CN115407182A - All-optical microwave electric field near-field imaging device and method - Google Patents
All-optical microwave electric field near-field imaging device and method Download PDFInfo
- Publication number
- CN115407182A CN115407182A CN202211365382.9A CN202211365382A CN115407182A CN 115407182 A CN115407182 A CN 115407182A CN 202211365382 A CN202211365382 A CN 202211365382A CN 115407182 A CN115407182 A CN 115407182A
- Authority
- CN
- China
- Prior art keywords
- microwave
- detected
- atomic
- electric field
- field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000003384 imaging method Methods 0.000 title claims abstract description 76
- 230000005684 electric field Effects 0.000 title claims abstract description 57
- 238000000034 method Methods 0.000 title claims description 13
- 238000001514 detection method Methods 0.000 claims abstract description 64
- 230000008878 coupling Effects 0.000 claims abstract description 28
- 238000010168 coupling process Methods 0.000 claims abstract description 28
- 238000005859 coupling reaction Methods 0.000 claims abstract description 28
- 238000010521 absorption reaction Methods 0.000 claims abstract description 24
- 238000013519 translation Methods 0.000 claims abstract description 14
- 230000005674 electromagnetic induction Effects 0.000 claims abstract description 11
- 229910052783 alkali metal Inorganic materials 0.000 claims description 17
- 150000001340 alkali metals Chemical class 0.000 claims description 17
- 239000000523 sample Substances 0.000 claims description 13
- 230000008859 change Effects 0.000 claims description 12
- 229910052751 metal Inorganic materials 0.000 claims description 11
- 239000002184 metal Substances 0.000 claims description 11
- 230000009471 action Effects 0.000 claims description 10
- 238000006073 displacement reaction Methods 0.000 claims description 10
- 230000005283 ground state Effects 0.000 claims description 9
- 229910052728 basic metal Inorganic materials 0.000 claims description 8
- 150000003818 basic metals Chemical class 0.000 claims description 8
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 7
- 230000005281 excited state Effects 0.000 claims description 7
- 238000002834 transmittance Methods 0.000 claims description 7
- 238000002347 injection Methods 0.000 claims description 6
- 239000007924 injection Substances 0.000 claims description 6
- 230000007704 transition Effects 0.000 claims description 5
- 239000004593 Epoxy Substances 0.000 claims description 3
- 238000005259 measurement Methods 0.000 abstract description 13
- 238000005516 engineering process Methods 0.000 abstract description 11
- 230000001066 destructive effect Effects 0.000 abstract description 6
- 230000000694 effects Effects 0.000 abstract description 6
- 230000003287 optical effect Effects 0.000 abstract description 6
- 230000035945 sensitivity Effects 0.000 abstract description 5
- 230000000644 propagated effect Effects 0.000 abstract description 2
- 238000004590 computer program Methods 0.000 description 13
- 230000005670 electromagnetic radiation Effects 0.000 description 8
- 229910052701 rubidium Inorganic materials 0.000 description 5
- IGLNJRXAVVLDKE-UHFFFAOYSA-N rubidium atom Chemical group [Rb] IGLNJRXAVVLDKE-UHFFFAOYSA-N 0.000 description 5
- 238000012360 testing method Methods 0.000 description 5
- 238000003745 diagnosis Methods 0.000 description 4
- 239000003822 epoxy resin Substances 0.000 description 4
- 229920000647 polyepoxide Polymers 0.000 description 4
- 230000006872 improvement Effects 0.000 description 3
- 235000014676 Phragmites communis Nutrition 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000013500 data storage Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- IGLNJRXAVVLDKE-NJFSPNSNSA-N Rubidium-87 Chemical group [87Rb] IGLNJRXAVVLDKE-NJFSPNSNSA-N 0.000 description 1
- 238000000862 absorption spectrum Methods 0.000 description 1
- TVFDJXOCXUVLDH-UHFFFAOYSA-N caesium atom Chemical group [Cs] TVFDJXOCXUVLDH-UHFFFAOYSA-N 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 239000005357 flat glass Substances 0.000 description 1
- 229910052754 neon Inorganic materials 0.000 description 1
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
- G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The application relates to an all-optical microwave electric field near-field imaging device, which comprises an atom sensing air chamber, a microwave source, a microwave element to be detected, a two-dimensional electric translation table, a dichroic mirror and a CCD camera; the output end of the microwave source is connected with the input end of a microwave element to be detected, the microwave element to be detected is fixed on the two-dimensional electric moving platform, the atom sensing air chamber is positioned at the top of the microwave element to be detected, is reversely and collinearly propagated with the detection light and the coupling light of the atomic energy level resonance, and is respectively sent into the atom sensing air chamber from the front side and the rear side of the atom sensing air chamber; after the detection light beam is split with the coupling light beam through the dichroic mirror, a two-dimensional absorption imaging result is displayed on the CCD camera. Compared with the prior art, the non-contact non-destructive microwave electric field two-dimensional imaging method is combined with the electromagnetic induction effect and the absorption imaging technology to realize non-contact non-destructive microwave electric field two-dimensional imaging so as to obtain surface microwave electric field high-resolution distribution data of the atomic sensing gas chamber; the electrical measurement is converted into the optical measurement, so that the imaging resolution and sensitivity are greatly improved.
