CN110557091A - High-voltage large-current photovoltaic array IV curve test circuit and test method - Google Patents
High-voltage large-current photovoltaic array IV curve test circuit and test method Download PDFInfo
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- CN110557091A CN110557091A CN201910709329.8A CN201910709329A CN110557091A CN 110557091 A CN110557091 A CN 110557091A CN 201910709329 A CN201910709329 A CN 201910709329A CN 110557091 A CN110557091 A CN 110557091A
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- 238000012360 testing method Methods 0.000 title claims abstract description 32
- 238000010998 test method Methods 0.000 title abstract description 6
- 239000003990 capacitor Substances 0.000 claims abstract description 73
- 230000007613 environmental effect Effects 0.000 claims abstract description 5
- 238000005070 sampling Methods 0.000 claims description 11
- 238000007599 discharging Methods 0.000 claims description 10
- 238000000034 method Methods 0.000 claims description 9
- 230000005684 electric field Effects 0.000 claims description 3
- 230000007547 defect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000007792 addition Methods 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
- H02J7/00—Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries
- H02J7/0068—Battery or charger load switching, e.g. concurrent charging and load supply
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
- H02J7/00—Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries
- H02J7/34—Parallel operation in networks using both storage and other dc sources, e.g. providing buffering
- H02J7/345—Parallel operation in networks using both storage and other dc sources, e.g. providing buffering using capacitors as storage or buffering devices
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Abstract
The invention discloses a high-voltage heavy-current photovoltaic array IV curve test circuit and a test method, belonging to the field of photovoltaic test.A capacitor is connected to the output end of a photovoltaic array as a variable load, and when the photovoltaic array charges the capacitor, the voltage and current in the period of time are continuously sampled to obtain the IV characteristic curve of the photovoltaic array under the current environmental condition; the difficulty that the traditional mode of simulating variable resistance by an electronic load cannot test high power is overcome by adopting a capacitive load mode.
Description
Technical Field
The invention belongs to the field of photovoltaic testing, and particularly relates to a high-voltage large-current photovoltaic array IV curve testing circuit and a testing method.
background
the traditional volt-ampere characteristic curve test method is to test the voltage and current output characteristics of a photovoltaic array by adjusting the continuous change of load impedance. The load impedance is generally adjusted by an electronic load. In the driving design of the electronic load, a power MOS tube is adopted as an electronic load device, and when the MOS tube works in an unsaturated region, a variable resistor controlled by a grid voltage can be regarded between a source electrode and a drain electrode. The working characteristic of the power MOS tube is that the current passing capacity is reduced faster along with the increase of the voltage between the source electrode and the drain electrode, the current is larger and larger along with the increase of the voltage of a tested photovoltaic array system, and the test mode of simulating the variable resistor by the electronic load device cannot meet the test requirement. The test method must be changed to meet the high voltage, high current test capability.
Disclosure of Invention
aiming at the technical problems in the prior art, the invention provides the high-voltage large-current photovoltaic array IV curve test circuit and the test method, which are reasonable in design, overcome the defects of the prior art and have good effects.
In order to achieve the purpose, the invention adopts the following technical scheme:
a high-voltage large-current photovoltaic array IV curve test circuit comprises a capacitor charging test circuit and a discharging circuit; the capacitor charging test circuit comprises a capacitor C, a normally open contact KNO of a relay K and a sampling resistor R1; the discharging circuit comprises a capacitor C, a normally closed contact KNC of a relay K and a power resistor R2; the photovoltaic array, the capacitor C, the normally open contact KNO of the relay K and the sampling resistor R1 form a closed loop; and the capacitor C, the normally closed contact KNC of the relay K and the power resistor R2 form a closed loop.
In addition, the invention also provides a high-voltage large-current photovoltaic array IV curve testing method, which adopts the high-voltage large-current photovoltaic array IV curve testing circuit and specifically comprises the following steps:
Step 1: before charging, a normally closed contact KNC of a relay K is switched on through a singlechip control circuit and is connected with a power resistor R2, so that a capacitor C is in a discharging state, and the situation that residual electric quantity exists on the capacitor and the accuracy of a measuring result is influenced is prevented;
step 2: when the capacitor starts to be charged, the normally closed contact KNC of the relay K is disconnected through the singlechip control circuit, the normally open contact KNO of the relay is closed, the end of the sampling resistor R1 is connected, the impedance of the capacitor is equal to zero at the charging moment, the voltage of the capacitor cannot change suddenly, so that the voltage at two ends of the capacitor is zero, the circuit is equal to a short circuit, and the flowing current is the short-circuit current ISC of the photovoltaic array; along with the progress of the charging process of the capacitor, charges with equal quantity and opposite polarity are gradually accumulated between the positive electrode and the negative electrode of the capacitor, an electric field with voltage VC is generated at the two ends of the capacitor, the voltage of the capacitor is continuously increased along with the continuous accumulated storage of the charges, when the voltage VC of the capacitor is equal to the voltage of a power supply, the capacitor is not charged any more, at the moment, the charging is finished, the current in the circuit is zero, namely the impedance of the capacitor is infinite, the circuit is in an open-circuit state, and the voltage of the capacitor is the open-circuit voltage VOC of;
And step 3: after charging is finished, the normally open contact KNO of the relay is disconnected through the singlechip control circuit, the normally closed contact KNC of the relay is connected to the power resistor R2, and residual electric quantity on the capacitor is consumed through the power resistor R2, so that the capacitor C is kept in an initial state;
And 4, step 4: and obtaining the IV characteristic curve of the photovoltaic array under the current environmental condition.
