CN114624167A - Sample analyzer - Google Patents
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- CN114624167A CN114624167A CN202210520432.XA CN202210520432A CN114624167A CN 114624167 A CN114624167 A CN 114624167A CN 202210520432 A CN202210520432 A CN 202210520432A CN 114624167 A CN114624167 A CN 114624167A
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- 230000003287 optical effect Effects 0.000 claims abstract description 137
- 238000005259 measurement Methods 0.000 claims abstract description 76
- 238000006243 chemical reaction Methods 0.000 claims abstract description 38
- 239000012530 fluid Substances 0.000 claims abstract description 18
- 239000007788 liquid Substances 0.000 claims abstract description 10
- 238000005338 heat storage Methods 0.000 claims description 56
- 238000010438 heat treatment Methods 0.000 claims description 22
- 238000009825 accumulation Methods 0.000 claims description 19
- 238000009529 body temperature measurement Methods 0.000 claims description 16
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 13
- 239000011889 copper foil Substances 0.000 claims description 13
- 238000012544 monitoring process Methods 0.000 claims description 13
- 229910000679 solder Inorganic materials 0.000 claims description 7
- 239000003292 glue Substances 0.000 claims description 5
- 238000001514 detection method Methods 0.000 claims description 4
- 238000003491 array Methods 0.000 claims description 2
- 238000004861 thermometry Methods 0.000 claims 6
- 238000009434 installation Methods 0.000 claims 4
- 238000000034 method Methods 0.000 abstract 1
- 239000000523 sample Substances 0.000 description 89
- 210000004027 cell Anatomy 0.000 description 38
- 239000007850 fluorescent dye Substances 0.000 description 12
- 229910052751 metal Inorganic materials 0.000 description 12
- 239000002184 metal Substances 0.000 description 12
- 239000003153 chemical reaction reagent Substances 0.000 description 11
- 238000009413 insulation Methods 0.000 description 9
- 239000002245 particle Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 210000004369 blood Anatomy 0.000 description 5
- 239000008280 blood Substances 0.000 description 5
- 230000001276 controlling effect Effects 0.000 description 4
- 238000004321 preservation Methods 0.000 description 4
- 238000001816 cooling Methods 0.000 description 3
- 238000005286 illumination Methods 0.000 description 3
- 230000001105 regulatory effect Effects 0.000 description 3
- 238000000684 flow cytometry Methods 0.000 description 2
- 230000017525 heat dissipation Effects 0.000 description 2
- 238000011534 incubation Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000002457 bidirectional effect Effects 0.000 description 1
- 239000012472 biological sample Substances 0.000 description 1
- 210000000601 blood cell Anatomy 0.000 description 1
- 230000001413 cellular effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000004043 dyeing Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000006552 photochemical reaction Methods 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Optical investigation techniques, e.g. flow cytometry
- G01N15/1434—Optical arrangements
- G01N15/1436—Optical arrangements the optical arrangement forming an integrated apparatus with the sample container, e.g. a flow cell
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
- G01N33/483—Physical analysis of biological material
- G01N33/487—Physical analysis of biological material of liquid biological material
- G01N33/49—Blood
- G01N33/4915—Blood using flow cells
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- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Biomedical Technology (AREA)
- Physics & Mathematics (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Hematology (AREA)
- Ecology (AREA)
- Dispersion Chemistry (AREA)
- Biophysics (AREA)
- Molecular Biology (AREA)
- Urology & Nephrology (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
The application discloses sample analyzer relates to medical treatment and detects technical field. The sample analyzer comprises a sample reaction container, a sheath fluid container, a flow chamber, an optical measurement component and a plurality of temperature control modules; the flow chamber is respectively communicated with the reaction container and the sheath liquid container; the optical measurement assembly detects light passing through the flow cell; the plurality of temperature control modules are respectively arranged corresponding to the sample reaction container, the sheath liquid container and the optical measurement assembly so as to control the temperature of the sample reaction container, the temperature of the sheath liquid container and the temperature of the optical measurement assembly. The method and the device can improve the accuracy and consistency of the measuring result of the optical measuring component.
Description
Technical Field
The application relates to the technical field of medical detection, in particular to a sample analyzer.
Background
Sample analyzers are used to analyze, e.g., classify and count, cellular particles in biological samples. Sample analyzers are classified as hematology analyzers or flow cytometric analyzers. The sample analyzer includes a sample collection device, a reagent supply device, a sample reaction device, a sample transport device, and an optical measurement device. The sample collection device is used for collecting a sample and conveying the sample to the sample reaction device; the reagent supply device is used for collecting reagents and conveying the reagents to the sample reaction device; the sample reaction device is used for mixing and incubating a sample and a reagent to obtain a sample; the sample conveying device is used for conveying a sample for optical measurement; the optical measuring device is used for collecting scattered light or fluorescence generated by the cell particles in the sample irradiated by the light source and converting the scattered light or the fluorescence into an electric signal so as to realize the classification and counting of the cells by analyzing the electric signal.
With the use of sample analyzers becoming more and more widespread, many primary hospitals, societies and clinics with common conditions have sample analyzers, however, the performance of the optical measurement device is greatly influenced by the temperature, and the change of the temperature can interfere the measurement result of the optical measurement device, cause the fluctuation of the measurement result and influence the accuracy and consistency of the measurement result.
Disclosure of Invention
To achieve the above objects, the present application provides a sample analyzer including a sample reaction container, a sheath fluid container, a flow cell, an optical measurement assembly, and a plurality of temperature control modules;
the flow chamber is respectively communicated with the reaction container and the sheath fluid container; the optical measurement assembly detects light passing through the flow cell; the plurality of temperature control modules are respectively arranged corresponding to the sample reaction container, the sheath liquid container and the optical measurement assembly so as to control the temperature of the sample reaction container, the temperature of the sheath liquid container and the temperature of the optical measurement assembly.
Has the advantages that: different from the prior art, the temperature control module which is correspondingly arranged with the optical measurement assembly is utilized to regulate and control the temperature of the optical measurement assembly so as to limit or reduce the temperature fluctuation of the optical measurement assembly, so that the optical measurement assembly is maintained near the preset target temperature, and the accuracy and consistency of the measurement result of the optical measurement assembly are improved.
