CN115327288A

CN115327288A - Capacitor batch test board and device

Info

Publication number: CN115327288A
Application number: CN202210919956.6A
Authority: CN
Inventors: 周明红; 万雷; 敬文平; 唐迎春; 刘俊鑫
Original assignee: Dongguan Dongyuyang Electronic Technology Development Co ltd
Current assignee: Dongguan Dongyuyang Electronic Technology Development Co ltd
Priority date: 2022-08-01
Filing date: 2022-08-01
Publication date: 2022-11-11

Abstract

The invention discloses a batch capacitor test board and a device, wherein the test board comprises a carrier board, the carrier board is provided with at least one connecting end and a plurality of loading network units electrically connected with the connecting end, the connecting end comprises a plurality of pin electrodes, and each loading network unit comprises a pair of power connection points which are respectively a positive pole and a negative pole; a plurality of pairs of pin electrodes which are respectively the same pole of the power supply connection point belonging to each loading network unit and are used as a cathode or an anode in the connection end are electrically connected, and the other poles of the power supply connection points belonging to each loading network unit are respectively electrically connected with different pin electrodes in the connection end; each loading network unit is provided with a plurality of pairs of loading points, and each pair of loading points is used for loading a capacitor to be detected; the test board can greatly improve the loading capacity of the capacitors to be tested in a single batch, and realize K-level (thousands of loading capacities) test on the capacitors, thereby improving the test efficiency.

Description

Capacitor batch test board and device

Technical Field

The invention relates to the technical field of capacitor testing tools, in particular to a capacitor batch testing board and a device.

Background

A chip-type multi-layer ceramic capacitor (MLCC) is made up through such technological steps as stacking ceramic dielectric films with printed electrodes (internal electrodes) in staggered mode, high-temp sintering to form ceramic chip, and sealing metal layers (external electrodes) at both ends of chip to form a structural body similar to monolithic one. In the MLCC production process, after the assembly process is completed, an aging test process is also performed. As shown in the figure, the currently used MLCC test tool includes an aging substrate and a plurality of aging solder plates configured for the aging substrate, and a test power supply is loaded onto a plurality of MLCCs on the aging solder plates through the aging substrate, thereby completing an aging test of the MLCCs. However, for the currently used burn-in solder plates, only one soldering site is provided on each electrode, and accordingly, only one MLCC is provided for loading, so that each burn-in solder plate can only load 14 MLCCs, and thus, the requirement of the small-batch spot check work of the MLCCs can only be met, for the large-batch test work, for example, in view of the application category of the end customer, in order to improve the service life of the product and reduce the failure rate, the product introduction needs to perform the reliability verification of the MLCCs at the level of 5K/10K, in this case, if the test fixture is used for performing the batch test on the MLCCs, a multi-batch operation is required, and the test efficiency cannot meet the actual work requirement.

Disclosure of Invention

The invention aims to provide a capacitor batch test board and a device which can greatly improve the single batch test quantity of capacitors so as to improve the test efficiency.

In order to achieve the purpose, the invention discloses a capacitor batch test board which comprises a carrier plate, wherein at least one connecting end used for being connected with a detection circuit and a plurality of loading network units electrically connected with the connecting end are arranged on the carrier plate, the connecting end comprises a plurality of pin electrodes, and each loading network unit comprises a pair of power supply connecting points which are respectively a positive pole and a negative pole; a plurality of pairs of the same poles of the power supply connection points respectively belonging to each of the loaded network units are electrically connected to the same one of the pin electrodes serving as a cathode or an anode in the connection terminals, and a plurality of pairs of the other poles of the power supply connection points respectively belonging to each of the loaded network units are electrically connected to different ones of the pin electrodes in the connection terminals; each loading network unit is provided with a plurality of pairs of loading points, and each pair of loading points is used for loading a capacitor to be detected.

Preferably, each of the loading network units is provided with a plurality of pairs of extension lines, two of the extension lines in each pair are electrically connected to two power connection points in the loading network unit, a plurality of pairs of loading points are arranged on each pair of extension lines at intervals from the head end to the tail end, and two of each pair of loading points are located on two of the extension lines in each pair.

Preferably, 50 to 100 loading points are arranged in each loading network unit.

Preferably, the carrier plate is provided with two connecting ends.

