CN104515968A - Calibration device for capacitor instant open/short circuit tester and calibration method - Google Patents

Calibration device for capacitor instant open/short circuit tester and calibration method Download PDF

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Publication number
CN104515968A
CN104515968A CN201410819756.9A CN201410819756A CN104515968A CN 104515968 A CN104515968 A CN 104515968A CN 201410819756 A CN201410819756 A CN 201410819756A CN 104515968 A CN104515968 A CN 104515968A
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short circuit
negative
positive
capacitor
transistor
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CN201410819756.9A
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CN104515968B (en
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瞿明生
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Guizhou Aerospace Institute of Measuring and Testing Technology
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Guizhou Aerospace Institute of Measuring and Testing Technology
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Abstract

The invention discloses a calibration device for a capacitor instant open/short circuit tester and a calibration method. The calibration device comprises a capacitor (3), wherein a collector of an NPN type triode transistor (1) and an emitter of a PNP type triode transistor (2) are in short circuit connection and then led to a terminal B; the capacitor (3) is connected in series between the terminal B and the emitter of the PNP type triode transistor (2); an emitter of the NPN type triode transistor (1) and a collector of the PNP type diode transistor (2) are in short circuit connection and then connected to a ground terminal GND; a base electrode of the NPN type triode transistor (1) is connected to a terminal A; a base electrode of the PNT type triode transistor (2) is connected to a terminal C. The calibration device disclosed by the invention solves the problems that in the prior art, the capacitor instant open/short circuit tester cannot be calibrated by a dedicated standard instrument capable of simulating the open circuit or the short circuit, and difficulty exists in calibrating the capacitor instant open/short circuit tester.

