CN115166454A - PCB flashover characteristic test system and method under transient overvoltage - Google Patents

PCB flashover characteristic test system and method under transient overvoltage Download PDF

Info

Publication number
CN115166454A
CN115166454A CN202210839938.7A CN202210839938A CN115166454A CN 115166454 A CN115166454 A CN 115166454A CN 202210839938 A CN202210839938 A CN 202210839938A CN 115166454 A CN115166454 A CN 115166454A
Authority
CN
China
Prior art keywords
flashover
resistor
power supply
circuit
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202210839938.7A
Other languages
Chinese (zh)
Inventor
韩涛
胡俊杰
韩潇
侯志鹏
李强
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tianjin University
Tianjin Aviation Mechanical and Electrical Co Ltd
Original Assignee
Tianjin University
Tianjin Aviation Mechanical and Electrical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tianjin University, Tianjin Aviation Mechanical and Electrical Co Ltd filed Critical Tianjin University
Priority to CN202210839938.7A priority Critical patent/CN115166454A/en
Publication of CN115166454A publication Critical patent/CN115166454A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/14Circuits therefor, e.g. for generating test voltages, sensing circuits
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/28Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing

Abstract

The invention relates to a PCB flashover characteristic test system and method under transient overvoltage, which have higher popularization. By the test system and the test method, flashover characteristic measurement under transient overvoltage of the PCB can be realized by using a voltage source with smaller power; meanwhile, automatic identification of flashover voltage under transient overvoltage and automatic stop of the pulse power supply after flashover occurs can be realized, and the safety of the tested test sample is protected.

