CN114720874A - Method for measuring solar cells Isc and Voc in sections - Google Patents
Method for measuring solar cells Isc and Voc in sections Download PDFInfo
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- CN114720874A CN114720874A CN202210222072.5A CN202210222072A CN114720874A CN 114720874 A CN114720874 A CN 114720874A CN 202210222072 A CN202210222072 A CN 202210222072A CN 114720874 A CN114720874 A CN 114720874A
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- voc
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/378—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC] specially adapted for the type of battery or accumulator
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/382—Arrangements for monitoring battery or accumulator variables, e.g. SoC
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/389—Measuring internal impedance, internal conductance or related variables
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- General Physics & Mathematics (AREA)
- Photovoltaic Devices (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a method for measuring solar cells Isc and Voc in sections, which is realized by separately carrying out an Isc measuring step, a Voc measuring step and an IV scanning step, wherein the Isc measuring step and the Voc measuring step are selected to be carried out or are separately carried out according to any sequence; when the Isc measuring step or the Voc measuring step is selected to be carried out, firstly carrying out the Isc measuring step or the Voc measuring step, and finally carrying out the IV scanning step; when the Isc measurement step and the Voc measurement step are performed separately in an arbitrary order, the Isc measurement step or the Voc measurement step is performed first, followed by the IV scanning step or finally performed the IV scanning step. According to the invention, the Isc measuring step, the Voc measuring step and the IV scanning step are separately and independently carried out, so that the accurate values of Isc and Voc can be accurately measured, and the IV curve is obtained by scanning, so that the accuracy of measuring the electrical parameters of the solar cell can be greatly improved.
Description
Technical Field
The invention relates to the technical field of solar cell testing, in particular to a method for measuring solar cells Isc and Voc in a segmented mode.
Background
At present, the Isc and Voc values of the solar cell and the solar cell module are obtained by taking the points at two ends of a drawn curve, namely the Isc and the Voc, as the test values of the solar cell after forward scanning (from the short-circuit state Isc to the open-circuit state Voc) or reverse scanning (from the open-circuit state Voc to the short-circuit state Isc) is completed within a certain time, and calculating the electrical parameters such as power and efficiency, as shown in fig. 1.
With the improvement of the solar cell efficiency, the method for fitting the Isc and the Voc in the IV measurement or the method for obtaining the intersection point of the IV curve and the intersection point is influenced by the cell characteristics (such as capacitance effect) (not in a real open circuit or short circuit state), the accuracy of the obtained Isc and Voc is reduced, and meanwhile, the data obtained by the cell measurement needs to be corrected according to the Isc and Voc, so that the accuracy of the data obtained by the solar cell measurement (such as power P, efficiency Eff and fill factor FF) is reduced, and the power and the efficiency are influenced. The reason why the high-capacitance battery needs longer measurement time is that each scanning point needs to obtain a true value when the voltage on the internal capacitor is consistent with the voltage on the electronic load, so that the higher the capacitance is, the longer the stabilization time and the measurement time are needed.
Therefore, when the test object is a high-capacitance solar cell, or during the scanning process of the electronic load, the circuit problem has an inaccurate value, that is, Isc or Voc does not reach the intersection point, the test is inaccurate, as shown in fig. 2.
Disclosure of Invention
The invention aims to solve the defects in the prior art and provides a method for measuring solar cells Isc and Voc in a segmented mode.
In order to achieve the purpose, the invention provides the following technical scheme:
a method for measuring the Isc and Voc of a solar cell in a segmentation way is realized by separately performing an Isc measuring step, a Voc measuring step and an IV scanning step, wherein the Isc measuring step and the Voc measuring step are performed alternatively or separately in any sequence; when the Isc measuring step or the Voc measuring step is selected to be carried out, firstly carrying out the Isc measuring step or the Voc measuring step, and finally carrying out the IV scanning step; when the Isc measurement step and the Voc measurement step are performed separately in an arbitrary order, the Isc measurement step or the Voc measurement step is performed first, followed by the IV scanning step or finally performed the IV scanning step. In particular, the Isc measurement step is the actual true value Isc measured when the circuit is in a true short circuit condition. The Isc measurement step is the actual true value Voc measured when the circuit is in a true open state.
Specifically, as a preferred embodiment of the present invention, the method is performed in the following order: firstly, a Voc measuring step, then an Isc measuring step and finally an IV scanning step are carried out.
Specifically, as a preferred embodiment of the present invention, the method is performed in the following order: the method comprises the steps of firstly carrying out Isc measurement, then carrying out Voc measurement and finally carrying out IV scanning.