Description

A kind of capacitor moment open-short circuit tester calibrating installation and calibration steps
Technical field
The invention belongs to Calibration of measuring instruments technology, particularly relate to a kind of capacitor moment open-short circuit tester calibrating installation and calibration steps.
Background technology
According to relevant national standard, electric capacity is when shock and vibration is tested, if electric capacity is opened a way instantaneously or the time of short circuit is less than official hour T 0time, electric capacity is qualified; If electric capacity is opened a way instantaneously or the time of short circuit is greater than official hour T 0time, electric capacity is defective.Capacitor moment open-short circuit instrument is for testing capacitor when shock and vibration is tested, and capacitor is opened a way or time of short circuit instantaneously, and judges measurement result, thus determines that whether surveyed electric capacity is qualified; Capacitor moment open-short circuit tester is primarily of part groups such as VDCT volts ,direct-current ,test source, alternating test voltage source, capacitance open circuit testing circuit and capacitance short-circuit testing circuits; VDCT volts ,direct-current ,test source provides the DC voltage needed for electric capacity; Alternating test voltage source provides the alternating voltage of below a few megahertz; Capacitance open circuit testing circuit function is detect the capacitance open circuit signal of multiple passage and display translation; Capacitance short-circuit testing circuit function is detect the capacitance short-circuit signal of multiple passage and display translation; Principle of work is: electric capacity is when shock and vibration is tested, add VDCT volts ,direct-current ,test source voltage and alternating test voltage source voltage at the two ends of electric capacity simultaneously, if electric capacity is working properly, test circuit can detect d. c. voltage signal added on it and ac voltage signal; When capacitance short-circuit, the DC voltage added by two ends is 0, and capacitance short-circuit testing circuit detects this short-circuit signal, and measures its short circuit duration and show; Because electric capacity has stopping direct current to lead to the characteristic of interchange, when capacitance open circuit, the alternating test voltage source signal added thereon is in off state, and capacitance open circuit testing circuit detects this chopping signal, and measures its breaking time and show.
Because the DC voltage of capacitor moment open-short circuit tester output is according to the withstand voltage difference of testing capacitor, from a few volt to thousands of volt continuously adjustabe, during due to capacitor moment open-short circuit tester work, first to wanting external device to identify, only have when external device is capacity cell, just output AC/DC signal, tests electric capacity.As do with common function or pulse producer standard it is calibrated time, instrument None-identified, meanwhile, due to instrument export high voltage probably damage instrument; Therefore prior art does not also have the reference instrument of its open circuit of special simulation or short circuit to calibrate it; Cause the calibration difficulties to capacitor moment open-short circuit tester.
Summary of the invention
The technical problem to be solved in the present invention: a kind of capacitor moment open-short circuit tester calibrating installation and calibration steps are provided, the reference instrument of its open circuit of special simulation or short circuit is not had to calibrate capacitor moment open-short circuit tester to solve prior art, the problems such as capacitor moment open-short circuit tester calibration difficulties.
Technical solution of the present invention:
A kind of capacitor moment open-short circuit tester calibrating installation, it comprises capacitor, terminals B is drawn out to after the collector of negative-positive-negative transistor and the emitter short circuit of positive-negative-positive transistor, capacitor is in series with between terminals B and the emitter of positive-negative-positive transistor, earth terminal GND is received after the emitter of negative-positive-negative transistor and the collector short circuit of positive-negative-positive transistor, the base stage of negative-positive-negative transistor receives terminals A, and the base stage of positive-negative-positive transistor receives terminals C.
Terminals A, B and C end is BNC connector.
A calibration steps for capacitor moment open-short circuit tester calibrating installation, it comprises short circuit calibration steps and the open circuit calibration steps of capacitor moment open-short circuit tester.
The short circuit calibration steps of capacitor moment open-short circuit tester comprises:
The signal that step 1, capacitor moment open-short circuit tester exports is added to B end;
Step 2, C end add a negative low level, make positive-negative-positive transistor saturation conduction;
Step 3, A end adds a monopulse voltage signal;
When step 4, A hold level for negative low level, negative-positive-negative transistor ends, when A holds level to jump to high level from low level, negative-positive-negative transistor saturation conduction, be equivalent to capacitor short-circuit, the pulse width T of monopulse voltage signal is increased, when the value of pulse width T is detected the short circuit duration T that instrument judges to exceed regulation 0time, this pulse width T is the minimum short circuit duration of capacitor moment open-short circuit tester.
The open circuit calibration steps of capacitor moment open-short circuit tester comprises:
The signal that step 1, capacitor moment open-short circuit tester exports is added to B end;
Step 2, A end add a negative low level, negative-positive-negative transistor is ended;
Step 3, C end add a monopulse voltage signal;
During step 4, C end low level, positive-negative-positive transistor saturation conduction, when level jumps to high level from low level, positive-negative-positive transistor ends, be equivalent to capacitor open-circuit, the pulse width T of monopulse voltage signal increased, the value of pulse width T is judged by instrument the open circuit time T exceeding regulation 0time, this pulse width T is the minimum open circuit time of capacitor moment open-short circuit tester.
Described high level is 1V, and negative low level is-1V.
Described monopulse voltage signal is that function generator or waveform generator produce.
Beneficial effect of the present invention:
The present invention is simple and reliable, easy to use, by a capacitor, a negative-positive-negative transistor and a positive-negative-positive transistor can form whole calibrating installation, by the saturated and cut-off adopting pulse voltage signal to control negative-positive-negative transistor and positive-negative-positive transistor, simulated implementation capacitor opens short circuit instantaneously, thus the minimum short circuit duration realized capacitor moment open-short circuit tester and the calibration of minimum open circuit time, the invention solves prior art does not have the reference instrument of its open circuit of special simulation or short circuit to calibrate capacitor moment open-short circuit tester, the problems such as capacitor moment open-short circuit tester calibration difficulties.
accompanying drawing illustrates:
Fig. 1 is structural representation of the present invention;
Fig. 2 is the monopulse voltage signal schematic diagram that function generator of the present invention or waveform generator produce.
embodiment:
A kind of capacitor moment open-short circuit tester calibrating installation, it comprises capacitor 3, terminals B is drawn out to after the collector of negative-positive-negative transistor 1 and the emitter short circuit of positive-negative-positive transistor 2, capacitor 3 is in series with between terminals B and the emitter of positive-negative-positive transistor 2, earth terminal GND is received after the emitter of negative-positive-negative transistor 1 and the collector short circuit of positive-negative-positive transistor 2, the base stage of negative-positive-negative transistor 1 receives terminals A, and the base stage of positive-negative-positive transistor 2 receives terminals C.
Terminals A, B and C end is BNC connector.
A calibration steps for capacitor moment open-short circuit tester calibrating installation, it comprises short circuit calibration steps and the open circuit calibration steps of capacitor moment open-short circuit tester.
The short circuit calibration steps of capacitor moment open-short circuit tester comprises:
The signal that step 1, capacitor moment open-short circuit tester exports is added to B end;
Step 2, with a D.C. regulated power supply C end add negative low level, make positive-negative-positive transistor 2 saturation conduction, be equivalent to short circuit, positive-negative-positive transistor 2 on electric capacity 3 without impact.
Step 3, A end adds a monopulse voltage signal, and the output of 33120A type function/AWG (Arbitrary Waveform Generator) is connected to A end, produces monopulse voltage signal;
When step 4, A end does not have monopulse voltage signal to export, A end is negative low level, negative-positive-negative transistor 1 ends, on electric capacity 3 without impact, when A holds level to jump to high level from negative low level, negative-positive-negative transistor 1 saturation conduction, is equivalent to capacitor 3 short circuit, the pulse width T of monopulse voltage signal is increased, when the value of pulse width T is detected the short circuit duration T that instrument judges to exceed regulation 0time, this pulse width T is the minimum short circuit duration of capacitor moment open-short circuit tester.
The open circuit calibration steps of capacitor moment open-short circuit tester comprises:
The signal that step 1, capacitor moment open-short circuit tester exports is added to B end;
Step 2, with a D.C. regulated power supply A end add negative low level, negative-positive-negative transistor 1 is ended, be equivalent to open circuit, negative-positive-negative transistor 1 on electric capacity 3 without impact;
Step 3, add a monopulse voltage signal at C end, the output of 33120A type function/AWG (Arbitrary Waveform Generator) is connected to C end, produces monopulse voltage signal;
When step 4, C end does not have monopulse voltage signal to export, C end is negative low level, positive-negative-positive transistor 2 saturation conduction, when C holds level to jump to high level from negative low level, positive-negative-positive transistor 2 ends, be equivalent to capacitor 3 open a way, the pulse width T of monopulse voltage signal increased, the value of pulse width T is judged by instrument the open circuit time T exceeding regulation 0time, this pulse width T is the minimum open circuit time of capacitor moment open-short circuit tester.
Described high level is 1V, and negative low level is-1V.
Described monopulse voltage signal is that function generator or waveform generator produce, and the present embodiment adopts, 33120A type function/AWG (Arbitrary Waveform Generator), 33120A type function/AWG (Arbitrary Waveform Generator) is arranged: press pulse key, make its lamp bright, amplitude A mpl=2Vpp, direct current biasing offset=0V, high level Hilevel=1V, low level Lolevel=-1V, period p eriod=100s, train of impulses Burst is 1cyc, positive pulse, manual triggers.Time then often by a manual triggers, it is 1V that 33120A type function/AWG (Arbitrary Waveform Generator) exports a high level, and low level is the adjustable monopulse of the pulse width of-1V.

