CN104515968B - A kind of capacitor moment open-short circuit tester calibrating installation and calibration method - Google Patents
A kind of capacitor moment open-short circuit tester calibrating installation and calibration method Download PDFInfo
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- CN104515968B CN104515968B CN201410819756.9A CN201410819756A CN104515968B CN 104515968 B CN104515968 B CN 104515968B CN 201410819756 A CN201410819756 A CN 201410819756A CN 104515968 B CN104515968 B CN 104515968B
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Abstract
The invention discloses a kind of capacitor moment open-short circuit tester calibrating installation and calibration method, it includes capacitor（3）, negative-positive-negative transistor（1）Colelctor electrode and positive-negative-positive transistor（2）Emitter stage short circuit after be drawn out to terminals B, in terminals B and positive-negative-positive transistor（2）Emitter stage between be in series with capacitor（3）, negative-positive-negative transistor（1）Emitter stage and positive-negative-positive transistor（2）Colelctor electrode short circuit be followed by earth terminal GND, negative-positive-negative transistor（1）Base stage be connected to terminals A, positive-negative-positive transistor（2）Base stage be connected to terminals C；The reference instrument that the present invention solves prior art and do not have its open circuit of special simulation or short circuit is calibrated to capacitor moment open-short circuit tester, the problems such as capacitor moment open-short circuit tester calibration difficulties.
Description
Technical field
The invention belongs to Calibration of measuring instruments technology, more particularly to a kind of capacitor moment open-short circuit tester calibrating installation
And calibration method.
Background technology
According to relevant national standard, electric capacity is when shock and vibration is tested, if the time of electric capacity moment open circuit or short circuit is small
In defined time T0When, electric capacity is qualified；If electric capacity moment opens a way or the time of short circuit is more than defined time T0When, electric capacity
It is unqualified.Capacitor moment open-short circuit instrument is to be used for testing capacitor when shock and vibration is tested, capacitor moment open circuit
Or the time of short circuit, and measurement result is judged, so that it is determined that whether surveyed electric capacity is qualified；Capacitor moment opens short-circuit survey
Try instrument main by VDCT volts ,direct-current ,test source, alternating test voltage source, capacitance open circuit detection circuit and capacitance short-circuit detection circuit etc.
Part group；VDCT volts ,direct-current ,test source provides the DC voltage needed for electric capacity；Alternating test voltage source provides less than several megahertzs
Alternating voltage；Capacitance open circuit detection circuit function is the capacitance open circuit signal and display output for detecting multiple passages；Electric capacity is short
Alignment detection circuit function is the capacitance short-circuit signal and display output for detecting multiple passages；Operation principle is：Electric capacity impact,
During vibration test, at the two ends of electric capacity simultaneously plus VDCT volts ,direct-current ,test source voltage and alternating test voltage source voltage, if electric
Appearance is working properly, and test circuit can detect d. c. voltage signal and ac voltage signal added thereon；When capacitance short-circuit,
DC voltage added by two ends is 0, and capacitance short-circuit detection electric circuit inspection goes out this short-circuit signal, and measures its short circuit duration and show
Out；Because electric capacity has the characteristic of blocking circulation exchange, when capacitance open circuit, it is added at alternating test voltage source signal thereon
In off state, capacitance open circuit detection electric circuit inspection goes out this break signal, and measures its breaking time and show.
The DC voltage exported due to capacitor moment open-short circuit tester according to the pressure-resistant difference of testing capacitor, from several volts to
Thousands of volt continuously adjustabes, when being worked due to capacitor moment open-short circuit tester, first to wanting external device to be identified, only
Have when external device is capacity cell, ability output AC/DC signal is tested electric capacity.Such as with common function or arteries and veins
When rushing generator and making standard it is calibrated, instrument None- identified, simultaneously as the high voltage of instrument output is likely to damage
Instrument；Therefore reference instrument of the prior art also without its open circuit of special simulation or short circuit is calibrated to it；Cause to electricity
The calibration difficulties of container moment open-short circuit tester.
The content of the invention
The technical problem to be solved in the present invention：A kind of capacitor moment open-short circuit tester calibrating installation and calibration side are provided
Method, does not have its open circuit of special simulation or the reference instrument of short circuit to capacitor moment open-short circuit tester to solve prior art
Calibrated, the problems such as capacitor moment open-short circuit tester calibration difficulties.
