CN114509462A - Scanning electron microscope shielding sample holder and system for radioactive test sample - Google Patents
Scanning electron microscope shielding sample holder and system for radioactive test sample Download PDFInfo
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- CN114509462A CN114509462A CN202210151372.9A CN202210151372A CN114509462A CN 114509462 A CN114509462 A CN 114509462A CN 202210151372 A CN202210151372 A CN 202210151372A CN 114509462 A CN114509462 A CN 114509462A
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- 230000002285 radioactive effect Effects 0.000 title claims abstract description 44
- 238000012360 testing method Methods 0.000 title claims abstract description 10
- 239000000463 material Substances 0.000 claims abstract description 16
- 230000009471 action Effects 0.000 claims abstract description 4
- 239000003638 chemical reducing agent Substances 0.000 claims description 39
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 4
- 229910052721 tungsten Inorganic materials 0.000 claims description 4
- 239000010937 tungsten Substances 0.000 claims description 4
- 229910001220 stainless steel Inorganic materials 0.000 claims description 3
- 239000010935 stainless steel Substances 0.000 claims description 3
- 238000000034 method Methods 0.000 description 13
- 230000008569 process Effects 0.000 description 11
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- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2204—Specimen supports therefor; Sample conveying means therefore
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
- G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
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- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21F—PROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULAR RADIATION OR PARTICLE BOMBARDMENT; TREATING RADIOACTIVELY CONTAMINATED MATERIAL; DECONTAMINATION ARRANGEMENTS THEREFOR
- G21F3/00—Shielding characterised by its physical form, e.g. granules, or shape of the material
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E30/00—Energy generation of nuclear origin
- Y02E30/30—Nuclear fission reactors
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- Sampling And Sample Adjustment (AREA)
Abstract
The invention discloses a scanning electron microscope shielding sample holder and a system for a radioactive test sample, wherein the scanning electron microscope shielding sample holder for the radioactive test sample comprises a bottom clamping plate, a shielding outer cylinder, a shielding inner cylinder and a sample table; one end of the shielding outer cylinder is connected with the upper end face of the bottom clamping plate, the shielding inner cylinder is arranged on the inner side of the shielding outer cylinder, and one end of the shielding inner cylinder is detachably connected with the upper end face of the bottom clamping plate; the sample table is arranged on the inner side of the shielding inner cylinder, the outer wall of the sample table is in contact with the inner wall of the shielding inner cylinder, and the sample table is lifted under the action of external force; the bottom clamping plate, the shielding outer cylinder, the shielding inner cylinder and the sample platform are all made of shielding materials. The shielding sample holder for the scanning electron microscope not only can shield the radioactive sample from the source when the radioactive sample is subjected to scanning electron microscope operation, but also can be suitable for samples with different sizes.
Description
Technical Field
The invention relates to the technical field of nuclear fuel circulation and irradiation, in particular to a scanning electron microscope shielding sample seat and a system of a radioactive test sample.
Background
Nuclear energy is one of the main methods for dealing with global energy shortage and environmental pollution as a sustainable energy source with high energy density, cleanness, low carbon and high energy efficiency, and the large-scale application of nuclear energy cannot leave the research and development of nuclear structure and functional materials. The scanning electron microscope (scanning electron microscope for short) is used as a large-scale precision analysis instrument for the most conventional microscopic characterization and analysis of materials, and plays an important role in the research and development process of nuclear structures and functional materials.
The irradiated nuclear material generally has radioactivity, and a strong radioactive sample can not only cause radioactive damage to experimenters and experimental environments in the microscopic analysis and characterization process of a scanning electron microscope, but also can cause irradiation damage to the scanning electron microscope equipment and even interfere with signal collection and processing of detector components and parts, and further has influence on the normal operation of experiments and the authenticity and reliability of data acquisition.
Therefore, it is necessary to design a radioactive shield as necessary from the source, i.e., the radioactive specimen itself.
Disclosure of Invention
The invention aims to provide a scanning electron microscope shielding sample holder and a scanning electron microscope shielding sample system for radioactive samples, which can shield the radioactive samples from the source when the radioactive samples are subjected to scanning electron microscope operation and can be suitable for samples with different sizes.
