CN114359173A - Panel detection method, panel detection device, electronic device and storage medium - Google Patents
Panel detection method, panel detection device, electronic device and storage medium Download PDFInfo
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Abstract
The embodiment of the invention provides a panel detection method and device, electronic equipment and a storage medium. The method comprises the following steps: acquiring an image of a panel to be detected; in the image of the panel to be detected, the following detection operations are performed for the electrodes of the panel to be detected: identifying electrodes of the panel to be detected in an image of the panel to be detected; identifying conductive particles in the electrode in an image of a panel to be detected; and determining whether the panel to be detected is qualified or not according to the identified positions of the electrodes and the identified positions of the conductive particles. The conductive particles identified by the technical scheme are all particles with qualified indentation strength, so that the influence of the indentation strength of the particles on the accuracy of the detection result is avoided, and the accuracy of the detection result of the panel is improved. Unqualified materials in the panel can be discharged in time based on an accurate panel detection result, waste of materials and working hours brought to subsequent working sections is avoided, and the yield of panel products is improved.
Description
Technical Field
The present invention relates to the field of panel detection technologies, and in particular, to a panel detection method, a panel detection apparatus, an electronic device, and a storage medium.
Background
Chip On Glass (COG) is a technology in which a driver Circuit Chip (IC) is directly bonded to a Glass plate, and is widely used in various display products such as liquid crystal display and electroluminescence technologies. In the COG process, an electrode of a driving circuit is aligned with an electrode (bump) on a glass plate, an Anisotropic Conductive Film (ACF) is used as a bonding dielectric material, and the connection and conduction between the electrode of the driving circuit and the electrode on the glass plate are realized through a certain period of high temperature and high pressure. Similarly, the flexible circuit board On Glass (FPC On Glass, FOG for short) is a technique in which a flexible circuit board (FPC) is directly bonded to a Glass plate, and the process is similar to COG. Similarly, a Chip On Film (COF) product is a chip-on-film product formed by directly packaging a semiconductor chip on a flexible substrate and then bonding the flexible substrate to a glass plate, and the manufacturing process is similar to that of COG.
Particle indentation is an important process in the panel binding process. Since the electrode material of the panel is flexible, expansion and contraction or warpage may occur during the binding process. And the pressure deviation of each electrode can occur, which leads to the failure of the panel. In addition, the indentation strength of the particles is also an important factor influencing the detection result during the panel detection process. Too strong indentations may result in the particles being crushed and too weak indentations may result in poor conductivity properties of the particles.
Therefore, in the panel detection, a technology capable of accurately detecting the binding quality between the electrodes joined in the panel to be detected is urgently needed.
Disclosure of Invention
The present invention has been made in view of the above problems. The invention provides a panel detection method, which comprises the following steps:
acquiring an image of a panel to be detected;
in the image of the panel to be detected, the following detection operations are performed for the electrodes of the panel to be detected:
identifying electrodes of the panel to be detected in an image of the panel to be detected;
identifying conductive particles in the electrode in an image of a panel to be detected;
and determining whether the panel to be detected is qualified or not according to the identified positions of the electrodes and the identified positions of the conductive particles.
Illustratively, after identifying the conductive particles in the electrode, the detecting operation further comprises:
generating a minimum envelope box of the identified conductive particles;
determining whether the panel to be detected is qualified according to the identified positions of the electrodes and the identified positions of the conductive particles, and the method comprises the following steps:
and determining whether the panel to be detected is qualified or not according to the identified position of the electrode and the position of the minimum envelope frame.
Illustratively, the minimum envelope box is a rectangle.
Illustratively, determining whether the panel to be detected is qualified according to the identified position of the electrode and the position of the minimum envelope frame comprises:
and determining whether the panel to be detected is qualified or not according to the position of the identified characteristic part of the electrode and the position of the corresponding characteristic part of the minimum envelope frame.
Exemplarily, the minimum envelope frame is a rectangle, and determining whether the panel to be detected is qualified according to the position of the identified feature of the electrode and the position of the corresponding feature of the minimum envelope frame includes:
judging whether the distance between the top edge of the electrode and the top edge of the rectangle is smaller than a longitudinal threshold value or not;
and determining that the panel to be detected is qualified under the condition that a preset condition is met, wherein the preset condition comprises that the distance between the top edge of the electrode and the top edge of the rectangle is smaller than a longitudinal threshold value.
Exemplarily, the minimum envelope frame is a rectangle, and determining whether the panel to be detected is qualified according to the position of the identified feature of the electrode and the position of the corresponding feature of the minimum envelope frame includes:
determining a first side edge of the electrode and a first side edge of the rectangle according to the distance between the electrode and the corresponding side edge of the rectangle, wherein the first side edge of the electrode corresponds to the first side edge of the rectangle, and the distance between the first side edge of the electrode and the first side edge of the rectangle is greater than the distance between the other side edge of the electrode and the corresponding side edge of the rectangle;
judging whether the distance between the first side edge of the electrode and the first side edge of the rectangle is smaller than a transverse threshold value or not;
and determining that the panel to be detected is qualified under the condition of meeting preset conditions, wherein the preset conditions comprise that the distance between the first side edge of the electrode and the first side edge of the rectangle is smaller than a transverse threshold value.
Illustratively, determining whether the panel to be detected is qualified according to the positions of the identified features of the electrodes and the positions of the corresponding features of the minimum envelope frame includes:
determining the center of the electrode and the center of the minimum envelope frame;
judging whether the distance between the center of the electrode and the center of the minimum envelope frame is smaller than a center distance threshold value or not;
and determining that the panel to be detected is qualified under the condition of meeting preset conditions, wherein the preset conditions comprise that the distance between the center of the electrode and the center of the minimum envelope frame is smaller than a center distance threshold value.
