CN114675168A - Calibration interface board and system of universal card slot of automatic integrated circuit test equipment - Google Patents

Calibration interface board and system of universal card slot of automatic integrated circuit test equipment Download PDF

Info

Publication number
CN114675168A
CN114675168A CN202210606233.0A CN202210606233A CN114675168A CN 114675168 A CN114675168 A CN 114675168A CN 202210606233 A CN202210606233 A CN 202210606233A CN 114675168 A CN114675168 A CN 114675168A
Authority
CN
China
Prior art keywords
calibration
board
interface
ate
standard
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202210606233.0A
Other languages
Chinese (zh)
Inventor
不公告发明人
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nanjing Hongtai Semiconductor Technology Co ltd
Original Assignee
Nanjing Hongtai Semiconductor Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nanjing Hongtai Semiconductor Technology Co ltd filed Critical Nanjing Hongtai Semiconductor Technology Co ltd
Priority to CN202210606233.0A priority Critical patent/CN114675168A/en
Publication of CN114675168A publication Critical patent/CN114675168A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00Testing or calibrating of apparatus covered by the other groups of this subclass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The invention discloses a calibration interface board and a system of a universal card slot of integrated circuit automatic test equipment, belonging to the technical field of integrated circuit automatic test, comprising a basic connecting board, wherein a plurality of standard interfaces with a first signal port and a second signal port are arranged on the basic connecting board at intervals side by side, the first signal port of each standard interface is electrically connected with a calibration source and a measuring instrument through the outside of a circuit bus, and is also used for electrically connecting an ATE resource board card positioned in the universal card slot of an ATE machine, and the second signal port of each standard interface is electrically connected with a board card calibration card corresponding to the calibration requirement of the ATE resource board card. The calibration interface board and the calibration interface board system of the universal card slot of the automatic integrated circuit testing equipment have the advantages of function integrated design, flexible operation and strong applicability.

