CN209821349U - Test circuit for electronic fuse thick film circuit - Google Patents
Test circuit for electronic fuse thick film circuit Download PDFInfo
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- CN209821349U CN209821349U CN201822175898.2U CN201822175898U CN209821349U CN 209821349 U CN209821349 U CN 209821349U CN 201822175898 U CN201822175898 U CN 201822175898U CN 209821349 U CN209821349 U CN 209821349U
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Abstract
The utility model relates to a test circuit for electron detonator thick film circuit, characterized by: the circuit comprises a connector, wherein a first pin of the connector is connected with a capacitor C1, a resistor R3, a resistor R4 and an ignition voltage detection meter, the resistor R3 is connected with an acoustic signal input button switch through a resistor R6, and the resistor R4 is connected with a magnetic signal input button switch through a resistor R5; the second pin of the connector is connected with the crystal oscillator and the resistor R1, and the third pin of the connector is connected with the crystal oscillator, the resistor R1 and the waveform inspection button switch; the sixth pin of the connector is connected with a resistor R11 and a starting button switch, the resistor R11 is connected with a light-emitting diode LED1, and the starting button switch is connected with the light-emitting diode LED2 through a resistor R12; the ninth pin of the connector is sequentially connected with a resistor R7, a thyristor Q1 and a light-emitting diode LED 3; the twelfth pin of the connector is sequentially connected with a resistor R8, a thyristor Q2 and a light-emitting diode LED 4. The utility model discloses satisfy thick film circuit's test demand, can simulate thick film circuit self-destruction, explosion, trip the function of state such as sending out.
Description
Technical Field
The utility model relates to a test circuit for electron detonator thick film circuit belongs to circuit check out test set technical field.
Background
The fuze is also called a fuse tube and is a detonating device. The fuze is a control circuit that detonates under predetermined conditions using target information and environmental information. Along with the development of science and technology, modern equipment usually uses the electronic fuse, in order to increase anti-interference and antistatic measure, adopts among the prior art to carry out the thick film integration improvement to the fuse low frequency part, uses thick film circuit in the electronic fuse. The electronic fuse thick film circuit needs to be overhauled regularly, and how to detect the electronic fuse thick film circuit quickly and conveniently becomes a problem which needs to be solved urgently.
Disclosure of Invention
The utility model aims at overcoming the not enough of existence among the prior art, providing a test circuit for electron fuze thick film circuit, can satisfy thick film circuit's test demand, can simulate the function of thick film circuit self-destruction, explosion, trip state such as send out.
According to the utility model provides a technical scheme, a test circuit for electron detonator thick film circuit, including the connector, characterized by: the first pin of the connector is connected with one end of a capacitor C1, the other end of the capacitor C1 is connected with one end of a resistor R3, one end of a resistor R4, the eighth pin of a connector P1, one end of a resistor R2 and one end of an ignition voltage detection table, the other end of the resistor R3 is connected with the fourth pin of the connector and one end of a resistor R6, the other end of the resistor R6 is connected with one end of a function input button switch SW-PB1, the other end of the function input button switch SW-PB1 is connected with VCC voltage, the other end of the resistor R4 is connected with the fifth pin of the connector and one end of a resistor R5, the other end of the resistor R5 is connected with one end of a function input button switch SW-PB2, the other end of the function input button switch SW-PB2 is connected with VCC voltage, the other end of the resistor R2 is connected with the other end of the ignition voltage detection table, one end of a capacitor C2 and the eleventh pin of the connector, the other, the other end of the current detection meter is grounded; the second pin of the connector is connected with one end of the crystal oscillator and one end of the resistor R1, and the third pin of the connector is connected with the other end of the crystal oscillator, the other end of the resistor R1 and the waveform inspection button switch; the sixth pin of the connector is connected with one end of a resistor R11 and one end of a start button switch, the other end of the resistor R11 is connected with the anode of a light-emitting diode LED1, the cathode of the light-emitting diode LED1 is grounded, the other end of the start button switch is connected with VCC voltage and one end of a resistor R12, the other end of the resistor R12 is connected with the anode of a light-emitting diode LED2, and the cathode of the light-emitting diode LED2 is grounded; the seventh pin of the connector is connected with VCC voltage; the ninth pin of the connector is connected with one end of a resistor R7, the other end of the resistor R7 is connected with the gate pole of a controlled silicon Q1, the anode of the controlled silicon Q1 is connected with the cathode of a light-emitting diode LED3, and the anode of the light-emitting diode LED3 is connected with one end of a resistor R9; the other end of the resistor R9 is connected with one end of a clearing switch, and the other end of the clearing switch is connected with 5V voltage; the twelfth pin of the connector is connected with one end of a resistor R8, the other end of the resistor R8 is connected with the gate pole of a controlled silicon Q2, the anode of the controlled silicon Q2 is connected with the cathode of a light-emitting diode LED4, and the anode of the light-emitting diode LED4 is connected with one end of a resistor R10; the other end of the resistor R10 is connected with 5V voltage.