Preferably, each of the connection ends is connected with 6 to 10 of the loading network units.

Preferably, the connecting end is a gold finger.

Preferably, the capacitor has a chip multilayer ceramic structure.

The invention also discloses a capacitor batch testing device which comprises a plurality of capacitor batch testing boards and an aging substrate, wherein the aging substrate is provided with a plurality of connecting matching ends which are respectively matched with the connecting ends on each carrier board, and the aging substrate is provided with the detection circuit which is used for providing a detection power supply for the carrier boards.

Preferably, the connecting end and the connecting mating end are connected through a pluggable structure.

Compared with the prior art, in the technical scheme of the invention, in order to increase the loading quantity of the capacitors to be tested, a plurality of groups of loading network units which are independent to each other are arranged on the carrier plate of the test board, and the plurality of groups of loading network units share one pin electrode of the connecting end, so that the loading network units can be arranged on the carrier plate to the maximum extent, and the loading capacity of the test board is increased; therefore, by means of the arrangement of the test board, the loading capacity of the capacitors to be tested in a single batch can be greatly improved, K-level (the loading capacity is over thousand) testing of the capacitors is achieved, and therefore testing efficiency is improved.

Drawings

FIG. 1 is a schematic plan view of a test board according to an embodiment of the present invention.

FIG. 2 is a plan view of the burn-in substrate according to the embodiment of the present invention.

Fig. 3 is an enlarged structural view of one of the loading network elements in fig. 1.

FIG. 4 is a schematic plan view of a test board according to another embodiment of the present invention.

Detailed Description

In order to explain technical contents, structural features, and objects and effects of the present invention in detail, the following detailed description is given with reference to the accompanying drawings in conjunction with the embodiments.

Fig. 1 to fig. 3 disclose a batch capacitor testing apparatus for testing the quality of capacitors in a large batch, the testing apparatus includes a plurality of testing boards 1 and an aging substrate 2, the testing boards 1 are electrically connected to the aging substrate 2, the testing boards 1 are used for loading the capacitors to be tested, and the aging substrate 2 is provided with a detecting circuit for providing a detecting power supply for the testing boards 1.

Specifically, as shown in fig. 1 and fig. 3, for each test board 1, it includes a carrier board 10, the carrier board 10 is provided with at least one connection terminal 11 for connecting with the detection circuit on the burn-in substrate 2 and a plurality of load network units 12 electrically connected with the connection terminal 11, the connection terminal 11 includes a plurality of pin electrodes 13, and each load network unit 12 includes a pair of power connection points 120. In addition, as shown in fig. 2, the burn-in substrate 2 is provided with a plurality of connection mating ends 20 respectively matching with the connection ends 11 on each carrier board 10, and the connection between the test board 1 and the burn-in substrate 2 is realized through the connection ends 11 and the connection mating ends 20.

Referring to fig. 1 again, in the loading network units 12, a plurality of pairs of the same poles of the power connection points belonging to each of the loading network units are electrically connected to a same one of the pin electrodes serving as a cathode or an anode, and a plurality of pairs of the power connection points belonging to each of the loading network units are electrically connected to different ones of the pin electrodes. In this embodiment, the cathodes of the pair of power connection points 120 in each load network unit 12 on the carrier board 10 are connected in parallel to the same pin electrode a serving as a cathode in the connection terminal 11, and the other pin electrodes c, d, e, f, g, h, i, and j on the connection terminal 11 are anodes and are respectively connected to the anodes of the pair of power connection points 120 in each load network unit 12 on the carrier board 10, so that each load network unit 12 is independent from each other, and thus, not only can the load network units 12 be maximally disposed according to the number of pin electrodes 13 in the connection terminal 11 on the carrier board 10, and the load capacity of the test board 1 is improved, but also the detection result of each load network unit 12 can be respectively determined according to the signal feedback of each pin electrode 13 serving as an anode.

As shown in fig. 3, each loading network unit 12 is provided with a plurality of pairs of loading points 121, and each pair of loading points 121 is used for loading a capacitor to be measured. In this embodiment, the loading point is a welding point for welding with the capacitor to be tested.

