CN115877210B - Pressure-maintaining adjustable capacitive load insulation detection method, device and equipment - Google Patents
Pressure-maintaining adjustable capacitive load insulation detection method, device and equipment Download PDFInfo
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- CN115877210B CN115877210B CN202211572296.5A CN202211572296A CN115877210B CN 115877210 B CN115877210 B CN 115877210B CN 202211572296 A CN202211572296 A CN 202211572296A CN 115877210 B CN115877210 B CN 115877210B
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Abstract
The invention provides a pressure-maintaining adjustable capacitive load insulation detection method, a pressure-maintaining adjustable capacitive load insulation detection device and pressure-maintaining adjustable capacitive load insulation detection equipment, which belong to the technical field of capacitive load micro-short circuit detection, and if the maximum drop value of the voltage of a capacitive load end in a voltage rising stage is larger than a first preset threshold value, the capacitive load is subjected to micro-breakdown in the voltage rising stage; if the maximum drop value of the capacitive load terminal voltage in the pressure maintaining stage is larger than a second preset threshold value, micro breakdown of the capacitive load occurs in the pressure maintaining stage; if the maximum drop value of the terminal voltage in the free drop stage is larger than a third preset threshold value, micro breakdown occurs in the capacitive load in the free drop stage, defective products with small insulation resistance values but no micro breakdown or micro short circuit occurs in the voltage rising stage and the pressure maintaining stage can be effectively detected by increasing the detection of the capacitive load terminal voltage in the free drop stage, and the detection precision and the detection rate of defects such as micro breakdown and small insulation resistance values in the free drop stage are improved by enabling the third preset threshold value to be larger than the first preset threshold value and the second preset threshold value.
Description
Technical Field
The invention relates to the technical field of capacitive load micro-short circuit detection, in particular to a pressure-maintaining adjustable capacitive load insulation detection method, device and equipment.
Background
The battery short circuit may cause abnormal discharge of the battery and even safety accidents. In the battery production process, detection and identification of the short circuit problem of a battery cell (short-term battery cell) before electrolyte injection are vital, so that abnormal discharge and safety accidents caused by battery short circuit can be avoided in the stage of finished battery production, the short circuit battery cell can be identified in advance, and the production and processing cost of the short circuit battery cell is reduced.
In the actual production process, besides the serious short-circuit problems caused by material dust puncture, diaphragm breakdown, electrode lug folding and the like, a large proportion of micro-short-circuit cells exist, micro-short-circuit points are caused by material dust particles, diaphragm defects, the structural characteristics of the cells and the like, instant discharge can occur at the micro-short-circuit points after high-voltage excitation is applied to positive and negative electrodes, the micro-short-circuit points are restored to a similar normal cell state after being fused in a high-voltage discharge process, but the cells still have the risk of burning defects of the micro-short-circuit discharge or further causing short circuits, and are the type which is difficult to identify in the short-circuit cells.
Chinese patent CN114035081a discloses a test method for accurately identifying the problem of micro-short circuit of battery cells before liquid injection, controlling constant current output to charge the cells to a stable test voltage, and at the same time, step one, in the stage of rising of charging voltage and constant voltage maintaining, a voltage sampling channel is controlled to sample voltages at two ends of a tested battery cell in real time and draw a voltage dynamic change curve in the charging process; step two, calculating sampling points in the voltage climbing process, wherein the maximum voltage drop value Vd1 occurs in the voltage climbing process; step three, calculating sampling points in the voltage maintaining process, and after the voltage rises to the set voltage, obtaining a maximum voltage drop value Vd2 when the test time is over; and fourthly, comparing the captured Vd1 and Vd2 with Vd1 and Vd2 thresholds of the good battery cell test, and identifying instant micro-short discharge generated in the test. However, the use fault problem of the capacitive load product caused by the small insulation resistance of the capacitive load cannot be accurately detected because the charging voltage climbing and the voltage dynamic change curve of the constant voltage maintaining stage are only detected.
Disclosure of Invention
The invention provides a pressure-maintaining adjustable capacitive load insulation detection method, a pressure-maintaining adjustable capacitive load insulation detection device and pressure-maintaining adjustable capacitive load insulation detection equipment, which can accurately detect the defects of short circuit, micro breakdown, low insulation resistance and the like of a capacitive load, different product defects display different fault types, and customers can purposefully improve the production flow according to the product reject ratio corresponding to the detected capacitive load defect types.
The specific technical scheme provided by the invention is as follows:
in one aspect, the pressure-maintaining adjustable capacitive load insulation detection method provided by the invention comprises the following steps:
the method comprises the steps of respectively obtaining the maximum drop value of the capacitive load terminal voltage in a voltage rising stage, a pressure maintaining stage and a free drop stage;
if the maximum drop value of the capacitive load terminal voltage in the voltage rising stage is larger than a first preset threshold value, micro-breakdown of the capacitive load occurs in the voltage rising stage;
if the maximum drop value of the capacitive load terminal voltage in the pressure maintaining stage is larger than a second preset threshold value, micro breakdown of the capacitive load occurs in the pressure maintaining stage;
if the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than a third preset threshold value, the capacitive load is subjected to micro-breakdown in the free drop stage; wherein the third preset threshold is greater than the first preset threshold and the second preset threshold.
Optionally, the magnitude of the third preset threshold value is in positive correlation with the maximum voltage of the voltage rising stage and the duration of the free falling stage.
Optionally, the third preset threshold is equal to a product value obtained by multiplying a ratio of a maximum voltage of the voltage rising stage to an equivalent insulation resistance of the capacitive load itself by a duration length of the free fall stage and a weight coefficient.
