CN102788944A - Quick test method of solar battery electric performance and capable of removing internal capacitor effect - Google Patents
Quick test method of solar battery electric performance and capable of removing internal capacitor effect Download PDFInfo
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- CN102788944A CN102788944A CN2012102350674A CN201210235067A CN102788944A CN 102788944 A CN102788944 A CN 102788944A CN 2012102350674 A CN2012102350674 A CN 2012102350674A CN 201210235067 A CN201210235067 A CN 201210235067A CN 102788944 A CN102788944 A CN 102788944A
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- 230000000694 effects Effects 0.000 title abstract description 11
- 239000003990 capacitor Substances 0.000 title abstract description 5
- 238000010998 test method Methods 0.000 title abstract 5
- 238000000034 method Methods 0.000 claims abstract description 33
- 238000012360 testing method Methods 0.000 claims abstract description 12
- 230000000881 depressing effect Effects 0.000 claims description 2
- 230000008030 elimination Effects 0.000 claims 1
- 238000003379 elimination reaction Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 abstract description 20
- 230000008569 process Effects 0.000 abstract description 6
- 230000009466 transformation Effects 0.000 description 7
- 230000008859 change Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 3
- 206010070834 Sensitisation Diseases 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 238000012827 research and development Methods 0.000 description 2
- 230000008313 sensitization Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- JJWJFWRFHDYQCN-UHFFFAOYSA-J 2-(4-carboxypyridin-2-yl)pyridine-4-carboxylate;ruthenium(2+);tetrabutylazanium;dithiocyanate Chemical compound [Ru+2].[S-]C#N.[S-]C#N.CCCC[N+](CCCC)(CCCC)CCCC.CCCC[N+](CCCC)(CCCC)CCCC.OC(=O)C1=CC=NC(C=2N=CC=C(C=2)C([O-])=O)=C1.OC(=O)C1=CC=NC(C=2N=CC=C(C=2)C([O-])=O)=C1 JJWJFWRFHDYQCN-UHFFFAOYSA-J 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- WEVYAHXRMPXWCK-UHFFFAOYSA-N acetonitrile Substances CC#N WEVYAHXRMPXWCK-UHFFFAOYSA-N 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 239000008151 electrolyte solution Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000005707 optogalvanic effect Effects 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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Abstract
The invention provides a quick test method of solar battery electric performance and capable of removing internal capacitor effect. The quick test method is characterized by conducting voltage scanning in one direction to measure current under each voltage, then conducting voltage scanning in the opposite direction to acquire current under the corresponding voltage again, utilizing arithmetic mean of current values of two scanning processes under the same voltage as the final current measurement value of the voltage and making an I-V curve. The quick test method has the advantages that test results are not affected by an internal capacitor of a solar battery, so that the I-V curve of the solar battery can be quickly and accurately measured by means of the quick test method to further obtain various electric performance parameters of the solar battery.
Description
Technical field
The invention belongs to manufacture of solar cells and research and development field, be specially solar cell electric performance test method.
Background technology
The test of solar cell all plays an important role with the research and development that are characterized in solar cell with in producing; The measurement of electrical property is an importance of solar cell test; The I-V curve can reflect a lot of unit for electrical property parameters of solar cell, wherein maximum output efficiency P
m, the voltage V when output power is maximum
mAnd electric current I
m, open-circuit voltage V
OcWith short-circuit current I
SC, fill factor, curve factor FF, resistance in series R
sWith parallel resistance R
ShImportant parameter in solar cell can both directly or through simple process obtain in the I-V curve.
Fast and accurate measurement I-V curve is the key that obtains each important parameter of solar cell; A common method of I-V curve test is a balanced bridge compensating circuit method; Promptly add a scanning voltage and measure electric current, can make the I-V curve through battery to mesuring battary.Fig. 1 is solar cell I-V curve test philosophy figure; Be the equivalent electrical circuit of solar cell in the frame of broken lines among the figure; This circuit is made up of with the elements such as constant current source Iph of reflection optogalvanic effect the diode D of reflection P-N junction characteristic, and the internal capacitance effect of solar cell can equivalence be Cs and two capacitors of Csh in the circuit.Fig. 2 is the scanning voltage synoptic diagram, and voltage carries out current measurement through certain Td time delay after changing, and measuring the action elapsed-time standards is Tt.