Preferably, the method can rapidly complete the volt-ampere characteristic test of the photovoltaic array in the process of capacitor charging, and can obtain a solar panel array current voltage IV curve with the open-circuit voltage VOC reaching 1500V and the short-circuit current ISC reaching 20A.
The invention has the following beneficial technical effects:
The invention provides a capacitive load design scheme aiming at the defect that the traditional electronic load type volt-ampere characteristic curve test cannot measure a high-power photovoltaic array, the capacitor is used as a variable load to be connected to the output end of the photovoltaic array according to the dynamic charging characteristic of the capacitor, a relay comprising a pair of normally open contacts and normally closed contacts is adopted to respectively control a charging circuit and a discharging circuit, the interlocking is realized so as to ensure that the charging circuit and the discharging circuit cannot be simultaneously connected or disconnected, when the photovoltaic array charges the capacitor, the voltage and the current in the period are continuously sampled, namely, the sampling resistor R1 is used for measuring the current in the process of charging the capacitor, and the voltage of the photovoltaic array is measured by measuring the voltage between a U point and a GND point, so that the IV characteristic curve of the photovoltaic array under the current environmental condition can.
the invention adopts a capacitive load mode to overcome the difficulty that the traditional mode of simulating the variable resistor by an electronic load cannot test high power; the current-voltage IV curve characteristic of the solar cell panel array with the photovoltaic array voltage open circuit reaching 1500V and the short circuit current reaching 20A can be measured.
Drawings
Fig. 1 is a graph of photovoltaic array output characteristics IV.
FIG. 2 is a schematic diagram of a test circuit of the present invention.
Detailed Description
The invention is described in further detail below with reference to the following figures and detailed description:
Fig. 2 shows a volt-ampere characteristic test circuit of a photovoltaic array based on a capacitive load, which comprises a test circuit and a discharge circuit, wherein the input of a battery array is PV + and PV-. The contacts KNC, KNO are normally closed contacts and normally open contacts of the relay K. The capacitor charging test circuit consists of a capacitor C, a normally open contact KNO of a relay K and a sampling resistor R1; the discharging circuit consists of a capacitor C, a normally closed contact KNC of the relay K and a resistor R2. The photovoltaic array, the capacitor C, the normally open contact KNO of the relay K and the sampling resistor R1 form a closed loop; and the capacitor C, the normally closed contact KNC of the relay K and the power resistor R2 form a closed loop.
Before charging begins, the singlechip control circuit drives the relay K to enable the normally closed contact KNC of the relay K to be switched on, and the power resistor R2 is switched in, so that the capacitor C is in a discharging state, and the situation that residual electric quantity exists on the capacitor and the accuracy of a measuring result is influenced is prevented.
when the capacitor starts to charge, the normally closed contact of the relay K is disconnected; the normally open contact KNO of the relay is closed, the end of the sampling resistor R1 is connected, the impedance of the capacitor is equal to zero at the charging moment, the voltage at the two ends of the capacitor cannot change suddenly due to the fact that the voltage of the capacitor cannot change suddenly, the circuit is equal to a short circuit, and the flowing current is the short-circuit current ISC of the photovoltaic module. Along with the progress of the charging process of the capacitor, charges with equal quantity and opposite polarity are gradually accumulated between two parallel plates of the capacitor, an electric field with voltage VC is generated at two ends of the capacitor, the voltage of the capacitor is continuously increased along with the continuous accumulated storage of the charges, when the voltage of the capacitor VC is equal to the voltage of a power supply, the capacitor is not charged any more, at the moment, the charging is finished, the current in the circuit is zero, namely the impedance of the capacitor is infinite, the circuit is in an open-circuit state, and the voltage of the capacitor is the open-circuit voltage VOC of the circuit.
After charging is finished, the normally open contact KNO of the relay is disconnected; the normally closed contact KNC is connected into the power resistor R2, and residual electricity on the capacitor is consumed through the power resistor R2, so that the capacitor C is kept in an initial state.
In the process of capacitor charging, the working point of the photovoltaic array part is gradually changed from (0, ISC) to (VOC, 0), the output voltage U and the current I of the photovoltaic array are sampled simultaneously, the sampled U and I values reflect the relation between the voltage and the current output by the photovoltaic array, so that the output state value of the photovoltaic array at each working point is obtained, and the combination of the sampling points can restore the output characteristic IV curve of the photovoltaic array under the current environmental condition, as shown in figure 1.
It is to be understood that the above description is not intended to limit the present invention, and the present invention is not limited to the above examples, and those skilled in the art may make modifications, alterations, additions or substitutions within the spirit and scope of the present invention.
