CN115078974A - Circuit board test platform - Google Patents
Circuit board test platform Download PDFInfo
- Publication number
- CN115078974A CN115078974A CN202210872195.3A CN202210872195A CN115078974A CN 115078974 A CN115078974 A CN 115078974A CN 202210872195 A CN202210872195 A CN 202210872195A CN 115078974 A CN115078974 A CN 115078974A
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- China
- Prior art keywords
- circuit board
- fixedly connected
- test platform
- board test
- push
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 33
- 239000000523 sample Substances 0.000 claims abstract description 32
- 230000005540 biological transmission Effects 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 8
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- 229910052802 copper Inorganic materials 0.000 description 3
- 239000010949 copper Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000003292 glue Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 230000003139 buffering effect Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000001125 extrusion Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention relates to the technical field of circuit board testing, in particular to a circuit board testing platform which comprises a base, wherein a conveyor belt is rotatably connected onto the base, a plurality of groove plates are fixedly connected onto the conveyor belt, two movable plates are arranged above the conveyor belt, two fixed plates are respectively and slidably connected onto the two movable plates, a probe is respectively and slidably connected onto each fixed plate, a spring is respectively and fixedly connected between each probe and each fixed plate, a limiting block is respectively and rotatably connected onto each fixed plate, a first electric push rod is respectively and fixedly connected onto each movable plate, a push block is respectively and fixedly connected onto the moving end of each first electric push rod, two first push-pull rods are respectively and hingedly connected onto each push block, each limiting block is respectively and hingedly connected with one first push-pull rod, the circuit board testing platform also comprises two moving frames, slide rods are respectively and fixedly connected onto the moving frames, and the two movable plates are respectively and slidably connected onto the two moving frames, this device can test double-sided circuit board.
Description
Technical Field
The invention relates to the technical field of circuit board testing, in particular to a circuit board testing platform.
Background
The circuit board is generally referred to as a 'circuit board', and the circuit board enables the circuit to be miniaturized and visualized, and plays an important role in mass production of fixed circuits and optimization of electrical appliance layout. The circuit board may be referred to as a printed wiring board or a printed circuit board; the circuit boards are divided into three large categories, namely a single-sided board, a double-sided board and a multilayer circuit board according to the number of layers; the difference between the single-sided circuit board and the double-sided circuit board is that the number of copper layers is different; the double-sided circuit board is characterized in that copper is arranged on both sides of the circuit board and can be conducted through a through hole to play a connecting role; and only one layer of copper is arranged on one surface, only simple circuits can be manufactured, and the manufactured holes can be only used for plug-ins and cannot be conducted.
When the circuit board is produced, in order to ensure the production quality of the circuit board, a special tester is generally needed to test the quality of the circuit board, the conventional circuit board tester can only test a single-sided circuit board, only the tested surface of the circuit board is placed upwards, test equipment for the double-sided circuit board is lacked, and time and labor are wasted when the tester is simply manually held by hands.
Disclosure of Invention
In view of the above, the technical problem to be solved by the present invention is to provide a circuit board testing platform, which can test a double-sided circuit board.
Including the base, rotate on the base and be connected with the conveyer belt, a plurality of frid of fixedly connected with on the conveyer belt, the conveyer belt top is provided with two movable plates, all is provided with two fixed plates on two movable plates, and equal sliding connection has the probe on every fixed plate, equal fixedly connected with spring between every probe and the fixed plate.
Each fixed plate is rotatably connected with a limiting block.
Every all fixedly connected with electric putter on the movable plate, all fixedly connected with ejector pad on every electric putter's the removal end, all articulated on every ejector pad have two first push-and-pull rods, and every stopper is articulated with a first push-and-pull rod respectively.
Still include two and remove the frame, remove all fixedly connected with slide bar on the frame, two movable plates sliding connection respectively are on two removal frames.
Two equal fixedly connected with first motor on the removal frame, the removal of two first motors holds equal fixedly connected with first lead screw, and two movable plates are threaded connection respectively on two first lead screws.
Drawings
The invention is described in further detail below with reference to the accompanying drawings and specific embodiments.
Fig. 1 and fig. 2 are schematic overall structures of a circuit board testing platform;
FIG. 3 is a schematic view of the structure of the conveyor belt;
FIG. 4 is a schematic structural view of a second electric putter;
FIG. 5 is a schematic structural view of the movable frame;
FIG. 6 is a schematic diagram of the structure of a probe;
FIG. 7 is a schematic view of the structure of the moving plate;
FIG. 8 is a schematic structural view of the supporting frame;
FIG. 9 is a schematic view of the splint;
fig. 10 is a schematic structural view of the lifting plate.
Detailed Description
The present invention will be described in detail with reference to the accompanying drawings in which embodiments of the invention are shown.
Referring to fig. 1-7, schematic diagrams of embodiments of facilitating testing of two-sided circuit boards in accordance with the present invention are shown, and further,
the utility model provides a circuit board test platform includes base 103, be connected with conveyer belt 101 through the bearing rotation on the base 103, each rotation of the left and right sides of base 103 connects a roller, install a conveyer belt 101 on two rollers, one of them roller of motor drive that utilizes the location to set up rotates in order to drive conveyer belt 101 and rotate, it bonds a plurality of frid 102 of fixedly connected with through glue on the conveyer belt 101, a plurality of frid 102 are the rubber material, the conveyer belt 101 top is provided with two movable plates 202, all be provided with fixed plate 402 on two movable plates 202, two fixed plates 402 can move on two movable plates 202 respectively, equal sliding connection has probe 403 on every fixed plate 402, all seted up two holes that are used for probe 403 gliding on every fixed plate 402, equal welding fixedly connected with spring 404 between every probe 403 and the 402 fixed plate.
Firstly, a worker inserts a double-sided circuit board to be tested on the plurality of groove plates 102 respectively, the plurality of groove plates 102 are made of rubber materials, the edge of the lower end of the double-sided circuit board can be automatically clamped in the groove plates 102 and is in an upright state, the conveying belt 101 runs to convey the double-sided circuit board at the moment, when one double-sided circuit board is conveyed to the middle of the two movable plates 202, the worker controls the two movable plates 202 to descend and then controls the two movable plates 202 to be close to each other, the two movable plates 202 drive the plurality of probes 403 to be close to each other respectively, the plurality of probes 403 are contacted with two sides of the double-sided circuit board respectively, and the plurality of probes 403 are externally connected onto an existing circuit board tester to further realize the function of testing the circuit board.
A plurality of springs 404 all play the effect of buffering, after probe 403 and circuit board take place to contact, spring 404 produces tensile, the test dynamics of simulation staff, and then can avoid probe 403 and circuit board to take place rigid contact, lead to probe 403 or circuit board to damage, slide on movable plate 202 through control fixed plate 402, and then can adjust the distance between two probes 403 on a movable plate 202, the staff can come to adjust the distance between two probes 403 according to the circuit board of difference, because two holes that are used for probe 403 gliding have all been seted up on every fixed plate 402, and then the staff can increase or reduce the quantity of probe 403 on the fixed plate 402 according to actual demand.
Referring to fig. 6, a schematic diagram of an embodiment of the present invention for facilitating adjustment of the test angle of the probe 403 is shown, and further,
each fixing plate 402 is rotatably connected with a limiting block 401 through a shaft, the shaft is provided with threads, and the limiting blocks 401 can be fixed on the fixing plates 402 through nuts.
Rectangular through grooves are formed in the two moving plates 202, the fixing plate 402 can slide on the moving plates 202 in cooperation with the limiting block 401, an operator rotates the fixing plate 402, the fixing plate 402 rotates relative to the limiting block 401, the function of adjusting the rotation angle of the probe 403 is achieved, testing on different circuit boards or different positions on the same circuit board is facilitated, the fixing plate 402 is fixed with the limiting block 401 through nuts at last, the limiting block 401 plays a limiting role, and the probe 403 can be guaranteed to keep moving linearly on the fixing plate 402.
Referring to fig. 6, there is shown a schematic diagram of an embodiment capable of implementing the function of simultaneously controlling the movement of two probes 403 according to the present invention, and further,
each moving plate 202 is fixedly connected with a first electric push rod 302 through a bolt, the moving end of each first electric push rod 302 is fixedly connected with a push block 301 through a bolt, each push block 301 is hinged with two first push-pull rods 303 through a shaft, and each limiting block 401 is hinged with one first push-pull rod 303 through a shaft.
The staff stretches out and draws back through controlling the removal end of first electric putter 302, and then drives ejector pad 301 and stretch out and draw back, and ejector pad 301 drives two first push-pull rods 303 respectively and carries out the push-and-pull to two stopper 401, and then realizes the function that two probes 403 moved of simultaneous control.
Referring to fig. 4-5, there are shown schematic diagrams of the up and down movement function of probe 403 that can be implemented in accordance with the present invention, and further,
this device still includes two and removes frame 201, removes all through bolt fixedly connected with slide bar 203 on the frame 201, and two movable plates 202 are sliding connection respectively on two remove frames 201, all offer on two movable plates 202 to be used for cooperating the gliding hole of slide bar 203.
The staff can realize the function of moving the probe 403 up and down by controlling the two moving plates 202 to slide on the two slide bars 203 respectively, the two slide bars 203 respectively play a role in limiting the moving plates 202, and the probe 403 can be ensured to vertically move up and down, so that the circuit board can be detected at multiple positions.
Referring to fig. 5, a schematic diagram of an embodiment capable of controlling the movement of two moving plates 202 according to the present invention is shown, and further,
the first motor 205 of equal ability through bolt fixedly connected with on two removal framves 201, the removal end of two first motors 205 all has seted up the internal thread through the first lead screw 204 of shaft coupling fixedly connected with on two movable plates 202, and two movable plates 202 are threaded connection respectively on two first lead screws 204.
The two first motors 205 are started, the two first motors 205 respectively drive the two first lead screws 204 to rotate, and then the two first lead screws 204 respectively drive the two moving plates 202 to slide on the two sliding rods 203, so that the function of moving the moving plates 202 is realized.
Referring to fig. 8, there is shown a schematic view of an embodiment for facilitating control of a plurality of probes 403 to be brought close to each other while maintaining linear movement according to the present invention, and further,
this device still includes support frame 501, and two remove the equal sliding connection of frame 201 on support frame 501, offer on the support frame 501 to be used for two gliding grooves of removing frame 201.
The support frame 501 has the effect of limiting the two movable frames 201, so that the plurality of probes 403 can be conveniently controlled to be close to each other and keep linear movement.
Referring to fig. 8-10, schematic diagrams of embodiments of the present invention that enable synchronized control of two mobile gantries 201 are shown, and further,
the second motor 504 is fixedly connected to the support frame 501 through a bolt, the second lead screw 505 is fixedly connected to an output shaft of the second motor 504 through a coupler, the lifting plate 502 is connected to the second lead screw 505 through threads, internal threads are formed in the lifting plate 502, the lifting plate 502 is hinged to the two second push-pull rods 503 through shafts, and one ends of the two second push-pull rods 503 are hinged to the two moving frames 201 through the shafts respectively.
The second motor 504 is started, the second motor 504 drives the second lead screw 505 to rotate, the second lead screw 505 can drive the lifting plate 502 to lift, meanwhile, the lifting plate 502 drives the two second push-pull rods 503 to respectively push the two moving frames 201, and then synchronous control over the two moving frames 201 can be achieved, so that the plurality of probes 403 are synchronously close to the circuit board, and the circuit board is prevented from being inclined due to single-side testing.
Referring to fig. 8-10, schematic diagrams of embodiments of functions capable of locating wiring boards in accordance with the present invention are shown, and further,
the two gears 602 are rotatably connected to the support frame 501 through bearings, the two gears 602 are fixedly connected to the clamping plate 603 through bolts, the lifting plate 502 is fixedly connected to the double-sided rack 601 through bolts, and the double-sided rack 601 is respectively in meshing transmission with the two gears 602.
When the lifting plate 502 descends, the two moving frames 201 are opened, meanwhile, the lifting plate 502 drives the double-sided rack 601 to move downwards, the double-sided rack 601 drives the two gears 602 to rotate, the two gears 602 drive the two clamping plates 603 to expand respectively, when a circuit board is detected, the lifting plate 502 ascends, the two moving frames 201 are close to, meanwhile, the double-sided rack 601 ascends, the double-sided rack 601 drives the two gears 602 to rotate reversely, the two gears 602 drive the two clamping plates 603 to close to respectively, at the moment, the two clamping plates 603 can clamp the upper end edge of the circuit board, the circuit board is positioned, and the circuit board is prevented from inclining and the test effect is influenced due to the fact that the circuit board is contacted with the probes 403.
When testing the circuit board and having the quality problem, the staff rises through control support frame 501, and then can directly extract the circuit board from the frid 102 in through two splint 603, then the operation of cooperation conveyer belt 101, directly place the unqualified circuit board of quality in the middle of two frids 102, and then the staff of being convenient for identifies it, makes things convenient for on next step to detect the maintenance.
Referring to fig. 9, there is shown an intention of an embodiment capable of increasing the frictional force between the wiring board and the two clamping plates 603 according to the present invention, and further,
two all glue fixedly connected with rubber strip on the splint 603.
The rubber strip is used for increasing the friction force between the circuit board and the two clamping plates 603, so that the circuit board is prevented from falling off and breaking, and meanwhile, the circuit board is prevented from being damaged due to extrusion force.
Referring to fig. 4, there is shown a view of an embodiment of the present invention capable of moving the supporting frame 501 up and down, and further,
two second electric push rods 104 are fixedly connected to the base 103 through bolts, and the support frame 501 is fixedly connected to the moving ends of the two second electric push rods 104 through bolts.
By controlling the extension and retraction of the two second electric push rods 104, the support frame 501 can be driven to move up and down, so that the circuit board can be conveniently pulled out of the slot plate 102.
Claims (10)
1. A circuit board test platform which is characterized in that: the conveying device comprises a base (103), wherein a conveying belt (101) which plays a role in conveying is arranged on the base (103), a plurality of groove plates (102) are fixedly connected to the conveying belt (101), two moving plates (202) are arranged above the conveying belt (101), two fixed plates (402) are arranged on the two moving plates (202), probes (403) are slidably connected to each fixed plate (402), and springs (404) are fixedly connected between each probe (403) and each fixed plate (402).
2. A circuit board test platform according to claim 1, wherein: each fixing plate (402) is rotatably connected with a limiting block (401).
3. A circuit board test platform according to claim 2, wherein: the movable plate is characterized in that a first electric push rod (302) is fixedly connected to each movable plate (202), a push block (301) is fixedly connected to the moving end of each first electric push rod (302), two first push-pull rods (303) are hinged to each push block (301), and each limiting block (401) is hinged to one first push-pull rod (303).
4. A circuit board test platform according to claim 3, wherein: the movable type trolley is characterized by further comprising two movable frames (201), sliding rods (203) are fixedly connected to the movable frames (201), and the two movable plates (202) are respectively connected to the two movable frames (201) in a sliding mode.
5. A circuit board test platform according to claim 4, wherein: two equal fixedly connected with first motor (205) on removing frame (201), the equal fixedly connected with first lead screw (204) of removal end of two first motor (205), two movable plates (202) are threaded connection respectively on two first lead screw (204).
6. A circuit board test platform according to claim 5, wherein: still include support frame (501), two move frame (201) equal sliding connection on support frame (501).
7. A circuit board test platform according to claim 6, wherein: the support frame (501) is fixedly connected with a second motor (504), an output shaft of the second motor (504) is fixedly connected with a second lead screw (505), the second lead screw (505) is connected with a lifting plate (502) in a threaded manner, the lifting plate (502) is hinged with two second push-pull rods (503), and one ends of the two second push-pull rods (503) are hinged to the two moving frames (201) respectively.
8. A circuit board test platform according to claim 7, wherein: support frame (501) are gone up to rotate and are connected with two gears (602), and equal fixedly connected with splint (603) are gone up in two gears (602), fixedly connected with two-sided rack (601) on lifter plate (502), and two-sided rack (601) mesh transmission respectively with two gears (602).
9. A circuit board test platform according to claim 8, wherein: two all fixedly connected with rubber strip on splint (603).
10. A circuit board test platform according to claim 8, wherein: two second electric push rods (104) are fixedly connected to the base (103), and the supporting frame (501) is fixedly connected to the moving ends of the two second electric push rods (104).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210872195.3A CN115078974A (en) | 2022-07-23 | 2022-07-23 | Circuit board test platform |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210872195.3A CN115078974A (en) | 2022-07-23 | 2022-07-23 | Circuit board test platform |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN115078974A true CN115078974A (en) | 2022-09-20 |
Family
ID=83243703
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210872195.3A Pending CN115078974A (en) | 2022-07-23 | 2022-07-23 | Circuit board test platform |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115078974A (en) |
Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0605818A1 (en) * | 1992-12-18 | 1994-07-13 | Tescon Co., Ltd. | Method and apparatus of testing printed circuit board |
| CN103344905A (en) * | 2013-06-18 | 2013-10-09 | 深圳市大族激光科技股份有限公司 | Moving needle bed testing machine and testing method |
| TWM466266U (en) * | 2013-05-31 | 2013-11-21 | Schmid Automation Asia Co Ltd | Hard board double-sided inspection device |
| US20180217200A1 (en) * | 2015-08-07 | 2018-08-02 | Xcerra Corp. | Positioning device for a parallel tester for testing printed circuit boards and parallel tester for testing printed circuit boards |
| CN207895035U (en) * | 2017-12-28 | 2018-09-21 | 重庆市中光电显示技术有限公司 | The two-sided rapid detection tool of circuit board |
| CN209417080U (en) * | 2018-08-23 | 2019-09-20 | 华为技术有限公司 | A kind of test device, equipment and system |
| CN111781489A (en) * | 2020-07-02 | 2020-10-16 | 广德王氏智能电路科技有限公司 | Automatic PCB defect inspection equipment |
| CN111983428A (en) * | 2020-08-18 | 2020-11-24 | 北京无线电测量研究所 | Fixing device and fixing method for double-sided flying probe test of circuit board |
| CN212303274U (en) * | 2020-06-27 | 2021-01-05 | 厦门利尔德自动化科技有限公司 | Automatic magnetizing assembly machine |
| CN112798824A (en) * | 2020-12-28 | 2021-05-14 | 滁州安飞信电子科技有限公司 | Frame electronic product detection smelting tool is pushed down in mill's vacuum |
| CN214409227U (en) * | 2021-02-26 | 2021-10-15 | 重庆创祥电源有限公司 | Testing device for storage battery |
| CN214667603U (en) * | 2021-04-14 | 2021-11-09 | 广州力赛计量检测有限公司 | Calibrating device for high-voltage switch mechanical characteristic tester |
| CN214952561U (en) * | 2020-12-05 | 2021-11-30 | 嘉兴光弘科技电子有限公司 | Disposable board-splitting test tool for circuit board verification |
| CN113809656A (en) * | 2021-10-15 | 2021-12-17 | 隋大明 | Power distribution cabinet |
| CN113848358A (en) * | 2021-09-17 | 2021-12-28 | 吴祥辉 | Intelligent prepayment control metering box |
| CN114739610A (en) * | 2022-05-13 | 2022-07-12 | 鹰潭市云探电子科技有限公司 | Probe elasticity durability presses testing arrangement |
-
2022
- 2022-07-23 CN CN202210872195.3A patent/CN115078974A/en active Pending
Patent Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0605818A1 (en) * | 1992-12-18 | 1994-07-13 | Tescon Co., Ltd. | Method and apparatus of testing printed circuit board |
| TWM466266U (en) * | 2013-05-31 | 2013-11-21 | Schmid Automation Asia Co Ltd | Hard board double-sided inspection device |
| CN103344905A (en) * | 2013-06-18 | 2013-10-09 | 深圳市大族激光科技股份有限公司 | Moving needle bed testing machine and testing method |
| US20180217200A1 (en) * | 2015-08-07 | 2018-08-02 | Xcerra Corp. | Positioning device for a parallel tester for testing printed circuit boards and parallel tester for testing printed circuit boards |
| CN207895035U (en) * | 2017-12-28 | 2018-09-21 | 重庆市中光电显示技术有限公司 | The two-sided rapid detection tool of circuit board |
| CN209417080U (en) * | 2018-08-23 | 2019-09-20 | 华为技术有限公司 | A kind of test device, equipment and system |
| CN212303274U (en) * | 2020-06-27 | 2021-01-05 | 厦门利尔德自动化科技有限公司 | Automatic magnetizing assembly machine |
| CN111781489A (en) * | 2020-07-02 | 2020-10-16 | 广德王氏智能电路科技有限公司 | Automatic PCB defect inspection equipment |
| CN111983428A (en) * | 2020-08-18 | 2020-11-24 | 北京无线电测量研究所 | Fixing device and fixing method for double-sided flying probe test of circuit board |
| CN214952561U (en) * | 2020-12-05 | 2021-11-30 | 嘉兴光弘科技电子有限公司 | Disposable board-splitting test tool for circuit board verification |
| CN112798824A (en) * | 2020-12-28 | 2021-05-14 | 滁州安飞信电子科技有限公司 | Frame electronic product detection smelting tool is pushed down in mill's vacuum |
| CN214409227U (en) * | 2021-02-26 | 2021-10-15 | 重庆创祥电源有限公司 | Testing device for storage battery |
| CN214667603U (en) * | 2021-04-14 | 2021-11-09 | 广州力赛计量检测有限公司 | Calibrating device for high-voltage switch mechanical characteristic tester |
| CN113848358A (en) * | 2021-09-17 | 2021-12-28 | 吴祥辉 | Intelligent prepayment control metering box |
| CN113809656A (en) * | 2021-10-15 | 2021-12-17 | 隋大明 | Power distribution cabinet |
| CN114739610A (en) * | 2022-05-13 | 2022-07-12 | 鹰潭市云探电子科技有限公司 | Probe elasticity durability presses testing arrangement |
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