TWI724955B - Capacitor test system and generating device of adjustable voltage drop for micro short - Google Patents

Capacitor test system and generating device of adjustable voltage drop for micro short Download PDF

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TWI724955B
TWI724955B TW109125464A TW109125464A TWI724955B TW I724955 B TWI724955 B TW I724955B TW 109125464 A TW109125464 A TW 109125464A TW 109125464 A TW109125464 A TW 109125464A TW I724955 B TWI724955 B TW I724955B
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adjustable
voltage drop
capacitor
capacitance
electrically connected
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TW109125464A
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TW202204908A (en
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許哲嘉
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興城科技股份有限公司
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Priority to CN202110210487.6A priority patent/CN114002616A/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/28—Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform

Abstract

A generating device of adjustable voltage drop for a micro short includes a first and a second output terminals, a DC input power source having one end electrically connected to the first output terminal, and the other end connected to a ground and electrically connected to the second output terminal, a fixed capacitor having one end electrically connected to the first output terminal, an adjustable current limit resistor having one end electrically connected to the other end of the fixed capacitor, a switch having one end electrically connected to the other end of the adjustable current limit resistor, and the other end connected to the ground, and an adjustable DC voltage source having a first terminal electrically connected to the other end of the fixed capacitor, and the other end connected to the ground, and is used to generate an adjustable voltage so as to generate an adjustable voltage drop between the first output terminal and the second output terminal via adjusting the adjustable voltage.

Description

電容測試系統及可調式微短壓降產生裝置 Capacitance testing system and adjustable micro-short voltage drop generating device

本發明涉及一種電容測試系統，該系統包含一可調式微短壓降產生裝置與一電容測試裝置，其中該電容測試裝置是用於檢測一待測電容是否具有一微短路缺陷，而該可調式微短壓降產生裝置是用於產生一可調壓降，用以輸入至該電容測試裝置，以檢測該電容測試裝置是否運作正常。 The present invention relates to a capacitance testing system. The system includes an adjustable micro-short voltage drop generating device and a capacitance testing device, wherein the capacitance testing device is used to detect whether a capacitor to be tested has a micro-short defect, and the adjustable The micro-short voltage drop generating device is used to generate an adjustable voltage drop for input to the capacitance testing device to detect whether the capacitance testing device is operating normally.

目前在檢測電路板上兩根金屬線間耦合電容時，常會遭遇微短路(Micro short)的現象，即兩根相鄰金屬線間有一微小之電阻值(例如10mΩ或100mΩ)，當加上一直流電壓一段時間後，該兩相鄰金屬線有可能相互導通，而產生一電壓降，此時該兩相鄰金屬線間具有一微短路。例如，導電性陽極細絲物(CAF(Conductive Anodic Filament)，或稱陽極性玻璃纖維絲漏電現象)即為一電路板上的微短路。 At present, when detecting the coupling capacitance between two metal wires on a circuit board, a micro short is often encountered, that is, there is a small resistance value (for example, 10mΩ or 100mΩ) between two adjacent metal wires, and when one is added After the DC voltage is applied for a period of time, the two adjacent metal wires may be connected to each other, resulting in a voltage drop. At this time, there is a slight short circuit between the two adjacent metal wires. For example, a conductive anode filament (CAF (Conductive Anodic Filament), or anode glass fiber filament leakage phenomenon) is a micro short circuit on a circuit board.

用於檢測兩根金屬線間耦合電容之微短路缺陷的一電容測試裝置的重要性自不待言，但如何確保該電 容測試裝置運作正常，亦是一值得深思的問題。 It goes without saying that the importance of a capacitance testing device for detecting the micro-short-circuit defect of the coupling capacitance between two metal wires is self-evident, but how to ensure that the electrical The normal operation of the capacity test device is also a question worth pondering.

職是之故，發明人鑒於習知技術之缺失，乃思及改良發明之意念，終能發明出本案之「電容測試系統及可調式微短壓降產生裝置」。 For this reason, in view of the lack of conventional technology, the inventor thought and improved the idea of the invention, and finally invented the "capacitance test system and adjustable micro-short voltage drop generating device" of this case.

