CN114822667A

CN114822667A - Method for accurately injecting VDT in eMMC test, storage medium and electronic equipment

Info

Publication number: CN114822667A
Application number: CN202210474231.0A
Authority: CN
Inventors: 孙成思; 孙日欣; 何阳; 李新春
Original assignee: Biwin Storage Technology Co Ltd
Current assignee: Biwin Storage Technology Co Ltd
Priority date: 2022-04-29
Filing date: 2022-04-29
Publication date: 2022-07-29

Abstract

The invention discloses a method for accurately injecting a VDT in an eMMC test, and a storage medium, namely electronic equipment. The command injected into the VDT is embedded into the data transmission process of the read-write command of the eMMC chip to be executed, so that the voltage fluctuation can be ensured to occur in the read-write process of the eMMC chip, excessive cycle test is not needed, and the test efficiency can be improved.

Description

Method for accurately injecting VDT in eMMC test, storage medium and electronic equipment

Technical Field

The invention relates to the technical field of chip testing, in particular to a method for accurately injecting VDT in an eMMC test, a storage medium and electronic equipment.

Background

With the development of technology, the application scenario of eMMC now includes not only mobile phone devices, but also household appliances such as similar intelligent wearing and set-top boxes, and vehicle-mounted control systems. Not only do customers have higher and higher requirements for performance and power consumption of storage devices, but applications like automobiles are more stringent standards for data reliability of storage devices.

Therefore, a storage manufacturer needs to pay more attention to the reliability of data and the robustness of firmware of the eMMC in an abnormal power supply state, except for abnormal power failure, the situation that power supply is unstable also occurs with a certain probability in the use process, and an eMMC manufacturer needs to construct a use case with a similar scene in the research and development test stage to improve the performance of a product under extreme conditions.

However, in the eMMC test case of the driver stage developed based on Linux uboot/kernel in the prior art, VDT (Voltage Detect) is injected into the eMMC usually at a set time, for example, 10S after the test starts, which results in that when the Voltage is injected into the eMMC, the eMMC chip is not necessarily in a read-write or other working state, and the influence of the Voltage fluctuation on the eMMC work cannot be reflected well, so that the eMMC chip often needs to be tested many times in a circulating manner, so that the Voltage fluctuation is ensured to occur in the eMMC working state, and a lot of time is consumed to complete the test of the eMMC chip.

Disclosure of Invention

The technical problem to be solved by the invention is as follows: the method, the storage medium and the equipment for accurately injecting the VDT in the eMMC test can realize accurate VDT injection in the eMMC chip test.

In order to solve the technical problems, the invention adopts the technical scheme that:

a method for accurately injecting a VDT in an eMMC test is characterized in that a command for injecting the VDT is embedded into a data transmission process of a read-write command of an eMMC chip to be executed.

In order to solve the technical problem, the invention adopts another technical scheme as follows:

a storage medium having stored thereon a computer program which, when executed by a processor, performs the steps of a method of accurately injecting VDT in eMMC testing, as described above.

an electronic device comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, the processor when executing the computer program implementing the steps of a method of accurately injecting VDT in eMMC testing as described above.

The invention has the beneficial effects that: the command injected into the VDT is embedded into the data transmission process of the read-write command of the eMMC chip to be executed, so that the voltage fluctuation can be ensured to occur in the read-write process of the eMMC chip, excessive cyclic test is not needed, and the test efficiency can be improved.

Drawings

Fig. 1 is a schematic flow chart illustrating a method for accurately injecting VDT in eMMC testing according to an embodiment of the present invention;

FIG. 2 illustrates an IIC data transmission format according to the present invention;

FIG. 3 is a waveform diagram of voltage fluctuations according to an embodiment of the present invention;

fig. 4 is a schematic structural diagram of an electronic device according to an embodiment of the present invention.

Detailed Description

In order to explain technical contents, achieved objects, and effects of the present invention in detail, the following description is made with reference to the accompanying drawings in combination with the embodiments.

Referring to fig. 1, a method for accurately injecting a VDT in an eMMC test embeds a command injected into the VDT into a data transmission process of a read/write command for an eMMC chip.

As can be seen from the above description, the beneficial effects of the present invention are: the command injected into the VDT is embedded into the data transmission process of the read-write command of the eMMC chip to be executed, so that the voltage fluctuation can be ensured to occur in the read-write process of the eMMC chip, excessive cyclic test is not needed, and the test efficiency can be improved.

Further, the method specifically comprises the following steps:

step S1, sending a read or write data command to the eMMC, and sending or reading data to the eMMC chip after receiving a read or write data command response;

step S2, injecting VDT;

in step S3, the data transfer is completed, and a stop transfer command is sent to the eMMC chip.

As can be seen from the above description, it is realized that the command injected into the VDT is embedded in the data transmission process of the read-write command to the eMMC chip.

Further, the step S2 specifically includes:

a pre-built function is called, and parameters are given to inject VDT.

According to the description, the efficiency of chip testing is improved by calling the function which is constructed in advance.

Further, the given parameter specifically includes a fluctuation range of the voltage.

As can be seen from the above description, by giving the fluctuation value of the voltage, various voltage fluctuation conditions can be simulated.

Further, the pre-constructed function includes adjusting VCC and/or VCCQ to a first set voltage for a first set time, and then adjusting VCC and/or VCCQ to a second set voltage for a second set time.

From the above description, it can be seen that the fluctuation of the voltage is simulated by giving the set voltage value, and the injection of the VDT is realized.

Further, the method includes step S0, setting the power supply VCC of the eMMC to a first set value, setting the power supply VCCQ of the eMMC to a second set value, and performing initialization on the eMMC.

As can be seen from the above description, the eMMC power supply at the beginning is made normal by initialization.

Further, in step S2, the command of injecting VDT is sent to the PMIC through the IIC protocol and executed by the PMIC.

As can be seen from the above description, the PMIC can simulate the fluctuation of the voltage with a set slope and a set fluctuation range, and can better detect the performance of the eMMC.

Another embodiment of the present invention provides a storage medium having stored thereon a computer program that, when executed by a processor, performs the steps of a method for accurately injecting VDT in eMMC testing as described above.

Referring to fig. 4, another embodiment of the present invention provides an electronic device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor executes the computer program to implement the steps of the method for accurately injecting VDT in eMMC test.

The invention discloses a method, a storage medium and equipment for accurately injecting a VDT in an eMMC test, which are used for accurately injecting the VDT when the eMMC executes operation in the eMMC test, in particular to accurately injecting the VDT when the eMMC executes read-write operation.

Referring to fig. 1, a first embodiment of the present invention is:

a method of accurately injecting VDT in eMMC testing, comprising the steps of:

step S0 sets the power supply VCC of the eMMC to a first set value, sets the power supply VCCQ of the eMMC to a second set value, and performs initialization on the eMMC.

In this embodiment, the first set value is specifically 3.3V, the VCCQ is a voltage provided for a controller in the eMMC chip, and in this embodiment, the second set value is specifically 1.8V.

Step S1, send a read or write data command to the eMMC, and send or read data to the eMMC chip after receiving a read or write data command response.

In this embodiment, one or more injections of VDT may also be performed before sending the read or write data command.

Or after receiving the read or write data command response, the eMMC chip sends or reads data after performing one or more times of VDT injection.

In step S2, VDT for the power VCC and/or the power VCCQ is injected.

Specifically, in this embodiment, a function that is constructed in advance is called, different parameters are given, the parameters may specifically include a voltage fluctuation value, so as to complete one-time VDT injection, which may be VCC voltage injection, VCCQ voltage injection, or both voltage injections, a Linux uboot open source code is adopted as a basis for software development, and the open source code may refer to the following websites:

https://github.com/hardkernel/u-boot.git-b odroidxu4-v2017.05。

the environment building of the software can refer to the following websites:

https://wiki.odroid.com/odroid-xu4/software/building_u-boot_mainline。

and sending the interface function to the PMIC through an IIC protocol according to the constructed interface function so as to realize voltage fluctuation.