Description
Technical Field
The application relates to the technical field of quantum precision measurement, in particular to an all-optical microwave electric field near-field imaging device and method.
Background
The integrated microwave chip is used as an important component of modern communication technology and scientific instruments, so that the performance of the modern communication technology and the scientific instruments can be improved without developing an internal circuit of the integrated microchip. Among them, in order to develop and test circuits inside an integrated microwave chip, a high resolution imaging technique of microwave field distribution is required. Therefore, conventional open waveguide probes have long been used to detect local microwave fields.
However, with the rapid improvement of the performance and the increase of the density of electronic devices in an integrated circuit, the conventional microwave field detection method not only causes interference to the measured field due to the characteristics of the metal of the probe, but also has the size of not less than a quarter wavelength, so that it is difficult to realize the high-sensitivity, high-resolution and non-invasive imaging of the microwave near field.
Therefore, it is desirable to provide a high-sensitivity, high-resolution and non-invasive microwave electric field imaging device.
Disclosure of Invention
In view of the above, it is necessary to provide a highly sensitive, high-resolution and non-invasive all-optical microwave electric field near-field imaging apparatus and method.
The embodiment of the invention provides an all-optical microwave electric field near-field imaging device, which comprises: the device comprises an atomic sensing air chamber, a microwave source, a microwave element to be detected, a two-dimensional electric translation table, a dichroic mirror and a CCD camera; the output end of the microwave source is connected with the input end of the microwave element to be detected, the microwave element to be detected is fixed on the two-dimensional electric moving platform, the atom sensing air chamber is positioned at the top of the microwave element to be detected, is in reverse collinear propagation with the detection light and the coupling light of the atomic energy level resonance, and is respectively sent into the atom sensing air chamber from the front side and the rear side of the atom sensing air chamber; and after the detection light beam is split with the coupling light beam through the dichroic mirror, a two-dimensional absorption imaging result is displayed on the CCD camera.
Furthermore, a gas injection hole is further formed in one side, opposite to the light wave emission hole, of the atom sensing gas chamber, and the gas injection hole is used for injecting atom gas into the atom sensing gas chamber; wherein the atomic gas is a basic metal atomic gas.
Further, the atom sensing gas chamber is obtained by bonding two quartz glass plates with grooves through epoxy resin, or is obtained by bonding a plurality of quartz glass plates through epoxy resin.
Furthermore, the thickness range of the atom sensing gas chamber is 1-2mm.
Another embodiment of the present invention provides an all-optical microwave electric field near-field imaging method, which is applicable to the above all-optical microwave electric field near-field imaging apparatus, and the method includes the following steps:
the detection light and the coupling light are reversely injected into the atom sensing gas chamber, so that the basic metal gas atoms are excited to a Reidberg state from the atomic state of the ground state;
transmitting a received microwave signal into the atom sensing gas chamber by a microwave element to be detected to form a microwave field to be detected and enable the alkali metal gas atoms in a rydberg state to generate stark displacement;
acquiring the change of the detection light transmissivity along with the spatial distribution of the microwave field to be detected, and displaying a two-dimensional absorption imaging result on a CCD camera;
and controlling the position of the microwave element to be detected on the two-dimensional electric translation platform to obtain near-field images of the microwave element to be detected at different positions in the microwave electric field to be detected.
Further, the detection light and the coupling light are reversely injected into the atom sensing gas chamber, so that the alkali metal gas atoms are excited from a ground state atomic state to a Reidberg state, and the method specifically comprises the following steps:
sending the resonant detection light and the coupling light into the atom sensing air chamber from the front side and the rear side of the atom sensing air chamber respectively; wherein the detection light is large-light-spot detection light;
the basic metal gas atoms are excited from a ground state atomic state to a middle excited state under the action of the detection light;
and the alkali metal gas atoms in the intermediate excited state are excited into a first energy level Reedberg state under the action of the coupled light, and an electromagnetically induced transparent window is formed.
Further, the microwave element to be measured emits the received microwave signal into the atom sensing gas chamber to form a microwave field to be measured, and the alkali metal gas atoms in the rydberg state are subjected to stark displacement, specifically comprising:
the microwave element to be tested acquires a microwave signal emitted by a microwave source and emits the microwave signal into the atomic sensing air chamber to form a microwave field to be tested;
under the action of the electromagnetic induction window, the microwave field to be detected and the alkaline metal gas atoms in the first energy level rydberg state are subjected to transition resonance to obtain the alkaline metal gas atoms in the second energy level rydberg state, and the alkaline metal gas atoms in the second energy level rydberg state are subjected to stark displacement.