本發明的主要目的在於提供一種電容測試系統，包含一可調式微短壓降產生裝置與一電容測試裝置，其中該電容測試裝置是用以判斷一電路板的相鄰兩線路間之一耦合電容在一充電過程中，是否會產生一微小的壓降，當該耦合電容在該充電過程中產生了該微小的壓降時，則該相鄰二線路間存在一微短路的缺陷；而該可調式微短壓降產生裝置是用於產生一可調壓降，且使該電容測試裝置接收該可調壓降以檢測該電容測試裝置是否運作正常。 The main purpose of the present invention is to provide a capacitance test system, including an adjustable micro-short voltage drop generating device and a capacitance test device, wherein the capacitance test device is used to determine a coupling capacitance between two adjacent lines of a circuit board During a charging process, will a slight voltage drop be generated? When the coupling capacitor generates the slight voltage drop during the charging process, there is a short-circuit defect between the two adjacent lines; The adjustable short voltage drop generating device is used to generate an adjustable voltage drop, and the capacitance testing device receives the adjustable voltage drop to detect whether the capacitance testing device is operating normally.

本案之又一主要目的在於提供一種電容測試系統，包含一可調式微短壓降產生裝置，包括一可調限流電阻，具一第一端與一第二端，一開關，具一第一端與一第二端，其中該開關之該第二端接地，且該開關之該第一端電連接於該可調限流電阻之該第二端，一可調直流電源，具一第一端與一第二端，其中該可調直流電源的該第一端電連接於該可調限流電阻之該第一端，且該可調直流電源的該第二端接地，一固定值電容，具一第一端與一第二端，其中該固定值電容之該第二端電連接於該可調直流電源之該第一端與該可調限流電阻之該第一端，以及一直 流輸入電源，具一第一端與一第二端，其中該直流輸入電源之該第一端電連接於該固定值電容之該第一端，該直流輸入電源之該第二端接地，且該產生裝置是用於在該固定值電容之該第一端與該接地間產生一可調壓降，以及一電容測試裝置，與該可調式微短壓降產生裝置耦接，用以接收該可調壓降以檢測該電容測試裝置。 Another main purpose of this case is to provide a capacitance test system, including an adjustable short voltage drop generator, including an adjustable current limiting resistor, with a first terminal and a second terminal, a switch, and a first terminal. Terminal and a second terminal, wherein the second terminal of the switch is grounded, and the first terminal of the switch is electrically connected to the second terminal of the adjustable current limiting resistor, an adjustable DC power supply, with a first Terminal and a second terminal, wherein the first terminal of the adjustable DC power supply is electrically connected to the first terminal of the adjustable current limiting resistor, and the second terminal of the adjustable DC power supply is grounded, a fixed value capacitor , Having a first terminal and a second terminal, wherein the second terminal of the fixed value capacitor is electrically connected to the first terminal of the adjustable DC power supply and the first terminal of the adjustable current limiting resistor, and a constant The current input power source has a first terminal and a second terminal, wherein the first terminal of the DC input power source is electrically connected to the first terminal of the fixed value capacitor, and the second terminal of the DC input power source is grounded, and The generating device is used to generate an adjustable voltage drop between the first end of the fixed-value capacitor and the ground, and a capacitor testing device is coupled to the adjustable short voltage drop generating device for receiving the The voltage drop can be adjusted to detect the capacitance test device.