Optionally, if the maximum drop value of the voltage at the capacitive load terminal in the voltage rising stage is greater than the first preset threshold, the micro-breakdown of the capacitive load in the voltage rising stage includes:
if the maximum drop value of the capacitive load terminal voltage in the voltage rising stage is larger than a first preset threshold value, acquiring the capacitive load terminal voltage value at the ending moment of the voltage rising stage;
if the voltage value of the capacitive load end at the ending time of the voltage rising stage is smaller than a preset voltage value, the capacitive load is short-circuited in the voltage rising stage;
if the voltage value of the capacitive load end at the end of the voltage rising stage is equal to a preset voltage value, the capacitive load is in micro short circuit in the voltage rising stage, wherein the preset voltage value is the same as the maximum voltage value of the capacitive load in the pressure maintaining stage.
Optionally, if the maximum drop value of the voltage at the capacitive load terminal in the free drop stage is greater than a third preset threshold, then the micro-breakdown of the capacitive load in the free drop stage specifically includes:
if the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than a third preset threshold value, judging whether the capacitive load terminal voltage change curve in the free drop stage drops linearly or not;
if the voltage change curve of the capacitive load end in the free falling stage is linear falling, the capacitive load is not subjected to micro breakdown in the free falling stage;
if the voltage change curve of the capacitive load end in the free falling stage is nonlinear falling, the capacitive load is subjected to micro-breakdown in the free falling stage.
Optionally, if the maximum drop value of the voltage at the capacitive load terminal in the free drop stage is greater than a third preset threshold, then the micro-breakdown of the capacitive load in the free drop stage specifically includes:
if the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than a third preset threshold value, acquiring the maximum slope of the capacitive load terminal voltage change curve in the free drop stage;
if the maximum slope is not greater than the preset slope threshold, the capacitive load is not subjected to micro breakdown in the free falling stage;
If the maximum slope is greater than a preset slope threshold, the capacitive load undergoes micro-breakdown in the free fall phase.
Optionally, the duration of the voltage rising stage is smaller than the duration of the dwell stage and smaller than the duration of the free fall stage, and the duration of the free fall stage is greater than the duration of the dwell stage.
Optionally, the duration of the voltage rising stage is always less than 100ms, and the magnitude of the third preset threshold value is in positive correlation with the maximum voltage of the voltage rising stage.
On the other hand, the invention also provides a pressure-maintaining adjustable capacitive load insulation detection device, which comprises:
the acquisition module is used for respectively acquiring the maximum drop value of the capacitive load terminal voltage in the voltage rising stage, the pressure maintaining stage and the free drop stage;
the first judging module is used for generating micro breakdown of the capacitive load in the voltage rising stage if the maximum drop value of the capacitive load terminal voltage in the voltage rising stage is larger than a first preset threshold value;
the second judging module is used for generating micro-breakdown of the capacitive load in the pressure maintaining stage if the maximum drop value of the capacitive load terminal voltage in the pressure maintaining stage is larger than a second preset threshold value;
The third judging module is used for generating micro breakdown of the capacitive load in the free falling stage if the maximum voltage drop value of the capacitive load terminal in the free falling stage is larger than a third preset threshold value; wherein the third preset threshold is greater than the first preset threshold and the second preset threshold.
In another aspect, the present application provides a pressure maintaining adjustable capacitive load insulation detection device, comprising: a processor, and a memory communicatively coupled to the processor;
the memory stores computer-executable instructions;
the processor executes the computer execution instructions stored in the memory to realize the pressure-maintaining adjustable capacitive load insulation detection method.
In another aspect, the present application provides a computer readable storage medium having stored therein computer executable instructions that when executed by a processor are configured to implement the pressure maintaining adjustable capacitive load insulation detection method described above.
The beneficial effects of the invention are as follows:
the pressure-maintaining adjustable capacitive load insulation detection method comprises the steps of respectively obtaining the maximum drop value of the capacitive load terminal voltage in a voltage rising stage, a pressure maintaining stage and a free drop stage; if the maximum drop value of the capacitive load terminal voltage in the voltage rising stage is larger than a first preset threshold value, micro-breakdown of the capacitive load occurs in the voltage rising stage; if the maximum drop value of the capacitive load terminal voltage in the pressure maintaining stage is larger than a second preset threshold value, micro breakdown of the capacitive load occurs in the pressure maintaining stage; if the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than a third preset threshold value, micro breakdown occurs in the capacitive load in the free drop stage, defective products with small capacitive load insulation resistance but no micro breakdown or micro short circuit occurs in the voltage rising stage and the pressure maintaining stage can be effectively detected by increasing the capacitive load terminal voltage detection in the free drop stage, and the detection precision and the detection rate of defects such as micro breakdown and small insulation resistance in the free drop stage can be improved by enabling the third preset threshold value to be larger than the first preset threshold value and the second preset threshold value.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flow chart of a pressure maintaining adjustable capacitive load insulation detection method according to an embodiment of the invention;
FIG. 2 is a schematic diagram of a complete test waveform of a capacitive load terminal voltage as exemplified herein;
FIG. 3 is a schematic diagram of a micro-shorting waveform of a capacitive load terminal voltage as exemplary shown herein;
FIG. 4 is a schematic diagram of a short circuit waveform of a capacitive load terminal voltage according to an embodiment of the present invention;
FIG. 5 is a block diagram of a pressure maintaining adjustable capacitive load insulation detection device according to an embodiment of the present invention;
fig. 6 is a graph showing polarization current during insulation testing of a capacitive load according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in further detail below with reference to the accompanying drawings, and it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The terms "comprises" and "comprising," along with any variations thereof, in the description and claims, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
A pressure-maintaining adjustable capacitive load insulation detection method and apparatus according to an embodiment of the present invention will be described in detail with reference to fig. 1 to 6.
