CN110557091A - High-voltage large-current photovoltaic array IV curve test circuit and test method - Google Patents

High-voltage large-current photovoltaic array IV curve test circuit and test method Download PDF

Info

Publication number
CN110557091A
CN110557091A CN201910709329.8A CN201910709329A CN110557091A CN 110557091 A CN110557091 A CN 110557091A CN 201910709329 A CN201910709329 A CN 201910709329A CN 110557091 A CN110557091 A CN 110557091A
Authority
CN
China
Prior art keywords
capacitor
circuit
voltage
photovoltaic array
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201910709329.8A
Other languages
Chinese (zh)
Inventor
钱彬
朱炬
朱文星
王俊
年夫来
邓允长
周康
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
China Electrical Instruments (anhui) Co Ltd
Original Assignee
China Electrical Instruments (anhui) Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by China Electrical Instruments (anhui) Co Ltd filed Critical China Electrical Instruments (anhui) Co Ltd
Priority to CN201910709329.8A priority Critical patent/CN110557091A/en
Publication of CN110557091A publication Critical patent/CN110557091A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02JCIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
    • H02J7/00Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries
    • H02J7/0068Battery or charger load switching, e.g. concurrent charging and load supply
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02JCIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
    • H02J7/00Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries
    • H02J7/34Parallel operation in networks using both storage and other dc sources, e.g. providing buffering
    • H02J7/345Parallel operation in networks using both storage and other dc sources, e.g. providing buffering using capacitors as storage or buffering devices
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02SGENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10Testing of PV devices, e.g. of PV modules or single PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

Abstract

The invention discloses a high-voltage heavy-current photovoltaic array IV curve test circuit and a test method, belonging to the field of photovoltaic test.A capacitor is connected to the output end of a photovoltaic array as a variable load, and when the photovoltaic array charges the capacitor, the voltage and current in the period of time are continuously sampled to obtain the IV characteristic curve of the photovoltaic array under the current environmental condition; the difficulty that the traditional mode of simulating variable resistance by an electronic load cannot test high power is overcome by adopting a capacitive load mode.