本案之下一主要目的在於提供一種可調式微短壓降產生裝置，包含一第一與一第二輸出端，一直流輸入電源，其一端電連接於該第一輸出端，其另一端接地且電連接於該第二輸出端，一固定值電容，其一端電連接於該第一輸出端，一可調限流電阻，其一端電連接於該固定值電容之另一端，一開關，其一端電連接於該可調限流電阻之另一端，其另一端接地，以及一可調直流電壓源，具一第一端電連接於該固定值電容之另一端，及另一端接地，且用以產生一可調電壓，俾藉調整該可調電壓，在該第一輸出端與該該第二輸出端間產生一可調壓降。 A main purpose of this case is to provide an adjustable short voltage drop generator, which includes a first output terminal and a second output terminal, a DC input power source, one end of which is electrically connected to the first output terminal, and the other end is grounded and Electrically connected to the second output end, a fixed value capacitor, one end of which is electrically connected to the first output end, an adjustable current limiting resistor, one end of which is electrically connected to the other end of the fixed value capacitor, a switch, and one end Is electrically connected to the other end of the adjustable current-limiting resistor, the other end of which is grounded, and an adjustable DC voltage source, with a first end electrically connected to the other end of the fixed value capacitor, and the other end is grounded, and used for An adjustable voltage is generated, and by adjusting the adjustable voltage, an adjustable voltage drop is generated between the first output terminal and the second output terminal.

1:電容測試系統 1: Capacitance test system

11:可調式微短壓降產生裝置 11: Adjustable micro-short pressure drop generator

12:電容檢測裝置 12: Capacitance detection device

C1:固定值電容 C 1 : fixed value capacitor

Cin:待測電容/耦合電容 C in : Capacitance to be measured/coupling capacitance

R1:第一內阻 R 1 : first internal resistance

R2:第二內阻 R 2 : second internal resistance

Rx:可調限流電阻 R x : Adjustable current limiting resistor

SW1:開關 SW 1 : switch

Vin:輸入電壓 V in : input voltage

Vout:輸出電壓 V out : output voltage

Vs:直流輸入電源 V s : DC input power

Vx:可調直流電源/可調直流電壓源 V x : adjustable DC power supply/adjustable DC voltage source

第一圖：其係顯示一依據本發明構想之較佳實施例的可調式微短壓降產生裝置之電路圖。 The first figure: It shows a circuit diagram of an adjustable short voltage drop generating device according to a preferred embodiment of the present invention.

第二圖：其係顯示一依據本發明構想之較佳實施例的電容測試裝置用於檢測一待測電容時之電路示意圖。 Figure 2: It is a schematic diagram of a circuit when the capacitance testing device according to the preferred embodiment of the present invention is used to detect a capacitance to be measured.

第三圖：其係顯示一依據本發明構想之較佳實施例 的電容測試系統之電路示意圖。 Figure 3: It shows a preferred embodiment according to the concept of the present invention Schematic diagram of the circuit of the capacitance test system.

第四圖(a)：其係顯示一依據本發明構想之較佳實施例的可調式微短壓降產生裝置於其輸出端產生一可調壓降之第一波形圖。 Figure 4 (a): It shows a first waveform diagram of an adjustable short voltage drop generating device according to a preferred embodiment of the present invention that generates an adjustable voltage drop at its output end.

第四圖(b)：其係顯示一依據本發明構想之較佳實施例的可調式微短壓降產生裝置於其輸出端產生一可調壓降之第二波形圖。 The fourth diagram (b): It shows a second waveform diagram of the adjustable short voltage drop generating device according to the preferred embodiment of the present invention that generates an adjustable voltage drop at its output end.