The invention is realized by the following technical scheme:
a shielding sample holder for a scanning electron microscope of a radioactive sample comprises a bottom clamping plate, a shielding outer cylinder, a shielding inner cylinder and a sample table;
one end of the shielding outer cylinder is connected with the upper end face of the bottom clamping plate, the shielding inner cylinder is arranged on the inner side of the shielding outer cylinder, and one end of the shielding inner cylinder is detachably connected with the upper end face of the bottom clamping plate;
the sample table is arranged on the inner side of the shielding inner cylinder, the outer wall of the sample table is in contact with the inner wall of the shielding inner cylinder, and the sample table is lifted under the action of external force;
the bottom clamping plate, the shielding outer barrel, the shielding inner barrel and the sample platform are all made of shielding materials.
The shielding material of the invention adopts stainless steel or tungsten-based material with good shielding capability to rays.
The bottom clamping plate has the main function of stably supporting the sample seat, a containing cavity for containing radioactive samples is formed between the sample table and the shielding inner cylinder, and the size of the containing cavity can be adjusted by lifting the sample table, so that the bottom clamping plate can be used for samples with different sizes.
The sample holder adopts a double-layer nested structure, the shielding inner cylinder and the bottom clamping plate are detachably connected, and according to the dose of the radioactive sample, the shielding material of the shielding inner cylinder is reasonably selected and the thickness of the shielding inner cylinder is reasonably designed, so that the shielding capacity of the non-testing surface of the sample is not lower than 5mm equivalent lead shielding equivalent.
The upper end face of the invention refers to the side of the corresponding part which faces upwards when in use.
Therefore, the shielding sample holder for the scanning electron microscope not only can shield the radioactive sample from the source when the radioactive sample is subjected to scanning electron microscope operation, but also can be suitable for samples with different sizes.
Furthermore, the inner wall of the shielding inner cylinder is provided with an internal thread, the outer wall of the sample platform is provided with an external thread matched with the internal thread, namely, the shielding inner cylinder is in threaded connection with the sample platform, and the sample platform is rotated in the internal thread of the shielding inner cylinder through the sample platform to realize the lifting of the sample platform.
Further, the lower terminal surface of sample platform is provided with the diaphragm that is used for being connected with the lift adjustment frock, the diaphragm can form detachable buckle structure with the lift adjustment frock.
Furthermore, one end of the shielding inner cylinder is connected with the upper end face of the bottom clamping plate through a bolt.
Furthermore, the inner wall of the shielding outer barrel is provided with a first inner supporting step, the outer wall of the shielding inner barrel is provided with a first outer step matched with the first inner supporting step, the inner wall of the shielding inner barrel is provided with a second inner supporting step, and when the sample platform descends to the bottommost end, the sample platform is supported by the second inner supporting step.
The convenience of installation operation of the shielding inner barrel and the structural stability of the whole sample seat can be improved by the arrangement.
Furthermore, the shielding inner cylinder is made of tungsten-based materials, and the bottom clamping plate, the shielding outer cylinder and the sample platform are made of stainless steel.
The utility model provides a scanning electron microscope shielding system of radioactive sample, includes scanning electron microscope shielding sample seat, still includes the lift adjustment frock, the lift adjustment frock has the lift end, and the lift end is connected with the lower terminal surface of sample platform is detachable during the use.
Further, the lifting adjusting tool comprises a clamp bottom plate, a speed reducer and a pressing block;
the fixture base plate is connected with the speed reducer base plate through a first upright post, the speed reducer is installed on the speed reducer base plate, the fixture base plate is used for supporting the scanning electron microscope shielding sample base, and when the fixture base plate is used, the worm output end of the speed reducer is detachably connected with the lower end face of the sample table;
the two clamping blocks are symmetrically arranged on the upper end face of the clamp base plate and used for clamping the scanning electron microscope shielding sample holder.
The speed reducer adopts a worm gear speed reducer, can reduce the rising and falling speed of the shielding sample seat, not only can accurately regulate and control the height of the sample platform, but also can reduce the operation errors caused by the inconvenient operation of a manipulator.
