CN111025143A - Bus conversion current switching test circuit device and parameter determination method thereof - Google Patents
Bus conversion current switching test circuit device and parameter determination method thereof Download PDFInfo
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- CN111025143A CN111025143A CN202010017677.1A CN202010017677A CN111025143A CN 111025143 A CN111025143 A CN 111025143A CN 202010017677 A CN202010017677 A CN 202010017677A CN 111025143 A CN111025143 A CN 111025143A
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
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Abstract
The invention discloses a bus conversion current switching test circuit device and a parameter determination method thereof, wherein the device comprises: the temperature rising transformer, the wave regulating inductor and the TRV regulating unit; one end of the temperature rising transformer is grounded, and the other end of the temperature rising transformer is connected with the wave modulating inductor; the other end of the wave regulating inductor is connected with one end of the tested isolating switch; the other end of the tested isolating switch is grounded; the TRV adjusting unit is formed by connecting an adjusting capacitor and an adjusting resistor in series and is connected to two ends of the tested isolating switch in parallel; the current measuring unit is arranged on one side of the grounding end of the tested isolating switch and is used for measuring the current value flowing through the tested isolating switch; the voltage measuring unit is arranged on the other side of the grounding end far away from the tested isolating switch and used for measuring voltage values at two ends of the tested isolating switch; the circuit device is simple in structure and high in reliability, popularization of a GIS isolating switch on-off module wire current conversion test during research and development is facilitated, and a GIS isolating switch test research and development period is saved.
Description
Technical Field
The invention relates to the technical field of power detection, in particular to a bus conversion current opening and closing test circuit and a parameter determination method thereof.
Background
In a transformer substation, the main functions of the isolating switch are to isolate a line and establish an isolating insulation fracture. However, in a double bus loop substation, for example, the disconnector must be used to switch the bus in addition to the above basic functions, which entails switching the bus switching current, the switching current value of which sometimes approaches the rated load current of the system. Normally, the opening and closing speed of the isolating switch is low, the isolating switch mostly acts slowly, an arc extinguishing device is not generally arranged in the body, the structure is simple, the arcing time is long when the isolating switch is opened and closed, particularly for GIS equipment, the generated electric arc can burn a contact, metal splashes are generated, the surface of an insulator is seriously polluted, the inner insulation performance of the GIS is directly influenced, and the safe operation of a transformer substation is threatened. Therefore, in the design of the GIS isolating switch, the GIS isolating switch is required to have high capacity of isolating an insulating fracture and certain capacity of switching bus conversion current.
At present, only a high-capacity test station has the capacity of switching bus conversion current, but the test period is long, the flexibility is insufficient, the repeatability test in the development stage is inevitable, the test cost is high, and the development process and the design test investment of the isolating switch are influenced.
Disclosure of Invention
In order to solve the problem that in the background technology, only a high-capacity test station has test capability for the switching bus switching current test of a GIS isolating switch, so that the repeated test cost in the development stage is high, the invention provides a bus switching current switching test circuit device and a parameter determination method thereof; the method comprises the steps that circuit parameters are determined through circuit simulation, and the circuit is based on a temperature rising transformer, and generates a GIS disconnecting switch bus conversion current switching test environment through a wave modulation inductor and a TRV (transient voltage transformer) adjusting unit; the bus conversion current opening and closing test circuit device comprises:
the temperature rising transformer, the wave regulating inductor and the TRV regulating unit;
one end of the temperature rising transformer is grounded, and the other end of the temperature rising transformer is connected with the wave regulating inductor;
the other end of the wave regulating inductor is connected with one end of the tested isolating switch;
the other end of the tested isolating switch is grounded;
the TRV adjusting unit is formed by connecting an adjusting capacitor and an adjusting resistor in series, and is connected to two ends of the tested isolating switch in parallel.
Further, the device also comprises a current measuring unit and a voltage measuring unit;
the current measuring unit is arranged on one side of the grounding end of the tested isolating switch and used for measuring the current value flowing through the tested isolating switch;
the voltage measuring unit is arranged on the other side away from the grounding end of the tested isolating switch and used for measuring the voltage values at two ends of the tested isolating switch.
Further, the device also comprises a test judgment unit;
the input end of the test judgment unit is connected with the output end of the current measurement unit and the output end of the voltage measurement unit;
the test judging unit is used for comparing the received current value of the tested isolating switch with a preset bus conversion current threshold value and judging whether the tested isolating switch meets the bus conversion current requirement when being closed;
the test judging unit is used for comparing the received voltage value of the tested isolating switch with a preset bus conversion voltage threshold value and judging whether the tested isolating switch meets the bus conversion voltage requirement when being closed.
Further, the device also comprises a circuit simulation unit;
the circuit simulation unit is used for simulating a circuit consisting of the temperature rising transformer, the wave modulation inductor and the TRV adjusting unit and determining parameter values of all elements in the circuit according to preset circuit setting requirements.
A method for determining parameters of a bus switching current switching test circuit as described above, the method comprising:
determining the rated bus conversion voltage and the rated bus conversion current of the tested isolating switch;
obtaining a load side direct current resistor and a short circuit inductor of the temperature-rising transformer;
calculating according to a preset rule to obtain the wave modulation inductance value;
constructing an analog simulation circuit of the bus conversion current switching test circuit, and setting corresponding parameters of the analog simulation circuit according to a load side direct current resistor, a short circuit inductor and a wave modulation inductance value of the temperature-rising transformer;
setting an adjusting resistor and an initial value of an adjusting capacitor of the TRV adjusting unit, performing circuit simulation, and taking the adjusting resistor and the adjusting capacitor as parameters of the TRV adjusting unit if the preset instantaneous recovery voltage waveform requirement is met;
and if the preset instantaneous recovery voltage waveform requirement is not met, adjusting the adjusting resistor and the adjusting capacitor according to a preset rule, and performing simulation again until the preset instantaneous recovery voltage waveform requirement is met.
Further, the calculating according to a preset rule to obtain the wave modulating inductance value includes:
calculating to obtain the total resistance of the loop according to the rated bus conversion voltage and the rated bus conversion current of the tested isolating switch;
calculating according to the load side direct current resistor, the short circuit inductor and the frequency to obtain a short circuit impedance;
and calculating to obtain the wave modulation inductance value according to the total resistance, the short-circuit impedance and the frequency.
Further, the preset transient recovery voltage waveform requirements include:
the transient recovery voltage TRV frequency is within a preset frequency range, and the expected amplitude coefficient is not less than a preset amplitude coefficient threshold.
Further, if the preset instantaneous recovery voltage waveform requirement is not met, adjusting the adjusting resistor and the adjusting capacitor according to a preset rule, comprising:
if the frequency is lower than the lower limit value of a preset frequency interval, reducing the adjusting capacitance value according to a preset frequency adjusting range;
if the frequency is higher than the upper limit value of a preset frequency interval, increasing the adjusting capacitance value according to a preset frequency adjusting amplitude;
and if the amplitude coefficient is lower than a preset amplitude coefficient threshold value, reducing the adjusting resistance value according to a preset amplitude adjusting range.
The method for performing the switching test by using the bus conversion current switching test circuit comprises the following steps:
the tested isolating switch is arranged at a corresponding position of the bus conversion current switching test circuit;
closing the tested isolating switch;
measuring and obtaining the current value flowing through the tested isolating switch through a current measuring unit;
measuring voltage values at two ends of the tested isolating switch through a voltage measuring unit;
and judging whether the tested isolating switch meets the requirements of bus conversion current and bus conversion voltage when the tested isolating switch is closed through a test judging unit.
The invention has the beneficial effects that: the technical scheme of the invention provides a bus conversion current switching test circuit device and a parameter determination method thereof, wherein the circuit device is powered by a temperature-rising transformer, and meets the requirements of national standards of GIS isolating switch bus conversion tests of 252KV and below on current, voltage and transient recovery voltage through the matched construction of a wave regulating inductor and a TRV regulating unit; the circuit device is simple in structure and high in reliability, facilitates popularization of a GIS isolating switch on-off module wire current conversion test during research and development, and greatly saves a research and development period of the GIS isolating switch test.
Drawings
A more complete understanding of exemplary embodiments of the present invention may be had by reference to the following drawings in which:
fig. 1 is a schematic structural diagram of a bus switching current open/close test circuit device according to an embodiment of the present invention;
FIG. 2 is a flow chart of a method for determining parameters of a switching test circuit for switching a bus switching current according to an embodiment of the present invention;
fig. 3 is a flowchart of a method for performing a test using a bus switching current open/close test circuit according to an embodiment of the present invention.
Detailed Description
The exemplary embodiments of the present invention will now be described with reference to the accompanying drawings, however, the present invention may be embodied in many different forms and is not limited to the embodiments described herein, which are provided for complete and complete disclosure of the present invention and to fully convey the scope of the present invention to those skilled in the art. The terminology used in the exemplary embodiments illustrated in the accompanying drawings is not intended to be limiting of the invention. In the drawings, the same units/elements are denoted by the same reference numerals.
Unless otherwise defined, terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. Further, it will be understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and will not be interpreted in an idealized or overly formal sense.
Fig. 1 is a schematic structural diagram of a bus switching current open/close test circuit device according to an embodiment of the present invention; as shown in fig. 1, the circuit arrangement includes:
the temperature rising transformer, the wave regulating inductor and the TRV regulating unit;
one end of the temperature rising transformer is grounded, and the other end of the temperature rising transformer is connected with the wave regulating inductor;
the other end of the wave regulating inductor is connected with one end of the tested isolating switch;
the other end of the tested isolating switch is grounded;
the TRV adjusting unit is formed by connecting an adjusting capacitor and an adjusting resistor in series, and is connected to two ends of the tested isolating switch in parallel.
Specifically, the temperature-rising transformer can be equivalent to a direct-current resistor RT and a short-circuit inductor LT;
the direct current resistance RT can be obtained by measuring the temperature rising transformer by a direct current resistance measuring method;
the short-circuit inductance LT can be obtained by measuring the temperature rising transformer by a short-circuit inductance measuring method;
when the isolating switch is switched off, the residual energy in the wave modulating inductor is discharged through the TRV regulating unit;
the temperature-rising transformer is powered by industrial electricity AC380V +/-10%, the power is 500kVA, the output current is 0-15000A and is adjustable, and the output voltage is more than or equal to 30V.
Further, in order to measure and determine whether the disconnecting switch meets the requirements of the bus switching on-off test, the circuit device further comprises a current measuring unit, a voltage measuring unit and a test judging unit;
the current measuring unit is arranged on one side of the grounding end of the tested isolating switch and used for measuring the current value flowing through the tested isolating switch; in the embodiment, the current measuring unit is a current measuring coil, the coil transformation ratio is 3000:1, the maximum measuring current is 15000A, and the measuring requirement of the conversion current under the extra-high voltage is met;
the voltage measuring unit is arranged on the other side away from the grounding end of the tested isolating switch and used for measuring the voltage values at two ends of the tested isolating switch.
The input end of the test judgment unit is connected with the output end of the current measurement unit and the output end of the voltage measurement unit;
the test judging unit is used for comparing the received current value of the tested isolating switch with a preset bus conversion current threshold value and judging whether the tested isolating switch meets the bus conversion current requirement when being closed;
the test judging unit is used for comparing the received voltage value of the tested isolating switch with a preset bus conversion voltage threshold value and judging whether the tested isolating switch meets the bus conversion voltage requirement when being closed.
Further, the device also comprises a circuit simulation unit; the circuit simulation unit is used for simulating a circuit consisting of the temperature rising transformer, the wave modulation inductor and the TRV adjusting unit and determining parameter values of all elements in the circuit according to preset circuit setting requirements.
FIG. 2 is a flow chart of a method for determining parameters of a switching test circuit for switching a bus switching current according to an embodiment of the present invention; as shown in fig. 2, the method includes:
in the embodiment, the conversion voltage of the rated bus and the conversion current of the rated bus of the tested isolating switch are determined according to the national standard of the GIS isolating switch bus conversion test corresponding to the extra-high voltage level required to be met;
for example, the rated bus transfer current IBT of the tested disconnector is 1600A, the rated bus transfer voltage UBT is 30V in the 126kV class, and the rated bus transfer voltage UBT is 100V in the 252kV class.
the temperature-rising transformer is responsible for side direct-current resistance and short-circuit inductance, and the side direct-current resistance and the short-circuit inductance are equivalent to the direct-current resistance and the short-circuit inductance of the temperature-rising transformer;
the direct-current resistance and the short-circuit inductance can be obtained by directly obtaining or calculating rated parameters of the temperature-rising transformer nameplate or by measuring the temperature-rising transformer;
for example: the temperature rising transformer can be measured by a direct current resistance measuring method to obtain a direct current resistance RT; measuring the temperature rising transformer by a short-circuit inductance measuring method to obtain the short-circuit inductance LT;
specifically, the method for calculating by the preset rule includes:
231, calculating to obtain the total loop resistance according to the rated bus conversion voltage and the rated bus conversion current of the tested isolating switch;
step 232, calculating according to the load side direct current resistance, the short circuit inductance and the frequency to obtain a short circuit impedance;
and 233, calculating to obtain the wave modulation inductance value according to the total resistance, the short-circuit impedance and the frequency.
Taking this embodiment as an example:
for the test under the voltage class of 126kV, determining the rated bus switching voltage of the tested isolating switch to be 30V and the rated bus switching current to be 1600A;
calculating to obtain total impedance Z-UBT/IBT-30V/1600A-18.75 m omega;
through measurement, the direct current impedance RT is 0.12m omega, and the short circuit inductance LT is 0.0012 mH; calculating to obtain short circuit impedance ZT which is 0.4092m omega by the formula LT which is (ZT-RT)/omega;
then the tuning inductance can be calculated, i.e. the tuning inductance L ═ Z-ZT)/ω ═ 60 μ H.
in this embodiment, the simulation circuit of the component is to obtain parameters of the TRV condition unit through simulation, build a simulation circuit by simulating an actual bus conversion current open/close test circuit, and set corresponding parameters according to the calculated actual parameters.
the initial values of the adjusting resistor and the adjusting capacitor are preset, in this embodiment, the TRV adjusting unit C is set to 1 μ F, and R is set to 2 Ω;
the preset instantaneous recovery voltage waveform requires that the waveform is 1-cos; and the transient recovery voltage TRV frequency is required to be within a preset frequency interval, and the expected amplitude coefficient is not less than a preset amplitude coefficient threshold value.
In this embodiment, the setting requirement is that the frequency of the transient recovery voltage TRV is not lower than 10kHz, and the expected amplitude coefficient is not lower than 1.5;
and step 260, if the preset instantaneous recovery voltage waveform requirement is not met, adjusting the adjusting resistor and the adjusting capacitor according to a preset rule, and performing simulation again until the preset instantaneous recovery voltage waveform requirement is met.
Specifically, the adjustment means:
if the frequency is lower than the lower limit value of a preset frequency interval, reducing the adjusting capacitance value according to a preset frequency adjusting range;
if the frequency is higher than the upper limit value of a preset frequency interval, increasing the adjusting capacitance value according to a preset frequency adjusting amplitude;
and if the amplitude coefficient is lower than a preset amplitude coefficient threshold value, reducing the adjusting resistance value according to a preset amplitude adjusting range.
After the adjustment is carried out according to the mode, simulation is carried out again, whether the requirement of the preset instantaneous recovery voltage waveform is met or not is judged, and if the requirement is met, available adjusting resistance and adjusting capacitance are obtained; if the result does not meet the requirement, further adjusting according to the method, and carrying out a new round of analog simulation until a result meeting the requirement is obtained.
FIG. 3 is a flow chart of a method for testing using a bus switching current open/close test circuit in accordance with an embodiment of the present invention; as shown in fig. 3, the method includes:
and 350, judging whether the tested isolating switch meets the requirements of bus conversion current and bus conversion voltage when the tested isolating switch is closed through a test judgment unit.
In the description provided herein, numerous specific details are set forth. However, it is understood that embodiments of the disclosure may be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure an understanding of this description.
Those skilled in the art will appreciate that the modules in the device in an embodiment may be adaptively changed and disposed in one or more devices different from the embodiment. The modules or units or components of the embodiments may be combined into one module or unit or component, and furthermore they may be divided into a plurality of sub-modules or sub-units or sub-components. All of the features disclosed in this specification (including any accompanying claims, abstract and drawings), and all of the processes or elements of any method or apparatus so disclosed, may be combined in any combination, except combinations where at least some of such features and/or processes or elements are mutually exclusive. Each feature disclosed in this specification (including any accompanying claims, abstract and drawings) may be replaced by alternative features serving the same, equivalent or similar purpose, unless expressly stated otherwise. Reference to step numbers in this specification is only for distinguishing between steps and is not intended to limit the temporal or logical relationship between steps, which includes all possible scenarios unless the context clearly dictates otherwise.
Moreover, those skilled in the art will appreciate that while some embodiments described herein include some features included in other embodiments, rather than other features, combinations of features of different embodiments are meant to be within the scope of the disclosure and form different embodiments. For example, any of the embodiments claimed in the claims can be used in any combination.
Various component embodiments of the disclosure may be implemented in hardware, or in software modules running on one or more processors, or in a combination thereof. The present disclosure may also be embodied as device or system programs (e.g., computer programs and computer program products) for performing a portion or all of the methods described herein. Such programs implementing the present disclosure may be stored on a computer-readable medium or may be in the form of one or more signals. Such a signal may be downloaded from an internet website or provided on a carrier signal or in any other form.
It should be noted that the above-mentioned embodiments illustrate rather than limit the disclosure, and that those skilled in the art will be able to design alternative embodiments without departing from the scope of the appended claims. The word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The disclosure may be implemented by means of hardware comprising several distinct elements, and by means of a suitably programmed computer. In the unit claims enumerating several systems, several of these systems may be embodied by one and the same item of hardware.
The foregoing is directed to embodiments of the present disclosure, and it is noted that numerous improvements, modifications, and variations may be made by those skilled in the art without departing from the spirit of the disclosure, and that such improvements, modifications, and variations are considered to be within the scope of the present disclosure.
Claims (9)
1. A bus bar switching current open and close test circuit apparatus, the apparatus comprising: the temperature rising transformer, the wave regulating inductor and the TRV regulating unit;
one end of the temperature rising transformer is grounded, and the other end of the temperature rising transformer is connected with the wave regulating inductor;
the other end of the wave regulating inductor is connected with one end of the tested isolating switch;
the other end of the tested isolating switch is grounded;
the TRV adjusting unit is formed by connecting an adjusting capacitor and an adjusting resistor in series, and is connected to two ends of the tested isolating switch in parallel.
2. The circuit arrangement of claim 1, wherein: the device also comprises a current measuring unit and a voltage measuring unit;
the current measuring unit is arranged on one side of the grounding end of the tested isolating switch and used for measuring the current value flowing through the tested isolating switch;
the voltage measuring unit is arranged on the other side away from the grounding end of the tested isolating switch and used for measuring the voltage values at two ends of the tested isolating switch.
3. The circuit arrangement of claim 1, wherein: the device also comprises a test judgment unit;
the input end of the test judgment unit is connected with the output end of the current measurement unit and the output end of the voltage measurement unit;
the test judging unit is used for comparing the received current value of the tested isolating switch with a preset bus conversion current threshold value and judging whether the tested isolating switch meets the bus conversion current requirement when being closed;
the test judging unit is used for comparing the received voltage value of the tested isolating switch with a preset bus conversion voltage threshold value and judging whether the tested isolating switch meets the bus conversion voltage requirement when being closed.
4. The circuit arrangement of claim 1, wherein: the device also comprises a circuit simulation unit;
the circuit simulation unit is used for simulating a circuit consisting of the temperature rising transformer, the wave modulation inductor and the TRV adjusting unit and determining parameter values of all elements in the circuit according to preset circuit setting requirements.
5. A method for determining parameters of a bus bar switching current open/close test circuit according to claim 1, the method comprising:
determining the rated bus conversion voltage and the rated bus conversion current of the tested isolating switch;
obtaining a load side direct current resistor and a short circuit inductor of the temperature-rising transformer;
calculating according to a preset rule to obtain the wave modulation inductance value;
constructing an analog simulation circuit of the bus conversion current switching test circuit, and setting corresponding parameters of the analog simulation circuit according to a load side direct current resistor, a short circuit inductor and a wave modulation inductance value of the temperature-rising transformer;
setting an adjusting resistor and an initial value of an adjusting capacitor of the TRV adjusting unit, performing circuit simulation, and taking the adjusting resistor and the adjusting capacitor as parameters of the TRV adjusting unit if the preset instantaneous recovery voltage waveform requirement is met;
and if the preset instantaneous recovery voltage waveform requirement is not met, adjusting the adjusting resistor and the adjusting capacitor according to a preset rule, and performing simulation again until the preset instantaneous recovery voltage waveform requirement is met.
6. The method according to claim 5, wherein the calculating the tuning wave inductance value according to a preset rule comprises:
calculating to obtain the total resistance of the loop according to the rated bus conversion voltage and the rated bus conversion current of the tested isolating switch;
calculating according to the load side direct current resistor, the short circuit inductor and the frequency to obtain a short circuit impedance;
and calculating to obtain the wave modulation inductance value according to the total resistance, the short-circuit impedance and the frequency.
7. The method of claim 5, wherein: the preset transient recovery voltage waveform requirements include:
the transient recovery voltage TRV frequency is within a preset frequency range, and the expected amplitude coefficient is not less than a preset amplitude coefficient threshold.
8. The method of claim 7, wherein adjusting the tuning resistor and tuning capacitor according to predetermined rules if the predetermined transient recovery voltage waveform requirement is not met comprises:
if the frequency is lower than the lower limit value of a preset frequency interval, reducing the adjusting capacitance value according to a preset frequency adjusting range;
if the frequency is higher than the upper limit value of a preset frequency interval, increasing the adjusting capacitance value according to a preset frequency adjusting amplitude;
and if the amplitude coefficient is lower than a preset amplitude coefficient threshold value, reducing the adjusting resistance value according to a preset amplitude adjusting range.
9. A method of performing a switching test using the bus bar conversion current switching test circuit of claim 3, the method comprising:
the tested isolating switch is arranged at a corresponding position of the bus conversion current switching test circuit;
closing the tested isolating switch;
measuring and obtaining the current value flowing through the tested isolating switch through a current measuring unit;
measuring voltage values at two ends of the tested isolating switch through a voltage measuring unit;
and judging whether the tested isolating switch meets the requirements of bus conversion current and bus conversion voltage when the tested isolating switch is closed through a test judging unit.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202010017677.1A CN111025143A (en) | 2020-01-08 | 2020-01-08 | Bus conversion current switching test circuit device and parameter determination method thereof |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202010017677.1A CN111025143A (en) | 2020-01-08 | 2020-01-08 | Bus conversion current switching test circuit device and parameter determination method thereof |
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Application publication date: 20200417 |