CN114726314A - Method for testing maximum power of high-capacitance solar cell module - Google Patents
Method for testing maximum power of high-capacitance solar cell module Download PDFInfo
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- CN114726314A CN114726314A CN202210241180.7A CN202210241180A CN114726314A CN 114726314 A CN114726314 A CN 114726314A CN 202210241180 A CN202210241180 A CN 202210241180A CN 114726314 A CN114726314 A CN 114726314A
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- 238000012360 testing method Methods 0.000 title claims abstract description 51
- 238000000034 method Methods 0.000 title claims abstract description 23
- 238000013100 final test Methods 0.000 claims abstract description 6
- 230000000694 effects Effects 0.000 claims description 11
- 238000004364 calculation method Methods 0.000 claims description 3
- 238000005259 measurement Methods 0.000 abstract description 4
- SJWPTBFNZAZFSH-UHFFFAOYSA-N pmpp Chemical compound C1CCSC2=NC=NC3=C2N=CN3CCCN2C(=O)N(C)C(=O)C1=C2 SJWPTBFNZAZFSH-UHFFFAOYSA-N 0.000 description 5
- 238000005457 optimization Methods 0.000 description 4
- 101001073212 Arabidopsis thaliana Peroxidase 33 Proteins 0.000 description 1
- 101001123325 Homo sapiens Peroxisome proliferator-activated receptor gamma coactivator 1-beta Proteins 0.000 description 1
- 102100028961 Peroxisome proliferator-activated receptor gamma coactivator 1-beta Human genes 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000003014 reinforcing effect Effects 0.000 description 1
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
- H02S50/15—Testing of PV devices, e.g. of PV modules or single PV cells using optical means, e.g. using electroluminescence
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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Abstract
The invention discloses a method for testing the maximum power of a high-capacity solar cell module, which comprises the following steps: carrying out single pulse flash on the solar cell module; the electronic load in single pulse flash scans the solar cell module for a plurality of times; before each scanning, calculating a maximum power point position Pmpi according to a previous scanning test result, recording an electronic load scanning value Umppi when the maximum power point position Pmpi is reached, and then reducing a scanning range ai-bi of the previous scanning by n times to calculate and confirm a scanning range of the current scanning; and the maximum power point position calculated according to the last scanning test result is the final test value. According to the invention, through reducing the scanning range for multiple times continuously, the accurate measurement of the solar cell can be realized under short pulses, and the test precision of the maximum power value of the solar cell module is improved.
Description
Technical Field
The invention relates to the technical field of solar cell testing, in particular to a method for testing the maximum power of a high-capacity solar cell module.
Background
Along with the promotion of solar cell technology, novel solar cell includes PERC, TopCon, the continuous volume production of HJT battery, and solar cell's efficiency constantly promotes, but what come along is that the electric capacity effect of electric capacity itself constantly increases, and high capacitive solar cell power test is a big difficult problem in present battery and subassembly test field, and the leading cause lies in along with the reinforcing of solar cell capacitive effect, and traditional pulsed tester can't realize accurate measurement, and the concrete performance is: when the electronic load scans from Isc to Uoc, namely forward scanning, the internal capacitance of the battery is charged, the maximum tested power is lower than an actual value, when the electronic load scans from Uoc to Isc, namely reverse scanning, the internal capacitance of the battery is in a discharge state, the maximum tested power is higher than the actual value, the influence of the capacitance effect on the battery test is generally evaluated, the influence of the capacitance effect is calculated by using the difference rate of the maximum tested power scanned from the forward direction to the reverse direction, the influence of the capacitance effect is smaller along with the extension of the test scanning time, but the requirement of the service life of a light source and the test time is limited, and the accurate measurement of the solar battery needs to be realized under short pulse.
Disclosure of Invention
The invention aims to solve the defects in the prior art and provides a method for testing the maximum power of a high-capacity solar cell module.
In order to achieve the purpose, the invention provides the following technical scheme:
a method for testing the maximum power of a high-capacity solar cell module comprises the following steps:
1) carrying out single pulse flash on the solar cell module;
2) scanning the solar cell module for a plurality of times by the electronic load in single pulse flash; before each scanning, the maximum power point position Pmpi is calculated according to the previous scanning test result, the electronic load scanning value Umppi when the maximum power point position Pmpi is recorded, then the scanning range ai-bi of the previous scanning is reduced by n times, and then the scanning range of the current scanning is calculated and confirmed, wherein the calculation formula is as follows:
ai+1=Umppi-(bi-ai)/n;
bi+1=Umppi+(bi-ai)/n;
wherein i is the scanned times, a is the scanning starting point, and b is the scanning end point;
3) and the maximum power point position calculated according to the last scanning test result is the final test value.
As an optimization scheme of the invention, before the electronic load scans the solar cell module for the first time in single pulse flash, the method also comprises the step of judging the scanning direction, wherein the reverse scanning is just opposite to the forward scanning starting point and the forward scanning end point.