第一圖是顯示一依據本發明構想之較佳實施例的可調式微短壓降產生裝置之電路圖。在第一圖中，一可調式微短壓降產生裝置11包括一具一第一端與一第二端之可調限流電阻Rx，一具一第一端與一第二端之開關SW1，其中該開關SW1之該第二端接地，且該開關SW1之該第一端電連接於該可調限流電阻Rx之該第二端，一具一第一端與一第二端之可調直流電源(其為一可調直流電壓源)Vx，其中該可調直流電源Vx的該第一端電連接於該可調限流電阻Rx之該第一端，且該可調直流電源Vx的該第二端接地，一具一第一端與一第二端之固定值電容C1，其中該固定值電容C1之該第二端電連接於該可調直流電源Vx之該第一端與該可調限流電阻Rx之該第一端，以及一具一第一端與一第二端之直流輸入電源VS，其中該直流輸入電源VS之該第一端電連接於該固定值電容C1之該第一端，該直流輸入電源VS之該第二端接地，且該產生裝置11是用於 在該固定值電容C1之該第一端與該接地間產生一可調壓降。該可調壓降是一任意大小之正值，代表一電容壓降，且該電容壓降作為一電容變異檢查的一測試訊號，以測試該電容測試裝置之一運作是否正常。 The first figure is a circuit diagram showing an adjustable short voltage drop generator according to a preferred embodiment of the present invention. In the first figure, an adjustable short voltage drop generator 11 includes an adjustable current limiting resistor R x with a first terminal and a second terminal, and a switch with a first terminal and a second terminal SW 1 , wherein the second end of the switch SW 1 is grounded, and the first end of the switch SW 1 is electrically connected to the second end of the adjustable current limiting resistor R x , one having a first end and a the second end of the variable DC power supply (which is an adjustable DC voltage source) V x, wherein the first end of the adjustable electrical DC power source V x is connected to the first end of the adjustable current limiter resistor R x of and the variable DC power supply V x to the second end, a first end and a second end of a fixed value of the capacitance C 1, wherein the fixed value of the capacitance C 1 of the second terminal is electrically connected to the The first terminal of the adjustable DC power supply V x and the first terminal of the adjustable current limiting resistor R x , and a DC input power supply V S with a first terminal and a second terminal, wherein the DC input power supply The first end of V S is electrically connected to the first end of the fixed value capacitor C 1 , the second end of the DC input power supply V S is grounded, and the generating device 11 is used to connect the fixed value capacitor C 1 An adjustable voltage drop is generated between the first terminal and the ground. The adjustable voltage drop is a positive value of any magnitude, representing a capacitor voltage drop, and the capacitor voltage drop is used as a test signal for a capacitance variation check to test whether one of the capacitor test devices is operating normally.

如第一圖所示，該直流輸入電源VS具有一第一等效內阻R1，電連接於該固定值電容C1之該第一端與該直流輸入電源VS之該第一端間，該可調直流電源Vx具有一第二等效內阻R2，電連接於該固定值電容C1之該第二端與該可調直流電源Vx之該第一端間，調整該可調直流電源Vx大小以調整該電容壓降大小，該開關是一雙極電晶體(BJT)或一場效電晶體(FET)，調整該開關之一速度以調整該電容壓降之一產生速度，該可調限流電阻是用以調整該電容壓降之一訊號強弱，當該開關導通時，產生該電容壓降，且該電容壓降是該直流輸入電源與該可調直流電源間之一電壓差。 As shown in the first figure, the DC input power supply V S has a first equivalent internal resistance R 1 , which is electrically connected to the first end of the fixed-value capacitor C 1 and the first end of the DC input power V S Meanwhile, the adjustable DC power supply V x has a second equivalent internal resistance R 2 , which is electrically connected between the second end of the fixed value capacitor C 1 and the first end of the adjustable DC power supply V x to adjust The size of the adjustable DC power supply V x is used to adjust the voltage drop of the capacitor, the switch is a bipolar transistor (BJT) or a field effect transistor (FET), and one of the speeds of the switch is adjusted to adjust one of the voltage drop of the capacitor The adjustable current-limiting resistor is used to adjust the strength of a signal of the capacitor voltage drop. When the switch is turned on, the capacitor voltage drop is generated, and the capacitor voltage drop is the DC input power supply and the adjustable DC power supply One voltage difference between.

