CN109342939A - The actuation release time calibrating installation and method of relay synthetic parameter test system - Google Patents
The actuation release time calibrating installation and method of relay synthetic parameter test system Download PDFInfo
- Publication number
- CN109342939A CN109342939A CN201811444944.2A CN201811444944A CN109342939A CN 109342939 A CN109342939 A CN 109342939A CN 201811444944 A CN201811444944 A CN 201811444944A CN 109342939 A CN109342939 A CN 109342939A
- Authority
- CN
- China
- Prior art keywords
- negative
- test system
- relay
- parameter test
- function
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 118
- 238000009434 installation Methods 0.000 title claims abstract description 42
- 238000000034 method Methods 0.000 title claims abstract description 30
- 210000004899 c-terminal region Anatomy 0.000 claims abstract description 4
- 238000005259 measurement Methods 0.000 claims description 21
- 239000013078 crystal Substances 0.000 claims description 9
- 230000001105 regulatory effect Effects 0.000 claims description 6
- 230000000630 rising effect Effects 0.000 claims description 6
- 230000003111 delayed effect Effects 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 10
- 238000012546 transfer Methods 0.000 description 8
- 239000000523 sample Substances 0.000 description 3
- 238000000691 measurement method Methods 0.000 description 2
- 229920006395 saturated elastomer Polymers 0.000 description 2
- 241000208340 Araliaceae Species 0.000 description 1
- 235000005035 Panax pseudoginseng ssp. pseudoginseng Nutrition 0.000 description 1
- 235000003140 Panax quinquefolius Nutrition 0.000 description 1
- 230000003796 beauty Effects 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 235000008434 ginseng Nutrition 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
- G01R31/3278—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches of relays, solenoids or reed switches
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
Abstract
The invention discloses a kind of actuation release time calibrating installation of relay synthetic parameter test system and methods, it includes single-pole double throw switch, and the end of convert B of double-throw switch is drawn out to terminals A；The end D of single-pole double throw switch is drawn out to the base stage of the first negative-positive-negative transistor；The C-terminal of single-pole double throw switch is drawn out to the base stage of the second negative-positive-negative transistor, and the collector of the first negative-positive-negative transistor is drawn out to terminals E；The collector of second negative-positive-negative transistor is drawn out to terminals F；The emitter of first negative-positive-negative transistor is drawn out to ground terminal GND；The emitter of second negative-positive-negative transistor is drawn out to ground terminal GND；The time interval to be calibrated point cannot accurately be set by solving the prior art, to cause calibrated point that cannot cover the problem of entire range ability.Existing calibration method precision is not high simultaneously, is unable to the problems such as meet volume biography requires.
Description
Technical field
The invention belongs to Calibration of measuring instruments technologies more particularly to a kind of actuation of relay synthetic parameter test system to release
Put time calibration device and method.
Background technique
Relay synthetic parameter test system mainly by time measuring unit, power supply, test fixture, resistance measurement unit,
The part such as voltage measurement unit, current measuring unit, coil power and computer forms.When actuation for busy relay
Between, release time, coil resistance, contact resistance, voltage, the multi-parameters such as electric current integrated test system.
Relay synthetic joins test system and test relay-operating time and the working principle such as specification of release time is attached
Shown in Fig. 1.Left side dotted line frame is relay synthetic parameter test system, and the right dotted line frame is measured relay.By relay
Transfer contact, normally-closed contact and normally opened contact are connected respectively to the corresponding end of convert of relay synthetic parameter test system, normally closed
End and normally open end.The winding wiring of relay terminates to the coil power end of relay synthetic parameter test system.
If voltage rating needed for relay coil is V1, normal-closed end be V to the voltage of end of convert2, normally open end is to end of convert
Voltage be V3, relay synthetic parameter test system coil power end output voltage be V4。
Pickup time measurement method is as follows: setting relay synthetic parameter test system is pickup time to measure function, is opened
Dynamic measurement.The voltage rating V needed for the coil power end output relay coil of relay synthetic parameter test system1When,
Relay coil is powered, and relay synthetic parameter examining system starts timing, after a period of time, transfer contact and normally opened contact
Closure, relay synthetic parameter test system stop timing, this interval of time is known as the pickup time of relay.
