element to be tested is discharged to charge the capacitor element with known capacity, so that the discharge charge of the super capacitor element to be tested is charged in the capacitor element with known capacity; and respectively collecting the voltage change value of the super capacitor element to be measured and the voltage change value of the capacitor element with known capacity.
According to the design concept of the invention, in the technical scheme of the invention, the charge of the capacitor element with known capacity is calculated according to the collected voltage change value of the capacitor element with known capacity, and then the capacity of the super capacitor element to be measured is calculated by using the formula of the capacity of the super capacitor element to be measured = charge/(the voltage change value of the super capacitor element to be measured).
Compared with the prior art, the invention has the beneficial effects that: the test device of the super capacitor comprises two switches, a current-limiting resistor and a capacitance element with known capacity, wherein the two switches, the current-limiting resistor and the capacitance element with known capacity are connected in a main loop of a direct-current power supply, when the super capacitor is measured, the direct-current power supply is used for charging the super capacitor element to be tested, and after the super capacitor element to be tested is fully charged, the super capacitor element to be tested is discharged to charge the capacitance element with known capacity, so that the discharge charge of the super capacitor element to be tested is charged in the capacitance element with known capacity; and then measuring the voltage change value of the super capacitor element to be tested and the voltage change value of the capacitor element with known capacity respectively, and calculating the capacitance of the super capacitor element to be tested.
Drawings
FIG. 1 is a circuit diagram of a supercapacitor capacity test device according to the present invention.
Detailed Description
Referring to fig. 1, the device for testing the capacity of the super capacitor comprises a main loop and a testing loop, wherein a direct current power supply DC is arranged on the main loop, and a first switch K1, a second switch K2, a current limiting resistor R1 and a capacitance element C2 are sequentially connected in series on a line from the positive end to the negative end of the direct current power supply DC. Specifically, the positive pole of the DC power supply DC is connected to the first switch K1, and the negative pole of the DC power supply DC is connected to the capacitor element C2, and it should be noted that the capacitor element C2 has a known capacitance, and the current limiting resistor R1 has a function of changing the discharge resistance and a function of dividing the voltage.
Furthermore, the test loop is arranged between the first switch K1 and the second switch K2, one end of the test loop is electrically connected with the main loop between the first switch K1 and the second switch K2, and the other end of the test loop is connected with the negative electrode of the direct current power supply DC.
When the capacity of the super capacitor is tested, firstly, the super capacitor C1 to be tested is connected into a test loop, so that the first switch K1 is closed, the second switch K2 is disconnected, at the moment, the direct-current power supply DC charges the super capacitor C1 to be tested, when the voltage of the capacitor element C1 to be tested reaches a preset voltage, the charging is completed, the first switch K1 is disconnected, the charging of the capacitor element C1 to be tested is stopped, and the voltage change value of the capacitor C1 to be tested at the moment is collected and recorded.
Then, the voltage of the capacitor C2 with known capacity is collected and recorded, the second switch K2 is closed, the first switch K1 is kept open, at this time, the super capacitor C1 to be measured is discharged to charge the capacitor element C2, after the capacitor element C2 is charged, the second switch K2 is opened, and the voltage change values of the capacitor C1 to be measured and the capacitor C2 with known capacity at this time are collected and recorded respectively.
And finally, calculating the capacity of the super capacitor element to be measured by using the formula C1 capacity = charge/the voltage change value of the super capacitor element to be measured C1.
As can be seen from the structure and the test process of the test device, the test device for the super capacitor comprises the two switches K1 and K2, the current-limiting resistor R1 and the capacitance element C2 with known capacity, so that the test device is simple in structure and low in manufacturing cost, and the test process is simple and rapid and is high in practicability.

Claims (3)

1. A super capacitor capacity testing device is characterized by comprising a main loop which is electrically connected with a direct current power supply, wherein a first switch, a second switch, a current-limiting resistor and a capacitance element with known capacity are sequentially connected in series with the main loop, the positive pole of the direct current power supply is connected with the first switch, the negative pole of the direct current power supply is connected with the capacitance element, a testing loop used for connecting a super capacitance element to be tested is arranged between the first switch and the second switch, one end of the testing loop is electrically connected with the main loop between the first switch and the second switch, and the other end of the testing loop is connected with the negative pole of the direct current power supply.
2. The device for testing the capacity of the super capacitor as claimed in claim 1, wherein the device for testing the capacity is characterized in that firstly, a direct current power supply is used for charging the super capacitor element to be tested in the testing loop, and after the super capacitor element to be tested is fully charged, the super capacitor element to be tested is discharged to charge the capacitor element with known capacity, so that the discharged charges of the super capacitor element to be tested are charged in the capacitor element with known capacity; and respectively collecting the voltage change value of the super capacitor element to be measured and the voltage change value of the capacitor element with known capacity.
3. The apparatus for testing capacitance of a super capacitor as claimed in claim 2, wherein the charge of the capacitance element with known capacitance is calculated from the collected voltage variation value of the capacitance element with known capacitance, and then the capacitance of the super capacitor to be tested is calculated by using the formula capacitance = charge/(voltage variation value of the super capacitor to be tested).
CN202211170621.5A 2022-09-26 2022-09-26 Supercapacitor capacity testing device Pending CN115508620A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202211170621.5A CN115508620A (en) 2022-09-26 2022-09-26 Supercapacitor capacity testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202211170621.5A CN115508620A (en) 2022-09-26 2022-09-26 Supercapacitor capacity testing device

Publications (1)

Publication Number Publication Date
CN115508620A true CN115508620A (en) 2022-12-23

Family

ID=84505615

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202211170621.5A Pending CN115508620A (en) 2022-09-26 2022-09-26 Supercapacitor capacity testing device

Country Status (1)

Country Link
CN (1) CN115508620A (en)

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