Further, acquiring the change of the detection light transmittance along with the spatial distribution of the microwave field to be detected, and displaying a two-dimensional absorption imaging result on a CCD camera;
separating the detection light and the coupling light passing through the atomic sensing gas chamber by a dichroic mirror;
acquiring detection information carried in the separated detection light; wherein the detection information comprises the variation of the detection light transmissivity along with the spatial distribution of the microwave field to be detected;
and obtaining a two-dimensional absorption imaging result of the microwave field to be detected according to the detection information, and displaying the two-dimensional absorption imaging result on a CCD camera.
Another embodiment of the present invention is also directed to a computer readable storage medium including a stored computer program; wherein the computer program when executed controls an apparatus in which the computer readable storage medium is located to perform the all-optical microwave electric field near field imaging method as described above.
Another embodiment of the present invention also proposes a terminal device, which includes a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, and the processor implements the all-optical microwave electric field near-field imaging method as described above when executing the computer program.
The all-optical microwave electric field near field imaging device comprises: the device comprises an atomic sensing air chamber, a microwave source, a microwave element to be detected, a two-dimensional electric translation table, a dichroic mirror and a CCD camera; the output end of the microwave source is connected with the input end of the microwave element to be detected, the microwave element to be detected is fixed on the two-dimensional electric moving platform, the atom sensing air chamber is positioned at the top of the microwave element to be detected, is in reverse collinear propagation with the detection light and the coupling light of the atomic energy level resonance, and is respectively sent into the atom sensing air chamber from the front side and the rear side of the atom sensing air chamber; and after the detection light beam is split with the coupling light beam through the dichroic mirror, a two-dimensional absorption imaging result is displayed on the CCD camera.
Compared with the prior art, the microwave electric field near-field imaging device disclosed by the invention is combined with an electromagnetic induction effect and an absorption imaging technology to realize non-contact non-destructive microwave electric field two-dimensional imaging so as to obtain surface microwave electric field high-resolution distribution data of the atomic sensing gas chamber; the electrical measurement is changed into optical measurement, so that the imaging resolution and sensitivity are greatly improved; the interference of electromagnetic radiation on detection is reduced by utilizing the atomic medium, and the electromagnetic compatibility diagnosis and test technology is developed by accurately positioning the electromagnetic radiation and the interference, so that the practical application requirements are met.
Drawings
FIG. 1 is a block diagram of an all-optical microwave electric field near-field imaging device according to an embodiment of the present invention;
FIG. 2 is a schematic flow chart of an all-optical microwave electric field near-field imaging method according to an embodiment of the present invention;
fig. 3 is a schematic diagram of an energy level structure of an all-optical microwave electric field near field imaging implementation process according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without any inventive step, are within the scope of the present invention.
It should be noted that, the step numbers in the text are only for convenience of explanation of the specific embodiments, and do not serve to limit the execution sequence of the steps. The method provided by the present embodiment may be executed by a related server, and the server is taken as an example for explanation below.
As shown in fig. 1, an all-optical microwave electric field near-field imaging device provided by an embodiment of the present invention includes: the device comprises an atom sensing air chamber 1, a microwave source 2, a microwave element to be detected 3, a two-dimensional electric translation stage 4, a dichroic mirror 5 and a CCD camera 6.
The output end of the microwave source is connected with the input end of the microwave element to be detected, the microwave element to be detected is fixed on the two-dimensional electric moving platform, the atom sensing air chamber is positioned at the top of the microwave element to be detected, is in reverse collinear propagation with the detection light and the coupling light of the atomic energy level resonance, and is respectively sent into the atom sensing air chamber from the front side and the rear side of the atom sensing air chamber; and after the detection light beam is split with the coupling light beam through the dichroic mirror, a two-dimensional absorption imaging result is displayed on the CCD camera.
Furthermore, a gas injection hole is further formed in one side, opposite to the light wave emission hole, of the atom sensing gas chamber, and the gas injection hole is used for injecting atom gas into the atom sensing gas chamber; wherein the atomic gas is a basic metal atomic gas.
Further, the atom sensing gas chamber is obtained by bonding two quartz glass plates with grooves through epoxy resin, or is obtained by bonding a plurality of quartz glass plates through epoxy resin. The thickness range of the atom sensing gas chamber is 1-2mm. It will be appreciated that in other embodiments the atom sensing gas cell may be made of a quartz glass with grooves and a flat glass bonded by epoxy.