Release time measurement method is as follows:
It is to measure function release time that relay synthetic parameter test system, which is arranged, starting measurement.Testing sequence is: first
First, voltage rating V needed for the coil power end output relay coil of relay synthetic parameter test system1, relay leads
Logical, transfer contact and normally opened contact are closures.When the coil that the coil power end of relay synthetic parameter test system exports
Voltage rating is by V1It when jump is 0V, i.e., is powered off to relay coil, relay synthetic parameter test system starts timing, passes through
After a period of time, transfer contact and normally-closed contact are connected, and relay synthetic parameter test system stops timing, between this period of time
Every the release time of referred to as relay.
Currently, relay synthetic parameter test system belongs to special test equipment, it is carried out to calibrate dedicated not yet
Calibrating installation.A kind of existing calibration method connection block diagram is as shown in Figure of description 2.2, left side dotted line frame is respectively relay
Device comprehensive parameter testing system and oscillograph, the right dotted line frame are measured relay.
The coil power end of relay synthetic parameter test system is connected to the logical of oscillograph with oscillograph voltage probe
On road 1；The transfer contact of relay and normally opened contact are connected on the channel 2 of oscillograph with oscillograph voltage probe；It will be after
The transfer contact of electric appliance and normally-closed contact are connected on the channel 3 of oscillograph with oscillograph voltage probe.Calibration method is as follows:
Pickup time calibration:
It is to measure function time of closing contact that relay synthetic parameter test system, which is arranged, starting measurement, when relay is comprehensive
Voltage rating needed for closing the relay coil of the coil power end output of parameter test system is V1When, the channel 1 of oscillograph
In t1Moment measures waveform, and after relay power, after a period of time, normally opened contact is closed, the channel 2 of oscillograph is in t2Moment
Waveform is measured, as shown in Figure of description 3.The pickup time that oscillograph measures is T0=t2-t1, meanwhile, relay synthetic parameter
The pickup time that test macro measures is T, and pickup time measurement error is calculated by formula (1):
Δ T=T-T0 (1)
In formula: Δ T-pickup time measurement error, unit: s；
The pickup time that T-relay synthetic parameter test system measures, unit: s；
T0The pickup time that-oscillograph measures, unit: s.
Release time calibration:
It is to measure function release time that relay synthetic parameter test system, which is arranged, and starting measurement, testing sequence is: first
First, voltage rating V needed for the coil power end output relay coil of relay synthetic parameter test system1, relay leads
Logical, transfer contact and normally opened contact are closures.When the coil that the coil power end of relay synthetic parameter test system exports
Voltage rating is by V1When jump is 0V, i.e., powered off to relay coil, the channel 1 of oscillograph is in t1Moment measures waveform, by one
After the section time, transfer contact and normally-closed contact are connected, and the channel 3 of oscillograph is in t2Moment measures waveform, such as 4 institute of Figure of description
Show.The release time that oscillograph measures is T0=t2-t1, meanwhile, the release time that relay synthetic parameter test system measures is
T, release time measurement error are calculated by formula (2):
Δ T=T-T0 (2)
In formula: Δ T-release time measurement error, unit: s；
The release time that T-relay synthetic parameter test system measures, unit: s；
T0The release time that-oscillograph measures, unit: s.
The difficult point of this calibration method is: due to calibration time interval point by relay pickup time and release when
Between determined, and the pickup time and release time of each type of relay are fixed, thus cannot accurately set will school
Quasi- time interval point, such as 0.1ms, 1ms, 10ms, especially relay synthetic parameter test system time measurement it is upper
Limit and lower limit, to cause calibrated point that cannot cover entire range ability.Meanwhile there is also surveyed with oscillograph for this method
When measuring time interval, resolution ratio is not high, and oscilloprobe has interference etc. to relay synthetic parameter test system, to cause school
Quasi- precision is not high, is unable to the problems such as meet volume biography requires.
Currently, the pickup time of typical relay synthetic parameter test system and the major technique of release time measurement refer to
It is designated as: reference time measurement: 10 μ s~200ms, the limits of error: ± 0.1%；Contact load: there are 6V/10mA, 6V/
A variety of gears such as 100mA, 28V/10mA, 28V/100mA.It is illustrated for the meaning represented by the contact load 6V/10mA:
It is voltage source, and supply voltage 6V, internal resistance is 6V/10mA=600 Ω, has both made power supply external short circuit, maximum current is
10mA.According to relay contact size of current, suitable gear is selected, the contact of relay will not be damaged.It is added to relay
Contact on, when relay be attracted or disconnect when, contact contact or disconnect, the relevant parameter of measuring relay.