Drawings
FIG. 1 is a block diagram of a first embodiment of a sample analyzer of the present application;
FIG. 2 is a schematic optical path diagram of an optical measurement assembly of the sample analyzer of the present application;
FIG. 3 is a schematic view of an assembled structure of an optical measurement assembly of a second embodiment of the sample analyzer of the present application;
FIG. 4 is a schematic view of the assembled structure of a thermal storage sheet assembly, an insulating layer and a metal mounting plate of a third embodiment of the sample analyzer of the present application;
FIG. 5 is a schematic view of the assembled structure of a thermal storage sheet assembly, an insulating layer and a metal mounting plate of a fourth embodiment of the sample analyzer of the present application;
FIG. 6 is a schematic view of an assembled structure of an optical measurement assembly of a fifth embodiment of the sample analyzer of the present application;
FIG. 7 is a schematic view of an assembly structure of an optical signal collecting plate and a photosensitive unit of the sample analyzer of the present application;
FIG. 8 is a schematic view of the area near the single photosensitive unit in FIG. 7;
FIG. 9 is a schematic view of an assembly of an optical signal collection plate, a mirror and a mirror holder according to a fifth embodiment of the sample analyzer of the present application;
FIG. 10 is a schematic view of an assembled structure of an optical measurement module according to a sixth embodiment of the sample analyzer of the present application;
fig. 11 is a schematic view of an assembly structure of an optical signal collecting plate and a heat conducting base in a sixth embodiment of the sample analyzer of the present application.
Description of reference numerals:
100. a sample analyzer; 110. a sample reaction vessel; 120. a sheath fluid container; 130. a flow chamber; 140. an optical measurement assembly; 150. a temperature control module; 160. a cover body; 161. a heat preservation cavity; 170. a laser temperature measurement piece; 180. a flow cell temperature measurement member; 190. a fluorescence detector temperature measurement piece; 400. a scattered light detector temperature measurement piece;
151. a reaction temperature control module; 152. a sheath fluid temperature control module; 153. a flow chamber temperature control module; 154. an optical measurement component temperature control module;
141. a laser; 142. a scattered light detector; 142a, a side scatter detector; 142b, a forward scatter detector; 143. a fluorescence detector; 144. a dichroic mirror;
1541. a laser temperature control module; 1542. a scattered light detector temperature control module; 1542a, a temperature control module of a side scattered light detector; 1542b, a forward scattering light detector temperature control module; 1543 a temperature control module of the fluorescent detector;
200. a common temperature control device; 210. a heat storage sheet assembly; 220. a heat storage temperature measurement member; 230. a controller; 211. a first side surface; 212. a second side surface; A. a component mounting area; B. a component avoidance zone;
210a, a first heat storage sheet assembly; 211a, a heating sheet; 212a, a thermal insulation layer; 213a, a metal mounting plate; 210b, a second thermal storage sheet assembly; 211b, a thermally conductive base plate; 212b, a heat patch; 213b, a heat insulating layer; 214b, a metal mounting plate;
310. an optical signal acquisition board; 311. a third side; 312. a fourth side; C. a copper foil outer drain region; D. a solder mask ink coverage area; 320. a light sensing unit; 330. a reflective mirror; 340. a mirror support; 341. a reflector mounting inclined plane;
350. a thermally conductive base; 351. a transverse plate; 3511. a fifth side surface; 3512. a sixth side; 352. a vertical plate; 3521. a seventh side; 3522. an eighth side; l, a first direction; w, a second direction; 360. a thermistor.
Detailed Description
In order to make the technical solutions of the present application better understood by those skilled in the art, the present application is described in further detail below with reference to the accompanying drawings and the detailed description. It is to be understood that the described embodiments are merely some embodiments of the present application and not all embodiments. All other embodiments obtained by a person of ordinary skill in the art without any creative effort based on the embodiments in the present application belong to the protection scope of the present application.
Referring to fig. 1, fig. 1 is a block diagram of a sample analyzer according to a first embodiment of the present application.
As shown in fig. 1, the sample analyzer 100 includes a sample reaction vessel 110, a sheath fluid vessel 120, a flow cell 130, an optical measurement assembly 140, and a plurality of temperature control modules 150.
The flow cell 130 communicates with the sample reaction container 110 and the sheath fluid container 120, respectively; the optical measurement assembly 140 detects light passing through the flow cell 130; the plurality of temperature control modules 150 are respectively disposed corresponding to the sample reaction container 110, the sheath fluid container 120, and the optical measurement module 140 to control the temperature of the sample reaction container 110, the temperature of the sheath fluid container 120, and the temperature of the optical measurement module 140.
The sample reaction container 110 is used for receiving a sample and a reagent, and is used for mixed incubation of the sample and the reagent to obtain a sample. The flow cell 130 receives the sample supplied from the sample reaction container 110 and the sheath fluid supplied from the sheath fluid container 120, and forms a columnar sample flow by wrapping the sample with the sheath fluid. The flow cell 130 has an illumination region (not shown), and the optical measurement assembly 140 is configured to provide light to illuminate the columnar sample flow through the illumination region, sense scattered light and fluorescence generated by the cell particles in the columnar sample flow due to the light illumination, and output corresponding electrical signals.
In this way, the temperature control module 150 disposed corresponding to the optical measurement assembly 140 is used to regulate and control the temperature of the optical measurement assembly 140, so as to limit or reduce the temperature fluctuation of the optical measurement assembly 140, and maintain the optical measurement assembly 140 at a temperature near the preset target temperature, thereby improving the accuracy and consistency of the measurement result of the optical measurement assembly 140.
In one exemplary embodiment, the sample is blood. Before entering the flow chamber 130 for detection by flow cytometry, the blood and the reagent are reacted at a constant temperature to form a sample, the reagent involved in the reaction includes a fluorescent dye, the fluorescent dye is used for dyeing blood cells so as to generate fluorescence under irradiation of light provided by the optical measurement component 140, and the optical measurement component 140 outputs a corresponding electrical signal by sensing the fluorescence.
The inventors found that the fluorescent dye is relatively sensitive to temperature, wherein as the temperature of the fluorescent dye decreases, the intensity of fluorescence emitted by the fluorescent dye increases; when the temperature of the fluorescent dye rises, the intensity of the fluorescence emitted by the fluorescent dye is reduced, mainly because: the conversion of the molecular internal energy of the fluorescent dye is accelerated along with the increase of the temperature, and simultaneously, the reversible photochemical reaction is generated between the excited molecules and the solvent molecules.
In the present application, the blood and the fluorescent dye may react in the sample reaction container 110, and the temperature of the sample reaction container 110 is controlled by the temperature control module 150 disposed corresponding to the sample reaction container 110, so that the temperature of the sample reaction container 110 is constant, thereby being capable of improving the accuracy and consistency of the measurement result of the optical measurement assembly 140.