Technical solution of the present invention：
A kind of capacitor moment open-short circuit tester calibrating installation, it includes capacitor, the collection of negative-positive-negative transistor
Electrode after the emitter stage short circuit of positive-negative-positive transistor with being drawn out to terminals B, in terminals B and positive-negative-positive transistor
It is in series between emitter stage after capacitor, the emitter stage of negative-positive-negative transistor and the colelctor electrode short circuit of positive-negative-positive transistor
Earth terminal GND is connected to, the base stage of negative-positive-negative transistor is connected to terminals A, and the base stage of positive-negative-positive transistor is connected to wiring
Hold C.
Terminals A, B and C-terminal are BNC connector.
A kind of calibration method of capacitor moment open-short circuit tester calibrating installation, it opens short-circuit survey including capacitor moment
Try the short-circuit calibration method and open circuit calibration method of instrument.
The short-circuit calibration method of capacitor moment open-short circuit tester includes：
Step 1, the signal of capacitor moment open-short circuit tester output are added to B ends；
Step 2, C-terminal add a negative low level, make positive-negative-positive transistor saturation conduction；
Step 3, A ends add a pulse voltage signal；
When step 4, A ends level are negative low level, negative-positive-negative transistor cut-off, A ends level jumps to high electricity from low level
Usually, negative-positive-negative transistor saturation conduction, equivalent to capacitor short-circuit, the pulse width T of pulse voltage signal is increased
Plus, judge to exceed defined short circuit duration T when pulse width T value is detected instrument0When, this pulse width T is capacitor
The minimum short circuit duration of moment open-short circuit tester.
The open circuit calibration method of capacitor moment open-short circuit tester includes：
Step 1, the signal of capacitor moment open-short circuit tester output are added to B ends；
Step 2, A ends add a negative low level, end negative-positive-negative transistor；
Step 3, C-terminal add a pulse voltage signal；
When step 4, C-terminal low level, positive-negative-positive transistor saturation conduction, when level jumps to high level from low level,
Positive-negative-positive transistor ends, equivalent to capacitor open-circuit, by the pulse width T increases of pulse voltage signal, pulse width
T value is judged to exceed defined open circuit time T by instrument0When, this pulse width T is capacitor moment open-short circuit tester
The minimum open circuit time.
The high level is 1V, and negative low level is -1V.
The pulse voltage signal is that function generator or waveform generator are produced.
Beneficial effects of the present invention：
Simple and reliable, convenient use of the invention, passes through a capacitor, a negative-positive-negative transistor and a positive-negative-positive
Transistor is that may make up whole calibrating installation, and negative-positive-negative transistor and PNP are controlled by using pulse voltage signal
The saturation of type transistor and cut-off, simulated implementation capacitor moment open short circuit, and short circuit is opened to capacitor moment so as to realize
The minimum short circuit duration of tester and the calibration of minimum open circuit time, the present invention solve prior art do not have special simulation its
Open circuit or the reference instrument of short circuit are calibrated to capacitor moment open-short circuit tester, capacitor moment open-short circuit tester school
Accurate difficult the problems such as.
Brief description of the drawings：
Fig. 1 is schematic structural view of the invention；
Fig. 2 is the pulse voltage signal schematic diagram that function generator of the present invention or waveform generator are produced.
Embodiment：
A kind of capacitor moment open-short circuit tester calibrating installation, it includes capacitor 3, negative-positive-negative transistor 1
Colelctor electrode after the emitter stage short circuit of positive-negative-positive transistor 2 with being drawn out to terminals B, in terminals B and the pole of positive-negative-positive crystal three
Capacitor 3, the emitter stage of negative-positive-negative transistor 1 and the current collection of positive-negative-positive transistor 2 are in series between the emitter stage of pipe 2
Extremely short connect is followed by earth terminal GND, and the base stage of negative-positive-negative transistor 1 is connected to terminals A, the base of positive-negative-positive transistor 2
Pole is connected to terminals C.
Terminals A, B and C-terminal are BNC connector.
A kind of calibration method of capacitor moment open-short circuit tester calibrating installation, it opens short-circuit survey including capacitor moment
Try the short-circuit calibration method and open circuit calibration method of instrument.