In specific implementation, the atom sensing gas chamber mainly plays a role of internal alkali metal gas atoms, preferably, buffer gas neon is injected into the gas chamber simultaneously to slow down the diffusion of the alkali metal gas atoms and form an atom sensing probe, and the atom sensing probe converts the change of the electric field intensity into the change of the detection light transmittance by utilizing an electromagnetic induction transparency effect; the microwave source generates a microwave electric field to be measured; the microwave element to be tested is arranged below the atom sensing air chamber, is connected with the microwave source and sends a microwave electric field to be tested to the atom sensing air chamber; the position of a microwave element to be measured is adjusted by controlling a two-dimensional electric translation table to obtain near-field images at different positions; the dichroic mirror is used for separating the detection light from the coupling light wave, so that the imaging information of the detection light can be conveniently collected; the CCD camera is used for receiving the image of the near-field imaging of the detection light.
The all-optical microwave electric field near field imaging device comprises: the device comprises an atom sensing air chamber, a microwave source, a microwave element to be detected, a two-dimensional electric translation table, a dichroic mirror and a CCD camera; the output end of the microwave source is connected with the input end of the microwave element to be detected, the microwave element to be detected is fixed on the two-dimensional electric moving platform, the atom sensing air chamber is positioned at the top of the microwave element to be detected, is reversely and collinearly propagated with the detection light and the coupling light of the atomic energy level resonance, and is respectively sent into the atom sensing air chamber from the front side and the rear side of the atom sensing air chamber; and after the detection light beam is split with the coupling light beam through the dichroic mirror, a two-dimensional absorption imaging result is displayed on the CCD camera. Compared with the prior art, the microwave electric field near-field imaging device disclosed by the invention is combined with an electromagnetic induction effect and an absorption imaging technology to realize non-contact non-destructive microwave electric field two-dimensional imaging so as to obtain surface microwave electric field high-resolution distribution data of the atomic sensing gas chamber; the electrical measurement is changed into optical measurement, so that the resolution and the sensitivity of imaging are greatly improved; the interference of electromagnetic radiation on detection is reduced by utilizing the atomic medium, and the electromagnetic compatibility diagnosis and test technology is developed by accurately positioning the electromagnetic radiation and the interference, so that the practical application requirements are met.
Referring to fig. 2, the present invention further provides an all-optical microwave electric field near-field imaging method, which is suitable for the above all-optical microwave electric field near-field imaging apparatus, and the method includes steps S11 to S14:
and S11, reversely injecting the probe light and the coupling light into the atom sensing gas chamber to excite the alkali metal gas atoms from the atomic state of the ground state to the Reedberg state.
And S12, transmitting the received microwave signal into the atom sensing gas chamber by a microwave element to be detected to form a microwave field to be detected and enabling the alkali metal gas atoms in the Reedberg state to generate Stark displacement.
And S13, acquiring the change of the detection light transmittance along with the spatial distribution of the microwave field to be detected, and displaying the two-dimensional absorption imaging result on a CCD camera.
And S14, controlling the position of the microwave element to be detected on the two-dimensional electric translation platform, and acquiring near-field images of the microwave element to be detected at different positions in a microwave electric field to be detected.
Referring to fig. 3, taking rubidium 87 atom as an example, 201 (5S 1/2, f =2, mf = 2) is a ground state of the rubidium atom, 202 (5P 3/2, f = 3) is an intermediate excited state of the rubidium atom, and 203 (47S 1/2) and 204 (47P 3/2) are a first energy level reed castle state and a second energy level reed castle state of the rubidium atom, respectively; probe light with a wavelength of 780nm is 205, and coupled light with a wavelength of 480nm is 206; 207 is a transition resonance with the Reidberg state 47S1/2 → 47P3/2, and the frequency is 37.5 GHz. S, P and D represent atomic levels with orbital angular momentum quantum numbers of 0, 1 and 2, respectively.
The resonant probe light 205 and coupling light 206 form an electromagnetically induced transparency (transparent window) when they are incident back on the atom sensing gas cell with a two-dimensional structure. The absorption spectrum of the probe light 205 originally subjected to the atomic resonance of the alkali metal gas is changed, and a transmission peak appears at the center of the spectrum. At this time, the microwave 207 of the σ + near field is added, and the microwave 207 resonates with a transition between the first energy level rydberg state 203 and the second energy level rydberg state 204 to form a four-level rydberg EIT. Under the action of the strong microwave 207, the stark shift of the rydberg state occurs, and the transmission peak of the probe light 205 is also split. Along with the increase of the intensity of the microwave field to be measured, the height of the splitting peak is increased, and the information of the electric field intensity is converted into optical information.
Furthermore, the detection light and the coupling light are reversely injected into the atom sensing gas chamber, so that the alkali metal gas atoms are excited from a ground atomic state to a Reidberg state, and the method specifically comprises the following steps:
and sending the resonant detection light and the coupling light into the atom sensing gas chamber from the front side and the rear side of the atom sensing gas chamber respectively, wherein the detection light and the coupling light are superposed in the atom sensing gas chamber. Basic metal gas atoms in the atom sensing gas chamber are excited from a ground state atomic state to a middle excited state under the action of the detection light; and exciting the alkali metal gas atoms in the intermediate excited state into a first energy level Reedberg state under the action of the coupled light, and forming an electromagnetic induction window. Wherein, the detection light adopts large-spot detection light with the wavelength of 780 nm; the wavelength of the coupled light is 480nm.
