CN104020357A - Capacitance test circuit and test method under DC bias condition - Google Patents
Capacitance test circuit and test method under DC bias condition Download PDFInfo
- Publication number
- CN104020357A CN104020357A CN201410234210.7A CN201410234210A CN104020357A CN 104020357 A CN104020357 A CN 104020357A CN 201410234210 A CN201410234210 A CN 201410234210A CN 104020357 A CN104020357 A CN 104020357A
- Authority
- CN
- China
- Prior art keywords
- impedance
- electric capacity
- over switch
- capacitance
- capacitor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
The invention discloses capacitance test circuit and test method under a DC bias condition. The circuit comprises a DC voltage stabilizing power source, an inductor, a diverter switch, a first capacitor, a second capacitor, an impedance tester and a bidirectional diverter switch. The DC voltage stabilizing power source and the inductor are connected in series and then are connected with a capacitor to be tested through the diverter switch; the first capacitor and the second capacitor are connected with the two ends of the capacitor to be tested, and the impedance tester is connected between the first capacitor and the second capacitor through the bidirectional diverter switch. The method comprises: switching on the diverter switch, connecting the bidirectional diverter switch to one end of the second capacitor, and charging the capacitor to a stable value; and then connecting the bidirectional diverter switch to the impedance tester, switching to an impedance test state, adjusting the impedance tester to obtain impedance, and then calculating to obtain the impedance of the capacitor to be tested. According to the invention, a charging process and an impedance test process can be switched, the impedance characteristics with in a wide DC bias scope and a wide frequency scope can be measured, and the impact caused by charging and discharging currents of the capacitor to the impedance tester is eliminated.
Description
Technical field
The present invention relates to capacitance test circuit and method of testing under a kind of direct current (DC) bias, belong to the technical field of Electronic Testing circuit.
Background technology
At present, being applicable to the integrated EMI filters such as plane, flexible PCB structural type and bus type under power electronics applied environment is studied widely.In integrated-type electromagnetic interface filter, electric capacity is an important component part, and high dielectric constant material is the basic material of making this type of electric capacity.In the process of the material screening, need carry out the electromagnetic property test under power electronics applied environment to material, wherein comprise the performance test under electric field, existing method of testing has several below: adopt the testing impedance instrument (for example LCR testing impedance instrument) with direct current biasing power supply directly to measure, the method can be used for the small-signal test under low direct current biasing, but its DC offset voltage is no more than 100V conventionally; Series connection bridge test method, can carry out the small-signal test under direct current biasing, test frequency lower (50Hz～10kHz), and capacitor charging electric current can be to instrument generation impact, and the instrument life-span is lower; A RCD buffer circuit method of utilizing the current-voltage waveform of capacitor charge and discharge process to calculate, this method can be carried out the large-signal test of several kV, but frequency of operation only has several hertz, and test waveform is triangular wave, the feature under can not accurate description sine wave.Thus, there is limitation in the capacitance test circuit under existing direct current biasing.
Summary of the invention
Technical matters to be solved by this invention is to overcome the deficiencies in the prior art, capacitance test circuit and method of testing under a kind of direct current (DC) bias are provided, this circuit coordinates impedance instrument, can the impedance operator of test capacitors in wide direct current (DC) bias scope and wide frequency ranges.
The present invention specifically solves the problems of the technologies described above by the following technical solutions:
Capacitance test circuit under a kind of direct current (DC) bias, comprise: D.C. regulated power supply, inductance, change-over switch, the first electric capacity and the second electric capacity, impedance instrument, two-way change-over switch, wherein said D.C. regulated power supply is connected with testing capacitance by change-over switch with after inductance series connection; One end of described the first electric capacity is connected in one end of testing capacitance, and the other end of the first electric capacity connects the input terminal of two-way change-over switch; Lead-out terminal of described two-way change-over switch connects impedance instrument, and another lead-out terminal of two-way change-over switch and impedance instrument are all connected one end of the second electric capacity; The other end of described the second electric capacity connects testing capacitance; Carry out charge or discharge by described switching switch control circuit, recycle two-way change-over switch and switch the duty of impedance instrument, record the impedance that calculates testing capacitance after the impedance of impedance instrument.