Be provided with the knob on the speed reducer, can realize controlling the lift of sample platform through operating knob, during the use, generally arrange lift adjustment frock and sample seat in the hot chamber, adopt the manipulator to realize the lofting operation.
Further, a spring is arranged on the output end of the worm, and spring gaskets are arranged at two ends of the spring on the output end of the worm.
Furthermore, a mounting bottom plate is arranged below the speed reducer bottom plate, the speed reducer bottom plate and the mounting bottom plate are connected through a second upright post, and a scale indicating scale is arranged between the speed reducer bottom plate and the mounting bottom plate.
Compared with the prior art, the invention has the following advantages and beneficial effects:
1. the shielding sample holder for the scanning electron microscope not only can shield the radioactive sample from the source when the radioactive sample is subjected to scanning electron microscope operation, but also can be suitable for samples with different sizes.
2. The shielding sample holder for the scanning electron microscope has the advantages of simple structure and flexible operation.
3. The invention can shield the radioactive sample from the source, thereby reducing the radiation dose level born by the equipment and the components, prolonging the service life of the components, optimizing the information acquisition efficiency of the equipment, protecting the testing personnel and the testing environment and the like, and providing technical support and safety guarantee for the research and development of nuclear structures and functional materials.
4. According to the invention, through the coordination of the scanning electron microscope shielding sample seat and the lifting adjusting tool, the requirements of sample loading and taking and sample stage moving are considered on the basis of effectively reducing the radioactivity of the non-observation surface of the radioactive sample to be detected, and the microscopic analysis capability of the scanning electron microscope on the high-radioactivity sample is effectively improved.
Drawings
The accompanying drawings, which are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the principles of the invention. In the drawings:
FIG. 1 is an overall structure diagram of a shielding sample holder for a scanning electron microscope according to the present invention;
FIG. 2 is a cross-sectional view of a shielding sample holder for a scanning electron microscope according to the present invention;
FIG. 3 is a front view of the lift adjustment tool of the present invention;
fig. 4 is a perspective view of the lifting adjusting tool of the invention.
Reference numbers and corresponding part names in the drawings:
1-bottom clamping plate; 2-shielding outer cylinder; 3-shielding the inner cylinder; 4-a bolt; 5-a sample stage; 6-a transverse plate; 7-shielding the sample holder by a scanning electron microscope; 8-pressing a clamping block; 9-a clamp base plate; 10-a first upright; 11-a spring; 12-a spring washer; 13-a speed reducer; 14-a reducer bottom plate; 15-a second upright; 16-scale indication scale; 17-mounting a bottom plate; 18-lower limit piece of lifting rod; 19-mounting screws.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail below with reference to examples and accompanying drawings, and the exemplary embodiments and descriptions thereof are only used for explaining the present invention and are not meant to limit the present invention.
Example 1:
as shown in fig. 1-4, a shielding sample holder for a scanning electron microscope of a radioactive sample comprises a bottom clamping plate 1, a shielding outer cylinder 2, a shielding inner cylinder 3 and a sample stage 5;
one end of the shielding outer cylinder 2 is connected with the upper end face of the bottom clamping plate 1, the shielding inner cylinder 3 is arranged on the inner side of the shielding outer cylinder 2, and one end of the shielding inner cylinder 3 is detachably connected with the upper end face of the bottom clamping plate 1;
the sample table 5 is arranged on the inner side of the shielding inner cylinder 3, the outer wall of the sample table 5 is in contact with the inner wall of the shielding inner cylinder 3, and the sample table 5 is lifted under the action of external force;
the bottom clamping plate 1, the shielding outer barrel 2, the shielding inner barrel 3 and the sample platform 5 are all made of shielding materials.
In this embodiment, the material of the bottom clamping plate 1 is 06Cr19Ni10, which mainly plays a role in stably supporting the sample holder; the material of the sample table 5 is 06Cr19Ni10 material, the main structure of the sample table is a disc with a certain thickness, the bottom of the sample table is provided with a transverse plate 6, and the transverse plate 6 is connected with a lifting adjusting tool so as to conveniently adjust the height of the sample table 5 in the sample seat.