第二圖是顯示一依據本發明構想之較佳實施例的電容測試裝置用於檢測一待測電容時之電路示意圖。在第二圖中，該電容測試裝置12用於檢測一待測電容Cin。該待測電容Cin可為一電路板上兩金屬線間之一耦合電容。該待測電容Cin是並聯電連接於一直流輸入電源(提供一輸入電壓Vin)與該電容測試裝置12間。該電容測試裝置12是用以判斷一電路板的相鄰兩線路間之一耦合電容在一充電過程中，是否會產生一微小的壓降，俾據以判斷該兩線路間是否存在一微短路的缺陷。當該待測電容(例 如該耦合電容)在該充電過程中，產生該微小的壓降時，則知該兩線路間存在一微短路的缺陷。 The second figure is a schematic diagram showing a circuit diagram of a capacitance test device according to a preferred embodiment of the present invention when it is used to detect a capacitance to be measured. In the second figure, the capacitance testing device 12 is used to detect a capacitance C in to be measured. The capacitance C in to be measured can be a coupling capacitance between two metal wires on a circuit board. The capacitance C in to be measured is electrically connected in parallel between the DC input power supply (providing an input voltage V in ) and the capacitance testing device 12. The capacitance testing device 12 is used to determine whether a coupling capacitor between two adjacent lines of a circuit board generates a slight voltage drop during a charging process, so as to determine whether there is a micro short circuit between the two lines. Defects. When the capacitor under test (for example, the coupling capacitor) generates the slight voltage drop during the charging process, it is known that there is a short circuit defect between the two lines.

第三圖是顯示一依據本發明構想之較佳實施例的電容測試系統之電路示意圖。在第三圖中，該電容測試系統1包含一可調式微短壓降產生裝置11與一電容測試裝置12。當該電容測試裝置12接收該可調式微短壓降產生裝置11所產生之該電容壓降，且該電容測試裝置12輸出一高電位，代表偵測到該微短路的缺陷，則該電容測試裝置12的該運作是正常的，而當該電容測試裝置12接收該可調式微短壓降產生裝置11所產生之該電容壓降，且該電容測試裝置12輸出一低電位，代表未偵測到該微短路的缺陷，則該電容測試裝置12的該運作是不正常的。 The third figure is a schematic circuit diagram of a capacitance testing system according to a preferred embodiment of the concept of the present invention. In the third figure, the capacitance testing system 1 includes an adjustable short voltage drop generating device 11 and a capacitance testing device 12. When the capacitance testing device 12 receives the capacitance voltage drop generated by the adjustable micro-short voltage drop generating device 11, and the capacitance testing device 12 outputs a high potential, which represents the detection of the micro-short defect, the capacitance test The operation of the device 12 is normal, and when the capacitance testing device 12 receives the capacitance voltage drop generated by the adjustable short voltage drop generating device 11, and the capacitance testing device 12 outputs a low voltage, it means that it is not detected If the defect of the micro short circuit occurs, the operation of the capacitance testing device 12 is abnormal.

第四圖(a)是顯示一依據本發明構想之較佳實施例的可調式微短壓降產生裝置於其輸出端產生一可調壓降之第一波形圖。在第四圖(a)中，該可調式微短壓降產生裝置11的輸出端所產生之輸出電壓(亦即該電容壓降)Vout是模擬一待測電容在其充電過程中，於其電容跨壓持續上升的中途產生了一電壓降，其大小(或深度)為Vx。 The fourth diagram (a) is a first waveform diagram showing an adjustable short voltage drop generating device according to a preferred embodiment of the present invention that generates an adjustable voltage drop at its output end. In the fourth figure (a), the output voltage generated by the output terminal of the adjustable short voltage drop generator 11 (that is, the capacitor voltage drop) V out simulates a capacitor under test during its charging process. A voltage drop occurs in the middle of the continuous rise of the capacitor cross-voltage, and its magnitude (or depth) is V x .

第四圖(b)是顯示一依據本發明構想之較佳實施例的可調式微短壓降產生裝置於其輸出端產生一可調壓降之第二波形圖。在第四圖(b)中，該可調式微短壓降產生裝置11的輸出端所產生之輸出電壓(亦即該電容壓降)Vout是模擬一待測電容在充電至一飽和電壓之後，產 生了一電壓降，其大小(或深度)為Vx。 The fourth diagram (b) is a second waveform diagram showing an adjustable short voltage drop generating device according to a preferred embodiment of the present invention that generates an adjustable voltage drop at its output end. In the fourth diagram (b), the output voltage generated by the output terminal of the adjustable short voltage drop generator 11 (that is, the capacitor voltage drop) V out simulates a capacitor under test after being charged to a saturation voltage , Produces a voltage drop, the magnitude (or depth) of which is V x .