Illustratively, the method further comprises:
and alarming under the condition that the panel to be detected is unqualified.
Illustratively, the detecting step is performed across all electrodes of said panel to be detected.
According to another aspect of the present invention, there is provided a panel inspection apparatus, including:
the acquisition module is used for acquiring an image of a panel to be detected;
the detection module is used for executing the following detection operations aiming at the electrodes of the panel to be detected in the image of the panel to be detected:
identifying an electrode of a panel to be detected;
identifying conductive particles in the electrode in an image of a panel to be detected;
and determining whether the panel to be detected is qualified or not according to the identified positions of the electrodes and the identified positions of the conductive particles.
According to another aspect of the present invention, there is provided an electronic device, including an image capturing apparatus, a processor, and a memory, wherein the image capturing apparatus is configured to obtain an image of a panel to be detected, and the memory stores computer program instructions, which when executed by the processor are configured to perform the panel detecting method described above.
According to yet another aspect of the present invention, there is provided a storage medium having stored thereon program instructions for performing the panel detection method described above when executed.
According to the technical scheme, the quality of the panel can be detected according to the identified position of the electrode on the panel to be detected and the position of the conductive particles in the electrode, namely the distribution condition of the conductive particles in the electrode. The technical scheme of the application has the advantages of wide application range and high generalization. And the detection result obtained based on the distribution of the conductive particles in the electrode is more intuitive, and is convenient for a user to observe. In addition, in this application, the electrically conductive particle of discernment is the qualified particle of indentation intensity, has avoided the influence of the indentation intensity of particle to the testing result accuracy, has improved the accuracy of panel testing result. Unqualified materials in the panel can be discharged in time based on an accurate panel detection result, waste of materials and working hours brought to subsequent working sections is avoided, and the yield of panel products is improved.
The foregoing description is only an overview of the technical solutions of the present invention, and the embodiments of the present invention are described below in order to make the technical means of the present invention more clearly understood and to make the above and other objects, features, and advantages of the present invention more clearly understandable.
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The above and other objects, features and advantages of the present invention will become more apparent by describing in more detail embodiments of the present invention with reference to the attached drawings. The accompanying drawings are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention and not to limit the invention. In the drawings, like reference numbers generally represent like parts or steps.
FIG. 1 shows a schematic flow diagram of a panel inspection method according to an embodiment of the invention;
fig. 2 shows a schematic flow chart of the detection steps for the electrodes of the panel to be detected according to an embodiment of the invention;
FIG. 3 shows a partial schematic view of an image of a panel to be inspected according to an embodiment of the invention;
FIG. 4 shows a partial schematic view of an image of a panel to be inspected having identified electrodes therein in accordance with an embodiment of the present invention;
FIG. 5 shows a simplified schematic diagram of one electrode in a panel to be tested according to an embodiment of the invention;
FIG. 6 shows a simplified schematic of an electrode and conductive particles according to another embodiment of the invention;
FIG. 7 shows a schematic view of a panel inspection apparatus according to an embodiment of the invention;
FIG. 8 shows a schematic view of an electronic device according to an embodiment of the invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, exemplary embodiments according to the present invention will be described in detail below with reference to the accompanying drawings. It is to be understood that the described embodiments are merely a subset of embodiments of the invention and not all embodiments of the invention, with the understanding that the invention is not limited to the example embodiments described herein. All other embodiments, which can be derived by a person skilled in the art from the embodiments of the invention described herein without inventive step, shall fall within the scope of protection of the invention.
According to one embodiment of the present invention, a panel inspection method is provided. The method judges whether the panel to be detected is qualified or not by identifying the position of the electrode on the panel to be detected and the position of the conductive particles in the electrode. It will be appreciated that it is desirable that the conductive particles on the electrode be uniformly distributed, rather than biased to one side of the electrode. The more the position of the conductive particles on the electrode is deviated, the worse the conductivity of the electrode is, and the worse the quality of the panel to be detected is.
A schematic flow diagram of a panel inspection method 1000 in accordance with one embodiment of the present invention is described below with reference to fig. 1 and 2. First, as shown in fig. 1, the panel inspection method 1000 may include the following steps.
Step S1100, acquiring an image of the panel to be detected.
Panel detection may be achieved using panel detection means. For example, the panel detection device may include a detection platform capable of carrying the panel to be detected and a detection assembly for detecting the panel to be detected carried on the detection platform. The inspection assembly includes an image capture device, such as an inspection camera, capable of clearly capturing an image of the panel to be inspected. Illustratively, the panel to be detected may be a panel based on the COG technology, a panel based on the COF technology, a panel based on the FOG technology, or the like. Illustratively, a panel may include thousands of electrodes, wherein the conductive particles are in the micron size, and a special inspection camera, such as a Differential Interference Contrast (DIC) microscope camera, may be used to capture images of the panel to be inspected in order to clearly distinguish the electrodes from the conductive particles.
Illustratively, the image of the panel to be detected may be an original image directly acquired by the image acquisition device, or may be an image obtained after preprocessing the original image. The preprocessing operation may include all operations for more clearly performing panel detection. For example, the preprocessing operation may include a noise removal operation such as filtering, and may also include adjustment of image parameters such as adjustment of image gray scale, contrast, brightness, etc. for clearly identifying electrodes or conductive particles in the image. The image may contain all or part of the electrodes in the panel to be detected.
Step S1200, in the image of the panel to be detected, performing the detection operation as shown in fig. 2 for the electrodes of the panel to be detected: step S1210 to step S1250.