Summary of the invention
The technical problem to be solved in the present invention: a kind of actuation release time school of relay synthetic parameter test system is provided
Standard apparatus and method cannot accurately set the time interval to be calibrated point, especially relay synthetic ginseng to solve the prior art
The bound of the time measurement of number test macros, to cause calibrated point that cannot cover the problem of entire range ability.Together
Shi Xianyou calibration method precision is not high, is unable to the problems such as meet volume biography requires.
Technical solution of the present invention
A kind of actuation release time calibrating installation of relay synthetic parameter test system, it includes single-pole double throw switch,
The end of convert B of single-pole double throw switch is drawn out to terminals A；The end D of single-pole double throw switch is drawn out to the first negative-positive-negative transistor
Base stage；The C-terminal of single-pole double throw switch is drawn out to the base stage of the second negative-positive-negative transistor, the first negative-positive-negative transistor
Collector is drawn out to terminals E；The collector of second negative-positive-negative transistor is drawn out to terminals F；First NPN type crystal three
The emitter of pole pipe is drawn out to ground terminal GND；The emitter of second negative-positive-negative transistor is drawn out to ground terminal GND.
Described terminals A, E and F are BNC connector.
The anode and function at relay synthetic parameter test system coil power end or the external trigger of arbitrary waveform generator
Input terminal is connected；The normally open end of relay synthetic parameter test system is connected with the end F of calibrating installation；Relay synthetic parameter is surveyed
The normal-closed end of test system is connected with the end E of calibrating installation；The end A of the output end and calibrating installation of function or arbitrary waveform generator
It is connected.
The internal crystal oscillator of function or arbitrary waveform generator is replaced with external with reference to frequency marking.
The calibration method of the actuation release time calibrating installation of the relay synthetic parameter test system, it includes inhaling
The calibration method and the calibration method of release time of time are closed, the calibration method of the pickup time includes:
The single-pole double throw switch of calibrating installation is got to location of C by step 1；
Step 2, setting function or arbitrary waveform generator are external trigger, and along being rising edge, the trigger delay time is for triggering
T0；
Step 3, according to function or the area requirement of arbitrary waveform generator external trigger input voltage, regulating relay is comprehensive
The voltage V of parameter test system coil power end output4, make voltage V4Meet area requirement；
Step 4, setting function or arbitrary waveform generator output waveform are impulse wave, period T1, pulse width Tw,
T1And TwSelection principle be: T1Compare TwGreatly, TwCan make calibrating installation two reliable saturation conductions of negative-positive-negative transistor and
Cut-off；The low level of impulse wave is -1V, high level 1V, opens the train of pulse function of function or arbitrary waveform generator, pulse
String is set as 1；
Step 5, setting relay synthetic parameter test system are to measure function pickup time, and relay is worked as in starting measurement
The coil power end output voltage V of comprehensive parameter testing system4When, relay synthetic parameter test system starts timing, simultaneously
Trigger function or arbitrary waveform generator, delayed time T0Afterwards, 1 is exported from function or the output end of arbitrary waveform generator
Single pulse signal reaches the base of the second negative-positive-negative transistor after terminal A, the terminal B of single-pole double throw switch and endpoint C
Pole makes the second negative-positive-negative transistor saturation conduction；The then normally opened terminal shortcircuit of relay synthetic parameter test system, relay
Comprehensive parameter testing system stops timing；The pickup time measured such as relay synthetic parameter test system is T, then pickup time
The error of calibration: Δ T=T-T0。
The calibration method of release time includes:
The single-pole double throw switch of calibrating installation is got to the position D by step 1；
Step 2, setting function or arbitrary waveform generator are external trigger, and along being failing edge, the trigger delay time is for triggering
T0；
Step 3, according to function or the area requirement of arbitrary waveform generator external trigger input voltage, regulating relay is comprehensive
The voltage V of parameter test system coil power end output4, make voltage V4Meet area requirement；
Step 4, setting function or arbitrary waveform generator output waveform are impulse wave, period T1, pulse width is
Tw, T1And TwSelection principle be: T1Compare TwGreatly, TwIt can make 2 reliable saturation conductions of negative-positive-negative transistor of calibrating installation
And cut-off；The low level of impulse wave is -1V, high level 1V, opens the train of pulse function of function generator, train of pulse is set as 1
It is a；
Step 5, setting relay synthetic parameter test system are to measure function release time, starting measurement, testing sequence
It is: firstly, by the coil power end output voltage V of relay synthetic parameter test system4, when coil power end output voltage
By V4When jump is 0V, relay synthetic parameter test system starts timing, while triggering function or arbitrary waveform generator, warp