當然，本發明所提出之該可調式微短壓降產生裝置11亦可運用於任何需要產生一任意電壓降的其他各種應用場合中。 Of course, the adjustable short voltage drop generator 11 proposed by the present invention can also be applied to any other various applications where an arbitrary voltage drop needs to be generated.

綜上所述，本發明提供一種電容測試系統，包含一可調式微短壓降產生裝置與一電容測試裝置，其中該電容測試裝置是用以判斷一電路板的相鄰兩線路間之一耦合電容在一充電過程中，是否會產生一微小的壓降，當該耦合電容在該充電過程中產生了該微小的壓降時，則該相鄰二線路間存在一微短路的缺陷；而該可調式微短壓降產生裝置是用於產生一可調壓降，且使該電容測試裝置接收該可調壓降以檢測該電容測試裝置是否運作正常，故其確實具有新穎性與進步性。 In summary, the present invention provides a capacitance testing system including an adjustable micro-short voltage drop generating device and a capacitance testing device, wherein the capacitance testing device is used to determine the coupling between two adjacent lines of a circuit board Will the capacitor generate a slight voltage drop during a charging process? When the coupling capacitor generates the slight voltage drop during the charging process, there is a short-circuit defect between the two adjacent lines; and the The adjustable short voltage drop generating device is used to generate an adjustable voltage drop, and the capacitance testing device receives the adjustable voltage drop to detect whether the capacitance testing device is operating normally, so it is indeed novel and progressive.

是以，縱使本案已由上述之實施例所詳細敘述而可由熟悉本技藝之人士任施匠思而為諸般修飾，然皆不脫如附申請專利範圍所欲保護者。 Therefore, even though this case has been described in detail by the above-mentioned embodiments and can be modified in many ways by those familiar with the art, it does not deviate from the protection of the scope of the attached patent application.

11:可調式微短壓降產生裝置 11: Adjustable micro-short pressure drop generator

C1:固定值電容 C 1 : fixed value capacitor

R1:第一內阻 R 1 : first internal resistance

R2:第二內阻 R 2 : second internal resistance

Rx:可調限流電阻 R x : Adjustable current limiting resistor

SW1:開關 SW 1 : switch

Vout:輸出電壓 V out : output voltage

Vs:直流輸入電源 V s : DC input power

Vx:可調直流電源/可調直流電壓源 V x : adjustable DC power supply/adjustable DC voltage source

Claims (9)