As a preferred technical solution of the present invention: also comprise the resistance for shunting and limit voltage on impedance instrument, one end of described resistance is connected in the other end of the first electric capacity, and the other end of resistance is connected in one end of the second electric capacity.
As a preferred technical solution of the present invention: described change-over switch is double pole single-throw switch.
As a preferred technical solution of the present invention: described two-way change-over switch is double-pole double-throw switch.
A method of testing for capacitance test circuit based under above-mentioned direct current (DC) bias, comprises the following steps:
Step (1), by described change-over switch closure, two-way change-over switch connects one end of the second electric capacity, utilize D.C. regulated power supply to capacitor charging to stationary value;
Step (2), more two-way change-over switch is connected to impedance instrument, switches to testing impedance state; Regulate impedance instrument to obtain the impedance of impedance instrument, and obtain the impedance of testing capacitance in conjunction with the impedance computation of described the first electric capacity and the second electric capacity.
Further, as a preferred technical solution of the present invention: obtain the impedance of testing capacitance in described step (2) according to the self discharge time of testing capacitance, be specially:
Step (21), in the time that the self discharge time of testing capacitance is greater than setting value, disconnect change-over switch, the electric capacity in circuit enters self discharge state; Under electric capacity self discharge state in circuit, calculate the impedance that obtains testing capacitance;
Step (22), in the time that the self discharge time of testing capacitance is less than setting value, change-over switch is still closed, in circuit, the voltage of electric capacity is steady state (SS); In circuit, the voltage of electric capacity is under steady state (SS), to calculate the impedance that obtains testing capacitance.
The present invention adopts technique scheme, can produce following technique effect:
Capacitance test circuit under direct current (DC) bias of the present invention and method of testing, by with coordinate impedance instrument, utilize change-over switch to cut off the connection of direct supply and testing capacitance, and utilize two-way change-over switch switch-capacitor charging process and testing impedance process, make the circuit can the impedance operator of test capacitors in wide direct current (DC) bias scope and wide frequency ranges, and then obtaining its constituent material characteristic with this understanding, test frequency is higher; Can effectively limit the impact of D.C. regulated power supply on measuring accuracy, the numerical value that test obtains is more accurate, and has eliminated the charging and discharging currents of electric capacity to the impact of impedance instrument, does not reduce the life-span of impedance instrument.Can apply to widely the capacity measurement under power electronics applied environment.
Brief description of the drawings
Fig. 1 is the circuit diagram of the capacitance test circuit under direct current (DC) bias of the present invention.
Fig. 2 is testing capacitance C in the present invention
xthe self discharge time is greater than the equivalent circuit diagram of setting value.
Fig. 3 is testing capacitance C in the present invention
xthe self discharge time is greater than the impedance computation illustraton of model of setting value.
Fig. 4 is testing capacitance C in the present invention
xthe self discharge time is less than the equivalent circuit diagram of setting value.
Fig. 5 is testing capacitance C in the present invention
xthe self discharge time is less than the impedance computation illustraton of model of setting value.
Embodiment
Below in conjunction with Figure of description, embodiments of the present invention are described.