Description

PCB flashover characteristic test system and method under transient overvoltage
Technical Field
The invention belongs to the technical field of high voltage and insulation characteristic testing, and particularly relates to a PCB flashover characteristic testing system, a method and a system under transient overvoltage.
Background
In an aircraft such as an aircraft, due to the limitation of the volume of the device, the high-power supply device often adopts a compact structure design of a Printed Circuit Board (PCB). However, due to the insufficient sectional area of the printed circuit, the input or output lines through which a large current flows often adopt a bus bar structure made of copper or aircraft aluminum, and are fixed on the surface of the PCB by welding.
However, due to changes in the aircraft altitude, the air pressure within its internal non-sealed power supply equipment will change. In addition, in the process of starting the aircraft load device, transient overvoltage which is several times of output voltage is inevitably generated in a circuit, and the transient overvoltage directly acts on important PCB devices such as bus bars and the like, so that discharge is easily caused under low air pressure, flashover and electric arc are caused due to high power supply power, and the stable operation of an aircraft power supply PCB and the safety of the aircraft are greatly threatened.
At present, the research aiming at the flashover characteristic of PCB equipment mainly depends on high-power supply equipment to initiate flashover and stabilize electric arcs, the equipment often has larger volume and cost, and in the test process, because of the occurrence of continuous flashover, the test sample can only be tested once, and the development of repeated tests is not facilitated. In addition, the existing test equipment is often tested by adopting a constant direct current or alternating current power supply, the test only researches the flashover characteristic caused under a steady state, and the research under the transient overvoltage is slightly insufficient. Meanwhile, transient overvoltage is often realized by energy storage and discharge of capacitive equipment, so that the power of the transient overvoltage is often low, continuous triggering cannot be realized, and intermittent triggering with a certain frequency is often designed.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides a PCB flashover characteristic test system and a method under transient overvoltage, wherein a multistage pulse circuit based on avalanche triode breakdown is adopted as a voltage source to generate high voltage, and transient overvoltage with fast ns-level rise time and fall time is generated to test the PCB flashover characteristic under the transient overvoltage; meanwhile, a flashover signal identification circuit is introduced to realize automatic identification of flashover voltage and complete measurement of flashover characteristics of the PCB test sample under the condition of smaller power supply.
The technical problem to be solved by the invention is realized by the following technical scheme:
the utility model provides a PCB flashover characteristic test system under transient state overvoltage which characterized in that: the device comprises an experimental box, a pulse power supply, an oscilloscope, a high-frequency current transformer, a flashover signal identification circuit, a single chip microcomputer locking circuit and a pulse power supply trigger control module, wherein a PCB test sample is placed in the experimental box, two bus bars are symmetrically arranged on the PCB test sample, one bus bar is connected to the pulse power supply, the other bus bar is grounded after passing through the high-frequency current transformer, the high-frequency current transformer is connected to the flashover signal identification circuit, the flashover signal identification circuit is connected to the single chip microcomputer locking circuit, the single chip microcomputer locking circuit is connected to the pulse power supply trigger control module, the pulse power supply trigger control module is connected to the pulse power supply, the single chip microcomputer locking circuit is further connected to the oscilloscope, and the oscilloscope is connected to the pulse power supply.
The pulse power supply comprises a trigger circuit and cascade circuits, the output end of the trigger circuit is connected with a plurality of cascade circuits in series, and the output end of each cascade circuit outputs nanosecond pulse output voltage;
the trigger circuit comprises a first capacitor, a second resistor, a first avalanche triode, a first resistor, a second capacitor, a second avalanche triode, a third resistor and a fourth resistor, wherein one end of the first capacitor is connected with a square wave control signal, the other end of the first capacitor is connected with one end of the second resistor and a base electrode of the first avalanche triode in parallel, the other end of the second resistor is connected with a grounding end and an emitting electrode of the first avalanche triode in parallel, a collector electrode of the third avalanche triode is connected with one end of the first resistor and one end of the second capacitor in parallel, the other end of the first resistor is connected with a direct current voltage input and one end of the third resistor in parallel, the other end of the second capacitor is connected with a base electrode of the second avalanche triode and one end of the fourth resistor, the other end of the third resistor is connected with a collector electrode and a trigger output end of the second avalanche triode, an emitting electrode of the second avalanche triode is connected with one end of the fourth resistor, and the other end of the fourth resistor is connected with an emitting electrode of the first avalanche triode and the other end of the second avalanche triode;