Delay time T0Afterwards, 1 single pulse signal is exported from function or the output end of arbitrary waveform generator, through terminal A, single-pole double throw
After the terminal B and endpoint D of switch, the base stage of the first negative-positive-negative transistor is reached, is saturated the first negative-positive-negative transistor
Conducting, the then normally closed terminal shortcircuit of relay synthetic parameter test system, relay synthetic parameter test system stop timing, such as after
The release time that electric appliance comprehensive parameter testing system measures is T, then the error of release time calibration are as follows: Δ T=T-T0The present invention
The utility model has the advantages that
The present invention is simple and reliable, easy to use；It can structure by 1 single-pole double throw switch and 2 negative-positive-negative transistors
At calibrating installation.Using the external trigger delay feature of function/arbitrary waveform generator, by relay synthetic parameter test system line
Enclose the accurate delay time T of coil voltage signal of power end output0Afterwards, go triggering function/arbitrary waveform generator, function/
Arbitrary waveform generator exports a pulse voltage signal, goes the saturation of 2 negative-positive-negative transistors of control calibrating installation
On and off comes the pickup time and release time of accurate analogue relay, to realize to relay synthetic parameter testing
The calibration of system pickup time and release time.The present invention, which solves the prior art, cannot accurately set the time interval to be calibrated
The bound of the time measurement of point, especially relay synthetic parameter test system, to cause calibrated point that cannot cover
The problem of entire range ability.Existing calibration method precision is not high simultaneously, is unable to the problems such as meet volume biography requires.Such as with high-precision
It is external with reference to frequency marking replace function/arbitrary waveform generator internal crystal oscillator, can greatly improve delay time output precision.
Detailed description of the invention:
Fig. 1 is the pickup time of prior art relay synthetic parameter test system busy relay and the original of release time
Manage block diagram；
Fig. 2 is the pickup time and release time of prior art Oscilloscope Calibration relay synthetic parameter test system
Functional block diagram；
Waveform diagram when Fig. 3 is the pickup time of prior art Oscilloscope Calibration relay synthetic parameter test system；
Waveform diagram when Fig. 4 is the release time of prior art Oscilloscope Calibration relay synthetic parameter test system；
Fig. 5 is electrical block diagram of the present invention；
Fig. 6 is present invention calibrating installation and function/arbitrary waveform generator calibration relay synthetic parameter test system
Pickup time and release time functional block diagram；
Fig. 7 is that calibrating installation of the invention and function/arbitrary waveform generator calibrate relay synthetic parameter test system
Pickup time when waveform diagram；
Fig. 8 is that calibrating installation of the invention and function/arbitrary waveform generator calibrate relay synthetic parameter test system
Release time when waveform diagram.
Specific embodiment:
A kind of calibrating installation (hereinafter referred to as calibration cartridge of relay synthetic parameter test system pickup time and release time
Set) as shown in Figure of description 5.It includes that the end of convert B of single-pole double throw switch 1 is drawn out to terminals A；Single-pole double throw switch 1
The end D be drawn out to the base stage of the first negative-positive-negative transistor 2；The C-terminal of single-pole double throw switch 1 is drawn out to the second NPN type crystal three
The base stage of pole pipe 3.The collector of first negative-positive-negative transistor 2 is drawn out to terminals E；Second negative-positive-negative transistor 3
Collector is drawn out to terminals F；The emitter of first negative-positive-negative transistor 2 is drawn out to ground terminal GND；Second NPN type crystal
The emitter of triode 3 is drawn out to ground terminal GND.
Terminals A, E and F are BNC connector.
Such as with the high-precision external internal crystal oscillator for replacing function/arbitrary waveform generator with reference to frequency marking, can greatly improve
The precision of delay time output.
Calibration connection block diagram is as shown in Figure of description 6.The anode at relay synthetic parameter test system coil power end
And function/arbitrary waveform generator external trigger input terminal is connected；The normally open end of relay synthetic parameter test system and calibration
The end F of device is connected；The normal-closed end of relay synthetic parameter test system is connected with the end E of calibrating installation；Function/random waveform
The output end of generator is connected with the end A of calibrating installation.
Using the external trigger delay feature of function/arbitrary waveform generator, by relay synthetic parameter test system coil
The accurate delay time T of coil voltage signal of power end output0Afterwards, triggering function/arbitrary waveform generator, function/appoint are removed
Waveform generator of anticipating exports a pulse voltage signal, and the saturation of 2 negative-positive-negative transistors of control calibrating installation is gone to lead
Logical and cut-off, comes the pickup time and release time of accurate analogue relay, to realize to relay synthetic parameter testing system
The calibration of system pickup time and release time.