In the present embodiment, the material of the main body of the shield outer cylinder 2 is 06Cr19Ni 10; its material of shielding inner tube 3 mainly selects the tungsten-based material that has good shielding effect to gamma ray, the inner wall of shielding inner tube 3 is provided with the internal thread, the outer wall of sample platform 5 be provided with internal thread matched with external screw thread, adopt threaded connection between shielding inner tube 3 and the sample platform 5 promptly, rotate the lift that realizes sample platform 5 through the screw thread, have convenient operation and stable advantage.
Example 2:
as shown in fig. 1 to 2, the present embodiment is based on embodiment 1;
in this embodiment, in order to facilitate the installation of the sample holder 7 for the scanning electron microscope and improve the structural stability, the inner wall of the shielding outer cylinder 2 is provided with a first inner supporting step, the outer wall of the shielding inner cylinder 3 is provided with a first outer step matched with the first inner supporting step, the inner wall of the shielding inner cylinder 3 is provided with a second inner supporting step, and when the sample stage 5 is lowered to the bottommost end, the sample stage 5 is supported by the second inner supporting step.
Example 3:
in the experimental process, the size of the radioactive sample to be measured generally has the characteristic of irregularity, so that the analysis precision of the scanning electron microscope is not influenced, and the shielding sample holder 7 of the scanning electron microscope has the function of flexibly lifting the sample stage 5. According to the structural characteristics of the shielding sample holder 7 of the scanning electron microscope in embodiment 1 or embodiment 2, the lifting of the sample stage 5 can be realized by rotating the horizontal plate 6 at the lower part of the sample stage 5. Because the operation of the mechanical arm in the hot chamber is difficult, it is necessary to design a lifting adjusting tool of the scanning electron microscope shielding sample holder 7, which is convenient for the operation of the mechanical arm.
As shown in fig. 1 to 4, a scanning electron microscope shielding system for a radioactive sample includes the scanning electron microscope shielding sample holder 7 according to embodiment 1 or embodiment 2, and further includes a lifting adjusting tool, where the lifting adjusting tool has a lifting end, and the lifting end is detachably connected to a lower end surface of the sample stage 5 during use.
In this embodiment, the lifting adjusting tool comprises a clamp bottom plate 9, a speed reducer bottom plate 14, a speed reducer 13 and a clamping block 8;
the clamp bottom plate 9 and the speed reducer bottom plate 14 are connected through a first upright post 10, the speed reducer 13 is installed on the speed reducer bottom plate 14, the clamp bottom plate 9 is used for supporting the scanning electron microscope shielding sample base 7, and when the clamp bottom plate is used, the worm output end of the speed reducer 13 is detachably connected with the lower end face of the sample table 5;
the two clamping blocks 8 are symmetrically arranged on the upper end face of the clamp bottom plate 9 and used for clamping the scanning electron microscope shielding sample holder 7, and preferably, the clamping blocks 8 are arranged on the clamp bottom plate 9 in a sliding mode.
In this embodiment, the speed reducer 13 is a worm gear speed reducer, the worm output end is provided with a spring 11, the worm output end is provided with spring washers 12 at both ends of the spring 11, and the speed of the sample to be measured during ascending or descending can be controlled by the speed reducer 13 and the spring 11.