Further, the microwave element to be measured emits the received microwave signal into the atom sensing gas chamber to form a microwave field to be measured, and the alkali metal gas atoms in the rydberg state are subjected to stark displacement, specifically comprising:
the microwave element to be measured fixed on the surface of the two-dimensional electric translation table is connected with a microwave source, and the microwave element to be measured acquires a microwave signal emitted by the microwave source and emits the microwave signal into the atomic sensing air chamber to form a microwave field to be measured; under the action of the electromagnetic induction window, the microwave field to be detected and the alkaline metal gas atoms in the first energy level Reedberg state are subjected to transition resonance to obtain the alkaline metal gas atoms in the second energy level Reedberg state, the alkaline metal gas atoms in the second energy level Reedberg state are subjected to Stark displacement, and the transmissivity of the large-spot detection light is changed along with the distribution of the microwave field.
Furthermore, the change of the detection light transmissivity along with the spatial distribution of the microwave field to be detected is obtained, and the two-dimensional absorption imaging result is displayed on a CCD camera, and the method specifically comprises the following steps:
separating the detection light and the coupling light passing through the atomic sensing gas chamber by a dichroic mirror; acquiring detection information carried in the separated detection light; wherein the detection information comprises the change of the detection light transmittance along with the spatial distribution of the microwave field to be detected; and obtaining a two-dimensional absorption imaging result of the microwave field to be detected according to the detection information, and displaying the two-dimensional absorption imaging result on a CCD camera.
It is understood that the image collected by the CCD camera is actually information of the spatial distribution of the transmittance of the probe light. Because the electric field intensity of the microwave and the transmissivity of the light field are in a linear relation, the measurement of the electric field intensity is converted into the measurement of the transmitted light intensity, and the intensity information of the corresponding microwave electric field can be obtained by collecting CCD images. During near-field scanning imaging, the position of a microwave element to be measured fixed on the two-dimensional electric translation table is changed through the controlled two-dimensional electric translation table, so that real-time imaging of each point position is realized.
In summary, the all-optical microwave electric field near-field imaging disclosed by the invention combines the electromagnetic induction transparency effect and the absorption imaging technology to realize non-contact non-destructive microwave electric field two-dimensional imaging so as to obtain surface microwave electric field high-resolution distribution data of rubidium bubbles; the electrical measurement is changed into optical measurement, so that the imaging resolution and sensitivity are greatly improved; the method utilizes the atomic medium to reduce the interference of electromagnetic radiation on detection, and develops the electromagnetic compatibility diagnosis and test technology through accurately positioning the electromagnetic radiation and the interference.
The above description is only a preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, for example, rubidium atom may also be cesium atom, and the atomic system may be an integrated antenna probe; any person skilled in the art can substitute or change the technical solution of the present invention and its inventive concept within the scope of the present invention and the patent disclosure of the present invention, and all belong to the protection scope of the present invention.
It should be understood that, although the steps in the above-described flowcharts are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not limited to being performed in the exact order illustrated and, unless explicitly stated herein, may be performed in other orders. Moreover, at least a portion of the steps in the above-described flowcharts may include multiple sub-steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, and the order of performing the sub-steps or the stages is not necessarily sequential, but may be performed alternately or alternatingly with other steps or at least a portion of the sub-steps or stages of other steps.
According to the all-optical microwave electric field near field imaging method provided by the embodiment of the invention, firstly, probe light and coupling light are reversely injected into an atom sensing gas chamber, so that alkaline metal gas atoms are excited to a Reidberg state from an atomic state of a ground state; then, a microwave element to be detected transmits the received microwave signal into the atom sensing gas chamber to form a microwave field to be detected, and the alkali metal gas atoms in the rydberg state generate stark displacement; then acquiring the change of the detection light transmissivity along with the spatial distribution of the microwave field to be detected, and displaying the two-dimensional absorption imaging result on a CCD camera; and finally, controlling the position of the microwave element to be detected on the two-dimensional electric translation table to obtain near-field images of the microwave element to be detected at different positions in a microwave electric field to be detected. Compared with the prior art, the microwave electric field near-field imaging device disclosed by the invention is combined with an electromagnetic induction effect and an absorption imaging technology to realize non-contact non-destructive microwave electric field two-dimensional imaging so as to obtain surface microwave electric field high-resolution distribution data of the atomic sensing gas chamber; the electrical measurement is changed into optical measurement, so that the resolution and the sensitivity of imaging are greatly improved; the interference of electromagnetic radiation on detection is reduced by utilizing the atomic medium, and the electromagnetic compatibility diagnosis and test technology is developed by accurately positioning the electromagnetic radiation and the interference, so that the practical application requirements are met.