Specifically, in the present embodiment, the one-time VDT implantation includes: setting VCC to 2.4V and holding VCC at 2.4V for 1ms, then adjusting VCC back to 3.3V and holding for 2ms, which results in the waveform shown in fig. 3, which is a clock signal, VCCQ signal, and VCC signal in sequence from top to bottom in fig. 3.

It is worth noting that the triggering of the VDT is not single, but may be triggered multiple times during one read command or one write command, i.e., step S2 may be executed multiple times.

In this embodiment, one or more injections of VDT may also be performed before the stop transmission command is sent.

Or after receiving the transmission stopping command response, the eMMC chip sends or reads data after performing one or more times of VDT injection.

The second embodiment of the invention is as follows:

a storage medium having stored thereon a computer program that, when executed by a processor, performs the steps of a method of one embodiment for accurately injecting a VDT in eMMC testing.

EXAMPLE III

Referring to fig. 4, an electronic device includes a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor executes the computer program to implement the steps of a method for accurately injecting VDT in eMMC testing according to an embodiment.

In summary, according to the method for accurately injecting the VDT in the eMMC test, the storage medium, and the electronic device provided by the present invention, the VDT injection command is embedded into the data transmission process of the read/write command for the eMMC chip and is executed, so that it is ensured that the voltage fluctuation occurs in the read/write process of the eMMC chip, excessive cycle tests are not required, and the test efficiency can be improved.

In the above embodiments provided in the present application, it should be understood that the disclosed method, apparatus, computer-readable storage medium, and electronic device may be implemented in other ways. For example, the above-described apparatus embodiments are merely illustrative, and for example, the division of the modules is only one logical division, and other divisions may be realized in practice, for example, a plurality of components or modules may be combined or integrated into another apparatus, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or components or modules, and may be in an electrical, mechanical or other form.

The components described as separate parts may or may not be physically separate, and parts displayed as components may or may not be physical modules, may be located in one place, or may be distributed on a plurality of network modules. Some or all of the components can be selected according to actual needs to achieve the purpose of the solution of the embodiment.

In addition, functional modules in the embodiments of the present invention may be integrated into one processing module, or each component may exist alone physically, or two or more modules are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode.

The integrated module, if implemented in the form of a software functional module and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention, which is substantially or partly contributed by the prior art, or all or part of the technical solution may be embodied in a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to perform all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.

It should be noted that for simplicity and convenience of description, the above-described method embodiments are shown as a series of combinations of acts, but it should be understood by those skilled in the art that the present invention is not limited by the order of acts, as some steps may occur in other orders or concurrently in accordance with the invention. Further, those skilled in the art will appreciate that the embodiments described in the specification are presently preferred and that no acts or modules are necessarily required of the invention.

In the above embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.

The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all equivalent changes made by using the contents of the present specification and the drawings, or applied directly or indirectly to the related technical fields, are included in the scope of the present invention.

Claims

1. A method for accurately injecting a VDT in an eMMC test is characterized in that a command for injecting the VDT is embedded into a data transmission process of a read-write command of an eMMC chip to be executed.

2. The method of claim 1, wherein the method for accurately injecting VDT in eMMC testing specifically comprises the steps of:

step S1, sending a read or write data command to the eMMC chip, and sending or reading data to the eMMC chip after receiving a read or write data command response;

step S2, injecting VDT;

3. The method according to claim 2, wherein the step S2 specifically includes:

a pre-built function is called, and parameters are given to inject VDT.

4. The method of claim 3, wherein the given parameter specifically includes a fluctuation range of the voltage.

5. The method of claim 4, wherein the pre-established function comprises adjusting VCC and/or VCCQ to a first set voltage for a first set time, and then adjusting VCC and/or VCCQ to a second set voltage for a second set time.

6. The method of claim 2, further comprising:

7. The method of claim 2, wherein the step S2 is performed by sending a command to inject VDT to the PMIC via the IIC protocol.

8. A storage medium having stored thereon a computer program which, when executed by a processor, performs the steps of a method of accurately injecting VDT in eMMC testing as claimed in any one of claims 1 to 7.

9. An electronic device comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, wherein the processor when executing the computer program performs the steps of a method of accurately injecting VDT in eMMC testing as claimed in any one of claims 1 to 7.