When a scanning electron microscope is needed to analyze a strong radioactive sample, the operation procedures to be performed on the radioactive sample to be detected and the scanning electron microscope shielding sample holder 7 mainly comprise a sample loading process, an analysis process, a sampling process and the like, and the specific operation of each step is as follows:
1) in the sample loading process, firstly, the scanning electron microscope shielding sample seat 7 is vertically placed on a specific experiment operation table surface, and the scanning electron microscope shielding sample seat 7 is assembled on a lifting adjusting tool by utilizing a manipulator; the knob of a speed reducer 13 on the lifting adjusting tool enables the top surface (upper end surface) of the sample platform 5 to be lifted to the level of the highest horizontal plane of the outer edge of the shielding outer cylinder 2; fixing a radioactive sample to be detected on a sample table 5 by using a manipulator; rotating a knob of the speed reducer 13 to reduce the height of the sample table 5, so that the level of the surface to be measured of the radioactive sample to be measured and the highest horizontal plane of the outer edge of the shielding outer cylinder 2 is positioned; the scanning electron microscope shielding sample seat 7 is taken down from the lifting adjusting tool by using a manipulator and is vertically placed on the specific experiment operation table board, and the sample loading process is finished;
2) in the analysis process, the sample bin of the scanning electron microscope is opened, and the shielding sample seat 7 of the scanning electron microscope is fixed on a sample table of the scanning electron microscope; closing the sample bin door of the scanning electron microscope, and reasonably adjusting the position of the shielding sample seat 7 of the scanning electron microscope by utilizing the displacement function of the scanning electron microscope;
3) in the sampling process, after the sample is analyzed, the scanning electron microscope sample bin is opened by utilizing the conventional operation of a scanning electron microscope, the scanning electron microscope shielding sample seat 7 is taken out from the scanning electron microscope sample bin and placed on a specific experiment table, and the door of the scanning electron microscope sample bin is closed; assembling a shielding sample seat 7 of a scanning electron microscope on a lifting adjusting tool, rotating a knob of a speed reducer 13 by using a manipulator to enable a sample table 5 to be lifted to the highest position, taking down a measured radioactive sample from the sample table 5 by using the manipulator, and placing the radioactive sample in a specially-made lead can; utilize the manipulator to rotate the knob of speed reducer 13 once more and make sample platform 5 reduce to scanning electron microscope shielding sample seat 7 minimum, take off scanning electron microscope shielding sample seat 7 from lift adjustment tool, place respectively in specific region, the sampling process is accomplished.
The coordination of scanning electron microscope shielding sample seat 7 and lift adjustment frock is passed through to this embodiment, can be effectual on the basis that reduces the radioactivity of the non-observation face of the radioactive sample that awaits measuring, compromise the sample dress and get, the needs that the sample platform removed, effectively improve the microscopic analysis ability of scanning electron microscope to high radioactivity sample. In addition, combine scanning electron microscope equipment structural feature itself, rationally set up scanning electron microscope shielding sample holder 7's specification and dimension, its particular requirement is: 1) the loading of a sample with the maximum diameter of 40mm and the maximum height of 30mm can be met; 2) the applicable size (diameter and height) of the sample can be adjusted by rotation and the sample is fixed; 3) the overall height after the sample is loaded is not more than 45 mm; 4) the shielding capability of the non-test surface of the sample is not lower than 5mm equivalent lead shielding equivalent.
Example 4:
as shown in fig. 1 to 4, in this embodiment, based on embodiment 3, an installation bottom plate 17 is disposed below the speed reducer bottom plate 14, the speed reducer bottom plate 14 and the installation bottom plate 17 are connected through a second upright post 15, a scale indication scale 16 is disposed between the speed reducer bottom plate 14 and the installation bottom plate 17, the installation bottom plate 17 can be connected with external equipment or the ground through an installation screw 19, and an upper end face of the installation bottom plate 17 is provided with a lower limit piece 18 of a lifting rod; the worm output end of the speed reducer 13 moves up and down in the transmission process, and the lower limit piece 18 of the lifting rod is used for limiting the downward transmission of the worm output end.
The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are merely exemplary embodiments of the present invention, and are not intended to limit the scope of the present invention, and any modifications, equivalent substitutions, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
It should be noted that the structures, ratios, sizes, and the like shown in the drawings attached to the present specification are only used for matching the disclosure of the present specification, so as to be understood and read by those skilled in the art, and are not used to limit the conditions of the present invention, so that the present invention has no technical essence, and any structural modification, ratio relationship change, or size adjustment should still fall within the scope of the present invention without affecting the function and the achievable purpose of the present invention. In addition, the terms such as "upper", "lower", "left", "right" and "middle" used in the present specification are for clarity of description, and are not intended to limit the scope of the present invention, and changes or modifications of the relative relationship may be made without substantial technical changes.
Claims (10)
1. A scanning electron microscope shielding sample holder for radioactive samples is characterized by comprising a bottom clamping plate (1), a shielding outer cylinder (2), a shielding inner cylinder (3) and a sample table (5);
one end of the shielding outer cylinder (2) is connected with the upper end face of the bottom clamping plate (1), the shielding inner cylinder (3) is arranged on the inner side of the shielding outer cylinder (2), and one end of the shielding inner cylinder (3) is detachably connected with the upper end face of the bottom clamping plate (1);
the sample table (5) is arranged on the inner side of the shielding inner cylinder (3), the outer wall of the sample table (5) is in contact with the inner wall of the shielding inner cylinder (3), and the sample table (5) is lifted under the action of external force;
the bottom clamping plate (1), the shielding outer cylinder (2), the shielding inner cylinder (3) and the sample table (5) are all made of shielding materials.
2. A shielding sample holder for a scanning electron microscope of radioactive samples according to claim 1, characterized in that the inner wall of the shielding inner cylinder (3) is provided with an internal thread, and the outer wall of the sample stage (5) is provided with an external thread matching with the internal thread.
3. The scanning electron microscope shielding sample holder for radioactive samples according to claim 1, characterized in that a horizontal plate (6) for connecting with a lifting adjusting tool is arranged on the lower end surface of the sample stage (5).
4. The shielding sample holder for the scanning electron microscope of the radioactive test sample according to claim 1, wherein one end of the shielding inner cylinder (3) is connected with the upper end surface of the bottom clamping plate (1) by a bolt.
5. A shielded holder for a scanning electron microscope for radioactive samples according to claim 1, wherein the inner wall of the shielding outer cylinder (2) is provided with a first inner supporting step, the outer wall of the shielding inner cylinder (3) is provided with a first outer step matching with the first inner supporting step, the inner wall of the shielding inner cylinder (3) is provided with a second inner supporting step, and when the sample stage (5) descends to the lowest end, the sample stage (5) is supported by the second inner supporting step.
6. A shielding sample holder for a scanning electron microscope for radioactive samples according to any one of claims 1 to 5, characterized in that the shielding inner cylinder (3) is made of tungsten-based material, and the bottom clamping plate (1), the shielding outer cylinder (2) and the sample stage (5) are made of stainless steel.
7. A scanning electron microscope shielding system for radioactive samples, which is characterized by comprising the scanning electron microscope shielding sample holder (7) according to any one of claims 1 to 6 and further comprising a lifting adjusting tool, wherein the lifting adjusting tool is provided with a lifting end, and the lifting end is detachably connected with the lower end face of the sample stage (5) in use.
8. The scanning electron microscope shielding system for radioactive samples according to claim 7, wherein the lifting adjusting tool comprises a clamp bottom plate (9), a speed reducer bottom plate (14), a speed reducer (13) and a clamping block (8);
the fixture base plate (9) is connected with the speed reducer base plate (14) through a first upright post (10), the speed reducer (13) is installed on the speed reducer base plate (14), the fixture base plate (9) is used for supporting the scanning electron microscope shielding sample base (7), and when the fixture base plate is used, the worm output end of the speed reducer (13) is detachably connected with the lower end face of the sample table (5);
the two pressing clamping blocks (8) are symmetrically arranged on the upper end face of the clamp base plate (9) and used for clamping the scanning electron microscope shielding sample holder (7).
9. Scanning electron microscope shielding system for radioactive specimens according to claim 8, characterized in that a spring (11) is provided on the worm output, and spring washers (12) are provided on the worm output at both ends of the spring (11).
10. Scanning electron microscope shielding system for radioactive samples according to claim 8, characterized in that a mounting base plate (17) is arranged below the speed reducer base plate (14), the speed reducer base plate (14) and the mounting base plate (17) are connected through a second upright (15), and a scale indicator (16) is arranged between the speed reducer base plate (14) and the mounting base plate (17).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210151372.9A CN114509462A (en) | 2022-02-18 | 2022-02-18 | Scanning electron microscope shielding sample holder and system for radioactive test sample |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210151372.9A CN114509462A (en) | 2022-02-18 | 2022-02-18 | Scanning electron microscope shielding sample holder and system for radioactive test sample |
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| Publication Number | Publication Date |
|---|---|
| CN114509462A true CN114509462A (en) | 2022-05-17 |
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| CN202210151372.9A Pending CN114509462A (en) | 2022-02-18 | 2022-02-18 | Scanning electron microscope shielding sample holder and system for radioactive test sample |
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