Further, if the first scan of the solar cell module by the electronic load in the single pulse flash is a forward scan, the scan range is 0 to Uoc, the starting point a1 is 0, and the end point b1 is Uoc. On the contrary, if the electronic load performs the first scan of the solar cell module in the single pulse flash, which is a reverse scan, the scan range is still 0 to Uoc, but the starting point a1 is Uoc and the end point b1 is 0.
As an optimization of the present invention, the electronic load performs at least 4 scans of the solar module in a single pulse flash.
The method further comprises the step of adjusting the pulse width before the single pulse flash of the solar cell module.
Specifically, the step of adjusting the pulse width includes:
setting a preset value of a forward and reverse difference rate according to the capacitive effect of the solar cell;
setting the pulse width as the minimum value, respectively carrying out forward scanning and reverse scanning in another pulse flash on the solar cell by carrying out single pulse flash on the solar cell module for one time, calculating the difference value of the maximum power values of the two times of scanning, and calculating the difference value of the maximum power values of the two times of scanning;
if the difference value is smaller than the preset value, the current pulse width meets the test requirement; if the difference value is larger than the preset value, increasing the pulse width and repeating the forward and reverse scanning steps until the difference value is smaller than the preset value.
The invention has the beneficial effects that:
according to the invention, through reducing the scanning range for multiple times continuously, the accurate measurement of the solar cell can be realized under short pulses, and the test precision of the maximum power value of the solar cell module is improved;
the invention sets the preset value of the forward and reverse difference rate according to the capacitive effect of the solar cell, compares the difference value of the maximum power value of the forward and reverse scanning for a plurality of times with the preset value, adjusts the most appropriate pulse width, and can adjust the most appropriate test condition according to the capacitive effect of different types of test cells.
Drawings
FIG. 1 is a flow chart of a method for testing a solar cell module;
fig. 2 is a flowchart of adjusting the pulse width.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When a component is referred to as being "connected" to another component, it can be directly connected to the other component or intervening components may also be present. When a component is referred to as being "disposed on" another component, it can be directly on the other component or intervening components may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
A method for testing the maximum power of a high-capacity solar cell module comprises the following steps:
1) carrying out single pulse flash on the solar cell module;
2) the electronic load in single pulse flash scans the solar cell module for a plurality of times; before each scanning, the maximum power point position Pmpi is calculated according to the previous scanning test result, the electronic load scanning value Umppi when the maximum power point position Pmpi is recorded, then the scanning range ai-bi of the previous scanning is reduced by n times, and then the scanning range of the current scanning is calculated and confirmed, wherein the calculation formula is as follows:
ai+1=Umppi-(bi-ai)/n;
bi+1=Umppi+(bi-ai)/n;
wherein i is the scanned times, a is the scanning starting point, and b is the scanning end point;
3) and the maximum power point position calculated according to the last scanning test result is the final test value.
As an optimization scheme of the invention, before the electronic load scans the solar cell module for the first time in single pulse flash, the method also comprises the step of judging the scanning direction, wherein the reverse scanning is just opposite to the forward scanning starting point and the forward scanning end point.
Further, if the first scan of the solar cell module by the electronic load in the single pulse flash is a forward scan, the scan range is 0 to Uoc, the starting point a1 is 0, and the end point b1 is Uoc. On the contrary, if the electronic load performs the first scan of the solar cell module in the single pulse flash, which is a reverse scan, the scan range is still 0 to Uoc, but the starting point a1 is Uoc and the end point b1 is 0.
As an optimization of the present invention, the electronic load performs at least 4 scans of the solar module in a single pulse flash.
Take 4 scans as an example:
as shown in fig. 1, firstly, the scanning direction is determined, taking forward scanning as an example, the reverse scanning is just opposite to the forward scanning starting point and end point;
starting a first scan, wherein the scan range is 0-Uoc, the starting point a1 is 0, the end point b1 is Uoc, scanning a complete IV curve, and then calculating the maximum power Pmpp1, Pmpp1 ═ Impp1 × Umpp1, namely the maximum power Pmpp1 in the IV curve, the abscissa is Umpp1, and the ordinate is Impp1 according to the resultant IV curve, so as to find out the corresponding Umpp 1;
entering a second scanning, reducing the scanning range by n times, wherein the scanning range is Umpp1- (b1-a 1)/n-Umpp 1+ (b1-a1)/n, the starting point a2 is Umpp1- (b1-a1)/n, the end point b2 is Umpp1+ (b1-a1)/n, carrying out the first scanning in the range, then calculating the maximum power Pmpp2 of the second scanning according to the resultant IV curve, and finding out Umpp2 corresponding to the maximum power Pmpp 2;
entering a third scanning, reducing the scanning range by n times, wherein the scanning range is Umpp2- (b2-a 2)/n-Umpp 2+ (b2-a2)/n, the starting point a3 is Umpp2- (b2-a2)/n, the end point b3 is Umpp2+ (b2-a2)/n, carrying out the first scanning in the range, then calculating the maximum power Pmpp3 of the third scanning according to the obtained IV curve, and finding out the Umpp3 corresponding to the maximum power Pmpp 3;
entering a fourth scanning, reducing the scanning range by n times, wherein the scanning range is Umpp3- (b3-a 3)/n-Umpp 3+ (b3-a3)/n, the starting point a4 is Umpp3- (b3-a3)/n, the end point b4 is Umpp3+ (b3-a4)/n, carrying out the first scanning in the range, then calculating the maximum power Pmpp4 of the fourth scanning according to the result IV curve, and the Pmpp4 calculated by the fourth scanning is the final test value.
In addition, before a solar cell module is subjected to a single pulse flash and multiple scans to carry out a maximum power test process, a step of adjusting the pulse width is required to meet the test conditions of the capacitive effect of different types of test cells. The method for determining the test pulse width provided by the invention is to find out a proper test pulse width according to a preset difference rate, and then determine the final test pulse width, and the implementation method is as shown in fig. 2, and specifically comprises the following steps:
firstly, in a test starting stage, a preset value of a forward and reverse difference rate needs to be set, then a test pulse width is set to be a minimum value of 10ms, then a single forward test flow is completed in one flash to calculate Pmpp (positive), then a single reverse test flow is completed in the next flash to calculate Pmpp (negative), a difference value of the difference Pmpp of the forward and reverse tests is calculated, if the difference value is smaller than the preset value, the difference value meets the test requirement, the capacitive effect is fully evaluated, and the pulse width at the moment can be determined to be a proper test pulse width; otherwise, if the difference value is larger than the preset value, the difference value does not meet the test requirement, the test pulse width needs to be increased, the forward and reverse test process is repeated, finally the test pulse width meeting the preset value can be obtained, the pretest process is ended, and the pulse width can be used as the test pulse width of the solar cell.
Furthermore, those skilled in the art will appreciate that while some embodiments described herein include some features included in other embodiments, rather than other features, combinations of features of different embodiments are meant to be within the scope of the invention and form different embodiments. For example, in the claims above, any of the claimed embodiments may be used in any combination. The information disclosed in this background section is only for enhancement of understanding of the general background of the invention and should not be taken as an acknowledgement or any form of suggestion that this information forms the prior art already known to a person skilled in the art.
Claims (6)
1. A method for testing the maximum power of a high-capacity solar cell module is characterized by comprising the following steps:
1) carrying out single pulse flash on the solar cell module;
2) scanning the solar cell module for a plurality of times by the electronic load in single pulse flash; before each scanning, the maximum power point position Pmpi is calculated according to the previous scanning test result, the electronic load scanning value Umppi when the maximum power point position Pmpi is recorded, then the scanning range ai-bi of the previous scanning is reduced by n times, and then the scanning range of the current scanning is calculated and confirmed, wherein the calculation formula is as follows:
ai+1=Umppi-(bi-ai)/n;
bi+1=Umppi+(bi-ai)/n;
wherein i is the scanned times, a is the scanning starting point, and b is the scanning end point;
3) and the maximum power point position calculated according to the last scanning test result is the final test value.
2. The method for testing the maximum power of a highly capacitive solar cell module as claimed in claim 1, wherein before the electronic load performs the first scan of the solar cell module in a single pulse flash, the method further comprises the step of determining the scan direction, wherein the reverse scan is opposite to the forward scan start and end points.
3. The method for testing the maximum power of a highly capacitive solar cell module as claimed in claim 1 or 2, wherein if the first scan of the solar cell module by the electronic load in a single pulse flash is a forward scan, the scan range is 0-Uoc, the starting point a1 is 0, and the end point b1 is Uoc.
4. The method for testing the maximum power of a highly capacitive solar cell module as claimed in claim 1, wherein the electronic load performs at least 4 scans of the solar cell module in a single pulse flash.
5. The method for testing the maximum power of a highly capacitive solar cell module as claimed in claim 1, further comprising the step of adjusting the pulse width before a single pulse flash of the solar cell module.
6. The method for testing the maximum power of a high-capacity solar cell module as claimed in claim 5, wherein the step of adjusting the pulse width comprises:
1) setting a preset value of a forward and reverse difference rate according to the capacitive effect of the solar cell;
2) setting the pulse width as the minimum value, respectively carrying out forward scanning and reverse scanning in another pulse flash on the solar cell assembly by carrying out single pulse flash on the solar cell once, and calculating the difference value of the maximum power values of two times of scanning;
3) if the difference value is smaller than the preset value, the current pulse width meets the test requirement; if the difference value is larger than the preset value, increasing the pulse width and repeating the forward and reverse scanning steps until the difference value is smaller than the preset value.
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CN117709132A (en) * | 2024-02-05 | 2024-03-15 | 安徽大学 | Diagnostic method for internal loss mechanism of solar cell |
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CN117709132A (en) * | 2024-02-05 | 2024-03-15 | 安徽大学 | Diagnostic method for internal loss mechanism of solar cell |
CN117709132B (en) * | 2024-02-05 | 2024-04-19 | 安徽大学 | Diagnostic method for internal loss mechanism of solar cell |
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Application publication date: 20220708 |