Referring to fig. 6, the capacitive load generally includes a lithium battery cell, a patch capacitor, and the like before liquid injection, and the pressure-maintaining adjustable capacitive load insulation detection method and the pressure-maintaining adjustable capacitive load insulation detection device according to the embodiment of the invention can be widely applied to insulation performance detection of the capacitive load such as the lithium battery cell, the patch capacitor, and the like before liquid injection.
As is well known, insulation tests for capacitive loads (such as lithium battery cells, patch capacitors and the like before liquid injection) are currently widely performed by using an insulation resistance tester or a direct current withstand voltage tester. None of these approaches have been developed specifically for capacitive loads, however, without taking into account the particulars of capacitive load insulation testing. Some insulating objects such as plastics, ceramics and the like can reach a stable value instantly under the action of direct current high voltage, but for capacitive loads such as lithium battery cores, patch capacitors and the like before liquid injection, the insulation of the insulating objects is composed of a composite medium, and various polarization phenomena can be generated under the action of direct current high voltage.
Referring to fig. 6, three polarized currents exist in the insulation test process of capacitive loads such as a lithium battery cell, a patch capacitor and the like before liquid injection, wherein the capacitance current i1 is generated due to the capacitance effect of a medium, and when the capacitive load to be tested is pressurized, rapid polarization occurs in the medium, which is equivalent to the current generated by charging the capacitor. The capacitance current i1 is instantaneously present and decays rapidly. The sink current i2 is the current generated by slow polarization occurring inside the medium, which decays slowly over time. The conduction current i3 is caused by the dielectric itself insulation equivalent impedance, and its current value is constant.
The current is large at the beginning of polarization and drops with increasing time. During polarization, the fastest decay is the capacitive current i1, the sink current i2 slowly over time, and the non-time-varying current is the conduction current i3 (leakage current). Therefore, when the insulation resistance tester measures the insulation value of the capacitive load, the insulation resistance is small at first, and only a few megaohms, and the insulation resistance is rapidly increased along with the gradual decrease of the polarization current, and then the change is slowed down. The insulation resistance test of the capacitive load generally needs more than a few seconds, and the insulation test value of the high-capacity lithium battery core needs more than 10 seconds, so that the requirement of an automatic production line on the rapid test of the capacitive load cannot be met.
Meanwhile, if the thin whisker-shaped protrusions exist on the diaphragm, a capacitive load such as a lithium battery core before liquid injection can break down and short circuit instantly after direct-current high voltage is applied, and the battery core becomes an insulating state after burning. The insulation resistance tester can filter out the capacitive load from the bypass capacitor of the hardware sampling circuit and the software average algorithm, so that the transient discharge micro short circuit defect of the capacitive load can not be detected. Chinese patent CN114035081A discloses a test method for accurately identifying the problem of micro short circuit of a battery cell before liquid injection, and the test method can detect the micro short circuit generated in the voltage rising stage and the pressure maintaining stage, but can not detect the product defect caused by small insulation resistance of a capacitive load, and the prior art needs to be overlapped with an insulation resistance tester or a direct current withstand voltage tester for use, so that the detection precision is low and the detection efficiency is low.
In order to solve the technical problems, the embodiment of the invention provides a pressure-maintaining adjustable capacitive load insulation detection method, which adopts a mode with adjustable high-voltage holding time and sets different pressure maintaining times according to different capacitive loads to solve the problem that the capacitive loads have polarization current specificity. After the pressure maintaining mode is finished, the output of the high-voltage device is stopped, the tested capacitive load enters a free discharge mode (free drop stage), the electric charge consumption is carried out by the self equivalent insulation resistance according to the characteristic that the capacitive load has the capacity of storing electric quantity, after the set time is reached, the electric quantity stored by the capacitive load is actively and rapidly discharged by the high-voltage device, the voltage drop at the end of the capacitive load is zero and then flows to the next test procedure, whether the insulation quality of the capacitive load is good or bad is judged by comparing whether the voltage drop value exceeds the set alarm threshold value at each stage, and the product defect detection such as micro short circuit, small insulation resistance value and the like of the capacitive load can be simultaneously carried out.
Referring to fig. 1 to 4, the pressure-maintaining adjustable capacitive load insulation detection method provided by the embodiment of the invention includes:
step 110: and respectively acquiring the maximum drop values of the capacitive load terminal voltages in the voltage rising stage, the pressure maintaining stage and the free drop stage.
Referring to fig. 1 and 2, the whole process of capacitive load insulation detection is divided into a voltage rising stage, a pressure maintaining stage, a free falling stage and a quick discharging stage, wherein an insulation resistance tester, a direct current withstand voltage tester or a technical scheme adopted by chinese patent CN114035081a in the prior art charges a detected capacitive load all the time in the whole test process, and the corresponding test process only has the voltage rising stage and the pressure maintaining stage.
In the embodiment of the invention, a high-voltage device is adopted to apply high voltage to a tested capacitive load (such as a lithium battery cell, a patch capacitor and the like before liquid injection) in the voltage rising stage, and the voltage value applied to the tested capacitive load can be adjusted and set according to the requirement. The capacitive load to be tested needs a certain charging time, the voltage can reach a preset voltage value, and the preset voltage value is also the maximum terminal voltage value of the capacitive load in the subsequent voltage-keeping stage. The voltage rising phase of the capacitive load to be measured corresponds to the initial rapid polarization process of the capacitive load to be measured. The duration of the initial fast polarization process depends on the internal resistance of the high voltage device and the magnitude of the equivalent capacitance of the capacitive load being measured. The embodiment of the invention preferably controls the duration time of the voltage rising stage within 100ms by adjusting the voltage rising time of the internal resistance control end of the high-voltage device to be not more than 100ms, thereby realizing the initial rapid polarization of the tested capacitive load and improving the micro short circuit and short circuit detection precision of the capacitive load in the voltage rising stage.