Claims (7)

1. a capacitor moment open-short circuit tester calibrating installation, it comprises capacitor (3), it is characterized in that: after the collector of negative-positive-negative transistor (1) and the emitter short circuit of positive-negative-positive transistor (2), be drawn out to terminals B, capacitor (3) is in series with between terminals B and the emitter of positive-negative-positive transistor (2), earth terminal GND is received after the emitter of negative-positive-negative transistor (1) and the collector short circuit of positive-negative-positive transistor (2), the base stage of negative-positive-negative transistor (1) receives terminals A, the base stage of positive-negative-positive transistor (2) receives terminals C.
2. a kind of capacitor moment open-short circuit tester calibrating installation according to claim 1, is characterized in that: terminals A, B and C end is BNC connector.
3. a calibration steps for capacitor moment open-short circuit tester calibrating installation, it comprises short circuit calibration steps and the open circuit calibration steps of capacitor moment open-short circuit tester.
4. the calibration steps of capacitor moment open-short circuit tester calibrating installation according to claim 3, the short circuit calibration steps of capacitor moment open-short circuit tester comprises:
The signal that step 1, capacitor moment open-short circuit tester exports is added to B end;
Step 2, C end add a negative low level, make positive-negative-positive transistor (2) saturation conduction;
Step 3, A end adds a monopulse voltage signal;
When step 4, A hold level for negative low level, negative-positive-negative transistor (1) ends, when A holds level to jump to high level from low level, negative-positive-negative transistor (1) saturation conduction, be equivalent to capacitor (3) short circuit, the pulse width T of monopulse voltage signal is increased, when the value of pulse width T is detected the short circuit duration T that instrument judges to exceed regulation 0time, this pulse width T is the minimum short circuit duration of capacitor moment open-short circuit tester.
5. the calibration steps of capacitor moment open-short circuit tester calibrating installation according to claim 3, the open circuit calibration steps of capacitor moment open-short circuit tester comprises:
The signal that step 1, capacitor moment open-short circuit tester exports is added to B end;
Step 2, A end add a negative low level, negative-positive-negative transistor (1) is ended;
Step 3, C end add a monopulse voltage signal;
During step 4, C end low level, positive-negative-positive transistor (2) saturation conduction, when level jumps to high level from low level, positive-negative-positive transistor (2) ends, be equivalent to capacitor (3) open circuit, the pulse width T of monopulse voltage signal increased, the value of pulse width T is judged by instrument the open circuit time T exceeding regulation 0time, this pulse width T is the minimum open circuit time of capacitor moment open-short circuit tester.
6. the calibration steps of the capacitor moment open-short circuit tester calibrating installation according to claim 4 or 5, it is characterized in that: described high level is 1V, negative low level is-1V.
7. the calibration steps of the capacitor moment open-short circuit tester calibrating installation according to claim 4 or 5, is characterized in that: described monopulse voltage signal is that function generator or waveform generator produce.
CN201410819756.9A 2014-12-25 2014-12-25 A kind of capacitor moment open-short circuit tester calibrating installation and calibration method Active CN104515968B (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107449934A (en) * 2017-09-07 2017-12-08 贵州航天计量测试技术研究所 A kind of calibrating installation and calibration method of Kindling paper burning velocity detecting system
WO2018018467A1 (en) * 2016-07-27 2018-02-01 东莞市广安电气检测中心有限公司 Method for calibrating short circuit test measurement system for electric appliance
CN117406158A (en) * 2023-12-15 2024-01-16 深圳市普裕时代新能源科技有限公司 Calibration method and device for lithium ion battery short circuit tester

