CN115078955A - Method and device for evaluating component in circuit and circuit - Google Patents
Method and device for evaluating component in circuit and circuit Download PDFInfo
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- CN115078955A CN115078955A CN202210994445.0A CN202210994445A CN115078955A CN 115078955 A CN115078955 A CN 115078955A CN 202210994445 A CN202210994445 A CN 202210994445A CN 115078955 A CN115078955 A CN 115078955A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/27—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2608—Circuits therefor for testing bipolar transistors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2621—Circuits therefor for testing field effect transistors, i.e. FET's
Abstract
The invention relates to the field of evaluation of circuit components, and discloses a method, a device and a circuit for evaluating component components in a circuit, wherein the method comprises the following steps: for any of the components in the circuit, an evaluation is made according to the following and the four legs are in a forward non-conducting state prior to the evaluation: controlling the branch where the component part is located and the branch on the opposite side of the component part to be conducted in the forward direction and continue for a first preset time so as to charge the charge-discharge module; controlling the branch where the component part is located not to be conducted in the forward direction but the branch on the opposite side of the component part to be conducted in the forward direction and lasting for a second preset time so as to enable the charge-discharge module to discharge; acquiring evaluation parameters of the component parts; and judging the state of the component part according to the acquired evaluation parameter and a preset evaluation parameter so as to evaluate the component part. By this, realized need not to dismantle component parts and can carry out the evaluation to component parts in the operating condition of circuit.
Description
Technical Field
The invention relates to the field of evaluation of circuit components, in particular to a method, a device and a circuit for evaluating component components in a circuit.
Background
Under the background of energy crisis and urgent energy transformation which are dominated by petroleum, new energy power generation such as photovoltaic and the like is an effective means for solving the problem of difficult power utilization and distributed power generation in remote areas. As early as 2007, china has become the world's largest photovoltaic manufacturing country with annual output reaching 1088 megawatts. Huge generated energy needs to be converted into electric energy through power electronic equipment such as a converter and the like so as to meet basic conditions of grid-connected operation. Therefore, the photovoltaic grid-connected inverter has an important influence on the reliable operation of the whole photovoltaic power generation system. However, the natural environment of the photovoltaic power plant is generally harsh, and the internal devices are subjected to high electrical stress and high thermal stress for a long time. Meanwhile, the fault occurrence rate of the photovoltaic inverter can be improved due to the influence of disturbance on the power grid and the direct current side. According to research statistics, the frequency of the inverter in failure is up to 60% in three common failure categories in the operation process of the photovoltaic power station, and the inverter belongs to failure high-power equipment. And studies have shown that the failure of the photovoltaic inverter due to a power device IGBT failure accounts for around 40% of the total failure. Therefore, an IGBT reliability evaluation and dynamic parameter extraction system based on the photovoltaic grid-connected actual working condition is urgently needed.
An IGBT reliability assessment and dynamic parameter testing system based on actual single-phase photovoltaic grid-connected inversion working conditions does not exist so far. If reliability assessment based on actual working conditions is required, the output of the single-phase grid inverter is often connected to a power grid simulator for IGBT aging, the method is high in cost (the power grid simulator is expensive in equipment price), and dynamic characteristics of the IGBT are difficult to measure. If the IGBT is subjected to the double-pulse test, the IGBT needs to be detached from the inverter, so that the single-phase photovoltaic inverter can be damaged, and the time and labor cost is huge.
Disclosure of Invention
It is an aim of embodiments of the present invention to provide a method and apparatus for assessing a component in an electrical circuit and an electrical circuit which addresses, or at least partially addresses, the above mentioned problems.
In order to achieve the above object, an aspect of embodiments of the present invention provides a method for evaluating a component part in a circuit, the method including: for any of the components in the circuit, an evaluation is made according to the following and four legs are in a forward non-conducting state prior to the evaluation: the circuit comprises a power supply module, at least four component parts and a charge-discharge module, wherein the component parts are located between two ends of the power supply module and distributed on the four branch circuits, the four branch circuits are combined in two and connected in series between two ends of the power supply module, the charge-discharge module is located between a first connection point and a second connection point, the first connection point and the second connection point are connection points of the two branch circuits connected in series in the four branch circuits, the opposite side branch circuit of the component part is a branch circuit which is not connected in series with the branch circuit of the component part and is located at a different side relative to the branch circuit of the charge-discharge module and the component part, the component parts are IGBT or MOSFET; controlling the forward direction of the branch where the component part is located not to be conducted, but controlling the forward direction of the branch at the opposite side of the component part to be conducted and lasting for a second preset time, so that the charge-discharge module discharges; acquiring evaluation parameters of the component parts, wherein the evaluation parameters comprise rise time, fall time, turn-on delay time and turn-off delay time; and judging the state of the component part according to the acquired evaluation parameter and a preset evaluation parameter so as to evaluate the component part.
Optionally, before the obtaining of the evaluation parameter of the component part, the method further includes: and controlling the branch where the component is located and the opposite branch of the component to be in forward conduction for a third preset time.
Optionally, in a case where the four branches are not in the forward non-conductive state before the component is evaluated, the method further includes: and controlling the four branches not to conduct in the positive direction.
Optionally, the at least four components include four components, the circuit further includes a power grid and a switch module, the power grid and the charge-discharge module are connected together between the first connection point and the second connection point, and the switch module is located between the power grid and the charge-discharge module, and the method further includes: and controlling the switch module to enable the charge-discharge module to be connected between the first connection point and the second connection point but the power grid is not connected between the first connection point and the second connection point when any component is evaluated.
Optionally, the switch module includes a first circuit breaker, a second circuit breaker and a third circuit breaker, wherein the charge-discharge module is connected between the first connection point and the first circuit breaker, the first circuit breaker is connected between the charge-discharge module and the power grid, the third circuit breaker is connected between the power grid and the second connection point, and the second circuit breaker is connected in parallel with the first circuit breaker, the power grid and the third circuit breaker; the controlling the switch module so that the charge-discharge module is connected between the first connection point and the second connection point but the power grid is not connected between the first connection point and the second connection point when any one of the components is evaluated comprises: controlling the first and third circuit breakers to open and the second circuit breaker to close.
Optionally, the component is an IGBT, and the evaluation parameters further include a voltage between a collector and an emitter, a voltage between a gate and the emitter, and a collector current.
Optionally, controlling the branch in which the component is located to be in forward conduction or not in forward conduction is realized by applying a pulse to the component in the branch.
Accordingly, another aspect of the embodiments of the present invention provides an apparatus for evaluating a component part in an electrical circuit, the apparatus comprising: the evaluation module is used for carrying out evaluation on any component in the circuit according to the following contents, and four branches are in a positive non-conduction state before the evaluation: the circuit comprises a power supply module, at least four components and a charge-discharge module, wherein the at least four components are positioned between two ends of the power supply module and distributed on the four branches, the four branches are combined in two pairs and connected in series between two ends of the power supply module, the charge-discharge module is positioned between a first connecting point and a second connecting point, the first connecting point and the second connecting point are connecting points of two branches connected in series in the four branches, the opposite branch of the component is a branch which is not connected in series with the branch of the component and is positioned at different sides relative to the branch of the charge-discharge module and the component, the component parts are IGBT or MOSFET; controlling the forward direction of the branch where the component part is located not to be conducted, but controlling the forward direction of the branch at the opposite side of the component part to be conducted and lasting for a second preset time, so that the charge-discharge module discharges; acquiring evaluation parameters of the component parts, wherein the evaluation parameters comprise rise time, fall time, turn-on delay time and turn-off delay time; and judging the state of the component part according to the acquired evaluation parameter and a preset evaluation parameter so as to evaluate the component part.
Optionally, the evaluation module is further configured to: and before the evaluation parameters of the component are obtained, controlling the branch where the component is located and the opposite branch of the component to be in forward conduction for a third preset time.
Optionally, the evaluation module is further configured to: and under the condition that the four branches are not in a forward non-conduction state before the component is evaluated, controlling the four branches to be in a forward non-conduction state.
Optionally, the at least four components include four components, the circuit further includes a power grid and a switch module, the power grid and the charge-discharge module are connected together between the first connection point and the second connection point, and the switch module is located between the power grid and the charge-discharge module; the evaluation module is further configured to: and controlling the switch module to enable the charge-discharge module to be connected between the first connection point and the second connection point but the power grid is not connected between the first connection point and the second connection point when any component is evaluated.
Optionally, the switch module includes a first circuit breaker, a second circuit breaker and a third circuit breaker, wherein the charge-discharge module is connected between the first connection point and the first circuit breaker, the first circuit breaker is connected between the charge-discharge module and the power grid, the third circuit breaker is connected between the power grid and the second connection point, and the second circuit breaker is connected in parallel with the first circuit breaker, the power grid and the third circuit breaker; the evaluation module controls the switch module so that when any one component is evaluated, the charging and discharging module is connected between the first connection point and the second connection point but the power grid is not connected between the first connection point and the second connection point, and the method comprises the following steps: and controlling the first circuit breaker and the third circuit breaker to be opened and controlling the second circuit breaker to be closed.
Optionally, the component is an IGBT, and the evaluation parameters further include a voltage between a collector and an emitter, a voltage between a gate and the emitter, and a collector current.
Optionally, the evaluation module controls the branch in which the component is located to be in forward conduction or in forward non-conduction by applying a pulse to the component in the branch.
In addition, another aspect of the embodiment of the invention also provides a circuit, which comprises the component parts, and the component parts are evaluated according to the method.
According to the technical scheme, in the circuit, the charging and discharging of the charging and discharging module are controlled by controlling the forward conduction and the forward non-conduction of the branch where the component to be evaluated is located and the forward conduction of the branch on the opposite side, so that the evaluation parameters of the component can be obtained, and the state of the component is judged according to the obtained evaluation parameters to realize the evaluation of the component, so that the component can be evaluated without disassembling the component in the actual working condition of the circuit, the probability of damage to the component to be evaluated is reduced, and the time and labor cost are reduced; in addition, the evaluation method is simple, power grid simulator equipment is not needed, and cost is reduced.
Drawings
FIG. 1 is a flow diagram of a method for evaluating components in an electrical circuit according to one embodiment of the present invention;
FIG. 2 is a schematic diagram of a circuit provided in accordance with another embodiment of the present invention;
FIG. 3 is a schematic diagram of a circuit provided by another embodiment of the present invention;
FIG. 4 is a schematic diagram of a circuit provided in accordance with another embodiment of the present invention;
FIG. 5 is a schematic diagram of a circuit provided by another embodiment of the present invention;
FIG. 6 is a schematic diagram of a circuit provided in accordance with another embodiment of the present invention; and
fig. 7 is a schematic diagram of an applied pulse signal provided by another embodiment of the present invention.
Description of the reference numerals
1. A first IGBT; 2. a second IGBT; 3. a third IGBT; 4. a fourth IGBT; s. the 1 A first circuit breaker; s 2 A second circuit breaker; s 3 A third circuit breaker; q 1 A first main pipe; q 2 A second main pipe; q 3 A third main pipe; q 4 A fourth main pipe; d 1 A first freewheeling diode; d 2 A second freewheeling diode; d 3 A third freewheeling diode; d 4 A fourth fly-wheel diode; l, inductance; A. a first connection point; B. a second connection point; u shape DC And a direct current power supply.
Detailed Description
The following detailed description of embodiments of the invention refers to the accompanying drawings. It should be understood that the detailed description and specific examples, while indicating the present invention, are given by way of illustration and explanation only, not limitation.
One aspect of embodiments of the present invention provides a method for evaluating a component in an electrical circuit.
Fig. 1 is a flow chart of a method for evaluating components in an electrical circuit according to an embodiment of the present invention. As shown in fig. 1, the method includes the following. The following description is given by taking a component to be evaluated as an example, and any component to be evaluated may be evaluated according to the following description. Further, before the evaluation, the four branches were in a state of positive non-conduction. It should be noted that, in the embodiment of the present invention, a branch is a branch in which component parts are located, and all component parts are distributed on four branches; whether each leg comprises several components, all components are distributed over four legs. Four branchesEach branch of (a) comprises at least one component, the forward conduction and the forward non-conduction of the branch being dependent on whether the component comprised in the branch is conducting in the forward direction or not. The component parts can be IGBTs or MOSFETs, the IGBTs or MOSFETs comprise main pipes and freewheeling diodes, and if current passes through the IGBTs or MOSFETs through the main pipes, the IGBTs or MOSFETs are conducted in the forward direction; if the main pipe is non-conductive, the IGBT or MOSFET is non-conductive in the forward direction. For example, as shown in fig. 2, the component is an IGBT, and for the branch where the first IGBT1 is located, if the current flows through the first main pipe Q 1 When the current flows through the first IGBT1, the first IGBT1 is in forward conduction, and the branch where the first IGBT1 is located is in forward conduction; if the current flows through the first freewheeling diode D 1 Flows through the first IGBT1 but the first main pipe Q 1 If the current is non-conductive, the first IGBT1 is not conductive in the forward direction, and the branch where the first IGBT1 is located may flow current, but the branch where the first IGBT1 is located is not conductive in the forward direction. For any branch, under the condition that all components in the branch are conducted in the forward direction, the branch is conducted in the forward direction; in the event that at least one component in the branch is non-conductive in the forward direction, the branch is non-conductive in the forward direction. In addition, the circuit comprises a power supply module, at least four components and a charge-discharge module. At least four components are located between two ends of the power supply module and distributed on four branches, for example, as shown in fig. 2, there are 4 IGBTs, each IGBT is located in one branch, and there are four branches. For example, as shown in fig. 2, the branch where the first IGBT1 is located and the branch where the third IGBT 3 is located are connected in series at both ends of the power supply, and the branch where the second IGBT 2 is located and the branch where the fourth IGBT4 is located are connected in series at both ends of the power supply. The charge-discharge module is located between a first connection point and a second connection point, where the first connection point and the second connection point are connection points of two branches connected in series in four branches, for example, as shown in fig. 2, a first connection point a is a connection point of a branch where the first IGBT1 is located and a branch where the third IGBT 3 is located, and a second connection point B is a connection point of a branch where the second IGBT 2 is located and a branch where the fourth IGBT4 is located. The opposite side branch of the component is not connected with the branch where the component is located in series and is opposite to the charge-discharge module and the componentThe branch in which the element is located is a branch on different sides, for example, the branch in which the first IGBT1 is located and the branch in which the fourth IGBT4 is located are opposite side branches to each other, and the branch in which the second IGBT 2 is located and the branch in which the third IGBT 3 is located are opposite side branches to each other. The component parts may be IGBTs or MOSFETs. In addition, the power supply module is in a power supply state when the evaluation is performed. Alternatively, the power supply module may be a dc power supply. Alternatively, the charge and discharge module may be an inductor. Optionally, the circuit may further include a capacitor; the capacitor is connected in parallel at two ends of the power supply module and used for storing energy; the capacitor and the power supply module are combined together to realize a stable output power supply. Alternatively, the power supply module may obtain electric energy based on photovoltaics.
In step S10, the branch where the component is located and the branch opposite to the component are controlled to be in forward conduction for a first preset time, so as to charge the charge and discharge module. The first preset time is related to the preset charging current value of the component to be evaluated, and can be set according to the preset charging current value.
In step S11, the branch where the component is located is controlled to be not conductive in the forward direction but the opposite branch of the component is controlled to be conductive in the forward direction for a second preset time, so that the charge and discharge module discharges. Wherein the second preset time is related to the switching frequency of the component to be evaluated, and can be set according to the switching frequency of the component to be evaluated.
In step S12, evaluation parameters of the component parts are acquired, wherein the evaluation parameters include a rise time, a fall time, an on-delay time, and an off-delay time. For example, an oscilloscope is connected to the component to be evaluated, and the evaluation parameters are acquired by the oscilloscope.
In step S13, the status of the component part is determined according to the acquired evaluation parameter and the preset evaluation parameter to evaluate the component part. Specifically, the evaluation parameters include a rise time, a fall time, an on-delay time, and an off-delay time, and the preset evaluation parameters set a threshold value for each of the evaluation parameters, respectively, that is, the preset evaluation parameters include a preset rise time, a preset fall time, a preset on-delay time, and a preset off-delay time; and judging the state of the component according to the acquired evaluation parameters and the preset evaluation parameters, namely comparing each item in the evaluation parameters with a corresponding threshold value to judge the state of the component. Optionally, the state of the component part is judged according to the obtained evaluation parameter and the preset evaluation parameter, where the state of the component part is judged to be poor when at least one of the evaluation parameters does not reach the corresponding preset threshold.
According to the technical scheme, in the circuit, the charging and discharging of the charging and discharging module are controlled by controlling the forward conduction and the forward non-conduction of the branch where the component to be evaluated is located and the forward conduction of the branch on the opposite side, so that the evaluation parameters of the component can be obtained, and the state of the component is judged according to the obtained evaluation parameters to realize the evaluation of the component, so that the component can be evaluated without disassembling the component in the actual working condition of the circuit, the probability of damage to the component to be evaluated is reduced, and the time and labor cost are reduced; in addition, the evaluation method is simple, power grid simulator equipment is not needed, and cost is reduced.
Optionally, in an embodiment of the present invention, before obtaining the evaluation parameter of the component part, the method further includes: and controlling the forward conduction of the branch where the component part is located and the opposite side branch of the component part and continuing for a third preset time. The third preset time is related to the switching frequency of the component to be evaluated, and can be set according to the switching frequency of the component to be evaluated. The forward conduction of the branch where the component to be evaluated is located and the opposite side branch of the component is controlled again, so that the obtained evaluation parameters can be more accurate; in addition, the reverse recovery current can also be acquired, so that the evaluation parameter can comprise the reverse recovery current; in addition, under the condition that the charging and discharging module is an inductor, a turn-off peak caused by stray inductance can be acquired, so that the evaluation parameters can include the turn-off peak caused by the stray inductance.
Optionally, in an embodiment of the present invention, in a case that the four branches are not in the positive non-conducting state before the evaluation of the component part, the method further includes: and controlling the four branches to be non-conductive in the forward direction.
Optionally, in an embodiment of the present invention, the at least four components include four components, the circuit further includes a power grid and a switch module, the power grid and the charge-discharge module are connected together between the first connection point and the second connection point, and the switch module is located between the power grid and the charge-discharge module, and the method further includes: the control switch module enables the charge-discharge module to be connected between the first connection point and the second connection point but the power grid is not connected between the first connection point and the second connection point when any component is evaluated.
Optionally, in an embodiment of the present invention, the switch module includes a first circuit breaker, a second circuit breaker, and a third circuit breaker, where the charge and discharge module is connected between the first connection point and the first circuit breaker, the first circuit breaker is connected between the charge and discharge module and the power grid, the third circuit breaker is connected between the power grid and the second connection point, and the second circuit breaker is connected in parallel with the first circuit breaker, the power grid, and the third circuit breaker; the control switch module makes the charge-discharge module connect between first tie point and second tie point but the electric wire netting is not connected between first tie point and second tie point when carrying out the appraisal to arbitrary component including: and controlling the first circuit breaker and the third circuit breaker to be opened and controlling the second circuit breaker to be closed.
Alternatively, in the embodiment of the present invention, the component may be an IGBT, and the evaluation parameter may further include a voltage between a collector and an emitter, a voltage between a gate and an emitter, and a collector current. Specifically, the voltage between the collector and the emitter and the voltage between the gate and the emitter may be measured using a high voltage probe, the collector current may be measured using a rogowski coil, the high voltage probe and the rogowski coil are connected to an oscilloscope, and the voltage between the collector and the emitter, the voltage between the gate and the emitter, and the collector current may be acquired by the oscilloscope.
Optionally, in the embodiment of the present invention, controlling the branch in which the component is located to be in forward conduction or in forward non-conduction may be achieved by applying a pulse to the component in the branch. For example by applying a positive going pulse or a negative going pulse. For a certain branch, no matter a plurality of components in the branch, controlling the forward conduction of the branch to be that all the components in the branch are applied with pulses to make the forward conduction of all the components so as to make the branch conduct in the forward direction; the branch is controlled to be non-conductive in the forward direction by pulsing at least one component in the branch such that the at least one component is non-conductive in the forward direction, thereby rendering the branch non-conductive in the forward direction. Specifically, for the MOSFET, for an N-channel enhancement type MOSFET, a positive pulse is applied to conduct in a positive direction, and a negative pulse is applied to not conduct in a positive direction; for a P-channel enhancement type MOSFET, a negative pulse is applied to conduct in a positive direction, and a positive pulse is applied to not conduct in a positive direction. For the IGBT, positive pulse is applied to the NPN type IGBT, positive conduction is carried out, negative pulse is applied, and positive conduction is carried out; and for the PNP type IGBT, negative pulse is applied to conduct in the positive direction, and positive pulse is applied to not conduct in the positive direction.
The method for evaluating the components in the circuit according to the embodiment of the present invention is described in detail with reference to fig. 2 to 7. In the embodiment, the components are IGBTs and NPN IGBTs, the circuit is in a single-phase photovoltaic grid-connected working condition, the power supply module is a direct-current power supply, the direct-current power supply supplies power by means of photovoltaic, and the circuit comprises a capacitor.
In the embodiment, the IGBT does not need to be detached from the circuit, the single-phase photovoltaic grid-connected inversion working condition can normally operate when the IGBT is not evaluated, and the IGBT can be normally used for aging; when the IGBT needs to be evaluated, a dynamic parameter (i.e., the evaluation parameter described in the above embodiment) representing a dynamic characteristic change of the aged IGBT may be extracted, so as to evaluate the IGBT according to the dynamic parameter, that is, monitor a state of the IGBT. Although the reliability assessment based on the actual working conditions has been paid attention by practitioners at home and abroad, the reliability assessment and the state monitoring of the IGBT based on the photovoltaic grid-connected actual working conditions are still deficient. Based on the current situation, the embodiment of the invention provides an IGBT reliability evaluation technology based on a single-phase photovoltaic grid-connected working condition so as to more accurately evaluate the reliability of the IGBT in the single-phase photovoltaic grid-connected inverter system. The IGBT dynamic parameter extraction technology based on the single-phase photovoltaic grid-connected inversion operation condition provided by the embodiment of the invention not only can realize the actual single-phase photovoltaic grid-connected operation condition, but also can realize the IGBT double-pulse test by means of circuit control, thereby avoiding the disassembly of the IGBT. In this embodiment, a circuit for evaluating the reliability of the IGBT based on the single-phase photovoltaic grid-connected inverter operation condition may be as shown in fig. 2.
The circuit is described in connection with fig. 2. As shown in fig. 2, a total of 4 IGBTs are included, namely a first IGBT1, a second IGBT 2, a third IGBT 3, and a fourth IGBT4, each IGBT occupies one branch, and the 4 IGBTs constitute an inverter. The first IGBT1 comprises a first main tube Q 1 And a first freewheeling diode D 1 The second IGBT 2 comprises a second main pipe Q 2 And a second freewheeling diode D 2 And the third IGBT 3 comprises a third main pipe Q 3 And a third freewheeling diode D 3 And the fourth IGBT4 comprises a fourth main tube Q 4 And a fourth freewheeling diode D 4 . The branch where the first IGBT1 is located and the branch where the third IGBT 3 is located are connected in series with a direct current power supply U through a first connecting point A DC The branch where the second IGBT 2 is located and the branch where the fourth IGBT4 is located are connected in series with the direct current power supply U through a second connection point B DC At both ends of the same. The branch where the first IGBT1 is located and the branch where the fourth IGBT4 is located are opposite side branches to each other, and the branch where the second IGBT 2 is located and the branch where the third IGBT 3 is located are opposite side branches to each other. DC power supply U DC The two sides are connected in parallel with a capacitor. The charge-discharge module is an inductor L. The switch module comprises a first circuit breaker S 1 A second breaker S 2 And a third circuit breaker S 3 Wherein the inductance L is connected between the first connection point A and the first breaker S 1 First circuit breaker S 1 Connected between the inductor L and the grid, a third circuit breaker S 3 Connected between the grid and a second connection point B, a second circuit breaker S 2 And a first breaker S 1 Grid and third circuit breaker S 3 And (4) connecting in parallel. In addition, the IGBT reliability evaluation provided by the embodiment of the invention comprises two parts, namely a single-phase inversion part and a circuit breaker part. When the IGBT is not evaluated, the first breaker S 1 And a third circuit breaker S 3 Closed, second breaker S 2 When the inverter is disconnected, the inverter is in a grid-connected operation state, and the circuit is in a normal working state; when the IGBT is evaluated, a first breaker S 1 And a third circuit breaker S 3 Open, second breaker S 2 When the IGBT on the inverter side is in a test mode, the direct-current power supply on the inverter side only needs to provide the loss power of the whole system, namely the direct-current power supply supplies power normally; the circuit breaker can be controlled to be opened or closed by sending an opening instruction or a closing instruction. In addition, in the embodiment, when the IGBT is evaluated, the IGBT is controlled to be forward-conducting or forward-non-conducting by applying a pulse voltage to the IGBT, and each branch in which the IGBT is located has only one IGBT, so that the forward-conducting or forward-non-conducting of the IGBT is the forward-conducting or forward-non-conducting of the branch in which the IGBT is located; and, the double pulse is used for evaluation, namely the evaluated IGBT undergoes three processes of forward conduction, forward non-conduction and forward conduction again.
In order to implement the double-pulse test of the inverter-side IGBT, before performing the evaluation, the circuit needs to be shut down from a normal operating state, and all the IGBTs are in an off state, that is, all the IGBTs are controlled to be in a forward non-conducting state, as shown in fig. 3. This can be achieved, for example, by pulsing all IGBTs.
The fourth IGBT4 is taken as a measured object, and the technical solution provided by the embodiment of the present invention is exemplarily described below. Note that, when other IGBTs are evaluated, the evaluation can be made with reference to the following.
When the fourth IGBT4 is evaluated, the fourth IGBT4 and the first IGBT1 are pulsed at voltages as shown in fig. 7. Wherein, the pulse voltage applied to the fourth IGBT4 and the first IGBT1 is actually applied to the fourth main pipe Q 4 And a first main pipe Q 1 The gate voltage applied to the fourth IGBT4 and the first IGBT1 by applying the pulse voltage is as shown in fig. 7.
At a time period t 0 ~t 1 Meanwhile, the first IGBT1 and the fourth IGBT4 are applied with a forward directionVoltage, the first IGBT1 and the fourth IGBT4 are simultaneously conducted in the forward direction, that is, the branch where the first IGBT1 is located and the branch where the fourth IGBT4 is located are controlled to be conducted in the forward direction, and the second breaker S 2 Turning off the DC power supply U DC The inductor L is charged by the first IGBT1 and the fourth IGBT4, and the current path is as shown in fig. 4. The magnitude of the forward voltage can be set according to the requirement of the device under test.
At a time period t 1 ~t 2 Meanwhile, a positive voltage is applied to the first IGBT1, and a negative voltage is applied to the fourth IGBT4, that is, the branch in which the fourth IGBT4 is located is controlled to be non-conductive in the positive direction, and the branch in which the first IGBT1 is located is controlled to be conductive in the positive direction. The fourth IGBT4 is not conducted in the forward direction, the first IGBT1 is conducted in the forward direction, and the current on the inductor L passes through the first IGBT1 and the second freewheeling diode D 2 Freewheeling is achieved, i.e. the inductor L is discharged, the freewheeling path being shown in fig. 5. The negative voltage (turn-off voltage) can be set according to the requirement of the device to be tested.
At a time period t 2 ~t 3 Meanwhile, forward voltages are applied to the first IGBT1 and the fourth IGBT4, and the first IGBT1 and the fourth IGBT4 are simultaneously turned on in the forward direction, that is, the branch where the first IGBT1 is located and the branch where the fourth IGBT4 is located are controlled to be turned on in the forward direction, and at this time, the value of the current flowing through the fourth IGBT4 is the set desired value, and the current path is as shown in fig. 6. Wherein the set desired value can be set according to the requirements of the device under test.
With reference to the above, a double pulse test of the fourth IGBT4 is achieved, at t 1 And t 2 Dynamic parameters (namely the evaluation parameters in the embodiment of the invention) of on-load and off-load of the IGBT can be extracted at any moment, and the state evaluation of the aged IGBT is realized. The mainly extracted dynamic parameters include rising time, falling time, turn-on delay time, turn-off delay time, voltage Vce between the collector and the emitter, voltage Vge between the gate and the emitter, and collector current Ic. Measuring voltage Vce and Vge by using a high-voltage probe, measuring current Ic by using a Rogowski coil, connecting the high-voltage probe and the Rogowski coil with an oscilloscope, connecting the fourth IGBT4 with the oscilloscope, setting the oscilloscope, and using the oscilloscopeAnd acquiring a switching time oscillogram of the fourth IGBT4, and acquiring Vce, Vge, Ic, rising time, falling time, turn-on delay time and turn-off delay time through an oscilloscope. And then comparing the extracted dynamic parameters with the rated dynamic parameters (preset evaluation parameters) of the DataSheat of the fourth IGBT4 to be tested, judging the state of the device to be tested at the moment, and realizing the state monitoring of the aged IGBT, namely evaluating the IGBT.
According to the above content, the technical scheme provided by the embodiment of the invention is an IGBT reliability testing method based on single-phase photovoltaic grid-connected actual working conditions, and the IGBT reliability testing method has the following characteristics: 1) the IGBT double-pulse test is realized by cooperatively controlling the on-off states of the circuit breaker and the inversion side device; 2) the filter inductor is used as a follow current inductor for double-pulse testing; 3) adding a breaker for blocking power flow at the network access side of the grid-connected inverter; 4) the double-pulse test can be carried out without plugging the tested device, and the dynamic characteristic parameters are extracted.
The technical scheme provided by the embodiment of the invention has the following advantages: 1) the double-pulse test and grid-connected operation modes of the single-phase photovoltaic grid-connected inverter are realized based on the three circuit breakers; 2) compared with the prior scheme, the device to be tested does not need to be plugged and plugged, the measurement can be carried out only by controlling the on-off states of the breaker and the IGBT, the on-line extraction of the dynamic characteristic of the IGBT is realized, and the method is safe, reliable, convenient and fast.
Accordingly, another aspect of embodiments of the present invention provides an apparatus for evaluating a component in an electrical circuit. The device includes: the evaluation module is used for carrying out evaluation on any component in the circuit according to the following contents, and the four branches are in a positive non-conduction state before the evaluation: the circuit comprises a power supply module, at least four component parts and a charge-discharge module, wherein the at least four component parts are positioned between two ends of the power supply module and distributed on the four branch circuits, the four branch circuits are combined in pairs and connected in series between two ends of the power supply module, the charge-discharge module is positioned between a first connection point and a second connection point, the first connection point and the second connection point are connection points of the two branch circuits which are connected in series in the four branch circuits, the opposite branch circuit of the component part is a branch circuit which is not connected in series with the branch circuit of the component part and is positioned at different sides relative to the charge-discharge module and the branch circuit of the component part, and the component part is an IGBT or an MOSFET; controlling the branch where the component part is located not to be conducted in the forward direction but the branch on the opposite side of the component part to be conducted in the forward direction and lasting for a second preset time so as to enable the charge-discharge module to discharge; acquiring evaluation parameters of the component parts, wherein the evaluation parameters comprise rise time, fall time, turn-on delay time and turn-off delay time; and judging the state of the component part according to the acquired evaluation parameter and a preset evaluation parameter so as to evaluate the component part.
Optionally, in an embodiment of the present invention, the evaluation module is further configured to: and before the evaluation parameters of the components are obtained, controlling the branch where the components are located and the opposite side branch of the components to be in forward conduction and continuing for a third preset time.
Optionally, in an embodiment of the present invention, the evaluation module is further configured to: and controlling the four branches to be in the forward non-conduction state under the condition that the four branches are not in the forward non-conduction state before the evaluation of the component part is carried out.
Optionally, in an embodiment of the present invention, the at least four components include four components, the circuit further includes a power grid and a switch module, the power grid and the charge and discharge module are connected together between the first connection point and the second connection point, and the switch module is located between the power grid and the charge and discharge module; the evaluation module is further configured to: the control switch module enables the charge-discharge module to be connected between the first connection point and the second connection point but the power grid is not connected between the first connection point and the second connection point when any component is evaluated.
Optionally, in an embodiment of the present invention, the switch module includes a first circuit breaker, a second circuit breaker, and a third circuit breaker, where the charge and discharge module is connected between the first connection point and the first circuit breaker, the first circuit breaker is connected between the charge and discharge module and the power grid, the third circuit breaker is connected between the power grid and the second connection point, and the second circuit breaker is connected in parallel with the first circuit breaker, the power grid, and the third circuit breaker; the evaluation module controls the switch module to enable the charge-discharge module to be connected between the first connection point and the second connection point but the power grid is not connected between the first connection point and the second connection point when any component is evaluated, and the evaluation module comprises: and controlling the first circuit breaker and the third circuit breaker to be opened and controlling the second circuit breaker to be closed.
Optionally, in an embodiment of the present invention, the component is an IGBT, and the evaluation parameter further includes a voltage between a collector and an emitter, a voltage between a gate and the emitter, and a collector current.
Optionally, in the embodiment of the present invention, the evaluation module controls the branch in which the component is located to be in forward conduction or in forward non-conduction by applying a pulse to the component in the branch.
The specific operating principle and benefits of the apparatus for evaluating a component in a circuit provided in the embodiment of the present invention are similar to those of the method for evaluating a component in a circuit provided in the embodiment of the present invention, and will not be described herein again.
In addition, another aspect of the embodiments of the present invention also provides a circuit including a component part, which is evaluated according to the method described in the above embodiments.
The preferred embodiments of the present invention have been described in detail above with reference to the accompanying drawings, but the present invention is not limited thereto. Within the scope of the technical idea of the invention, numerous simple modifications can be made to the technical solution of the invention, including combinations of the individual specific technical features in any suitable way. The invention is not described in detail in order to avoid unnecessary repetition. Such simple modifications and combinations should be considered within the scope of the present disclosure as well.
Claims (15)
1. A method for evaluating a component in an electrical circuit, the method comprising:
for any of the components in the circuit, an evaluation is made according to the following and four legs are in a forward non-conducting state prior to the evaluation:
the circuit comprises a power supply module, at least four component parts and a charge-discharge module, wherein the component parts are located between two ends of the power supply module and distributed on the four branch circuits, the four branch circuits are combined in two and connected in series between two ends of the power supply module, the charge-discharge module is located between a first connection point and a second connection point, the first connection point and the second connection point are connection points of the two branch circuits connected in series in the four branch circuits, the opposite side branch circuit of the component part is a branch circuit which is not connected in series with the branch circuit of the component part and is located at a different side relative to the branch circuit of the charge-discharge module and the component part, the component parts are IGBT or MOSFET;
controlling the forward direction of the branch where the component part is located not to be conducted, but controlling the forward direction of the branch at the opposite side of the component part to be conducted and lasting for a second preset time, so that the charge-discharge module discharges;
acquiring evaluation parameters of the component parts, wherein the evaluation parameters comprise rise time, fall time, turn-on delay time and turn-off delay time; and
and judging the state of the component according to the acquired evaluation parameters and preset evaluation parameters so as to evaluate the component.
2. The method of claim 1, wherein prior to said obtaining an evaluation parameter for said component part, the method further comprises:
and controlling the branch where the component is located and the opposite branch of the component to be in forward conduction for a third preset time.
3. The method of claim 1, wherein in the event that the four legs are not in a forward non-conducting state prior to evaluating the component, the method further comprises: and controlling the four branches not to conduct in the forward direction.
4. The method of claim 1, wherein the at least four components includes four components, the circuit further includes a power grid connected with the charge-discharge module between the first connection point and the second connection point, and a switch module located between the power grid and the charge-discharge module, the method further comprising:
and controlling the switch module to enable the charge-discharge module to be connected between the first connection point and the second connection point but the power grid is not connected between the first connection point and the second connection point when any component is evaluated.
5. The method of claim 4, wherein the switch module comprises a first circuit breaker, a second circuit breaker, and a third circuit breaker, wherein the charge-discharge module is connected between the first connection point and the first circuit breaker, the first circuit breaker is connected between the charge-discharge module and the grid, the third circuit breaker is connected between the grid and the second connection point, and the second circuit breaker is connected in parallel with the first circuit breaker, the grid, and the third circuit breaker;
the controlling the switch module so that the charge-discharge module is connected between the first connection point and the second connection point but the power grid is not connected between the first connection point and the second connection point when any one of the components is evaluated comprises: and controlling the first circuit breaker and the third circuit breaker to be opened and controlling the second circuit breaker to be closed.
6. The method of claim 1, wherein the component is an IGBT, and the evaluation parameters further include a collector-emitter voltage, a gate-emitter voltage, and a collector current.
7. Method according to any of claims 1-6, characterized in that controlling the branch in which the component is located to be positively conducting or non-conducting is performed by pulsing the component in the branch.
8. An apparatus for evaluating a component in an electrical circuit, the apparatus comprising:
the evaluation module is used for carrying out evaluation on any component in the circuit according to the following contents, and four branches are in a positive non-conduction state before the evaluation:
the circuit comprises a power supply module, at least four components and a charge-discharge module, wherein the at least four components are positioned between two ends of the power supply module and distributed on the four branches, the four branches are combined in two pairs and connected in series between two ends of the power supply module, the charge-discharge module is positioned between a first connecting point and a second connecting point, the first connecting point and the second connecting point are connecting points of two branches connected in series in the four branches, the opposite branch of the component is a branch which is not connected in series with the branch of the component and is positioned at different sides relative to the branch of the charge-discharge module and the component, the component parts are IGBT or MOSFET;
controlling the forward direction of the branch where the component part is located not to be conducted, but controlling the forward direction of the branch at the opposite side of the component part to be conducted and lasting for a second preset time, so that the charge-discharge module discharges;
acquiring evaluation parameters of the component, wherein the evaluation parameters comprise rise time, fall time, turn-on delay time and turn-off delay time; and
and judging the state of the component according to the acquired evaluation parameters and preset evaluation parameters so as to evaluate the component.
9. The apparatus of claim 8, wherein the evaluation module is further configured to: and before the evaluation parameters of the component are obtained, controlling the branch where the component is located and the opposite side branch of the component to be in forward conduction for a third preset time.
10. The apparatus of claim 8, wherein the evaluation module is further configured to: and under the condition that the four branches are not in a forward non-conduction state before the component is evaluated, controlling the four branches to be in the forward non-conduction state.
11. The device of claim 8, wherein the at least four components includes four components, the circuit further comprising a power grid connected with the charge-discharge module between the first connection point and the second connection point, and a switch module between the power grid and the charge-discharge module;
the evaluation module is further configured to: and controlling the switch module to enable the charge-discharge module to be connected between the first connection point and the second connection point but the power grid is not connected between the first connection point and the second connection point when any component is evaluated.
12. The apparatus of claim 11, wherein the switch module comprises a first circuit breaker, a second circuit breaker, and a third circuit breaker, wherein the charge-discharge module is connected between the first connection point and the first circuit breaker, the first circuit breaker is connected between the charge-discharge module and the grid, the third circuit breaker is connected between the grid and the second connection point, and the second circuit breaker is connected in parallel with the first circuit breaker, the grid, and the third circuit breaker;
the evaluation module controls the switch module so that when any one component is evaluated, the charging and discharging module is connected between the first connection point and the second connection point but the power grid is not connected between the first connection point and the second connection point, and the method comprises the following steps: and controlling the first circuit breaker and the third circuit breaker to be opened and controlling the second circuit breaker to be closed.
13. The apparatus of claim 8, wherein the component is an IGBT, and the evaluation parameters further include a collector-emitter voltage, a gate-emitter voltage, and a collector current.
14. The device according to any one of claims 8-13, wherein the evaluation module controls the branch in which the component is located to be in forward conduction or in forward non-conduction by applying a pulse to the component in the branch.
15. An electrical circuit comprising a component that is evaluated according to the method of any one of claims 1-7.
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017051049A (en) * | 2015-09-04 | 2017-03-09 | 富士電機株式会社 | Driving device for semiconductor element |
| CN108111004A (en) * | 2017-12-29 | 2018-06-01 | 电子科技大学 | A kind of hybrid device for realizing Si IGBT Sofe Switch characteristics |
| CN109143009A (en) * | 2017-06-15 | 2019-01-04 | 许继电气股份有限公司 | A kind of IGBT power module test macro |
| CN111707919A (en) * | 2020-06-29 | 2020-09-25 | 全球能源互联网研究院有限公司 | IGBT device test circuit and test method |
| CN113970688A (en) * | 2021-10-26 | 2022-01-25 | 特变电工西安电气科技有限公司 | General test platform and test method for IGBT power module |
| US11277127B1 (en) * | 2019-05-15 | 2022-03-15 | H. Alan Mantooth | Intelligent multi-level voltage gate driving system for semiconductor power devices |
-
2022
- 2022-08-18 CN CN202210994445.0A patent/CN115078955B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017051049A (en) * | 2015-09-04 | 2017-03-09 | 富士電機株式会社 | Driving device for semiconductor element |
| CN109143009A (en) * | 2017-06-15 | 2019-01-04 | 许继电气股份有限公司 | A kind of IGBT power module test macro |
| CN108111004A (en) * | 2017-12-29 | 2018-06-01 | 电子科技大学 | A kind of hybrid device for realizing Si IGBT Sofe Switch characteristics |
| US11277127B1 (en) * | 2019-05-15 | 2022-03-15 | H. Alan Mantooth | Intelligent multi-level voltage gate driving system for semiconductor power devices |
| CN111707919A (en) * | 2020-06-29 | 2020-09-25 | 全球能源互联网研究院有限公司 | IGBT device test circuit and test method |
| CN113970688A (en) * | 2021-10-26 | 2022-01-25 | 特变电工西安电气科技有限公司 | General test platform and test method for IGBT power module |
Non-Patent Citations (3)
| Title |
|---|
| SATYARANJAN JENA 等: ""Realization of double band hysteresis current controller for single phase grid connected pulse width modulated voltage source inverter"", 《2015 INTERNATIONAL CONFERENCE ON MAN AND MACHINE INTERFACING》 * |
| 张茂强等: "基于SiC MOSFET的电力电子变压器双有源桥功率模块设计", 《浙江电力》 * |
| 李德正 等: ""Heric 逆变器驱动电路研究与设计"", 《电子器件》 * |
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