the cascade circuit comprises a third capacitor, a third avalanche triode, a fifth resistor and a sixth resistor, one end of the third capacitor is connected to the trigger output end of the trigger circuit, the other end of the third capacitor is connected to the base of the third avalanche triode and one end of the sixth resistor respectively, the collector of the third avalanche triode is connected to one end of the fifth resistor and the cascade output end respectively, the other end of the fifth resistor is connected to a direct-current voltage input, the emitter of the third avalanche triode is connected to one end of the sixth resistor, and the other end of the sixth resistor is connected to the ground terminal.
The flashover signal identification circuit comprises a flashover capacitor and a TL3016C voltage comparator, an input end of the flashover capacitor is connected with an output signal of the high-frequency current transformer, an output end of the flashover capacitor is connected with a flashover first resistor, an output end of the flashover first resistor is connected with a flashover second resistor and the TL3016C voltage comparator in parallel, output ends of the TL3016C voltage comparator and the flashover second resistor are connected with a flashover third resistor, an output end of the flashover third resistor outputs TTL high level and inputs the TTL high level to the single-chip locking circuit, an output end of the flashover third resistor is connected with a flashover fourth resistor and a flashover fifth resistor in parallel, the TL3016C voltage comparator, the flashover fourth resistor and the flashover fifth resistor are all grounded, and the flashover first resistor, the flashover second resistor, the TL3016C voltage comparator, the flashover third resistor, the flashover fourth resistor and the flashover fifth resistor form a hysteresis voltage comparator.
A PCB flashover characteristic test method under transient overvoltage is characterized in that: the testing method comprises the following steps:
1) Preparation of test samples: symmetrically welding the two bus bars on the surface of the PCB to form a PCB test sample, cleaning the PCB test sample by alcohol, and drying the PCB test sample in a drying box;
2) The pulse power supply determines: determining the number of required cascade circuits according to test requirements, and connecting the trigger circuit and the multistage cascade circuits in series to form a pulse power supply;
3) Building a test system: placing the dried PCB test sample in an experimental box, and connecting the experimental box, a pulse power supply, an oscilloscope, a high-frequency current transformer, a flashover signal identification circuit, a singlechip latching circuit and a pulse power supply trigger control module to form a test system;
4) Testing the flashover starting voltage value: a square wave control signal is given to a pulse power supply to generate nanosecond pulse transient overvoltage, the nanosecond pulse transient overvoltage signal passes through a PCB test sample, a bus bar on the PCB test sample is subjected to flashover to form a high-frequency current signal, a high-frequency current transformer converts the high-frequency current signal into a voltage signal, the voltage signal is subjected to signal identification through a flashover signal identification circuit and generates a TTL high level, the voltage signal is output to a single chip microcomputer locking circuit, the single chip microcomputer locking circuit adopts an STM32L151C8T6 single chip microcomputer, an I/O pin connected with the flashover signal identification circuit is set to be in an external terminal mode and is set to be in a rising edge trigger mode, when the flashover signal identification circuit outputs the TTL high level square wave signal, the I/O pin identifies an external interrupt event, and when the single chip microcomputer continuously generates external interrupt for about 10 times within 100ms, the situation is judged to be that flashover occurs; the single chip microcomputer is connected with an I/O (input/output) pin of the pulse power supply trigger control module and is set to be in an output mode, when flashover occurs, the pin immediately outputs a high-level signal which is used for controlling the pulse power supply trigger control module to stop the output of a trigger signal, so that the generation of pulse voltage is stopped; meanwhile, the single chip microcomputer is communicated with the oscilloscope through the USB communication chip CH340, when the single chip microcomputer judges that flashover occurs, an instruction is sent to enable the oscilloscope to pause, and the current pulse voltage amplitude of the oscilloscope is the flashover starting voltage value.
The invention has the advantages and beneficial effects that:
1. the test object of the invention is a bus bar on a power supply PCB in an aircraft, and the test system of the invention can realize that the flashover voltage of the test object can be determined by using a smaller power supply in the test process.
2. The pulse power supply comprises a trigger circuit and a plurality of cascade circuits, and can generate nanosecond pulse transient overvoltage, so that pulses with different voltage levels are generated.
3. The invention introduces a flashover signal identification circuit, can quickly identify flashover signals after stable flashover occurs, transmits the flashover signals to the pulse power supply trigger control module through the singlechip latching circuit, controls the pulse power supply to stop generating pulse signals, and immediately and automatically cuts off the pulse power supply, thereby realizing effective protection on a test sample, simultaneously reading the pulse voltage value of the cut-off time voltage source through program control, and recording the flashover initial voltage value.
Drawings
FIG. 1 is a schematic diagram of a test system of the present invention;
FIG. 2 is a circuit diagram and equivalent block diagram of the trigger circuit of the present invention;
FIG. 3 is a circuit diagram and equivalent block diagram of the cascade circuit of the present invention;
FIG. 4 is a circuit diagram of a trigger circuit of the present invention in series with a cascode circuit;
FIG. 5 is a schematic view of a flashover voltage test specimen of the present invention;