Specifically, as shown in fig. 1, the plurality of temperature control modules 150 include a reaction temperature control module 151, a sheath liquid temperature control module 152, and an optical measurement module temperature control module 154, where the reaction temperature control module 151 is disposed corresponding to the sample reaction container 110, the sheath liquid temperature control module 152 is disposed corresponding to the sheath liquid container 120, and the optical measurement module temperature control module 154 is disposed corresponding to the optical measurement module 140.
Further, referring to fig. 2, fig. 2 is a schematic optical path diagram of an optical measurement assembly of the sample analyzer of the present application. As shown in fig. 2, the optical measurement assembly 140 includes a laser 141, a scattered light detector 142, and a fluorescence detector 143, and the optical measurement assembly temperature control module 154 includes a laser temperature control module 1541, a scattered light detector temperature control module 1542, and a fluorescence detector temperature control module 1543.
The laser temperature control module 1541 is disposed corresponding to the laser 141, and is configured to control a temperature of the laser 141; a scattered light detector temperature control module 1542 is disposed corresponding to the scattered light detector 142 for controlling the temperature of the scattered light detector 142; the fluorescence detector temperature control module 1543 is disposed corresponding to the fluorescence detector 143 and is configured to control the temperature of the fluorescence detector 143.
As shown in fig. 2, a laser 141 is used to irradiate the columnar sample flow with light through the irradiation region, and the cell particles in the columnar sample flow generate scattered light and fluorescence under the irradiation of the light. The scattered light detector 142 is used for sensing scattered light and outputting a corresponding electrical signal, and the fluorescence detector 143 is used for sensing fluorescence and outputting a corresponding electrical signal.
Optionally, scatter detectors 142 include photodiodes and/or avalanche photodiodes and fluorescence detectors 143 include avalanche photodiodes, photomultiplier tubes, and/or single photon avalanche diode arrays.
With respect to laser 141, the inventors have discovered that laser 141 is sensitive to temperature variations, wherein the wavelength of the laser light output by laser 141 is related to the temperature of laser 141, and the higher the temperature of laser 141, the longer the wavelength of the laser light output by laser 141. Since the sample in the column-shaped sample flow is stained with a specific fluorescent dye, a small change in the peak wavelength of the laser light output from the laser 141 causes a large fluctuation in the excited weak fluorescence, resulting in a large deviation in the measurement result of the optical measurement unit 140.
In this way, in an exemplary real-time manner, the temperature of the laser 141 is controlled by the laser temperature control module 1541 corresponding to the laser 141 to limit or reduce the temperature fluctuation of the laser 141, so as to improve the measurement result of the optical measurement assembly 140 and achieve the purpose of improving the accuracy and consistency of the measurement result of the optical measurement assembly 140.
For photodetectors such as scatter detectors 142 and fluorescence detectors 143, the inventors have found that the photodetectors are also sensitive to temperature changes.
In the manner described above, in an exemplary real-time manner, the temperature of scatter detectors 142 is controlled using scatter detector temperature control module 1542 corresponding to scatter detectors 142 to limit or reduce temperature fluctuations of scatter detectors 142; the temperature of the fluorescence detector 143 is controlled by the fluorescence detector temperature control module 1543 corresponding to the fluorescence detector 143 to limit or reduce the temperature fluctuation of the fluorescence detector 143; therefore, the measuring result of the optical measuring component 140 can be improved, and the purpose of improving the accuracy and consistency of the measuring result of the optical measuring component 140 is achieved.
Further, as shown in fig. 1, the plurality of temperature control modules 150 includes a flow chamber temperature control module 153 disposed corresponding to the flow chamber 130 for controlling the temperature of the flow chamber 130.
In this way, the temperature of the flow chamber 130 is controlled by the flow chamber temperature control module 153 corresponding to the flow chamber 130 to limit or reduce the temperature fluctuation of the flow chamber 130, so that the measurement result of the optical measurement assembly 140 can be improved, and the purpose of improving the accuracy and consistency of the measurement result of the optical measurement assembly 140 can be achieved.
In an exemplary embodiment, the sample is blood, and the blood is reacted with a reagent at a constant temperature to form a sample before entering the flow cell 130 for detection by flow cytometry, wherein the reagent involved in the reaction comprises a fluorescent dye as described in the first embodiment. Wherein the temperature of the flow cell 130 is controlled by the flow cell temperature control module 153, so that the temperature of the fluorescent dye in the sample flowing into the flow cell 130 is relatively stable.
In the above optical measurement assembly 140, the temperature control module 150 includes a temperature monitoring module (not shown in fig. 1 and 2) and a temperature adjusting module (not shown in fig. 1 and 2), wherein the temperature monitoring module is configured to monitor a temperature and obtain a corresponding temperature value, and the temperature adjusting module is configured to adjust the temperature according to the temperature value obtained by the temperature monitoring module, so that the temperature control module 150 achieves an effect of controlling the temperature.
Among them, the inventor found that in the above-mentioned optical measurement module 140, since the laser temperature control module 1541 is integrated in the laser 141, the scattered light detector temperature control module 1542 is integrated in the scattered light detector 142, and the fluorescence detector temperature control module 1543 is integrated in the fluorescence detector 143. That is, the temperature control module 150 is integrated with the corresponding optical electronic component, wherein the switching-off signal generated when the power components such as the temperature adjustment module in the temperature control module 150 are switched on and off may interfere with the weak signal of the optical electronic component integrated therewith. For example, an on/off signal generated in a temperature adjustment module in laser temperature control module 1541 may interfere with the light emission intensity of laser 141; the on/off signal generated in the temperature adjustment module of the scattered light detector temperature control module 1542 may interfere with the sensing of scattered light by the scattered light detector 142; the on/off signal generated in the temperature adjustment module of fluorescence detector temperature control module 1543 may interfere with the sensing of fluorescence by fluorescence detector 143.
Further, the inventors found that the target temperature control range of the laser temperature control module 1541, the target temperature control range of the scattered light detector temperature control module 1542, and the target temperature control range of the fluorescence detector temperature control module 1543 have overlapping value ranges. Specifically, the target temperature control range of the laser temperature control module 1541 is-10 ℃ to 50 ℃. For example, at-10 deg.C, -5 deg.C, -10 deg.C, 27.5 deg.C, 30 deg.C, 50 deg.C. The target temperature control ranges of the scattered light detector temperature control module 1542 and the fluorescence detector temperature control module 1543 are-20 ℃ to 60 ℃. For example, at-20 deg.C, -10 deg.C, 0 deg.C, 24.6 deg.C, 53 deg.C, 60 deg.C. The target temperature control range of the flow cell temperature control module 153 is +30 ℃ to 40 ℃. For example, 30 ℃, 34.9 ℃, 36.5 ℃, 37 ℃ and 40 ℃. The target temperature control range of the laser 141 module, the target temperature control range of the scattered light detector temperature control module 1542 and the target temperature control range of the fluorescent detector temperature control module 1543 are 30-40 ℃. The inventors hereby propose the following second embodiment.