The short-circuit calibration method of capacitor moment open-short circuit tester includes：
Step 1, the signal of capacitor moment open-short circuit tester output are added to B ends；
Step 2, with a D.C. regulated power supply in C-terminal negative low level is added, make the saturation conduction of positive-negative-positive transistor 2, phase
When in short circuit, positive-negative-positive transistor 2 is on electric capacity 3 without influence.
Step 3, A ends add a pulse voltage signal, and the output of 33120A type functions/AWG is connected to
A ends, produce pulse voltage signal；
When step 4, A ends do not have the output of pulse voltage signal, A ends are negative low level, and negative-positive-negative transistor 1 ends,
On electric capacity 3 without influence, A ends level from negative low level jump to high level when, the saturation conduction of negative-positive-negative transistor 1, equivalent to electricity
The short circuit of container 3, the pulse width T increases of pulse voltage signal judge to exceed rule when pulse width T value is detected instrument
Fixed short circuit duration T0When, this pulse width T is the minimum short circuit duration of capacitor moment open-short circuit tester.
The open circuit calibration method of capacitor moment open-short circuit tester includes：
Step 1, the signal of capacitor moment open-short circuit tester output are added to B ends；
Step 2, with a D.C. regulated power supply at A ends negative low level is added, end negative-positive-negative transistor 1, equivalent to
Open circuit, negative-positive-negative transistor 1 is on electric capacity 3 without influence；
Step 3, C-terminal add a pulse voltage signal, 33120A type functions/AWG output connection
To C-terminal, pulse voltage signal is produced；
When step 4, C ends do not have the output of pulse voltage signal, C-terminal is negative low level, the saturation of positive-negative-positive transistor 2
Conducting, when C-terminal level jumps to high level from negative low level, positive-negative-positive transistor 2 ends, and is opened a way equivalent to capacitor 3,
By the pulse width T increases of pulse voltage signal, pulse width T value is judged to exceed defined open circuit time T by instrument0
When, this pulse width T is the minimum open circuit time of capacitor moment open-short circuit tester.
The high level is 1V, and negative low level is -1V.
The pulse voltage signal is that function generator or waveform generator are produced, and the present embodiment is used, 33120A types
Function/arbitrary waveform generator, 33120A type functions/AWG is set：Pulse keys are pressed, make its lamp bright, amplitude
Ampl=2Vpp, direct current biasing offset=0V, high level Hilevel=1V, low level Lolevel=- 1V, period p eriod=
100s, train of pulse Burst are 1cyc, positive pulse, manually triggering.When then often pressing once triggering manually, 33120A type functions/any
It is 1V that waveform generator, which exports a high level, and low level is the -1V adjustable pulse of pulse width.
Claims (7)
1. a kind of capacitor moment open-short circuit tester calibrating installation, it includes capacitor（3）, it is characterised in that：NPN type crystal
Triode（1）Colelctor electrode be drawn out to terminals B, in terminals B and positive-negative-positive transistor（2）Emitter stage between connect
There is capacitor（3）, negative-positive-negative transistor（1）Emitter stage and positive-negative-positive transistor（2）Colelctor electrode short circuit be followed by
Earth terminal GND, negative-positive-negative transistor（1）Base stage be connected to terminals A, positive-negative-positive transistor（2）Base stage be connected to
Line end C.
2. a kind of capacitor moment open-short circuit tester calibrating installation according to claim 1, it is characterised in that：Terminals
A, B and C-terminal are BNC connector.
3. a kind of calibration method of capacitor moment open-short circuit tester calibrating installation as claimed in claim 1, it includes electricity
The short-circuit calibration method and open circuit calibration method of container moment open-short circuit tester.
4. the calibration method of capacitor moment open-short circuit tester calibrating installation according to claim 3, capacitor moment
The short-circuit calibration method of open-short circuit tester includes：
Step 1, the signal of capacitor moment open-short circuit tester output are added to B ends；
Step 2, C-terminal add a negative low level, make positive-negative-positive transistor（2）Saturation conduction；
Step 3, A ends add a pulse voltage signal；
When step 4, A ends level is negative low levels, negative-positive-negative transistor（1）Cut-off, A ends level is jumped from negative low level
During to high level, negative-positive-negative transistor（1）Saturation conduction, equivalent to capacitor（3）Short circuit, by pulse voltage signal
Pulse width T increases, judge to exceed defined short circuit duration T when pulse width T value is detected instrument0When, this pulse width T
The as minimum short circuit duration of capacitor moment open-short circuit tester；Described negative low level is -1V.