The calibration method of the actuation release time calibrating installation of the relay synthetic parameter test system, it includes inhaling
The calibration method and the calibration method of release time of time are closed, the calibration method of the pickup time includes:
The single-pole double throw switch of calibrating installation is got to location of C by step 1；
Step 2, setting function or arbitrary waveform generator are external trigger, and along being rising edge, the trigger delay time is for triggering
T0；
Step 3, according to function or the area requirement of arbitrary waveform generator external trigger input voltage, regulating relay is comprehensive
The voltage V of parameter test system coil power end output4, make voltage V4Meet area requirement；
Step 4, setting function or arbitrary waveform generator output waveform are impulse wave, period T1, pulse width Tw,
T1And TwSelection principle be: T1Compare TwGreatly, TwCan make calibrating installation two reliable saturation conductions of negative-positive-negative transistor and
Cut-off；The low level of impulse wave is -1V, high level 1V, opens the train of pulse function of function or arbitrary waveform generator, pulse
String is set as 1；
Step 5, setting relay synthetic parameter test system are to measure function pickup time, and relay is worked as in starting measurement
The coil power end output voltage V of comprehensive parameter testing system4When, relay synthetic parameter test system starts timing, simultaneously
Trigger function or arbitrary waveform generator, delayed time T0Afterwards, 1 is exported from function or the output end of arbitrary waveform generator
Single pulse signal reaches the base of the second negative-positive-negative transistor after terminal A, the terminal B of single-pole double throw switch and endpoint C
Pole makes the second negative-positive-negative transistor saturation conduction；The then normally opened terminal shortcircuit of relay synthetic parameter test system, relay
Comprehensive parameter testing system stops timing；The pickup time measured such as relay synthetic parameter test system is T, then pickup time
The error of calibration: Δ T=T-T0。
The calibration method of release time includes:
The single-pole double throw switch of calibrating installation is got to the position D by step 1；
Step 2, setting function or arbitrary waveform generator are external trigger, and along being failing edge, the trigger delay time is for triggering
T0；
Step 3, according to function or the area requirement of arbitrary waveform generator external trigger input voltage, regulating relay is comprehensive
The voltage V of parameter test system coil power end output4, make voltage V4Meet area requirement；
Step 4, setting function or arbitrary waveform generator output waveform are impulse wave, period T1, pulse width is
Tw, T1And TwSelection principle be: T1Compare TwGreatly, TwIt can make 2 reliable saturation conductions of negative-positive-negative transistor of calibrating installation
And cut-off；The low level of impulse wave is -1V, high level 1V, opens the train of pulse function of function generator, train of pulse is set as 1
It is a；
Step 5, setting relay synthetic parameter test system are to measure function release time, starting measurement, testing sequence
It is: firstly, by the coil power end output voltage V of relay synthetic parameter test system4, when coil power end output voltage
By V4When jump is 0V, relay synthetic parameter test system starts timing, while triggering function or arbitrary waveform generator, warp
Delay time T0Afterwards, 1 single pulse signal is exported from function or the output end of arbitrary waveform generator, through terminal A, single-pole double throw
After the terminal B and endpoint D of switch, the base stage of the first negative-positive-negative transistor is reached, is saturated the first negative-positive-negative transistor
Conducting, the then normally closed terminal shortcircuit of relay synthetic parameter test system, relay synthetic parameter test system stop timing, such as after
The release time that electric appliance comprehensive parameter testing system measures is T, then the error of release time calibration are as follows: Δ T=T-T0
The delay of coil voltage and pulse voltage signal are generated by function/arbitrary waveform generator, and the present embodiment is with beauty
For 33522A type function/arbitrary waveform generator of state's agilent company production, to calibrate pickup time and release time 1ms
Point is illustrated.
According to 33522A type function/arbitrary waveform generator external trigger level input range, relay synthetic parameter is set
Test macro coil power voltage V4For 5V.
The CH1 (channel 1) on front panel is pressed, on is selected in Output (output), is i.e. unlatching channel 1 exports, voltage signal
It is exported from the end CH1.
Waveforms (waveform) key on front panel is pressed, then presses pulse (pulse) key, that is, selects output waveform for pulse
Wave.