FIG. 6 is a circuit diagram of a flashover signal identifying circuit of the present invention;
fig. 7 is a graph of the flashover start voltage value and the temperature and humidity according to the embodiment of the invention.
Detailed Description
The present invention is further illustrated by the following specific examples, which are intended to be illustrative, not limiting and are not intended to limit the scope of the invention.
As shown in fig. 1, a PCB flashover characteristic testing system under transient overvoltage is innovative in that: the device comprises an experimental box, a pulse power supply, an oscilloscope, a High Frequency Current Transformer (HFCT), a flashover signal identification circuit, a single chip microcomputer latching circuit and a pulse power supply trigger control module, wherein a PCB test sample is placed in the experimental box, two bus bars are symmetrically arranged on the PCB test sample, one bus bar is connected to the pulse power supply, the other bus bar is grounded after passing through the high frequency current transformer, the high frequency current transformer is connected to the flashover signal identification circuit, the flashover signal identification circuit is connected to the single chip microcomputer latching circuit, the single chip microcomputer latching circuit is connected to the pulse power supply trigger control module, the pulse power supply trigger control module is connected to the pulse power supply, the single chip microcomputer latching circuit is further connected to the oscilloscope, and the oscilloscope is connected to the pulse power supply.
As shown in fig. 2, the trigger circuit includes a first capacitor, a second resistor, a first avalanche transistor, a first resistor, a second capacitor, a second avalanche transistor, a third resistor, and a fourth resistor, wherein one end of the first capacitor is connected to a square wave control signal, the other end of the first capacitor is connected in parallel to one end of the second resistor and a base of the first avalanche transistor, the other end of the second resistor is connected in parallel to a ground terminal and an emitter of the first avalanche transistor, respectively, a collector of the third avalanche transistor is connected in parallel to one end of the first resistor and one end of the second capacitor, respectively, the other end of the first resistor is connected to a dc voltage input and one end of the third resistor, the other end of the second capacitor is connected to a base of the second avalanche transistor and one end of the fourth resistor, respectively, the other end of the third resistor is connected to a collector of the second avalanche transistor and a trigger output terminal, respectively, an emitter of the second avalanche transistor is connected to one end of the fourth resistor, and the other end of the fourth resistor are connected to an emitter of the first avalanche transistor and the other end of the second avalanche transistor, respectively;
the trigger link circuit adopts square wave signal to realize control, Q 1 And Q 2 The avalanche transistor is selected and used for realizing the capacitor C by utilizing the rapid avalanche breakdown characteristic thereof 2 To produce a rapidly varying nanosecond pulse at the trigger output; the output amplitude of the pulse voltage can be adjusted by adjusting the DC voltage of 100-300V, and the voltage adjusting range of the circuit is 150-250V through experimental tests.
As shown in fig. 3, the cascade circuit includes a third capacitor, a third avalanche transistor, a fifth resistor and a sixth resistor, one end of the third capacitor is connected to the third avalanche transistorThe other end of the third capacitor is respectively connected to the base of the third avalanche transistor and one end of a sixth resistor, the collector of the third avalanche transistor is respectively connected to one end of a fifth resistor and the cascade output end, the other end of the fifth resistor is connected to direct-current voltage input, the emitter of the third avalanche transistor is connected to one end of the sixth resistor, the other end of the sixth resistor is connected to the ground terminal, the energy storage element is a capacitor C 3 The rapid release of energy is realized through the breakdown of the avalanche triode so as to form pulse voltage at the output end, and the adjustable pulse voltage value generated by a single cascade link is 150-250V.
In order to improve the voltage peak value of a pulse voltage source, a structure that a plurality of cascade circuits are connected in series can be adopted, the invention adopts a multistage pulse generating circuit with adjustable stage number, a pulse power source comprises a trigger circuit and the cascade circuits, the output end of the trigger circuit is connected with the cascade circuits in series, and the output end of the cascade circuits outputs nanosecond pulse output voltage; as shown in fig. 4, the amplitude control of the output pulse voltage is realized, the output pulse voltage can be increased by 150-250V voltage value every time a cascade circuit is added, and the output voltage amplitude of the whole pulse can be controlled by adjusting the value of the dc voltage, when in use, a capacitor (200pf, 600v) is connected at the output end to filter the interference of the dc voltage.
As shown in fig. 6, the flashover signal identification circuit includes a flashover capacitor and a TL3016C voltage comparator, an input end of the flashover capacitor is connected to an output signal of the high-frequency current transformer, an output end of the flashover capacitor is connected to a flashover first resistor, an output end of the flashover first resistor is connected in parallel to a flashover second resistor and a TL3016C voltage comparator, output ends of the TL3016C voltage comparator and the flashover second resistor are both connected to a flashover third resistor, an output end of the flashover third resistor outputs a TTL high level and inputs the TTL high level to the single-chip locking circuit, an output end of the flashover third resistor is connected in parallel to a flashover fourth resistor and a flashover fifth resistor, the TL3016C voltage comparator, the flashover fourth resistor and the flashover fifth resistor are all grounded, and the flashover first resistor, the flashover second resistor, the TL3016C voltage comparator, the flashover third flashover resistor, the flashover fourth resistor and the flashover fifth flashover resistor form a hysteresis voltage comparator.