An embodiment of the present invention further provides a computer-readable storage medium, where the computer-readable storage medium includes a stored computer program; wherein the computer program when executed controls an apparatus in which the computer readable storage medium is located to perform the all-optical microwave electric field near field imaging method as described above.
An embodiment of the present invention further provides a terminal device, where the terminal device includes a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, and the processor, when executing the computer program, implements the all-optical microwave electric field near-field imaging method as described above.
Preferably, the computer program can be divided into one or more modules/units (e.g., computer program 1, computer program 2,. Cndot. Cndot.) which are stored in the memory and executed by the processor to accomplish the present invention. The one or more modules/units may be a series of computer program instruction segments capable of performing certain functions, which are used to describe the execution of the computer program in the terminal device.
The Processor may be a Central Processing Unit (CPU), other general purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field-Programmable Gate Array (FPGA) or other Programmable logic device, a discrete Gate or transistor logic device, a discrete hardware component, etc., the general purpose Processor may be a microprocessor, or the Processor may be any conventional Processor, the Processor is a control center of the terminal device, and various interfaces and lines are used to connect various parts of the terminal device.
The memory mainly includes a program storage area and a data storage area, wherein the program storage area may store an operating system, an application program required for at least one function, and the like, and the data storage area may store related data and the like. In addition, the memory may be a high speed random access memory, may also be a non-volatile memory such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card), and the like, or may also be other volatile solid state memory devices.
It should be noted that the terminal device may include, but is not limited to, a processor and a memory, and those skilled in the art will understand that the terminal device may further include more or less components, or combine some components, or different components.
The above description is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, it is possible to make various improvements and modifications without departing from the technical principle of the present invention, and those improvements and modifications should be considered as the protection scope of the present invention.
Claims (8)
1. An all-optical microwave electric field near field imaging device, comprising: the device comprises an atomic sensing air chamber, a microwave source, a microwave element to be detected, a two-dimensional electric translation table, a dichroic mirror and a CCD camera; the output end of the microwave source is connected with the input end of the microwave element to be detected, the microwave element to be detected is fixed on the two-dimensional electric moving platform, the atom sensing air chamber is positioned at the top of the microwave element to be detected, is in reverse collinear propagation with the detection light and the coupling light of the atomic energy level resonance, and is respectively sent into the atom sensing air chamber from the front side and the rear side of the atom sensing air chamber; and after the detection light beam is split with the coupling light beam through the dichroic mirror, a two-dimensional absorption imaging result is displayed on the CCD camera.
2. The all-optical microwave electric field near-field imaging device according to claim 1, wherein a gas injection hole is further formed in a side of the atom sensing gas chamber opposite to the light wave emission hole, and the gas injection hole is used for injecting atomic gas into the atom sensing gas chamber; wherein the atomic gas is a basic metal atomic gas.
3. An all-optical microwave electric field near field imaging device according to claim 1, wherein the atom sensing gas cell is obtained by epoxy bonding two quartz glass plates with grooves or by epoxy bonding a plurality of quartz glass plates.
4. The all-optical microwave electric field near field imaging device according to claim 1, wherein the thickness of the atomic sensing gas chamber ranges from 1 to 2mm.
5. An all-optical microwave electric field near-field imaging method is applicable to the all-optical microwave electric field near-field imaging device, and comprises the following steps:
the detection light and the coupling light are reversely injected into the atom sensing gas chamber, so that the basic metal gas atoms are excited to a Reidberg state from an atomic state of a ground state;
transmitting the received microwave signal into the atom sensing gas chamber by a microwave element to be detected to form a microwave field to be detected and enable the alkali metal gas atoms in the rydberg state to generate stark displacement;
acquiring the change of the detection light transmissivity along with the spatial distribution of the microwave field to be detected, and displaying a two-dimensional absorption imaging result on a CCD camera;
and controlling the position of the microwave element to be detected on the two-dimensional electric translation platform to obtain near-field images of the microwave element to be detected at different positions in the microwave electric field to be detected.
6. The all-optical microwave electric field near field imaging method according to claim 5, wherein the probe light and the coupling light are reversely injected into the atomic sensing chamber to excite the alkali metal gas atoms from a ground atomic state to a riedberg state, and the method specifically comprises:
sending the resonant detection light and the coupling light into the atom sensing air chamber from the front side and the rear side of the atom sensing air chamber respectively; wherein the detection light is large-light-spot detection light;
the basic metal gas atoms are excited from a ground state atomic state to a middle excited state under the action of the detection light;
and exciting the alkali metal gas atoms in the intermediate excited state into a first energy level Reedberg state under the action of the coupled light, and forming an electromagnetic induction transparent window.