When the testing device with the structure is used, firstly, capacitors to be tested are welded on a plurality of pairs of loading points 121 in each loading network unit 12, after each loading network unit 12 is filled with the capacitors, the testing board 1 is installed on the aging substrate 2 through the connecting end 11 and the connecting matching end 20, then the aging substrate 2 is electrified, and the aging substrate 2 loads a testing power supply to a plurality of capacitors in each loading network unit 12 through a testing circuit, so that a large amount of testing work of capacitors in a single batch is realized, K-level (the loading capacity is thousands) testing of the capacitors can be easily realized, and the testing efficiency is improved. The capacitor in the present embodiment has a chip multilayer ceramic structure.

Specifically, referring to fig. 3 again, each loading network unit 12 is provided with a plurality of pairs of extension lines L, two of the extension lines L1 and L2 in each pair are electrically connected to a pair of power connection points in the loading network unit, a plurality of pairs of loading points 121 are spaced from the head end to the tail end of each pair of extension lines L, and two of each pair of loading points 121 are respectively located on two of the pair of extension lines L, that is, on the line L1 and the line L2.

Optionally, 50-100 loading points 121 are provided in each loading network element 12. Specifically, in the present embodiment, 84 loading points 121 are provided in each loading network element 12.

Alternatively, as shown in fig. 4, two connection terminals 11 are disposed on the carrier board 10, and 6 to 10 load network units 12 can be connected to each connection terminal 11. Specifically, in the present embodiment, there are eight load network units 12 connected to each connection terminal 11, so that the load capacity of the capacitor under test of one carrier board 10 is 1344. In this embodiment, since two connecting terminals 11 are disposed on the carrier board 10, as shown in fig. 2, the pair of the connecting terminals 20 on the burn-in substrate 2 is disposed, and each pair of the connecting terminals P is respectively matched with two connecting terminals 11 on the carrier board 10.

Further, to facilitate the installation of the test board 1, the connecting end 11 is connected to the connecting mating end 20 via a pluggable structure. Specifically, the connection end 11 is a gold finger, and the connection mating end 20 is a slot adapted to the gold finger.

The above disclosure is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the scope of the present invention, therefore, the present invention is not limited by the appended claims.

Claims

1. A capacitor batch test board is characterized by comprising a carrier board, wherein the carrier board is provided with at least one connecting end used for being connected with a detection circuit and a plurality of loading network units electrically connected with the connecting end, the connecting end comprises a plurality of pin electrodes, and each loading network unit comprises a pair of power supply connecting points which are respectively a positive pole and a negative pole; a plurality of pairs of the same poles of the power supply connection points respectively belonging to each of the loaded network units are electrically connected to the same one of the pin electrodes serving as a cathode or an anode in the connection terminals, and a plurality of pairs of the other poles of the power supply connection points respectively belonging to each of the loaded network units are electrically connected to different ones of the pin electrodes in the connection terminals; each loading network unit is provided with a plurality of pairs of loading points, and each pair of loading points is used for loading a capacitor to be detected.

2. The test board for testing capacitor lot size as claimed in claim 1, wherein each of the loading network units has a plurality of pairs of extension lines, two of the extension lines in each pair are electrically connected to two power connection points of the loading network unit, a plurality of pairs of loading points are spaced from the head end to the tail end of each extension line in each pair, and two of the loading points in each pair are located on two of the extension lines in each pair.

3. The test board for testing capacitor lots as claimed in claim 1, wherein 50-100 loading points are provided in each of the loading network units.

4. The test board for batch of capacitors according to claim 1, wherein two of the connecting terminals are disposed on the carrier board.

5. The test board for batch of capacitors as claimed in claim 1, wherein 6 to 10 loading network units are connected to each of the connecting terminals.

6. The test board for batch testing of capacitors as claimed in claim 1, wherein the connecting terminals are gold fingers.

7. The test board for testing capacitor lots according to claim 1, wherein the capacitors have a chip-type multilayer ceramic structure.

8. A batch capacitor test device, comprising a plurality of batch capacitor test boards according to any one of claims 1 to 7 and a burn-in substrate, wherein the burn-in substrate is provided with a plurality of connection terminals respectively matched with the connection terminals on each of the carrier boards, and the burn-in substrate is provided with the detection circuit for providing a detection power supply for the carrier boards.

9. The batch test apparatus of claim 8, wherein the connection end and the connection mating end are connected by a pluggable structure.