As shown in fig. 6, when a flashover occurs, the HFCT outputs a pulse signal, which enters a hysteresis voltage comparator formed by a TL3016C voltage comparator through a 0.1uF capacitor, i.e., a square wave signal with a voltage value of 3.3V is output from a TTL level output terminal, and the signal enters an I/O pin of a subsequent one-chip microcomputer circuit, i.e., the occurrence of the flashover can be identified by setting an external interrupt.
A PCB flashover characteristic test method under transient overvoltage is characterized in that: the testing method comprises the following steps:
1) Preparation of test samples: as shown in fig. 5, two bus bars are symmetrically welded on the surface of a PCB to form a PCB test sample, the PCB test sample is cleaned by alcohol and placed in a drying oven for drying, one bus bar is connected with a high voltage electrode during the test, and the other bus bar is grounded through a lead;
the test may be run on bare bus bars, and test with bare metal material. Furthermore, flashover behavior tests can also be performed for materials with an insulating coating. In practical application, the bus bar is coated with insulating paint or conformal paint and other materials on the surface thereof according to different manufacturing processes so as to improve the insulating property of the bus bar.
2) Determining a pulse power supply: determining the number of required cascade circuits according to test requirements, and connecting the trigger circuit and the multistage cascade circuits in series to form a pulse power supply;
3) Building a test system: placing the dried PCB test sample in an experimental box, and connecting the experimental box, a pulse power supply, an oscilloscope, a high-frequency current transformer, a flashover signal identification circuit, a singlechip latching circuit and a pulse power supply trigger control module to form a test system;
4) Testing the flashover starting voltage value: a square wave control signal is given to a pulse power supply to generate nanosecond pulse transient overvoltage, the nanosecond pulse transient overvoltage signal passes through a PCB test sample, and a bus bar on the PCB test sample is subjected to flashover to form a high-frequency current signal;
the HFCT is a high-frequency current transformer, the measuring frequency range of the HFCT is 500k-30MHz, when the bus bar is in flashover directly, a current signal with higher frequency flows in a bus bar grounding wire, the current signal can be converted into a voltage signal by utilizing the detection of the HFCT, and the occurrence of each flashover corresponds to the generation of a cluster of high-frequency signals;
when flashover occurs, the HFCT outputs a pulse signal, the pulse signal enters a hysteresis voltage comparator formed by a TL3016C voltage comparator after passing through a 0.1uF capacitor, namely, a square wave signal with the voltage value of 3.3V can be output by a TTL level output end, the square wave signal enters an I/O pin of a subsequent single chip circuit, and the occurrence of flashover can be identified by setting external interruption;
the voltage signal is subjected to signal identification through the flashover signal identification circuit, generates a TTL high level and is output to the single chip microcomputer locking circuit; the single chip microcomputer locking circuit adopts an STM32L151C8T6 single chip microcomputer, an I/O pin connected with a flashover signal identification circuit is set to be in an external terminal mode and is set to be in a rising edge trigger mode, when the flashover signal identification circuit outputs a TTL high-level square wave signal, the I/O pin identifies an external interrupt event, and when the single chip microcomputer continuously generates external interrupts for about 10 times within 100ms, the single chip microcomputer is judged to generate flashover;
the single chip microcomputer is connected with an I/O (input/output) pin of the pulse power supply trigger control module and is set to be in an output mode, when flashover occurs, the pin immediately outputs a high-level signal which is used for controlling the pulse power supply trigger control module to stop the output of a trigger signal, so that the generation of pulse voltage is stopped;
meanwhile, the single chip microcomputer is communicated with the oscilloscope through a USB communication chip CH340, when the single chip microcomputer judges that flashover occurs, an instruction is sent to enable the oscilloscope to pause, and the current pulse voltage amplitude of the oscilloscope is the flashover starting voltage value.
Examples
(1) Welding 2 bus bars on the surface of the PCB at intervals of 2mm, cleaning the PCB by using alcohol, and placing the PCB in a drying oven at 50 ℃ for 2h for drying;
(2) The pulse power supply is connected to the required number of stages, and a test system is set up according to the figure 1;
(3) And raising the pulse voltage value at a constant speed of 50V/min until a flashover system automatically stops supplying power.
(4) The voltage amplitude displayed by the oscilloscope is recorded and is recorded as the flashover voltage under the experimental condition.
Typical voltage data results obtained are shown in fig. 7, which is a plot of the flashover onset voltage values measured at various temperatures and humidities.
Although the embodiments of the present invention and the accompanying drawings are disclosed for illustrative purposes, those skilled in the art will appreciate that: various substitutions, changes and modifications are possible without departing from the spirit and scope of the invention and the appended claims, and therefore the scope of the invention is not limited to the disclosure of the embodiments and the accompanying drawings.

