CN114518376A - Electronic probe shielding sample seat of radioactive sample - Google Patents
Electronic probe shielding sample seat of radioactive sample Download PDFInfo
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- CN114518376A CN114518376A CN202210150745.0A CN202210150745A CN114518376A CN 114518376 A CN114518376 A CN 114518376A CN 202210150745 A CN202210150745 A CN 202210150745A CN 114518376 A CN114518376 A CN 114518376A
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- 239000000523 sample Substances 0.000 title claims abstract description 308
- 230000002285 radioactive effect Effects 0.000 title claims abstract description 32
- 239000000463 material Substances 0.000 claims abstract description 15
- 238000006073 displacement reaction Methods 0.000 claims description 7
- 229910001220 stainless steel Inorganic materials 0.000 claims description 4
- 239000010935 stainless steel Substances 0.000 claims description 4
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 4
- 229910052721 tungsten Inorganic materials 0.000 claims description 4
- 239000010937 tungsten Substances 0.000 claims description 4
- 230000000149 penetrating effect Effects 0.000 claims 1
- 238000012360 testing method Methods 0.000 abstract description 7
- 230000005855 radiation Effects 0.000 abstract description 3
- 238000000034 method Methods 0.000 description 12
- 230000008569 process Effects 0.000 description 11
- 238000004458 analytical method Methods 0.000 description 8
- 230000004992 fission Effects 0.000 description 5
- 239000000446 fuel Substances 0.000 description 5
- 239000000306 component Substances 0.000 description 4
- 238000013461 design Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000005070 sampling Methods 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000003758 nuclear fuel Substances 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000008358 core component Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000003912 environmental pollution Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 230000005251 gamma ray Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000008204 material by function Substances 0.000 description 1
- 238000007431 microscopic evaluation Methods 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 238000004451 qualitative analysis Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2204—Specimen supports therefor; Sample conveying means therefore
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21F—PROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULAR RADIATION OR PARTICLE BOMBARDMENT; TREATING RADIOACTIVELY CONTAMINATED MATERIAL; DECONTAMINATION ARRANGEMENTS THEREFOR
- G21F1/00—Shielding characterised by the composition of the materials
- G21F1/02—Selection of uniform shielding materials
- G21F1/08—Metals; Alloys; Cermets, i.e. sintered mixtures of ceramics and metals
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- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21F—PROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULAR RADIATION OR PARTICLE BOMBARDMENT; TREATING RADIOACTIVELY CONTAMINATED MATERIAL; DECONTAMINATION ARRANGEMENTS THEREFOR
- G21F1/00—Shielding characterised by the composition of the materials
- G21F1/02—Selection of uniform shielding materials
- G21F1/08—Metals; Alloys; Cermets, i.e. sintered mixtures of ceramics and metals
- G21F1/085—Heavy metals or alloys
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21F—PROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULAR RADIATION OR PARTICLE BOMBARDMENT; TREATING RADIOACTIVELY CONTAMINATED MATERIAL; DECONTAMINATION ARRANGEMENTS THEREFOR
- G21F3/00—Shielding characterised by its physical form, e.g. granules, or shape of the material
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E30/00—Energy generation of nuclear origin
- Y02E30/30—Nuclear fission reactors
Abstract
The invention discloses an electronic probe shielding sample holder for radioactive samples, which comprises a sample table chassis, an adjustable sample clamp and a fixed sample clamp; the fixed sample clamp and the adjustable sample clamp are arranged on the sample platform chassis, the fixed sample clamp and the adjustable sample clamp are arranged oppositely, an accommodating cavity for accommodating a standard sample and a sample to be detected is formed between the fixed sample clamp and the adjustable sample clamp, and the distance between the fixed sample clamp and the adjustable sample clamp is adjustable; the sample platform chassis, the adjustable sample clamp and the fixed sample clamp are all made of shielding materials. The sample holder can shield the radioactive sample from the source under the condition of not influencing the normal test of the electronic probe, thereby reducing the radiation dose level born by equipment components, prolonging the service life of the components, optimizing the information acquisition efficiency of the equipment, protecting testers, test environment and the like.