As shown in Figure 1, the present invention has designed the capacitance test circuit under a kind of direct current (DC) bias, comprising: D.C. regulated power supply U
dC, inductance L, change-over switch K
1, the first capacitor C
awith the second capacitor C
b, impedance instrument, two-way change-over switch K
2, wherein said D.C. regulated power supply U
dCpositive terminal connect inductance L, inductance L again with change-over switch K
1terminal connect, change-over switch K
1another terminal connect testing capacitance C
xone end, testing capacitance C
xthe other end connect D.C. regulated power supply U
dCnegative pole end, i.e. D.C. regulated power supply U
dCrear by change-over switch K with inductance L series connection
1with testing capacitance C
xconnect; Described the first capacitor C
aone end be connected in testing capacitance C
xone end, the first capacitor C
athe other end connect two-way change-over switch K
2input terminal; Described two-way change-over switch K
2lead-out terminal connect impedance instrument, two-way change-over switch K
2another lead-out terminal be all connected the second capacitor C with impedance instrument
bone end; Described the second capacitor C
bthe other end connect testing capacitance C
x; Linear adjustable D.C. regulated power supply U
dCtesting capacitance C is provided
xon DC offset voltage; By described change-over switch K
1control circuit carries out charge or discharge, recycles two-way change-over switch K
2switch the duty of impedance instrument, calculate testing capacitance C after recording the impedance of impedance instrument
ximpedance.The circuit forming is thus applied between testing capacitor and testing impedance instrument, can be in the impedance operator of wide direct current (DC) bias scope and wide frequency ranges build-in test capacitor.
Further, in order to realize the shunting to electric current, can reduce voltage on impedance instrument port, also comprise a resistance R in circuit, one end of described resistance R is connected in the first capacitor C simultaneously
athe other end, the other end of resistance R is connected in the second capacitor C
bone end, resistance R is in parallel with testing impedance instrument, makes resistance R that the path of the loop current that electric capacity self discharge causes is provided, and is limited in the pressure drop producing on testing impedance instrument.
In addition, the change-over switch K in circuit
1can be for the existing switch with disconnecting circuit and closed circuit function, as relay etc., can be preferably double pole single-throw switch as shown in Figure 1, but be not limited to this kind of mode, it comprises terminal A
1, A
2, B
1, B
2with two disconnecting links, the terminal A of double pole single-throw switch
1be connected with inductance L, one of them disconnecting link of double pole single-throw switch is fixed on terminal A
1upper, terminal A
1corresponding and testing capacitance C
xone end connect terminal A
2, and the terminal B of double pole single-throw switch
1be connected to stream stabilized voltage supply U
dCnegative pole end, its another one disconnecting link is fixed on terminal B
1upper, terminal B
1corresponding and testing capacitance C
xthe other end connect terminal B
2.When double pole single-throw switch needs closure, terminal A
1and A
2be communicated with terminal B
1and B
2be communicated with, make D.C. regulated power supply U
dCwith after inductance L series connection by double pole single-throw switch and testing capacitance C
xconnect, utilize the change-over switch K of this kind of structure
1can more conveniently control.
Two-way change-over switch K in circuit
2can be for the existing switch with two-way handoff functionality, as relay etc., can be preferably double-pole double-throw switch as shown in Figure 1, but be not limited to this kind of mode, it comprises terminal A
3, A
4, A
5, B
3, B
4, B
5with two disconnecting links, the terminal A of double-pole double-throw switch
3and B
3between use wire short circuit, two disconnecting links are separately fixed at terminal A
4and B
4upper, terminal A
5and B
5for being connected to impedance instrument, in parallel with the test port of impedance instrument, utilize two disconnecting links respectively to A
3and B
3when closed, be switched to capacitor charging process, utilize two disconnecting links respectively to A
5and B
5when closed, be switched to testing impedance process.The convenient switching of two-way change-over switch that structure forms thus, rational in infrastructure simple.