When the terminal voltage of the capacitive load terminal to be tested reaches a preset voltage value, the high-voltage device is kept to continuously output so that the capacitive load to be tested enters a pressure maintaining stage, wherein the duration time of the pressure maintaining stage is longer than the duration time of a voltage rising stage, if the duration time of the pressure maintaining stage is insufficient or the pressure maintaining stage is not performed, the capacitive load terminal to be tested enters a free discharging stage, in the actual testing process, the terminal voltage of the capacitive load to be tested can be observed to obviously drop, then the voltage is nearly linearly dropped, further, false detection of short circuit or micro short circuit in the free discharging stage can be caused, and micro short circuit detection precision in the free dropping stage can be reduced.
Through creative research, the detected capacitive load can generate interlayer polarization phenomenon in the insulation test process, the duration of the interlayer polarization phenomenon is long, but the absorption current is small. If the voltage rising stage is finished without maintaining the pressure or the duration time of the pressure maintaining stage is not enough, the device enters a free falling stage (namely a free discharging stage), namely, the high-voltage device stops outputting when the pressure maintaining stage is finished and the voltage rising stage does not have enough time, the absorption current consumed by the interlayer polarization of the capacitive load can cause a section of steeper falling of the voltage of the end of the capacitive load to be detected, and when the interlayer polarization phenomenon is finished, the voltage of the end of the capacitive load to be detected is linear falling caused by free discharging of the equivalent insulation resistance of the capacitive load to be detected. The voltage drop discreteness of the free discharge stage end is large, the third preset threshold value cannot be accurately set to accurately judge the micro short circuit and micro breakdown phenomena occurring in the free drop stage, and further misjudgment or missing detection of the free drop stage affects the insulation detection precision of the capacitive load to be detected.
The embodiment of the invention is not particularly limited as to how long the duration of the pressure maintaining stage is specifically set. However, through inventive analysis, the duration of the dwell period needs to be set to be longer than the duration of the voltage rising period, where a dwell time longer than the duration of the voltage rising period may be initially set according to the polarization condition of the capacitive load to be measured after reaching the preset voltage value, so that the high voltage device continues to output the voltage to provide the absorption current of the capacitive load.
After the pressure maintaining stage is finished, the high-voltage device stops outputting voltage, the capacitive load to be tested enters a free discharging mode, and the continuous process of the free discharging mode is the free falling stage of the embodiment of the invention. The free discharging mode is to stop the output of the high-voltage device by means of the characteristic that the capacitive load has charge storage capacity, namely stopping pressure maintaining, and the capacitive load end voltage is approximately linearly reduced by the equivalent insulation resistance of the capacitive load. In the free falling stage, if the equivalent insulation impedance of the capacitive load meets the requirement and no micro breakdown or micro short circuit occurs, at this time, since the equivalent insulation impedance of the capacitive load is basically in a stable range, the capacitance value is also stable, so that the terminal voltage drop value of the capacitive load to be measured is also stable and basically shows linear drop in the duration of the free falling stage.
After the free discharging stage is finished, the short-circuit insulation test of the tested capacitive load is finished, and at the moment, an active discharging circuit in the high-voltage device discharges the stored charge of the tested capacitive load, so that the voltage drop of the end of the active discharging circuit is zero and then the active discharging circuit flows to the next station, and the electric shock accident is prevented.
By way of example, the embodiment of the invention adopts a digital voltmeter to detect the voltage values of the detected capacitive load ends in the voltage rising stage, the pressure maintaining stage, the free falling stage and the rapid discharging stage, and can intuitively display the voltage change curves of the detected capacitive load ends in the voltage rising stage, the pressure maintaining stage, the free falling stage and the rapid discharging stage in a curve form after being processed, wherein the voltage change curves of the detected capacitive load ends in the voltage rising stage, the pressure maintaining stage, the free falling stage and the rapid discharging stage are shown in fig. 2.
Step 120: if the maximum drop value of the capacitive load terminal voltage in the voltage rising stage is larger than a first preset threshold value, the capacitive load is subjected to micro-breakdown in the voltage rising stage.
Detecting the terminal voltage of the capacitive load to be detected in the voltage rising stage, and if the maximum drop value of the terminal voltage of the capacitive load in the voltage rising stage is larger than a first preset threshold value, enabling the capacitive load to generate micro-breakdown in the voltage rising stage. Taking the lithium battery cell before liquid injection as an example, if the diaphragm has fine whisker-shaped protrusions, the diaphragm can be instantaneously broken down to form a short circuit after direct-current high voltage is applied in a voltage rising stage, and the diaphragm becomes an insulating state after burning. The thin whisker-shaped protrusion is melted off, and then the short-circuit channel disappears and returns to a non-short-circuit state, but the isolating membrane can generate a certain degree of burning damage due to the fusing of the thin whisker-shaped protrusion and the occurrence of electric arc, and the situation belongs to micro-breakdown to be detected in the embodiment of the invention.
For example, the lithium battery cell is formed by overlapping the lithium battery cell and the positive electrode, and the lithium battery cell is formed by overlapping the lithium battery cell and the positive electrode, so that a positive electrode short circuit loop and a negative electrode short circuit loop are formed.