Description
Technical Field
The invention relates to the technical field of nuclear fuel circulation and irradiation, in particular to an electronic probe shielding sample holder for a radioactive sample.
Background
Nuclear energy is one of the main methods for dealing with global energy shortage and environmental pollution as a high-energy-density, clean, low-carbon and sustainable energy. The fuel element is used as a core component of a nuclear reactor core, energy is released through element fission reaction, a large amount of fission nuclide is generated at the same time, and the obtained data of the type, content, distribution and the like of the fission nuclide of the irradiated fuel element are important for the irradiation effect and service performance of the fuel element.
The irradiated fuel element has a high radioactivity metering level, and when the conventional energy spectrometer is used for element analysis, required characteristic X rays are often covered in gamma radiation, so that the element analysis is greatly interfered, and equipment is damaged. The electron probe makes the characteristic X-ray and the gamma ray not in the same direction due to the action of the beam splitter prism of the spectrometer, provides a larger operation space for the corresponding shielding design, and gradually becomes the key equipment for analyzing the components of the irradiated nuclear fuel micro-area and the fission nuclide. However, when the electronic probe analyzes a sample to be tested at a high dose level, the strong radioactive sample still causes radioactive damage to the equipment itself, laboratory personnel and experimental environment, so that it is necessary to design the necessary radioactive shielding from the source, i.e. the radioactive sample itself.
Disclosure of Invention
The invention aims to provide an electronic probe shielding sample holder for radioactive samples, which can shield the radioactive samples from the source under the condition of not influencing the normal test of the electronic probes.
The invention is realized by the following technical scheme:
an electronic probe shielding sample holder for radioactive samples comprises a sample table chassis, an adjustable sample clamp and a fixed sample clamp;
the fixed sample clamp and the adjustable sample clamp are arranged on the sample platform chassis, the fixed sample clamp and the adjustable sample clamp are arranged oppositely, an accommodating cavity for accommodating a standard sample and a sample to be detected is formed between the fixed sample clamp and the adjustable sample clamp, and the distance between the fixed sample clamp and the adjustable sample clamp is adjustable;
the sample platform chassis, the adjustable sample clamp and the fixed sample clamp are all made of shielding materials.
The invention aims at the analysis requirements of the electronic probe on the types, contents, distribution and other data of the irradiated fuel element fission nuclide, combines the high radioactivity level of the analysis sample to be detected, and designs the electronic probe shielding sample seat according to the special sample platform design requirements and the sample introduction requirements of the electronic probe. The shielding sample holder not only needs to have radioactive shielding capability, but also needs to meet the operation of a manipulator and other auxiliary equipment in the glove box, establishes a rigid interface with the manipulator, and simultaneously needs to consider the state maintenance in the transportation process of the whole sample, thereby meeting the sample loading requirement of sealed loading and transporting. Finally, the standard sample placing position is designed on the shielding sample seat, so that the qualitative analysis of the micro-area components of the radioactive sample is facilitated.
The electronic probe shielding sample holder can realize loading, taking and stable clamping of a standard sample and a sample to be tested by adjusting the distance between the fixed sample clamp and the adjustable sample clamp, wherein the standard sample and the sample to be tested which are placed in the accommodating cavity are shielded by the sample platform chassis, the adjustable sample clamp and the fixed sample clamp, so that the radioactive sample is shielded from the source, the radioactivity of the non-observation surface of the radioactive sample to be tested is reduced under the condition of not influencing the normal use of the electronic probe, the radiation dose level born by equipment components is reduced, the service life of the components is prolonged, the information acquisition efficiency of the equipment is optimized, testing personnel and testing environment are protected, and the technical support and safety guarantee are provided for research and development of nuclear structures and functional materials.
Furthermore, the adjustable sample clamp is arranged on the sample platform base plate in a sliding mode, the fixed sample clamp is fixed on the sample platform base plate, namely the fixed sample clamp is fixed, and the distance between the fixed sample clamp and the adjustable sample clamp is adjusted by adjusting the adjustable sample clamp.
Furthermore, a fixing support is arranged on the sample platform base plate on one side close to the adjustable sample clamp, a lead screw penetrates through the fixing support, a lead screw nut is arranged on the lead screw, and one end of the lead screw is connected with the adjustable sample clamp.