Claims (4)

1. The utility model provides a PCB flashover characteristic test system under transient state overvoltage which characterized in that: the device comprises an experimental box, a pulse power supply, an oscilloscope, a high-frequency current transformer, a flashover signal identification circuit, a single chip microcomputer locking circuit and a pulse power supply trigger control module, wherein a PCB test sample is placed in the experimental box, two bus bars are symmetrically arranged on the PCB test sample, one bus bar is connected to the pulse power supply, the other bus bar is grounded after passing through the high-frequency current transformer, the high-frequency current transformer is connected to the flashover signal identification circuit, the flashover signal identification circuit is connected to the single chip microcomputer locking circuit, the single chip microcomputer locking circuit is connected to the pulse power supply trigger control module, the pulse power supply trigger control module is connected to the pulse power supply, the single chip microcomputer locking circuit is further connected to the oscilloscope, and the oscilloscope is connected to the pulse power supply.
2. The PCB flashover characteristic testing system under overvoltage transients of claim 1, wherein: the pulse power supply comprises a trigger circuit and cascade circuits, wherein the output end of the trigger circuit is connected with a plurality of cascade circuits in series, and the output end of each cascade circuit outputs nanosecond pulse output voltage;
the trigger circuit comprises a first capacitor, a second resistor, a first avalanche triode, a first resistor, a second capacitor, a second avalanche triode, a third resistor and a fourth resistor, wherein one end of the first capacitor is connected with a square wave control signal, the other end of the first capacitor is connected with one end of the second resistor and a base electrode of the first avalanche triode in parallel, the other end of the second resistor is connected with a grounding end and an emitting electrode of the first avalanche triode in parallel, a collector electrode of the third avalanche triode is connected with one end of the first resistor and one end of the second capacitor in parallel, the other end of the first resistor is connected with a direct current voltage input and one end of the third resistor in parallel, the other end of the second capacitor is connected with a base electrode of the second avalanche triode and one end of the fourth resistor, the other end of the third resistor is connected with a collector electrode and a trigger output end of the second avalanche triode, an emitting electrode of the second avalanche triode is connected with one end of the fourth resistor, and the other end of the fourth resistor is connected with an emitting electrode of the first avalanche triode and the other end of the second avalanche triode;
the cascade circuit comprises a third capacitor, a third avalanche triode, a fifth resistor and a sixth resistor, one end of the third capacitor is connected to the trigger output end of the trigger circuit, the other end of the third capacitor is respectively connected to the base of the third avalanche triode and one end of the sixth resistor, the collector of the third avalanche triode is respectively connected to one end of the fifth resistor and the cascade output end, the other end of the fifth resistor is connected to a direct-current voltage input, the emitter of the third avalanche triode is connected to one end of the sixth resistor, and the other end of the sixth resistor is connected to the ground terminal.
3. The system for testing the flashover characteristics of the PCB under over voltage transients of claim 1, wherein: the flashover signal identification circuit comprises a flashover capacitor and a TL3016C voltage comparator, an input end of the flashover capacitor is connected with an output signal of the high-frequency current transformer, an output end of the flashover capacitor is connected with a flashover first resistor, an output end of the flashover first resistor is connected with a flashover second resistor and the TL3016C voltage comparator in parallel, output ends of the TL3016C voltage comparator and the flashover second resistor are connected with a flashover third resistor, an output end of the flashover third resistor outputs TTL high level and inputs the TTL high level to a single-chip locking circuit, an output end of the flashover third resistor is connected with a flashover fourth resistor and a flashover fifth resistor in parallel, the TL3016C voltage comparator, the flashover fourth resistor and the flashover fifth resistor are all grounded, and the flashover first resistor, the flashover second resistor, the TL3016C voltage comparator, the flashover third resistor, the flashover fourth resistor and the flashover fifth resistor form a voltage hysteresis comparator.
4. The method for testing the flashover characteristics of the PCB under the transient overvoltage according to any one of claims 1 to 3, wherein: the testing method comprises the following steps:
1) Preparation of test samples: symmetrically welding the two bus bars on the surface of the PCB to form a PCB test sample, cleaning the PCB test sample by alcohol, and drying the PCB test sample in a drying box;
2) Determining a pulse power supply: determining the number of required cascade circuits according to test requirements, and connecting the trigger circuit and the multistage cascade circuits in series to form a pulse power supply;
3) Building a test system: placing the dried PCB test sample in an experimental box, and connecting the experimental box, a pulse power supply, an oscilloscope, a high-frequency current transformer, a flashover signal identification circuit, a singlechip latching circuit and a pulse power supply trigger control module to form a test system;
4) Testing the flashover starting voltage value: a square wave control signal is given to a pulse power supply to generate nanosecond pulse transient overvoltage, the nanosecond pulse transient overvoltage signal passes through a PCB test sample, a bus bar on the PCB test sample is subjected to flashover to form a high-frequency current signal, a high-frequency current transformer converts the high-frequency current signal into a voltage signal, the voltage signal is subjected to signal identification through a flashover signal identification circuit and generates a TTL high level, the voltage signal is output to a single chip locking circuit, the single chip locking circuit adopts an STM32L151C8T6 single chip, an I/O pin connected with the flashover signal identification circuit is set to be in an external terminal mode and is set to be in a rising edge trigger mode, when the flashover signal identification circuit outputs the TTL high level square wave signal, the I/O pin identifies an external interrupt event, and when the single chip continuously generates external interrupt for about 10 times within 100ms, the single chip is judged to be flashover; the single chip microcomputer is connected with an I/O (input/output) pin of the pulse power supply trigger control module and is set to be in an output mode, when flashover occurs, the pin immediately outputs a high-level signal which is used for controlling the pulse power supply trigger control module to stop the output of a trigger signal, so that the generation of pulse voltage is stopped; meanwhile, the single chip microcomputer is communicated with the oscilloscope through the USB communication chip CH340, when the single chip microcomputer judges that flashover occurs, an instruction is sent to enable the oscilloscope to pause, and the current pulse voltage amplitude of the oscilloscope is the flashover starting voltage value.
CN202210839938.7A 2022-07-18 2022-07-18 PCB flashover characteristic test system and method under transient overvoltage Pending CN115166454A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202210839938.7A CN115166454A (en) 2022-07-18 2022-07-18 PCB flashover characteristic test system and method under transient overvoltage