Referring to fig. 3, the voltage rising stage detects the voltages at two ends of the capacitive load in real time, if the capacitive load to be detected breaks down due to voltage breakdown caused by poor insulation, the voltage at the ends of the capacitive load will drop, i.e. if the capacitive load is micro-broken down in the charging stage, the voltage at the ends of the capacitive load will drop and fluctuate due to internal discharge. Referring to fig. 3, assuming that the drop start voltage is assumed to be A1 and the drop end voltage is assumed to be A2, the maximum voltage drop in the voltage rising stage is: v1=a1-A2. By comparing whether the drop voltage VT1 exceeds the first preset threshold V1 set by the customer, if the maximum voltage drop VT1 is greater than the first preset threshold V1, it can be determined that the capacitive load to be measured has micro-breakdown during the voltage rising stage.
Further, if the maximum drop value of the capacitive load terminal voltage in the voltage rising stage is larger than a first preset threshold value, acquiring the capacitive load terminal voltage value at the ending moment of the voltage rising stage; if the voltage value of the capacitive load end at the end of the voltage rising stage is smaller than a preset voltage value, the voltage drop fluctuation of the capacitive load in the voltage rising stage belongs to the internal short circuit of the capacitive load; if the voltage value of the capacitive load end at the end of the voltage rising stage is equal to a preset voltage value, the capacitive load is micro-shorted in the voltage rising stage, wherein the preset voltage value is the same as the maximum end voltage value of the capacitive load in the pressure maintaining stage.
Referring to fig. 4, in the embodiment of the present invention, when it is detected in the voltage rising stage that the terminal voltage drop of the capacitive load to be measured is greater than the first preset threshold, whether the value of the terminal voltage of the capacitive load at the end of the voltage rising stage reaches the preset voltage value is analyzed by superposition, so as to accurately identify the micro-breakdown phenomenon occurring in the voltage rising stage as a short circuit or micro-short circuit defect occurring in the capacitive load to be measured, thereby improving the production process and the production process of the production line in a targeted manner according to different micro-breakdown type analyses, and improving the production yield of the capacitive load to be measured. In other words, according to the embodiment of the invention, whether the terminal voltage fluctuation of the capacitive load to be measured in the voltage rising stage is caused by short circuit or micro breakdown is judged by judging whether the maximum terminal voltage drop in the voltage rising stage is larger than the first preset threshold value and whether the terminal voltage value of the capacitive load at the end time of the voltage rising stage reaches the preset voltage value, so that the problem existing in production is solved according to the type of the defect.
Meanwhile, the embodiment of the invention can calculate the time TP for the voltage of the capacitive load end to rise to the preset voltage value in the voltage rising stage, and the rising time of the voltage of the capacitive load end is in direct proportion to the capacitance value. By setting the upper limit TH and the lower limit TL of the rise time, it is determined whether the capacitance of the capacitive load is too large or too small or the probe contact failure causes the empty test by comparing with the rise time TP.
Step 130: if the maximum drop value of the capacitive load terminal voltage in the pressure maintaining stage is larger than a second preset threshold value, micro breakdown occurs to the capacitive load in the pressure maintaining stage.
Referring to fig. 2 and 3, assuming that the drop start voltage of the capacitive load terminal voltage in the dwell stage is B1 and the drop end voltage is B2, the capacitive load terminal voltage in the dwell stage has a maximum drop value VT 2=b1-B2, and if the capacitive load terminal voltage in the dwell stage has a maximum drop value VT2 greater than a second preset threshold V2, the capacitive load undergoes micro breakdown in the dwell stage.
Similarly, if the maximum drop value of the capacitive load terminal voltage in the pressure maintaining stage is larger than a first preset threshold value, acquiring the capacitive load terminal voltage value at the end time of the pressure maintaining stage; if the voltage value of the capacitive load end at the end time of the pressure maintaining stage is smaller than a preset voltage value, the voltage drop fluctuation of the capacitive load in the pressure maintaining stage belongs to the internal short circuit of the capacitive load; if the voltage value of the capacitive load end at the end of the pressure maintaining stage is equal to the preset voltage value, the capacitive load is subjected to micro short circuit in the pressure maintaining stage.
Referring to fig. 4, in the embodiment of the invention, when the detected voltage drop of the capacitive load at the end of the pressure maintaining stage is detected to be greater than the first preset threshold value, whether the voltage value of the capacitive load at the end of the pressure maintaining stage reaches the preset voltage value is analyzed by superposition, so that the micro-breakdown phenomenon occurring in the pressure maintaining stage is further accurately identified as a short circuit or micro-short circuit defect occurring in the capacitive load to be detected, and further, the production flow and the production process of the production line can be improved in a targeted manner according to different micro-breakdown type analysis, and the production yield of the capacitive load to be detected is improved. In other words, the embodiment of the invention judges whether the terminal voltage fluctuation of the capacitive load to be measured in the pressure maintaining stage is caused by short circuit or micro breakdown or not by judging whether the maximum terminal voltage drop in the pressure maintaining stage is larger than the first preset threshold value and whether the capacitive load terminal voltage value at the end time of the pressure maintaining stage reaches the preset voltage value, so that the problem existing in production is solved according to the type of the defect.
Step 140: if the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than a third preset threshold value, the capacitive load is subjected to micro-breakdown in the free drop stage; wherein the third preset threshold is greater than the first preset threshold and the second preset threshold.
According to the pressure-maintaining adjustable capacitive load insulation detection method, the third preset threshold is larger than the first preset threshold and the second preset threshold, and the terminal voltage drop value of the capacitive load in the free drop stage comprises terminal voltage fluctuation caused by micro-breakdown and linear drop caused by free discharge of the equivalent insulation resistance of the capacitive load to be detected, so that the capacitive load micro-breakdown detection precision in the free drop stage can be improved by the fact that the third preset threshold is larger than the first preset threshold and the second preset threshold, and the problem that the linear drop caused by free discharge of the equivalent insulation resistance of the capacitive load to be detected is recognized as micro-breakdown is avoided.