The distance between the adjustable sample clamp and the fixed sample clamp can be adjusted through the screw rod.
Furthermore, the fixed support is fixed on the sample platform chassis through a first inner hexagonal socket head cap screw.
Furthermore, a graduated scale is arranged on the sample platform base plate, and the length direction of the graduated scale is the displacement direction of the adjustable sample clamp.
The graduated scale is used for displaying the displacement length of the adjustable sample clamp, and is convenient for realizing accurate adjustment.
Furthermore, the adjustable sample clamp is connected with the sample platform base plate through a spring ball, and clamping after the adjustable sample clamp is adjusted is achieved through the spring ball.
Further, adjustable sample anchor clamps include first L type fixed plate, the vertical section inner wall of first L type fixed plate is provided with inboard deflector, the horizontal segment tip of first L type fixed plate is provided with the outside deflector, fixed sample anchor clamps include second L type fixed plate, be provided with the inboard guide rail that cooperatees with the outside deflector in the vertical section of second L type fixed plate, the horizontal segment tip of second L type fixed plate is provided with the outside guide rail that cooperatees with the inboard guide rail.
The vertical section refers to the side in the same direction as the displacement direction of the adjustable sample clamp, the horizontal section specifically refers to the side perpendicular to the displacement direction of the adjustable sample clamp, the inner side is the side wall of the accommodating cavity, and the outer side is the side opposite to the inner side.
The outside deflector can slide in the inboard guide rail, the inboard deflector can slide in the outside guide rail, and the vertical section setting of first L type fixed plate is in the horizontal segment outside of second L type fixed plate promptly, the horizontal segment setting of first L type fixed plate is inboard in the vertical section of second L type fixed plate.
Further, the horizontal segment of first L type fixed plate with the horizontal segment of second L type fixed plate is protruding to the inboard respectively and is formed first boss and second boss, first boss and second boss staggered arrangement, form first chamber of holding between first boss and the second L type fixed plate, it holds the chamber to form the second between second boss and the first L type fixed plate, and first chamber and the second of holding is used for placing standard sample and the sample that awaits measuring.
The first boss has the effect of blockking to the standard sample or the sample that awaits measuring that place in the second holds the chamber, the second boss has the effect of blockking to the standard sample or the sample that awaits measuring that place in the first chamber that holds or the second holds the chamber, consequently, the standard sample and the sample that awaits measuring of placing in first chamber and the second and holding in the chamber can not contact for standard sample and the sample that awaits measuring can not produce the influence because of the contact when detecting.
Furthermore, the fixed sample clamp is fixed on the sample platform chassis through a second inner hexagonal socket head cap screw.
Further, the shielding material comprises stainless steel and tungsten-based materials, and the shielding capacity of the shielding material is not lower than 5mm lead shielding equivalent.
Compared with the prior art, the invention has the following advantages and beneficial effects:
1. the shielding sample seat provided by the invention meets the requirements of sample loading and taking and stable clamping of the sample, and can effectively improve the microscopic analysis capability of an electronic probe on a high-level sample.
2. The main material of the radioactive shielding sample holder is stainless steel or tungsten-based material, and 2 sample mounting positions are arranged, wherein one sample mounting position is used for placing a sample to be detected, and the other sample mounting position is used for placing a standard sample, so that the standard sample and the sample to be detected are not influenced by contact during detection.
3. The radioactive shielding sample holder adopts a structure that one end is fixed and the other end can be movably adjusted in size; the distance between the fixed sample clamp and the adjustable sample clamp is adjustable, and the sample clamp can be used for fixing samples with different sizes.
4. The invention is provided with the graduated scale, so that the regulation and control precision of the shielding sample seat can be improved.
5. The invention is provided with the spring ball which can be used for re-clamping after the position of the movable end of the shielding sample holder is adjusted.
Drawings
The accompanying drawings, which are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the principles of the invention. In the drawings:
FIG. 1 is a general structure diagram of a shielding sample holder of an electronic probe according to the present invention;
fig. 2 is a cross-sectional view of the present generator probe shielding sample holder.
Reference numbers and corresponding part names in the figures:
1-a lead screw; 2-a lead screw nut; 3-fixing a bracket; 4-a first socket head cap screw; 5-adjustable sample clamp; 6-spring ball; 7-fixing the sample clamp; 8-a second hexagon socket cap screw; 9-sample stage chassis; 10-a graduated scale; 11-standard sample; 12-a sample to be tested; 51-a first L-shaped fixation plate; 52-outboard guide plate; 53-inner guide plate; 71-second L-shaped fixing plate.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail below with reference to examples and accompanying drawings, and the exemplary embodiments and descriptions thereof are only used for explaining the present invention and are not meant to limit the present invention.
Example 1:
as shown in fig. 1-2, an electronic probe shielding sample holder for radioactive samples comprises a sample stage chassis 9, an adjustable sample clamp 5 and a fixed sample clamp 7;
The fixed sample clamp 7 and the adjustable sample clamp 5 are arranged on a sample platform chassis 9, the fixed sample clamp 7 and the adjustable sample clamp 5 are oppositely arranged, an accommodating cavity for accommodating a standard sample 11 and a sample 12 to be detected is formed between the fixed sample clamp 7 and the adjustable sample clamp 5, and the distance between the fixed sample clamp 7 and the adjustable sample clamp 5 is adjustable;
the sample platform chassis 9, the adjustable sample clamp 5 and the fixed sample clamp 7 are all made of shielding materials; the shielding material comprises stainless steel and a tungsten-based material, and the shielding capacity of the shielding material is not lower than 5mm lead shielding equivalent.
In this embodiment, the adjustable sample clamp 5 is slidably disposed on the platform base plate 9, and the fixed sample clamp 7 is fixed on the platform base plate 9.
Specifically, the adjustable sample fixture 5 comprises a first L-shaped fixing plate 51, an inner side guide plate 53 is arranged on the inner wall of the vertical section of the first L-shaped fixing plate 51, an outer side guide plate 52 is arranged at the end of the horizontal section of the first L-shaped fixing plate 51, the fixed sample fixture 7 comprises a second L-shaped fixing plate 71, an inner side guide rail matched with the outer side guide plate 52 is arranged in the vertical section of the second L-shaped fixing plate 71, and an outer side guide rail matched with the inner side guide plate 53 is arranged at the end of the horizontal section of the second L-shaped fixing plate 71; a fixed bracket 3 is arranged on one side of the sample platform chassis 9 close to the adjustable sample clamp 5; the fixed support 3 is fixed on a sample platform chassis 9 through a first inner hexagonal socket head cap screw 4, a screw rod 1 penetrates through the fixed support 3, a screw rod nut 2 is arranged on the screw rod 1, and one end of the screw rod 1 is connected with the outer side wall of a first L-shaped fixed plate 51 of an adjustable sample clamp 5; a first through hole is formed in the vertical section of the first L-shaped fixing plate 51, a plurality of second through holes matched with the first through holes are formed in the sample platform chassis 9, the adjustable sample clamp 5 is connected with the sample platform chassis 9 through a spring ball 6, and the spring ball 6 can be inserted into the first through hole and the second through hole; the second L-shaped fixing plate 71 is fixed on the sample stage chassis 9 by a second hexagon socket head cap screw 8.
Because the electronic probe shielding sample holder needs to load samples with different diameters, the embodiment adopts a structure that one end is fixed and the other end can be movably adjusted.
The electron probe shielding sample seat accessible of this embodiment is adjusted the interval between fixed sample anchor clamps 7 and the adjustable sample anchor clamps 5 and is realized getting, stabilizing the centre gripping standard sample 11 and the sample 12 that awaits measuring, wherein, the standard sample 11 and the sample 12 that awaits measuring of arranging in holding the chamber receive sample platform chassis 9, adjustable sample anchor clamps 5 and the shielding effect of fixed sample anchor clamps 7, have realized shielding radioactive sample from the source.
When an electronic probe is used for analyzing a strongly radioactive sample, the main operations of the sample 12 to be detected and the shielding sample holder include a sample loading process, an analysis process, a sampling process and the like, and the specific operation of each step is as follows:
1) in the sample loading process, firstly, the radioactive shielding sample seat is vertically placed on a specific experiment operation table surface, and the position of the shielding sample seat is properly adjusted until the shielding sample seat can be flexibly operated by a manipulator. Firstly, a screw rod 1 of a rotary shielding sample seat is used for adjusting the position of an adjustable sample clamp 5 to the farthest distance away from the sample loading direction; and then sequentially placing the embedded standard sample 11 and the sample 12 to be tested into the accommodating cavity. And finally, rotating the screw rod 1 to enable the adjustable sample clamp 5 to stably clamp the standard sample 11 and the sample 12 to be tested, and finishing the sample loading process.
2) In the analysis process, after the sample is loaded, the sample seat of the electronic probe is adjusted to the lowest position by utilizing the height displacement function of the electronic probe, then the electronic probe bin door is opened, the whole shielding sample seat is fixed on the electronic probe sample seat by utilizing the mechanical arm, and the electronic probe bin door is closed. The height limit value of the lowest observation surface at the topmost end of the view shielding sample seat is used for adjusting the height of the sample platform to the most appropriate test position, and the position of the probe and the sample seat is noticed at all times in the adjusting process, so that collision is avoided. And finally, completing the analysis work of the sample to be detected by utilizing the conventional operation of the electronic probe, and completing the analysis process.
3) And in the sampling process, after the sample is analyzed, the electronic probe sample bin door is opened, and the sample table is lowered to the lowest position by utilizing the height adjusting function of the sample table carried by the electronic probe. The shielded sample holder is removed from the electronic probe sample stage by a robot arm, and the entire apparatus is placed on a specific sample stage. The lead screw 1 of the rotary shielding sample seat enables the adjustable sample clamp 5 to be adjusted to the farthest distance away from the sample loading direction, the sample is taken down by utilizing a manipulator and placed in a special lead tank, and the sampling process is completed.
Example 2:
this embodiment is based on embodiment 1, the horizontal segment of first L type fixed plate 51 and the horizontal segment of second L type fixed plate 71 are protruding to the inboard respectively and are formed first boss and second boss, first boss and second boss staggered arrangement, form first chamber of holding between first boss and the second L type fixed plate 71, form the second between second boss and the first L type fixed plate 51 and hold the chamber, first chamber of holding and second hold the chamber and be used for placing standard sample 11 and sample 12 that awaits measuring.
The test of the electronic probe of this embodiment requires that the shielding sample holder is provided with 2 sample mounting positions, one of which is used for placing the sample 12 to be tested and the other is used for placing the standard sample 11.
Example 3:
in this embodiment, based on embodiment 1, the sample stage chassis 9 is provided with a graduated scale 10, and the length direction of the graduated scale 10 is the displacement direction of the adjustable sample clamp 5.
The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are merely exemplary embodiments of the present invention, and are not intended to limit the scope of the present invention, and any modifications, equivalent substitutions, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
It should be noted that the structures, ratios, sizes, and the like shown in the drawings attached to the present specification are only used for matching the disclosure of the present specification, so as to be understood and read by those skilled in the art, and are not used to limit the conditions of the present invention, so that the present invention has no technical essence, and any structural modification, ratio relationship change, or size adjustment should still fall within the scope of the present invention without affecting the function and the achievable purpose of the present invention. In addition, the terms such as "upper", "lower", "left", "right", "middle", etc. used in the present specification are used for clarity of description, and are not intended to limit the scope of the present invention, and the relative relationship between the terms and the terms may be changed or adjusted without substantial technical change.
Claims (10)
1. An electronic probe shielding sample holder for radioactive samples is characterized by comprising a sample table chassis (9), an adjustable sample clamp (5) and a fixed sample clamp (7);
the fixed sample clamp (7) and the adjustable sample clamp (5) are arranged on a sample platform chassis (9), the fixed sample clamp (7) and the adjustable sample clamp (5) are oppositely arranged, an accommodating cavity for accommodating a standard sample (11) and a sample (12) to be detected is formed between the fixed sample clamp (7) and the adjustable sample clamp (5), and the distance between the fixed sample clamp (7) and the adjustable sample clamp (5) is adjustable;
The sample platform chassis (9), the adjustable sample clamp (5) and the fixed sample clamp (7) are all made of shielding materials.
2. An electron probe shielding sample holder for radioactive samples according to claim 1, characterized in that the adjustable sample holder (5) is slidably arranged on the sample stage chassis (9) and the fixed sample holder (7) is fixed on the sample stage chassis (9).
3. The electron probe shielding sample holder for radioactive samples according to claim 2, characterized in that a fixed support (3) is arranged on the sample stage chassis (9) at a side close to the adjustable sample clamp (5), a lead screw (1) is arranged on the fixed support (3) in a penetrating manner, a lead screw nut (2) is arranged on the lead screw (1), and one end of the lead screw (1) is connected with the adjustable sample clamp (5).
4. The electron probe shielding sample holder of a radioactive sample according to claim 3, characterized in that the fixing support (3) is fixed on the sample stage chassis (9) by a first hexagon socket head cap screw (4).
5. The electron probe shielding sample holder of radioactive samples according to claim 2, characterized in that a graduated scale (10) is arranged on the sample stage chassis (9), and the length direction of the graduated scale (10) is the displacement direction of the adjustable sample holder (5).
6. The electron probe shielding holder of a radioactive sample according to claim 2, wherein the adjustable sample holder (5) is connected to the sample stage base plate (9) by a spring ball (6).
7. The electron probe shielding sample holder of a radioactive sample according to claim 2, wherein the adjustable sample holder (5) comprises a first L-shaped fixing plate (51), an inner side guide plate (53) is disposed on the inner wall of the vertical section of the first L-shaped fixing plate (51), an outer side guide plate (52) is disposed on the end of the horizontal section of the first L-shaped fixing plate (51), the fixed sample holder (7) comprises a second L-shaped fixing plate (71), an inner side guide rail matched with the outer side guide plate (52) is disposed in the vertical section of the second L-shaped fixing plate (71), and an outer side guide rail matched with the inner side guide plate (53) is disposed on the end of the horizontal section of the second L-shaped fixing plate (71).
8. The electron probe shielding sample holder of a radioactive sample according to claim 7, wherein the horizontal section of the first L-shaped fixing plate (51) and the horizontal section of the second L-shaped fixing plate (71) are protruded inward to form a first boss and a second boss, respectively, the first boss and the second boss are arranged in a staggered manner, a first accommodating cavity is formed between the first boss and the second L-shaped fixing plate (71), a second accommodating cavity is formed between the second boss and the first L-shaped fixing plate (51), and the first accommodating cavity and the second accommodating cavity are used for accommodating the standard sample (11) and the sample (12) to be tested.
9. The electron probe shielding sample holder of a radioactive sample according to claim 1, wherein the sample fixing clamp (7) is fixed on the sample stage chassis (9) through a second hexagon socket head cap screw (8).
10. The electron probe-shielded sample holder for a radioactive specimen according to any one of claims 1 to 9, wherein the shielding material comprises stainless steel and tungsten-based materials, and the shielding material has a shielding capacity of not less than 5mm lead shielding equivalent.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210150745.0A CN114518376A (en) | 2022-02-18 | 2022-02-18 | Electronic probe shielding sample seat of radioactive sample |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210150745.0A CN114518376A (en) | 2022-02-18 | 2022-02-18 | Electronic probe shielding sample seat of radioactive sample |
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| CN114518376A true CN114518376A (en) | 2022-05-20 |
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| CN202210150745.0A Pending CN114518376A (en) | 2022-02-18 | 2022-02-18 | Electronic probe shielding sample seat of radioactive sample |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116487079A (en) * | 2023-04-03 | 2023-07-25 | 中国核动力研究设计院 | Method for qualitatively testing nuclear fuel microcell burnup based on electronic probe |
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| CN215008136U (en) * | 2021-06-22 | 2021-12-03 | 河北朗飞生物科技有限公司 | Scanning type electron microscope sample clamp |
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| CN116487079A (en) * | 2023-04-03 | 2023-07-25 | 中国核动力研究设计院 | Method for qualitatively testing nuclear fuel microcell burnup based on electronic probe |
| CN116487079B (en) * | 2023-04-03 | 2024-01-30 | 中国核动力研究设计院 | Method for qualitatively testing nuclear fuel microcell burnup based on electronic probe |
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