一種電容測試系統，包含： A capacitance test system, including: 一可調式微短壓降產生裝置，包括： An adjustable micro-short pressure drop generating device, including: 一可調限流電阻，具一第一端與一第二端； An adjustable current limiting resistor with a first end and a second end; 一開關，具一第一端與一第二端，其中該開關之該第二端接地，且該開關之該第一端電連接於該可調限流電阻之該第二端； A switch having a first end and a second end, wherein the second end of the switch is grounded, and the first end of the switch is electrically connected to the second end of the adjustable current limiting resistor; 一可調直流電源，具一第一端與一第二端，其中該可調直流電源的該第一端電連接於該可調限流電阻之該第一端，且該可調直流電源的該第二端接地； An adjustable DC power supply has a first end and a second end, wherein the first end of the adjustable DC power supply is electrically connected to the first end of the adjustable current limiting resistor, and the adjustable DC power supply The second end is grounded; 一固定值電容，具一第一端與一第二端，其中該固定值電容之該第二端電連接於該可調直流電源之該第一端與該可調限流電阻之該第一端；以及 A fixed value capacitor having a first terminal and a second terminal, wherein the second terminal of the fixed value capacitor is electrically connected to the first terminal of the adjustable DC power source and the first terminal of the adjustable current limiting resistor End; and 一直流輸入電源，具一第一端與一第二端，其中該直流輸入電源之該第一端電連接於該固定值電容之該第一端，該直流輸入電源之該第二端接地，且該產生裝置是用於在該固定值電容之該第一端與該接地間產生一可調壓降；以及 A DC input power source having a first terminal and a second terminal, wherein the first terminal of the DC input power source is electrically connected to the first terminal of the fixed value capacitor, and the second terminal of the DC input power source is grounded, And the generating device is used to generate an adjustable voltage drop between the first terminal of the fixed value capacitor and the ground; and 一電容測試裝置，與該可調式微短壓降產生裝置耦接，用以接收該可調壓降以檢測該電容測試裝置。 A capacitance testing device is coupled to the adjustable short voltage drop generating device and used for receiving the adjustable voltage drop to detect the capacitance testing device. 如申請專利範圍第1項所述之電容測試系統，其中該可調壓降是一任意大小之正值，代表一電容壓降，且該電容壓降作為一電容變異檢查的一測試訊號，以測試該電容測試裝置之一運作是否正常。 For example, in the capacitor test system described in item 1 of the scope of patent application, the adjustable voltage drop is a positive value of any magnitude, representing a capacitor voltage drop, and the capacitor voltage drop is used as a test signal for a capacitance variation check. Test whether one of the capacitance testing devices is operating normally. 如申請專利範圍第2項所述之電容測試系統，其中該電容測試裝置是用以判斷一電路板的相鄰兩線路間之一耦合電容在一充電過程中，是否會產生一微小的壓降，俾據以判斷該兩線路間是否存在一微短路的缺陷。 The capacitance test system described in item 2 of the scope of patent application, wherein the capacitance test device is used to determine whether a coupling capacitor between two adjacent lines of a circuit board will generate a slight voltage drop during a charging process , To determine whether there is a short-circuit defect between the two lines. 如申請專利範圍第3項所述之電容測試系統，其中當該電容測試裝置感測到該耦合電容在該充電過程中產生了該微小的壓降，且該微小的壓降為一正值時，則該相鄰二線路間存在該微短路的缺陷。 The capacitance testing system described in item 3 of the scope of patent application, wherein when the capacitance testing device senses that the coupling capacitor has generated the tiny voltage drop during the charging process, and the tiny voltage drop is a positive value , Then there is the defect of the micro short circuit between the two adjacent lines. 如申請專利範圍第3項所述之電容測試系統，其中當該電容測試裝置接收該可調式微短壓降產生裝置所產生之該電容壓降，且該電容測試裝置輸出一高電位，代表偵測到該微短路的缺陷，則該電容測試裝置的該運作是正常的；以及當該電容測試裝置接收該可調式微短壓降產生裝置所產生之該電容壓降，且該電容測試裝置輸出一低電位，代表未偵測到該微短路的缺陷，則該電容測試裝置的該運作是不正常的。 The capacitance test system described in item 3 of the scope of patent application, wherein when the capacitance test device receives the capacitance voltage drop generated by the adjustable micro-short voltage drop generation device, and the capacitance test device outputs a high potential, it represents detection When the short circuit defect is detected, the operation of the capacitance test device is normal; and when the capacitance test device receives the capacitance voltage drop generated by the adjustable short voltage drop generation device, and the capacitance test device outputs A low potential means that the micro-short defect is not detected, and the operation of the capacitance testing device is abnormal. 