Furthermore, in order to improve the precision of capacitive load micro-breakdown detection in the free falling stage, the embodiment of the invention makes positive correlation between the magnitude of the third preset threshold and the maximum voltage in the voltage rising stage and the duration of the free falling stage. Preferably, the third preset threshold value is equal to the product value obtained by multiplying the ratio of the maximum voltage of the voltage rising stage to the equivalent insulation impedance of the capacitive load by the duration length of the free falling stage and the weight coefficient, so that the larger the maximum voltage of the voltage rising stage is, the larger the third preset threshold value is, the longer the duration length of the free falling stage is, the larger the third preset threshold value is, and further the linear falling caused by free discharge of the equivalent insulation resistance of the capacitive load to be tested can be prevented from being identified as micro-breakdown, and the micro-breakdown detection precision of the capacitive load of the free falling stage is improved.
Referring to fig. 2 and 3, assuming that the free discharge start time voltage is C1 and the stop time voltage is C2, the free discharge stage voltage maximum drop value is vt3=c1-C2. If the drop voltage VT3 in the free discharge stage exceeds the third preset threshold V3 set by the customer, the micro breakdown inside the capacitive load to be detected can be judged.
If micro breakdown occurs in the capacitive load to be tested in the free falling stage or the insulation resistance value of the capacitive load to be tested is smaller, the maximum falling value of the capacitive load terminal voltage in the free falling stage is larger than a third preset threshold value, so that whether the capacitive load to be tested has micro breakdown in the free falling stage is accurately identified. According to the pressure-maintaining adjustable capacitive load insulation detection method provided by the embodiment of the invention, when the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than the third preset threshold value, whether the capacitive load terminal voltage change curve in the free drop stage drops linearly is judged in a superposition mode.
Specifically, if the maximum drop value of the capacitive load terminal voltage in the free drop stage is greater than a third preset threshold value, judging whether the capacitive load terminal voltage change curve in the free drop stage drops linearly; if the voltage change curve of the capacitive load end in the free falling stage is linear falling, the capacitive load is not subjected to micro breakdown in the free falling stage; if the voltage change curve of the capacitive load end in the free falling stage is nonlinear falling, the capacitive load is subjected to micro-breakdown in the free falling stage. When the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than a third preset threshold value and the capacitive load terminal voltage change curve in the free drop stage is linear drop, no micro breakdown occurs in the detected capacitive load in the free drop stage, and the larger voltage drop of the detected capacitive load is caused by smaller insulation resistance value.
If micro breakdown occurs in the capacitive load to be tested in the free falling stage or the insulation resistance value of the capacitive load to be tested is smaller, the maximum falling value of the capacitive load terminal voltage in the free falling stage is larger than a third preset threshold value, and further in order to accurately identify whether the micro breakdown occurs in the capacitive load to be tested in the free falling stage, when the maximum falling value of the capacitive load terminal voltage in the free falling stage is larger than the third preset threshold value, the pressure maintaining adjustable capacitive load insulation detection method provided by the embodiment of the invention can also be used for superposing and judging whether the maximum falling value of the capacitive load terminal voltage in the free falling stage is smaller than a fourth preset threshold value to determine whether the reason that the fluctuation of the capacitive load terminal voltage in the free falling stage occurs in the capacitive load to be tested in the free falling stage or the insulation resistance value of the capacitive load to be tested is smaller. The fourth preset threshold is greater than the third preset threshold.
Specifically, if the maximum drop value of the capacitive load terminal voltage in the free drop stage is greater than a third preset threshold value, judging whether the maximum drop value of the capacitive load terminal voltage in the free drop stage is less than a fourth preset threshold value; if the maximum drop value of the capacitive load terminal voltage in the free drop stage is smaller than a fourth preset threshold value, the capacitive load is not subjected to micro breakdown in the free drop stage; the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than a third preset threshold value and smaller than a fourth preset threshold value, which is caused by the fact that the insulation resistance value of the capacitive load terminal voltage is smaller, namely the detected capacitive load has larger voltage drop caused by the defect that the insulation resistance value of the capacitive load terminal voltage is smaller. If the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than a fourth preset threshold value, micro breakdown occurs in the capacitive load in the free drop stage, so that the reason that the capacitive load terminal voltage in the free drop stage fluctuates greatly can be accurately identified, and whether the current product defect category belongs to the situation that micro breakdown occurs in the capacitive load to be detected in the free drop stage or the insulation resistance value of the capacitive load to be detected is smaller can be accurately identified.
If micro breakdown occurs in the capacitive load to be tested in the free falling stage or the insulation resistance value of the capacitive load to be tested is smaller, the maximum falling value of the capacitive load terminal voltage in the free falling stage is larger than a third preset threshold value, and further in order to accurately identify whether the micro breakdown occurs in the capacitive load to be tested in the free falling stage, the pressure maintaining adjustable capacitive load insulation detection method provided by the embodiment of the invention can also be used for determining whether the cause of the fluctuation of the capacitive load terminal voltage in the free falling stage is that the micro breakdown occurs in the capacitive load to be tested in the free falling stage or the insulation resistance value of the capacitive load to be tested is smaller when the maximum falling value of the capacitive load terminal voltage in the free falling stage is larger than the third preset threshold value.
Specifically, if the maximum drop value of the capacitive load terminal voltage in the free drop stage is greater than a third preset threshold value, acquiring the maximum slope of the capacitive load terminal voltage change curve in the free drop stage; if the maximum slope is not greater than the preset slope threshold, the capacitive load is not subjected to micro-breakdown in the free falling stage, and the detected capacitive load has larger voltage falling due to the defect of smaller insulation resistance value in the capacitive load; if the maximum slope is greater than a preset slope threshold, the capacitive load undergoes micro-breakdown in the free fall phase.
The method provided by the embodiment of the invention can be used for effectively checking the defective products of which the insulation resistance value is smaller but breakdown short circuit or micro short circuit does not occur in the voltage rising stage and the pressure maintaining stage in the free discharging stage, so that the insulation resistance of the capacitive load is synchronously checked to be smaller in the micro breakdown detection process, defective products with poor insulation are prevented from flowing into the market, and the detection precision and the detection efficiency are improved.
The pressure-maintaining adjustable capacitive load insulation detection method comprises the steps of respectively obtaining the maximum drop value of the capacitive load terminal voltage in a voltage rising stage, a pressure maintaining stage and a free drop stage; if the maximum drop value of the capacitive load terminal voltage in the voltage rising stage is larger than a first preset threshold value, micro-breakdown of the capacitive load occurs in the voltage rising stage; if the maximum drop value of the capacitive load terminal voltage in the pressure maintaining stage is larger than a second preset threshold value, micro breakdown of the capacitive load occurs in the pressure maintaining stage; if the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than a third preset threshold value, micro breakdown occurs in the capacitive load in the free drop stage, defective products with small capacitive load insulation resistance but no micro breakdown or micro short circuit occurs in the voltage rising stage and the pressure maintaining stage can be effectively detected by increasing the capacitive load terminal voltage detection in the free drop stage, and the detection precision and the detection rate of defects such as micro breakdown and small insulation resistance in the free drop stage can be improved by enabling the third preset threshold value to be larger than the first preset threshold value and the second preset threshold value.
Based on the same inventive concept, referring to fig. 5, an embodiment of the present invention further provides a pressure-maintaining adjustable capacitive load insulation detection device, where the pressure-maintaining adjustable capacitive load insulation detection device provided in the embodiment of the present application may execute a processing flow provided in the embodiment of the pressure-maintaining adjustable capacitive load insulation detection method. As shown in fig. 5, a pressure maintaining adjustable capacitive load insulation detection device 20 includes:
an acquisition module 201, configured to acquire a capacitive load terminal voltage maximum drop value in a voltage rising stage, a pressure maintaining stage, and a free drop stage, respectively;
a first judging module 202, configured to, if the maximum drop value of the voltage at the capacitive load terminal in the voltage rising stage is greater than a first preset threshold value, cause micro breakdown of the capacitive load in the voltage rising stage;
the second judging module 203 is configured to if the maximum drop value of the capacitive load terminal voltage in the pressure maintaining stage is greater than the second preset threshold value, cause micro breakdown of the capacitive load in the pressure maintaining stage;
a third judging module 204, configured to, if the maximum drop value of the voltage at the capacitive load end in the free drop stage is greater than a third preset threshold, cause micro breakdown of the capacitive load in the free drop stage; wherein the third preset threshold is greater than the first preset threshold and the second preset threshold.
The device provided in the embodiment of the present application may be specifically used to execute the scheme provided in the embodiment of the method corresponding to the embodiment of fig. 1, and specific functions and technical effects that can be achieved are not repeated herein.
Based on the same inventive concept, the embodiment of the invention further provides a pressure-maintaining adjustable capacitive load insulation detection device, which comprises: a processor, and a memory communicatively coupled to the processor, the memory storing computer-executable instructions.
The processor executes the computer-executable instructions stored in the memory to implement the scheme provided by any of the method embodiments, and specific functions and technical effects that can be implemented are not described herein. The electronic device may be the server mentioned above.
The embodiment of the application further provides a computer readable storage medium, in which computer executable instructions are stored, and when the computer executable instructions are executed by a processor, the computer executable instructions are used to implement the scheme provided by any one of the method embodiments, and specific functions and technical effects that can be implemented are not described herein.
The embodiment of the application also provides a computer program product, which comprises: the computer program is stored in a readable storage medium, and the computer program can be read from the readable storage medium by at least one processor of the electronic device, where execution of the computer program by at least one processor causes the electronic device to execute the solution provided by any one of the method embodiments, and specific functions and technical effects that can be achieved are not described herein.
Other embodiments of the present application will be apparent to those skilled in the art from consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of the application following, in general, the principles of the application and including such departures from the present disclosure as come within known or customary practice within the art to which the application pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the application being indicated by the following claims.
It should be noted that although several units or sub-units of the apparatus are mentioned in the above detailed description, such a division is merely exemplary and not mandatory. Indeed, the features and functions of two or more of the elements described above may be embodied in one element in accordance with embodiments of the present application. Conversely, the features and functions of one unit described above may be further divided into a plurality of units to be embodied.
While preferred embodiments of the present application have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. It is therefore intended that the following claims be interpreted as including the preferred embodiments and all such alterations and modifications as fall within the scope of the application.
It will be apparent to those skilled in the art that various modifications and variations can be made to the embodiments of the present invention without departing from the spirit or scope of the embodiments of the invention. Thus, if such modifications and variations of the embodiments of the present invention fall within the scope of the claims and the equivalents thereof, the present invention is also intended to include such modifications and variations.