Referring to fig. 3, fig. 3 is a schematic view of an assembly structure of an optical measurement assembly according to a second embodiment of the sample analyzer of the present application. As further defined for the above first embodiment, a second embodiment of the sample analyzer 100 is proposed, which is further defined in that, referring to fig. 2 in comparison with fig. 3, the laser temperature control module 1541, the scattered light detector temperature control module 1542, the fluorescence detector temperature control module 1543 and the flow chamber temperature control module 153 in fig. 2 are integrated into the common temperature control device 200 in fig. 3, and the flow chamber 130, the laser 141, the scattered light detector 142 and the fluorescence detector 143 are respectively assembled to the common temperature control device 200.
Through the mode, the temperature of the laser 141, the temperature of the scattered light detector 142, the temperature of the fluorescence detector 143 and the temperature of the flow chamber 130 are uniformly regulated and controlled by the common temperature control device 200, so that the number of the temperature control devices is reduced, the cost is reduced, and the power consumption of the power supply is reduced.
And with respect to the temperature control modules 150 which are dispersed and respectively correspondingly integrated in the laser 141, the scattered light detector 142 and the fluorescence detector 143, the laser temperature control module 1541, the scattered light detector temperature control module 1542, the fluorescence detector temperature control module 1543 and the flow chamber temperature control module 153 are integrated into a common temperature control device 200, so that interference on weak signals in the laser 141, the scattered light detector 142 and the fluorescence detector 143 can be reduced.
In an exemplary embodiment, the target temperature control range of the common temperature control device 200 may be 32 ℃ to 38 ℃. For example, 32 ℃, 33.7 ℃, 36 ℃, 36.5 ℃, 37 ℃ and 38 ℃.
In an exemplary embodiment, the temperature adjustment module in the common temperature control device 200 may have a heating module and a cooling module, such that bidirectional temperature adjustment may be achieved by heating and cooling of the common temperature control device 200.
The inventors have found that the laser 141, the scattered light detector 142, and the fluorescence detector 143 need to be located in a sealed darkroom without external stray light, and if the common temperature control device 200 is cooled, water drops are likely to be condensed in the darkroom, which not only causes a short-circuit fault in the circuit, but also causes corrosion, thereby affecting the sealing performance of the darkroom. The inventors hereby propose to configure the common temperature control device 200 as a unidirectional temperature control device (not shown).
The one-way temperature control device only has a heating module and no refrigerating module. The one-way temperature control device stops heating when the monitored temperature reaches or exceeds the preset stopping temperature, and heats when the monitored temperature is lower than the preset stopping temperature, so that the target temperature control range of the public temperature control device 200 is 32-38 ℃.
The inventor finds that the average temperature in China's climate gazette in 2021 is 10.5 ℃, the average temperature in China is mostly lower than 30 ℃, even if the basic hospitals, the social health clinics and the clinics with quite poor conditions are generally provided with air conditioners, and the indoor temperature can be reduced by regulating and controlling the air conditioners when the indoor temperature is higher than 30 ℃.
Thus, the off temperature can be 32 ℃ to 38 ℃. For example, 32 ℃, 33.7 ℃, 36 ℃, 36.5 ℃, 37 ℃ and 38 ℃. So that the stop temperature is higher than the indoor temperature in most cases, thereby facilitating the heating of the common temperature control device 200. When the indoor temperature is higher than the stop temperature, the indoor temperature may be lower than the stop temperature using an air conditioner. In an exemplary embodiment, the common temperature control device 200 may be communicatively coupled to an air conditioner. The communication connection is for example a wireless connection or a wired connection. The wireless connection is, for example, one or more of WIFI, bluetooth and ZigBee.
When the public temperature control device 200 monitors that the indoor temperature reaches the upper limit cut-off temperature, the air conditioner is controlled to start and refrigerate. The upper limit cut-off temperature is greater than the cut-off temperature, and the upper limit cut-off temperature can be 33 ℃ to 38 ℃. For example, 33 ℃, 34 ℃, 36.5 ℃, 37 ℃, 37.5 ℃ and 38 ℃.
In an exemplary embodiment, the off temperature may be 35 ℃. The upper cut-off temperature may be 37 ℃ or 38 ℃.
Alternatively, the common temperature control device 200 controls the air conditioner to stop cooling when it is monitored that the indoor temperature reaches or falls below the stop temperature.
Compared with the mode that the temperature is reduced by using the temperature control devices correspondingly assembled with the laser 141, the scattered light detector 142 and the fluorescence detector 143, the temperature of the laser 141, the scattered light detector 142 and the fluorescence detector 143 in the darkroom is regulated and controlled by using the linkage of the common temperature control device 200 and the air conditioner, and when the temperature reaches or exceeds the upper limit cut-off temperature, the temperature is reduced by using the air conditioner, so that water drops are not easy to be condensed in the darkroom.
As shown in fig. 3, the common temperature control device 200 includes a heat storage plate assembly 210, a heat storage temperature measurement member 220 and a controller 230, wherein the temperature monitoring module of the common temperature control device 200 can be realized by the linkage of the heat storage temperature measurement member 220 and the controller 230, and the temperature adjusting module of the common temperature control device 200 can be realized by the linkage of the heat storage plate assembly 210 and the controller 230.
The flow chamber 130, the laser 141, the scattered light detector 142 and the fluorescence detector 143 are respectively and correspondingly assembled on a heat storage piece assembly 210, and the heat storage piece assembly 210 is used for heating the flow chamber 130, the laser 141, the scattered light detector 142 and the fluorescence detector 143; the heat accumulation temperature measurement member 220 is assembled to the heat accumulation plate assembly 210 and used for detecting the temperature of the heat accumulation plate assembly 210; the controller 230 is electrically coupled to the heat storage plate assembly 210 and the heat storage temperature measurement unit 220, respectively, and is configured to control the heat storage plate assembly 210 to heat up to a target temperature control range.
Further, heat accumulator assembly 210 includes first side 211 and second side 212 that are disposed opposite each other. First side 211 has a component mounting area a adjacent to component avoidance area B for mounting laser 141, flow cell 130, scattered light detector 142 and fluorescence detector 143, and a component avoidance area B not mounting optical measurement component 140.
The laser 141, the flow cell 130, the scattered light detector 142, and the fluorescence detector 143 are disposed in the component mounting region a, and the thermal storage temperature measurement element 220 is disposed in the component avoiding region B.
Through the above manner, the heat storage temperature measurement piece 220 is arranged in the component avoiding area B, so that the arrangement and leading-out of the signal line can be facilitated, and the signal of the heat storage temperature measurement piece 220 is not easily influenced by the laser 141, the flow chamber 130, the scattered light detector 142 and the fluorescence detector 143.
Further, referring to fig. 4, fig. 4 is a schematic diagram of an assembly structure of a thermal storage sheet assembly, a thermal insulation layer and a metal mounting plate according to a third embodiment of the sample analyzer of the present application. As further defined in the second embodiment above, a third embodiment of the sample analyzer 100 is provided, which is further defined in that the heat storage plate assembly 210 is a first heat storage plate assembly 210a, the first heat storage plate assembly 210a includes a heat sink 211a, the sample analyzer 100 includes a thermal insulation layer 212a, and a metal mounting plate 213 a.
The first side surface 211 and the second side surface 212 are opposite sides of the heating sheet 211 a; the heat insulation layer 212a covers the second side surface 212 of the heat storage plate assembly 210; the metal mounting plate 213a is overlapped on one side of the heat insulation layer 212a, which faces away from the heat storage plate assembly 210; the controller 230 is electrically coupled to the heating plate 211 a.
In this manner, the flow cell 130, the laser 141, the scattered light detector 142, and the fluorescence detector 143 are directly mounted to the heat accumulation sheet assembly 210, so that heat transfer between the heat sheet 211a and the flow cell 130, the laser 141, the scattered light detector 142, and the fluorescence detector 143 can be accelerated.
And the thermal insulation layer 212a is used for isolating the temperature of the outside, so that the heat conduction, the heat convection or the heat radiation between the temperature of the flow chamber 130, the laser 141, the scattered light detector 142 and the fluorescent light detector 143 and the outside can be isolated or reduced. The metal mounting plate 213a is provided to facilitate mounting and fixing.
Alternatively, the mounting plate is a metal mounting plate 213a, which has high mechanical strength.
Further, referring to fig. 5, fig. 5 is a schematic diagram of an assembly structure of a thermal storage plate assembly, a thermal insulation layer and a metal mounting plate according to a fourth embodiment of the sample analyzer of the present application. In further detail with respect to the second embodiment described above, a fourth embodiment of the sample analyzer 100 is provided, which is further defined in that the heat storage sheet assembly 210 is a second heat storage sheet assembly 210b, the second heat storage sheet assembly 210b includes a heat conductive base plate 211b, and the sample analyzer 100 includes a heat patch 212b, a heat insulating layer 213b, and a metal mounting plate 214 b.
The heat conducting bottom plate 211b is arranged on the heating sheet 212b in an overlapping manner, the first side surface 211 is a side surface of the heat conducting bottom plate 211b deviating from the heating sheet 212b, and the second side surface 212 is a side surface of the heating sheet 212b deviating from the heat conducting bottom plate 211 b; the heat insulation layer 213b covers the second side surface 212 of the heat storage plate assembly 210; the metal mounting plate 214b is overlapped on one side surface of the heat insulation layer 213b, which faces away from the heat storage plate assembly 210; the controller 230 is electrically coupled to the heating plate 212 b.
Alternatively, the heat conducting bottom plate 211b has a high heat conductivity, that is, the heat conducting bottom plate 211b has good heat conductivity. In an exemplary embodiment, the heat conductive base plate may be an aluminum alloy heat conductive base plate.
In this way, the flow chamber 130, the laser 141, the scattered light detector 142 and the fluorescence detector 143 are indirectly assembled to the heat storage plate assembly 210 through the heat conducting bottom plate 211b, so that the heat conducting bottom plate 211b can store heat and conduct heat with the flow chamber 130, the laser 141, the scattered light detector 142 and the fluorescence detector 143 when the heating plate 212b is heated, and thus the flow chamber 130, the laser 141, the scattered light detector 142 and the fluorescence detector 143 are integrally heated.
And when the heat patch 212b is not heated, the heat conductive bottom plate 211b may dissipate heat for the flow cell 130, the laser 141, the scattered light detector 142, and the fluorescence detector 143 based on heat conduction with the flow cell 130, the laser 141, the scattered light detector 142, and the fluorescence detector 143, respectively.
Further, referring to fig. 6, fig. 6 is a schematic view of an assembly structure of an optical measurement assembly according to a fifth embodiment of the sample analyzer of the present application. As further defined with respect to the third or fourth embodiments described above, a fifth embodiment of the sample analyzer 100 is provided, which is further defined in that the sample analyzer 100 includes a housing 160, as shown in fig. 6.
The cover body 160 covers the first side surface 211 of the heat accumulation plate assembly 210 to form a heat preservation cavity together with the heat accumulation plate assembly 210, and the flow chamber 130, the laser 141, the scattered light detector 142, the fluorescence detector 143 and the heat accumulation temperature measuring part 220 are located in the heat preservation cavity. Wherein, the sample reaction vessel 110 and the sheath fluid vessel 120 may be located outside the incubation cavity.
Through the mode, the heat preservation cavity not only can be used for maintaining the stability of the temperatures of the flow chamber 130, the laser 141, the scattered light detector 142 and the fluorescence detector 143, but also can be a dark room and can isolate external stray light.
The inventors have found that the thermal mass storage assembly 210 detects the temperature of the thermal mass storage assembly 210 using the thermal mass temperature measuring member 220, and thus the temperature of the thermal mass storage assembly 210 is used as a uniform temperature value for the flow cell 130, the laser 141, the scattered light detector 142, and the fluorescence detector 143. Since the temperature of the heat storage chip assembly 210 is the temperature of the flow cell 130, the laser 141, the scattered light detector 142, and the fluorescence detector 143 and the temperature of the heat storage chip assembly 210 after heat conduction therebetween, the temperature detected by the heat storage temperature measuring member 220 is different from the temperatures of the flow cell 130, the laser 141, the scattered light detector 142, and the fluorescence detector 143. In order to further obtain more accurate temperatures in the flow cell 130, the laser 141, the scattered light detector 142 and the fluorescence detector 143, as shown in fig. 3, the inventor proposes that the sample analyzer 100 includes a laser temperature measuring member 170, a flow cell temperature measuring member 180, a scattered light detector temperature measuring member 400 and a fluorescence detector temperature measuring member 190.
The laser temperature measuring part 170 is disposed on the laser 141, electrically coupled to the controller 230, and configured to monitor the temperature of the laser 141; the flow chamber temperature measuring part 180 is disposed in the flow chamber 130, electrically coupled to the controller 230, and configured to monitor the temperature of the flow chamber 130; the fluorescence detector temperature measuring piece 190 is arranged on the fluorescence detector 143, electrically coupled with the controller 230, and used for monitoring the temperature of the fluorescence detector 143; the scattered light detector temperature measuring element 400 is disposed on the scattered light detector 142, and is electrically coupled to the controller 230 for monitoring the temperature of the scattered light detector 142.