Units (unit) key on front panel is pressed, Period (period) key is pressed, by the Parameters (wave on front panel
Shape parameter) key, the setting period is 20ms.Pulse Width (pulse width) key is pressed, setting pulse width is 10ms.It presses
Amplitude (amplitude) key, setting impulse amplitude are 2Vpp.Offset (biasing) key is pressed, setting bias voltage is 0.0V.It is then every
After secondary triggering 33522A type function/arbitrary waveform generator, exporting 1 pulse width from channel 1 is 10ms, and low level is -1V,
High level is the pulse of 1V.
Burst (train of pulse) key on front panel is pressed, on key, i.e. unbalanced pulse string function are pressed.#of Cycles key is pressed, if
It is set to 1Cyc, i.e., setting output waveform is 1 pulse.
Trigger (triggering) key on front panel is pressed, Source (trigger source) key is pressed, selects Ext (external trigger).By Sync
Src (synchronisation source) selects CH1 (channel 1).Trigger Setup (triggering setting) key is pressed, setting Delay (delay) is 1ms, i.e. T0
=1ms.Triggering is along setting: being that rising edge triggers by Rising (rising edge), when calibrating release when pickup time to be calibrated
When the time, it is failing edge triggering by Falling (failing edge), presses Done (confirmation) key.
The key technical indexes:
The external trigger delay feature of this calibrating installation function/arbitrary waveform generator accurately simulates generation relay
Pickup time and release time.Therefore, the main indicator of calibrating installation depends on function/arbitrary waveform generator used.Together
When, with the external high-precision internal crystal oscillator for replacing function/arbitrary waveform generator with reference to frequency marking, output simple venation can be greatly improved
Rush the time precision of voltage signal.33522A type function/arbitrary waveform generator is such as used, output delay time range: 4ns~
1ks is continuously adjusted, the limits of error: ± 5 × 10-8×Tw, wherein TwFor pulse width.
Claims (6)
1. a kind of actuation release time calibrating installation of relay synthetic parameter test system, it includes single-pole double throw switch (1),
It is characterized by: the end of convert B of single-pole double throw switch (1) is drawn out to terminals A；The end D of single-pole double throw switch (1) is drawn out to
The base stage of one negative-positive-negative transistor (2)；The C-terminal of single-pole double throw switch (1) is drawn out to the second negative-positive-negative transistor (3)
The collector of base stage, the first negative-positive-negative transistor (2) is drawn out to terminals E；The current collection of second negative-positive-negative transistor (3)
Pole is drawn out to terminals F；The emitter of first negative-positive-negative transistor (2) is drawn out to ground terminal GND；Second NPN type crystal three
The emitter of pole pipe (3) is drawn out to ground terminal GND.
2. a kind of actuation release time calibrating installation of relay synthetic parameter test system according to claim 1,
Be characterized in that: described terminals A, E and F are BNC connector.
3. a kind of actuation release time calibrating installation of relay synthetic parameter test system according to claim 1,
It is characterized in that: the anode and function at relay synthetic parameter test system coil power end or the external trigger of arbitrary waveform generator
Input terminal is connected；The normally open end of relay synthetic parameter test system is connected with the end F of calibrating installation；Relay synthetic parameter is surveyed
The normal-closed end of test system is connected with the end E of calibrating installation；The end A of the output end and calibrating installation of function or arbitrary waveform generator
It is connected.
4. a kind of actuation release time calibrating installation of relay synthetic parameter test system according to claim 1,
Be characterized in that: the internal crystal oscillator of function or arbitrary waveform generator is replaced with external with reference to frequency marking.