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210839938.7A CN115166454A (en) 2022-07-18 2022-07-18 PCB flashover characteristic test system and method under transient overvoltage

Publications (1)

Publication Number Publication Date
CN115166454A true CN115166454A (en) 2022-10-11

Family

ID=83494241

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202210839938.7A Pending CN115166454A (en) 2022-07-18 2022-07-18 PCB flashover characteristic test system and method under transient overvoltage

Country Status (1)

Country Link
CN (1) CN115166454A (en)

Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101056089A (en) * 2006-03-08 2007-10-17 恩益禧电子股份有限公司 Pwm current controlling apparatuses capable of optimally correcting load current
CN102435941A (en) * 2011-09-07 2012-05-02 中国电力科学研究院 Method for simulating very fast transient over-voltage during opening/closing process of isolating switch
CN103633964A (en) * 2013-02-27 2014-03-12 中国科学院电子学研究所 High-reliability large-power nanosecond narrow pulse generating circuit
CN104759352A (en) * 2015-03-20 2015-07-08 福建龙净环保股份有限公司 Electric precipitation pulse high voltage supply controller
CN105093156A (en) * 2015-08-26 2015-11-25 云南电网有限责任公司电力科学研究院 Ultrahigh frequency partial discharge detection equipment mode identification function test system and test method based on avalanche triode
CN106391314A (en) * 2016-11-16 2017-02-15 南京航空航天大学 Spark tracking control method for electrostatic precipitator
CN107727980A (en) * 2017-11-22 2018-02-23 中国人民解放军61489部队 A kind of test system for the injection test of surge protective device ultra-wideband pulse
CN108923389A (en) * 2018-06-21 2018-11-30 核工业理化工程研究院 Used in electron gun high frequency switch power supply system high pressure flashover short circuit protection system and guard method
US20200153123A1 (en) * 2018-11-14 2020-05-14 Audi Ag Method for producing a current conducting unit, junction box for a vehicle battery, and motor vehicle
CN216351134U (en) * 2021-07-02 2022-04-19 襄阳华中科技大学先进制造工程研究院 High-voltage direct-current power supply flashover detection and parameter metering system
CN114448397A (en) * 2022-01-07 2022-05-06 北京航空航天大学 Ultra-wideband low-overshoot Gaussian even pulse generation device with controllable amplitude interval and method
CN114578723A (en) * 2020-12-02 2022-06-03 现代自动车株式会社 System for identifying a controller causing a vehicle discharge

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101056089A (en) * 2006-03-08 2007-10-17 恩益禧电子股份有限公司 Pwm current controlling apparatuses capable of optimally correcting load current
CN102435941A (en) * 2011-09-07 2012-05-02 中国电力科学研究院 Method for simulating very fast transient over-voltage during opening/closing process of isolating switch
CN103633964A (en) * 2013-02-27 2014-03-12 中国科学院电子学研究所 High-reliability large-power nanosecond narrow pulse generating circuit
CN104759352A (en) * 2015-03-20 2015-07-08 福建龙净环保股份有限公司 Electric precipitation pulse high voltage supply controller
CN105093156A (en) * 2015-08-26 2015-11-25 云南电网有限责任公司电力科学研究院 Ultrahigh frequency partial discharge detection equipment mode identification function test system and test method based on avalanche triode
CN106391314A (en) * 2016-11-16 2017-02-15 南京航空航天大学 Spark tracking control method for electrostatic precipitator
CN107727980A (en) * 2017-11-22 2018-02-23 中国人民解放军61489部队 A kind of test system for the injection test of surge protective device ultra-wideband pulse
CN108923389A (en) * 2018-06-21 2018-11-30 核工业理化工程研究院 Used in electron gun high frequency switch power supply system high pressure flashover short circuit protection system and guard method
US20200153123A1 (en) * 2018-11-14 2020-05-14 Audi Ag Method for producing a current conducting unit, junction box for a vehicle battery, and motor vehicle
CN114578723A (en) * 2020-12-02 2022-06-03 现代自动车株式会社 System for identifying a controller causing a vehicle discharge
CN216351134U (en) * 2021-07-02 2022-04-19 襄阳华中科技大学先进制造工程研究院 High-voltage direct-current power supply flashover detection and parameter metering system
CN114448397A (en) * 2022-01-07 2022-05-06 北京航空航天大学 Ultra-wideband low-overshoot Gaussian even pulse generation device with controllable amplitude interval and method

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
闫家启: "双间隙伪火花开关的触发及导通特性", 《高电压技术》, 31 August 2021 (2021-08-31) *

Similar Documents

Publication Publication Date Title
CN101320068B (en) Nano-second electrostatic discharge current experiment equipment based on sheet type piezoresistor
Florkowska et al. Measurement and analysis of surface partial discharges at semi-square voltage waveforms
CN203811751U (en) Power equipment partial discharge experimental system based on comparison fitting analysis
Wei et al. Partial discharge behavior on twisted pair under ultra-short rise time square-wave excitations
CN112444700A (en) Method for testing self-healing performance of self-healing metallized film capacitor
CN108196174A (en) A kind of variable-frequency motor insulated local discharge PDIV and PDEV Auto-Test System and method
CN104360114A (en) 10 KV square-wave voltage generator for checking performance of impulse voltage divider
CN115166454A (en) PCB flashover characteristic test system and method under transient overvoltage
CN104020357A (en) Capacitance test circuit and test method under DC bias condition
CN110456123B (en) Broadband transient voltage division measuring device and method
US11227805B2 (en) System and method for surge-testing a gallium nitride transistor device
Saadati et al. Fundamental difference of partial discharge phenomena under AC and DC stresses
CN107576828B (en) Multi-switch synchronous triggering device and method for impulse voltage generator
CN111025143A (en) Bus conversion current switching test circuit device and parameter determination method thereof
CN110006325A (en) A kind of deformation of transformer winding intelligent detecting method based on frequency sweep impedance
CN112378995B (en) Electric spark generating device, energy testing device and electric spark generating system
CN113608011B (en) Direct-current high-voltage measuring device with self-calibration function and operation method thereof
Lühring et al. Influence of humidity on pulse shape parameters of positive corona discharges in air at DC voltage
CN205620343U (en) Sensitive type electromagnetic pulse protective material capability test system in field
CN110672990B (en) High-temperature gas dielectric breakdown voltage detection device and method
Dong et al. Effect of voltage waveform on partial discharge characteristics and insulation life
CN110514976B (en) GIS insulation defect monitoring device, system and detection method
Kikuchi et al. Repetitive Partial Discharge Phenomena on Electrical Motor Coil Windings under High-Repetition Nanosecond Pulsed Voltages Driven by SiC MOSFET Inverter
Petri et al. The influence of voltage form on the insulation resilience of inverter-fed low voltage traction machines with hairpin windings
Liang et al. Analysis of temperature effect on electromagnetic susceptibility of microcontroller

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination