CN114966342A - 基于波导终端短路法高温高压下介电性能测试系统及方法 - Google Patents
基于波导终端短路法高温高压下介电性能测试系统及方法 Download PDFInfo
- Publication number
- CN114966342A CN114966342A CN202210589680.XA CN202210589680A CN114966342A CN 114966342 A CN114966342 A CN 114966342A CN 202210589680 A CN202210589680 A CN 202210589680A CN 114966342 A CN114966342 A CN 114966342A
- Authority
- CN
- China
- Prior art keywords
- waveguide
- temperature
- test
- pressure
- high temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 93
- 238000000034 method Methods 0.000 title claims abstract description 34
- 239000000463 material Substances 0.000 claims abstract description 74
- 229910052751 metal Inorganic materials 0.000 claims description 43
- 239000002184 metal Substances 0.000 claims description 43
- 230000017525 heat dissipation Effects 0.000 claims description 25
- 238000010438 heat treatment Methods 0.000 claims description 25
- 238000009413 insulation Methods 0.000 claims description 20
- 238000012937 correction Methods 0.000 claims description 12
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 12
- 238000001816 cooling Methods 0.000 claims description 11
- 230000006698 induction Effects 0.000 claims description 10
- 239000010453 quartz Substances 0.000 claims description 10
- 238000001514 detection method Methods 0.000 claims description 7
- 239000002131 composite material Substances 0.000 claims description 6
- 238000011049 filling Methods 0.000 claims description 6
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 6
- 230000005540 biological transmission Effects 0.000 claims description 5
- 239000003989 dielectric material Substances 0.000 claims description 5
- 230000008569 process Effects 0.000 claims description 5
- 238000006243 chemical reaction Methods 0.000 claims description 3
- 238000009792 diffusion process Methods 0.000 claims description 3
- 238000011068 loading method Methods 0.000 claims description 3
- 238000012544 monitoring process Methods 0.000 claims description 3
- 238000003825 pressing Methods 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 2
- 230000005855 radiation Effects 0.000 claims description 2
- 230000008054 signal transmission Effects 0.000 claims description 2
- 230000009471 action Effects 0.000 abstract description 4
- 238000001028 reflection method Methods 0.000 abstract description 3
- 238000005259 measurement Methods 0.000 abstract description 2
- 238000009774 resonance method Methods 0.000 abstract description 2
- 238000011160 research Methods 0.000 description 5
- 239000011358 absorbing material Substances 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 4
- ILRRQNADMUWWFW-UHFFFAOYSA-K aluminium phosphate Chemical compound O1[Al]2OP1(=O)O2 ILRRQNADMUWWFW-UHFFFAOYSA-K 0.000 description 2
- 238000000605 extraction Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 230000005672 electromagnetic field Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 238000004154 testing of material Methods 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Description
Claims (7)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202210589680.XA CN114966342B (zh) | 2022-05-26 | 2022-05-26 | 基于波导终端短路法高温高压下介电性能测试系统及方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202210589680.XA CN114966342B (zh) | 2022-05-26 | 2022-05-26 | 基于波导终端短路法高温高压下介电性能测试系统及方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN114966342A true CN114966342A (zh) | 2022-08-30 |
CN114966342B CN114966342B (zh) | 2024-08-16 |
Family
ID=82954899
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202210589680.XA Active CN114966342B (zh) | 2022-05-26 | 2022-05-26 | 基于波导终端短路法高温高压下介电性能测试系统及方法 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN114966342B (zh) |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101158702A (zh) * | 2007-10-30 | 2008-04-09 | 电子科技大学 | 基于终端短路法的介质材料高温复介电常数测量方法 |
CN101329376A (zh) * | 2008-07-29 | 2008-12-24 | 中国科学院物理研究所 | 高温高压下样品的介电常数和介电损耗测量装置及方法 |
CN101329375A (zh) * | 2008-07-29 | 2008-12-24 | 中国科学院物理研究所 | 低温高压下样品的介电常数和介电损耗测量装置及方法 |
CN105170981A (zh) * | 2015-10-12 | 2015-12-23 | 福州大学 | 一种微波热压烧结与钎焊装置及其使用方法 |
CN107796831A (zh) * | 2017-10-20 | 2018-03-13 | 山东大学 | 一种用于测量材料微波热效应的微波量热仪及其量热方法 |
CN110703054A (zh) * | 2019-10-29 | 2020-01-17 | 山东省科学院自动化研究所 | 基于太赫兹自由空间法的样品介电特性测试装置和方法 |