如申請專利範圍第2項所述之電容測試系統，其中該直 流輸入電源具有一第一等效內阻，電連接於該固定值電容之該第一端與該直流輸入電源之該第一端間，該可調直流電源具有一第二等效內阻，電連接於該固定值電容之該第二端與該可調直流電源之該第一端間，調整該可調直流電源大小以調整該電容壓降大小，該開關是一雙極電晶體或一場效電晶體，調整該開關之一速度以調整該電容壓降之一產生速度，該可調限流電阻是用以調整該電容壓降之一訊號強弱，當該開關導通時，產生該電容壓降，且該電容壓降是該直流輸入電源與該可調直流電源間之一電壓差。 Such as the capacitance test system described in item 2 of the scope of patent application, wherein the direct The current input power supply has a first equivalent internal resistance, which is electrically connected between the first end of the fixed-value capacitor and the first end of the DC input power supply, and the adjustable DC power supply has a second equivalent internal resistance, Electrically connected between the second end of the fixed-value capacitor and the first end of the adjustable DC power supply, the adjustable DC power supply is adjusted to adjust the voltage drop of the capacitor, and the switch is a bipolar transistor or a field The effect transistor is to adjust a speed of the switch to adjust the generating speed of the capacitor voltage drop. The adjustable current-limiting resistor is used to adjust the signal strength of the capacitor voltage drop. When the switch is turned on, the capacitor voltage is generated And the capacitor voltage drop is a voltage difference between the DC input power supply and the adjustable DC power supply. 一種可調式微短壓降產生裝置，包含： An adjustable micro-short pressure drop generating device, including: 一第一與一第二輸出端； A first and a second output terminal; 一直流輸入電源，其一端電連接於該第一輸出端，其另一端接地且電連接於該第二輸出端； A DC input power source, one end of which is electrically connected to the first output terminal, and the other end of which is grounded and electrically connected to the second output terminal; 一固定值電容，其一端電連接於該第一輸出端； A fixed value capacitor, one end of which is electrically connected to the first output terminal; 一可調限流電阻，其一端電連接於該固定值電容之另一端； An adjustable current-limiting resistor, one end of which is electrically connected to the other end of the fixed value capacitor; 一開關，其一端電連接於該可調限流電阻之另一端，其另一端接地；以及 A switch, one end of which is electrically connected to the other end of the adjustable current limiting resistor, and the other end of which is grounded; and 一可調直流電壓源，具一第一端電連接於該固定值電容之另一端，及另一端接地，且用以產生一可調電壓，俾 藉調整該可調電壓，在該第一輸出端與該該第二輸出端間產生一可調壓降。 An adjustable DC voltage source, with a first end electrically connected to the other end of the fixed value capacitor, and the other end grounded, and used to generate an adjustable voltage, By adjusting the adjustable voltage, an adjustable voltage drop is generated between the first output terminal and the second output terminal. 如申請專利範圍第7項所述之可調式微短壓降產生裝置，其中該可調壓降是一任意大小之正值，代表一電容壓降，用以作為一電容變異檢查之一測試訊號。 The adjustable short voltage drop generator described in item 7 of the scope of patent application, wherein the adjustable voltage drop is a positive value of any magnitude, representing a capacitor voltage drop, and is used as a test signal for a capacitance variation check . 如申請專利範圍第8項所述之可調式微短壓降產生裝置，其中該直流輸入電源具有一第一等效內阻，電連接於該固定值電容之該一端與該直流輸入電源之該一端間，該可調直流電壓源具有一第二等效內阻，電連接於該固定值電容之該另一端與該可調直流電壓源之該一端間，調整該可調直流電壓源大小以調整該電容壓降大小，該開關是一雙極電晶體或一場效電晶體，調整該開關之一速度以調整該電容壓降之一產生速度，該可調限流電阻是用以調整該電容壓降之一訊號強弱，當該開關導通時，產生該電容壓降，且該電容壓降是該直流輸入電源與該可調直流電壓源間之一電壓差。 The adjustable short voltage drop generator described in item 8 of the scope of patent application, wherein the DC input power supply has a first equivalent internal resistance, and is electrically connected to the one end of the fixed value capacitor and the DC input power supply Between one end, the adjustable DC voltage source has a second equivalent internal resistance, and is electrically connected between the other end of the fixed-value capacitor and the one end of the adjustable DC voltage source to adjust the size of the adjustable DC voltage source to Adjust the voltage drop of the capacitor, the switch is a bipolar transistor or a field-effect transistor, adjust a speed of the switch to adjust a generation speed of the capacitor voltage drop, and the adjustable current-limiting resistor is used to adjust the capacitor One of the voltage drop signals is strong or weak. When the switch is turned on, the capacitor voltage drop is generated, and the capacitor voltage drop is a voltage difference between the DC input power source and the adjustable DC voltage source.
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