Claims (3)
1. The utility model provides a high-pressure heavy current photovoltaic array IV curve test circuit which characterized in that: the device comprises a capacitance charging test circuit and a discharging circuit; the capacitor charging test circuit comprises a capacitor C, a normally open contact KNO of a relay K and a sampling resistor R1; the discharging circuit comprises a capacitor C, a normally closed contact KNC of a relay K and a power resistor R2; the photovoltaic array, the capacitor C, the normally open contact KNO of the relay K and the sampling resistor R1 form a closed loop; and the capacitor C, the normally closed contact KNC of the relay K and the power resistor R2 form a closed loop.
2. a high-voltage large-current photovoltaic array IV curve testing method is characterized by comprising the following steps: the high-voltage large-current photovoltaic array IV curve test circuit adopted according to claim 1 specifically comprises the following steps:
step 1: before charging, a normally closed contact KNC of a relay K is switched on through a singlechip control circuit and is connected with a power resistor R2, so that a capacitor C is in a discharging state, and the situation that residual electric quantity exists on the capacitor and the accuracy of a measuring result is influenced is prevented;
Step 2: when the capacitor starts to be charged, the normally closed contact KNC of the relay K is disconnected through the singlechip control circuit, the normally open contact KNO of the relay is closed, the end of the sampling resistor R1 is connected, the impedance of the capacitor is equal to zero at the charging moment, the voltage of the capacitor cannot change suddenly, so that the voltage at two ends of the capacitor is zero, the circuit is equal to a short circuit, and the flowing current is the short-circuit current ISC of the photovoltaic array; along with the progress of the charging process of the capacitor, charges with equal quantity and opposite polarity are gradually accumulated between the positive electrode and the negative electrode of the capacitor, an electric field with voltage VC is generated at the two ends of the capacitor, the voltage of the capacitor is continuously increased along with the continuous accumulated storage of the charges, when the voltage VC of the capacitor is equal to the voltage of a power supply, the capacitor is not charged any more, at the moment, the charging is finished, the current in the circuit is zero, namely the impedance of the capacitor is infinite, the circuit is in an open-circuit state, and the voltage of the capacitor is the open-circuit voltage VOC of;
And step 3: after charging is finished, the normally open contact KNO of the relay is disconnected through the singlechip control circuit, the normally closed contact KNC of the relay is connected to the power resistor R2, and residual electric quantity on the capacitor is consumed through the power resistor R2, so that the capacitor C is kept in an initial state;
And 4, step 4: and obtaining the IV characteristic curve of the photovoltaic array under the current environmental condition.
3. The high-voltage high-current photovoltaic array IV curve testing method as claimed in claim 2, wherein: the method can quickly finish the volt-ampere characteristic test of the photovoltaic array in the capacitor charging process, and can obtain the current-voltage IV curve of the solar cell panel array, wherein the open-circuit voltage VOC reaches 1500V, and the short-circuit current ISC reaches 20A.
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113608145A (en) * | 2021-07-14 | 2021-11-05 | 科华数据股份有限公司 | Multi-path photovoltaic module ground fault detection device and detection method |
CN116667784A (en) * | 2023-04-28 | 2023-08-29 | 一道新能源科技股份有限公司 | Capacitance testing method and device for photovoltaic module |
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CN102879722A (en) * | 2012-09-20 | 2013-01-16 | 江苏技术师范学院 | Volt-ampere performance testing device and method for solar array |
CN103235250A (en) * | 2013-04-11 | 2013-08-07 | 合肥工业大学 | Photovoltaic array I-V characteristic testing device and testing method thereof |
CN106096715A (en) * | 2016-05-05 | 2016-11-09 | 江苏方天电力技术有限公司 | Photovoltaic module shade decision method based on peak counting Yu parameter identification |
CN106533359A (en) * | 2016-09-21 | 2017-03-22 | 中国电子科技集团公司第四十研究所 | Photovoltaic assembly outdoor testing device and method of programmable compensation design |
CN108306618A (en) * | 2018-02-27 | 2018-07-20 | 顺德中山大学太阳能研究院 | A kind of photovoltaic IV testers |
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Patent Citations (5)
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CN102879722A (en) * | 2012-09-20 | 2013-01-16 | 江苏技术师范学院 | Volt-ampere performance testing device and method for solar array |
CN103235250A (en) * | 2013-04-11 | 2013-08-07 | 合肥工业大学 | Photovoltaic array I-V characteristic testing device and testing method thereof |
CN106096715A (en) * | 2016-05-05 | 2016-11-09 | 江苏方天电力技术有限公司 | Photovoltaic module shade decision method based on peak counting Yu parameter identification |
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CN113608145A (en) * | 2021-07-14 | 2021-11-05 | 科华数据股份有限公司 | Multi-path photovoltaic module ground fault detection device and detection method |
CN116667784A (en) * | 2023-04-28 | 2023-08-29 | 一道新能源科技股份有限公司 | Capacitance testing method and device for photovoltaic module |
CN116667784B (en) * | 2023-04-28 | 2024-03-15 | 一道新能源科技股份有限公司 | Capacitance testing method and device for photovoltaic module |
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Application publication date: 20191210 |