In the above manner, the laser temperature measuring part 170 is used to monitor the nearby temperature of the laser 141, so as to reflect the temperature of the laser 141 more truly; the near temperature monitoring of the flow chamber 130 is realized by using the flow chamber temperature measuring member 180 to truly reflect the temperature of the flow chamber 130; the near temperature monitoring of the fluorescence detector 143 is realized by using the fluorescence detector temperature measuring piece 190 to truly reflect the temperature of the fluorescence detector 143; the scattered light detector temperature measuring piece 400 is used for realizing the nearby temperature monitoring of the scattered light detector 142 so as to reflect the temperature of the scattered light detector 142 more truly.
Further, as shown in fig. 3, at least two scattered light detectors 142 are configured as a forward scattered light detector 142b and a side scattered light detector 142a, respectively, and the optical measurement component 140 includes a dichroic mirror 144.
As shown, the scattered light includes forward scattered light and side scattered light. Wherein the optical axis of the forward scattered light is 0 to 10 degrees from the optical axis of the laser 141, and the forward scattered light reflects the volume size of the cell particles. The optical axis of the side scattered light, which reflects the complexity of the internal structure of the cell particle, is substantially perpendicular to the optical axis of the laser 141. The fluorescence includes lateral fluorescence, the optical axis of which is substantially perpendicular to the optical axis of the laser 141, and the lateral fluorescence reflects the content of DNA and RNA inside the cell particle.
The forward scattering light detector 142b is disposed on the optical path of the forward scattering light transmitted through the flow cell 130, and is configured to detect the forward scattering light and convert the forward scattering light into a corresponding electrical signal; dichroic mirror 144 is disposed on a side of flow cell 130 that is offset from the optical axis of laser 141, e.g., dichroic mirror 144 is disposed on a side of flow cell 130 and on an optical path substantially perpendicular to the optical axis of laser 141, for separating side-scattered light and side-fluorescent light. The fluorescence detector 143 is disposed on the light path of the lateral fluorescence split by the dichroic mirror 144, and is configured to detect the lateral fluorescence and convert the lateral fluorescence into a corresponding electrical signal; the side scattered light detector 142a is disposed on the optical path of the side scattered light split by the dichroic mirror 144, and is configured to detect the side scattered light and convert the side scattered light into a corresponding electrical signal.
Referring to fig. 6, 7 and 9, fig. 6 is a schematic view of an assembled structure of an optical measurement assembly of a fifth embodiment of the sample analyzer of the present application; FIG. 7 is a schematic view of an assembly structure of an optical signal collecting plate and a photosensitive unit of the sample analyzer of the present application; fig. 9 is a schematic view showing an assembled structure of an optical signal collecting plate, a mirror, and a mirror holder according to a fifth embodiment of the sample analyzer of the present application.
In the fifth embodiment, either one of the fluorescence detector 143 and the scattered light detector 142 includes the optical signal collection plate 310, the plurality of light sensing units 320, and the reflective mirror 330.
The optical signal collection plate 310 has a third side 311 and a fourth side 312 which are arranged opposite to each other in the thickness direction; the third side 311 of the optical signal acquisition plate 310 is arranged on the first side 211 of the heat storage plate assembly 210 in an overlapping manner; the plurality of photosensitive units 320 are respectively disposed on the fourth side 312 of the optical signal collecting plate 310 and distributed in an array; the reflective mirror 330 is disposed on a side of the optical signal collection plate 310 away from the heat accumulation plate assembly 210, and the reflective mirror 330 is disposed obliquely with respect to the fourth side 312 of the optical signal collection plate 310, and is used for reflecting light passing through the flow chamber 130 to the optical signal collection plate 310.
In this way, the optical signal collection plate 310 is attached to the first side surface 211 of the heat storage plate assembly 210, so that the optical signal collection plate 310 can directly conduct heat with the heat storage plate assembly 210, and a large heat conduction area is formed between the optical signal collection plate 310 and the heat storage plate assembly 210.
Optionally, the sample analyzer 100 includes a mirror holder 340, the mirror holder 340 is mounted on the first side 211 of the heat storage plate assembly 210 and extends from the side of the optical signal collection plate 310 to the top of the optical signal collection plate 310, and the mirror 330 is mounted on the mirror holder 340.
Specifically, the mirror holder 340 has a mirror mounting inclined surface 341 facing the optical signal collecting plate 310, and the mirror 330 is fitted to the mirror mounting inclined surface 341.
Referring to fig. 10, 11 and 7, fig. 10 is a schematic view of an assembled structure of an optical measuring unit according to a sixth embodiment of the sample analyzer of the present application; fig. 11 is a schematic view of an assembly structure of an optical signal collecting plate and a heat conducting base in a sixth embodiment of the sample analyzer of the present application.
In the sixth embodiment, the sample analyzer 100 includes a plurality of thermally conductive bases 350.
A plurality of thermally conductive bases 350 are mounted to first side 211 of heat mass assembly 210; scatter detectors 142 and fluorescence detectors 143 are correspondingly mounted to a plurality of thermally conductive bases 350.
Specifically, either one of the fluorescence detector and the scattered light detector includes an optical signal collection plate 310 and a plurality of photosensitive cells 320, the optical signal collection plate 310 having a third side 311 and a fourth side 312 that are oppositely disposed in a thickness direction; the third side 311 of the optical signal collecting board 310 is closely attached to the heat conducting base 350. The plurality of photosensitive units 320 are respectively disposed on the fourth side 312 of the optical signal collecting plate 310 and are distributed in an array.
In this way, the scattered light detector 142 and the fluorescence detector 143 are assembled by the corresponding heat-conducting bases 350, so that the scattered light detector 142 and the fluorescence detector 143 can be assembled on the heat storage plate assembly 210 more flexibly.
Specifically, heat conducting base 350 includes a horizontal plate 351 and a vertical plate 352, which are integrally disposed, horizontal plate 351 has a fifth side 3511 and a sixth side 3512 that are disposed opposite to each other in the thickness direction, vertical plate 352 has a seventh side 3521 and an eighth side 3522 that are disposed opposite to each other in the thickness direction, fifth side 3511 of horizontal plate 351 is disposed on first side 211 of heat accumulation plate assembly 210 in an overlapping manner, and vertical plate 352 extends toward a side of horizontal plate 351 that faces away from heat accumulation plate assembly 210; the third side 311 of the optical signal collecting plate 310 is disposed on the seventh side 3521 or the eighth side 3522 of the vertical plate 352. In an exemplary embodiment, the thermally conductive base 350 is disposed in an "L" shape.