The principle of this capacitance test circuit is: by the adjustable D.C. regulated power supply U of linearity
dCtesting capacitance C is provided
xon DC offset voltage; Inductance L is connected on linear adjustable D. C regulated U
dCpositive terminal and the terminal A of double pole single-throw switch
1between, provide expedite path to DC current, make linear adjustable D. C regulated U
dCvoltage can be carried in testing capacitance C completely
xupper, provide an impedance to AC signal simultaneously, realize the ac small signal testing capacitance C that flows through as much as possible of testing impedance instrument output
x, the least possible flow through linear adjustable D. C regulated U
dC; The terminal B of double pole single-throw switch
1wiring adjustable D. C regulated U
dCnegative pole end, another port A
2b
2with testing capacitance C
xparallel connection, can realize linear adjustable D. C regulated U
dCwith the access of inductance L with exit; The first capacitor C
awith the second capacitor C
bseries connection testing capacitance C
xtwo ends, and utilize and be positioned at the first capacitor C
awith the second capacitor C
bbetween double-pole double-throw switch switch the duty of impedance instrument, the first capacitor C
awith the second capacitor C
bbe used for blocking DC voltage and be loaded into impedance instrument, simultaneously for the AC test signals of impedance instrument output provides path; The resistance R in parallel with impedance instrument plays shunting action, the voltage on restriction impedance instrument test port; Two disconnecting links of double-pole double-throw switch are to terminal A
3and B
3when closed, make testing capacitance C in circuit
x, the first capacitor C
a, the second capacitor C
bcharging and to stationary value, then two of double-pole double-throw switch disconnecting links are respectively to A
5and B
5when closed, be switched to testing impedance process, impedance instrument is for calibrating terminal A
5and B
5between resulting impedance.Obtain now the first capacitor C in circuit
a, the second capacitor C
b, resistance R impedance after, by regulate impedance instrument measure the impedance Z under this state
m, finally calculate the impedance Z of testing capacitance
x.
On capacitance test circuit of the present invention basis, design the capacitance test method under a kind of direct current (DC) bias, it is based on this kind of circuit, coordinate testing impedance instrument to use, be applied between testing capacitor and testing impedance instrument, can be in the impedance operator of wide direct current (DC) bias scope and wide frequency ranges build-in test capacitor.Be divided into two kinds of tests mode, i.e. mode 1 and mode 2 according to the length of testing capacitance self discharge time.
Below according to testing capacitance C
xthe size of self discharge time constant is introduced two kinds of operation modes of this circuit.If testing capacitance C
xcapacitance be C
x, self-resistance is R
x, its self discharge timeconstantτ=R
xc
x.
If τ is >1 hour, think now testing capacitance C
xself discharge time constant larger, select mode 1, test process is as follows: change-over switch K
1, two-way change-over switch K
2all in off-state, by two-way change-over switch K
2get to A
3and B
3end, then by change-over switch K
1closure, linear adjustment adjustable D. C regulated U
dCvoltage to required test voltage value, testing capacitance C
x, the first capacitor C
a, the second capacitor C
bcharge to after stationary value, disconnect change-over switch K
1, then by two-way change-over switch K
2get to A
5and B
5end, the electric capacity in circuit enters self discharge state, regulates impedance instrument to measure the impedance Z under this state
m, as shown in Figure 2, in Fig. 2, current i is the loop current that in circuit, electric capacity self discharge causes to this equivalent electrical circuit, resistance R is in parallel with testing impedance instrument, realizes the shunting to current i, can reduce voltage on testing impedance instrument port simultaneously.Now, impedance computation illustraton of model as shown in Figure 3, Z in Fig. 3
a, Z
b, Z
rbe respectively the first capacitor C
a, the second capacitor C
bimpedance with resistance R; Z
xfor testing capacitance C
ximpedance.Through type (1) calculates the impedance Z of testing capacitance
x.
For the enough little situation of current i, in circuit, can remove resistance R, now, through type (2) calculates the impedance Z of testing capacitance
x.
Z
m＝Z
x+Z
a+Z
b (2)
If τ≤1 hour, thinks now testing capacitance C
xself discharge time constant less, select mode 2, test process is as follows: change-over switch K
1, two-way change-over switch K
2all in off-state, by two-way change-over switch K
2get to A
3and B
3end, then by change-over switch K
1closure, linear adjustment adjustable D. C regulated U
dCvoltage to required test voltage value, testing capacitance C
x, the first capacitor C
a, the second capacitor C
bcharge to after stationary value, by two-way change-over switch K switch
2get to A
5and B
5end, in circuit, the voltage of all electric capacity is steady state (SS) subsequently, then regulates impedance instrument to measure the impedance Z under this state
m, this equivalent electrical circuit as shown in Figure 4, impedance computation illustraton of model now as shown in Figure 5, Z
a, Z
b, Z
rbe respectively the first capacitor C
a, the second capacitor C
bwith the impedance of resistance R, Z in Fig. 5
lfor the impedance of inductance L.Through type (3) calculates the impedance Z of testing capacitance
x.