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US3255409A (en) * 1962-02-19 1966-06-07 Eico Electronic Instr Co Inc Capacitance tester for performing capacitance measurements and open and short circuit tests
CN86206128U (en) * 1986-08-19 1987-05-27 扬英宇 In-circuit capacitance testor
US20080290879A1 (en) * 2007-05-24 2008-11-27 Electro Scientific Industries, Inc. Capacitive measurements with fast recovery current return
CN202075366U (en) * 2011-05-09 2011-12-14 佛山市三水日明电子有限公司 Instantaneous open circuit and short circuit measuring apparatus
CN103207320A (en) * 2012-01-17 2013-07-17 海洋王(东莞)照明科技有限公司 Capacitor detection circuit
CN204302479U (en) * 2014-12-25 2015-04-29 贵州航天计量测试技术研究所 A kind of capacitor moment open-short circuit tester calibrating installation

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3255409A (en) * 1962-02-19 1966-06-07 Eico Electronic Instr Co Inc Capacitance tester for performing capacitance measurements and open and short circuit tests
CN86206128U (en) * 1986-08-19 1987-05-27 扬英宇 In-circuit capacitance testor
US20080290879A1 (en) * 2007-05-24 2008-11-27 Electro Scientific Industries, Inc. Capacitive measurements with fast recovery current return
CN202075366U (en) * 2011-05-09 2011-12-14 佛山市三水日明电子有限公司 Instantaneous open circuit and short circuit measuring apparatus
CN103207320A (en) * 2012-01-17 2013-07-17 海洋王(东莞)照明科技有限公司 Capacitor detection circuit
CN204302479U (en) * 2014-12-25 2015-04-29 贵州航天计量测试技术研究所 A kind of capacitor moment open-short circuit tester calibrating installation

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018018467A1 (en) * 2016-07-27 2018-02-01 东莞市广安电气检测中心有限公司 Method for calibrating short circuit test measurement system for electric appliance
GB2555888A (en) * 2016-07-27 2018-05-16 Dongguan Guang An Electrical Testing Centre Co Ltd Method for calibrating short circuit test measurement system for electric appliance
GB2555888B (en) * 2016-07-27 2022-01-05 Dongguan Guang An Electrical Testing Centre Co Ltd Method for calibrating electrical equipment short-circuit test measuring systems
CN107449934A (en) * 2017-09-07 2017-12-08 贵州航天计量测试技术研究所 A kind of calibrating installation and calibration method of Kindling paper burning velocity detecting system
CN117406158A (en) * 2023-12-15 2024-01-16 深圳市普裕时代新能源科技有限公司 Calibration method and device for lithium ion battery short circuit tester
CN117406158B (en) * 2023-12-15 2024-04-12 深圳市普裕时代新能源科技有限公司 Calibration method and device for lithium ion battery short circuit tester

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