Through the manner, reflection by a reflector is not required, the optical signal collection plate 310 can be directly located on the light path of the light emitted from the flow chamber 130, and the optical signal collection plate 310 sequentially passes through the fourth side 312 and the third side 311 on the heat conducting base 350 and further has a larger heat conduction area with the heat storage plate assembly 210, so that the heat conduction efficiency between the optical signal collection plate 310 and the heat storage plate assembly 210 is high.
Further, the sample analyzer includes a glue joint portion (not shown), and the glue joint portion is disposed between the third side surface of the optical signal collecting plate and the vertical plate, and is respectively glued to the third side surface of the optical signal collecting plate and the vertical plate.
Optionally, the adhesive joint may be silicone.
By the mode, the heat dissipation of the optical signal acquisition board can be enhanced by the aid of the glue joint part when the heating sheet does not work.
Further, referring to fig. 7-8, fig. 8 is a schematic view of the area near the single photosensitive unit in fig. 7. The optical signal acquisition board 310 is divided into a copper foil outer drain region C and a solder resist ink coverage region D, the copper foil outer drain region C is adjacent to the region of the optical signal acquisition board 310 where the photosensitive unit 320 is disposed, and the solder resist ink coverage region D is located on the side of the copper foil outer drain region C away from the photosensitive unit 320.
The copper foil outer drain region C is a region where solder resist ink is not set in the optical signal acquisition board 310 to cover the copper foil and the copper foil directly leaks out; the solder resist ink coverage area D is an area where the solder resist ink coverage copper foil is provided in the optical signal acquisition board 310 and the copper foil does not leak.
In this way, the copper foil leaking from the copper foil outer drain region C can enhance the heat dissipation of the photosensitive cell 320.
Further, any one of the laser temperature measuring part 170, the flow chamber temperature measuring part 180, the fluorescence detector temperature measuring part 190, and the thermal storage temperature measuring part 220 includes a thermistor 360 and a temperature detecting circuit (not shown), the temperature detecting circuit is electrically coupled to the thermistor and the controller 230; as shown in fig. 7 and 8, the thermistor of the fluorescence detector temperature measuring element 190 is integrated on the corresponding optical signal collecting plate 310 and is located beside the photosensitive unit 320.
As shown in fig. 3, the pack escape area B extends to the edge of the heat storage pack assembly 210, and the thermistor of the heat storage temperature measuring member 220 is located in the area of the pack escape area B near the edge of the heat storage pack assembly 210.
Through the above manner, the signal line of the thermistor of the heat storage temperature measurement piece 220 can be conveniently led out from the edge of the heat storage plate assembly 210, so that the arrangement and leading-out of the thermistor of the heat storage temperature measurement piece 220 can be facilitated, and the optical path layout of the optical measurement assembly 140 is not affected.
As shown in fig. 3, the first side 211 of the heat storage plate assembly 210 has a first direction L and a second direction W perpendicular to the thickness direction of the heat storage plate assembly 210 and to each other.
The fluorescent detectors 143 are distributed along a first direction L in the mounting area of the component mounting area a and the component avoiding area B, and the lasers 141 are distributed along a second direction W in the mounting area of the component mounting area a and the component avoiding area B; the mounting area of flow cell 130 at component mounting area a and the mounting area of fluorescence detector 143 at component mounting area a are distributed along second direction W, and the mounting area of flow cell 130 at component mounting area a and the mounting area of laser 141 at component mounting area a are distributed along first direction L.
Alternatively, the heat accumulation plate assembly 210 is a square assembly, and the assembly escape area B is located at a corner of the heat accumulation plate assembly 210. For example, the heat accumulation sheet assembly 210 has four corners, and at least one of the corners is provided with the assembly escape area B.
It will be appreciated that the corners are the areas where the edges of the heat mass assembly 210 abut the two edges.
The above embodiments are merely examples and are not intended to limit the scope of the present disclosure, and all modifications, equivalents, and flow charts using the contents of the specification and drawings are included in the scope of the present disclosure.
Claims (23)
1. A sample analyzer, comprising a sample reaction vessel, a sheath fluid vessel, a flow chamber, an optical measurement assembly, and a plurality of temperature control modules;
the flow chamber is respectively communicated with the reaction container and the sheath fluid container; the optical measurement assembly detects light passing through the flow cell; the plurality of temperature control modules are respectively arranged corresponding to the sample reaction container, the sheath liquid container and the optical measurement assembly so as to control the temperature of the sample reaction container, the temperature of the sheath liquid container and the temperature of the optical measurement assembly.
2. The sample analyzer of claim 1, wherein the plurality of temperature control modules comprise a reaction temperature control module, a sheath fluid temperature control module, and an optical measurement component temperature control module, the reaction temperature control module is disposed corresponding to the sample reaction container, the sheath fluid temperature control module is disposed corresponding to the sheath fluid container, and the optical measurement component temperature control module is disposed corresponding to the optical measurement component.
3. The sample analyzer of claim 2, wherein the optical measurement assembly includes a laser, a scattered light detector, and a fluorescence detector, and the optical measurement assembly temperature control module includes a laser temperature control module, a scattered light detector temperature control module, and a fluorescence detector temperature control module;
the laser temperature control module is arranged corresponding to the laser and used for controlling the temperature of the laser; the scattered light detector temperature control module is arranged corresponding to the scattered light detector and is used for controlling the temperature of the scattered light detector; the fluorescence detector temperature control module is arranged corresponding to the fluorescence detector and used for controlling the temperature of the fluorescence detector.
4. The sample analyzer of claim 3 wherein the plurality of temperature control modules comprises a flow cell temperature control module disposed in correspondence with the flow cell for controlling the temperature of the flow cell.
5. The sample analyzer of claim 4, wherein the laser temperature control module, the scattered light detector temperature control module, the fluorescence detector temperature control module, and the flow cell temperature control module are integrated into a common temperature control device, and the flow cell, the laser, the scattered light detector, and the fluorescence detector are respectively correspondingly mounted to the common temperature control device.
6. The sample analyzer of claim 5, wherein the common temperature control device is a one-way temperature control device.
7. The sample analyzer of claim 6 wherein the common temperature control device comprises:
the flow chamber, the laser, the scattered light detector and the fluorescence detector are respectively and correspondingly assembled on the heat storage sheet assembly, and the heat storage sheet assembly is used for heating the flow chamber, the laser, the scattered light detector and the fluorescence detector;
the heat accumulation temperature measurement piece is assembled on the heat accumulation piece assembly and used for detecting the temperature of the heat accumulation piece assembly;
and the controller is electrically coupled with the heat accumulation plate assembly and the heat accumulation temperature measuring piece respectively and is used for controlling the heat accumulation plate assembly to be heated to a target temperature control range.