Furthermore, the tenth foot of the connector is a setting interface.
Further, the cathode of the thyristor Q1 and the cathode of the thyristor Q2 are grounded.
A test circuit for electron detonator thick film circuit simulates the function of states such as thick film circuit self-destruction, explosion, trip and the like. The test board is externally connected with a working power supply, and the test result can be directly displayed through the LED on the test table board, so that the test table is visual and convenient.
Drawings
Fig. 1 is an electrical schematic diagram of a test circuit for an electronic fuse thick film circuit according to the present invention.
Detailed Description
The present invention will be further explained with reference to the accompanying drawings.
As shown in FIG. 1, the testing circuit for the electronic fuze thick film circuit of the present invention includes a connector P1, the first pin of the connector P1 is connected to one end of a capacitor C1, the other end of the capacitor C1 is connected to one end of a resistor R3, one end of a resistor R4, the eighth pin GND of the connector P1, one end of a resistor R2 and one end of an ignition voltage detection table V, the other end of the resistor R3 is connected to the fourth pin of the connector P1 and one end of a resistor R6, the other end of the resistor R6 is connected to one end of a function input button SW-PB1, the other end of the function input button SW-PB1 is connected to a VCC voltage, the other end of the resistor R4 is connected to the fifth pin of a connector P1 and one end of a resistor R5, the other end of the resistor R5 is connected to one end of a function input button SW-PB2, the other end of the function input button SW-PB2 is connected to a voltage, and the other end of the resistor R2, One end of a capacitor C2 and the eleventh pin of the connector P1, the other end of the capacitor C2 is connected with one end of a current detection table I, the other end of the current detection table I is grounded, and an ignition voltage detection table V is used for monitoring the detonation voltage of the thick film circuit; the function input button switch SW-PB1 and the function input button switch SW-PB2 are used for simulating sound and magnetic signal input; the second pin of the connector P1 is connected with one end of the crystal oscillator Y and one end of the resistor R1, and the third pin of the connector P1 is connected with the other end of the crystal oscillator Y, the other end of the resistor R1 and the waveform check button switch SW-PB 3; a sixth pin of the connector P1 is connected with one end of a resistor R11 and one end of a start button switch SW-PB4, the other end of the resistor R11 is connected with the anode of a light-emitting diode LED1, the cathode of the light-emitting diode LED1 is grounded, the other end of the start button switch SW-PB4 is connected with VCC voltage and one end of a resistor R12, the other end of the resistor R12 is connected with the anode of a light-emitting diode LED2, and the cathode of the light-emitting diode LED2 is grounded; the seventh pin of the connector P1 is connected with VCC voltage; a ninth pin of the connector P1 is connected with one end of a resistor R7, the other end of the resistor R7 is connected with a gate of a controlled silicon Q1, the anode of the controlled silicon Q1 is connected with the cathode of a light-emitting diode LED3, the anode of the light-emitting diode LED3 is connected with one end of a resistor R9, and the light-emitting diode LED3 is used for displaying tripping action; the other end of the resistor R9 is connected with one end of a clearing switch SW-SPST, the other end of the clearing switch SW-SPST is connected with 5V voltage, and the clearing switch SW-SPST is used for turning off the indicator light; the tenth pin of the connector P1 is a setting interface; the twelfth pin of the connector P1 is connected with one end of a resistor R8, the other end of the resistor R8 is connected with the gate of a controlled silicon Q2, the anode of the controlled silicon Q2 is connected with the cathode of a light-emitting diode LED4, the anode of the light-emitting diode LED4 is connected with one end of a resistor R10, and the light-emitting diode LED4 is used for displaying explosion action; the other end of the resistor R10 is connected with 5V voltage; the cathode of the thyristor Q1 and the cathode of the thyristor Q2 are grounded.