Can eliminate the method for rapidly testing of the solar cell electrical property of internal capacitance influence, it is characterized by under the identical condition of the voltage setting value that keeps sweep velocity and each measurement point and carry out twice voltage scanning of both forward and reverse directions.
For crystal silicon solar batteries, the internal capacitance effect is very little, can ignore; And for some novel batteries, like CIGS thin-film solar cells such as (CIGS), DSSC (DSSC) etc.; Internal capacitance is bigger, and is more remarkable to the influence of I-V curve, and this shows as the result that different sweep velocitys and direction of scanning obtain has bigger error; Particularly error is maximum near best power point, and is as shown in Figure 3.This is that because the existence of electric capacity, change in current will lag behind the variation of voltage because after scanning voltage changes.So wish to get near the real measurement data sweep velocity that should slow down, promptly Td time delay among Fig. 2 will increase, bigger Td will make the speed of I-V curved measurement bring to have a strong impact on, be unfavorable for the quick measurement in the industry when capacity effect is very strong.In order to measure the I-V curve of solar cell rapidly and accurately, we have carried out the innovation on the measuring method on the basis of conventional I-V testing hardware.
Summary of the invention
The present invention seeks to, for a kind of method that can eliminate the quick measurement solar cell electrical property of inside solar energy battery capacitive effect is provided.
Technical scheme of the present invention: the solar cell electrical property method for rapidly testing of eliminating the internal capacitance influence; The present invention has mainly done improvement on measuring method; Single direction carries out voltage scanning (voltage from large to small or change from small to big scan) and carries out rightabout voltage scanning (voltage changes from small to big or scans from large to small) again after measuring the electric current under each voltage; Draw the electric current under the corresponding voltage once more; The arithmetic mean of getting twice current value of depressing of scanning same electrical is made the I-V curve as the ultimate current measured value under this voltage.
With this I-V curve is that each crucial unit for electrical property parameters of solar cell is calculated on the basis.Though measure the I-V curve like this twice, net result does not receive the influence of inside solar energy battery electric capacity to be measured, each Td that measures can be very little or without time delay, so measuring speed promotes greatly.
We can know by the monotonicity of I-V curve; In certain measured voltage scanning process, electric capacity is a single state that is in charge or discharge, if when voltage scans from high to low; Electric capacity should be in discharge condition in whole measuring process, otherwise then is in charged state.Suppose that battery performance does not change when measuring, equivalent electrical circuit is constant, and the numerical value of each parameter is all constant, and charge and discharge process electric current rule over time also should be constant.If voltage becomes V2 from V1 during the electric capacity charging, become V1 from V2 during discharge, then the electric current of two processes does
It is thus clear that
R wherein
cFor with the resistance of capacitances in series, C is the electric capacity of capacitor, t is the time during to current measurement after the change in voltage, I
0Be steady current, the electric current when promptly not having capacitive effect.Because both the mean value electric current when stablize, so the I-V curve when both direction scans the I-V curve of getting corresponding current mean value respectively and is the battery steady operation during measurement.Change in current when Fig. 4 is the voltage change, when voltage just changed, it is bigger that electric current departs from equilibrium value; Slowly reach equilibrium value after a period of time; And that different direction of scanning electric currents departs from the direction of equilibrium value is different, and the deviation value of both direction just is zero, and is consistent with top formula.
With the stronger DSSC of internal capacitance effect is that subjects has been verified effect of the present invention, and the measuring system hardware components is as shown in Figure 5, and concrete steps are referring to " embodiment " part.
Fig. 5; Fig. 6 has provided I-V curve (Fig. 5) and efficiency curves (Fig. 6) that used by dye sensitization solar battery the inventive method is measured. as can beappreciated from fig. 5; Same battery at the same time, the I-V curve that record when Td is respectively 1ms, 5ms, 50ms, 1s time delay overlaps basically, and Fig. 3 with classic method measure the I-V curve; Difference division with Td is bigger, particularly (inserts in the little block diagram in Fig. 3) near the maximum power point.
Fig. 6 is that the transformation efficiency of the DSSC of classic method and the inventive method measurement compares; " Down " curve and " Up " curve be the simple scanning method record transformation efficiency and time delay Td relation; " Average " is the transformation efficiency that records with method of the present invention and the relation of Td; It is thus clear that transformation efficiency and Td that method of the present invention records do not have obvious relation, and the transformation efficiency difference that draws under the different Td with same direction of scanning of the different scanning direction of simple scanning method is all bigger.Can know to the influencing characteristic of electric current that by discharging and recharging of electric capacity the true curve of longer curve of measuring of Td time delay and solar cell is close more, the more approaching true efficient of transformation efficiency.
Beneficial effect of the present invention is: can find out from Fig. 6 right side; The efficient that records when using efficiency ratio tradition simple scanning method Td that method of the present invention records during as 1ms at Td as 1s is more near actual value; This has proved that fully method of the present invention can measure the I-V curve and the transformation efficiency of solar cell really rapidly and accurately, believes that this can provide a method fast and accurately for the detection on the solar module production line.
Description of drawings
Fig. 1 inside solar energy battery equivalent electrical circuit and I-V curved measurement equivalent electrical circuit;
Scanning voltage synoptic diagram during Fig. 2 solar cell I-V curved measurement;
Fig. 3 direction of scanning and time delay Td to the influence of big electric capacity solar cell I-V curve;
Electric current over time under the different voltages of Fig. 4 direction of scanning;
Fig. 5 the present invention tests the result of big internal capacitance solar cell, the I-V curve that measures;
The electricity conversion of the DSSC that Fig. 6 measures for present embodiment.
Embodiment
Hardware is made up of following several parts during practical implementation of the present invention: simulated solar light source, the solar energy when this part provides 1.5 air quality for solar cell; The digital source table is measured the electric current through solar cell when it provides certain voltage can for solar cell to be measured; Control computer is used for control survey mode and measurement parameter and read measurement data and processing, preserve data.
Measuring method of the present invention mainly realizes through computer-controlled program; Coding makes source table treat shoot the sun can battery to carry out behind the voltage scanning along carrying out same scanning in the other direction; After measuring two groups of corresponding data; Data are handled each item unit for electrical property parameters of output I-V curve and solar cell to be measured.
We have made the apparent in view DSSC of internal capacitance effect and have checked our measuring method; Prove that measuring method of the present invention can measure the electrical property of the solar cell of big internal capacitance quickly and accurately, typical a measurement comprises following step:
(1) makes and encapsulate with N719 dye sensitization TiO
2Be working electrode, I
-/ I
3-Acetonitrile solution is an electrolytic solution, and platinum plating FTO electro-conductive glass is the DSSC to electrode, and working area is about 0.15cm
2.
(2) open the simulated solar light source, demarcate, regulate light source and make the sunshine of its luminous power and AM1.5 suitable with the standard silicon solar cell.
(3) solar cell is placed on the sample stage under the light source irradiation, connect the measurement lead, putting and covering plate restriction illuminating area is a specific area.
(4) open digital source table and control computer, setting measurement parameter and begin to measure on computer software.
The I-V curve of Fig. 5 left side for measuring specifically; Fig. 6 is the electricity conversion of the DSSC that measures specifically; It is thus clear that methods and results of the present invention does not receive the influence of sweep velocity and direction of scanning, realized eliminating the electrical property measurement of inside solar energy battery capacitive effect.
Claims (2)
1. eliminate the solar cell electrical property method for rapidly testing that internal capacitance influences for one kind; It is characterized in that first single direction carries out voltage scanning and measures after the electric current under each voltage; Carry out rightabout voltage scanning again; Draw the electric current under the corresponding voltage once more, the arithmetic mean of getting twice current value of depressing of scanning same electrical is made the I-V curve as the ultimate current measured value under this voltage.