5. the calibration side of the actuation release time calibrating installation of relay synthetic parameter test system as described in claim 1
Method, it includes the calibration method of pickup time and the calibration method of release time, and the calibration method of the pickup time includes:
The single-pole double throw switch (1) of calibrating installation is got to location of C by step 1；
Step 2, setting function or arbitrary waveform generator are external trigger, and along being rising edge, the trigger delay time is T for triggering0；
Step 3, according to function or the area requirement of arbitrary waveform generator external trigger input voltage, regulating relay comprehensive parameters
The voltage V of test macro coil power end output4, make voltage V4Meet area requirement；
Step 4, setting function or arbitrary waveform generator output waveform are impulse wave, period T1, pulse width Tw, T1And Tw
Selection principle be: T1Compare TwGreatly, TwIt can make the reliable saturation conduction of two negative-positive-negative transistors and the cut-off of calibrating installation；
The low level of impulse wave is -1V, high level 1V, opens the train of pulse function of function or arbitrary waveform generator, train of pulse is set
It is 1；
Step 5, setting relay synthetic parameter test system are to measure function pickup time, and relay synthetic is worked as in starting measurement
The coil power end output voltage V of parameter test system4When, relay synthetic parameter test system starts timing, triggers simultaneously
Function or arbitrary waveform generator, delayed time T0Afterwards, 1 simple venation is exported from function or the output end of arbitrary waveform generator
Signal is rushed, after terminal A, the terminal B of single-pole double throw switch (1) and endpoint C, reaches the base of the second negative-positive-negative transistor (3)
Pole makes the second negative-positive-negative transistor (3) saturation conduction；The then normally opened terminal shortcircuit of relay synthetic parameter test system, relay
Device comprehensive parameter testing system stops timing；Pickup time as relay synthetic parameter test system measures is T, then when being attracted
Between the error calibrated: Δ T=T-T0。
6. the calibration side of the actuation release time calibrating installation of relay synthetic parameter test system according to claim 5
Method, it is characterised in that: the calibration method of release time includes:
The single-pole double throw switch (1) of calibrating installation is got to the position D by step 1；
Step 2, setting function or arbitrary waveform generator are external trigger, and along being failing edge, the trigger delay time is T for triggering0；
Step 3, according to function or the area requirement of arbitrary waveform generator external trigger input voltage, regulating relay comprehensive parameters
The voltage V of test macro coil power end output4, make voltage V4Meet area requirement；
Step 4, setting function or arbitrary waveform generator output waveform are impulse wave, period T1, pulse width Tw, T1
And TwSelection principle be: T1Compare TwGreatly, TwIt can make 2 reliable saturation conductions of negative-positive-negative transistor of calibrating installation and cut
Only；The low level of impulse wave is -1V, high level 1V, opens the train of pulse function of function generator, train of pulse is set as 1；
Step 5, setting relay synthetic parameter test system are to measure function release time, and starting measurement, testing sequence is: first
It first, will be in the coil power end output voltage V of relay synthetic parameter test system4, when coil power end output voltage is by V4It jumps
When becoming 0V, relay synthetic parameter test system starts timing, while triggering function or arbitrary waveform generator, when delayed
Between T0Afterwards, 1 single pulse signal is exported from function or the output end of arbitrary waveform generator, through terminal A, single-pole double throw switch
(1) after terminal B and endpoint D, the base stage of the first negative-positive-negative transistor (2) is reached, the first negative-positive-negative transistor (2) are made
Saturation conduction, then the normally closed terminal shortcircuit of relay synthetic parameter test system, relay synthetic parameter test system stop timing,
The release time measured such as relay synthetic parameter test system is T, then the error of release time calibration are as follows: Δ T=T-T0。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811444944.2A CN109342939B (en) | 2018-11-29 | 2018-11-29 | Device and method for calibrating suction and release time of relay comprehensive parameter testing system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811444944.2A CN109342939B (en) | 2018-11-29 | 2018-11-29 | Device and method for calibrating suction and release time of relay comprehensive parameter testing system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109342939A true CN109342939A (en) | 2019-02-15 |
| CN109342939B CN109342939B (en) | 2024-04-09 |
Family
ID=65318848
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811444944.2A Active CN109342939B (en) | 2018-11-29 | 2018-11-29 | Device and method for calibrating suction and release time of relay comprehensive parameter testing system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109342939B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110967659A (en) * | 2019-12-24 | 2020-04-07 | 贵州航天计量测试技术研究所 | Calibration device, system and method for relay comprehensive tester |