Specifically, as a preferred embodiment of the present invention, the method is performed in the following order: firstly, a Voc measuring step is carried out, then an IV scanning step is carried out, and finally an Isc measuring step is carried out.
Specifically, as a preferred embodiment of the present invention, the method is performed in the following order: firstly, an Isc measuring step is carried out, then an IV scanning step is carried out, and finally a Voc measuring step is carried out.
Specifically, as a preferred embodiment of the present invention, the method is performed in the following order: the Isc measurement step is performed first, and the IV scanning step is performed last.
Specifically, as a preferred embodiment of the present invention, the method is performed in the following order: the Voc measurement step is performed first, and the IV scanning step is performed last.
The beneficial effects of the invention are as follows:
according to the invention, the Isc measuring step, the Voc measuring step and the IV scanning step are separately and independently carried out, so that the accurate values of Isc and Voc can be accurately measured, and the IV curve is obtained by scanning, so that the accuracy of measuring the electrical parameters of the solar cell can be greatly improved.
Drawings
FIG. 1 is a prior art IV curve taken using forward or reverse scanning;
FIG. 2 is a prior art IV curve obtained by scanning a high-capacity solar cell in either a forward or reverse direction;
FIG. 3 is a graph obtained by measurement using the method of example 1;
FIG. 4 is a graph obtained by measurement using the method of example 2;
FIG. 5 is a graph obtained by measurement using the method of example 3;
FIG. 6 is a graph obtained by measurement using the method of example 4;
FIG. 7 is a graph obtained by measurement using the method of example 5;
FIG. 8 is a graph obtained by measurement using the method of example 6.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When a component is referred to as being "connected" to another component, it can be directly connected to the other component or intervening components may also be present. When a component is referred to as being "disposed on" another component, it can be directly on the other component or intervening components may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
The invention provides a method for measuring solar cells Isc and Voc in sections, which is realized by separately performing an Isc measuring step, a Voc measuring step and an IV scanning step, wherein the Isc measuring step and the Voc measuring step are selected to be performed or are separately performed according to any sequence; when the Isc measuring step or the Voc measuring step is selected to be carried out, firstly carrying out the Isc measuring step or the Voc measuring step, and finally carrying out the IV scanning step; when the Isc measurement step and the Voc measurement step are performed separately in an arbitrary order, the Isc measurement step or the Voc measurement step is performed first, followed by the IV scanning step or finally performed the IV scanning step. In particular, the Isc measurement step is the actual true value Isc measured when the circuit is in a true short circuit condition. The Isc measurement step is the actual true value Voc measured when the circuit is in a true open state.
Example 1
As a preferred embodiment of the present invention, the method is carried out in the following order: firstly, a Voc measuring step, then an Isc measuring step and finally an IV scanning step are carried out. As shown in fig. 3, during the time from 0 to t1, the circuit is in a true open state, and an actual true value Voc is measured; measuring an actual true value Isc when the circuit is in a real short-circuit state within the time from t1 to t 2; during the time t2-t3, the electronic load scanning process, i.e., the IV scanning step, obtains an IV curve. As can be seen from fig. 3, even if the electronic load scan is incomplete during the measurement process, the curve is fitted, and the true values of Voc and Isc are not affected.
Example 2
Specifically, as a preferred embodiment of the present invention, the method is performed in the following order: the method comprises the steps of firstly carrying out Isc measurement, then carrying out Voc measurement and finally carrying out IV scanning. As shown in FIG. 4, in the time period 0-t1, the circuit is in the real short circuit state, and the actual true value Isc is measured; measuring actual true Voc when the circuit is in a real open circuit state within the time from t1 to t 2; during the time t2-t3, the electronic load scanning process, i.e., the IV scanning step, obtains an IV curve. Even in the process, as can be seen from fig. 3, even if the electronic load scan is incomplete during the measurement process, the curve is completed by fitting, and the fact that Voc and Isc take true values is not affected.
Example 3
Specifically, as a preferred embodiment of the present invention, the method is performed in the following order: firstly, a Voc measuring step is carried out, then an IV scanning step is carried out, and finally an Isc measuring step is carried out. As shown in fig. 5, during the time from 0 to t1, the circuit is in a true open state, and an actual true value Voc is measured; in the time period from t1 to t2, the electronic load scans to obtain an IV curve; and in the time period from t2 to t3, the circuit is in a real short circuit state, and an actual true value Isc is measured.
Example 4
Specifically, as a preferred embodiment of the present invention, the method is performed in the following order: as shown in FIG. 6, in the time 0-t1, the circuit is in the real short circuit state, and the actual true value Isc is measured; in the time period from t1 to t2, the electronic load scans to obtain an IV curve; and in the time period from t2 to t3, the circuit is in a real open circuit state, and an actual true value Voc is measured.
Example 5
Specifically, as a preferred embodiment of the present invention, the method is performed in the following order: the Isc measurement step is performed first, and the IV scanning step is performed last. As shown in fig. 7, during the time from 0 to t1, the circuit is in a true open state, and an actual true value Voc is measured; during the time t1-t2, the IV curve is obtained by the electronic load scanning process.
Example 6
Specifically, as a preferred embodiment of the present invention, the method is performed in the following order: the Voc measurement step is performed first, and the IV scanning step is performed last. As shown in FIG. 8, in the time period 0-t1, the circuit is in the real short circuit state, and the actual true value Isc is measured; during the time t1-t2, the IV curve is obtained by the electronic load scanning process.
According to the embodiments, the Isc measurement step, the Voc measurement step and the IV scanning step are performed separately and independently, so that the accurate values of Isc and Voc can be measured accurately, and the IV curve is obtained by scanning, so that the accuracy of measuring the electrical parameters of the solar cell can be greatly improved.
Furthermore, those skilled in the art will appreciate that while some embodiments described herein include some features included in other embodiments, rather than other features, combinations of features of different embodiments are meant to be within the scope of the invention and form different embodiments. For example, in the claims above, any of the claimed embodiments may be used in any combination. The information disclosed in this background section is only for enhancement of understanding of the general background of the invention and should not be taken as an acknowledgement or any form of suggestion that this information forms the prior art already known to a person skilled in the art.
Claims (9)
1. A method for measuring the Isc and Voc of a solar cell in a segmented mode is characterized in that the method is achieved by separately and independently performing an Isc measuring step, a Voc measuring step and an IV scanning step, wherein the Isc measuring step and the Voc measuring step are performed alternatively or separately in any sequence; when the Isc measuring step or the Voc measuring step is selected to be carried out, firstly carrying out the Isc measuring step or the Voc measuring step, and finally carrying out the IV scanning step; when the Isc measurement step and the Voc measurement step are performed separately in an arbitrary order, the Isc measurement step or the Voc measurement step is performed first, followed by the IV scanning step or finally performed the IV scanning step.
2. The method of claim 1, wherein the Voc measurement step is performed first, then the Isc measurement step, and finally the IV scanning step.
3. The method of claim 1, wherein the Isc and Voc of solar cells are measured in stages, wherein the Isc measurement step is performed first, the Voc measurement step is performed, and the IV scanning step is performed last.
4. The method of claim 1 wherein the solar cell Isc and Voc step is performed first, followed by the IV scan step and finally the Isc step.
5. The method of claim 1, wherein the Isc measurement step is performed first, the IV scanning step is performed, and the Voc measurement step is performed last.
6. The method for measuring the solar cells Isc and Voc in sections according to claim 1, wherein the Isc measuring step is performed first, and the IV scanning step is performed last.
7. The method of claim 1, wherein the solar cell Isc and Voc is measured in stages, and wherein the Voc measurement step is performed first, and the IV scanning step is performed last.
8. The method for measuring the solar cells Isc and Voc in sections according to any one of claims 1 to 6, wherein the Isc measuring step is an actual true value Isc measured when the circuit is in a true short circuit state.
9. The method for measuring the solar cells Isc and Voc in sections according to claim 1, 2, 3, 4, 5 or 7, wherein the Isc measuring step is the actual true value Voc measured when the circuit is in the true open circuit state.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210222072.5A CN114720874A (en) | 2022-03-07 | 2022-03-07 | Method for measuring solar cells Isc and Voc in sections |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210222072.5A CN114720874A (en) | 2022-03-07 | 2022-03-07 | Method for measuring solar cells Isc and Voc in sections |
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| Publication Number | Publication Date |
|---|---|
| CN114720874A true CN114720874A (en) | 2022-07-08 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210222072.5A Withdrawn CN114720874A (en) | 2022-03-07 | 2022-03-07 | Method for measuring solar cells Isc and Voc in sections |
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| CN (1) | CN114720874A (en) |
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2022
- 2022-03-07 CN CN202210222072.5A patent/CN114720874A/en not_active Withdrawn
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Application publication date: 20220708 |
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