7. The all-optical microwave electric field near field imaging method according to claim 6, wherein the emitting, by a microwave element to be measured, a received microwave signal into the atomic sensing gas chamber to form a microwave field to be measured and cause stark displacement of the alkali metal gas atoms in a rydberg state, specifically comprises:
the microwave element to be tested acquires a microwave signal emitted by a microwave source and emits the microwave signal into the atomic sensing air chamber to form a microwave field to be tested;
under the action of an electromagnetic induction window, the microwave field to be detected and the alkaline metal gas atoms in the first energy level rydberg state are subjected to transition resonance to obtain the alkaline metal gas atoms in the second energy level rydberg state, and the alkaline metal gas atoms in the second energy level rydberg state are subjected to stark displacement.
8. The all-optical microwave electric field near field imaging method according to claim 7, wherein the change of the detection light transmittance along with the spatial distribution of the microwave field to be measured is obtained, and the two-dimensional absorption imaging result is displayed on a CCD camera, specifically comprising;
separating the detection light and the coupling light passing through the atomic sensing gas chamber by a dichroic mirror;
acquiring detection information carried in the separated detection light; wherein the detection information comprises the change of the detection light transmittance along with the spatial distribution of the microwave field to be detected;
and obtaining a two-dimensional absorption imaging result of the microwave field to be detected according to the detection information, and displaying the two-dimensional absorption imaging result on a CCD camera.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211365382.9A CN115407182A (en) | 2022-11-03 | 2022-11-03 | All-optical microwave electric field near-field imaging device and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211365382.9A CN115407182A (en) | 2022-11-03 | 2022-11-03 | All-optical microwave electric field near-field imaging device and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN115407182A true CN115407182A (en) | 2022-11-29 |
Family
ID=84169266
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202211365382.9A Pending CN115407182A (en) | 2022-11-03 | 2022-11-03 | All-optical microwave electric field near-field imaging device and method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115407182A (en) |
Citations (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1455870A (en) * | 2000-09-13 | 2003-11-12 | 纽卡斯尔诺森伯兰大学 | Microwave holographic measuring method and apparatus |
| CN103616571A (en) * | 2013-12-07 | 2014-03-05 | 山西大学 | Electric field detection method and device based on stark effects of Rydberg atoms |
| CN104880614A (en) * | 2015-06-09 | 2015-09-02 | 华南师范大学 | Microwave electric field intensity meter based on cold Rydberg atom interferometer and measuring method thereof |
| CN106501624A (en) * | 2016-11-25 | 2017-03-15 | 山西大学 | Microwave field Two dimensional Distribution measuring method based on Rydberg quantum coherence effect |
| CN107179450A (en) * | 2017-05-31 | 2017-09-19 | 华南师范大学 | A kind of microwave electric field strength measurement method and measurement apparatus |
| CN107356820A (en) * | 2017-06-07 | 2017-11-17 | 南京邮电大学 | A kind of electromagnetic field near field imaging system and method based on pulse optical detection magnetic resonance |
| CN108872269A (en) * | 2018-07-06 | 2018-11-23 | 深圳凌波近场科技有限公司 | Near field electromagnetic wave measuring system and multifunctional near-field electromagnetic wave measurement method |
| CN111308228A (en) * | 2020-01-15 | 2020-06-19 | 中国科学院大学 | Method and device for improving microwave electric field intensity measurement signal-to-noise ratio through Zeeman frequency modulation |
| US20200233025A1 (en) * | 2019-01-23 | 2020-07-23 | ColdQuanta, Inc. | Microwave sensor using rydberg particles |
| CN113092420A (en) * | 2021-04-22 | 2021-07-09 | 山西大学 | Workpiece defect measuring device and method based on rydberg atoms |
| CN113238097A (en) * | 2021-04-25 | 2021-08-10 | 西安电子科技大学 | Design method of single-frequency microwave electric field intensity measurement system based on rydberg atoms |
| CN113376449A (en) * | 2021-06-08 | 2021-09-10 | 合肥衡元量子技术有限公司 | Low-frequency microwave electric field sensor based on rydberg atoms and detection method |
| CN113405988A (en) * | 2021-05-14 | 2021-09-17 | 清远市天之衡量子科技有限公司 | Terahertz imaging method and system based on atomic gas chamber |
| US20220196716A1 (en) * | 2020-05-29 | 2022-06-23 | Rydberg Technologies Inc. | Atom-based closed-loop control for electromagnetic radiation measurement, communications, and information processing |
| US20220276293A1 (en) * | 2020-06-26 | 2022-09-01 | Honeywell International Inc. | Wideband rf spectrum real-time monitor |
-
2022
- 2022-11-03 CN CN202211365382.9A patent/CN115407182A/en active Pending