US20210208052A1 (en) * | 2020-01-07 | 2021-07-08 | Perm Inc. | Methods and Apparatus for Determining the Spatial Distribution of Materials using Electromagnetic Radiation |
US20210278351A1 (en) * | 2020-03-04 | 2021-09-09 | Saudi Arabian Oil Company | Performing microwave measurements on samples under confining pressure using coaxial resonators |
-
2022
- 2022-05-26 CN CN202210589680.XA patent/CN114966342B/zh active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101158702A (zh) * | 2007-10-30 | 2008-04-09 | 电子科技大学 | 基于终端短路法的介质材料高温复介电常数测量方法 |
CN101329376A (zh) * | 2008-07-29 | 2008-12-24 | 中国科学院物理研究所 | 高温高压下样品的介电常数和介电损耗测量装置及方法 |
CN101329375A (zh) * | 2008-07-29 | 2008-12-24 | 中国科学院物理研究所 | 低温高压下样品的介电常数和介电损耗测量装置及方法 |
CN105170981A (zh) * | 2015-10-12 | 2015-12-23 | 福州大学 | 一种微波热压烧结与钎焊装置及其使用方法 |
CN107796831A (zh) * | 2017-10-20 | 2018-03-13 | 山东大学 | 一种用于测量材料微波热效应的微波量热仪及其量热方法 |
CN110703054A (zh) * | 2019-10-29 | 2020-01-17 | 山东省科学院自动化研究所 | 基于太赫兹自由空间法的样品介电特性测试装置和方法 |
US20210208052A1 (en) * | 2020-01-07 | 2021-07-08 | Perm Inc. | Methods and Apparatus for Determining the Spatial Distribution of Materials using Electromagnetic Radiation |
US20210278351A1 (en) * | 2020-03-04 | 2021-09-09 | Saudi Arabian Oil Company | Performing microwave measurements on samples under confining pressure using coaxial resonators |
Non-Patent Citations (2)
Title |
---|
吴俊军 等: "基于开口同轴法的岩矿石样品介电常数测试", 《地球物理学报》, vol. 54, no. 2, 28 February 2011 (2011-02-28), pages 457 - 465 * |
蔡林宏: "温度场和压力场作用下吸波材料介电性能测试技术", 《中国优秀硕士学位论文全文数据库 基础科学辑》, no. 4, 15 April 2024 (2024-04-15), pages 005 - 505 * |
Also Published As
Publication number | Publication date |
---|---|
CN114966342B (zh) | 2024-08-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN101545931B (zh) | 一种基于终端短路法的高温复介电常数测量方法 | |
CN100568000C (zh) | 基于终端短路法的介质材料高温复介电常数测量方法 | |
Varadan et al. | Free-space, broadband measurements of high-temperature, complex dielectric properties at microwave frequencies | |
CN103344841B (zh) | 电介质材料介电性能变温测试用自由空间终端短路系统 | |
CN104090171B (zh) | 具有开孔短路板的材料复介电常数测试系统及方法 | |
CN209606521U (zh) | 一种测量介电常数的六边形互补开口谐振环微带传感器 | |
CN108828380B (zh) | 微波加热过程中材料电磁参数测量装置与方法 | |
CN112505429B (zh) | 基于同轴带状线谐振器的复介电常数测试系统及测试方法 | |
CN107543970B (zh) | 一种基于数据库校准方法的介电常数测量方法 | |
CN209673898U (zh) | 用于测量介电常数的互补开口谐振环微带谐振传感器及测量系统 | |
CN201666921U (zh) | 宽带高温介电性能测量装置 | |
CN106443198A (zh) | 一种同轴线测试方法 | |
CN113687148B (zh) | 一种电磁参数测量系统及其测量方法 | |
Gui et al. | Open resonator system for automatic and precise dielectric measurement at millimeter wavelengths | |
CN110763921A (zh) | 高温介电损耗特性测量系统及测量方法 | |
CN114966342B (zh) | 基于波导终端短路法高温高压下介电性能测试系统及方法 | |
US5854559A (en) | Method and apparatus for testing microwave devices and circuits in a controlled environment | |
CN109782200A (zh) | 一种材料电磁参数测量方法 | |
Olyphant et al. | Strip-line methods for dielectric measurements at microwave frequencies | |
Stutzman et al. | Broadband calibration of long lossy microwave transmission lines at cryogenic temperatures using nichrome films | |
Colpitts | Temperature sensitivity of coaxial probe complex permittivity measurements: Experimental approach | |
Yu et al. | A novel parallel-plate dielectric resonator method for broadband complex permittivity measurement in the millimeter-wave bands | |
CN109458961B (zh) | 一种便携式吸波涂层厚度测量装置及方法 | |
CN113721081B (zh) | 一种天线罩的最佳厚度的测量方法和系统 | |
CN110058056A (zh) | 一种非标测试夹具 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
CB03 | Change of inventor or designer information | ||
CB03 | Change of inventor or designer information |
Inventor after: Gao Yong Inventor after: Xie Chunmao Inventor after: He Xiao Inventor after: Li Xingxing Inventor after: Cai Linhong Inventor after: Li En Inventor after: Zhu Hui Inventor after: Zheng Hu Inventor after: Long Jiawei Inventor after: Zhang Yunpeng Inventor after: Gao Chong Inventor after: Yu Chengyong Inventor before: Gao Yong Inventor before: Xie Maochun Inventor before: He Xiao Inventor before: Li Xingxing Inventor before: Cai Linhong Inventor before: Li En Inventor before: Zhu Hui Inventor before: Zheng Hu Inventor before: Long Jiawei Inventor before: Zhang Yunpeng Inventor before: Gao Chong Inventor before: Yu Chengyong |
|
GR01 | Patent grant | ||
GR01 | Patent grant |