For the enough little situation of current i, in circuit, can remove resistance R, now, through type (4) calculates the impedance Z of testing capacitance
x.
Z
m＝Z
a+Z
b+Z
LZ
x/(Z
L+Z
x) (4)
Thus, capacitance test circuit under direct current (DC) bias of the present invention and method of testing, by with coordinate impedance instrument, utilize change-over switch switch-capacitor charging process and testing impedance process, make the circuit can the impedance operator of test capacitors in wide direct current (DC) bias scope and wide frequency ranges.
For the impedance operator of verifying that capacitance test circuit under direct current (DC) bias of the present invention and method of testing can be in wide direct current (DC) bias scope and wide frequency ranges, special with a checking example to verify.
10nF electric capacity using self discharge timeconstantτ=1 second is as a test case, and the capacitance test circuit component parameters used under described direct current (DC) bias is: inductance L is 42.9mH, the first capacitor C
a, the second capacitor C
bbe all the high pressure ceramic disc capacitor of 47nF, change-over switch K
1, two-way change-over switch K
2for small-sized machine formula switch, resistance R is 1M Ω paster type resistor, linear adjustable D. C regulated U
dCfor defeated 0 to 400V adjustable D.C. regulated power supply, impedance instrument is Agilent4395A impedance/network/spectrum analyser.D.C. regulated power supply UDC output voltage is set in to 300V, selects mode 2 to test, the test data of reading from Agilent4395A impedance/network/spectrum analyser is: frequency 150kHz, impedance 9.23-j159 Ω.Utilize formula (3) to calculate the impedance Z of testing capacitance
x=9.15-j114 Ω.
To sum up, according to above-mentioned checking example, the present invention is verified, circuit can the impedance operator of test capacitors in wide direct current (DC) bias scope and wide frequency ranges, can effectively limit the impact of D.C. regulated power supply on measuring accuracy, the numerical value that test obtains is more accurate, and has eliminated the charging and discharging currents of electric capacity to the impact of impedance instrument.
By reference to the accompanying drawings embodiments of the present invention are explained in detail above, but the present invention is not limited to above-mentioned embodiment, in the ken possessing those of ordinary skill in the art, can also under the prerequisite that does not depart from aim of the present invention, makes a variety of changes.
Claims (6)
1. the capacitance test circuit under a direct current (DC) bias, it is characterized in that, comprise: D.C. regulated power supply, inductance, change-over switch, the first electric capacity and the second electric capacity, impedance instrument, two-way change-over switch, wherein said D.C. regulated power supply is connected with testing capacitance by change-over switch with after inductance series connection; One end of described the first electric capacity is connected in one end of testing capacitance, and the other end of the first electric capacity connects the input terminal of two-way change-over switch; Lead-out terminal of described two-way change-over switch connects impedance instrument, and another lead-out terminal of two-way change-over switch and impedance instrument are all connected one end of the second electric capacity; The other end of described the second electric capacity connects testing capacitance; Carry out charge or discharge by described switching switch control circuit, recycle two-way change-over switch and switch the duty of impedance instrument, record the impedance that calculates testing capacitance after the impedance of impedance instrument.
2. the capacitance test circuit under direct current (DC) bias according to claim 1, it is characterized in that: also comprise the resistance for shunting and limit voltage on impedance instrument, one end of described resistance is connected in the other end of the first electric capacity, and the other end of resistance is connected in one end of the second electric capacity.
3. the capacitance test circuit under direct current (DC) bias according to claim 1, is characterized in that: described change-over switch is double pole single-throw switch.