Claims (5)
1. The pressure-maintaining adjustable capacitive load insulation detection method is characterized by comprising the following steps of:
the method comprises the steps of respectively obtaining the maximum drop value of the capacitive load terminal voltage in a voltage rising stage, a pressure maintaining stage and a free drop stage;
if the maximum drop value of the capacitive load terminal voltage in the voltage rising stage is larger than a first preset threshold value, micro-breakdown of the capacitive load occurs in the voltage rising stage;
if the maximum drop value of the capacitive load terminal voltage in the pressure maintaining stage is larger than a second preset threshold value, micro breakdown of the capacitive load occurs in the pressure maintaining stage;
if the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than a third preset threshold value, the capacitive load is subjected to micro-breakdown in the free drop stage;
wherein the third preset threshold is greater than the first preset threshold and the second preset threshold; the magnitude of the third preset threshold value is in positive correlation with the maximum voltage of the voltage rising stage and the duration time length of the free falling stage; wherein the third preset threshold value is equal to the product value obtained by multiplying the ratio of the maximum voltage of the voltage rising stage to the equivalent insulation resistance of the capacitive load by the duration time length of the free falling stage and the weight coefficient;
The duration length of the voltage rising stage is smaller than the duration length of the pressure maintaining stage and smaller than the duration length of the free falling stage, and the duration length of the free falling stage is larger than the duration length of the pressure maintaining stage; if the maximum drop value of the capacitive load terminal voltage in the free drop stage is greater than a third preset threshold value, the micro-breakdown of the capacitive load in the free drop stage specifically comprises:
if the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than a third preset threshold value, judging whether the capacitive load terminal voltage change curve in the free drop stage drops linearly or not;
if the voltage change curve of the capacitive load end in the free falling stage is linear falling, the capacitive load is not subjected to micro breakdown in the free falling stage;
if the voltage change curve of the capacitive load end in the free falling stage is nonlinear falling, the capacitive load is subjected to micro-breakdown in the free falling stage; or (b)
If the maximum drop value of the capacitive load terminal voltage in the free drop stage is greater than a third preset threshold value, the micro-breakdown of the capacitive load in the free drop stage specifically comprises:
if the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than a third preset threshold value, acquiring the maximum slope of the capacitive load terminal voltage change curve in the free drop stage;
If the maximum slope is not greater than the preset slope threshold, the capacitive load is not subjected to micro breakdown in the free falling stage;
if the maximum slope is greater than a preset slope threshold, the capacitive load undergoes micro-breakdown in the free fall phase.
2. The pressure maintaining adjustable capacitive load insulation detection method according to claim 1, wherein if the maximum drop value of the capacitive load terminal voltage in the voltage rising stage is greater than a first preset threshold value, the micro breakdown of the capacitive load in the voltage rising stage includes:
if the maximum drop value of the capacitive load terminal voltage in the voltage rising stage is larger than a first preset threshold value, acquiring the capacitive load terminal voltage value at the ending moment of the voltage rising stage;
if the voltage value of the capacitive load end at the ending time of the voltage rising stage is smaller than a preset voltage value, the capacitive load is short-circuited in the voltage rising stage;
if the voltage value of the capacitive load end at the end of the voltage rising stage is equal to a preset voltage value, the capacitive load is in micro short circuit in the voltage rising stage, wherein the preset voltage value is the same as the maximum voltage value of the capacitive load in the pressure maintaining stage.
3. The dwell-adjustable capacitive load insulation detection method according to claim 2, characterized in that the duration of the voltage rising phase is always less than 100ms.
4. The utility model provides a pressurize adjustable capacitive load insulation detection device which characterized in that, pressurize adjustable capacitive load insulation detection device includes:
the acquisition module is used for respectively acquiring the maximum drop value of the capacitive load terminal voltage in the voltage rising stage, the pressure maintaining stage and the free drop stage;
the first judging module is used for judging that if the maximum drop value of the capacitive load terminal voltage in the voltage rising stage is larger than a first preset threshold value, the capacitive load is subjected to micro breakdown in the voltage rising stage;
the second judging module is used for judging that if the maximum drop value of the capacitive load terminal voltage in the pressure maintaining stage is larger than a second preset threshold value, the capacitive load is subjected to micro breakdown in the pressure maintaining stage;
the third judging module is used for judging that if the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than a third preset threshold value, the capacitive load is subjected to micro breakdown in the free drop stage; wherein the third preset threshold is greater than the first preset threshold and the second preset threshold; the duration length of the voltage rising stage is smaller than the duration length of the pressure maintaining stage and smaller than the duration length of the free falling stage, and the duration length of the free falling stage is larger than the duration length of the pressure maintaining stage; the magnitude of the third preset threshold value is in positive correlation with the maximum voltage of the voltage rising stage and the duration time length of the free falling stage; wherein the third preset threshold value is equal to the product value obtained by multiplying the ratio of the maximum voltage of the voltage rising stage to the equivalent insulation resistance of the capacitive load by the duration time length of the free falling stage and the weight coefficient;
If the maximum drop value of the capacitive load terminal voltage in the free drop stage is greater than a third preset threshold value, the micro-breakdown of the capacitive load in the free drop stage specifically comprises:
if the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than a third preset threshold value, judging whether the capacitive load terminal voltage change curve in the free drop stage drops linearly or not;
if the voltage change curve of the capacitive load end in the free falling stage is linear falling, the capacitive load is not subjected to micro breakdown in the free falling stage;
if the voltage change curve of the capacitive load end in the free falling stage is nonlinear falling, the capacitive load is subjected to micro-breakdown in the free falling stage; or if the maximum drop value of the capacitive load terminal voltage in the free drop stage is greater than a third preset threshold value, the micro-breakdown of the capacitive load in the free drop stage specifically comprises:
if the maximum drop value of the capacitive load terminal voltage in the free drop stage is larger than a third preset threshold value, acquiring the maximum slope of the capacitive load terminal voltage change curve in the free drop stage;
if the maximum slope is not greater than the preset slope threshold, the capacitive load is not subjected to micro breakdown in the free falling stage;
If the maximum slope is greater than a preset slope threshold, the capacitive load undergoes micro-breakdown in the free fall phase.
5. Pressure-maintaining adjustable capacitive load insulation detection equipment, which is characterized by comprising: a processor, and a memory communicatively coupled to the processor;
the memory stores computer-executable instructions;
the processor executes computer-executable instructions stored by the memory to implement the method of any one of claims 1-3.
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