| CN112462252A (en) * | 2020-11-23 | 2021-03-09 | 帝森克罗德集团有限公司 | Synchronous switch relay calibration platform and calibration method |
| CN112526431A (en) * | 2020-12-18 | 2021-03-19 | 贵州航天计量测试技术研究所 | Adapter for calibrating sticking/breaking fault voltage of relay life monitoring station and calibration method thereof |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2588518Y (en) * | 2002-11-14 | 2003-11-26 | 厦门宏发电声有限公司 | Check corrector for electromagnetic relay |
| CN101201393A (en) * | 2007-10-30 | 2008-06-18 | 厦门顶科电子有限公司 | Method for calibrating closed hull precision of relay synthetic parametric tester |
| CN202267741U (en) * | 2011-10-14 | 2012-06-06 | 北京博电新力电气股份有限公司 | Automatic calibration device of relay protection tester |
| CN203101592U (en) * | 2013-03-21 | 2013-07-31 | 河北工业大学 | Electromagnetic relay comprehensive parameter test instrument |
| JP3208336U (en) * | 2016-10-25 | 2017-01-05 | 株式会社Ｎａａファシリティーズ | Calibration test equipment |
| CN209167498U (en) * | 2018-11-29 | 2019-07-26 | 贵州航天计量测试技术研究所 | The actuation release time calibrating installation of relay synthetic parameter test system |
-
2018
- 2018-11-29 CN CN201811444944.2A patent/CN109342939B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2588518Y (en) * | 2002-11-14 | 2003-11-26 | 厦门宏发电声有限公司 | Check corrector for electromagnetic relay |
| CN101201393A (en) * | 2007-10-30 | 2008-06-18 | 厦门顶科电子有限公司 | Method for calibrating closed hull precision of relay synthetic parametric tester |
| CN202267741U (en) * | 2011-10-14 | 2012-06-06 | 北京博电新力电气股份有限公司 | Automatic calibration device of relay protection tester |
| CN203101592U (en) * | 2013-03-21 | 2013-07-31 | 河北工业大学 | Electromagnetic relay comprehensive parameter test instrument |
| JP3208336U (en) * | 2016-10-25 | 2017-01-05 | 株式会社Ｎａａファシリティーズ | Calibration test equipment |
| CN209167498U (en) * | 2018-11-29 | 2019-07-26 | 贵州航天计量测试技术研究所 | The actuation release time calibrating installation of relay synthetic parameter test system |
Non-Patent Citations (1)
| Title |
|---|
| 瞿明生;: "半导体器件测试系统脉冲电流校准装置及校准方法研究", 计量与测试技术, no. 10 * |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110967659A (en) * | 2019-12-24 | 2020-04-07 | 贵州航天计量测试技术研究所 | Calibration device, system and method for relay comprehensive tester |
| CN110967659B (en) * | 2019-12-24 | 2022-02-25 | 贵州航天计量测试技术研究所 | Calibration device, system and method for relay comprehensive tester |
| CN112462252A (en) * | 2020-11-23 | 2021-03-09 | 帝森克罗德集团有限公司 | Synchronous switch relay calibration platform and calibration method |
| CN112526431A (en) * | 2020-12-18 | 2021-03-19 | 贵州航天计量测试技术研究所 | Adapter for calibrating sticking/breaking fault voltage of relay life monitoring station and calibration method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| CN109342939B (en) | 2024-04-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109342939A (en) | The actuation release time calibrating installation and method of relay synthetic parameter test system | |
| CN101403777B (en) | Resistive current tester for great current zinc oxide lightning arrester | |
| CN106291310A (en) | A kind of method of testing utilizing double-pulsed technology test IGBT dynamic switching characteristic and device | |
| CN103176160A (en) | Local discharge simulation calibrating device | |
| CN106771837A (en) | A kind of current transformer remote polarity tester | |
| CN203965489U (en) | A kind of shelf depreciation high voltage pulse generation device | |
| CN202676901U (en) | Time parameter calibration device for high-voltage switch mechanical property tester | |
| CN102998645A (en) | Impulse voltage standard wave source for high-voltage impulse voltage quantity value traceability and using method thereof | |
| CN105510859A (en) | System and method for evaluating electronic transformer | |
| CN110967659B (en) | Calibration device, system and method for relay comprehensive tester | |
| CN209167498U (en) | The actuation release time calibrating installation of relay synthetic parameter test system | |
| CN206450779U (en) | A kind of current transformer remote polarity tester | |
| CN106568997A (en) | Switching control method and device of multimeter current range | |
| CN103542877A (en) | Method for calibrating aircraft starting box comprehensive inspection tester | |
| CN203133260U (en) | Impulse voltage standard wave source for high-voltage impulse voltage quantity value traceability | |
| CN201563237U (en) | Multi-channel loudspeaker service life tester | |
| CN103809089A (en) | Method and device for generating calibration pulse for detecting partial discharge of high voltage equipment | |
| CN218470956U (en) | Novel calibration device for high-voltage switch mechanical characteristic tester | |
| CN103982354B (en) | A kind of automobile ignition coil comprehensive parameter tester | |
| CN205844509U (en) | A kind of phase error detecting apparatus of electronic transducer calibration instrument | |
| CN202758008U (en) | Performance testing device of trip outlet contact of relay protection device | |
| CN109946635B (en) | Conducted sensitivity test system checking device | |
| CN204302479U (en) | A kind of capacitor moment open-short circuit tester calibrating installation | |
| CN103323638A (en) | Multifunctional digital scope meter | |
| CN204177927U (en) | A kind of permanent-magnet breaker characteristic test control circuit |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |