CN111123076A - Calibration device and automatic test equipment - Google Patents
Calibration device and automatic test equipment Download PDFInfo
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- CN111123076A CN111123076A CN202010022864.9A CN202010022864A CN111123076A CN 111123076 A CN111123076 A CN 111123076A CN 202010022864 A CN202010022864 A CN 202010022864A CN 111123076 A CN111123076 A CN 111123076A
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- 238000012360 testing method Methods 0.000 title claims abstract description 46
- 238000005259 measurement Methods 0.000 claims abstract description 84
- 230000005540 biological transmission Effects 0.000 claims abstract description 22
- 230000006870 function Effects 0.000 claims description 11
- 238000000034 method Methods 0.000 description 7
- 238000003745 diagnosis Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
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- 230000009286 beneficial effect Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
- G01R35/007—Standards or reference devices, e.g. voltage or resistance standards, "golden references"
Abstract
The invention discloses a calibration device and automatic test equipment. One embodiment of the calibration device comprises: the automatic test equipment comprises a plurality of calibration daughter boards and a calibration mother board, wherein the calibration daughter boards are connected with a plurality of measurement board cards of automatic test equipment in a one-to-one correspondence manner, the calibration mother board is respectively connected with the calibration daughter boards through standardized interfaces, the types of the calibration daughter boards are matched with the types of the measurement board cards corresponding to the calibration daughter boards, the calibration mother board is provided with a direct-current signal standard source and a time sequence signal standard source, and the standardized interfaces comprise direct-current calibration signal interfaces and time sequence calibration signal interfaces; and the calibration daughter board is used for switching the transmission channels of the multi-channel to-be-direct-current calibration signals from the corresponding measurement board cards to output the multi-channel to-be-direct-current calibration signals to the calibration mother board in a single path through the direct-current calibration signal interface, and switching the transmission channels of the multi-channel to-be-time-sequence calibration signals from the corresponding measurement board cards to output the multi-channel to-be-time-sequence calibration signals to the calibration mother board in a single path through the time-sequence calibration signal interface. The embodiment can greatly improve the calibration efficiency of the automatic test equipment.
Description
Technical Field
The invention relates to the technical field of testing. And more particularly, to a calibration device and automatic test equipment.
Background
In the testing field, for testing devices such as chips, Automatic Test Equipment (ATE) is generally used for testing the devices. Taking the test of a chip as an example, generally, an automatic test device is plugged with a plurality of measurement boards, and the plurality of measurement boards are used to send test signals to the chip. In order to ensure the accuracy of the test signal sent by the measurement board card, the measurement board card of the automatic test equipment needs to be calibrated first, which may also be directly referred to as calibrating the automatic test equipment.
Automatic test equipment generally supports the mixed use of a plurality of different types of measurement board cards to meet different demand configurations of customers. At present, the calibration method for the measurement board card of the automatic test equipment is to make a calibration board card for each type of measurement board card, connect the calibration board card with the corresponding type of measurement board card, measure the multi-channel to-be-calibrated direct current signal from each measurement board card (the multi-channel direct current signal output by the measurement board card) by the direct current signal standard source in the calibration board card, measure the multi-channel to-be-calibrated time sequence signal from each measurement board card (the multi-channel digital signal output by the measurement board card) by the timing signal standard source in the calibration board card, calculate the error parameters of each channel to-be-calibrated direct current signal and each channel to-be-calibrated time sequence signal by using the upper computer software deployed in the automatic test equipment and write the error parameters into the FLASH memory of the measurement board card, so as to calibrate or compensate the output signals (including the multi-channel direct current signal and the multi-, the error parameters include linearity error, offset error and the like.
Because the output interfaces of the measuring boards of different types are different, the calibration mode of the measuring board of the existing automatic test equipment needs to manufacture a calibration board matched with each type of measuring board, the types of the measuring boards on the automatic test equipment need to be consistent when the calibration is carried out, and the calibration boards of corresponding types need to be uniformly replaced and need to be replaced when the measuring boards are replaced.
Therefore, it is desirable to provide a new calibration device and automatic test equipment.
Disclosure of Invention
The present invention is directed to a calibration device and an automatic test equipment, which solve at least one of the problems of the prior art.
In order to achieve the purpose, the invention adopts the following technical scheme:
the invention provides a calibration device for automatic test equipment, wherein the automatic test equipment comprises a plurality of measurement board cards, the calibration device comprises a plurality of calibration daughter boards which are connected with the measurement board cards in a one-to-one correspondence manner and a calibration mother board which is respectively connected with the calibration daughter boards through standardized interfaces, the types of the calibration daughter boards are matched with the types of the measurement board cards corresponding to the calibration daughter boards, the calibration mother board is provided with a direct current signal standard source and a time sequence signal standard source, and the standardized interfaces comprise a direct current calibration signal interface and a time sequence calibration signal interface;
the calibration daughter board is used for switching transmission channels of multiple paths of signals to be subjected to direct current calibration from corresponding measurement board cards to output the multiple paths of signals to be subjected to direct current calibration to the calibration mother board in a single path through the direct current calibration signal interface, and switching transmission channels of multiple paths of signals to be subjected to time sequence calibration from corresponding measurement board cards to output the multiple paths of signals to be subjected to time sequence calibration to the calibration mother board in a single path through the time sequence calibration signal interface.
Optionally, the calibration daughter board includes a first relay network and a second relay network, the first relay network includes a plurality of first relays that are arranged in the transmission channel of the multi-path to-be-calibrated dc signal in a one-to-one manner, the second relay network includes a plurality of second relays that are arranged in the transmission channel of the multi-path to-be-calibrated timing signal in a one-to-one manner, the first relay network is configured to implement switching of the to-be-calibrated dc signal output by the single path, and the second relays are configured to implement switching of the to-be-calibrated timing signal output by the single path.
Optionally, the first relay is a low frequency relay, and the second relay is a high frequency relay.
Optionally, the standardized interface further includes a dc calibration bus for connecting transmission channels of signals to be dc calibrated between the calibration daughter boards through the calibration mother board.
Optionally, the calibration daughter board includes a diagnostic circuit, where the diagnostic circuit includes a precision resistor network, and is configured to determine whether a fault exists in the dc output and voltage-current measurement functions of the measurement board card corresponding to the calibration daughter board based on a multi-path dc calibration signal to be measured from the measurement board card corresponding to the calibration daughter board.
Optionally, the standardized interface further includes a control signal interface for converting a level of a control signal from the measurement board card into a standard level and transmitting the control signal.
The second aspect of the present invention provides an automatic test device, which includes a plurality of measurement boards and a calibration apparatus provided in the first aspect of the present invention.
Optionally, the system further comprises a back plate for plugging the plurality of measurement board cards.
Optionally, at least two types of the measurement boards exist in the plurality of measurement boards.
The invention has the following beneficial effects:
the technical scheme of the invention has high flexibility and high universality, and can greatly improve the calibration efficiency of automatic test equipment while saving cost.
Drawings
The following describes embodiments of the present invention in further detail with reference to the accompanying drawings;
fig. 1 is a schematic diagram of an automatic test equipment provided in an embodiment of the present invention.
Fig. 2 shows a schematic diagram of a calibration daughter board.
Fig. 3 shows a schematic diagram of a standardized interface.
Detailed Description
In order to more clearly illustrate the invention, the invention is further described below with reference to preferred embodiments and the accompanying drawings. Similar parts in the figures are denoted by the same reference numerals. It is to be understood by persons skilled in the art that the following detailed description is illustrative and not restrictive, and is not to be taken as limiting the scope of the invention.
As shown in fig. 1 to 3, an embodiment of the present invention provides an automatic test device, which includes a calibration apparatus and a plurality of measurement boards (e.g., the measurement board 1, the measurement board 2, … …, and the measurement board N in fig. 1), where the calibration apparatus includes a plurality of calibration daughter boards (e.g., the calibration board 1, the calibration board 2, … …, and the calibration board N in fig. 1) connected to the plurality of measurement boards in a one-to-one correspondence, and a calibration motherboard respectively connected to the plurality of calibration daughter boards through a standardized interface, where the type of the calibration daughter board matches the type of the measurement board corresponding to the calibration daughter board, the calibration motherboard is provided with a dc signal standard source and a timing signal standard source, and as shown in fig. 3, the standardized interface includes a dc calibration signal interface and a timing calibration signal interface;
the calibration daughter board is used for switching a transmission channel of a multi-channel to-be-treated direct current calibration signal from a corresponding measurement board card to pass through the direct current calibration signal interface to output the multi-channel to-be-treated direct current calibration signal to a calibration mother board (namely, the transmission channel of the multi-channel to-be-treated direct current calibration signal is switched, and the direct current calibration signal interface outputs the multi-channel to-be-treated direct current calibration signal to the calibration mother board in sequence in a single way), and switching a transmission channel of a multi-channel to-be-treated time sequence calibration signal from a corresponding measurement board card to pass through the time sequence calibration signal interface to output the multi-channel to-be-treated time sequence calibration signal to the calibration mother board in a single way (namely, the transmission channel of the multi-channel to-be-treated time sequence calibration.
When calibration is performed, a direct current signal standard source with functions of precisely measuring voltage and current in a calibration mother board measures voltage and current of a signal to be calibrated from each calibration daughter board, a timing signal standard source in the calibration mother board measures a signal to be calibrated from each calibration daughter board, and upper computer software deployed in automatic test equipment can be used for calculating error parameters of the signal to be calibrated and the timing calibration signal and writing the error parameters into a FLASH memory of a measurement board card for the measurement board card to perform calibration or compensation of output signals (including the direct current signal and the timing signal) according to the error parameters, wherein the error parameters include linearity errors, offset errors and the like, and for the timing calibration signal, the error parameters are generally the offset magnitude between two digital signals (namely whether edges are aligned).
The calibration device in the automatic test equipment that this embodiment provided adopts a general calibration motherboard to combine rather than the mode through a plurality of calibration daughter boards of unified standardized interface connection, the configuration of installation different grade type measurement integrated circuit boards on the automatic test equipment is come to the nimble configuration of calibration daughter board, can realize calibrating the measurement integrated circuit board of the different grade type of installing on the automatic test equipment simultaneously, high flexibility and high-pass usefulness have, research and development cycle and cost have been reduced, can promote automatic test equipment's calibration efficiency by a wide margin when practicing thrift the cost.
In some optional implementation manners of this embodiment, as shown in fig. 1, the automatic test equipment further includes a backplane for plugging the plurality of measurement boards.
In some optional implementation manners of this embodiment, at least two types of measurement boards exist in the plurality of measurement boards, that is, the measurement board 1 and the measurement boards 2 and … …, and at least one of the measurement boards N is different from the other measurement boards in type.
In some optional implementation manners of this embodiment, as shown in fig. 2, the calibration sub-board includes a first relay network and a second relay network, the first relay network includes a plurality of first relays that are arranged in the transmission channel of the multiple to-be-calibrated dc signals in a one-to-one correspondence, the second relay network includes a plurality of second relays that are arranged in the transmission channel of the multiple to-be-calibrated dc signals in a one-to-one correspondence, the first relay network is configured to implement switching of the to-be-calibrated dc signals that are output in a single path, and the second relays are configured to implement switching of the to-be-calibrated dc signals that are output in a single path.
Further, the first relay is a low-frequency relay, and the second relay is a high-frequency relay.
In the implementation mode, the calibration daughter board has the main functions of changing the multi-channel to-be-calibrated signals output by the measurement board card into one channel to-be-calibrated signals in a mode of switching (or conducting) the transmission channels through the low-frequency high-power relay, and changing the multi-channel to-be-calibrated signals output by the measurement board card into one channel to-be-calibrated signals in a mode of switching (or conducting) the transmission channels through the high-frequency relay. Therefore, only one path of signals to be calibrated, which are output to the calibration mother board by the calibration daughter board, is a direct-current calibration signal and one path of signals to be calibrated is a timing calibration signal, so that the interfaces of the calibration daughter board and the calibration mother board are standardized and unified, the calibration mother board can be connected (for example, inserted) into any calibration daughter board, and the flexible configuration of the calibration daughter board is realized. The calibration daughter boards are connected with the calibration mother board through the calibration daughter boards, and the calibration daughter boards and the calibration mother board are connected with the calibration mother board through the calibration daughter boards.
In some optional implementations of this embodiment, the standardized interface further includes a dc calibration bus for implementing, through the calibration motherboard, connection of a transmission channel of a signal to be dc calibrated between the calibration daughter boards. The optional mode can realize the parallel calibration of each measuring board card, and can further improve the calibration efficiency of the automatic test equipment. Specifically, the direct current calibration buses of all the calibration daughter boards are connected through the calibration mother board, so that the interconnection of direct current signals among the measurement board cards (the interconnection can be realized through the relays capable of switching corresponding transmission channels) can be realized, and further, the high-precision direct current signals of the high-precision measurement board cards are used for calibrating the low-precision direct current signals of the low-precision measurement board cards, so that the measurement board cards can be calibrated one by one without depending on a standard source in the calibration mother board, and the parallel calibration of the low-precision measurement board cards is realized.