Description

High-voltage large-current photovoltaic array IV curve test circuit and test method
Technical Field
The invention belongs to the field of photovoltaic testing, and particularly relates to a high-voltage large-current photovoltaic array IV curve testing circuit and a testing method.
background
the traditional volt-ampere characteristic curve test method is to test the voltage and current output characteristics of a photovoltaic array by adjusting the continuous change of load impedance. The load impedance is generally adjusted by an electronic load. In the driving design of the electronic load, a power MOS tube is adopted as an electronic load device, and when the MOS tube works in an unsaturated region, a variable resistor controlled by a grid voltage can be regarded between a source electrode and a drain electrode. The working characteristic of the power MOS tube is that the current passing capacity is reduced faster along with the increase of the voltage between the source electrode and the drain electrode, the current is larger and larger along with the increase of the voltage of a tested photovoltaic array system, and the test mode of simulating the variable resistor by the electronic load device cannot meet the test requirement. The test method must be changed to meet the high voltage, high current test capability.
Disclosure of Invention
aiming at the technical problems in the prior art, the invention provides the high-voltage large-current photovoltaic array IV curve test circuit and the test method, which are reasonable in design, overcome the defects of the prior art and have good effects.
In order to achieve the purpose, the invention adopts the following technical scheme:
a high-voltage large-current photovoltaic array IV curve test circuit comprises a capacitor charging test circuit and a discharging circuit; the capacitor charging test circuit comprises a capacitor C, a normally open contact KNO of a relay K and a sampling resistor R1; the discharging circuit comprises a capacitor C, a normally closed contact KNC of a relay K and a power resistor R2; the photovoltaic array, the capacitor C, the normally open contact KNO of the relay K and the sampling resistor R1 form a closed loop; and the capacitor C, the normally closed contact KNC of the relay K and the power resistor R2 form a closed loop.
In addition, the invention also provides a high-voltage large-current photovoltaic array IV curve testing method, which adopts the high-voltage large-current photovoltaic array IV curve testing circuit and specifically comprises the following steps:
Step 1: before charging, a normally closed contact KNC of a relay K is switched on through a singlechip control circuit and is connected with a power resistor R2, so that a capacitor C is in a discharging state, and the situation that residual electric quantity exists on the capacitor and the accuracy of a measuring result is influenced is prevented;
step 2: when the capacitor starts to be charged, the normally closed contact KNC of the relay K is disconnected through the singlechip control circuit, the normally open contact KNO of the relay is closed, the end of the sampling resistor R1 is connected, the impedance of the capacitor is equal to zero at the charging moment, the voltage of the capacitor cannot change suddenly, so that the voltage at two ends of the capacitor is zero, the circuit is equal to a short circuit, and the flowing current is the short-circuit current ISC of the photovoltaic array; along with the progress of the charging process of the capacitor, charges with equal quantity and opposite polarity are gradually accumulated between the positive electrode and the negative electrode of the capacitor, an electric field with voltage VC is generated at the two ends of the capacitor, the voltage of the capacitor is continuously increased along with the continuous accumulated storage of the charges, when the voltage VC of the capacitor is equal to the voltage of a power supply, the capacitor is not charged any more, at the moment, the charging is finished, the current in the circuit is zero, namely the impedance of the capacitor is infinite, the circuit is in an open-circuit state, and the voltage of the capacitor is the open-circuit voltage VOC of;
And step 3: after charging is finished, the normally open contact KNO of the relay is disconnected through the singlechip control circuit, the normally closed contact KNC of the relay is connected to the power resistor R2, and residual electric quantity on the capacitor is consumed through the power resistor R2, so that the capacitor C is kept in an initial state;
And 4, step 4: and obtaining the IV characteristic curve of the photovoltaic array under the current environmental condition.
Preferably, the method can rapidly complete the volt-ampere characteristic test of the photovoltaic array in the process of capacitor charging, and can obtain a solar panel array current voltage IV curve with the open-circuit voltage VOC reaching 1500V and the short-circuit current ISC reaching 20A.
The invention has the following beneficial technical effects:
The invention provides a capacitive load design scheme aiming at the defect that the traditional electronic load type volt-ampere characteristic curve test cannot measure a high-power photovoltaic array, the capacitor is used as a variable load to be connected to the output end of the photovoltaic array according to the dynamic charging characteristic of the capacitor, a relay comprising a pair of normally open contacts and normally closed contacts is adopted to respectively control a charging circuit and a discharging circuit, the interlocking is realized so as to ensure that the charging circuit and the discharging circuit cannot be simultaneously connected or disconnected, when the photovoltaic array charges the capacitor, the voltage and the current in the period are continuously sampled, namely, the sampling resistor R1 is used for measuring the current in the process of charging the capacitor, and the voltage of the photovoltaic array is measured by measuring the voltage between a U point and a GND point, so that the IV characteristic curve of the photovoltaic array under the current environmental condition can.
the invention adopts a capacitive load mode to overcome the difficulty that the traditional mode of simulating the variable resistor by an electronic load cannot test high power; the current-voltage IV curve characteristic of the solar cell panel array with the photovoltaic array voltage open circuit reaching 1500V and the short circuit current reaching 20A can be measured.
Drawings
Fig. 1 is a graph of photovoltaic array output characteristics IV.
FIG. 2 is a schematic diagram of a test circuit of the present invention.
Detailed Description
The invention is described in further detail below with reference to the following figures and detailed description:
Fig. 2 shows a volt-ampere characteristic test circuit of a photovoltaic array based on a capacitive load, which comprises a test circuit and a discharge circuit, wherein the input of a battery array is PV + and PV-. The contacts KNC, KNO are normally closed contacts and normally open contacts of the relay K. The capacitor charging test circuit consists of a capacitor C, a normally open contact KNO of a relay K and a sampling resistor R1; the discharging circuit consists of a capacitor C, a normally closed contact KNC of the relay K and a resistor R2. The photovoltaic array, the capacitor C, the normally open contact KNO of the relay K and the sampling resistor R1 form a closed loop; and the capacitor C, the normally closed contact KNC of the relay K and the power resistor R2 form a closed loop.
Before charging begins, the singlechip control circuit drives the relay K to enable the normally closed contact KNC of the relay K to be switched on, and the power resistor R2 is switched in, so that the capacitor C is in a discharging state, and the situation that residual electric quantity exists on the capacitor and the accuracy of a measuring result is influenced is prevented.
when the capacitor starts to charge, the normally closed contact of the relay K is disconnected; the normally open contact KNO of the relay is closed, the end of the sampling resistor R1 is connected, the impedance of the capacitor is equal to zero at the charging moment, the voltage at the two ends of the capacitor cannot change suddenly due to the fact that the voltage of the capacitor cannot change suddenly, the circuit is equal to a short circuit, and the flowing current is the short-circuit current ISC of the photovoltaic module. Along with the progress of the charging process of the capacitor, charges with equal quantity and opposite polarity are gradually accumulated between two parallel plates of the capacitor, an electric field with voltage VC is generated at two ends of the capacitor, the voltage of the capacitor is continuously increased along with the continuous accumulated storage of the charges, when the voltage of the capacitor VC is equal to the voltage of a power supply, the capacitor is not charged any more, at the moment, the charging is finished, the current in the circuit is zero, namely the impedance of the capacitor is infinite, the circuit is in an open-circuit state, and the voltage of the capacitor is the open-circuit voltage VOC of the circuit.
After charging is finished, the normally open contact KNO of the relay is disconnected; the normally closed contact KNC is connected into the power resistor R2, and residual electricity on the capacitor is consumed through the power resistor R2, so that the capacitor C is kept in an initial state.
In the process of capacitor charging, the working point of the photovoltaic array part is gradually changed from (0, ISC) to (VOC, 0), the output voltage U and the current I of the photovoltaic array are sampled simultaneously, the sampled U and I values reflect the relation between the voltage and the current output by the photovoltaic array, so that the output state value of the photovoltaic array at each working point is obtained, and the combination of the sampling points can restore the output characteristic IV curve of the photovoltaic array under the current environmental condition, as shown in figure 1.
It is to be understood that the above description is not intended to limit the present invention, and the present invention is not limited to the above examples, and those skilled in the art may make modifications, alterations, additions or substitutions within the spirit and scope of the present invention.

Claims (3)

1. The utility model provides a high-pressure heavy current photovoltaic array IV curve test circuit which characterized in that: the device comprises a capacitance charging test circuit and a discharging circuit; the capacitor charging test circuit comprises a capacitor C, a normally open contact KNO of a relay K and a sampling resistor R1; the discharging circuit comprises a capacitor C, a normally closed contact KNC of a relay K and a power resistor R2; the photovoltaic array, the capacitor C, the normally open contact KNO of the relay K and the sampling resistor R1 form a closed loop; and the capacitor C, the normally closed contact KNC of the relay K and the power resistor R2 form a closed loop.
2. a high-voltage large-current photovoltaic array IV curve testing method is characterized by comprising the following steps: the high-voltage large-current photovoltaic array IV curve test circuit adopted according to claim 1 specifically comprises the following steps:
step 1: before charging, a normally closed contact KNC of a relay K is switched on through a singlechip control circuit and is connected with a power resistor R2, so that a capacitor C is in a discharging state, and the situation that residual electric quantity exists on the capacitor and the accuracy of a measuring result is influenced is prevented;
Step 2: when the capacitor starts to be charged, the normally closed contact KNC of the relay K is disconnected through the singlechip control circuit, the normally open contact KNO of the relay is closed, the end of the sampling resistor R1 is connected, the impedance of the capacitor is equal to zero at the charging moment, the voltage of the capacitor cannot change suddenly, so that the voltage at two ends of the capacitor is zero, the circuit is equal to a short circuit, and the flowing current is the short-circuit current ISC of the photovoltaic array; along with the progress of the charging process of the capacitor, charges with equal quantity and opposite polarity are gradually accumulated between the positive electrode and the negative electrode of the capacitor, an electric field with voltage VC is generated at the two ends of the capacitor, the voltage of the capacitor is continuously increased along with the continuous accumulated storage of the charges, when the voltage VC of the capacitor is equal to the voltage of a power supply, the capacitor is not charged any more, at the moment, the charging is finished, the current in the circuit is zero, namely the impedance of the capacitor is infinite, the circuit is in an open-circuit state, and the voltage of the capacitor is the open-circuit voltage VOC of;
And step 3: after charging is finished, the normally open contact KNO of the relay is disconnected through the singlechip control circuit, the normally closed contact KNC of the relay is connected to the power resistor R2, and residual electric quantity on the capacitor is consumed through the power resistor R2, so that the capacitor C is kept in an initial state;
And 4, step 4: and obtaining the IV characteristic curve of the photovoltaic array under the current environmental condition.
3. The high-voltage high-current photovoltaic array IV curve testing method as claimed in claim 2, wherein: the method can quickly finish the volt-ampere characteristic test of the photovoltaic array in the capacitor charging process, and can obtain the current-voltage IV curve of the solar cell panel array, wherein the open-circuit voltage VOC reaches 1500V, and the short-circuit current ISC reaches 20A.
CN201910709329.8A 2019-08-02 2019-08-02 High-voltage large-current photovoltaic array IV curve test circuit and test method Pending CN110557091A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910709329.8A CN110557091A (en) 2019-08-02 2019-08-02 High-voltage large-current photovoltaic array IV curve test circuit and test method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910709329.8A CN110557091A (en) 2019-08-02 2019-08-02 High-voltage large-current photovoltaic array IV curve test circuit and test method

Publications (1)

Publication Number Publication Date
CN110557091A true CN110557091A (en) 2019-12-10

Family

ID=68736868

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910709329.8A Pending CN110557091A (en) 2019-08-02 2019-08-02 High-voltage large-current photovoltaic array IV curve test circuit and test method

Country Status (1)

Country Link
CN (1) CN110557091A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113608145A (en) * 2021-07-14 2021-11-05 科华数据股份有限公司 Multi-path photovoltaic module ground fault detection device and detection method
CN116667784A (en) * 2023-04-28 2023-08-29 一道新能源科技股份有限公司 Capacitance testing method and device for photovoltaic module

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102879722A (en) * 2012-09-20 2013-01-16 江苏技术师范学院 Volt-ampere performance testing device and method for solar array
CN103235250A (en) * 2013-04-11 2013-08-07 合肥工业大学 Photovoltaic array I-V characteristic testing device and testing method thereof
CN106096715A (en) * 2016-05-05 2016-11-09 江苏方天电力技术有限公司 Photovoltaic module shade decision method based on peak counting Yu parameter identification
CN106533359A (en) * 2016-09-21 2017-03-22 中国电子科技集团公司第四十研究所 Photovoltaic assembly outdoor testing device and method of programmable compensation design
CN108306618A (en) * 2018-02-27 2018-07-20 顺德中山大学太阳能研究院 A kind of photovoltaic IV testers

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102879722A (en) * 2012-09-20 2013-01-16 江苏技术师范学院 Volt-ampere performance testing device and method for solar array
CN103235250A (en) * 2013-04-11 2013-08-07 合肥工业大学 Photovoltaic array I-V characteristic testing device and testing method thereof
CN106096715A (en) * 2016-05-05 2016-11-09 江苏方天电力技术有限公司 Photovoltaic module shade decision method based on peak counting Yu parameter identification
CN106533359A (en) * 2016-09-21 2017-03-22 中国电子科技集团公司第四十研究所 Photovoltaic assembly outdoor testing device and method of programmable compensation design
CN108306618A (en) * 2018-02-27 2018-07-20 顺德中山大学太阳能研究院 A kind of photovoltaic IV testers

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113608145A (en) * 2021-07-14 2021-11-05 科华数据股份有限公司 Multi-path photovoltaic module ground fault detection device and detection method
CN116667784A (en) * 2023-04-28 2023-08-29 一道新能源科技股份有限公司 Capacitance testing method and device for photovoltaic module
CN116667784B (en) * 2023-04-28 2024-03-15 一道新能源科技股份有限公司 Capacitance testing method and device for photovoltaic module

Similar Documents

Publication Publication Date Title
Cultura et al. Modeling, evaluation and simulation of a supercapacitor module for energy storage application
CN106300545B (en) A kind of active equalization control device and control method for liquid metal cell
Glavin et al. Ultracapacitor/battery hybrid for solar energy storage
CN103760492A (en) Method for online testing performance of lead-acid storage cells of transformer substation
CN110557091A (en) High-voltage large-current photovoltaic array IV curve test circuit and test method
Lei et al. Charging optimization of lithium-ion batteries based on capacity degradation speed and energy loss
CN105162206A (en) Rechargeable battery charging control method
CN102879722A (en) Volt-ampere performance testing device and method for solar array
CN114156945A (en) Photovoltaic micro-grid island mode power generation device and control method thereof
CN108306618A (en) A kind of photovoltaic IV testers
CN111366864B (en) Battery SOH on-line estimation method based on fixed voltage rise interval
CN102967831A (en) On-line detection system and detection method of lead-acid storage battery performance
CN203759127U (en) Device for measuring single-cell battery internal resistance in equalization processes
CN103823118A (en) Device and method for measuring internal resistance of battery cells during equalization
CN104076294B (en) Load device for testing battery performance of electric vehicle
CN111398834A (en) SoC (system on chip) real-time estimation system and estimation method for liquid metal battery
Rajani et al. Experimental verification of the rate of charge improvement using photovoltaic MPPT hardware for the battery and ultracapacitor storage devices
CN202443113U (en) Battery self-discharge performance rapid measuring device
CN201364513Y (en) Expandable constant current source device
CN210327087U (en) Constant-resistance charging and discharging circuit
CN108183688B (en) Solar energy output data detection circuitry
CN111693782A (en) Storage battery internal resistance test and large current tolerance test device with loop resistor
CN107069922B (en) Electrochemical cell charge-discharge current monitoring system and monitoring method for energy storage
Yin et al. Study on the Effect of High Temperature and High-Current Rate on Fast Charging of Lithium-ion Batteries
TWI658676B (en) Novel battery balancer

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20191210