The utility model discloses a test method for test circuit of electron detonator thick film circuit, including following step:
(1) the direct current voltage-stabilizing power supply switch is opened earlier, selects II ways direct current voltage-stabilizing power supply voltage output to set for 3.6V, and the current output protection sets for 1A, connects direct current voltage-stabilizing power supply output and is connected with the testboard VCC. The selected direct-current stable power supply voltage output is set to 5V, the current output protection is set to 1.5A, and the selected direct-current stable power supply voltage output is connected with the 5V of the test board display screen. And checking whether the data displayed by the current stable voltage power supply is the same as the set value, and opening the output after confirming no error.
(2) And connecting the setter with the setting two ends of the detection table, turning on a power supply of the oscilloscope to connect the oscilloscope with the two ends of the detection table, and respectively inserting and locking the 16 electronic fuses to be detected into the locking sockets.
(3) And opening a VCC switch, displaying 0.00 by a voltmeter and starting power supply by the electronic fuse. Setting the setter time to 4 minutes, simultaneously setting 16 electronic fuses to be tested according to a 'set' button switch of the setter, and displaying the thunder passing number XX and the good thunder number XX by the setter. The display data of the setter is the same as the number of products mounted on the actual detection table, and the setter is switched on and off according to the waveform 1-16 of the detection table to observe whether the waveform of each product is normal or not. Pressing the 'power-off' button switch of the setter, pressing the switches of the detection table waveforms 1-16, and checking whether each product is normally powered off.
(4) And (3) simultaneously setting the 16 electronic fuses to be tested according to a setting button switch of a setter, wherein the setter is required to display the number XX of the passed thunder and the number XX of the good thunder. Each product corresponding ammeter display (290-; the voltmeter value in the panel rises from 0V at 30 seconds, and when the voltage rises to a specified value at the time of approaching 60S, the voltmeter voltage corresponding to 1-16 fuzes is observed whether the voltmeter voltage reaches a specified value of 9V;
when 60 seconds, the corresponding yellow indicator light is lightened; the corresponding voltmeter voltage is less than 1V, the corresponding ammeter current (500-600) uA is adopted, the voltage value in the panel starts to rise again in 90 seconds, and when the voltage rises to a specified value in 120S, whether the voltmeter voltage corresponding to 1-16 electronic thick film circuits rises to the specified value is observed; observing whether the voltage of an ammeter corresponding to 1-16 electronic thick film circuits reaches a specified value less than 60 uA or not; when the specified value is reached, 9V is pressed, a 4 switch is pressed, an explosion indicator lamp is not lighted, a 5 switch is pressed, the explosion indicator lamp is not lighted, a 4 switch is pressed, the explosion indicator lamp is lighted, and a clear key is pressed to enable the indicator lamp on the panel to be extinguished.
(5) Then the thick film circuit is boosted again, when the stopwatch reaches 4 minutes, the explosion indicator lamp is lighted again, and the 'clear' key is pressed to turn off the indicator lamp on the panel.
(6) All switches should be reset after the test is finished.
A test circuit for electron detonator thick film circuit simulates the function of states such as thick film circuit self-destruction, explosion, trip and the like. The test board is externally connected with a working power supply, and the test result can be directly displayed through the LED on the test table board, so that the test table is visual and convenient.