In some optional implementation manners of this embodiment, as shown in fig. 2, the calibration daughter board includes a diagnostic circuit, and the diagnostic circuit includes a precision resistor network, and is configured to determine whether there is a fault in the dc output and voltage and current measurement functions of the measurement board card corresponding to the calibration daughter board based on the multiple paths of signals to be dc calibrated from the measurement board card corresponding to the calibration daughter board. In one specific example, the diagnostic circuit mainly comprises a precise resistor network with high precision and low temperature drift, and the diagnostic principle is roughly as follows: if the calculation result of dividing the output voltage of the measuring board card by the resistance value is basically equal to the current value measured by the measuring board card, the functions of the output voltage of the measuring board card and the measured current are normal; and if the calculation result of multiplying the output current of the measuring board card by the resistance value is basically equal to the voltage value measured by the measuring board card, the functions of the output current of the measuring board card and the voltage measurement are normal. The execution main body is a measurement board card. The 'measurement board output current/voltage value' is the voltage/current to be output by the direct current calibration signal. In addition, besides the precise resistance network, the diagnosis circuit can also realize other diagnosis functions such as signal loopback test function and the like through other circuits. The implementation mode enables the calibration device to realize the fault diagnosis function while realizing the calibration function, optimizes the design, further saves the cost and increases the use efficiency of customers.
In some optional implementations of this embodiment, the standardized interface further includes a control signal interface for converting a level of the control signal from the measurement board card into a standard level and transmitting the control signal.
In a specific example, the control type interface is shown as IIC (integrated circuit bus) in fig. 3, the measurement board outputs an IIC (integrated circuit bus) signal to the calibration daughter board to control the relays in the calibration daughter board and the calibration mother board and communication between the measurement board and the calibration daughter board and the calibration mother board through the IIC bus, and if a level standard of the IIC signal output by the measurement board is different from an IIC level standard (3.3V) output by the calibration daughter board to the calibration mother board, the IIC signal output by the calibration daughter board to the calibration mother board can be matched to the 3.3V level standard by using the IIC level conversion chip. The calibration daughter board and the calibration mother board comprise IIC extended GPIO chips, and the measurement board card controls the chips through an IIC bus to realize GPIO output level control, so that on-off control of the relay is realized. The calibration mother board and the calibration daughter board may also have a main control chip, such as an FPGA, disposed thereon, which also requires parameter communication through the IIC.
In addition, the calibration daughter board and the calibration mother board are both powered by the measurement board card, if the voltage ranges of the power supply output to the calibration daughter board by the measurement board card and the power supply output to the calibration mother board by the calibration daughter board are different, voltage conversion is needed, and the consistency of the power supply voltage output to the calibration mother board by the calibration daughter board is ensured.
In summary, the calibration device in the automatic test equipment provided in this embodiment standardizes the interfaces of the calibration daughter board and the calibration mother board, and realizes that each slot of the calibration mother board supports different types of calibration daughter boards, thereby corresponding to different types of measurement board cards. Various measurement board card configuration modes of the automatic test equipment can be adapted through the configuration of the corresponding calibration daughter board, so that the calibration of the automatic test equipment can be flexibly and efficiently realized.
In the description of the present invention, it should be noted that the terms "upper", "lower", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, which are merely for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and operate, and thus, should not be construed as limiting the present invention. Unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are intended to be inclusive and mean, for example, that they may be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
It is further noted that, in the description of the present invention, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
It should be understood that the above-mentioned embodiments of the present invention are only examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention, and it will be obvious to those skilled in the art that other variations and modifications can be made on the basis of the above description, and all embodiments cannot be exhaustive, and all obvious variations and modifications belonging to the technical scheme of the present invention are within the protection scope of the present invention.
Claims (9)
1. A calibration device for automatic test equipment comprises a plurality of measurement board cards, and is characterized by comprising a plurality of calibration daughter boards and a calibration mother board, wherein the calibration daughter boards are connected with the measurement board cards in a one-to-one correspondence manner, the calibration mother board is respectively connected with the calibration daughter boards through standardized interfaces, the types of the calibration daughter boards are matched with the types of the measurement board cards corresponding to the calibration daughter boards, the calibration mother board is provided with a direct current signal standard source and a time sequence signal standard source, and the standardized interfaces comprise a direct current calibration signal interface and a time sequence calibration signal interface;
the calibration daughter board is used for switching transmission channels of multiple paths of signals to be subjected to direct current calibration from corresponding measurement board cards to output the multiple paths of signals to be subjected to direct current calibration to the calibration mother board in a single path through the direct current calibration signal interface, and switching transmission channels of multiple paths of signals to be subjected to time sequence calibration from corresponding measurement board cards to output the multiple paths of signals to be subjected to time sequence calibration to the calibration mother board in a single path through the time sequence calibration signal interface.
2. The calibration device according to claim 1, wherein the calibration daughter board comprises a first relay network and a second relay network, the first relay network comprises a plurality of first relays disposed in the transmission channel of the multiple signals to be calibrated with direct current in a one-to-one correspondence, the second relay network comprises a plurality of second relays disposed in the transmission channel of the multiple signals to be calibrated with time sequence in a one-to-one correspondence, the first relay network is configured to implement switching of the signals to be calibrated with direct current output by a single circuit, and the second relays are configured to implement switching of the signals to be calibrated with time sequence output by a single circuit.
3. The calibration device of claim 2, wherein the first relay is a low frequency relay and the second relay is a high frequency relay.
4. The calibration device according to claim 1, wherein the standardized interface further comprises a dc calibration bus for connecting transmission channels of signals to be dc calibrated between the calibration daughter boards through the calibration mother board.
5. The calibration device according to claim 1, wherein the calibration daughter board comprises a diagnostic circuit, and the diagnostic circuit comprises a precision resistor network, and is configured to determine whether the dc output and voltage/current measurement functions of the measurement board card corresponding to the calibration daughter board have a fault based on the multiple dc calibration signals to be measured from the measurement board card corresponding to the calibration daughter board.
6. The calibration device of claim 1, wherein the standardized interface further comprises a control signal interface for converting the level of the control signal from the measurement board to a standard level and transmitting the control signal.
7. An automatic test equipment comprising a plurality of measurement boards, characterized in that it further comprises a calibration device according to any one of claims 1-6.
8. The automatic test equipment of claim 7, further comprising a backplane for plugging the plurality of measurement cards.
9. The automatic test equipment of claim 7, wherein there are at least two measurement card types of the plurality of measurement cards.
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| CN202010022864.9A CN111123076A (en) | 2020-01-09 | 2020-01-09 | Calibration device and automatic test equipment |
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| CN111812576A (en) * | 2020-07-22 | 2020-10-23 | 积成电子股份有限公司 | System and method for adjusting transformer board of relay protection device |
| CN111968344A (en) * | 2020-07-31 | 2020-11-20 | 中国铁道科学研究院集团有限公司 | Signal interface detection equipment and method for railway earthquake early warning monitoring system |
| CN113447846A (en) * | 2021-06-29 | 2021-09-28 | 国网北京市电力公司 | Charging pile testing device calibration system |
| CN114264996A (en) * | 2021-11-30 | 2022-04-01 | 上海御渡半导体科技有限公司 | Method for detecting DC calibration effectiveness of ATE equipment |
| CN114646870A (en) * | 2022-02-07 | 2022-06-21 | 苏州华兴源创科技股份有限公司 | Time sequence calibration method and system |
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| CN114264996A (en) * | 2021-11-30 | 2022-04-01 | 上海御渡半导体科技有限公司 | Method for detecting DC calibration effectiveness of ATE equipment |
| CN114264996B (en) * | 2021-11-30 | 2024-05-03 | 上海御渡半导体科技有限公司 | ATE equipment DC calibration effectiveness detection method |
| CN114646870A (en) * | 2022-02-07 | 2022-06-21 | 苏州华兴源创科技股份有限公司 | Time sequence calibration method and system |
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| CN114646870B (en) * | 2022-02-07 | 2024-03-12 | 苏州华兴源创科技股份有限公司 | Time sequence calibration method and system |
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| CN115792769A (en) * | 2023-01-29 | 2023-03-14 | 苏州华兴源创科技股份有限公司 | Signal calibration method and system of semiconductor test equipment and computer equipment |
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