CN115803689B - 时间测量装置、荧光寿命测量装置及时间测量方法 - Google Patents

时间测量装置、荧光寿命测量装置及时间测量方法

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Publication number
CN115803689B
CN115803689B CN202180046560.9A CN202180046560A CN115803689B CN 115803689 B CN115803689 B CN 115803689B CN 202180046560 A CN202180046560 A CN 202180046560A CN 115803689 B CN115803689 B CN 115803689B
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CN
China
Prior art keywords
time
signal
measurement
tac
measuring device
Prior art date
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Application number
CN202180046560.9A
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English (en)
Chinese (zh)
Other versions
CN115803689A (zh
Inventor
新仓史智
吉见步
北泽健
井上贵之
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
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Hamamatsu Photonics KK
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Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Priority claimed from PCT/JP2021/018263 external-priority patent/WO2022030062A1/ja
Publication of CN115803689A publication Critical patent/CN115803689A/zh
Application granted granted Critical
Publication of CN115803689B publication Critical patent/CN115803689B/zh
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Classifications

    • GPHYSICS
    • G04HOROLOGY
    • G04FTIME-INTERVAL MEASURING
    • G04F10/00Apparatus for measuring unknown time intervals by electric means
    • G04F10/005Time-to-digital converters [TDC]
    • GPHYSICS
    • G04HOROLOGY
    • G04FTIME-INTERVAL MEASURING
    • G04F10/00Apparatus for measuring unknown time intervals by electric means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/6408Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • GPHYSICS
    • G04HOROLOGY
    • G04FTIME-INTERVAL MEASURING
    • G04F10/00Apparatus for measuring unknown time intervals by electric means
    • G04F10/10Apparatus for measuring unknown time intervals by electric means by measuring electric or magnetic quantities changing in proportion to time
    • G04F10/105Apparatus for measuring unknown time intervals by electric means by measuring electric or magnetic quantities changing in proportion to time with conversion of the time-intervals
    • GPHYSICS
    • G04HOROLOGY
    • G04FTIME-INTERVAL MEASURING
    • G04F13/00Apparatus for measuring unknown time intervals by means not provided for in groups G04F5/00 - G04F10/00
    • G04F13/02Apparatus for measuring unknown time intervals by means not provided for in groups G04F5/00 - G04F10/00 using optical means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/6408Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • G01N2021/6415Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence with two excitations, e.g. strong pump/probe flash
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/12Circuits of general importance; Signal processing
    • G01N2201/123Conversion circuit

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
CN202180046560.9A 2020-08-06 2021-05-13 时间测量装置、荧光寿命测量装置及时间测量方法 Active CN115803689B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020-133839 2020-08-06
JP2020133839 2020-08-06
PCT/JP2021/018263 WO2022030062A1 (ja) 2020-08-06 2021-05-13 時間計測装置、蛍光寿命計測装置、及び時間計測方法

Publications (2)

Publication Number Publication Date
CN115803689A CN115803689A (zh) 2023-03-14
CN115803689B true CN115803689B (zh) 2026-03-03

Family

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CN202180046560.9A Active CN115803689B (zh) 2020-08-06 2021-05-13 时间测量装置、荧光寿命测量装置及时间测量方法

Country Status (5)

Country Link
US (1) US20230288336A1 (https=)
EP (1) EP4170436A4 (https=)
JP (2) JP6946599B1 (https=)
KR (1) KR20230047328A (https=)
CN (1) CN115803689B (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025004353A1 (ja) * 2023-06-30 2025-01-02 日本電信電話株式会社 測定装置、測定方法、及びプログラム

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102545669A (zh) * 2010-12-21 2012-07-04 台达电子工业股份有限公司 具有电容转换功能的太阳能光电系统
CN103105383A (zh) * 2011-11-14 2013-05-15 徕卡显微系统复合显微镜有限公司 测量样本中激发态寿命的方法

Family Cites Families (13)

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JPS5576919A (en) * 1978-12-06 1980-06-10 Japan Spectroscopic Co Measuring method for rapid time division spectroscopic analysis
JPS5972049A (ja) * 1982-10-19 1984-04-23 Horiba Ltd 試料の発光寿命測定装置
JPS59108261U (ja) * 1983-01-08 1984-07-21 株式会社堀場製作所 試料の発光寿命測定装置
US6690463B2 (en) 2000-02-10 2004-02-10 Evotec Biosystems Ag Fluorescence intensity and lifetime distribution analysis
DE102007026684B4 (de) * 2007-06-08 2009-03-19 Gesellschaft für Schwerionenforschung mbH Zeit-Amplituden-Konverter-Bauelement
EP2199830B1 (en) 2008-12-19 2014-07-02 Leibniz-Institut für Neurobiologie A position resolved measurement apparatus and a method for acquiring space coordinates of a quantum beam incident thereon
JP2010266291A (ja) * 2009-05-13 2010-11-25 Mitsubishi Electric Corp 時間計測回路
CN201926878U (zh) * 2010-12-23 2011-08-10 中国科学院西安光学精密机械研究所 一种光子序列到达时间的连续测量装置
US10079608B2 (en) * 2011-09-08 2018-09-18 Fastree 3D Bv Time-to-digital converter and method therefor
JP5978266B2 (ja) * 2014-09-03 2016-08-24 浜松ホトニクス株式会社 時間計測装置、時間計測方法、発光寿命計測装置、及び発光寿命計測方法
EP3465156B1 (de) 2016-05-25 2020-03-18 Leica Microsystems CMS GmbH Fluoreszenzlebensdauer-mikroskopieverfahren mit zeitkorrelierter einzelphotonenzählung welches höhere lichtintensitäten zulässt, und entsprechende vorrichtung
KR102035019B1 (ko) * 2017-09-20 2019-10-22 주식회사 유진로봇 거리 측정 장치, 시간 디지털 변환기, 및 이동체
CN110568749B (zh) * 2019-08-30 2021-04-09 华中师范大学 时间数字转换器电路、装置、设备及装置的控制方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102545669A (zh) * 2010-12-21 2012-07-04 台达电子工业股份有限公司 具有电容转换功能的太阳能光电系统
CN103105383A (zh) * 2011-11-14 2013-05-15 徕卡显微系统复合显微镜有限公司 测量样本中激发态寿命的方法

Also Published As

Publication number Publication date
CN115803689A (zh) 2023-03-14
JP7660049B2 (ja) 2025-04-10
JP6946599B1 (ja) 2021-10-06
JPWO2022030062A1 (https=) 2022-02-10
JP2022031264A (ja) 2022-02-18
EP4170436A4 (en) 2024-07-10
KR20230047328A (ko) 2023-04-07
EP4170436A1 (en) 2023-04-26
US20230288336A1 (en) 2023-09-14

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