8. The sample analyzer of claim 7,
the heat storage plate component comprises a first side surface and a second side surface which are arranged in an opposite mode, the first side surface is provided with a component assembly area and a component avoiding area, the component assembly area is adjacent to the component avoiding area, the component assembly area is used for assembling the laser, the flow chamber, the scattered light detector and the fluorescence detector, and the optical measurement component is not assembled in the component avoiding area;
the laser, the flow chamber, the scattered light detector and the fluorescence detector are arranged in the assembly area, and the heat storage temperature measurement piece is arranged in the assembly avoiding area.
9. The sample analyzer of claim 8, wherein the thermal storage sheet assembly comprises:
the first side surface and the second side surface are two side surfaces which are arranged on the back of the heating sheet;
wherein the controller is electrically coupled to the heating plate.
10. The sample analyzer of claim 8, wherein the thermal storage sheet assembly comprises:
the controller is electrically coupled with the heating plate;
and the heat conduction bottom plate is arranged on the heating sheet in an overlapped mode, the first side face is a side face of the heat conduction bottom plate deviating from the heating sheet, and the second side face is a side face of the heating sheet deviating from the heat conduction bottom plate.
11. The sample analyzer of claim 8, wherein the sample analyzer comprises a cover body covering the first side of the heat storage plate assembly to form a thermal chamber with the heat storage plate assembly, and the flow chamber, the laser, the scattered light detector, the fluorescence detector, and the thermal thermometry element are located in the thermal chamber.
12. The sample analyzer of claim 7, wherein the sample analyzer comprises:
the laser temperature measuring part is arranged on the laser, electrically coupled with the controller and used for monitoring the temperature of the laser;
the flow chamber temperature measuring part is arranged in the flow chamber, is electrically coupled with the controller and is used for monitoring the temperature of the flow chamber;
the scattered light detector temperature measuring part is arranged on the scattered light detector, is electrically coupled with the controller and is used for monitoring the temperature of the scattered light detector;
and the fluorescence detector temperature measuring part is arranged on the fluorescence detector, is electrically coupled with the controller and is used for monitoring the temperature of the fluorescence detector.
13. The sample analyzer of claim 8, wherein the sample analyzer includes an insulating layer covering the second side of the thermal storage sheet assembly.
14. The sample analyzer of claim 13 wherein either of the fluorescence detector and the scattered light detector comprises:
the optical signal acquisition board is provided with a third side surface and a fourth side surface which are arranged in a thickness direction in an opposite way; the third side surface of the optical signal acquisition plate is arranged on the first side surface of the heat storage plate assembly in an overlapped mode;
the photosensitive units are respectively arranged on the fourth side surface of the optical signal acquisition board and distributed in an array;
and the reflector is arranged on one side, away from the heat storage sheet assembly, of the optical signal acquisition plate, is obliquely arranged relative to the fourth side face of the optical signal acquisition plate, and is used for reflecting light rays passing through the flow chamber to the optical signal acquisition plate.
15. The sample analyzer of claim 8, wherein the sample analyzer comprises:
a plurality of thermally conductive bases mounted to a first side of the thermal storage sheet assembly;
the scattered light detector and the fluorescence detector are correspondingly assembled on the plurality of heat conducting bases.
16. The sample analyzer of claim 3 wherein the scatter detectors include photodiodes and/or avalanche photodiodes and the fluorescence detectors include avalanche photodiodes, photomultiplier tubes, and/or single photon avalanche diode arrays.
17. The sample analyzer of claim 15 wherein either of the fluorescence detector and the scattered light detector comprises:
the optical signal acquisition board is provided with a third side surface and a fourth side surface which are arranged in a thickness direction in an opposite way; the third side surface of the optical signal acquisition board is tightly attached to the heat conduction base;
and the photosensitive units are respectively arranged on the fourth side surface of the optical signal acquisition board and are distributed in an array.
18. The sample analyzer of claim 17,
the heat conducting base comprises a transverse plate and a vertical plate which are integrally arranged, the transverse plate is provided with a fifth side surface and a sixth side surface which are oppositely arranged along the thickness direction, the vertical plate is provided with a seventh side surface and an eighth side surface which are oppositely arranged along the thickness direction, the fifth side surface of the transverse plate is arranged on the first side surface of the heat storage plate assembly in an overlapped mode, and the vertical plate extends towards one side, away from the heat storage plate assembly, of the transverse plate;
the third side surface of the optical signal acquisition plate is arranged on the seventh side surface or the eighth side surface of the vertical plate in an overlapped mode.
19. The sample analyzer of claim 18, wherein the sample analyzer comprises a glue joint portion, and the glue joint portion is disposed between the third side surface of the optical signal collecting plate and the vertical plate and is respectively glued to the third side surface of the optical signal collecting plate and the vertical plate.
20. The sample analyzer as claimed in claim 14 or 17, wherein the optical signal collecting plate is divided into a copper foil drain region adjacent to an area of the optical signal collecting plate where the light sensing unit is disposed and a solder resist ink covering region at a side of the copper foil drain region remote from the light sensing unit.
21. The sample analyzer of claim 14 or 17, wherein any one of the laser thermometry, the flow cell thermometry, the fluorescence detector thermometry, and the thermal storage thermometry comprises a thermistor and a temperature detection circuit electrically coupled to the thermistor; and the thermistor of the temperature measuring part of the fluorescent detector is integrated on the corresponding optical signal acquisition board and is positioned beside the photosensitive unit.
22. The sample analyzer of claim 21, wherein the block-averted region extends to an edge of the thermal storage block assembly, and the thermistor of the thermal storage thermometry block is located in a region of the block-averted region near the edge of the thermal storage block assembly.
23. The sample analyzer of claim 22,
the first side face of the heat storage plate assembly is provided with a first direction and a second direction which are perpendicular to the thickness direction of the heat storage plate assembly and are perpendicular to each other;
the fluorescent detectors are distributed in a first direction in the installation area of the component assembly area and the component avoiding area, and the lasers are distributed in a second direction in the installation area of the component assembly area and the component avoiding area;
the flow chamber is distributed along a second direction at the installation area of the component assembly area and the fluorescence detector, and the flow chamber is distributed along a first direction at the installation area of the component assembly area and the laser.
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| CN202210520432.XA CN114624167B (en) | 2022-05-13 | 2022-05-13 | Sample analyzer |
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