2. the method for rapidly testing of the solar cell electrical property of elimination internal capacitance influence according to claim 1; The I-V curve that it is characterized in that using the mean value of the electric current of twice both forward and reverse directions scanning to make is the basis, draws each item unit for electrical property parameters of solar cell to be measured.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012102350674A CN102788944A (en) | 2012-07-06 | 2012-07-06 | Quick test method of solar battery electric performance and capable of removing internal capacitor effect |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012102350674A CN102788944A (en) | 2012-07-06 | 2012-07-06 | Quick test method of solar battery electric performance and capable of removing internal capacitor effect |
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|---|---|
| CN102788944A true CN102788944A (en) | 2012-11-21 |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107015087A (en) * | 2017-05-17 | 2017-08-04 | 华中科技大学 | A kind of capacitive property detection method of photoelectric device |
| CN108398241A (en) * | 2018-01-30 | 2018-08-14 | 苏州腾晖光伏技术有限公司 | The applicability evaluation method that pulse solar simulator tests efficient crystal silicon battery |
| US10333462B2 (en) | 2016-11-03 | 2019-06-25 | Industrial Technology Research Institute | Measuring apparatus for solar cell |
Citations (5)
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|---|---|---|---|---|
| US20040056648A1 (en) * | 2002-07-26 | 2004-03-25 | Canon Kabushiki Kaisha | Method and apparatus for measuring photoelectric conversion device, and process and apparatus for producing photoelectric conversion device |
| JP2004281480A (en) * | 2003-03-13 | 2004-10-07 | National Institute Of Advanced Industrial & Technology | I-v characteristic acquiring method of solar battery |
| CN101299054A (en) * | 2008-05-23 | 2008-11-05 | 南京大学 | Measuring method of dye sensitization nano-film solar cell I-V characteristic and conversion efficiency characteristic |
| CN101769983A (en) * | 2008-12-31 | 2010-07-07 | 中国科学院物理研究所 | Solar battery IPCE curve measuring device and method |
| US20110316578A1 (en) * | 2008-12-18 | 2011-12-29 | Tahara Electric Co., Ltd. | Characteristic measuring device for solar cell |
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2012
- 2012-07-06 CN CN2012102350674A patent/CN102788944A/en active Pending
Patent Citations (5)
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|---|---|---|---|---|
| US20040056648A1 (en) * | 2002-07-26 | 2004-03-25 | Canon Kabushiki Kaisha | Method and apparatus for measuring photoelectric conversion device, and process and apparatus for producing photoelectric conversion device |
| JP2004281480A (en) * | 2003-03-13 | 2004-10-07 | National Institute Of Advanced Industrial & Technology | I-v characteristic acquiring method of solar battery |
| CN101299054A (en) * | 2008-05-23 | 2008-11-05 | 南京大学 | Measuring method of dye sensitization nano-film solar cell I-V characteristic and conversion efficiency characteristic |
| US20110316578A1 (en) * | 2008-12-18 | 2011-12-29 | Tahara Electric Co., Ltd. | Characteristic measuring device for solar cell |
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Non-Patent Citations (1)
| Title |
|---|
| NAOKI KOIDE ET AL.: "Measuring methods of cell performance of dye-sensitized solar cells", 《REVIEW OF SCIENTIFIC INSTRUMENTS》 * |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10333462B2 (en) | 2016-11-03 | 2019-06-25 | Industrial Technology Research Institute | Measuring apparatus for solar cell |
| CN107015087A (en) * | 2017-05-17 | 2017-08-04 | 华中科技大学 | A kind of capacitive property detection method of photoelectric device |
| CN107015087B (en) * | 2017-05-17 | 2019-04-26 | 华中科技大学 | A kind of capacitive property detection method of photoelectric device |
| CN108398241A (en) * | 2018-01-30 | 2018-08-14 | 苏州腾晖光伏技术有限公司 | The applicability evaluation method that pulse solar simulator tests efficient crystal silicon battery |
| CN108398241B (en) * | 2018-01-30 | 2020-02-21 | 苏州腾晖光伏技术有限公司 | Method for evaluating applicability of pulse solar simulator to high-efficiency crystalline silicon battery test |
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Application publication date: 20121121 |