5. the calibration method of capacitor moment open-short circuit tester calibrating installation according to claim 3, capacitor moment
The open circuit calibration method of open-short circuit tester includes：
Step 1, the signal of capacitor moment open-short circuit tester output are added to B ends；
Step 2, A ends add a negative low level, make negative-positive-negative transistor（1）Cut-off；
Step 3, C-terminal add a pulse voltage signal；
When step 4, C-terminal is negative low levels, positive-negative-positive transistor（2）Saturation conduction, when level is jumped to from negative low level
During high level, positive-negative-positive transistor（2）Cut-off, equivalent to capacitor（3）Open circuit, the pulse of pulse voltage signal is wide
T increases are spent, pulse width T value is judged to exceed defined open circuit time T by instrument0When, this pulse width T is capacitor wink
Between open-short circuit tester the minimum open circuit time；The negative low level is -1V.
6. the calibration method of the capacitor moment open-short circuit tester calibrating installation according to claim 4 or 5, its feature exists
In：The high level is 1V, and negative low level is -1V.
7. the calibration method of the capacitor moment open-short circuit tester calibrating installation according to claim 4 or 5, its feature exists
In：The pulse voltage signal is that function generator or waveform generator are produced.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201410819756.9A CN104515968B (en) | 2014-12-25 | 2014-12-25 | A kind of capacitor moment open-short circuit tester calibrating installation and calibration method |
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| CN201410819756.9A CN104515968B (en) | 2014-12-25 | 2014-12-25 | A kind of capacitor moment open-short circuit tester calibrating installation and calibration method |
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| CN104515968A CN104515968A (en) | 2015-04-15 |
| CN104515968B true CN104515968B (en) | 2017-08-01 |
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Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2018018467A1 (en) * | 2016-07-27 | 2018-02-01 | 东莞市广安电气检测中心有限公司 | Method for calibrating short circuit test measurement system for electric appliance |
| CN107449934A (en) * | 2017-09-07 | 2017-12-08 | 贵州航天计量测试技术研究所 | A kind of calibrating installation and calibration method of Kindling paper burning velocity detecting system |
| CN117406158B (en) * | 2023-12-15 | 2024-04-12 | 深圳市普裕时代新能源科技有限公司 | Calibration method and device for lithium ion battery short circuit tester |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3255409A (en) * | 1962-02-19 | 1966-06-07 | Eico Electronic Instr Co Inc | Capacitance tester for performing capacitance measurements and open and short circuit tests |
| CN86206128U (en) * | 1986-08-19 | 1987-05-27 | 扬英宇 | In-circuit capacitance testor |
| CN202075366U (en) * | 2011-05-09 | 2011-12-14 | 佛山市三水日明电子有限公司 | Instantaneous open circuit and short circuit measuring apparatus |
| CN103207320A (en) * | 2012-01-17 | 2013-07-17 | 海洋王（东莞）照明科技有限公司 | Capacitor detection circuit |
| CN204302479U (en) * | 2014-12-25 | 2015-04-29 | 贵州航天计量测试技术研究所 | A kind of capacitor moment open-short circuit tester calibrating installation |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7940058B2 (en) * | 2007-05-24 | 2011-05-10 | Electro Scientific Industries, Inc. | Capacitive measurements with fast recovery current return |
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2014
- 2014-12-25 CN CN201410819756.9A patent/CN104515968B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3255409A (en) * | 1962-02-19 | 1966-06-07 | Eico Electronic Instr Co Inc | Capacitance tester for performing capacitance measurements and open and short circuit tests |
| CN86206128U (en) * | 1986-08-19 | 1987-05-27 | 扬英宇 | In-circuit capacitance testor |
| CN202075366U (en) * | 2011-05-09 | 2011-12-14 | 佛山市三水日明电子有限公司 | Instantaneous open circuit and short circuit measuring apparatus |
| CN103207320A (en) * | 2012-01-17 | 2013-07-17 | 海洋王（东莞）照明科技有限公司 | Capacitor detection circuit |
| CN204302479U (en) * | 2014-12-25 | 2015-04-29 | 贵州航天计量测试技术研究所 | A kind of capacitor moment open-short circuit tester calibrating installation |
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