Claims (3)
1. The utility model provides a test circuit for electron detonator thick film circuit, includes the connector, characterized by: the first pin of the connector is connected with one end of a capacitor C1, the other end of the capacitor C1 is connected with one end of a resistor R3, one end of a resistor R4, the eighth pin of the connector, one end of a resistor R2 and one end of an ignition voltage detection table, the other end of a resistor R3 is connected with the fourth pin of the connector and one end of a resistor R6, the other end of a resistor R6 is connected with one end of a function input button switch SW-PB1, the other end of the function input button switch SW-PB1 is connected with VCC voltage, the other end of a resistor R4 is connected with the fifth pin of the connector and one end of a resistor R5, the other end of a resistor R5 is connected with one end of a function input button switch SW-PB2, the other end of a function input button switch SW-PB2 is connected with VCC voltage, the other end of a resistor R2 is connected with the other end of the ignition voltage detection table, one end of a capacitor C2 and the eleventh pin of the connector, the, the other end of the current detection meter is grounded; the second pin of the connector is connected with one end of the crystal oscillator and one end of the resistor R1, and the third pin of the connector is connected with the other end of the crystal oscillator, the other end of the resistor R1 and the waveform inspection button switch; the sixth pin of the connector is connected with one end of a resistor R11 and one end of a start button switch, the other end of the resistor R11 is connected with the anode of a light-emitting diode LED1, the cathode of the light-emitting diode LED1 is grounded, the other end of the start button switch is connected with VCC voltage and one end of a resistor R12, the other end of the resistor R12 is connected with the anode of a light-emitting diode LED2, and the cathode of the light-emitting diode LED2 is grounded; the seventh pin of the connector is connected with VCC voltage; the ninth pin of the connector is connected with one end of a resistor R7, the other end of the resistor R7 is connected with the gate pole of a controlled silicon Q1, the anode of the controlled silicon Q1 is connected with the cathode of a light-emitting diode LED3, and the anode of the light-emitting diode LED3 is connected with one end of a resistor R9; the other end of the resistor R9 is connected with one end of a clearing switch, and the other end of the clearing switch is connected with 5V voltage; the twelfth pin of the connector is connected with one end of a resistor R8, the other end of the resistor R8 is connected with the gate pole of a controlled silicon Q2, the anode of the controlled silicon Q2 is connected with the cathode of a light-emitting diode LED4, and the anode of the light-emitting diode LED4 is connected with one end of a resistor R10; the other end of the resistor R10 is connected with 5V voltage.
2. The test circuit for an electronic fuze thick film circuit, as claimed in claim 1, wherein: the tenth foot of the connector is a setting interface.
3. The test circuit for an electronic fuze thick film circuit, as claimed in claim 1, wherein: the cathode of the thyristor Q1 and the cathode of the thyristor Q2 are grounded.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822175898.2U CN209821349U (en) | 2018-12-24 | 2018-12-24 | Test circuit for electronic fuse thick film circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822175898.2U CN209821349U (en) | 2018-12-24 | 2018-12-24 | Test circuit for electronic fuse thick film circuit |
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| Publication Number | Publication Date |
|---|---|
| CN209821349U true CN209821349U (en) | 2019-12-20 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201822175898.2U Active CN209821349U (en) | 2018-12-24 | 2018-12-24 | Test circuit for electronic fuse thick film circuit |
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| CN (1) | CN209821349U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109633325A (en) * | 2018-12-24 | 2019-04-16 | 苏州烽燧电子有限公司 | Electronic fuse thick film circuit tester control circuit |
| CN113267097A (en) * | 2021-04-23 | 2021-08-17 | 安徽东风机电科技股份有限公司 | Electric fuse firing function monitoring circuit |
-
2018
- 2018-12-24 CN CN201822175898.2U patent/CN209821349U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109633325A (en) * | 2018-12-24 | 2019-04-16 | 苏州烽燧电子有限公司 | Electronic fuse thick film circuit tester control circuit |
| CN109633325B (en) * | 2018-12-24 | 2023-12-29 | 苏州烽燧电子有限公司 | Control circuit of electronic fuze thick film circuit tester |
| CN113267097A (en) * | 2021-04-23 | 2021-08-17 | 安徽东风机电科技股份有限公司 | Electric fuse firing function monitoring circuit |
| CN113267097B (en) * | 2021-04-23 | 2023-01-17 | 安徽东风机电科技股份有限公司 | Electric fuse firing function monitoring circuit |
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