4. the capacitance test circuit under direct current (DC) bias according to claim 1, is characterized in that: described two-way change-over switch is double-pole double-throw switch.
5. a method of testing for the capacitance test circuit based under direct current (DC) bias described in claim 1 to 4 any one, is characterized in that, comprises the following steps:
Step (1), by described change-over switch closure, two-way change-over switch connects one end of the second electric capacity, utilize D.C. regulated power supply to capacitor charging to stationary value;
Step (2), more two-way change-over switch is connected to impedance instrument, switches to testing impedance state; Regulate impedance instrument to obtain the impedance of impedance instrument, and obtain the impedance of testing capacitance in conjunction with the impedance computation of described the first electric capacity and the second electric capacity.
6. the capacitance test method under direct current (DC) bias according to claim 5, is characterized in that: in described step (2), obtain the impedance of testing capacitance according to the self discharge time of testing capacitance, be specially:
Step (21), in the time that the self discharge time of testing capacitance is greater than setting value, disconnect change-over switch, the electric capacity in circuit enters self discharge state; Under electric capacity self discharge state in circuit, calculate the impedance that obtains testing capacitance;
Step (22), in the time that the self discharge time of testing capacitance is less than setting value, change-over switch is still closed, in circuit, the voltage of electric capacity is steady state (SS); In circuit, the voltage of electric capacity is under steady state (SS), to calculate the impedance that obtains testing capacitance.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410234210.7A CN104020357B (en) | 2014-05-29 | 2014-05-29 | Capacitance test circuit and method of testing under a kind of Dc bias |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410234210.7A CN104020357B (en) | 2014-05-29 | 2014-05-29 | Capacitance test circuit and method of testing under a kind of Dc bias |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104020357A true CN104020357A (en) | 2014-09-03 |
| CN104020357B CN104020357B (en) | 2017-03-29 |
Family
ID=51437218
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410234210.7A Expired - Fee Related CN104020357B (en) | 2014-05-29 | 2014-05-29 | Capacitance test circuit and method of testing under a kind of Dc bias |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104020357B (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105510723A (en) * | 2016-01-28 | 2016-04-20 | 武汉理工大学 | Large capacitance capacity and internal resistance measuring device and measuring method thereof |
| CN106093641A (en) * | 2016-06-08 | 2016-11-09 | 福州大学 | The DC bias characteristics test circuit of a kind of electric capacity and method of testing |
| CN112639492A (en) * | 2019-07-24 | 2021-04-09 | 东芝三菱电机产业系统株式会社 | Capacitor diagnosis device and capacitor diagnosis method |
| TWI724955B (en) * | 2020-07-28 | 2021-04-11 | 興城科技股份有限公司 | Capacitor test system and generating device of adjustable voltage drop for micro short |
| CN113671262A (en) * | 2021-10-25 | 2021-11-19 | 电子科技大学 | Capacitance value measuring method under high-voltage environment |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1289931A (en) * | 1999-09-27 | 2001-04-04 | 林恒生 | Circuit for testing allowable current of capacitor |
| US20040027140A1 (en) * | 2002-06-25 | 2004-02-12 | Hubbell Incorporated. | Method & apparatus for testing an electrical component |
| CN101561467A (en) * | 2008-04-18 | 2009-10-21 | 英业达股份有限公司 | System and method for real-time impedance measuring |
| CN102508034A (en) * | 2011-10-25 | 2012-06-20 | 上海交通大学 | Method and device for measuring parameters of micro solid gyroscope equivalent circuit |
| US20130116956A1 (en) * | 2011-11-08 | 2013-05-09 | Hon Hai Precision Industry Co., Ltd. | Capacitance measurement circuit |
-
2014
- 2014-05-29 CN CN201410234210.7A patent/CN104020357B/en not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1289931A (en) * | 1999-09-27 | 2001-04-04 | 林恒生 | Circuit for testing allowable current of capacitor |
| US20040027140A1 (en) * | 2002-06-25 | 2004-02-12 | Hubbell Incorporated. | Method & apparatus for testing an electrical component |
| CN101561467A (en) * | 2008-04-18 | 2009-10-21 | 英业达股份有限公司 | System and method for real-time impedance measuring |
| CN102508034A (en) * | 2011-10-25 | 2012-06-20 | 上海交通大学 | Method and device for measuring parameters of micro solid gyroscope equivalent circuit |
| US20130116956A1 (en) * | 2011-11-08 | 2013-05-09 | Hon Hai Precision Industry Co., Ltd. | Capacitance measurement circuit |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105510723A (en) * | 2016-01-28 | 2016-04-20 | 武汉理工大学 | Large capacitance capacity and internal resistance measuring device and measuring method thereof |
| CN105510723B (en) * | 2016-01-28 | 2018-06-22 | 武汉理工大学 | The capacity and internal resistance measurement device and its measuring method of a kind of bulky capacitor |
| CN106093641A (en) * | 2016-06-08 | 2016-11-09 | 福州大学 | The DC bias characteristics test circuit of a kind of electric capacity and method of testing |
| CN106093641B (en) * | 2016-06-08 | 2019-02-01 | 福州大学 | A kind of the DC bias characteristics test circuit and test method of capacitor |
| CN112639492A (en) * | 2019-07-24 | 2021-04-09 | 东芝三菱电机产业系统株式会社 | Capacitor diagnosis device and capacitor diagnosis method |
| TWI724955B (en) * | 2020-07-28 | 2021-04-11 | 興城科技股份有限公司 | Capacitor test system and generating device of adjustable voltage drop for micro short |
| CN113671262A (en) * | 2021-10-25 | 2021-11-19 | 电子科技大学 | Capacitance value measuring method under high-voltage environment |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104020357B (en) | 2017-03-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104020357A (en) | Capacitance test circuit and test method under DC bias condition | |
| CN104714153B (en) | winding test device | |
| CN112540307B (en) | Military power battery charge-discharge performance test system | |
| JP2016093039A (en) | Inspection method of solar power generation system and inspection apparatus | |
| CN106093641B (en) | A kind of the DC bias characteristics test circuit and test method of capacitor | |
| CN206583938U (en) | Test switching circuit for component capacitive equipment | |
| Jie et al. | A survey of impedance measurement methods in power electronics | |
| CN111007393A (en) | High-voltage circuit breaker loop resistance test circuit | |
| CN111007424B (en) | Alternating current load system and method for simulating power factor | |
| CN113376441B (en) | System and method for measuring parasitic inductance parameters of thin film capacitor | |
| CN217521306U (en) | Insulation detection circuit for vehicle and electric vehicle | |
| CN112378995B (en) | Electric spark generating device, energy testing device and electric spark generating system | |
| CN207133322U (en) | A kind of test device | |
| CN214041542U (en) | Constant current circuit for direct current resistance tester | |
| CN108717140A (en) | High frequency electric source equipment output power test device and test method | |
| CN201583600U (en) | Device for testing the dielectric loss of high voltage transformer | |
| CN204705610U (en) | The inductance measurement device of perception resistance | |
| CN211043547U (en) | Reliability life test device for rail transit vehicle power capacitor | |
| CN114355045A (en) | High-precision GIS loop resistance testing device and method | |
| CN208847791U (en) | High frequency electric source equipment output power test device | |
| CN204241606U (en) | Detection module and pick-up unit | |
| CN110108956A (en) | A kind of dedicated high frequency electric source of the capacitor testing of wide frequency ranges and its test method | |
| CN113884967B (en) | Method and device for testing delay time of direct-current voltage transformer | |
| CN219574293U (en) | Interelectrode voltage test circuit and test system | |
| CN111487448B (en) | Circuit module for testing LCR (inductance capacitance resistance) by using alternating current signal and testing method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170329 Termination date: 20180529 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |