CN115166375A - Insertion loss test port - Google Patents

Abstract

The application relates to the technical field of printed circuit board processing, provides an insertion loss test port, locates on the circuit board, insertion loss test port includes: the positioning holes are distributed on the circuit board at intervals and enclose a test area; the two grounding PADs are arranged in the test area in parallel at intervals, and each grounding PAD is strip-shaped and extends along the first direction; the testing assembly is arranged between the two grounding PADs and comprises at least one testing PAD, and a preset distance is reserved between at least part of the testing PAD and the adjacent grounding PAD; the positioning hole and the test PAD form a first test port; the ground PAD and the test PAD constitute a second test port. The insertion loss test port realizes the adaptation of a common series of probes when carrying out differential insertion loss test and characteristic insertion loss test, does not need to purchase probe devices of various specifications, and saves the cost.

Description

Insertion Loss Test Port

technical field

The present application relates to the technical field of printed circuit board processing, and in particular, to an insertion loss test port.

Background technique

With the development of information technology, insertion loss (also called insertion loss), as a key parameter to measure PCB signal loss, has received more and more attention in the PCB manufacturing process. There are two types of insertion loss: differential insertion loss and characteristic insertion loss. Differential insertion loss refers to the insertion loss of a differential line, which consists of two parallel, equal-length transmission lines with a transmission phase difference of 180°; characteristic insertion loss refers to the insertion loss of a single-ended line, which consists of a single transmission line.

Due to the different designs of the test ports, in the testing process, different probes need to be selected according to the actual design for testing; and the probes are very expensive, and purchasing probes of various specifications will increase the cost of the enterprise.

SUMMARY OF THE INVENTION

The purpose of the present application is to provide an insertion loss test port, so as to solve the technical problem that the probe specifications of the existing insertion loss test port are incompatible.

The embodiment of the present application proposes an insertion loss test port, which is provided on a circuit board, and the insertion loss test port includes:

a plurality of positioning holes, the plurality of positioning holes are distributed on the circuit board at intervals and form a test area;

Two grounding PADs are arranged in the test area in parallel and spaced apart, and each of the grounding PADs is strip-shaped and extends along the first direction;

a test assembly, disposed between the two grounded PADs, the test assembly includes at least one test PAD, and at least a part of the test PAD has a preset distance from the adjacent grounded PAD;

Wherein, the positioning hole and the test PAD form a first test port; the grounding PAD and the test PAD form a second test port.

In one embodiment, along a second direction perpendicular to the first direction, the widths of the test PAD and the grounding PAD are both greater than or equal to 0.2 mm.

In one embodiment, the test assembly includes a rectangular test PAD, the test PAD extends along the first direction, and the predetermined distance between the test PAD and the two grounded PADs is equal distances.

In one embodiment, the test assembly includes two test PADs for adapting probes with a preset probe spacing, and each of the test PADs includes a first test part, a connection part and a second test part connected in sequence. Two test parts, the first test part and the second test part both extend along the first direction, and there is a preset angle between the extension line of the connection part and the first direction, and the two test parts extend along the first direction. The distance between the second test parts is greater than the distance between the two first test parts and less than the preset probe spacing, and the distance between each of the first test parts and the adjacent grounded PAD is the preset distance.

In one embodiment, the width of each of the first test portion and the second test portion is 0.2 mm, the distance between the two first test portions is less than 0.35 mm, and the two second test portions are The distance between them is less than 0.5mm.

In one embodiment, both ends of the ground PAD and the test PAD are flush.

In one embodiment, the preset distance is greater than 0.1 mm.

In one embodiment, the number of the positioning holes is four, and the four positioning holes are located around the test area and are distributed in a rectangular shape.

In one embodiment, the insertion loss test port further includes a signal-on PAD disposed in the test area, the signal-on PAD is spaced from one end of the test PAD, and the signal-on PAD passes through. A transmission line is electrically connected to the test PAD.

In one embodiment, the insertion loss test port further includes a plurality of shielding holes disposed in the test area, and some of the shielding holes and the test PAD or the grounding PAD are far away from the signal conduction PAD. One end is arranged at intervals, and along the first direction, the distance between the shielding hole and the end of the test PAD or the grounding PAD away from the signal conducting PAD is greater than or equal to 0.2 mm; some of the shielding holes are arranged at on the ground PAD.

The above-mentioned insertion loss test port includes a plurality of positioning holes, two grounding PADs located in the test area, and a test component located between the two grounding PADs. Since the positioning holes and test components can be combined to fit Packetmicro series probes, the grounding PAD It can be combined with test components to adapt to FormFactor Cascade series probes, thus realizing the adaptation of common series of probes for differential insertion loss test and characteristic insertion loss test, without the need to purchase probe devices of various specifications, saving cost and effectively Solved the technical problem of incompatible probe specifications of existing insertion loss test ports.

Description of drawings

In order to illustrate the technical solutions in the embodiments of the present application more clearly, the following briefly introduces the accompanying drawings that need to be used in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only for the present application. In some embodiments, for those of ordinary skill in the art, other drawings can also be obtained according to these drawings without any creative effort.

Fig. 1 is the test port of the Packetmicro series probe corresponding to the existing differential insertion loss test;

Figure 2 is the test port of the FormFactor Cascade series probe corresponding to the existing differential insertion loss test;

Fig. 3 is the test port of the Packetmicro series probe corresponding to the existing characteristic insertion loss test;

Figure 4 is the test port of the FormFactor Cascade series probe corresponding to the existing characteristic insertion loss test;

5 is a schematic structural diagram of an insertion loss test port corresponding to a differential insertion loss test provided in Embodiment 1 of the present application;

FIG. 6 is a schematic structural diagram of the ground PAD, the test PAD, the transmission line and the signal conduction PAD in the insertion loss test port shown in FIG. 5;

7 is a schematic structural diagram of an insertion loss test port corresponding to a characteristic insertion loss test provided in Embodiment 2 of the present application;

FIG. 8 is a schematic structural diagram of the ground PAD, the test PAD, the transmission line and the signal conduction PAD in the insertion loss test port shown in FIG. 7 .

The meanings of the marks in the figure are:

100. Insertion loss test port;

101. Test area;

10. Positioning hole;

20. Ground PAD;

30, test PAD; 31, first test part; 32, connection part; 33, second test part;

40. The signal turns on the PAD;

50. Transmission line;

60. Shielding hole;

201. Grounding ring.

Detailed ways

In order to make the purpose, technical solutions and advantages of the present application more clearly understood, the present application will be described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application, but not to limit the present application.

It should be noted that when an element is referred to as being "fixed to" or "disposed on" another element, it can be directly on the other element or indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or indirectly connected to the other element.

It should be understood that the orientation or positional relationship indicated by the terms "length", "width", "upper", "lower", "inner", "outer", etc. are based on the orientation or positional relationship shown in the drawings, only For the convenience of describing the present application and simplifying the description, it is not indicated or implied that the referred device or element must have a particular orientation, be constructed and operate in a particular orientation, and therefore should not be construed as a limitation of the present application. In the description of the present application, "plurality" means two or more, unless otherwise expressly and specifically defined.

In this application, unless otherwise expressly specified and limited, the terms "installed", "connected", "connected", "fixed" and other terms should be understood in a broad sense, for example, it may be a fixed connection or a detachable connection , or integrated; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, and it can be the internal connection of the two elements or the interaction relationship between the two elements. For those of ordinary skill in the art, the specific meanings of the above terms in this application can be understood according to specific situations.

The existing PCB insertion loss test is to select the corresponding probe according to the test port. The commonly used probes are Packetmicro series and FormFactor Cascade series.

When performing differential insertion loss test, please refer to Figure 1. The test port design of Packetmicro series probes includes four positioning holes 10, two circular test pads (pads) 30 and a grounding ring 201. The hole 10 positions the probe, and the two probes of the probe are in contact with the two circular test pads 30 for testing. Please refer to Figure 2. The test port design of FormFactor Cascade series probes includes four test PAD30s, two of which are ground PADs (rings) and two are signal PADs, which are arranged in a ground-signal-ground manner and probe station artificially positioned The test is carried out by contacting the four probes of the probe with the four test PAD30s.

When performing the characteristic insertion loss test, please refer to Figure 3. The test port design of the Packetmicro series probe includes four positioning holes 10, a circular test PAD30, and a grounding ring 201. The four positioning holes 10 are used to test the probe. Positioning, the test is carried out by contacting one of the probe tips of the probe with a circular test PAD30. Please refer to Figure 4. The test port design of FormFactorCascade series probes includes three test PAD30, two of which are ground PADs and one is signal PAD, which are arranged in a ground-to-ground manner. The three probes of the needle are brought into contact with the three test PAD30s for testing.

In the above test process, due to the different design of the test ports, it is necessary to select different probes for testing according to the actual design, and the operation is complicated; in addition, the price of probes is very expensive, and purchasing probes of various specifications increases the cost of enterprises.

In order to illustrate the technical solutions described in the present application, the following description is made with reference to the specific drawings and embodiments. In order to improve the compatibility of the insertion loss test port, the present application proposes a loss test port, please refer to Embodiment 1 and Embodiment 2 for details. The loss test port can be adapted to the common probe devices of Packetmicro series and FormFactor Cascade series without purchasing Various specifications of the probe device, reduce the cost of enterprises.

Example 1

Referring to FIG. 5 and FIG. 6 , Embodiment 1 of the present application proposes an insertion loss test port 100 , which is applicable to Packetmicro series and FormFactor Cascade series probes for differential insertion loss test lines. Take PacketmicroDelta-L 4.0 probe and FormFactor Cascade Probe 350(D) probe as examples, Packetmicro Delta-L4.0 probe contains two probes with a spacing of 0.5mm; FormFactor Cascade Probe 350(D) has a common ground Four probes, the spacing between each probe is 0.35mm.

Please refer to FIG. 5 and FIG. 6 , the insertion loss test port 100 is provided on the circuit board, and the insertion loss test port 100 includes a plurality of positioning holes 10 , two ground pads (pads) 20 and test components.

A plurality of positioning holes 10 are distributed on the circuit board at intervals and enclose a test area 101 to facilitate the positioning of the probes.

Two grounding PADs 20 are arranged in the test area 101 in parallel and spaced apart. Each grounding PAD 20 is strip-shaped and extends along the first direction (X direction in the figure). It is understood that the more regular the shape of the grounding PAD 20 is, the more The easier it is to make contact with the ground PAD20 and keep it connected to facilitate subsequent testing.

The test assembly is disposed between the two grounded PADs 20 , the test assembly includes two test PADs 30 , and at least a part of the test PADs 30 has a predetermined distance d from the adjacent grounded PADs 20 .

Among them, the positioning hole 10 and the test PAD30 constitute the first test port for the Packetmicro Delta-L 4.0 probe; the ground PAD20 and the test PAD30 constitute the second test port for the FormFactor Cascade Probe 350(D) probe.

The above-mentioned insertion loss test port 100 includes a plurality of positioning holes 10, two grounded PADs 20 located in the test area 101, and a test component disposed between the two grounded PADs 20. Since the positioning holes 10 and the test components can be combined to adapt to Packetmicro series probes. Pins, grounding PAD20 and test components can be combined to fit FormFactor Cascade series probes, thus realizing the adaptation of commonly used series of probes for differential insertion loss testing, eliminating the need to purchase probe devices of various specifications, saving costs and effectively solving The technical problem of the incompatibility of the probe specifications of the existing insertion loss test port 100 is solved.

Considering the convenience of manufacturing and the convenience of testing, please refer to FIG. 5 and FIG. 6 , in this embodiment, along the second direction (the Y direction in the figure) perpendicular to the first direction, the widths of the PAD30 and the grounding PAD20 are tested Equal to 0.2mm. In this way, the probe of the probe is easier to contact with the test PAD30 or grounded PAD20, and it will not be easily dislocated, and the test process is relatively stable. It can be understood that, in other embodiments of the present application, along the second direction perpendicular to the first direction, the widths of the testing PAD 30 and the grounding PAD 20 may also be greater than 0.2 mm, which is not limited herein.

Please refer to FIG. 5 and FIG. 6 , in this embodiment, the test assembly includes two test PADs 30 for adapting probes with preset probe distances, and each test PAD 30 includes a first test part 31 connected in sequence, a connection part 32 and the second test part 33, the first test part 31 and the second test part 33 both extend along the first direction, the extension line of the connecting part 32 has a preset angle with the first direction, and the two second test parts The distance b between the parts 33 is greater than the distance a between the two first test parts 31 and less than the preset probe spacing, and the preset distance d between each first test part 31 and the adjacent grounded PAD 20 is.

It can be understood that the first test portion 31 and the second test portion 33 of the two test pads 30 are parallel to each other, so as to facilitate contact with the probe of the probe. Wherein, the width of each of the first test portion 31 and the second test portion 33 is 0.2 mm.

Among them, the first test parts 31 of the two test PAD30 and the two ground PAD20 cooperate to form a second test port, which is adapted to the FormFactor Cascade Probe 350(D) probe, that is, the ground of the FormFactor Cascade Probe 350(D) probe. The four probes of Xinxindi respectively contact one of the grounded PADs 20 , the first test part 31 of the two test PADs 30 , and the other grounded PAD20 in sequence along the second direction.

Specifically, the distance between the four probes of the FormFactor Cascade Probe 350 (D) is 0.35mm. First, the distance a between the two first test parts 31 is 0.15mm. The width of the first test portion 31 is 0.2mm, then the distance between the centers of the two first test portions 31 is 0.35mm; secondly, the preset distance d between the first test portion 31 and the adjacent grounded PAD 20 is 0.2 mm, which is convenient to manufacture and test, and combined with the width of the first test portion 31 and the grounded PAD 20 is 0.2 mm, the distance between the center of each first test portion 31 and the center of the adjacent grounded PAD 20 is 0.4 mm, so, It can ensure stable contact between the four probes and the test PAD30 or ground PAD20.

It can be understood that the distance between the probes in the same system probe device is constant. In order to ensure that the probe of the probe can contact the first test part 31 of the test PAD30 and the grounded PAD20 at the same time, it is required that the distance between the first test part 31 of the test PAD30 and the adjacent grounded PAD20, that is, the preset distance d is smaller than the probe The distance between the two first test parts 31 is also smaller than the distance between the probes, for example, less than 0.35 mm. Since the test PAD30 and the grounding PAD20 need to be set at intervals, combined with the difficulty of the preparation process, the preset distance d needs to be greater than 0.1mm. As such, in other embodiments of the present application, the preset distance d between the first testing portion 31 and the adjacent grounded PAD 20 may also be other values within the range of 0.1 mm˜0.35 mm. Since the probe spacing of FormFactorCascade series probes can also be 0.4mm, 0.45mm and other spacings, the spacing between the test PAD30 and the test PAD30 and the grounding PAD20 can be adjusted according to the probe spacing of the probe, or according to the probe spacing of the probe. Test the width of the first test portion 31 of the PAD 30 and the grounded PAD 20 .

Among them, the second test parts 33 of the two test pads 30 cooperate with the four positioning holes 10 to form the first test port, so as to fit the Packetmicro Delta-L 4.0 probe, that is, the two probes of the Packetmicro Delta-L 4.0 probe along the No. The two directions respectively contact the second test parts 33 of the two test PADs 30 in turn, so the distance between the two second test parts 33 and the adjacent grounded PAD 20 may not be limited, as long as the spacing is ensured.

Specifically, the distance between the two probes of the Packetmicro Delta-L 4.0 probe is 0.5mm, that is, the preset distance between the probes is 0.5mm, and the distance b between the two second test parts 33 is 0.3mm, that is, the two second The distance b between the test parts 33 is smaller than the preset probe spacing, and combined with the width of each second test part 33 being 0.2mm, the distance between the centers of the two second test parts 33 is 0.5mm. The two probes of the Packetmicro Delta-L 4.0 probe can stably contact the two second test parts 33 at the same time.

It can be understood that in other embodiments of the present application, the width of each of the first test parts 31 and the second test parts 33 may also be greater than 0.2 mm, and at this time, the distance a between the two first test parts 31 may be Satisfy: any value in the range of 0mm<a<0.35mm; the distance b between the two second test parts 33 may satisfy: any value in the range of 0mm<b<0.5mm, but is not limited thereto.

Referring to FIG. 5 , in this embodiment, both ends of the grounding PAD 20 and the testing PAD 30 are flush, and the structure is regular, which can avoid the situation that only part of the probe of the probe is connected.

Referring to FIG. 5 , in this embodiment, the number of the positioning holes 10 is four, and the four positioning holes 10 are located around the test area 101 and are distributed in a rectangular shape. The distance between the center of each positioning hole 10 and the center of the adjacent positioning hole 10 is 6.35mm or 2.54mm, that is, the size of the rectangular test area 101 is 6.35mm long and 2.54mm wide, so that it can be adapted to existing The positioning structure of the probe does not need to be redesigned.

Please refer to FIG. 5 and FIG. 6 , in this embodiment, the insertion loss test port 100 further includes a signal conduction PAD 40 disposed in the test area 101 , the signal conduction PAD 40 and one end of the test PAD 30 are spaced apart and the signal conduction PAD 40 passes through The transmission line 50 is electrically connected to the test PAD 30 .

In order to reduce the influence of crosstalk on the insertion loss test port 100, the insertion loss test port 100 further includes a plurality of shielding holes 60 arranged in the test area 101. The number of shielding holes 60 can be set according to the position of the test port, and multiple shielding holes 60 can be designed . Since the shielding holes 60 are arranged on the side of the signal conducting PAD40, the coupling effect between the differential lines will be affected, so part of the shielding holes 60 and the end of the test PAD30 or the grounding PAD20 far away from the signal conducting PAD40 are arranged at intervals, that is to say, Part of the shielding hole 60 and the signal conducting PAD 40 are respectively located on opposite sides of the test PAD 30 . Along the first direction, the distance between the shielding hole 60 and the end of the test PAD 30 or the ground PAD 20 away from the signal conduction PAD 40 is greater than or equal to 0.2 mm.

In addition, two or more shielding holes 60 may also be opened on the grounding PAD 20 , wherein at least one shielding hole 60 is opened on each grounding PAD at a position corresponding to the first testing portion 31 and the second testing portion 33 . . It can be understood that the grounding PAD 20 is used for shielding in the horizontal direction, and the shielding holes 60 are used for shielding in the vertical direction.

It can be understood that the positioning hole 10 and the shielding hole 60 are prepared by drilling holes on the PCB board; the grounding PAD 20 and the test components can be obtained in the circuit pattern preparation through exposure, development, etching and other processes, and the above contents are all single-sided tests. Port design, the other end can be mirrored design.

The above-mentioned insertion loss test port 100 includes a plurality of positioning holes 10, two grounded PADs 20 located in the test area 101, and a test component disposed between the two grounded PADs 20. Since the positioning holes 10 and the test components can be combined to adapt to Packetmicro series probes. Pins, grounding PAD20 and test components can be combined to fit FormFactor Cascade series probes, thus realizing the adaptation of commonly used series of probes for differential insertion loss testing, eliminating the need to purchase probe devices of various specifications, saving costs and effectively solving The technical problem of the incompatibility of the probe specifications of the existing insertion loss test port 100 is solved.

Embodiment 2

Please refer to FIG. 7 and FIG. 8 , the second embodiment of the present application proposes an insertion loss test port 100. For characteristic insertion loss lines, it can be applied to Packetmicro series and FormFactor Cascade series probes, with FormFactorCascade Probe 350(S) probe and Take the Packetmicro Delta-L probe as an example. Packetmicro Delta-L probe contains one probe; FormFactor Cascade Probe 350(S) probe has three probes in total, and the spacing between each probe is 0.35mm.

Please refer to FIG. 7 and FIG. 8 , the insertion loss test port 100 is provided on the circuit board, and the insertion loss test port 100 includes a plurality of positioning holes 10 , two grounding PADs 20 and test components.

A plurality of positioning holes 10 are distributed on the circuit board at intervals and enclose a test area 101 to facilitate the positioning of the probes.

Two grounding PADs 20 are disposed in the test area 101 in parallel and spaced apart, and each grounding PAD 20 is strip-shaped and extends along the first direction.

The test component is arranged between the two grounded PADs 20 . The test component includes a test PAD 30 , and there is a preset distance d between the test PAD 30 and the adjacent ground PAD 20 .

Among them, the positioning hole 10 and the test PAD30 constitute the first test port for the Packetmicro Delta-L probe; the ground PAD20 and the test PAD30 constitute the second test port for the FormFactor Cascade Probe 350(S) probe.

The above-mentioned insertion loss test port 100 includes a plurality of positioning holes 10, two grounded PADs 20 located in the test area 101, and a test component disposed between the two grounded PADs 20. Since the positioning holes 10 and the test components can be combined to adapt to Packetmicro series probes. Pins, grounding PAD20 and test components can be combined to fit FormFactor Cascade series probes, thus realizing the adaptation of commonly used series of probes for characteristic insertion loss testing, eliminating the need to purchase probe devices of various specifications, saving costs and effectively solving The technical problem of the incompatibility of the probe specifications of the existing insertion loss test port 100 is solved.

Combining the convenience of manufacture and the convenience of testing, please refer to FIG. 7 , in this embodiment, along the second direction perpendicular to the first direction, the widths of the testing PAD 30 and the grounding PAD 20 are equal to 0.2 mm. It can be understood that, in other embodiments of the present application, along the second direction perpendicular to the first direction, the widths of the test PAD 30 and the ground PAD 20 may also be greater than 0.2 mm.

Referring to FIGS. 7 and 8 , in this embodiment, the test component includes a rectangular test PAD 30 , the test PAD 30 is extended along the first direction, and the test PAD 30 is located between the two grounded PADs 20 . That is, the distance between the test PAD30 and the two ground PAD20 is equal, and the two ends of the ground PAD20 and the test PAD30 are flush.

Among them, the test PAD30 and two grounding PAD20 cooperate to form the second test port to adapt to the FormFactor Cascade Probe 350(S) probe, that is, the ground to ground of the FormFactor Cascade Probe 350(S) The three probes are along the second direction Contact one of the grounded PAD20, test PAD30, and the other grounded PAD20 in turn.

Specifically, the distance between the ground, ground and ground probes of the FormFactor Cascade Probe 350(S) probe is 0.35mm, and the preset distance d between the test PAD30 and the adjacent ground PAD20 is 0.2mm, which is convenient for manufacturing and testing. , and the width of the test PAD30 and the ground PAD20 is 0.2mm, the distance between the center of the test PAD30 and the center of the ground PAD20 is 0.4mm. In this way, it can be ensured that the three probes between the ground and the ground and the test PAD30 or the ground PAD20 stable contact.

Since the distance between the probes in the same system probe device is fixed, in order to ensure that the probe of the probe can contact the test PAD30 and the grounding PAD20 at the same time, the distance between the test PAD30 and the adjacent grounding PAD20 is required, that is, the preset distance d is smaller than the probe. Spacing, such as less than 0.35mm. Since the test PAD30 and the grounding PAD20 need to be set at intervals, combined with the difficulty of the preparation process, the preset distance d needs to be greater than 0.1mm. As such, in other embodiments of the present application, the preset distance d between the test PAD 30 and the adjacent grounding PAD 20 may also be other values within the range of 0.1 mm to 0.35 mm. Since the probe spacing of the probes can also be other, it is necessary to adjust the spacing between the test PAD30 and the grounding PAD20 according to the probe spacing of the probes, or adjust the width of the testing PAD30 and the grounding PAD20 according to the probe spacing of the probes.

The test PAD 30 cooperates with the four positioning holes 10 to form a first test port, which is adapted to the Packetmicro Delta-L probe, that is, a single probe of the Packetmicro Delta-L probe contacts the test PAD 30.

For the structure of the positioning hole 10 and the signal conduction PAD 40 of the insertion loss test port 100, please refer to the first embodiment. It also has all the beneficial effects brought by the technical solutions of the above embodiments, and will not be repeated here.

The insertion loss test port 100 further includes a plurality of shielding holes 60 disposed in the test area 101 . The number of the shielding holes 60 can be set according to the position of the test port, and multiple shielding holes 60 can be designed. Part of the shielding hole 60 is spaced apart from one end of the test PAD 30 or the ground PAD 20 away from the signal conducting PAD 40 , that is, the partial shielding hole 60 and the signal conducting PAD 40 are located on opposite sides of the test PAD 30 respectively. In addition, one or more shielding holes 60 may also be opened on the grounding PAD 20 .

The above-mentioned embodiments are only used to illustrate the technical solutions of the present application, but not to limit them; although the present application has been described in detail with reference to the above-mentioned embodiments, those of ordinary skill in the art should understand that: it is still possible to implement the above-mentioned implementations. The technical solutions described in the examples are modified, or some technical features thereof are equivalently replaced; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions in the embodiments of the application, and should be included in the within the scope of protection of this application.

Claims (10)

1. An insertion loss test port, located on a circuit board, is characterized in that, the insertion loss test port comprises: a plurality of positioning holes, the plurality of positioning holes are distributed on the circuit board at intervals and form a test area; Two grounding PADs are arranged in the test area in parallel and spaced apart, and each of the grounding PADs is strip-shaped and extends along the first direction; a test assembly, disposed between the two grounded PADs, the test assembly includes at least one test PAD, and at least a part of the test PAD has a preset distance from the adjacent grounded PAD; Wherein, the positioning hole and the test PAD form a first test port; the grounding PAD and the test PAD form a second test port. 2 . The insertion loss test port according to claim 1 , wherein, along a second direction perpendicular to the first direction, the widths of the test PAD and the grounding PAD are both greater than or equal to 0.2 mm. 3 . 3 . The insertion loss test port according to claim 2 , wherein the test component comprises a rectangular test PAD, the test PAD extends along the first direction, and the test PAD is connected to two. 4 . The preset distances between the grounded PADs are equal. 4. The insertion loss test port of claim 2, wherein the test assembly comprises two test PADs for adapting probes having a preset probe spacing, each of the test PADs comprising: The first test part, the connection part and the second test part are connected in sequence, the first test part and the second test part both extend along the first direction, and the extension line of the connection part is connected to the first test part. There is a preset angle between the directions, the distance between the two second test parts is greater than the distance between the two first test parts and less than the preset probe distance, each of the first test parts The distance between the part and the adjacent grounded PAD is the preset distance. 5 . The insertion loss test port according to claim 4 , wherein the width of each of the first test portion and the second test portion is 0.2 mm, and the distance between the two first test portions is 0.2 mm. 6 . Less than 0.35mm, the distance between the two second test parts is less than 0.5mm. 6 . The insertion loss test port according to claim 1 , wherein both ends of the ground PAD and the test PAD are flush. 7 . 7 . The insertion loss test port according to claim 1 , wherein the preset distance is greater than 0.1 mm. 8 . 8. The insertion loss test port according to any one of claims 1-5, wherein the number of the positioning holes is four, and the four positioning holes are located around the test area and are rectangular distributed. 9. The insertion loss test port according to any one of claims 1-5, wherein the insertion loss test port further comprises a signal conduction PAD arranged in the test area, and the signal conduction The PAD is spaced apart from one end of the test PAD, and the signal-on PAD is electrically connected to the test PAD through a transmission line. 10 . The insertion loss test port according to claim 9 , wherein the insertion loss test port further comprises a plurality of shielding holes arranged in the test area, and some of the shielding holes are connected to the test PAD or the test pad. 11 . One end of the grounding PAD away from the signal-on PAD is spaced apart, and along the first direction, the distance between the shielding hole and the test PAD or the end of the grounding PAD far away from the signal-on PAD greater than or equal to 0.2mm; some of the shielding holes are arranged on the grounding PAD.

Images