Patent Citations (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1455870A (en) * | 2000-09-13 | 2003-11-12 | 纽卡斯尔诺森伯兰大学 | Microwave holographic measuring method and apparatus |
| CN103616571A (en) * | 2013-12-07 | 2014-03-05 | 山西大学 | Electric field detection method and device based on stark effects of Rydberg atoms |
| CN104880614A (en) * | 2015-06-09 | 2015-09-02 | 华南师范大学 | Microwave electric field intensity meter based on cold Rydberg atom interferometer and measuring method thereof |
| CN106501624A (en) * | 2016-11-25 | 2017-03-15 | 山西大学 | Microwave field Two dimensional Distribution measuring method based on Rydberg quantum coherence effect |
| CN107179450A (en) * | 2017-05-31 | 2017-09-19 | 华南师范大学 | A kind of microwave electric field strength measurement method and measurement apparatus |
| CN107356820A (en) * | 2017-06-07 | 2017-11-17 | 南京邮电大学 | A kind of electromagnetic field near field imaging system and method based on pulse optical detection magnetic resonance |
| CN108872269A (en) * | 2018-07-06 | 2018-11-23 | 深圳凌波近场科技有限公司 | Near field electromagnetic wave measuring system and multifunctional near-field electromagnetic wave measurement method |
| US20200233025A1 (en) * | 2019-01-23 | 2020-07-23 | ColdQuanta, Inc. | Microwave sensor using rydberg particles |
| CN111308228A (en) * | 2020-01-15 | 2020-06-19 | 中国科学院大学 | Method and device for improving microwave electric field intensity measurement signal-to-noise ratio through Zeeman frequency modulation |
| US20220196716A1 (en) * | 2020-05-29 | 2022-06-23 | Rydberg Technologies Inc. | Atom-based closed-loop control for electromagnetic radiation measurement, communications, and information processing |
| US20220276293A1 (en) * | 2020-06-26 | 2022-09-01 | Honeywell International Inc. | Wideband rf spectrum real-time monitor |
| CN113092420A (en) * | 2021-04-22 | 2021-07-09 | 山西大学 | Workpiece defect measuring device and method based on rydberg atoms |
| CN113238097A (en) * | 2021-04-25 | 2021-08-10 | 西安电子科技大学 | Design method of single-frequency microwave electric field intensity measurement system based on rydberg atoms |
| CN113405988A (en) * | 2021-05-14 | 2021-09-17 | 清远市天之衡量子科技有限公司 | Terahertz imaging method and system based on atomic gas chamber |
| CN113376449A (en) * | 2021-06-08 | 2021-09-10 | 合肥衡元量子技术有限公司 | Low-frequency microwave electric field sensor based on rydberg atoms and detection method |
Non-Patent Citations (2)
| Title |
|---|
| 刘笑宏等: "室温原子气室中基于电磁诱导透明和吸收效应的微波电场测量", 《华南师范大学学报(自然科学版)》 * |
| 孙富宇等: "原子微波测量技术", 《时间频率学报》 * |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US10648933B2 (en) | Methods and apparatus for optically detecting magnetic resonance | |
| JP5735545B2 (en) | Device for analyzing samples using radiation in the terahertz frequency range | |
| CN112867934A (en) | Atom-based electromagnetic field sensing element and measurement system | |
| CN105044897B (en) | Quick random optical based on sparse constraint is reconstructed into as system and method | |
| CN105699315B (en) | THz wave measuring device, measurement method and measuring instrument | |
| CN107356820A (en) | A kind of electromagnetic field near field imaging system and method based on pulse optical detection magnetic resonance | |
| US11480514B2 (en) | Fluorescence lifetime imaging (FLIM) and flow cytometry applications for a time synchronized sensor network | |
| JP7034485B2 (en) | Electromagnetic wave measuring device | |
| JPH06180353A (en) | Voltage-image forming device and method utilizing electric-optic | |
| CN103163106A (en) | Super-resolution fluorescent lifetime imaging method and device based on stimulated emission lost | |
| US20230137266A1 (en) | Quantum electromagnetic field sensor and imager | |
| CN110440919B (en) | Two-dimensional real-time terahertz near-field imaging method and device | |
| EP3106858B1 (en) | Far-infrared imaging device and far-infrared imaging method | |
| EP2096430A2 (en) | Apparatus and method for obtaining images using coherent anti-stokes Raman scattering | |
| KR20130064684A (en) | Terahertz continuous wave system and three dimension imaging abtainning method thereof | |
| Ali et al. | High quality silicon photonics optical ring resonator biosensor design | |
| CN115407182A (en) | All-optical microwave electric field near-field imaging device and method | |
| CN103760135A (en) | Speed transfer laser spectrum measuring device and method of V-type energy level structure atoms | |
| JP2004020352A (en) | Method and apparatus for measuring terahertz pulse light | |
| RU2538296C2 (en) | Method of determining qubit state | |
| US8085402B2 (en) | Microscope and an observation method in the microscope | |
| JP6720383B2 (en) | Far infrared spectrometer | |
| WO2009013681A1 (en) | Integrated all-electronic terahertz imaging/spectroscopy device | |
| CN211602920U (en) | Terahertz wave excitation transmission system | |
| US9488569B2 (en) | Method and systems to detect matter through use of a magnetic field gradient |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20221129 |