Step 1210, identifying the electrode of the panel to be detected.
As mentioned above, the panel to be detected includes a large number of electrodes, and the electrodes to be detected are identified from the acquired image of the panel to be detected. Exemplarily, fig. 3 shows a partial image of a panel to be inspected based on the COF technique according to an embodiment of the present invention. The image of the panel to be inspected shown in fig. 3 includes a plurality of electrodes 310 therein. As shown in fig. 3, the gray scale of the electrode 310 is clearly different from other areas in the image.
Illustratively, the electrodes 310 may be identified according to a preset gray threshold. For example, the preset identification electrode has a gray threshold of 65 in the image. The preset grayscale threshold 65 for the image recognition may be loaded in the system program. Therefore, the image of the panel to be detected can be divided according to the gray threshold. The region greater than the threshold value of the gray scale may be determined as an electrode, thereby recognizing the region of the electrode.
Still alternatively, the electrodes may be identified in the image of the panel to be detected in response to an operation by the user. For example, the electrodes may be identified by determining the boundaries of the electrodes in response to a user-initiated mouse event or keyboard event. For example, the boundary of the electrode may be determined according to a position where a cursor is dragged in response to an event where a user drags the cursor on the image with a mouse.
FIG. 4 shows a partial schematic view of an image of a panel to be inspected having identified electrodes therein, according to one embodiment of the invention. Alternatively, the boundary of the electrode may be a rectangular frame consisting of four edge lines of the upper, lower, left, and right sides of the electrode, which is recognized in the image of the panel to be detected. Illustratively, the rectangular frame may include a top side, a bottom side, a left side, and a right side.
In step S1230, in the image of the panel to be detected, the conductive particles in the electrode are identified.
It is understood that in the panel to be detected, conductive particles for conduction are present in the electrodes. If the conductive particles pass the indentation strength in the electrode, they appear in the image in a different gray scale than the areas without particles. Referring again to fig. 4, in the image of the panel to be inspected, there are multiple conductive particles in the area of each electrode, e.g., 410 is one conductive particle on the first electrode. Illustratively, the indentation of each conductive particle has a more obvious gray scale difference with the electrode. Further, each conductive particle may comprise a darker first area 411 and a lighter second area 412. Wherein the gray scale of the first region 411 is generally smaller than the gray scale of the surrounding region and the gray scale of the second region 412 is generally larger than the gray scale of the surrounding region. The conductive particles can thus be identified in the image of the panel to be detected on the basis of the grey scale, for example by means of a grey scale threshold. The conductive particles may be identified based on other factors such as shape, in addition to gray scale.
Step S1250, determining whether the panel to be detected is qualified according to the identified positions of the electrodes and the identified positions of the conductive particles.
For example, in an image of a panel to be detected, the identified electrode may be regarded as a quadrangular frame, for example, a rectangular frame. The position of the rectangular box may represent the position of the electrode. Alternatively, the positions of the four sides of the rectangular frame may be determined, or the position of the center of the rectangular frame may be determined as the position of the electrode. On one electrode, several conductive particles may be included, the positions of which are all considered. Alternatively, a position occupied by a set of several conductive particles or a position of a center of several conductive particles may be taken as the position of the identified conductive particle.
The identified positions of the conductive particles on the electrode and the electrode can be compared, and whether the panel to be detected is qualified or not can be determined according to the position relation of the conductive particles and the electrode. Illustratively, the position deviation of the two is determined, such as the position deviation of the two in the transverse direction or the longitudinal direction, or the transverse position deviation and the longitudinal position deviation of the center points of the two are integrated. It will be appreciated that for deviations in either of the above directions, a deviation closer to 0 indicates a closer to perfect alignment; conversely, a deviation from 0 indicates a serious misalignment between the two. Whether the panel to be detected is qualified or not can be judged based on whether the determined deviation is larger than the deviation threshold value or not by setting a certain deviation threshold value.
Exemplarily, the detecting step S1200 is performed by traversing all electrode pairs of the panel to be detected. The image of the panel to be detected comprises a plurality of electrodes, the position of each electrode and the position of the conductive particles on the electrode can be identified and determined one by one until the detection of all the electrodes in the whole panel to be detected is completed, so as to determine whether the panel to be detected is qualified. For example, the proportion of the electrodes, on which the lateral deviation, the longitudinal deviation and/or the positional deviation of the central point of the conductive particles on all the electrodes are less than or equal to the deviation threshold value, may be determined according to the lateral deviation, the longitudinal deviation and/or the positional deviation of the central point of the conductive particles on each electrode with respect to the electrode on which the conductive particles are located, and when the proportion exceeds the proportion threshold value, the panel to be detected is determined to be qualified. This ratio is, for example, any value between 90% and 100%. According to the technical scheme, the quality of the panel to be detected is determined according to the position deviation of the conductive particles on all the electrodes relative to the electrodes, and the detection result is more accurate.
According to the technical scheme, the quality of the panel can be detected according to the identified position of the electrode on the panel to be detected and the position of the conductive particles in the electrode, namely the distribution condition of the conductive particles in the electrode. The technical scheme of the application has the advantages of wide application range and high generalization. And the detection result obtained based on the distribution of the conductive particles in the electrode is more intuitive, and is convenient for a user to observe. In addition, in this application, the electrically conductive particle of discernment is the qualified particle of indentation intensity, has avoided the influence of the indentation intensity of particle to the testing result accuracy, has improved the accuracy of panel testing result. Unqualified materials in the panel can be discharged in time based on an accurate panel detection result, waste of materials and working hours brought to subsequent working sections is avoided, and the yield of panel products is improved.
Exemplarily, the method 1000 further includes: and when the panel to be detected is unqualified, alarming. For example, after the above-described detection operation S1200 is performed, when a failure of the panel to be detected is detected, an alarm may be issued. The alarm may be in the form of a prompt tone that alerts the user, an alarm prompt box that is displayed on the interface, and button controls such as "confirm and continue" or "re-detect". Optionally, when the user receives the alarm information, the user can record the detection result of the panel to be detected by clicking a button to confirm and continue, and mark the position of the electrode in the panel to be detected, where the position of the electrode has a large deviation from the position of the identified conductive particle; the detection of the panel to be detected can also be re-executed after manually adjusting detection parameters, such as any of the grayscale threshold values, the deviation threshold values, and the like, by clicking a button "re-detection". In the technical scheme, the unqualified panel to be detected is alarmed, so that unqualified materials in the panel can be conveniently and timely removed, and the waste of materials and working hours brought to subsequent working sections is avoided.
Illustratively, in the detecting operation S1200, after the conductive particles on the electrode are identified in step S1230, step S1240 is further included, where a minimum envelope frame of the identified conductive particles is generated. Referring to fig. 5, fig. 5 shows a simplified pattern of one electrode and conductive particles in an image of a panel to be inspected, as identified. Wherein the rectangular areas filled by parallel longitudinal lines represent recognized electrodes 510 (in particular, in fig. 5, 510 indicates a glass electrode of a panel to be detected, and the dotted line boundary indicates a part of an FPC or IC electrode; in this embodiment, a part of an FPC or IC electrode indicated by a part of the dotted line boundary is actually coincident with a boundary of a quadrangle 530 of minimum envelope mentioned below), and the gray circular particles 520 represent conductive particles on the recognized electrodes. Illustratively, based on a preset positioning indicator, such as the lower left corner of the image, a rectangular coordinate system is established (fig. 5 is only a part of the image, and the X-axis and the Y-axis are only for illustrative purposes and are not the rectangular coordinate system described herein), and the position of the electrode and the position of the conductive particles on the electrode are determined according to the rectangular coordinate system. For example, for the electrodes arranged in the transverse direction, the arrangement direction (transverse direction) of the electrodes may be set to the direction of the x-axis of the rectangular coordinate system, and the direction (longitudinal direction) perpendicular to the arrangement direction of the electrodes may be set to the direction of the y-axis. As shown in FIG. 5, the rectangular frame representing electrode 510 has its top and bottom sides parallel to the x-axis of the coordinate system and its two side sides parallel to the y-axis of the coordinate system. For example, and without limitation, the position of the recognition electrode may include coordinates of four sides of a rectangular frame in which the recognition electrode is located, e.g., the top and bottom sides may be denoted as y ═ b and y ═ a, respectively, and the two sides of the rectangular frame may be denoted as x ═ c and x ═ d, respectively.
For example, the conductive particles on the electrode shown in fig. 5 may be regarded as a circle with a radius r, and the position of the conductive particle may be identified as the coordinate position of the circular area where the conductive particle is located. Alternatively, for the radius r of the conductive particle is much smaller than the length or width of the electrode, the center coordinates of the circle where the conductive particle is located may be regarded as the position coordinates of the conductive particle.
Illustratively, a minimum envelope box of all conductive particles on the identified electrode is generated based on the locations of these conductive particles. The minimum envelope box may be the minimum area including all particles on the electrode. Referring again to fig. 5, fig. 5 shows the electrode with 25 conductive particles identified, and the minimum area encompassing the 25 points can be determined based on the position coordinates of the 25 conductive particles. It will be appreciated that the minimum area that can envelope the 25 points may have a number of configurations, without limitation. Illustratively, the minimum envelope box may be a quadrilateral 530, shown in longer dashed lines in fig. 5, which may include 25 particle regions. Alternatively, the minimum envelope box may also be an irregular shape 540, shown in short dashed lines in fig. 5, wrapped by a smooth curve. Still alternatively, the minimum envelope box may also be a polygon 550 composed of centers of 12 particles located at the outer side among the 25 particles.
As described above, in step S1250, it may be determined whether the panel to be inspected is acceptable or not according to the positions of the identified electrodes and the positions of the identified conductive particles. Exemplarily, the step S1250 includes: and determining whether the panel to be detected is qualified or not according to the identified position of the electrode and the position of the minimum envelope frame. Referring again to fig. 5, the minimum envelope box of the conductive particles is exemplified by a polygon 550. Since the conductive particles are on the electrode, the minimum envelope polygon 550 of the conductive particles is contained by the rectangular frame 510 of the electrode, and whether the panel to be detected is qualified is determined based on the position of the minimum envelope polygon 550 on the rectangular frame 510 of the electrode. For example, for two regions included and included, the more the position of the included relatively small region matches the central region of the other region, the more accurate the alignment between the two regions is. It can be understood that in one electrode, the minimum enveloping frame of the conductive particles is distributed in the central area of the electrode, the alignment is more accurate, and relatively more particles can be ensured on the electrode, so that the conductivity is stronger, and the quality of the panel is better. On the contrary, if the minimum enveloping frame of the conductive particles is deviated from the central area of the electrode, there may be a portion of the particles with insufficient indentation strength, even without falling on the electrode, and with relatively weak conductivity, even without conductivity, thereby affecting the quality of the panel.
According to the technical scheme, the positions of all the conductive particles on the electrode are represented by the positions of the minimum envelope frame, and whether the panel to be detected is qualified or not is determined according to the identified positions of the electrode and the positions of the minimum envelope frame. For the electrode with more conductive particles, the relative position of each conductive particle in all the conductive particles and the electrode does not need to be determined one by one. According to the scheme, on the basis of ensuring accurate detection, the calculation amount can be reduced, so that the detection cost is saved.
Illustratively, the minimum envelope box of the identified conductive particles may be a rectangle. The minimum envelope box of the identified conductive particles shown in fig. 5 may be in a non-limiting variety of configurations. Where the minimum envelope box quadrilateral 530 is a rectangle.
Illustratively, in the image of the panel to be detected, the minimum rectangular envelope of the conductive particles on the electrodes may be generated by: step S1241, determining the minimum value x of the abscissa among the coordinate values of all the conductive particlesminAnd maximum value xmaxThe minimum value y of the ordinateminAnd maximum value ymax(ii) a Step S1242, a minimum rectangular envelope frame of the conductive particles is generated according to the minimum value and the maximum value of the abscissa and the ordinate of the conductive particles. For example, refer again to fig. 5. First, by comparing the coordinate values of all the conductive particles, the minimum value and the maximum value of the abscissa and the ordinate of the conductive particle, such as x, are sequentially obtainedmin＝2、xmax＝5、ymin＝3、ymax4. Then, the minimum enveloping frame of the conductive particles on the electrode is determined to be a rectangle 2 which is more than or equal to x which is less than or equal to 5 and 3 which is more than or equal to y which is less than or equal to 4. Further, whether the panel is qualified or not can be confirmed by comparing the position of the rectangular envelope frame with the position of the electrode.
By the technical scheme, the minimum enveloping frame of all the conductive particles on the electrode in the panel to be detected is determined to be a rectangle, and then whether the panel to be detected is qualified or not can be determined by comparing the positions of the rectangular enveloping frame and the electrode. The position of the rectangular envelope can generally characterize the position of all conductive particles on the electrode. Since the algorithm for determining the rectangular envelope boxes of the dispersion points is simple, mature and high in reliability, the positions of the conductive particles are represented by the positions of the rectangular envelope boxes of the conductive particles in the scheme, so that the detection accuracy of the panel can be guaranteed, and the calculation cost is low and the speed is high. The method has strong operability in actual panel detection.
For example, the implementation of the detecting step S1250 may determine whether the panel to be detected is qualified according to the positions of the identified features of the electrodes and the positions of the corresponding features of the minimum envelope frame.
For convenience of description, in the following embodiments, description is made taking an example in which the minimum envelope box is a rectangle. One rectangle comprises four vertexes and four sides, and the four vertexes and four sides of the rectangle can be respectively obtainedThe midpoint on each edge and the center point, diagonal, etc. of the rectangle. By way of example and not limitation, one or more of a vertex, an edge, a midpoint, a diagonal, a center point, etc. of the rectangle 510 representing the electrode shown in fig. 5 may each serve as a feature of the electrode, and a position of the feature in the coordinate system may be further obtained. Similarly, the location of the corresponding feature of the minimum envelope 530 of conductive particles on the electrode in fig. 5 in the coordinate system may be obtained. And finally, comparing the position relationship of the two, for example, calculating the coordinate difference or distance of the characteristic part, and determining whether the panel to be detected is qualified according to the position relationship and a preset judgment standard. For example, the characteristic portion of the electrode is represented by the abscissa of the midpoint of the bottom side of a rectangle in which the electrode is located, and the abscissa of the midpoint of the bottom side of the electrode is x1. The abscissa of the center point of the bottom side of the minimum rectangular envelope of the conductive particles on the electrode is x2. The preset determination criterion may be that the difference between the two horizontal coordinates is less than a threshold value xa. The difference Δ x ═ x may be based on the abscissa described above1-x2L and threshold xaThe magnitude relationship between them determines whether the electrode is acceptable. When Δ x is less than xaAnd judging that the electrode is qualified, otherwise, judging that the electrode is unqualified.
According to the technical scheme, whether the panel to be detected is qualified or not is determined by extracting the positions of the electrode and the corresponding characteristic parts of the region where the conductive particles on the electrode are located and comparing the position relation of the characteristic parts of the electrode and the corresponding characteristic parts in the coordinate system. The alignment relationship between the electrodes and the conductive particles in the electrodes is finally simplified into the positional relationship between the features of the two regions. The scheme not only ensures the accuracy of the detection result, but also reduces the technical difficulty and the operation cost of the detection to a certain extent.
As described above, whether the panel to be detected is qualified or not can be determined according to the positions of the identified characteristic parts of the electrodes and the positions of the corresponding characteristic parts of the minimum envelope frame; and the minimum envelope box may be rectangular. In one example, the feature of the electrode may be a top edge of the electrode. Accordingly, the feature of the rectangular envelope of conductive particles is the top edge of the rectangle. Illustratively, it is determined whether the panel to be detected is qualified by: in step S1251, it is determined whether the distance between the top edge of the electrode and the top edge of the minimum rectangular envelope of the conductive particles is smaller than a vertical threshold. And S1252, determining that the panel to be detected is qualified under the condition of meeting the preset condition. Illustratively, the preset condition includes a distance between a top edge of the electrode and a top edge of a smallest rectangular envelope of the conductive particles being less than a longitudinal threshold.
Step S1251 and step S1252 are further explained, exemplarily, with reference to fig. 6. Fig. 6 shows a simplified diagram of an electrode and conductive particles according to another embodiment of the invention. The top edge 610 of the electrode is shown in fig. 6, and the top edge 620 of the smallest rectangle enveloping the conductive particles on the electrode, hereinafter referred to as the top edge of the rectangle. The top edge of an electrode located in a rectangular coordinate system may be denoted as y ═ y1The top side of the rectangle is denoted as y ═ y2. Calculating the distance between the top edges of the two, namely calculating y1And y2Difference d of1＝|y1-y2L. For example, the preset condition may be that the distance between the top edge of the electrode and the top edge of the rectangle is less than a longitudinal threshold yaComparison of d1And yaWhen d is1<yaAnd if not, determining that the panel to be detected is qualified, and otherwise, determining that the panel to be detected is unqualified.
Through the technical scheme, whether the panel to be detected is qualified or not is determined according to the relation between the distance between the electrode in the panel to be detected and the top edge of the minimum rectangular envelope of the conductive particles and the preset threshold value. In actual operation, only one point on the top edge of the electrode and the ordinate value of the point with the largest ordinate value in the conductive particles need to be determined. The detection efficiency is improved on the basis of ensuring the detection quality of the panel.
As previously mentioned, the minimum envelope box may be a rectangle. In another example, the above-described determination of whether the panel to be detected is qualified according to the positions of the identified features of the electrodes and the positions of the corresponding features of the minimum envelope is accomplished by the following steps. Step S1253, determining the first side of the electrode and the first side of the rectangle according to the distance between the electrode and the corresponding side of the rectangle. That is, the feature of the electrode is a first side of the electrode. Accordingly, the feature of the smallest rectangular envelope box of conductive particles is the first side of the rectangle. It is understood that corresponding sides refer to sides of the same side. The first sides of the electrodes correspond to the first sides of the rectangle, e.g. both left sides or both right sides. And the distance between the first side edge of the electrode and the first side edge of the rectangle is greater than the distance between the other side edge of the electrode and the corresponding side edge of the rectangle. Assuming that the distance between the left side of the electrode and the left side of the rectangle is greater than the distance between the right side of the electrode and the right side of the rectangle, the left side of the electrode is the first side of the electrode, and the left side of the rectangle is the first side of the rectangle; otherwise, the right side of the electrode may be determined to be the first side of the electrode, and the right side of the rectangle may be the first side of the rectangle. In step S1254, it is determined whether the distance between the first side of the electrode and the first side of the rectangle is smaller than the lateral threshold. And S1255, determining that the panel to be detected is qualified under the condition of meeting the preset condition. Illustratively, the preset condition includes that a distance between the first side of the electrode and the first side of the rectangle is less than a lateral threshold.
Illustratively, as shown in fig. 6, the electrode includes a left side 630 and the smallest rectangular envelope of conductive particles on the electrode includes a left side 640, hereinafter referred to as the left side of the rectangle. The right side of the electrode coincides with the right side of the rectangle, i.e. the distance between them is 0, while the distance from the left side 630 of the electrode to the left side 640 of the rectangle is greater than 0. Thus, it can be determined that the left side 630 of the electrode is the first side of the electrode and the left side 640 of the rectangle is the first side of the rectangle. The left side 630 of the electrode in the rectangular coordinate system may be denoted as x ═ x1The left side 640 of the rectangle is denoted x ═ x2. Calculating the distance between the two is the calculation x1And x2Difference d of2＝|x1-x2L. For example, the preset condition may be that the distance between the first side edge of the electrode and the first side edge of the rectangle is smaller than the lateral threshold value xbComparison of d2And xbWhen d is2<xbAnd if not, determining that the panel to be detected is qualified, and otherwise, determining that the panel to be detected is unqualified.
By the technical scheme, whether the panel to be detected is qualified or not is determined by comparing the distance between the electrode in the panel to be detected and one side edge of the minimum envelope frame of the conductive particles with the preset threshold value. According to the scheme, the panel quality can be detected without loading a complex operation program, and the detection cost is lower compared with that of a traditional detection mode.
In yet another example, it is determined whether the panel to be detected is qualified based on the identified locations of the features of the electrodes and the locations of the corresponding features of the minimum envelope. Wherein the feature of the electrode may be the center of the electrode. Accordingly, the feature of the minimum envelope box of the conductive particles may be the center of the minimum envelope box. Illustratively, whether the panel to be detected is qualified is determined by the following steps. Step S1256, determining the center of the electrode and the center of the minimum envelope frame; step S1257, determining whether the distance between the center of the electrode and the center of the rectangle is smaller than a center distance threshold; and S1258, determining that the panel to be detected is qualified under the condition of meeting the preset condition. Illustratively, the preset condition includes that a distance between the center of the electrode and the center of the rectangle is less than a center distance threshold.
Exemplarily, step S1256 to step S1258 are further explained with reference to fig. 6 again. Wherein, the point O is the central point of the electrode1Is the center point of the minimum envelope box of the conductive particles, hereinafter referred to as the center point of the rectangle. By way of example and not limitation, the coordinates of the center point of an electrode may be determined by determining the coordinates of a pair of diagonal vertices of the electrode, such as identifying one vertex of the electrode as having coordinates of (x)o，yo) The corresponding diagonal vertex coordinate is (x)o’，yo') the coordinates of the point O of the center point of the electrode are
Alternatively, the center point of the electrode may be determined by identifying four sides of the electrode, for example, x ═ x may be identified for each of the four sides of the electrode1，x＝x2，y＝y1，y＝y2The coordinate of the center point O of the electrode is
Similarly, the center point O of the rectangle is obtained1Has the coordinates of (x)o1，yo1). Calculate points O and O1The distance m between them. Illustratively, the preset condition may be that the distance between the center point of the electrode and the center point of the rectangle is smaller than a center distance threshold n, m and n are compared, when m is smaller than n, it is determined that the panel to be detected is qualified, otherwise, it is not qualified. It is to be understood that although the minimum envelope box is rectangular in fig. 6, this example does not limit the shape of the minimum envelope box. The coordinates of the center point of the minimum envelope box can be specifically determined according to the shape of the minimum envelope box, for example, for a circular minimum envelope box, the center point is the center point of the minimum envelope box.
By the technical scheme, whether the panel to be detected is qualified or not is determined by comparing whether the distance between the electrode in the panel to be detected and the central point of the minimum envelope frame of the conductive particles is smaller than a preset threshold value or not. The scheme is simple and can accurately reflect whether the electrode and the core electrode in the panel are in a proper alignment state, so that the accuracy of panel detection is ensured.
It is understood that in the above three examples, determining whether the panel is qualified based on the positions of the top edge, the side edge, and the center of the electrode and the minimum envelope box is achieved by using steps S1251 to S1252, steps S1253 to S1255, and steps S1256 to S1258, respectively. In practical applications, any two, even 3, of the above schemes may be combined to realize panel detection. For example, in one example, the preset condition may include that the distances between the electrode and the top, side, and/or center of the minimum envelope all meet respective threshold conditions. Thus, the panel to be detected is confirmed to be qualified. The scheme integrates more conditions to detect the panel, and ensures the quality of the panel.
According to another aspect of the invention, a panel detection device is also provided. Fig. 7 shows a schematic block diagram of a panel detection apparatus 700 according to an embodiment of the present invention. As shown in fig. 7, the apparatus 700 includes: an acquisition module 710 and a detection module 720. The obtaining module 710 is configured to obtain an image of a panel to be detected; the detection module 720 is configured to perform the following detection operations on the electrodes of the panel to be detected in the image of the panel to be detected: identifying an electrode of a panel to be detected; identifying conductive particles in the electrode in an image of a panel to be detected; and determining whether the panel to be detected is qualified or not according to the identified positions of the electrodes and the identified positions of the conductive particles.
According to another aspect of the invention, an electronic device is also provided. Fig. 8 shows a schematic block diagram of an electronic device 800 according to an embodiment of the invention. As shown in fig. 8, the electronic device 800 includes an image capturing device 810, a processor 820 and a memory 830, where the image capturing device 810 is used for capturing an image of a panel to be detected, and the memory 830 stores computer program instructions, and the computer program instructions are executed by the processor 820 to perform the panel detecting method according to the embodiment of the present invention.
According to yet another aspect of the present invention, there is also provided a storage medium having stored thereon program instructions for executing the panel detection method of the embodiment of the present invention when executed.
A person skilled in the art can understand specific implementation schemes of the panel detection apparatus, the electronic device, and the storage medium by reading the above description related to the panel detection method, and details are not described herein for brevity.
Although the illustrative embodiments have been described herein with reference to the accompanying drawings, it is to be understood that the foregoing illustrative embodiments are merely exemplary and are not intended to limit the scope of the invention thereto. Various changes and modifications may be effected therein by one of ordinary skill in the pertinent art without departing from the scope or spirit of the present invention. All such changes and modifications are intended to be included within the scope of the present invention as set forth in the appended claims.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
In the several embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. For example, the above-described device embodiments are merely illustrative, and for example, the division of the units is only one logical functional division, and other divisions may be realized in practice, for example, a plurality of units or components may be combined or integrated into another device, or some features may be omitted, or not executed.
In the description provided herein, numerous specific details are set forth. It is understood, however, that embodiments of the invention may be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure an understanding of this description.
Similarly, it should be appreciated that in the description of exemplary embodiments of the invention, various features of the invention are sometimes grouped together in a single embodiment, figure, or description thereof for the purpose of streamlining the invention and aiding in the understanding of one or more of the various inventive aspects. However, the method of the present invention should not be construed to reflect the intent: that the invention as claimed requires more features than are expressly recited in each claim. Rather, as the following claims reflect, inventive aspects lie in less than all features of a single disclosed embodiment. Thus, the claims following the detailed description are hereby expressly incorporated into this detailed description, with each claim standing on its own as a separate embodiment of this invention.
It will be understood by those skilled in the art that all of the features disclosed in this specification (including any accompanying claims, abstract and drawings), and all of the processes or elements of any method or apparatus so disclosed, may be combined in any combination, except combinations where such features are mutually exclusive. Each feature disclosed in this specification (including any accompanying claims, abstract and drawings) may be replaced by alternative features serving the same, equivalent or similar purpose, unless expressly stated otherwise.
Furthermore, those skilled in the art will appreciate that while some embodiments described herein include some features included in other embodiments, rather than other features, combinations of features of different embodiments are meant to be within the scope of the invention and form different embodiments. For example, in the claims, any of the claimed embodiments may be used in any combination.
The various component embodiments of the invention may be implemented in hardware, or in software modules running on one or more processors, or in a combination thereof. Those skilled in the art will appreciate that a microprocessor or Digital Signal Processor (DSP) may be used in practice to implement some or all of the functionality of some of the modules used in the panel detection apparatus according to embodiments of the present invention. The present invention may also be embodied as apparatus programs (e.g., computer programs and computer program products) for performing a portion or all of the methods described herein. Such programs implementing the present invention may be stored on computer-readable media or may be in the form of one or more signals. Such a signal may be downloaded from an internet website or provided on a carrier signal or in any other form.
It should be noted that the above-mentioned embodiments illustrate rather than limit the invention, and that those skilled in the art will be able to design alternative embodiments without departing from the scope of the appended claims. In the claims, any reference signs placed between parentheses shall not be construed as limiting the claim. The word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The invention may be implemented by means of hardware comprising several distinct elements, and by means of a suitably programmed computer. In the unit claims enumerating several means, several of these means may be embodied by one and the same item of hardware. The usage of the words first, second and third, etcetera do not indicate any ordering. These words may be interpreted as names.
The above description is only for the specific embodiment of the present invention or the description thereof, and the protection scope of the present invention is not limited thereto, and any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present invention, and the changes or substitutions should be covered within the protection scope of the present invention. The protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (12)
1. A panel inspection method, the method comprising:
acquiring an image of a panel to be detected;
in the image of the panel to be detected, the following detection operations are performed for the electrodes of the panel to be detected:
identifying the electrodes of the panel to be detected in the image of the panel to be detected;
identifying conductive particles in the electrode in the image of the panel to be detected;
and determining whether the panel to be detected is qualified or not according to the identified positions of the electrodes and the identified positions of the conductive particles.
2. The method of claim 1, wherein after said identifying conductive particles in said electrode, said detecting operation further comprises:
generating a minimum envelope box for the identified conductive particles;
determining whether the panel to be detected is qualified according to the identified positions of the electrodes and the identified positions of the conductive particles, wherein the determining comprises the following steps:
and determining whether the panel to be detected is qualified or not according to the identified position of the electrode and the position of the minimum envelope frame.
3. The method of claim 2, wherein the minimum envelope box is a rectangle.
4. The method of claim 2, wherein said determining whether the panel to be detected is qualified according to the positions of the identified electrodes and the position of the minimum envelope box comprises:
and determining whether the panel to be detected is qualified or not according to the position of the identified characteristic part of the electrode and the position of the corresponding characteristic part of the minimum envelope frame.
5. The method of claim 4, wherein the minimum envelope box is rectangular, and the determining whether the panel to be detected is qualified according to the positions of the identified features of the electrodes and the positions of the corresponding features of the minimum envelope box comprises:
determining whether a distance between a top edge of the electrode and a top edge of the rectangle is less than a longitudinal threshold;
and determining that the panel to be detected is qualified when a preset condition is met, wherein the preset condition comprises that the distance between the top edge of the electrode and the top edge of the rectangle is smaller than the longitudinal threshold value.
6. The method of claim 4, wherein the minimum envelope box is rectangular, and the determining whether the panel to be detected is qualified according to the positions of the identified features of the electrodes and the positions of the corresponding features of the minimum envelope box comprises:
determining a first side of the electrode and a first side of the rectangle according to the distance between the electrode and the corresponding side of the rectangle, wherein the first side of the electrode corresponds to the first side of the rectangle, and the distance between the first side of the electrode and the first side of the rectangle is greater than the distance between the other side of the electrode and the corresponding side of the rectangle;
judging whether the distance between the first side edge of the electrode and the first side edge of the rectangle is smaller than a transverse threshold value or not;
and determining that the panel to be detected is qualified under the condition that a preset condition is met, wherein the preset condition comprises that the distance between the first side edge of the electrode and the first side edge of the rectangle is smaller than the transverse threshold value.
7. The method of claim 4, wherein said determining whether the panel to be detected is qualified based on the locations of the identified features of the electrode and the locations of the corresponding features of the minimum envelope comprises:
determining a center of the electrode and a center of the minimum envelope box;
judging whether the distance between the center of the electrode and the center of the minimum envelope frame is smaller than a center distance threshold value or not;
and determining that the panel to be detected is qualified under the condition that a preset condition is met, wherein the preset condition comprises that the distance between the center of the electrode and the center of the minimum envelope frame is smaller than the center distance threshold value.
8. The method of any of claims 1 to 7, wherein the method further comprises:
and alarming under the condition that the panel to be detected is unqualified.
9. The method of any one of claims 1 to 7, wherein the detecting step is performed across all electrodes of the panel to be detected.
10. A panel testing apparatus, the apparatus comprising:
the acquisition module is used for acquiring an image of a panel to be detected;
the detection module is used for executing the following detection operations aiming at the electrodes of the panel to be detected in the image of the panel to be detected:
identifying the electrode of the panel to be detected;
identifying conductive particles in the electrode in the image of the panel to be detected;
and determining whether the panel to be detected is qualified or not according to the identified positions of the electrodes and the identified positions of the conductive particles.
11. An electronic device comprising an image acquisition device, a processor and a memory, wherein the image acquisition device is configured to acquire an image of a panel to be inspected, and the memory has stored therein computer program instructions which, when executed by the processor, are configured to perform the panel inspection method according to any one of claims 1 to 9.
12. A storage medium having stored thereon program instructions for performing, when executed, the panel detection method of any one of claims 1 to 9.
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| JP2006292398A (en) * | 2005-04-06 | 2006-10-26 | Mitsubishi Electric Corp | Method of and device for inspecting electronic component mounted position |
| CN107562242A (en) * | 2016-07-01 | 2018-01-09 | 南昌欧菲光科技有限公司 | Pressure sensitive device and there is its display device |
| CN112465809A (en) * | 2020-12-15 | 2021-03-09 | 北京市计算中心 | Mold defect detection method based on image recognition, computer-readable storage medium and device |
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| JP2006292398A (en) * | 2005-04-06 | 2006-10-26 | Mitsubishi Electric Corp | Method of and device for inspecting electronic component mounted position |
| CN107562242A (en) * | 2016-07-01 | 2018-01-09 | 南昌欧菲光科技有限公司 | Pressure sensitive device and there is its display device |
| CN112465809A (en) * | 2020-12-15 | 2021-03-09 | 北京市计算中心 | Mold defect detection method based on image recognition, computer-readable storage medium and device |
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