Description

Calibration interface board and system of universal card slot of automatic integrated circuit test equipment
Technical Field
The invention belongs to the technical field of automatic test of integrated circuits, and particularly relates to a calibration interface board and a calibration interface board system of a universal card slot of automatic test equipment of an integrated circuit.
Background
ATE (automatic Testing Equipment) applied to large-scale automatic Testing of integrated circuits has the characteristics of high integration level, high precision, high stability and the like. The high integration level means that a single ATE device generally has hundreds of input/output (I/O) channels or even tens of thousands of I/O channels, and the requirement of parallel testing of large-scale integrated circuits as much as possible is met; also means that a single ATE device generally has different test resources and is presented by various different types of resource boards; so as to meet the test requirements of different types of integrated circuits or different modules in a system on chip (SoC) chip. The high precision means that various ATE test resources are required to have higher drive (Force) or measurement (Measure) precision to ensure the accuracy of a test result, for example, the voltage precision is generally superior to the uV grade, and the current precision is generally superior to the nA grade, so that the conditions of wrong leakage or wrong screening caused by insufficient precision are avoided. The high stability means that the ATE needs to ensure the stability of a long-time test result in the integrated circuit test process, and the fluctuation of the same test result cannot be caused by the subtle difference of the test environment, the aging of hardware devices and the like; and meanwhile, the results of the same test performed by using the resource board cards with the same model and different batch numbers are consistent.
The above-described features of ATE equipment require that the ATE manufacturer have sufficient means to ensure that highly integrated resource board cards achieve nominal accuracy, stability, and consistency over as long a period as possible. The most important means is Calibration (Calibration) of the resource board card: under the specified conditions, the characteristics of the calibrated equipment are assigned with a reference standard, and the indication error of the calibrated equipment is determined. A typical calibration tool is a reference source and a metrology instrument that have been calibrated to a higher accuracy than the device being calibrated. In general, external calibration of ATE uses a multimeter with higher accuracy to measure calibrated resources of ATE to confirm characteristics such as gain and error of characteristics of each channel on each resource board. The calibration interface board is a PCB board, and is a calibration connection circuit formed by circuit wiring designed on the PCB and electronic components on the PCB. ATE and calibration multimeters typically use the connection cables of the calibration interface board and multimeter to connect the multimeter to the resource being calibrated.
Conventional ATE typically uses a card slot architecture to accommodate the architecture of the resource cards. Most ATE card slots are not universal and only accommodate specific resource cards, which has the disadvantage of inflexible device configuration, and the customer can only use a relatively fixed configuration, and cannot easily change the device configuration according to the needs of the ic under test. In addition, a calibration interface board cannot be adapted to different resource boards inserted into each universal card slot in various configurations of ATE. Although the external signal interfaces of different resource boards are designed into a uniform standard mode, the calibration requirements and circuits of the resource boards are different. Therefore, once fixed, the design of the calibration interface board cannot change with different ATE-configured resource boards. Therefore, different calibration interface boards are needed for different configurations of ATE machines, and as the number of types of the calibration interface boards increases, the manufacturing cost and the management cost increase.
Disclosure of Invention
The invention aims to overcome the defects in the prior art and provides a calibration interface board and a calibration system of a universal card slot of integrated circuit automatic test equipment, which can be adapted to different ATE machine configurations and can be butted with the universal card slot of ATE to be adapted to different resource board cards, and can also be flexibly configured with a board card calibration card according to different resource board cards, thereby realizing function integrated design, saving cost and cost, being flexible in operation and strong in applicability.
In order to achieve the purpose, the invention is realized by adopting the following technical scheme.
In a first aspect, the invention provides a calibration interface board of a universal card slot of an automatic integrated circuit test device, which comprises a base connecting board, wherein a plurality of standard interfaces with a first signal port and a second signal port are arranged on the base connecting board at intervals side by side, the first signal port of each standard interface is electrically connected with a calibration source and a measuring instrument through the outside of a circuit bus, and is further used for electrically connecting an ATE resource board card located in the universal card slot of an ATE machine, and the second signal port of each standard interface is electrically connected with a board card calibration card corresponding to the calibration requirement of the ATE resource board card.
Further, the first signal port of each standard interface is electrically connected to the calibration source and the metrology instrument through a relay network.
Furthermore, a second signal port of each standard interface is electrically connected with one board card calibration card through a relay network.
Furthermore, calibration circuits corresponding to different calibration requirements are arranged on the board card calibration cards corresponding to the plurality of standard interfaces.
Furthermore, a plurality of unified standard communication interfaces which are adapted to the external signal interface of the ATE resource board card of the universal card slot are arranged between the first signal ports of the standard interfaces, and a plurality of unified standard communication interfaces which are adapted to the external signal interface of the board card calibration card are arranged between the second signal ports of the standard interfaces.
Furthermore, the basic connecting plate is a PCB circuit board provided with a basic circuit.
In a second aspect, the present invention provides a calibration system for a card slot of an automatic integrated circuit test device, including an ATE machine, a calibration source, a measurement instrument, and the standard interface board according to any one of the first aspect;
the ATE machine is provided with a plurality of universal card slots which are used for being plugged with ATE resource board cards and are electrically connected with a first signal port of the standard interface and provided with a unified standard communication interface, and the calibration source and the measuring instrument are respectively electrically connected with the first signal port of the standard interface.
Furthermore, the number of the universal card slots, the number of the standard interfaces and the number of the board card calibration cards are in one-to-one correspondence.
Furthermore, a pogo pin connector is adopted as a unified standard communication interface of the universal card slot.
Further, the ATE resource board card is a digital resource board card, an analog resource board card or a mixed signal resource board card.
Compared with the prior art, the invention has the following beneficial effects:
the calibration interface board and the system of the universal card slot of the integrated circuit automatic test equipment adopt the standard interface arranged on the basic connecting board, and the first signal interface and the second signal interface of the standard interface are respectively matched with the universal card slot of the ATE and the board calibration cards with different calibration requirements, so that the calibration interface board and the system can be matched with different ATE machine station configurations and different board calibration cards, the structural design is flexible, the operation is convenient, different interface boards are not required to be arranged, the production test cost of enterprises is saved, and the test efficiency is improved;
the relay network is utilized to increase the conversion control flexibility of adapting to different ATE resource board cards, improve the conversion control flexibility among the board card calibration cards, and integrally realize the circuit conversion from the calibrated ATE resource board card to a calibration source and a measuring instrument so as to realize the calibration conversion of the different ATE resource board cards;
the standard interface of the unified standard communication interface is adopted on the basic connecting plate, so that different board calibration cards and ATE (automatic test equipment) resource board cards can be correspondingly connected through the standard interface, the adaptation is flexible, and the ATE resource board cards can be accommodated according to different universal clamping grooves to select different board calibration cards to be matched.
Drawings
Fig. 1 is a schematic structural diagram of a calibration interface board and a system of a universal card slot of an automatic integrated circuit test equipment according to an embodiment of the present invention.
Fig. 2 is a functional schematic diagram of a calibration interface board of a card slot commonly used in an automatic test equipment for integrated circuits according to an embodiment of the present invention.
Fig. 3 is a schematic test flow diagram of a calibration system of a universal card slot of an automatic test equipment for integrated circuits according to an embodiment of the present invention.
In the figure:
101. a resource board card; 102. a board card calibration card; 103. an ATE machine; 104. a standard interface; 105. a base connection plate; 106. a relay network; 107. calibration source and meter.
Detailed Description
The invention is further described below with reference to the accompanying drawings. The following examples are only for illustrating the technical solutions of the present invention more clearly, and the protection scope of the present invention is not limited thereby.
In the description of the present invention, it is to be understood that the terms "central," "longitudinal," "lateral," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are used in the orientations and positional relationships indicated in the drawings, which are based on the orientations and positional relationships indicated in the drawings, and are used for convenience in describing the present invention and for simplicity in description, but do not indicate or imply that the device or element so referred to must have a particular orientation, be constructed in a particular orientation, and be operated, and thus should not be construed as limiting the present invention. Furthermore, the terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first," "second," etc. may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless otherwise specified.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art through specific situations.
As shown in fig. 1 and 2, an embodiment of the present invention provides a calibration interface board for a universal card slot of an automatic integrated circuit test device, including a base connection board 105, where a plurality of standard interfaces 104 having a first signal port and a second signal port are arranged on the base connection board 105 side by side at intervals, the first signal port of each standard interface 104 is electrically connected to a calibration source and a measurement instrument through a circuit bus outside, and is further used to electrically connect an ATE resource board 101 located in a universal card slot of an ATE machine 103, and the second signal port of each standard interface 104 is electrically connected to a board calibration card 102 corresponding to a calibration requirement of the ATE resource board 101.
Different ATE resource integrated circuit boards 101 in the general card slot usually have unified general standard external signal interface design, combine a plurality of be between the first signal port of standard interface 104 be with the unified standard communication interface that the external signal interface of ATE resource integrated circuit board 101 of general card slot suited, the external signal interface electricity through ATE resource integrated circuit board 101 is connected in the first signal port of the standard interface 104 that has unified standard communication interface, need not to consider the type of ATE resource integrated circuit board 101, realize the communication connection between ATE resource integrated circuit board 101 and the standard interface 104, can be convenient for dispose different ATE resource integrated circuit boards 101 in a flexible way, the different board configurations of adaptation.
The second signal ports of the standard interfaces 104 are all unified standard communication interfaces adapted to the external signal interface of the board calibration card 102, and can be adapted to and replaced with different board calibration cards 102, and when the device is used, the corresponding board calibration cards 102 are directly replaced according to different calibration requirements of the ATE resource board 101.
The basic connection board 105 is a PCB circuit board with a basic circuit, the standard interface 104 is connected to a calibration source and a measuring instrument for calibration through the basic circuit, and a signal interface of the resource board 101 for electrically connecting with a module or a circuit on the ATE resource board 101 is led out through the basic circuit and is electrically connected to the standard interface 104.
The basic circuit is a common general calibration circuit for all existing ATE resource board cards 101. In addition, the board calibration card 102 designs a corresponding calibration circuit according to the calibration requirements of different ATE resource boards 101 of different types, so as to meet different calibration requirements.
In this embodiment, in order to increase the flexibility of adapting different ATE resource boards 101 and switch the circuit between the ATE resource boards 101 and the calibration source and the meter 107, the first signal port of each standard interface 104 is electrically connected to the calibration source and the meter through a relay network 106, and the second signal port of each standard interface 104 is electrically connected to one board calibration card 102 through a relay network 106, so as to form a dual switching circuit control mode among the ATE resource boards 101, the board calibration cards 102, the calibration source, and the meter.
As shown in fig. 1, the present invention provides a calibration system for a universal card slot of an automatic integrated circuit test device, which includes an ATE machine 103, a calibration source, a measurement instrument, and the standard interface 104 board;
the ATE machine table 103 is provided with a plurality of universal card slots which are used for being plugged with an ATE resource board card 101 and are electrically connected with a first signal port of the standard interface 104 and are provided with a unified standard communication interface, and the calibration source and the measuring instrument are respectively electrically connected with the first signal port of the standard interface 104.
In this embodiment, the number of the universal card slots, the standard interfaces 104, and the board calibration cards 102 corresponds to one another. Meanwhile, one board calibration card 102 corresponds to one relay network 106 for circuit switching.
The communication interface can adopt multiple form specifications according to actual test requirements, and the unified standard communication interface of the universal card slot in the embodiment adopts a pogo pin connector.
The ATE resource board 101 is a digital resource board, an analog resource board, or a mixed signal resource board.
The calibration usage principle of the universal card slot of the integrated circuit automatic test equipment of the present invention will be described with reference to fig. 3 and the usage operation of the embodiment.
Preparing a calibration interface board with a universal basic connection board 105 (PCB) and a standard interface 104;
determining the type of each ATE resource board card 101 according to the configuration condition of an ATE machine 103, inserting the ATE resource board cards into corresponding general card slots, selecting board card calibration cards 102 meeting the calibration requirement, inserting the board card calibration cards into second signal interfaces of standard interfaces 104 corresponding to the general card slots one by one, and sequentially and respectively confirming that all ATE resource board cards 101 and the board card calibration cards 102 are inserted;
and connecting and combining the corresponding external calibration source and the measuring instrument, butting and combining the calibration interface board and the universal card slot of the ATE machine 103, and switching and controlling each relay network 106 to realize circuit transformation among the calibrated ATE resource board card 101, the board card calibration card 102, the calibration source and the measuring instrument, thereby realizing different test circuits.
The above description is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, several modifications and variations can be made without departing from the technical principle of the present invention, and these modifications and variations should also be regarded as the protection scope of the present invention.

Claims (10)

1. The utility model provides a calibration interface board of general draw-in groove of automatic test equipment of integrated circuit, its characterized in that, includes the basic connecting plate, the interval is provided with a plurality of standard interfaces that have first signal port and second signal port, every side by side on the basic connecting plate the first signal port of standard interface passes through the outside electricity of circuit bus and connects calibration source and instrumentation, and still is arranged in one to connect electrically ATE resource integrated circuit board, every in the general draw-in groove that is arranged in the ATE board the second signal port electricity of standard interface connect one with the corresponding integrated circuit board calibration card of calibration requirement of ATE resource integrated circuit board.
2. The calibration interface board for a universal card slot of integrated circuit automatic test equipment according to claim 1, wherein the first signal port of each of said standard interfaces is electrically connected to said calibration source and said meter through a relay network.
3. The calibration interface board for a universal card slot of integrated circuit automatic test equipment according to claim 2, wherein the second signal port of each of said standard interfaces is electrically connected to one of said card calibration cards through a relay network.
4. The calibration interface board for the universal card slot of the ic automatic test equipment according to claim 3, wherein the board calibration cards corresponding to the plurality of standard interfaces are provided with calibration circuits corresponding to different calibration requirements.
5. The calibration interface board of the universal card slot of the ic automatic test equipment according to claim 4, wherein the first signal ports of the plurality of standard interfaces are all unified standard communication interfaces adapted to external signal interfaces of the ATE resource board of the universal card slot, and the second signal ports of the plurality of standard interfaces are all unified standard communication interfaces adapted to external signal interfaces of the board calibration card.
6. The calibration interface board of the universal card slot of the ic automatic test equipment according to claim 1, wherein the basic connection board is a PCB circuit board with a basic circuit.
7. A calibration system for a universal card slot of an automatic integrated circuit test device, which is characterized by comprising an ATE machine table, a calibration source, a measurement instrument and a standard interface board according to any one of claims 1-6;
the ATE machine is provided with a plurality of universal card slots which are used for being plugged with ATE resource board cards and are electrically connected with a first signal port of the standard interface and provided with a unified standard communication interface, and the calibration source and the measuring instrument are respectively electrically connected with the first signal port of the standard interface.
8. The system of claim 7, wherein the number of universal card slots, the standard interfaces, and the card calibration cards corresponds to one another.
9. The system of claim 8, wherein the unified communications interface of the universal card slot is a pogo pin connector.
10. The system of claim 9, wherein the ATE resource board is a digital resource board, an analog resource board, or a mixed signal resource board.
CN202210606233.0A 2022-05-31 2022-05-31 Calibration interface board and system of universal card slot of automatic integrated circuit test equipment Pending CN114675168A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202210606233.0A CN114675168A (en) 2022-05-31 2022-05-31 Calibration interface board and system of universal card slot of automatic integrated circuit test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210606233.0A CN114675168A (en) 2022-05-31 2022-05-31 Calibration interface board and system of universal card slot of automatic integrated circuit test equipment

Publications (1)

Publication Number Publication Date
CN114675168A true CN114675168A (en) 2022-06-28

Family

ID=82081204

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202210606233.0A Pending CN114675168A (en) 2022-05-31 2022-05-31 Calibration interface board and system of universal card slot of automatic integrated circuit test equipment

Country Status (1)

Country Link
CN (1) CN114675168A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115598580A (en) * 2022-12-12 2023-01-13 南京宏泰半导体科技有限公司(Cn) Automatic switching calibration device and method for test station of discrete device semiconductor test system
CN117761510A (en) * 2023-12-25 2024-03-26 珠海芯试界半导体科技有限公司 ATE interface standard universal line and FT test system connected with same

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1858596A (en) * 2006-04-03 2006-11-08 华为技术有限公司 Chip general detector and its structure method
CN109298317A (en) * 2018-10-13 2019-02-01 国营芜湖机械厂 A kind of Intelligent test device and its test method of middle low-frequency channel
CN208607348U (en) * 2018-08-10 2019-03-15 北京悦芯科技有限公司 Calibrate ancillary equipment and calibration system
US10365345B1 (en) * 2015-12-02 2019-07-30 Anritsu Company Calibration device for use with measurement instruments
CN111123076A (en) * 2020-01-09 2020-05-08 苏州华兴源创科技股份有限公司 Calibration device and automatic test equipment

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1858596A (en) * 2006-04-03 2006-11-08 华为技术有限公司 Chip general detector and its structure method
US10365345B1 (en) * 2015-12-02 2019-07-30 Anritsu Company Calibration device for use with measurement instruments
CN208607348U (en) * 2018-08-10 2019-03-15 北京悦芯科技有限公司 Calibrate ancillary equipment and calibration system
CN109298317A (en) * 2018-10-13 2019-02-01 国营芜湖机械厂 A kind of Intelligent test device and its test method of middle low-frequency channel
CN111123076A (en) * 2020-01-09 2020-05-08 苏州华兴源创科技股份有限公司 Calibration device and automatic test equipment

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115598580A (en) * 2022-12-12 2023-01-13 南京宏泰半导体科技有限公司(Cn) Automatic switching calibration device and method for test station of discrete device semiconductor test system
CN117761510A (en) * 2023-12-25 2024-03-26 珠海芯试界半导体科技有限公司 ATE interface standard universal line and FT test system connected with same

Similar Documents

Publication Publication Date Title
CN114675168A (en) Calibration interface board and system of universal card slot of automatic integrated circuit test equipment
CN111123076A (en) Calibration device and automatic test equipment
CN212008827U (en) Calibration device and automatic test equipment
CN212258965U (en) Automatic test system of radio frequency module
CN105372536A (en) Aviation electronic universal test platform
CN101769986A (en) Test device and test method thereof
CN214041466U (en) Universal aging motherboard, adapter plate and testing device
CN115267481A (en) Chip test circuit and chip test device
CN101311740A (en) Electronic assembly test system
CN218445837U (en) Aging board and chip aging test system
CN109188254B (en) Calibration method and device for measuring electrical characteristics of microwave semiconductor integrated circuit
CN207924050U (en) The epitaxial apparatus of the inspection of capacitance batch and test
CN203732081U (en) Universal measurement testing interface adaptor
CN214540463U (en) Relay board for switching and detecting multiple paths of signals
CN112858786A (en) Modular resistance voltage measuring device and method
CN109857009A (en) A kind of signal adaptation device for the calibration of electricity multi-parameter
CN218767165U (en) Automatic testing arrangement of batch electron device
CN219997263U (en) Power module test fixture
CN216771824U (en) Conversion device for rapidly checking current detection loop problem
CN217467081U (en) Power panel testing device
CN218767044U (en) Electric energy meter switching pedestal and configuration system
CN212275954U (en) Electric energy meter testing device
CN220105211U (en) Test structure for power management chip
CN215114937U (en) Device for batch calibration of secondary instruments
CN216526146U (en) Test communication device for semiconductor temperature control device

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20220628